A uniform magnetic field magnetoelectric testing and observation device

Abstract

The present invention discloses a uniform magnetic field magnetoelectric testing and observation device, which includes a loading platform, an optical observation system, a magnetic field generating system, and a magnetoelectric detection system; the optical observation system includes a monocular microscope arranged above the loading platform, a CCD camera arranged on the monocular microscope, and a computer electrically connected to the CCD camera; the magnetic field generating system includes at least one Helmholtz coil non-contactly sleeved on the loading platform and a DC programmable power supply electrically connected to the Helmholtz coil; the magnetoelectric detection system includes a precision programmable power supply, a desktop Gaussmeter electrically connected to the precision programmable power supply, and a Gaussmeter probe electrically connected to the desktop Gaussmeter. The device provided by the present invention integrates macroscopic and microscopic performance tests, can compare microscopic structures and macroscopic signals, improves the detection efficiency of microscopic electronic components, and provides convenience for microcomputer electromagnetic and electrical system testing.

Description

Technical Field

[0001] The invention relates to the technical field of magnetoelectric testing systems, and in particular to a uniform magnetic field magnetoelectric testing and observation device. Background Art

[0002] With the development of microfluidic technology, more and more people are beginning to expand the application of microfluidic chips and the testing of their performance. Due to the precise internal structure and small size of microfluidic chips, comprehensive exploration of their performance has become a complex problem. For some fluids with poor light transmittance, their electrical properties need to be studied and quantitatively tested under a magnetic field, which brings more challenges to the performance testing of microfluidic chips.

[0003] At present, for the flow analysis inside some microfluidic chips, people mostly conduct qualitative observations under a microscope, including the behavior and movement observations of bubbles, droplets, cells, and viruses. However, qualitative research captures fewer details, and the conclusions obtained from the research are incomplete. How to quantitatively study the internal flow of microfluidic chips and the performance of chips under a microscope has become an important challenge. For some fluids with poor light transmittance inside microfluidic chips, magnetoelectric testing and observation, microscopic qualitative observations and macroscopic performance comparison detection are all problems that need to be solved urgently. How to generate a uniform magnetic field, how to arrange the observation circuit, and how to capture microscopic movements and macroscopic electrical signals at the same time are problems that need to be solved by the present invention.

[0004] Therefore, the prior art still needs to be improved and developed. Summary of the invention

[0005] In view of the above-mentioned deficiencies in the prior art, the object of the present invention is to provide a uniform magnetic field magnetoelectric testing and observation device, aiming to solve the problem that the observation device cannot quantitatively study the internal flow of the microfluidic chip and the chip performance.

[0006] The technical solution of the present invention is as follows:

[0007] A uniform magnetic field magnetoelectric testing and observation device, which includes a loading platform, an optical observation system, a magnetic field generating system, and a magnetoelectric detection system; the optical observation system includes a monocular microscope arranged above the loading platform, a CCD camera arranged on the monocular microscope, and a computer electrically connected to the CCD camera; the magnetic field generating system includes at least one Helmholtz coil non-contactly sleeved on the loading platform and a DC programmable power supply electrically connected to the Helmholtz coil; the magnetoelectric detection system includes a precision programmable power supply, a desktop gaussmeter electrically connected to the precision programmable power supply, and a gaussmeter probe electrically connected to the desktop gaussmeter.

[0008] In the uniform magnetic field magnetoelectric testing and observation device, the optical observation system further includes an adjustable light source arranged below the object loading platform, and a light source regulator electrically connected to the adjustable light source.

[0009] The uniform magnetic field magnetoelectric testing and observation device, wherein the optical observation system also includes a left carrier platform bracket and a right carrier platform bracket arranged below the carrier platform and used to support the carrier platform, the left carrier platform bracket is provided with a manual precision fine-tuning workbench, the left end of the carrier platform is fixed on the manual precision fine-tuning workbench, the right carrier platform bracket is provided with a horizontal slide rail, and the right end of the carrier platform is fixed on the horizontal slide rail.

[0010] The uniform magnetic field magnetoelectric testing and observation device, wherein the optical observation system also includes a fixed base, a bracket vertical rod fixedly arranged on the fixed base, a bracket horizontal rod arranged on the bracket vertical rod, a bracket slide rail arranged on the bracket horizontal rod, and a microscope bracket arranged on the bracket slide rail, and the microscope bracket is used to install a monocular microscope.

[0011] The uniform magnetic field magnetoelectric testing and observation device, wherein the monocular microscope comprises a monocular microscope barrel and an objective lens installed below the monocular microscope barrel.

[0012] The uniform magnetic field magnetoelectric testing and observation device, wherein the loading platform is provided with a positioning drill hole.

[0013] The uniform magnetic field magnetoelectric testing and observation device, wherein the magnetic field generating system also includes a temperature sensor for detecting the temperature of the Helmholtz coil, and a temperature alarm electrically connected to the temperature sensor.

[0014] The uniform magnetic field magnetoelectric testing and observation device, wherein the magnetic field generating system includes two Helmholtz coils arranged between the left bracket of the loading platform and the right bracket of the loading platform, the two Helmholtz coils are symmetrically arranged at intervals, and the monocular microscope is located between the two Helmholtz coils.

[0015] The uniform magnetic field magnetoelectric testing and observation device, wherein the magnetoelectric detection system also includes a data collector electrically connected to the desktop Gaussmeter and the precision programmable power supply respectively, and the data collector is also electrically connected to the notebook.

[0016] The uniform magnetic field magnetoelectric testing and observation device, wherein the magnetoelectric detection system also includes an instrument bracket and an instrument arranged on the instrument bracket.

[0017] Beneficial effects: The uniform magnetic field magnetoelectric testing and observation device provided by the present invention can generate a relatively uniform magnetic field, and simultaneously perform microscopic observation and macroscopic magnetoelectric performance testing of small magnetic electronic components within the magnetic field. The device provided by the present invention integrates macroscopic and microscopic performance testing in one, and can compare microscopic structures and macroscopic signals, which improves the detection efficiency of microscopic electronic components and provides convenience for the testing of microcomputer electromagnetic and electrical systems. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a first-view structural schematic diagram of a preferred embodiment of a uniform magnetic field magnetoelectric testing and observation device of the present invention.

[0019] Figure 2 This is a second perspective structural schematic diagram of a preferred embodiment of a uniform magnetic field magnetoelectric testing and observation device of the present invention.

[0020] Figure 3 It is a third perspective structural schematic diagram of a preferred embodiment of a uniform magnetic field magnetoelectric testing and observation device of the present invention. DETAILED DESCRIPTION

[0021] The present invention provides a uniform magnetic field magnetoelectric testing and observation device. To make the purpose, technical solution and effect of the present invention clearer and more specific, the present invention is further described in detail below. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0022] Due to the miniaturization and integration of micro sensors, it has become a major problem to conduct microscopic observation and macro performance testing at the same time. At present, microscopes are mainly used to observe electronic components on the market. Common stereo microscopes have a large operating space at the bottom, which can integrate macro electrical measurement systems, but their magnification is low. Common high-magnification microscopes such as metallographic microscopes have a short focal length and a small operating space under the lens, and it is impossible to integrate complex systems under them. Therefore, most existing observation devices can only provide observation functions and cannot integrate microscopic observation and macro electrical testing. In addition, the magnetic field will affect the accuracy of certain test sensors and interfere with the test system. There are many challenges in conducting electrical testing and microscopic observation in the magnetic field. In general, there is currently no good solution to how to achieve magnetoelectric measurement and microscopic observation in a magnetic field.

[0023] Based on this, the present invention provides a uniform magnetic field magnetoelectric testing and observation device, such as Figure 1-Figure 2As shown, it includes a loading platform 111, an optical observation system, a magnetic field generating system, and a magnetoelectric detection system; the optical observation system includes a monocular microscope arranged above the loading platform 111, a CCD camera 109 arranged on the monocular microscope, and a computer 106 electrically connected to the CCD camera 109; the magnetic field generating system includes at least one Helmholtz coil 114 non-contactly sleeved on the loading platform 111 and a DC programmable power supply 101 electrically connected to the Helmholtz coil 114; the magnetoelectric detection system includes a precision programmable power supply 102, a desktop gaussmeter 103 electrically connected to the precision programmable power supply 102, and a gaussmeter probe 207 electrically connected to the desktop gaussmeter 103.

[0024] In this embodiment, the CCD camera is installed on the monocular microscope, and the CCD imaging camera is connected to the computer 106, and imaging is performed using supporting software. Before imaging, the software can be calibrated using the monocular microscope calibration ruler to associate the relationship between pixel size and actual size, so as to facilitate the measurement of sample size through microscope pictures. In this embodiment, the flow characteristics of the microfluidic chip can be qualitatively recorded by the CCD camera; in this embodiment, the Helmholtz coil 114 can generate a uniform magnetic field after being energized, and the magnetic and electric properties of the microfluidic chip can be quantitatively tested by the desktop Gauss meter 103 and the Gauss meter probe 207. In other words, the uniform magnetic field magnetoelectric testing and observation device provided in this embodiment integrates the macroscopic and microscopic performance tests of the microfluidic chip, and can compare the microstructure and macroscopic signals, which improves the detection efficiency of microscopic electronic components and provides convenience for the testing of microcomputer electromagnetic and electrical systems.

[0025] In some embodiments, the monocular microscope includes a monocular microscope barrel 205 and an objective lens 115 installed below the monocular microscope barrel 205. In this embodiment, objective lenses 115 with different magnifications can be installed below the monocular microscope barrel 205 according to needs, for example, replaceable objective lenses of 10 times, 20 times, 40 times, etc. can be installed to observe samples of different sizes.

[0026] In some embodiments, the optical observation system also includes a fixed base 120, a support vertical rod 107 fixedly disposed on the fixed base 120, a support horizontal rod 108 disposed on the support vertical rod 107, a support slide rail 210 disposed on the support horizontal rod 108, and a microscope support 209 disposed on the support slide rail 210, and the microscope support 209 is used to install the monocular microscope.

[0027] Specifically, if Figure 1-2As shown, the fixed base 120 is fixed to the bracket vertical rod 107 through a flange 203, and the bracket vertical rod 107 is connected to a horizontal fastener 200 with a through hole through a vertical rod fastening screw 213. The horizontal fastener 200 can be adjusted up and down and rotated through the vertical rod fastening screw 213. The bracket horizontal rod 108 is inserted into the through hole of the horizontal fastener 200 and fixed by the first fastening screw 211 and the second fastening screw 212. The bracket horizontal rod 108 can be adjusted to move horizontally along the through hole through the first fastening screw 211 and the second fastening screw 212. The bracket vertical rod 107 is also provided with a vertical rod safety fastening screw 201 and a vertical rod safety fastener 202. The vertical rod safety fastening screw 201 and the vertical rod safety fastener 202 are used together to fix the bracket horizontal rod 108 to prevent it from accidentally sliding along the gravity direction and causing the lens to collide with the object platform and be damaged.

[0028] In this embodiment, the microscope bracket 209 is fixed to the bracket slide rail 210 by the horizontal fastening screw 208. The microscope bracket 209 is also provided with a microscope coarse and fine focusing screw 110. The bracket slide rail 210 is used in conjunction with the microscope coarse and fine focusing screw 110 to control the microscope bracket 209 to drive the monocular microscope to move up and down along the direction of gravity, thereby adjusting the focal length.

[0029] In this embodiment, the monocular microscope is fixed on the microscope bracket 209, and the microscope bracket can be adjusted and fixed within three degrees of freedom in space, so as to facilitate the movement of the entire optical observation system.

[0030] In some embodiments, the optical observation system further includes an adjustable light source 116 disposed below the object platform 111, and a light source regulator 119 electrically connected to the adjustable light source 116. In this embodiment, by adding an adjustable light source 116 below the object platform 111, the adjustable light source can be set to pass through samples with poor light transmittance, thereby observing the internal conditions of thinner objects, which helps to more clearly observe the flow properties of the fluid in the microfluidic chip.

[0031] In some embodiments, the optical observation system further includes a left carrier bracket 117 and a right carrier bracket 113 disposed below the carrier platform 111 and used to support the carrier platform, the left carrier bracket 117 is provided with a manual precision fine-tuning workbench 118, the left end of the carrier platform 111 is fixed on the manual precision fine-tuning workbench 118, the right carrier bracket 113 is provided with a horizontal slide rail 112, the right end of the carrier platform is fixed on the horizontal slide rail 112; Figure 3As shown, the manual precision fine-tuning workbench 118 is provided with a front-to-back Y-direction displacement knob 301 and a left-to-right X-direction displacement knob 302 .

[0032] Specifically, the left end of the loading platform 111 can be quantitatively adjusted by the front and rear Y-direction displacement knob 301 and the left and right X-direction displacement knob 302 to achieve displacement in two directions; the right end of the loading platform 111 is fixed on the horizontal slide rail 112, and the horizontal slide rail 112 can be translated in two directions and driven by the manual precision fine-tuning workbench 118. The manual precision fine-tuning workbench is provided with a screw micrometer with a scale, which can measure the displacement of the loading platform 111. In this embodiment, the loading platform can be specified to translate a certain distance, and the entire sample located on the loading platform is sampled and tested. The sampling detection method refers to extracting a certain number of fields of view in a certain length and width area according to a sampling method such as a fixed interval, and performing statistics. Combined with the ratio of the field of view area to the total area of ​​the sample, the situation of the entire sample and the probability of an event occurring are estimated. The image of the microscope can also measure the distance, and the pixel distance is mapped using a microscope calibration ruler, and the distance can be calculated using the number of pixels in the microscope image.

[0033] In some embodiments, the loading platform 111 is made of transparent acrylic material with good light transmission performance.

[0034] In some embodiments, the loading platform 11 is further provided with positioning holes, which are a plurality of orthogonal groups of holes and can be used to position the sample. If a fixture needs to be installed for special samples, this group of holes can also be expanded.

[0035] In some embodiments, Figure 1 As shown, the magnetic field generating system further includes a temperature sensor for detecting the temperature of the Helmholtz coil 114, and a temperature alarm 121 electrically connected to the temperature sensor. Figure 1-Figure 2 As shown, the magnetic field generating system includes two Helmholtz coils 114 arranged between the left support of the loading platform and the right support of the loading platform, the two Helmholtz coils 114 are arranged symmetrically at intervals, and the monocular microscope is located between the two Helmholtz coils 114. A DC programmable high-power power supply 101 provides power for the Helmholtz coils 114, and uniform magnetic fields of different sizes can be generated by changing the combination of current and voltage, and the magnetic field strength ranges from 0 to 30 mT.

[0036] In some specific embodiments, the inner diameter of the Helmholtz coil is 138mm, the outer diameter is 242mm, the middle distance between the two Helmholtz coils is 58mm, placed left and right, the enameled wire is 3.0mm, the DC resistance is 0.98 ohm, the maximum current of the coil is 20A, the central magnetic field intensity is 30mT at 20A, and the uniformity of the central 20*20mm position is 99%. The DC programmable high-power power supply is powered by the Helmholtz coil, and the power supply can provide a voltage of 0-30V, a current of 0-20A, a voltage resolution of 1mV, a current resolution of 0.1mA, and an overload protection. The Helmholtz coil has no water cooling system, and the temperature increases with the power-on time. In order to prevent accidents, the temperature sensor combined with the temperature alarm can detect the coil temperature in real time and alarm, and the alarm threshold is 50 degrees Celsius. The magnetic field generating system also includes a J-type thermocouple temperature measuring device, which is installed on the Helmholtz coil, and the thermocouple signal is connected to the magnetoelectric detection system to feed back the coil temperature to the computer port. In this embodiment, the magnetic field strength of the Helmholtz coil can be achieved by changing the combination of the magnetic field current and the magnetic field voltage. The field strength can be changed by changing the voltage or by changing the current. The relationship between the magnetic field strength and the voltage and current can be preliminarily determined by curve fitting, and then closed-loop adjustment is performed in combination with the measured value of the desktop Gauss meter, so as to quickly reach the required value, and the adjustment process is both fast and accurate.

[0037] In some embodiments, the spacing between the two Helmholtz coils is 58 mm, and the diameter of the monocular microscope barrel is less than 50 mm, so it can be placed inside the magnetic field. The length of the monocular microscope barrel is relatively large, so that the installed CCD imaging camera is outside the magnetic field, avoiding the influence of the magnetic field on the imaging of the CCD imaging camera.

[0038] In some embodiments, Figure 1-Figure 2 As shown, the magnetoelectric detection system also includes a data acquisition device 104 electrically connected to the desktop gaussmeter 103 and the precision programmable power supply 102 respectively, and the data acquisition device 104 is also electrically connected to the notebook 106; it also includes a gaussmeter probe bracket 206 for placing a gaussmeter probe 207, an instrument bracket 105 for placing an instrument, and a measurement processing circuit electrically connected to the precision programmable power supply 102.

[0039] Specifically, the DC precision programmable power supply is composed of 3 channels, which can provide 0-30V, 0-30V, and 0-5V voltages respectively, and is mainly used to provide power for the measurement and processing circuit. The desktop gaussmeter is used to measure the magnetic field strength, and is used in conjunction with the gaussmeter probe and the gaussmeter probe bracket. The gaussmeter probe can move according to the position of the gaussmeter probe bracket. The gaussmeter probe bracket can adjust the height up and down. The gaussmeter probe bracket rod is engraved with a scale, and the height direction can be measured. The gaussmeter probe and the desktop gaussmeter are connected with a data line, and the desktop gaussmeter can linearly convert the magnitude of the magnetic field strength into a voltage signal. The data acquisition device is composed of a data acquisition system host and a data acquisition card. The measurement and processing circuit can be designed by itself according to the electronic components to be measured, and the final voltage and current signals are connected to the data acquisition device and finally transmitted to the computer.

[0040] In this embodiment, the data collector can measure signals such as voltage, current, and temperature. The sample parameters that need to be measured can be converted into voltage signals using corresponding sensors and the measurement processing circuit and connected to the data collector. The data collector has multiple interfaces reserved for easy expansion.

[0041] In this embodiment, an emergency switch and a safety resistor are arranged in the measurement and processing circuit. The main function of the emergency switch is to disconnect the measurement and processing circuit and the main power supply when the test sample is disassembled and assembled and a short circuit occurs. The main function of the safety resistor is to limit the current to prevent large current from burning the entire system.

[0042] In summary, the uniform magnetic field magnetoelectric testing and observation device provided by the present invention can generate a relatively uniform magnetic field, and simultaneously perform microscopic observation and macroscopic magnetoelectric performance testing of small magnetic electronic components inside the magnetic field. The device provided by the present invention integrates macroscopic and microscopic performance testing in one, and can compare microscopic structures and macroscopic signals, which improves the detection efficiency of microscopic electronic components and provides convenience for testing microcomputer electromagnetic and electrical systems. In addition, the uniform magnetic field magnetoelectric testing and observation device is also provided with functions such as random sampling, image measurement, closed-loop control, module expansion, and protection circuit, which facilitates scientific research such as uniform magnetic field magnetoelectric testing and observation.

[0043] It should be understood that the application of the present invention is not limited to the above examples. For ordinary technicians in this field, improvements or changes can be made based on the above description. All these improvements and changes should fall within the scope of protection of the claims attached to the present invention.

Claims

1. A uniform magnetic field magnetoelectric testing and observation device, characterized in that: It includes a loading platform, an optical observation system, a magnetic field generating system, and a magnetoelectric detection system; the optical observation system includes a monocular microscope arranged above the loading platform, a CCD camera arranged on the monocular microscope, and a computer electrically connected to the CCD camera; the magnetic field generating system includes at least one Helmholtz coil non-contactly sleeved on the loading platform and a DC programmable power supply electrically connected to the Helmholtz coil; the magnetoelectric detection system includes a precision programmable power supply, a desktop gaussmeter electrically connected to the precision programmable power supply, and a gaussmeter probe electrically connected to the desktop gaussmeter; The optical observation system further comprises a left carrier platform bracket and a right carrier platform bracket arranged below the carrier platform and used to support the carrier platform, the left carrier platform bracket is provided with a manual precision fine-tuning workbench, the left end of the carrier platform is fixed on the manual precision fine-tuning workbench, the right carrier platform bracket is provided with a horizontal slide rail, the right end of the carrier platform is fixed on the horizontal slide rail; The magnetic field generating system comprises two Helmholtz coils arranged between the left support of the loading platform and the right support of the loading platform, the two Helmholtz coils are arranged symmetrically at intervals, and the monocular microscope is located between the two Helmholtz coils; The inner diameter of the Helmholtz coil is 138 mm, the outer diameter is 242 mm, the center distance between the two Helmholtz coils is 58 mm, they are placed left and right, the enameled wire is 3.0 mm, the DC resistance is 0.98 ohms, the maximum current of the coil is 20 A, the center magnetic field strength is 30 mT at 20 A, and the uniformity of the center 20*20 mm position is 99%; The magnetoelectric detection system further comprises a data collector electrically connected to the table-top Gauss meter and the precision programmable power supply respectively, and the data collector is also electrically connected to the computer.

2. The uniform magnetic field magnetoelectric testing and observation device according to claim 1, characterized in that: The optical observation system further includes an adjustable light source disposed below the object-carrying platform, and a light source regulator electrically connected to the adjustable light source.

3. The uniform magnetic field magnetoelectric testing and observation device according to claim 1, characterized in that: The optical observation system also includes a fixed base, a bracket vertical rod fixedly arranged on the fixed base, a bracket horizontal rod arranged on the bracket vertical rod, a bracket slide rail arranged on the bracket horizontal rod, and a microscope bracket arranged on the bracket slide rail, wherein the microscope bracket is used to install a monocular microscope.

4. The uniform magnetic field magnetoelectric testing and observation device according to claim 1, characterized in that: The monocular microscope comprises a monocular microscope barrel and an objective lens installed below the monocular microscope barrel.

5. The uniform magnetic field magnetoelectric testing and observation device according to claim 1, characterized in that: The loading platform is provided with positioning holes.

6. The uniform magnetic field magnetoelectric testing and observation device according to claim 1, characterized in that: The magnetic field generating system further includes a temperature sensor for detecting the temperature of the Helmholtz coil, and a temperature alarm electrically connected to the temperature sensor.

7. The uniform magnetic field magnetoelectric testing and observation device according to claim 1, characterized in that: The magnetoelectric detection system also includes an instrument bracket and an instrument arranged on the instrument bracket.

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