Display device

Abstract

A display device includes: a substrate having a display area and a non-display area adjacent to the display area; a plurality of pixel columns arranged in the display area on the substrate; and a lighting inspection circuit unit arranged in the non-display area on the substrate, including a plurality of lighting inspection transistors, for supplying a lighting inspection voltage to the plurality of pixel columns. Each lighting inspection transistor includes: an active pattern arranged in the non-display area on the substrate and having a source region, a drain region, and a channel region; a gate electrode arranged in the channel region on the active pattern; an interlayer insulating layer covering the gate electrode and including a first contact hole provided to expose a portion of the source region of the active pattern and spaced at least 7 μm from a first side surface of the gate electrode; and a source electrode contacting the source region of the active pattern through the first contact hole.

Description

Technical Field

[0001] The present invention relates to a display device, and more particularly to a display device with improved display quality. Background Art

[0002] The display device may include pixels and may display an image based on signals and voltages supplied to the pixels.

[0003] On the other hand, a lighting inspection can be used to detect whether the display device is damaged (for example, whether the wiring, pixels, etc. are damaged). In this case, a lighting inspection transistor for lighting inspection is formed in the display device, but due to static electricity generated during the manufacturing process of the display device, insulation breakdown may occur in the lighting inspection transistor. If insulation breakdown occurs, the insulating layer loses its insulation and becomes conductive, and a short circuit may occur in the lighting inspection transistor. When driving the display device, since the data voltage is provided to the pixel through the lighting inspection transistor, the display quality of the display device may be reduced due to the short circuit phenomenon. Summary of the Invention

[0004] An object of the present invention is to provide a display device with improved display quality.

[0005] However, the purpose of the present invention is not limited to the above-mentioned purpose, and can be expanded in various ways without departing from the scope of the idea and field of the present invention.

[0006] In order to achieve the purpose of the present invention, the display device involved in each embodiment of the present invention may include: a substrate, having a display area and a non-display area adjacent to the display area; a plurality of pixel columns, arranged in the display area on the substrate; and a lighting inspection circuit unit, arranged in the non-display area on the substrate, including a plurality of lighting inspection transistors, and providing a lighting inspection voltage to the plurality of pixel columns, each of the lighting inspection transistors including: an active pattern, arranged in the non-display area on the substrate, and having a source region, a drain region and a channel region; a gate electrode, arranged in the channel region on the active pattern; an interlayer insulating layer, covering the gate electrode, and including a first contact hole that exposes a portion of the source region of the active pattern and is spaced apart from the first side of the gate electrode by more than 7μm; and a source electrode, contacting the source region of the active pattern through the first contact hole.

[0007] According to one embodiment, the interlayer insulating layer may further include: a second contact hole, exposing a portion of the drain region of the active pattern, and the second contact hole is set at a distance of more than 7 μm from the second side of the gate electrode, and each of the lighting check transistors further includes: a drain electrode, contacting the drain region of the active pattern through the second contact hole.

[0008] According to an embodiment, the distance between the first side surface of the gate electrode and the first contact hole may be the same as the distance between the second side surface of the gate electrode and the second contact hole.

[0009] According to an embodiment, a length between the first side surface and the second side surface of the gate electrode may be 3 μm to 4 μm.

[0010] According to an embodiment, the distance between the first contact hole and the second contact hole may be greater than 17 μm.

[0011] According to one embodiment, each of the lighting inspection transistors may further include: a gate insulating layer, which is located between the substrate and the interlayer insulating layer and covers the active pattern, and the first contact hole and the second contact hole pass through the gate insulating layer to expose the source region and the drain region of the active pattern respectively.

[0012] According to one embodiment, the display device may further include a data driving unit disposed in the non-display area on the substrate and generating a data voltage, and the lighting inspection circuit unit may be disposed between the plurality of pixel columns and the data driving unit.

[0013] According to one embodiment, the display device may further include: a multiplexer, wherein the non-display area on the substrate is arranged between the lighting inspection circuit unit and the plurality of pixel columns, and the multiplexer receives the data voltage from the data driving unit and provides the data voltage to the plurality of pixel columns.

[0014] According to an embodiment, the source electrode may be disposed adjacent to the data driving unit, and the drain electrode may be disposed adjacent to the demultiplexer.

[0015] According to one embodiment, the display device may further include: an anti-static circuit unit, which is arranged in the non-display area on the substrate and is electrically connected to the lighting check circuit unit, and measures the voltage level of the lighting check voltage. When the anti-static circuit unit measures that the voltage level of the lighting check voltage is higher than a preset voltage level, the lighting check voltage is not provided to the lighting check transistor.

[0016] According to an embodiment, the maximum distance between the first side surface of the gate electrode and the first contact hole may be determined corresponding to the preset voltage.

[0017] According to one embodiment, the multiple pixel columns may include: a first pixel column, which repeatedly arranges first pixels displaying a first color and second pixels displaying a second color; a second pixel column, which arranges third pixels displaying a third color; and a third pixel column, which repeatedly arranges the second pixels and the first pixels.

[0018] According to one embodiment, the lighting inspection circuit unit may alternately apply the lighting inspection voltage to the first pixels and the second pixels included in the first pixel column and the third pixel column.

[0019] According to one embodiment, the multiple light-up check transistors include a first light-up check transistor, a second light-up check transistor, and a third light-up check transistor, the first light-up check transistor and the second light-up check transistor are electrically connected to the first pixel column and the third pixel column, and the third light-up check transistor is electrically connected to the second pixel column.

[0020] According to one embodiment, the light-on check voltage may include a first light-on check voltage, a second light-on check voltage and a third light-on check voltage, the first light-on check transistor provides the first light-on check voltage to the first pixel in response to a first check control signal, the second light-on check transistor provides the second light-on check voltage to the second pixel in response to a second check control signal, and the third light-on check transistor provides the third light-on check voltage to the third pixel in response to a third check control signal.

[0021] According to one embodiment, the display device may further include: a data driving unit that generates data voltages provided to the multiple pixel columns; a gate driving unit that generates scan signals provided to the multiple pixel columns; and a timing control unit that generates control signals for controlling the data driving unit and the gate driving unit.

[0022] (Effects of the Invention)

[0023] The display device involved in each embodiment of the present invention may include a lighting inspection transistor having a first distance of 7μm or more. As a result, the charge mobility of the lighting inspection transistor can be reduced, and the insulation breakdown phenomenon caused by static electricity generated during the manufacturing process of the display device can be avoided. Therefore, the display device can perform a lighting inspection, and the lighting inspection can detect whether the display device is damaged (for example, whether the wiring, pixels, etc. are damaged, etc.). In addition, since the lighting inspection transistor will not be short-circuited, the display quality can be improved when driving the display device.

[0024] However, the effects of the present invention are not limited to the above-mentioned effects, and various extensions can be made without departing from the spirit and scope of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 and Figure 2 The figures are used to explain the manufacturing process of the display device according to each embodiment of the present invention.

[0026] Figure 3 The figures show display devices according to various embodiments of the present invention.

[0027] Figure 4 Yes Figure 3 A circuit diagram of a display device.

[0028] Figure 5 Is used to illustrate Figure 3 A plan view of a lighting inspection transistor included in a display device.

[0029] Figure 6 It is along Figure 5 A cross-sectional view taken along line II'.

[0030] Figure 7 yes Figure 3 Block diagram of a display device.

[0031] Explanation of symbols:

[0032] 1000: display device; 10: mother substrate; 20: mask; 100: substrate; 110, 120, 130: first to third pixel columns; 200: lighting inspection circuit unit; 300: multiplexer; 400: data driving unit; 500: anti-static circuit unit; DL: data line; TR1, TR2, TR3: first to third lighting inspection transistors; 240: active pattern; 260: gate electrode; 280: source electrode; 290: drain electrode; 281: first contact hole; 282: second contact hole; 600: display panel; 700: gate driving unit; 800: timing control unit. DETAILED DESCRIPTION

[0033] Hereinafter, various embodiments of the present invention will be described in more detail with reference to the accompanying drawings. The same reference numerals are used for the same components in the drawings, and repeated description of the same components will be omitted.

[0034] Figure 1 and Figure 2 A diagram for explaining the manufacturing process of a display device.

[0035] Reference Figure 1 and Figure 2 , the mother substrate 10 can be arranged in a lattice shape to form Figure 3 After aligning the mother substrate 10 and the mask 20 having a plurality of openings, the deposition material 31 is deposited from the deposition source 30 through the plurality of openings onto the unit region 40 of the mother substrate 10. Here, the unit region 40 may include Figure 3 The display area DA and Figure 3 For example, the deposition material 31 may be a pixel (eg, Figure 3 Organic matter included in PX).

[0036] In one embodiment, a plurality of pixel transistors disposed below the organic material may be configured in the display area DA, and a plurality of lighting inspection transistors (for example, Figure 4 TR1, TR2, or TR3). At this time, while aligning the mother substrate 10 and the mask 20, the central portion A of the mother substrate 10 may sink. As the central portion A of the mother substrate 10 sinks, it may approach or come into contact with the mask 20. In this case, static electricity may be generated in the central portion A of the mother substrate 10 that is in proximity to or in contact with the metal mask 20, potentially damaging the lighting inspection transistor located in the central portion A.

[0037] For example, in order to align the mother substrate 10 and the mask 20 in a row, the alignment speed of the mother substrate 10 can be set to about 300 mm / s, and the distance between the mother substrate 10 and the mask 20 can be set to about 5 mm. In this case, static electricity with a voltage level of about 500 V may be generated in the central portion A of the mother substrate 10. As a result, insulation breakdown may occur in the lighting inspection transistor of the display device 1000 manufactured in the unit area 40 located in the central portion A of the mother substrate 10. If insulation breakdown occurs, the insulating layer (for example, Figure 6The gate insulating layer 250 or the interlayer insulating layer 270 may lose its insulating properties and become conductive, which may cause a short circuit in the lighting inspection transistor. When the display device 1000 is driven, the display quality of the display device 1000 may be degraded due to the short circuit because the data voltage is supplied to the pixel through the lighting inspection transistor.

[0038] Figure 3 The figures show display devices according to various embodiments of the present invention.

[0039] Reference Figure 3 , for example, in Figure 1 and Figure 2 The plurality of unit regions 40 shown can each form a display device 1000, and by performing unit cutting, the display device 1000 can be separated from the mother substrate 10. The display device 1000 may include a substrate 100, a plurality of data lines DL, a plurality of pixel columns 110, 120, and 130, a lighting inspection circuit unit 200, a demultiplexer 300, a data driving unit 400, and an anti-static circuit unit 500.

[0040] The substrate 100 may have a display area DA and a non-display area NDA disposed adjacent to the display area DA.

[0041] A plurality of data lines DL may be configured in the display area DA on the substrate 100. For example, the plurality of data lines DL may extend in a column direction and may be arranged side by side in a row direction perpendicular to the column direction. The plurality of data lines DL may be electrically connected to the pixel columns 110, 120, and 130, respectively.

[0042] The pixel columns 110, 120, and 130 may be arranged in parallel with the plurality of data lines DL. Each of the pixel columns 110, 120, and 130 may include a plurality of pixels PX. When performing a lighting test of the display device 1000, each pixel PX may emit light in response to a lighting test voltage supplied through the plurality of data lines DL.

[0043] In one embodiment, the pixel columns 110, 120, and 130 may include a first pixel column 110, a second pixel column 120, and a third pixel column 130. The first pixel column 110 may include a first pixel R displaying a first color and a second pixel B displaying a second color. The first pixel R and the second pixel B may be repeatedly arranged in the first pixel column 110. The second pixel column 120 may include a third pixel G displaying a third color. The third pixel G may be repeatedly arranged in the second pixel column 120. The third pixel column 130 may include a first pixel R and a second pixel B. The first pixel R and the second pixel B may be repeatedly arranged in the third pixel column 130. In this case, the first pixel R and the second pixel B included in the third pixel column 130 are arranged in the opposite order to the first pixel R and the second pixel B included in the first pixel column 110. For example, the first color may be red, the second color may be blue, and the third color may be green.

[0044] In one embodiment, if Figure 3 As shown, the display area DA on the substrate 100 can repeatedly configure the first pixel column 110, the second pixel column 120, the third pixel column 130 and the second pixel column 120. On the other hand, the order of configuring the pixel columns 110, 120, and 130 is not limited to this, and although Figure 3 Although eight pixel columns 110 , 120 , and 130 are shown in FIG, the number of pixel columns 110 , 120 , and 130 is not limited thereto.

[0045] The lighting inspection circuit unit 200 may be disposed in the non-display area NDA on the substrate 100. The lighting inspection circuit unit 200 may provide a lighting inspection voltage to the pixel columns 110, 120, and 130 through the plurality of data lines DL when performing a lighting inspection of the display device 1000.

[0046] In one embodiment, the lighting inspection circuit unit 200 may alternately apply lighting inspection voltages to the first pixel R and the second pixel B included in the first pixel column 110 and the third pixel column 130. For example, the lighting inspection circuit unit 200 may apply a first lighting inspection voltage to cause the first pixel R to emit light, thereby detecting a lighting failure of the first pixel R. Then, the lighting inspection circuit unit 200 may apply a second lighting inspection voltage to cause the second pixel B to emit light, thereby detecting a lighting failure of the second pixel B.

[0047] In one embodiment, the lighting inspection circuit unit 200 may apply a lighting inspection voltage to the third pixel G included in the second pixel column 120. For example, the lighting inspection circuit unit 200 may apply a third lighting inspection voltage to cause the third pixel G to emit light, thereby detecting lighting failure of the third pixel G.

[0048] The lighting inspection circuit unit 200 may not operate when the display device 1000 is driven. For example, when the display device 1000 is driven, the display device 1000 may turn off the lighting inspection transistor included in the lighting inspection circuit unit 200.

[0049] The demultiplexer 300 may be disposed between the lighting inspection circuit unit 200 and the pixel columns 110, 120, and 130 in the non-display area NDA on the substrate 100. When driving the display device 1000, the demultiplexer 300 may receive a data voltage from the data driving unit 400 and apply the data voltage to the pixel columns 110, 120, and 130 through a plurality of data lines DL.

[0050] The data driver 400 can generate the data voltages and provide the data voltages to the pixel columns 110, 120, and 130 via the demultiplexer 300 and a plurality of data lines DL when driving the display device 1000. In one embodiment, the data driver 400 can be disposed in a non-display area NDA on the substrate 100. In other embodiments, the data driver 400 can also be disposed on a flexible printed circuit board (FPCB) in a COF (chip-on-film) form.

[0051] The anti-static circuit portion 500 may be disposed in the non-display area NDA on the substrate 100. Figure 4 The anti-static circuit portion 500 will be described in detail.

[0052] Figure 4 Yes Figure 3 A circuit diagram of a display device.

[0053] Reference Figure 3 and Figure 4 The lighting inspection circuit unit 200 may include first to third lighting inspection transistors TR1 to TR3. When performing a lighting inspection of the display device 1000, the first to third lighting inspection transistors TR1 to TR3 may provide a lighting inspection voltage to the first to third pixels R to B. To this end, the first and second lighting inspection transistors TR1 and TR2 may be electrically connected to the first and third pixel columns 110 and 130, and the third lighting inspection transistor TR3 may be electrically connected to the second pixel column 120.

[0054] The first light-up check transistor TR1 may provide a first light-up check voltage LS_R to the first pixel R in response to a first check control signal LCS_R. The first check control signal LCS_R may have a voltage level that turns the first light-up check transistor TR1 on and off, and the first light-up check voltage LS_R may have a voltage level that causes the first pixel R to emit light. For example, a gate terminal of the first light-up check transistor TR1 may receive the first check control signal LCS_R, a source terminal may receive the first light-up check voltage LS_R, and a drain terminal may provide the first light-up check voltage LS_R to the first pixel column 110 or the third pixel column 130.

[0055] The second light-up check transistor TR2 may provide a second light-up check voltage LS_B to the second pixel B in response to a second check control signal LCS_B. The second check control signal LCS_B may have a voltage level that turns on and off the second light-up check transistor TR2, and the second light-up check voltage LS_B may have a voltage level that causes the second pixel B to emit light. For example, a gate terminal of the second light-up check transistor TR2 may receive the second check control signal LCS_B, a source terminal may receive the second light-up check voltage LS_B, and a drain terminal may provide the second light-up check voltage LS_B to the first pixel column 110 or the third pixel column 130.

[0056] The first pixel R can receive the first lighting check voltage LS_R to emit light, and the second pixel B can receive the second lighting check voltage LS_B to emit light. For example, the voltage level of the first lighting check voltage LS_R can be higher than the voltage level of the second lighting check voltage LS_B. In addition, as described above, the lighting check circuit unit 200 can alternately apply the first lighting check voltage LS_R and the second lighting check voltage LS_B to the first pixel R and the second pixel B. To this end, the first check control signal LCS_R and the second check control signal LCS_B can be alternately provided to the first lighting check transistor TR1 and the second lighting check transistor TR2, respectively.

[0057] The third light-up check transistor TR3 may provide a third light-up check voltage LS_G to the third pixel G in response to a third check control signal LCS_G. The third check control signal LCS_G may have a voltage level that turns the third light-up check transistor TR3 on and off, and the third light-up check voltage LS_G may have a voltage level that causes the third pixel G to emit light. For example, a gate terminal of the third light-up check transistor TR3 may receive the third check control signal LCS_G, a source terminal may receive the third light-up check voltage LS_G, and a drain terminal may provide the third light-up check voltage LS_G to the second pixel column 120.

[0058] The demultiplexer 300 may include a plurality of control transistors that may provide data voltages to the first to third pixels R to B in response to control signals CS_1 and CS_2 when the display device 1000 is driven.

[0059] As described above, when driving the display device 1000 , the data driving part 400 may generate the data voltage and provide the data voltage to the first to third pixels R to B through the demultiplexer 300 and the plurality of data lines DL.

[0060] The anti-static circuit unit 500 may be electrically connected to the lighting check circuit unit 200 and may measure the voltage levels of the first to third lighting check voltages LS_R to LS_G supplied to the lighting check circuit unit 200. If the anti-static circuit unit 500 measures that the voltage level of at least one of the first to third lighting check voltages LS_R to LS_G is higher than a predetermined voltage level, the at least one lighting check voltage may not be supplied to the first to third lighting check transistors TR1 to TR3. In other words, static electricity may be generated on at least one of the plurality of wirings that transmit the first to third lighting check voltages LS_R to LS_G, and the anti-static circuit unit 500 may not supply the static electricity generated on the wiring to the first to third lighting check transistors TR1 to TR3. For example, when the preset voltage level set in the anti-static circuit portion 500 is approximately 6.5V and the voltage level of the voltage transmitted through the at least one wiring is approximately 7V, the anti-static circuit portion 500 may not provide the voltage of approximately 7V to the first to third lighting check transistors TR1 to TR3.

[0061] Figure 5 Is used to illustrate Figure 3 A plan view of a display device including a light-up inspection transistor, Figure 6 It is along Figure 5 A cross-sectional view taken along line II'.

[0062] Reference Figure 3 、 Figure 4 、 Figure 5 and Figure 6 The first to third light-up inspection transistors TR1 to TR3 may respectively include an active pattern 240 , a gate insulating layer 250 , a gate electrode 260 , an interlayer insulating layer 270 , a source electrode 280 , and a drain electrode 290 .

[0063] A buffer layer 230 , an active pattern 240 , a gate insulating layer 250 , a gate electrode 260 , an interlayer insulating layer 270 , a source electrode 280 , and a drain electrode 290 may be sequentially disposed on the substrate 100 .

[0064] The buffer layer 230 may be disposed on the substrate 100. The buffer layer 230 may prevent metal atoms or impurities from diffusing from the substrate 100 to the active pattern 240. Furthermore, the buffer layer 230 may regulate the heat transfer rate during the crystallization process used to form the active pattern 240, thereby ensuring uniform formation of the active pattern 240. Alternatively, in other embodiments, the display device 1000 may not include the buffer layer 230.

[0065] The active pattern 240 may be disposed on the buffer layer 230. In one embodiment, the active pattern 240 may include a silicon semiconductor such as amorphous silicon or polycrystalline silicon, or a metal oxide semiconductor.

[0066] The active pattern 240 may include a source region 243, a drain region 245, and a channel region 241 between the source region 243 and the drain region 245. Impurities may be doped into the source region 243 and the drain region 245 of the active pattern 240. Thus, the channel region 241 of the active pattern 240 may have lower conductivity and higher resistance than the source region 243 and the drain region 245.

[0067] The gate insulating layer 250 may be interposed between the substrate 100 and the interlayer insulating layer 270 and cover the active pattern 240. The first contact hole 281 and the second contact hole 291 may penetrate the gate insulating layer 250, respectively exposing a portion of the source region 243 and the drain region 245 of the active pattern 240. The gate insulating layer 250 may include an insulating material. For example, the gate insulating layer 250 may be formed of silicon oxide, silicon nitride, titanium oxide, tantalum oxide, etc.

[0068] The gate electrode 260 may be disposed in the channel region 241 on the gate insulating layer 250. The gate electrode 260 may include a metal, an alloy, a conductive metal oxide, or the like. For example, the gate electrode 260 may include gold (Au), silver (Ag), copper (Cu), nickel (Ni), chromium (Cr), aluminum (Al), tungsten (W), molybdenum (Mo), titanium (Ti), tantalum (W), or an alloy thereof, and may have a single-layer structure or a multi-layer structure including different metal layers. On the other hand, the gate electrode 260 may correspond to the reference Figure 4 Description of the gate terminal.

[0069] On the other hand, the gate electrode 260 may include a first side surface and a second side surface opposite to the first side surface. Figure 5As shown, the gate electrode 260 may include a first side surface facing the source electrode 280 and a second side surface opposite the first side surface and facing the drain electrode 290. In other words, the distance between the first side surface and the second side surface may be equal to the length LEN of the gate electrode 260.

[0070] Interlayer insulating layer 270 may cover gate electrode 260 and may be formed with a portion of first contact hole 281 and a portion of second contact hole 291. In other words, a first portion of gate insulating layer 250 and interlayer insulating layer 270 may be removed to form first contact hole 281, and a second portion of gate insulating layer 250 and interlayer insulating layer 270 may be removed to form second contact hole 291. That is, gate insulating layer 250 and interlayer insulating layer 270 may include first contact hole 281 and second contact hole 291. Interlayer insulating layer 270 may include an insulating material. For example, interlayer insulating layer 270 may be formed of silicon oxide, silicon nitride, titanium oxide, tantalum oxide, or the like.

[0071] The first contact hole 281 may expose a portion of the source region 243 of the active pattern 240 and be spaced approximately 7 μm or more from the first side of the gate electrode 260. In other words, a first distance DIS_1 between the gate electrode 260 and the first contact hole 281 may be approximately 7 μm or more.

[0072] The second contact hole 291 may expose a portion of the drain region 245 of the active pattern 240 and be spaced approximately 7 μm or more from the second side of the gate electrode 260. In other words, a second distance DIS_2 between the gate electrode 260 and the second contact hole 291 may be approximately 7 μm or more.

[0073] In one embodiment, the distance between the first contact hole 281 and the second contact hole 291 may be greater than about 17 μm.

[0074] The source electrode 280 may be disposed on the interlayer insulating layer 270 and may contact the source region 243 of the active pattern 240 through the first contact hole 281. The source electrode 280 may include a metal, an alloy, a conductive metal oxide, or the like. For example, the source electrode 280 may include Au, Ag, Cu, Ni, Cr, Al, W, Mo, Ti, Ta, or an alloy thereof, and may have a single-layer structure or a multi-layer structure including different metal layers. In addition, the source electrode 280 may correspond to the reference electrode 280. Figure 4 Thus, the source electrode 280 may be disposed adjacent to the data driving unit 400 and electrically connected to the data driving unit 400 , thereby receiving a data voltage from the data driving unit 400 .

[0075] The drain electrode 290 may be disposed on the interlayer insulating layer 270 and may contact the drain region 245 of the active pattern 240 through the second contact hole 291. The drain electrode 290 may include a metal, an alloy, a conductive metal oxide, etc. In one embodiment, the drain electrode 290 may be formed together with the source electrode 280 and may include the same material as the source electrode 280. In addition, the drain electrode 290 may correspond to the reference electrode 280. Figure 4 Thus, the drain electrode 290 may be disposed adjacent to the demultiplexer 300 and electrically connected to the demultiplexer 300 , thereby providing the demultiplexer 300 with a data voltage.

[0076] The charge mobility of the first lighting check transistor TR1 can be determined by the length of each component forming the first lighting check transistor TR1 and the distance between each component. For example, as the first distance DIS_1 between the first contact hole 281 filled by the source electrode 280 and the first side surface of the gate electrode 260 and the second distance DIS_2 between the second contact hole 291 filled by the drain electrode 290 and the second side surface of the gate electrode 260 increase, the distance that charge moves from the source region 243 to the drain region 245 can increase. Therefore, as the first distance DIS_1 and the second distance DIS_2 increase, the charge mobility of the first lighting check transistor TR1 can decrease. In addition, the longer the length LEN of the channel region 241, which has a greater resistance than the source region 243 and the drain region 245, the lower the charge mobility of the first lighting check transistor TR1 can be.

[0077] On the other hand, as described above, in the manufacturing process of the display device 1000, as the mother substrate ( Figure 1 and Figure 2 The central part of 10) ( Figure 1 and Figure 2 A) sinks, the central portion may be aligned with the mask ( Figure 1 and Figure 2 20) are close to or in contact with each other, which may generate static electricity with a voltage level of approximately 500V in the central portion. To prevent dielectric breakdown of the first lighting test transistor TR1 due to this static electricity, the first distance DIS_1 and the second distance DIS_2 of the first lighting test transistor TR1 can be respectively greater than approximately 7μm. In other words, by designing the first lighting test transistor TR1 with a first distance DIS_1 or a second distance DIS_2 greater than approximately 7μm, the charge mobility of the first lighting test transistor TR1 can be reduced, thereby preventing dielectric breakdown of the first lighting test transistor TR1.

[0078] In one embodiment, the length LEN of the gate electrode 260 may be approximately 3 μm to approximately 4 μm. The first lighting inspection transistor TR1 includes the gate electrode 260 having a length LEN of approximately 3 μm to approximately 4 μm, thereby reducing charge mobility of the first lighting inspection transistor TR1 and preventing insulation breakdown of the first lighting inspection transistor TR1.

[0079] Table 1 below shows whether dielectric breakdown occurs in the first lighting check transistor TR1 based on changes in the first distance DIS_1 and the second distance DIS_2 when the gate electrode 260 length LEN is approximately 3.5 μm. As shown in the table below, dielectric breakdown occurs in the first lighting check transistor TR1 when the first distance DIS_1 and the second distance DIS_2 are approximately 3.2 μm, approximately 3.3 μm, approximately 3.5 μm, and approximately 6 μm, respectively (i.e., events 1 through 4). Conversely, dielectric breakdown does not occur in the first lighting check transistor TR1 when the first distance DIS_1 and the second distance DIS_2 are approximately 7 μm, approximately 8.7 μm, and approximately 11 μm, respectively (i.e., events 5 through 7).

[0080]

[0081]

[0082] In one embodiment, the maximum distances of the first distance DIS_1 and the second distance DIS_2 of the first lighting check transistor TR1 can be determined in accordance with the preset voltage set in the anti-static circuit unit 500. For example, the maximum distances of the first distance DIS_1 and the second distance DIS_2 of the first lighting check transistor TR1 can be approximately 11 μm. As described above, if the anti-static circuit unit 500 measures a lighting check voltage that is higher than a preset voltage level, the lighting check voltage may not be supplied to the first to third lighting check transistors TR1 to TR3. For example, the preset voltage level of the anti-static circuit unit 500 may be approximately 6.5 V. If the first distance DIS_1 or the second distance DIS_2 of the first lighting check transistor TR1 is greater than approximately 11 μm, the charge mobility of the first lighting check transistor TR1 may decrease. As a result, the first lighting check transistor TR1 may be unable to transmit a lighting check voltage having a voltage level below approximately 6.5 V, and the display device 1000 may be unable to perform a lighting check.

[0083] In one embodiment, the first distance DIS_1 and the second distance DIS_2 may be the same. For example, if the first distance DIS_1 is shorter than the second distance DIS_2, the distance that charges move from the source region 243 to the channel region 241 may be shorter than the distance that charges move from the channel region 241 to the drain region 245. In this case, static electricity generated during the manufacturing process of the display device 1000 may be concentrated on the source region 243, thereby causing insulation breakdown in the first lighting inspection transistor TR1. To prevent static electricity from being concentrated on the source region 243 or the drain region 245, the first distance DIS_1 and the second distance DIS_2 may be the same.

[0084] On the other hand, the structures of the second lighting check transistor TR2 and the third lighting check transistor TR3 can be substantially the same as the first lighting check transistor TR1 described above. Furthermore, a display layer can be disposed on the source electrode 280 and the drain electrode 290. In one embodiment, when the display device 1000 is a liquid crystal display device, the display layer can include a first electrode, a second electrode, and a liquid crystal layer disposed between the first and second electrodes. In other embodiments, when the display device 1000 is an organic light-emitting display device, the display layer can include a first electrode, a second electrode, and an organic light-emitting layer disposed between the first and second electrodes.

[0085] Figure 7 yes Figure 3 Block diagram of a display device.

[0086] Reference Figure 3 and Figure 7 The display device 1000 may include a display panel 600 , a data driving unit 400 , a gate driving unit 700 , and a timing control unit 800 .

[0087] The display panel 600 may include a plurality of data lines DL, a plurality of gate lines, a plurality of pixels PX connected to the plurality of data lines DL and the gate lines, a lighting inspection circuit unit 200, a demultiplexer 300, and an anti-static circuit unit 500. The display panel 600 may receive a data voltage DS through the plurality of data lines DL and a gate signal GS through the plurality of gate lines.

[0088] The gate lines may be arranged in a display area DA on the substrate 100. For example, the gate lines may extend in a row direction and be arranged side by side in a column direction perpendicular to the row direction. A plurality of pixels PX may be formed in the areas where the gate lines intersect with the data lines DL.

[0089] The data driving unit 400 can generate a data voltage DS based on the image data RGB' and the data control signal DCTRL provided by the timing driving unit 800, and can provide the data voltage DS to the plurality of pixels PX through the plurality of data lines DL. For example, the data control signal DCTRL may include an output data strobe signal, a horizontal start signal, and a load signal.

[0090] The gate driver 700 can generate a gate signal GS based on the gate control signal GCTRL provided by the timing control unit 800, and can provide the gate signal GS to the plurality of pixels PX via the plurality of gate lines. For example, the gate control signal GCTRL may include a vertical start signal, a clock signal, etc. For example, the gate driver 700 can be directly mounted on the non-display area NDA of the substrate 100. In other embodiments, the gate driver 700 can be configured on an FPCB in a COF form factor.

[0091] The timing control unit 800 can receive input image data RGB and a control signal CTRL from the outside. For example, the input image data RGB can be RGB data including red image data, green image data, and blue image data. The control signal CTRL can include a vertical synchronization signal, a horizontal synchronization signal, an input data selection signal, a main clock signal, etc. The timing control unit 800 can generate a gate control signal GCTRL, a data control signal DCTRL, and image data RGB' based on the input image data RGB and the control signal CTRL. In addition, the timing control unit 800 can provide the gate control signal GCTRL to the gate driver 700 and can provide the data control signal DCTRL and image data RGB' to the data driver 400.

[0092] The display device 1000 according to various embodiments of the present invention may include first to third lighting inspection transistors TR1 to TR3 having a first distance DIS_1 of 7 μm or greater. As a result, the charge mobility of the first to third lighting inspection transistors TR1 to TR3 can be reduced, and insulation breakdown due to static electricity generated during the manufacturing process of the display device 1000 will not occur. Therefore, the display device 1000 can perform a lighting inspection, and the lighting inspection can detect whether the display device 1000 is damaged (for example, whether the wiring, pixel PX, etc. are damaged). In addition, the first to third lighting inspection transistors TR1 to TR3 will not be short-circuited, thereby improving the display quality when driving the display device 1000.

[0093] (Industrial Applicability)

[0094] The present invention can be applied to display devices and electronic devices including the same. For example, the present invention can be applied to high-resolution smartphones, mobile phones, smart tablets, smart watches, tablet PCs, car navigation systems, televisions, computer monitors, laptop computers, and the like.

[0095] The present invention has been described above with reference to exemplary embodiments. However, those skilled in the art will appreciate that the present invention can be modified and altered in various ways without departing from the spirit and scope of the invention as described in the claims.

Claims

1. A display device comprising: a substrate having a display area and a non-display area adjacent to the display area; a plurality of pixel columns arranged in the display area on the substrate; as well as a lighting inspection circuit unit, which is arranged in the non-display area on the substrate, includes a plurality of lighting inspection transistors and supplies a lighting inspection voltage to the plurality of pixel columns; Each of the lighting inspection transistors includes: an active pattern, disposed in the non-display area on the substrate, and comprising a source region, a drain region, and a channel region; a gate electrode, disposed on the active pattern and overlapping the channel region; an interlayer insulating layer covering the gate electrode and including a first contact hole that exposes a portion of the source region of the active pattern and is spaced apart from the first side surface of the gate electrode by more than 7 μm; and A source electrode contacts the source region of the active pattern through the first contact hole.

2. The display device according to claim 1, wherein The interlayer insulating layer further includes a second contact hole exposing a portion of the drain region of the active pattern, and the second contact hole is provided at a distance of 7 μm or more from the second side surface of the gate electrode. Each of the lighting inspection transistors further includes a drain electrode contacting the drain region of the active pattern through the second contact hole.

3. The display device according to claim 2, wherein The first side surface of the gate electrode is spaced apart from the first contact hole by the same distance as the second side surface of the gate electrode is spaced apart from the second contact hole.

4. The display device according to claim 2, wherein: A length between the first side and the second side of the gate electrode is 3 μm to 4 μm.

5. The display device according to claim 2, wherein The distance between the first contact hole and the second contact hole is greater than 17 μm.

6. The display device according to claim 2, wherein: Each of the lighting inspection transistors further includes: a gate insulating layer, interposed between the substrate and the interlayer insulating layer and covering the active pattern, The first contact hole and the second contact hole penetrate the gate insulating layer to expose the source region and the drain region of the active pattern, respectively.

7. The display device according to claim 2, further comprising: a data driving unit, disposed in the non-display area on the substrate, and generating a data voltage; The lighting inspection circuit unit is arranged between the plurality of pixel columns and the data driving unit.

8. The display device according to claim 7, further comprising: A demultiplexer is disposed between the lighting inspection circuit unit and the plurality of pixel columns in the non-display area on the substrate. The demultiplexer receives the data voltage from the data driving part and provides the data voltage to the plurality of pixel columns.

9. The display device according to claim 8, wherein: The source electrode is disposed adjacent to the data driving part, and the drain electrode is disposed adjacent to the demultiplexer.

10. The display device according to claim 1, further comprising: an antistatic circuit portion, disposed in the non-display region on the substrate, electrically connected to the lighting inspection circuit portion, and configured to measure a voltage level of the lighting inspection voltage; When the anti-static circuit portion measures that the voltage level of the lighting inspection voltage is higher than a preset voltage level, the lighting inspection voltage is not supplied to the lighting inspection transistor.

11. The display device according to claim 10, wherein: A maximum distance between the first side surface of the gate electrode and the first contact hole is determined corresponding to the preset voltage.

12. The display device according to claim 1, wherein The plurality of pixel columns include: A first pixel column repeatedly arranges first pixels displaying a first color and second pixels displaying a second color; a second pixel column in which third pixels displaying a third color are arranged; and The third pixel column repeatedly arranges the second pixels and the first pixels.

13. The display device according to claim 12, wherein: The lighting inspection circuit section alternately applies the lighting inspection voltage to the first pixels and the second pixels included in the first pixel column and the third pixel column.

14. The display device according to claim 13, wherein: The plurality of lighting check transistors include a first lighting check transistor, a second lighting check transistor, and a third lighting check transistor. The first lighting check transistor and the second lighting check transistor are electrically connected to the first pixel column and the third pixel column. The third lighting check transistor is electrically connected to the second pixel column.

15. The display device according to claim 14, wherein: The lighting inspection voltage includes a first lighting inspection voltage, a second lighting inspection voltage, and a third lighting inspection voltage. The first lighting inspection transistor provides the first lighting inspection voltage to the first pixel in response to a first inspection control signal. The second lighting inspection transistor provides the second lighting inspection voltage to the second pixel in response to a second inspection control signal. The third light-up inspection transistor provides the third light-up inspection voltage to the third pixel in response to a third inspection control signal.

16. The display device according to claim 1, further comprising: a data driving unit for generating data voltages to be supplied to the plurality of pixel columns; a gate driving unit, generating a scanning signal provided to the plurality of pixel columns; as well as The timing control unit generates control signals for controlling the data driving unit and the gate driving unit.

Images