An electro-optically induced transient co-characterization system and measurement method

Abstract

An embodiment of the present invention provides an electro-optically induced transient co-characterization system and measurement method, including: a clock controller configured to send clock control signals to a photoluminescence trigger device and an electroluminescence trigger device; a delay device connected to the photoluminescence trigger device or the electroluminescence trigger device and configured to adjust the working time difference between the photoluminescence trigger device and the electroluminescence trigger device according to a predetermined delay time; a time-correlated photoelectric counter connected to a single-photon detector and configured to control the single-photon detector to collect photons according to the received clock control signal and count the number of photons received by the single-photon detector; a photoluminescence trigger device configured to emit light of a predetermined wavelength to a device under test; an electroluminescence trigger device configured to apply an electrical drive to the device under test; a test bench connected to the electroluminescence trigger device and configured to carry the device under test; and a single-photon detector configured to receive light generated by the electroluminescence or photoluminescence of the device under test.

Description

Technical Field

[0001] The present invention relates to the field of optoelectronics, and particularly to an electro-optically and photo-optically transient co-characterization system and a measurement method. Background Art

[0002] The working principle of a light-emitting diode is that two carriers, electrons and holes, are injected from both ends of the diode by an external voltage. The electrons and holes meet in the light-emitting layer and emit light through radiative recombination. Studying the mechanism of the light-emitting process of the light-emitting diode and monitoring the injection of charge carriers are very important for improving the device structure and enhancing the device performance.

[0003] Transient electroluminescence (i.e., EL) technology can reflect the luminescence time delay and trailing time of an electroluminescent device, as well as characteristics such as carrier injection, transport, accumulation, capture, and mobility inside the device. Therefore, it is applied to study the light-emitting process and principle of electroluminescent devices.

[0004] The most basic transient electroluminescence technology is to use a periodic single-pulse voltage as a driving power source to be applied to the electroluminescent device, and use a photodetector to receive the electroluminescent signal and plot the device EL turn-on and turn-off curves. Existing measurement systems can either only measure electrical transients (i.e., transient EL) or only measure optical transients (i.e., transient PL, abbreviated as TRPL). Such measurement methods can only obtain information at the end when electrical equilibrium has been established (such as TRPL), or only obtain comprehensive LED turn-on or turn-off information, and cannot measure the photoluminescence performance at the transient moment of device switching, and cannot observe the microscopic change process of the device. Summary of the Invention

[0005] In view of this, the embodiments of the present invention propose an electro-optically and photo-optically transient co-characterization system and a measurement method to solve the following problems of the prior art: existing measurement systems can only measure electrical transients or optical transients, cannot measure the photoluminescence performance at the transient moment of device turn-on and turn-off, and cannot observe the microscopic change process of the device.

[0006] On the one hand, an embodiment of the present invention provides an electro-optically and optically induced transient co-characterization system, including: a clock controller configured to send clock control signals to a photoluminescence trigger device and an electroluminescence trigger device to control the operation of the photoluminescence trigger device and the electroluminescence trigger device; a delay unit connected to the photoluminescence trigger device or the electroluminescence trigger device and configured to adjust the working time difference between the photoluminescence trigger device and the electroluminescence trigger device according to a predetermined delay time; the time-correlated single-photon counter connected to a single-photon detector and configured to control the single-photon detector to collect photons according to the received clock control signal and count the number of photons received by the single-photon detector; the photoluminescence trigger device configured to emit light of a predetermined wavelength to a test object according to the received clock control signal; the electroluminescence trigger device configured to apply an electrical drive to the test object according to the received clock control signal; a test bench connected to the electroluminescence trigger device and configured to carry the test object; and the single-photon detector configured to receive light generated by electroluminescence or photoluminescence of the test object.

[0007] In some embodiments, it further includes: a dichroic mirror disposed between the test bench and the single-photon detector and configured to reflect the light of the predetermined wavelength from the photoluminescence trigger device to the test object and / or transmit the light generated by electroluminescence or photoluminescence of the test object to the single-photon detector.

[0008] In some embodiments, the delay unit is specifically configured to send a delayed control signal to a next-stage device at the end of a predetermined delay time after receiving the clock control signal to control the operation of the photoluminescence trigger device or the electroluminescence trigger device.

[0009] In some embodiments, the electroluminescence trigger device is a pulsed drive power supply.

[0010] In some embodiments, the photoluminescence trigger device is a pulsed laser.

[0011] In some embodiments, the pulsed laser is a picosecond or femtosecond pulsed laser.

[0012] In some embodiments, when the delay unit is configured to be connected to the photoluminescence trigger device, the delay unit is further connected to the time-correlated single-photon counter, or the photoluminescence trigger device is further connected to the time-correlated single-photon counter.

[0013] In some embodiments, the delay unit is a nanosecond-precision electrical delay unit.

[0014] On the other hand, an embodiment of the present invention provides an electro-optically and optically induced transient measurement method, which applies the electro-optically and optically induced transient co-characterization system according to any embodiment of the present invention, including: obtaining photon information corresponding to a predetermined delay time within a first integration time through a time-correlated single-photon counter; determining the photoluminescence performance of the object to be measured according to the photon information, where the photoluminescence performance includes photoluminescence lifetime and relative photoluminescence efficiency.

[0015] In some embodiments, after obtaining the photon information corresponding to the predetermined delay time within the first integration time through the time-correlated single-photon counter, it further includes:

[0016] Adjusting the predetermined delay time of the delay device to a new predetermined delay time, and continuously obtaining photon information within a second integration time according to the new predetermined delay time.

[0017] In some embodiments, the photon information corresponding to the predetermined delay time is the photon information at the transient time point corresponding to the rising edge in the electroluminescence decay curve.

[0018] In some embodiments, it further includes: determining system configuration parameters, where the configuration parameters at least include: the turn-on voltage, turn-off voltage, and pulse length of the electroluminescence trigger device, the predetermined wavelength and repetition period of the photoluminescence trigger device, the period of the clock control signal generated by the clock controller, and the predetermined delay time of the delay device; configuring the electro-optically and optically induced transient co-characterization system according to the system configuration parameters, and sending the clock control signal after the configuration is completed to obtain photon information.

[0019] In the embodiment of the present invention, the object to be measured is driven to work by the electroluminescence trigger device, and at the same time, a photoluminescence trigger device is provided to irradiate the object to be measured. Moreover, the time difference brought by the work of the photoluminescence trigger device and the electroluminescence trigger device when receiving the clock control signal is adjusted by the provided delay device to ensure that the system working time is consistent. Furthermore, the time-correlated single-photon counter can accurately obtain the photon information at the corresponding moment. When the predetermined delay time of the delay device is adjusted, the photon information at different moments can be obtained, and then the curves of the luminescence lifetime and luminescence efficiency changes of the object to be measured at different time points can be obtained. The longer the integration time, the more data can be observed, and the more accurate the photon statistics emitted by the luminescent body can be observed. The microscopic change process of the object to be measured can be observed as a whole, which is beneficial to improving the device performance. Description of the Drawings

[0020] To more clearly illustrate the technical solutions in the embodiments of the present disclosure or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments recorded in the present disclosure. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on these drawings.

[0021] Figure 1 Schematic diagram of the architecture of the electro-optically and optically induced transient co-characterization system provided by the embodiment of the present invention Figure 1 ;

[0022] Figure 2 Schematic diagram of the architecture of the electro-optically and optically induced transient co-characterization system provided by the embodiment of the present invention Figure 2 ;

[0023] Figure 3 Schematic diagram of the architecture of the electro-optically and optically induced transient co-characterization system provided by the embodiment of the present invention Figure 3 ;

[0024] Figure 4 Flowchart of the electro-optically and optically induced transient measurement method provided by the embodiment of the present invention;

[0025] Figure 5 Schematic diagram of the signal timing when the electro-optically and optically induced transient co-characterization system provided by the embodiment of the present invention is working.

[0026] Reference numerals:

[0027] 1 - Clock controller, 2 - Delayer, 3 - Time-correlated single-photon counter, 4 - Photoluminescence trigger device, 5 - Electroluminescence trigger device, 6 - Test bench, 7 - Single-photon detector, 8 - Beam splitter. Detailed implementation manners

[0028] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions of the embodiments of the present invention with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the described embodiments of the present invention without creative efforts fall within the scope of protection of the present invention.

[0029] Unless otherwise defined, technical terms or scientific terms used in the present invention shall have the ordinary meanings as understood by those of ordinary skill in the art to which the present invention pertains. The terms "first", "second" and similar terms used in the present invention do not denote any order, quantity or importance, but are only used to distinguish different components. Words such as "comprising" or "including" mean that the elements or objects appearing before the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Words such as "connected" or "coupled" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. Words such as "upper", "lower", "left" and "right" are only used to indicate relative positional relationships, and when the absolute position of the object being described changes, the relative positional relationships may also change accordingly.

[0030] To keep the following description of the embodiments of the present invention clear and concise, detailed descriptions of known functions and known components are omitted in the present invention.

[0031] Embodiments of the present invention provide an electro-optically and optically induced transient co-characterization system, the structural schematic diagram of which is as Figure 1 shown and includes:

[0032] A clock controller 1 configured to send clock control signals to a photoluminescence trigger device 4 and an electroluminescence trigger device 5 to control the operation of the photoluminescence trigger device 4 and the electroluminescence trigger device 5; a delay unit 2 connected to the photoluminescence trigger device 4 or the electroluminescence trigger device 5 and configured to adjust the operating time difference between the photoluminescence trigger device 4 and the electroluminescence trigger device 5 according to a predetermined delay time; a time-correlated single-photon counter 3 connected to a single-photon detector 7 and configured to control the single-photon detector 7 to collect photons according to the received clock control signal and count the number of photons received by the single-photon detector 7; a photoluminescence trigger device 4 configured to emit light of a predetermined wavelength to a device under test according to the received clock control signal; an electroluminescence trigger device 5 configured to apply an electrical drive to the device under test according to the received clock control signal; a test bench 6 connected to the electroluminescence trigger device 5 and configured to carry the device under test; and a single-photon detector 7 configured to receive light generated by electroluminescence or photoluminescence of the device under test.

[0033] In a specific implementation, when the delay unit 2 is configured to be connected to the photoluminescence trigger device 4, the delay unit 2 is further connected to the time-correlated single-photon counter 3, or alternatively, the photoluminescence trigger device 4 may also be connected to the time-correlated single-photon counter 3.

[0034] For the above-mentioned delay device, it is specifically configured to control the operation of the photoluminescence trigger device or the electroluminescence trigger device at the end of a predetermined delay time after receiving the clock control signal, and thus can drive the electroluminescence trigger device 5 to operate a certain time earlier than the photoluminescence trigger device 4 and the time-correlated single photon counting device 3 (abbreviated as TCSPC), for example, 20 ns earlier.

[0035] The above-mentioned Figure 1 This is only a possible implementation of the embodiment of the present invention. The two delay devices respectively represented by the dotted box and the solid box in the figure do not exist simultaneously, that is, there is only one delay device in an electroluminescence and photoluminescence transient co-characterization system. If the delay device at the position of the solid box is adopted, the delay device at the position of the dotted box does not exist. If the delay device at the position of the dotted box exists, the delay device at the position of the solid box does not exist; Figure 1 The use of a dotted box to represent the delay device is to guide those skilled in the art that the delay device can be set at different positions, and it does not constitute a limitation to the embodiment of the present invention.

[0036] The delay device can be placed in front of the pulse drive power supply. By coordinating with the repetition rate of the photoluminescence trigger device 4, the same effect can be achieved. Because the electrical participation can enter later, in this regard, the setting of the dotted box is more direct; however, when the time accuracy of the electroluminescence trigger device 5 is relatively poor (with a large jitter), it will cause the control of the delay device to fail. In this case, the design of the solid box is preferred, but in this case, a negative delay (-δt) or a cross-cycle (T - δt) needs to be made.

[0037] For the test bench, it can have a trigger interface for driving the object to be tested, and is thus configured to receive the electrical drive applied by the electroluminescence trigger device and apply the electrical drive to the object to be tested to achieve the electro-optical conversion of the object to be tested. During use, the electrical drive of the electroluminescence trigger device is applied to the test bench. As long as the object to be tested is placed on the test bench, it can be connected to the trigger interface and thus be electrically driven. There is no need for the operator to perform cumbersome connection operations on the object to be tested for the upcoming electrical drive. The object to be tested is directly placed on the test bench, and the light with a predetermined wavelength emitted by the photoluminescence trigger device can also directly optically excite the object to be tested.

[0038] In the embodiment of the present invention, an electroluminescence trigger device is used to drive the object under test to work, and a photoluminescence trigger device is provided to irradiate the object under test. Moreover, a delay device is provided to adjust the time difference caused by the work of the photoluminescence trigger device and the electroluminescence trigger device when receiving a clock control signal, ensuring that the system working time is consistent. Thus, the time-correlated photoelectric counter can accurately obtain the photon information at the corresponding moment. When the predetermined delay time of the delay device is adjusted, the photon information at different moments can be obtained, and then the curves of the luminescence lifetime and the change of luminescence efficiency of the object under test at different time points can be obtained. The longer the integration time is, the more data can be observed, and the more accurate the photon statistics emitted by the luminescent body can be observed. From the overall perspective, the microscopic change process of the object under test can be observed, which is beneficial to improving the device performance.

[0039] The above-mentioned electroluminescence and photoluminescence transient co-characterization system can also be as Figure 2 shown, including: a transmissive-reflective mirror 8, arranged between the test bench 6 and the single-photon detector 7, configured to reflect the light with a predetermined wavelength from the photoluminescence trigger device 4 to the object under test, and / or transmit the light generated by the electroluminescence or photoluminescence of the object under test to the single-photon detector 7.

[0040] Specifically, the above-mentioned electroluminescence trigger device 5 can be a pulse drive power supply, the above-mentioned photoluminescence trigger device 4 can be a pulsed laser, and the above-mentioned delay device 2 can be an electrical delay device with a nanosecond accuracy or higher accuracy. In order to measure the luminescence lifetime and the change of luminescence efficiency of the object under test more precisely, the above-mentioned pulsed laser can be a picosecond or femtosecond pulsed laser.

[0041] The embodiment of the present invention also provides an electroluminescence and photoluminescence transient measurement method. This method applies the electroluminescence and photoluminescence transient co-characterization system of the above-mentioned embodiment of the present invention. Specifically, it can be implemented by the CPU of a computer, and its architecture can be as Figure 3 shown, and its process can be as Figure 4 shown, including steps S401 to S402:

[0042] S401, obtaining the photon information corresponding to the predetermined delay time within the first integration time through a time-correlated photoelectric counter;

[0043] S402, determining the photoluminescence performance of the object under test according to the photon information, where the photoluminescence performance includes the photoluminescence lifetime and the relative photoluminescence efficiency.

[0044] The embodiment of the present invention applies the electroluminescence and photoluminescence transient co-characterization system, obtains the photon information corresponding to the predetermined delay time within the first integration time (i.e., the first measurement) through a time-correlated photoelectric counter, and then can determine the photoluminescence performance of the object under test according to the photon information, making up for the shortcoming in the prior art that only optical transients can be measured, and realizing the multi-microscopic state monitoring of optical performance.

[0045] Before implementing the above S401, system configuration parameters can be determined first. The system configuration parameters at least include: the turn-on voltage, turn-off voltage, and pulse length of the electroluminescence trigger device, the predetermined wavelength and repetition period of the photoluminescence trigger device, the period of the clock control signal generated by the clock controller, and the predetermined delay time of the delay device. Then, configure the electro- and photoluminescence transient co-characterization system according to the system configuration parameters, and send a clock control signal after the configuration is completed to obtain photon information.

[0046] After obtaining the photon information corresponding to the predetermined delay time within the first integration time through the time-correlated single-photon counter, if you want to obtain the photon information at other time points, you can adjust the predetermined delay time of the delay device to a new predetermined delay time, and continue to obtain the photon information within the second integration time according to the new predetermined delay time. Among them, the above-mentioned second integration time (i.e., the second measurement) and the first integration time can be the same or different.

[0047] As Figure 5 shown, it is a schematic diagram of the signal timing when the electro- and photoluminescence transient co-characterization system is working. The clock controller 1 generates a trigger signal (i.e., the clock control signal) to trigger the system to start working. The photoluminescence trigger device 4 (corresponding to the pulse laser light intensity) and the single-photon detector 7 (corresponding to the single-photon counter signal) both start working only when the predetermined delay time ends, while the electroluminescence trigger device 5 (corresponding to the pulse voltage drive) starts working when it receives the trigger signal and generates a square wave. Figure 5 The single-photon counter signal is the rising pointed waveform at the time point when the predetermined delay time ends in the figure, and the dotted curve in the figure is the decay curve corresponding to the electroluminescence. In order to better determine the process of establishing the balance of the luminescence of the object to be measured, the photon information corresponding to the above-mentioned predetermined delay time is the luminescence characteristics of the luminescent body at the transient time point corresponding to the rising edge in the electroluminescence decay curve, that is, the photon information. Figure 5 Only one trigger signal and the counter signals triggered by two pulsed laser beams are drawn. In fact, the counter can obtain a reliable measurement curve through a multi-period integration time, which will not be elaborated here.

[0048] Next, the above system and method will be further described in combination with specific embodiments.

[0049] System components:

[0050] The measurement system coordinates the timing of the transient PL system (i.e., the photoluminescence trigger device 4) and the transient EL system (i.e., the electroluminescence trigger device 5) with a master clock (i.e., clock controller 1) and a time delay device with nanosecond or picosecond precision (such as the pulse delay generator of TOMBAK, model DDG-Tombak, with a delay range from 10 ps to 1000 s). Any currently available technology can be used for the transient EL or transient PL. For example, TCSPC or streamcamera technology can be used for TRPL.

[0051] System connection and operation mode:

[0052] The clock controller sends a coordinated signal trigger to the transient PL system (such as TCSPC and pulsed lasers) and the transient EL system (such as the pulsed drive power supply). A time delay device with nanosecond or picosecond precision is placed between the master clock and the transient PL system to control the sampling time point. By integrating multiple trigger cycles, the PL lifetime and relative luminescence efficiency at a certain time point can be obtained. By scanning the time of the delay device, the curves of the PL lifetime and the changes in luminescence efficiency at different time points after the device is turned on can be obtained.

[0053] The falling edge usually has a relatively long time, and a high-precision time control device is not required for special design to capture the transient. The rising edge is usually shorter than the falling edge, and even shorter than the interval between two pulses of a general laser (hundreds of nanoseconds). Therefore, this transient is usually difficult to capture. The advantage of the rising edge in discussing the establishment of device efficiency compared to the falling edge is that it reflects the process of establishing the balance of device luminescence in the device (the electric field is applied, carriers flow to the light-emitting layer, carriers are injected into the light-emitting layer, and the injection reaches equilibrium), while the falling edge reflects different information due to the release of the electric field. It is the information of the remaining carriers exiting the depletion region and the reactivation of defect states to participate in luminescence.

[0054] System debugging parameters:

[0055] Pulse width adjustment range of the pulsed drive power supply: 1 ns to 10 s;

[0056] Pulse period length adjustment range of the pulsed drive power supply: 100 ns to 10 s;

[0057] Pulse cycle number of the pulsed drive power supply: 1 to infinity;

[0058] Voltage adjustment range of the pulsed drive power supply: -1000 V to 1000 V;

[0059] Pulse duty cycle adjustment of the pulsed drive power supply: 0 to 100%;

[0060] Delay adjustment range of the clock controller: 10 ps to 1000 s;

[0061] Wavelength, energy, pulse width, and repetition period of the laser: visible light, 0 - 1 W, 100 fs to 1 ns, 10 ns to 0.1 s;

[0062] According to the specific device situation, setting the pulse drive power supply and the pulsed laser to the same period (such as 1 μs) will greatly simplify the workload of signal processing;

[0063] Integration time of single - photon counting: 0 to infinity.

[0064] The device in the following embodiments is illustrated by taking ITO / PEDOT:PSS / TFB / RQD / ZnO / Al as an example.

[0065] Example 1 (EL / PL co - transient characterization of turning on the LED)

[0066] The pulse turn - on voltage of the pulse drive power supply is set to 3 V, the turn - off voltage is set to 0 V, and the pulse length is 20 μs.

[0067] The wavelength of the pulsed laser is 532 nm, and the repetition period is 100 ns.

[0068] The period of the trigger signal of the clock controller is 100 μs, and the drive power supply is 50 ns ahead of the pulsed laser and TCSPC.

[0069] Integration time: 10 minutes.

[0070] Example 2 (Driving the LED with a voltage less than the LED turn - on voltage and observing the pre - turn - on transient of the LED)

[0071] The pulse turn - on voltage of the drive power supply is set to 1.2 V (less than the turn - on voltage of the LED), the turn - off voltage is set to 0 V, and the pulse length is 20 μs.

[0072] The wavelength of the pulsed laser is 532 nm, and the repetition period is 100 ns.

[0073] The period of the trigger signal of the clock controller is 100 μs, and the drive power supply is 50 ns ahead of the pulsed laser and TCSPC.

[0074] Integration time: 10 minutes.

[0075] Example 3 (Reverse - bias LED transient characterization, observing the influence process of the transient of reverse - released trapped charges on the luminescence of the light - emitting layer)

[0076] The pulse turn - on voltage of the drive power supply is set to - 10 V, the turn - off voltage is set to 0 V, and the pulse length is 20 μs.

[0077] The wavelength of the pulsed laser is 532 nm and the repetition period is 100 ns.

[0078] The period of the trigger signal of the clock controller is 100 μs, and the drive power supply is 10 ns, 20 ns, 50 ns, 70 ns, 100 ns ahead of the pulsed laser and TCSPC.

[0079] The integration time at each time point is 5 minutes. Capture the TCSPC lifetimes at 10 ns, 20 ns, 50 ns, 70 ns, 100 ns at the time nodes of the rising edge of the captured voltage.

[0080] The delay line is the main body for adjusting each of the above time points, that is, adjusting 10 ns, 20 ns, etc.

[0081] Example 4 (LED Transient Characterization with Turn-on and Reverse Bias Charge Release)

[0082] The reverse bias can help empty the charges in the device and reset the charge distribution inside the device. Adding this reverse bias can be used to observe the influence of these charges on the device operation.

[0083] The pulse turn-on voltage of the drive power supply is set to 3 V, the turn-off voltage is set to -10 V, and the pulse length is 20 μs.

[0084] The wavelength of the pulsed laser is 532 nm and the repetition period is 100 ns.

[0085] The period of the trigger signal of the clock controller is 100 μs, and the drive power supply is 20 ns ahead of the pulsed laser and TCSPC.

[0086] The integration time is 30 minutes.

[0087] The above integration time will affect the data accuracy, and it is specifically adjusted according to the situation of each measurement.

[0088] In the embodiments of the present invention, by synchronizing electroluminescence and photoluminescence, the turn-on and turn-off processes of the LED are sampled in detail. Especially for quantum dot LEDs, the reasons for whether a specific device has achieved optimized efficiency can be studied in detail.

[0089] Ideally, quantum dots with optimized photoluminescence efficiency can be used to fabricate optimized electroluminescent devices. However, in practice, these two aspects often cannot be unified. An important reason is that the injection speeds of electrons and holes into the luminescent region are inconsistent. For example, quantum dots are neutral without bias voltage. When a bias voltage is applied, the end with a smaller potential barrier, higher mobility, and larger carrier concentration will inject first, followed by the weaker end. As a result, charge accumulation will occur in the quantum dots first, leading to a decrease in quantum efficiency and a shorter photoluminescence lifetime. However, with the establishment of the interfacial electric field region caused by charge accumulation and the large-scale arrival of the slower carriers at the quantum dots, the carriers at the weaker end will reach the state of balanced injection with the stronger end through a transient process with the assistance of the interfacial electric field in the final equilibrium state.

[0090] Help in observing this transient process: It can directly reflect the process of carrier injection in the device from imbalance at the start of applying bias voltage to the establishment of a compensation mechanism to reach quasi-equilibrium. By using the deviation between these two states, the compensation state of QLED under continuous operation can be understood; the reasons for the improvement of device performance can be understood by comparing the transient characteristics of different devices; since display devices are usually driven by PWM in a pulsed manner, studying this process is of guiding significance for the design of future display devices; electrical synchronization can be achieved with an accuracy of 10 ps - 10 ns, meeting the requirement for capturing transients.

[0091] In addition, although exemplary embodiments have been described in this document, their scope includes any and all embodiments based on the present invention with equivalent elements, modifications, omissions, combinations (e.g., solutions that cross various embodiments), adaptations, or changes. The elements in the claims will be broadly interpreted based on the language used in the claims and are not limited to the examples described in this specification or during the implementation of this application. The examples will be interpreted as non-exclusive. Therefore, this specification and the examples are intended to be considered only as examples, and the true scope and spirit are indicated by the following claims and the full scope of their equivalents.

[0092] The foregoing description is intended to be illustrative and not restrictive. For example, the above examples (or one or more aspects thereof) may be used in combination with each other. For example, those of ordinary skill in the art may use other embodiments when reading the above description. Additionally, in the above detailed description, various features may be grouped together to simplify the present invention. This should not be construed as an intention that an unclaimed disclosed feature is necessary for any claim. On the contrary, the subject matter of the present invention may be less than all of the features of a particular disclosed embodiment. Thus, the following claims are hereby incorporated into the detailed description as examples or embodiments, where each claim stands on its own as a separate embodiment, and it is contemplated that these embodiments may be combined with each other in various combinations or permutations. The scope of the present invention should be determined with reference to the appended claims and the full scope of equivalents to which those claims are entitled.

[0093] The foregoing has described in detail multiple embodiments of the present invention, but the present invention is not limited to these specific embodiments. Those skilled in the art can make various variations and modifications to the embodiments on the basis of the inventive concept of the present invention, and these variations and modifications should all fall within the scope of protection required by the present invention.

Claims

1. An electro-optically and optically transient co-characterization system, characterized in that, Comprising: A clock controller configured to send clock control signals to a photoluminescence triggering device and an electroluminescence triggering device to control the operation of the photoluminescence triggering device and the electroluminescence triggering device; A delay unit connected to the photoluminescence triggering device or the electroluminescence triggering device, configured to adjust the working time difference between the photoluminescence triggering device and the electroluminescence triggering device according to a predetermined delay time; when the delay unit is configured to be connected to the photoluminescence triggering device, the delay unit is further connected to a time-correlated photoelectron counter; A time-correlated photoelectron counter connected to a single-photon detector, configured to control the single-photon detector to collect photons according to the received clock control signal and count the number of photons received by the single-photon detector; The photoluminescence triggering device configured to emit light of a predetermined wavelength to a test object according to the received clock control signal; the photoluminescence triggering device is a pulsed laser; The electroluminescence triggering device configured to apply an electrical drive to the test object according to the received clock control signal; the electroluminescence triggering device is a pulsed drive power supply; A test bench connected to the electroluminescence triggering device, configured to carry the test object; The single-photon detector configured to receive light generated by electroluminescence or photoluminescence of the test object.

2. The electro-optic transient co-characterization system according to claim 1, wherein Further comprising: A dichroic mirror disposed between the test bench and the single-photon detector, configured to reflect the light of the predetermined wavelength from the photoluminescence triggering device to the test object, and / or transmit the light generated by electroluminescence or photoluminescence of the test object to the single-photon detector.

3. The electro-optical transient co-characterization system according to claim 1, wherein The delay unit is specifically configured to issue a delayed control signal to the next-level device at the end of a predetermined delay time after receiving the clock control signal to control the operation of the photoluminescence triggering device or the electroluminescence triggering device.

4. The electro-optic transient co-characterization system according to any one of claims 1 to 3, characterized in that The delay unit is a nanosecond-precision electrical delay unit.

5. A method for electro-optic transient measurement, characterized in that, Applying the electro-optical transient co-characterization system according to any one of claims 1 to 4, comprising: Obtaining photon information corresponding to a predetermined delay time within a first integration time through a time-correlated photoelectron counter; Determining the photoluminescence performance of the test object according to the photon information, wherein the photoluminescence performance includes photoluminescence lifetime and photoluminescence relative luminous efficiency; After obtaining the photon information corresponding to the predetermined delay time within the first integration time through the time-correlated photoelectron counter, further comprising: Adjusting the predetermined delay time of the delay unit to a new predetermined delay time and continuing to obtain photon information within a second integration time according to the new predetermined delay time.

6. The electro-optic transient measurement method according to claim 5, characterized in that The photon information corresponding to the predetermined delay time is the photon information at the corresponding transient time point of the rising edge in the electroluminescence decay curve.

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