An independent and precise temperature-controlled solid-state hard disk aging test module

Abstract

The present invention relates to an independent and precise temperature-controlled solid-state hard disk aging test module, comprising a shell, an air duct tail pipe, an exhaust fan and a carrier; the shell, the air duct tail pipe and the exhaust fan are connected in sequence from front to back; the shell is flat, with an open aging chamber at the front and a control chamber spaced apart at the back; a docking test plug is provided at the inner end of the aging chamber, heating plates are provided at the top and bottom respectively, and a temperature sensor is also provided inside; the carrier can be slidably inserted into the aging chamber, and the socket of the solid-state hard disk to be tested is connected to the docking test plug; the carrier is located between two heating plates, and forms an air duct connected to the air duct tail pipe; the present invention forms an air duct connected to the air duct tail pipe at the top and bottom of the carrier, and cooperates with two heating plates, so as to independently and precisely control the temperature of the solid-state hard disk, improve the test accuracy, and has the advantages of simple and compact structure and small size.

Description

Technical Field

[0001] The present invention relates to the technical field of high temperature aging test, and in particular to an independent precise temperature control solid state hard disk aging test module. Background Art

[0002] High temperature aging test equipment is a device that simulates high temperature and harsh environment testing for high-performance electronic products. It is an important experimental equipment to improve product stability and reliability, and an important production process for manufacturers to improve product quality and competitiveness. The equipment is widely used in power electronics, computers, communications, biopharmaceuticals and other fields.

[0003] With the rapid development of the solid-state drive industry, higher and higher performance requirements are placed on testing equipment. Therefore, many solid-state drive high-temperature aging test equipment have appeared on the market, such as an SSD solid-state drive aging test cabinet disclosed in prior art 201821206547.7, and a solid-state drive high-temperature aging test equipment disclosed in prior art 202020508858.X. During the prior art test: multiple solid-state drives are tested in a high-temperature box at the same time. Since the temperature control of the high-temperature box is not uniform after being loaded, the solid-state drive often has uneven temperature steps, resulting in different solid-state drive performance, which affects the test effect and the accuracy of the results; for example, a large-scale high-temperature test equipment for solid-state drive reliability testing disclosed in prior art 201721456171.0, although multiple independent aging chambers are provided, each aging chamber is large in size, which is not only inconvenient to carry, but also greatly occupies the laboratory area. Summary of the invention

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art and to provide an independent and precise temperature-controlled solid-state hard disk aging test module.

[0005] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is: an independent and precise temperature-controlled solid-state hard disk aging test module, comprising a housing, an air duct tail pipe, an exhaust fan and a carrier;

[0006] The housing, the air duct tail pipe and the exhaust fan are connected in sequence from front to back;

[0007] The housing is flat, with an open aging chamber at the front and a control chamber spaced apart at the rear;

[0008] The inner end of the aging chamber is provided with a docking test plug, the top and bottom are provided with heating plates respectively, and a temperature sensor is also provided inside;

[0009] The control room is respectively connected with the docking test plug, the heating plate, the temperature sensor and the exhaust fan line;

[0010] The carrier can be slidably inserted into the aging chamber, and the socket of the solid state hard disk to be tested is connected with the docking test plug; the carrier is located between two heating plates, and forms an air duct connected to the air duct tail pipe.

[0011] Preferably, horizontally placed guide bars are respectively provided on both sides of the aging chamber; and guide grooves corresponding to the guide bars are respectively provided on both sides of the carrier.

[0012] Preferably, the outer ends of the two guide strips are each provided with a guide portion inclined outwards.

[0013] Preferably, card slots are respectively provided on both sides of the entrance of the aging chamber; and lock components that can be inserted into the card slots are respectively provided on both sides of the handle of the carrier.

[0014] Preferably, each group of the lock assembly includes a receiving slot arranged in the carrier handle, and an F-shaped locking block arranged in the receiving slot; the locking block includes a lock body, a locking head arranged outside the lock body and capable of extending into the slot, a limiting portion arranged inside the lock body to prevent the locking block from sliding out of the receiving slot, an extruding portion arranged on the lock body and capable of extending out of the carrier handle, a guide column arranged on the inner side of the extruding portion and placed parallel to the lock body, and a spring mounted on the guide column to drive the locking head to move into the slot.

[0015] Preferably, the inner side of the lock head is provided with a chamfer.

[0016] Preferably, both sides, top and bottom of the aging chamber entrance are provided with guide surfaces inclined outwards.

[0017] Preferably, oppositely placed ventilation openings are provided on both sides of the control room.

[0018] Due to the application of the above technical solution, the present invention has the following advantages compared with the prior art:

[0019] 1. The present invention uses an ultra-narrow air duct design and cooperates with two heating plates to independently and accurately control the temperature of the solid-state hard disk. The temperature control accuracy can reach 1°C, which improves the test accuracy;

[0020] 2. The present invention has the advantages of simple and compact structure and small size by forming air ducts connected to the air duct tail pipe at the top and bottom of the vehicle;

[0021] 3. The overall modular design of the present invention can be stacked and placed for quick assembly. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The technical solution of the present invention is further described below in conjunction with the accompanying drawings:

[0023] Attached Figure 1 This is a structural schematic diagram of the independent precise temperature control solid state hard disk aging test module of the present invention;

[0024] Attached Figure 2 A vertical cross-sectional view of the independent precise temperature control solid state hard disk aging test module of the present invention;

[0025] Attached Figure 3 It is a horizontal cross-sectional view of the independent precise temperature control solid state hard disk aging test module of the present invention;

[0026] Attached Figure 4 for Figure 2 A partial enlarged view of the middle part;

[0027] Attached Figure 5 for Figure 3 A partial enlarged view of the middle part;

[0028] Attached Figure 6 It is a schematic diagram of the structure of the carrier after installing the solid state hard disk in the present invention.

[0029] Among them: 1. Shell; 11. Card slot; 12. Ventilation port; 13. Control room; 14. Docking test plug; 15. Heating plate; 16. Air duct; 17. Guide strip; 18. Guide part; 19. Guide surface; 2. Air duct tail pipe; 3. Exhaust fan; 4. Carrier; 41. Receiving slot; 42. Lock body; 43. Lock head; 44. Limiting part; 45. Extrusion part; 46. Guide column; 47. Spring; 48. Guide slide groove; 49. Handle; 5. Solid state drive; 51. Socket. DETAILED DESCRIPTION

[0030] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0031] Attached Figure 1-6 The independent precise temperature control solid state hard disk aging test module of the present invention comprises a housing 1, an air duct tail pipe 2, an exhaust fan 3 and a carrier 4;

[0032] The housing 1, the air duct tail pipe 2 and the exhaust fan 3 are connected in sequence from front to back;

[0033] The housing 1 is flat, with an open aging chamber at the front and a control chamber 13 spaced apart at the top and bottom at the rear;

[0034] The inner end of the aging chamber is provided with a docking test plug 14, the top and bottom are provided with heating plates 15, and a temperature sensor is also provided inside;

[0035] The control room 13 is respectively connected with the docking test plug 14, the heating plate 15, the temperature sensor and the exhaust fan 3 wires;

[0036] The carrier 4 can be slidably inserted into the aging chamber, and the socket 51 of the solid state drive 5 to be tested is connected to the docking test plug 14; the carrier 4 is located between two heating plates 15, and forms an air duct 16 connected to the air duct tail pipe 2; the air duct has only a 1mm gap.

[0037] During operation: the staff inserts the carrier 4 with the solid-state hard disk 5 to be tested into the aging room, and connects the socket 51 of the solid-state hard disk 5 to be tested with the docking test plug 14, and then independently and accurately controls the temperature of the solid-state hard disk 5 to be tested through the control room 13. When the temperature sensor detects that the temperature in the aging room is lower than the set temperature, it is heated by two heating plates 15 to reach the set temperature; when the temperature sensor detects that the temperature in the aging room is higher than the set temperature, the exhaust fan 3 is used to dissipate heat to reach the set temperature; the temperature control accuracy can reach 1°C, thereby achieving accurate temperature control of the solid-state hard disk 5 and accurate results of the aging test.

[0038] Furthermore, horizontally placed guide bars 17 are respectively provided on both sides of the aging chamber; guide grooves 48 corresponding to the guide bars 17 are respectively provided on both sides of the carrier 4; when the carrier 4 is inserted into the aging chamber, the guide bars 17 on both sides of the aging chamber are respectively located in the guide grooves 48 on both sides of the carrier 4, which not only plays a guiding role, but also can ensure that the carrier 4 is located in the middle of the two heating plates 15, and the temperature is more uniform.

[0039] Furthermore, the outer ends of the two guide strips 17 are provided with guide portions 18 tilted outwards to play a guiding role, so as to facilitate the guide strips 17 on both sides of the aging chamber to slide into the guide grooves 48 on both sides of the carrier 4.

[0040] Furthermore, card slots 11 are respectively provided on both sides of the entrance of the aging chamber; lock components that can be inserted into the card slots 11 are respectively provided on both sides of the handle 49 of the carrier 4; the present invention can play a limiting role by cooperating with the card slots 11, and the carrier 4 can be fixed in the aging chamber.

[0041] Furthermore, each group of the lock assembly includes a receiving groove 41 arranged in the handle 49, and an F-shaped lock block arranged in the receiving groove 41; the lock block includes a lock body 42, a lock head 43 arranged outside the lock body 42 and extending into the card slot 11, a limiting portion 44 arranged inside the lock body 42 to prevent the lock block from sliding out of the receiving groove 41, an extrusion portion 45 arranged on the lock body 42 and extending out of the handle 49, a guide column 46 arranged on the inner side of the extrusion portion 45 and placed parallel to the lock body 42, and a spring 47 sleeved on the guide column 46 to drive the lock head 43 to move into the card slot 11; when After the carrier 4 is inserted into the aging chamber, the lock head 43 extends into the card slot 11 under the elastic force of the spring 47, thereby fixing the carrier 4 in the aging chamber; when the carrier 4 needs to be taken out from the aging chamber, the squeezing portion 45 is pressed to overcome the elastic force of the spring 47 to move the lock body 42 in the direction away from the card slot 11, so that the lock head 43 is disengaged from the card slot 11, and then the carrier 4 is pulled out of the aging chamber, and finally the squeezing portion 45 is released. The lock body 42 drives the squeezing portion 45 back to the initial position under the elastic force of the spring 47, and at the same time, under the action of the limiting portion 44, it can prevent the lock block from sliding out of the accommodating groove 41.

[0042] Furthermore, the inner side of the lock head 43 is provided with a chamfer to play a guiding role, so that the lock head 43 can be easily inserted into the slot 11 .

[0043] Furthermore, guide surfaces 19 tilted outward are provided on both sides, top and bottom of the aging chamber entrance to play a guiding role, so as to facilitate the carrier 4 to extend into the aging chamber.

[0044] Furthermore, oppositely placed vents 12 are provided on both sides of the control room 13 to dissipate heat and reduce the temperature in the control room 13 .

[0045] The above are only specific application examples of the present invention and do not constitute any limitation on the protection scope of the present invention. Any technical solution formed by equivalent transformation or equivalent replacement shall fall within the protection scope of the present invention.

Claims

1. An independent and precise temperature-controlled solid-state hard disk aging test module, characterized in that: It includes a shell, an air duct tail pipe, an exhaust fan and a carrier; The housing, the air duct tail pipe and the exhaust fan are connected in sequence from front to back; The housing is flat, with an open aging chamber at the front and a control chamber spaced apart at the rear; The inner end of the aging chamber is provided with a docking test plug, the top and bottom are provided with heating plates respectively, and a temperature sensor is also provided inside; The control room is respectively connected with the docking test plug, the heating plate, the temperature sensor and the exhaust fan line; The carrier can be slidably inserted into the aging chamber, and the socket of the solid state hard disk to be tested is connected with the docking test plug; the carrier is located between two heating plates, and forms an air duct connected to the air duct tail pipe.

2. The independent precise temperature control solid state drive aging test module according to claim 1, characterized in that: Horizontally placed guide bars are respectively arranged on both sides of the aging chamber; and guide slide grooves corresponding to the guide bars are respectively arranged on both sides of the carrier.

3. The independent precise temperature control solid state hard disk aging test module according to claim 2, characterized in that: The outer ends of the two guide strips are both provided with guide parts inclined outwards.

4. The independent precise temperature control solid state drive aging test module according to any one of claims 1 to 3, characterized in that: Card slots are respectively arranged on both sides of the entrance of the aging chamber; and lock components which can be inserted into the card slots are respectively arranged on both sides of the handle of the carrier.

5. The independent precise temperature control solid state hard disk aging test module according to claim 4, characterized in that: Each set of the lock assembly includes a receiving slot arranged in the carrier handle, and an F-shaped lock block arranged in the receiving slot; the lock block includes a lock body, a lock head arranged outside the lock body and capable of extending into the slot, a limiting portion arranged inside the lock body to prevent the lock block from sliding out of the receiving slot, an extrusion portion arranged on the lock body and capable of extending out of the carrier handle, a guide column arranged on the inner side of the extrusion portion and placed parallel to the lock body, and a spring sleeved on the guide column to drive the lock head to move into the slot.

6. The independent precise temperature control solid state hard disk aging test module according to claim 5, characterized in that: The inner side of the lock head is provided with a chamfer.

7. The independent precise temperature control solid state hard disk aging test module according to claim 6, characterized in that: Both sides, the top and the bottom of the entrance of the aging chamber are provided with guide surfaces inclined outwards.

8. The independent precise temperature control solid state hard disk aging test module according to claim 7, characterized in that: Oppositely placed ventilation openings are respectively arranged on both sides of the control room.

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