Antenna inspection device and method

Abstract

The present invention relates to an antenna inspection device and method. In one embodiment, the antenna inspection device may include: a carrier for configuring an antenna device; an inspection substrate, which is in contact with and connected to the antenna device; a connection maintaining portion, which maintains the contact and connection between the antenna device and the inspection substrate; and an inspection portion, which is installed or connected to the inspection substrate to inspect the antenna device, and the carrier includes a ground connection.

Description

Technical Field

[0001] The present invention relates to a device and method for inspecting an antenna using a non-optical method. Background Art

[0002] Recently, with the development of information society, wireless communication technologies such as Wi-Fi, Bluetooth, etc. are combined with display devices and implemented in the form of, for example, smart phones. In this case, an antenna may be combined with the display device to perform a communication function.

[0003] Recently, with the evolution of mobile communication technology, antennas for performing high-frequency or ultra-high-frequency band communications have been integrated with display devices. Recently, with the development of thin, highly transparent, and high-resolution display devices such as transparent and flexible displays, antennas are also being developed with improved transparency and flexibility.

[0004] On the other hand, in order to produce antennas for use in products, it is necessary to inspect their performance and check for defects. Therefore, there is a demand for a technology that can easily and efficiently inspect antenna performance and check for defects. Summary of the Invention

[0005] An object of the present invention is to provide a device and method for inspecting an antenna using a non-optical method.

[0006] In order to achieve the above-mentioned purpose, the present invention adopts the following technical solutions.

[0007] 1. An antenna inspection device, comprising: a carrier for arranging an antenna device; an inspection substrate that contacts and is connected to the antenna device; a connection maintaining portion that maintains contact and connection between the antenna device and the inspection substrate; and an inspection portion that is mounted on or connected to the inspection substrate to inspect the antenna device, wherein the carrier includes a ground connection.

[0008] 2. The antenna inspection device according to item 1 above, wherein the ground is formed of a metal having a resistance value of 3Ω or less.

[0009] 3. According to the antenna inspection device described in 2 above, the ground is formed of silver, gold, copper, aluminum, or alloys thereof.

[0010] 4. According to the antenna inspection device described in item 1 above, the inspection substrate includes a flexible printed circuit board.

[0011] 5. In the antenna inspection device according to item 1 above, the connection maintaining portion presses a contact portion between the antenna device and the inspection substrate to maintain contact and connection between the antenna device and the inspection substrate.

[0012] 6. In the antenna inspection device according to item 1 above, the inspection unit measures S parameters and antenna radiation efficiency of the antenna device.

[0013] 7. The antenna inspection device according to item 1 above, further comprising: a first adjustment unit configured to determine an alignment state between the antenna device and the ground.

[0014] 8. The antenna inspection device according to item 7 above, wherein the first adjustment unit adjusts a position of the antenna device or the ground based on the determined alignment state.

[0015] 9. The antenna inspection device according to item 1 above, further comprising: a second adjustment unit configured to determine an alignment state or a contact state between the inspection substrate and the antenna device.

[0016] 10. The antenna inspection device according to 9 above, wherein the second adjustment unit adjusts the position of the inspection substrate or the antenna device based on the determined alignment state or contact state.

[0017] 11. According to the antenna inspection device described in 1 above, the stage further includes a substrate support portion, and the substrate support portion supports the antenna device or the inspection substrate.

[0018] 12. According to the antenna inspection device described in 11 above, the substrate support portion is formed of polytetrafluoroethylene or a side vibration-isolating plate.

[0019] 13. An antenna inspection method, comprising: a step of configuring an antenna device on a carrier including a ground; a step of bringing an inspection substrate and the antenna device into contact and connecting the antenna device; a step of pressing a contact portion between the inspection substrate and the antenna device; and a step of inspecting the antenna device.

[0020] 14. The antenna inspection method according to 13 above further includes: a step of determining an alignment state between the antenna device and the ground; and a step of adjusting a position of the antenna device or the ground based on the determined alignment state.

[0021] 15. The antenna inspection method according to 13 above also includes: a step of determining the alignment state or contact state of the inspection substrate and the antenna device; and a step of adjusting the position of the inspection substrate or the antenna device based on the determined alignment state or contact state.

[0022] The effects of the present invention are as follows.

[0023] The antenna's S parameters and radiation efficiency can be measured using non-optical methods, and the antenna can be inspected for defects such as poor bonding and pattern loss.

[0024] Furthermore, it is possible to automate antenna inspection and perform antenna inspection in a short time. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 is a block diagram illustrating an embodiment of an antenna inspection system.

[0026] Figure 2 This is a diagram showing an embodiment of an antenna inspection device.

[0027] Figure 3 This is a diagram showing another embodiment of the antenna inspection device.

[0028] Figure 4 This is a diagram showing still another embodiment of the antenna inspection device.

[0029] Figure 5 This is a diagram showing still another embodiment of the antenna inspection device.

[0030] Figure 6 This is a diagram showing still another embodiment of the antenna inspection device.

[0031] Figure 7 This is a diagram showing an embodiment of an antenna inspection method.

[0032] Figure 8 FIG. 1 is a diagram illustrating another embodiment of an antenna inspection method.

[0033] Figure 9 This is a diagram showing still another embodiment of the antenna inspection method. DETAILED DESCRIPTION

[0034] The embodiments are described in detail below with reference to the accompanying drawings. When adding reference numerals to the components of each figure, it should be noted that the same components, even if marked on different figures, should be given the same reference numerals as much as possible.

[0035] For each step, unless the context clearly states a specific order, each step may be performed in a different order than the order indicated above. That is, each step may be performed in the same order as the order indicated, may be performed substantially simultaneously, or may be performed in the reverse order.

[0036] When describing an embodiment, if it is determined that a detailed description of related known technologies would unnecessarily obscure the main points of the embodiment, such detailed description will be omitted. Furthermore, the terms described below are defined based on their functions within the embodiment and may vary depending on the intentions or practices of users and operators. Therefore, their definitions should be based on the entire specification.

[0037] Terms such as "first" and "second" may be used to describe various components, but are only used to distinguish one component from another. Unless the context clearly defines otherwise, singular expressions include plural expressions, and terms such as "including" or "having" used to specify the presence of features, numbers, steps, actions, components, parts, or combinations thereof described in the specification should be understood as not excluding the presence or addibility of one or more other features, numbers, steps, actions, components, parts, or combinations thereof.

[0038] In addition, directional terms such as "one side," "the other side," "upper," and "lower" are used with respect to the orientation of the disclosed figures. Because components of embodiments of the present invention can be positioned in a variety of orientations, the directional terms are used for illustrative purposes only and are not intended to be limiting.

[0039] Furthermore, the distinction between components in this specification is based solely on the primary functions of each component. That is, two or more components may be combined into a single component, or a single component may be divided into two or more components with more specialized functions. Furthermore, in addition to performing its own primary function, each component may also perform some or all of the functions of another component, and some of the primary functions of each component may be specifically performed by another component.

[0040] Figure 1 is a block diagram illustrating an embodiment of an antenna inspection system.

[0041] Reference Figure 1 The antenna inspection system 100 may include an antenna device 110 and an antenna inspection device 120 .

[0042] The antenna device 110 may be a microstrip patch antenna made in the form of a transparent film. The antenna device 110 may be applied to, for example, electronic devices for high-frequency to ultra-high-frequency (e.g., 3G, 4G, 5G or higher) mobile communications, Wi-Fi, Bluetooth, NFC (Near Field Communication), GPS (Global Positioning System), etc., but is not limited thereto. Here, the electronic devices may include mobile phones, smart phones, tablet computers, laptop computers, PDAs (Personal Digital Assistants), portable multimedia players (PMPs), navigation devices, MP3 players, digital cameras, wearable devices, etc., and the wearable devices may include watch types, wristband types, ring types, belt types, necklace types, ankle band types, thigh band types, forearm band types, etc. However, the electronic devices are not limited to the above examples, and the wearable devices are not limited to the above examples.

[0043] The antenna inspection device 120 can inspect the antenna device 110. For example, the antenna inspection device 120 can measure the S parameters and antenna radiation efficiency of the antenna device 110 and inspect whether there is bonding failure or antenna pattern loss using non-optical methods.

[0044] For detailed description of the antenna inspection device 120, please refer to Figures 2 to 6 Provide a description.

[0045] Figure 2 This is a diagram showing an embodiment of an antenna inspection device. Figure 2 The antenna inspection device 200 may be Figure 1 An embodiment of the antenna inspection device 120.

[0046] Reference Figure 2 The antenna inspection device 200 may include a stage 210 , an inspection substrate 220 , a connection maintaining unit 230 , and an inspection unit 240 .

[0047] The antenna device 110 to be inspected may be placed on the stage 210 .

[0048] The antenna device 110 as an inspection object may include an antenna unit 111 and an antenna substrate 112. The antenna unit 111 may include a dielectric layer and an antenna conductive layer.

[0049] The dielectric layer may include an insulating material having a predetermined dielectric constant. According to one embodiment, the dielectric layer may include inorganic insulating materials such as glass, silicon oxide, silicon nitride, and metal oxides, or organic insulating materials such as epoxy resin, acrylic resin, and imide-based resins. The dielectric layer may function as a film substrate for the antenna element, which forms the antenna conductive layer.

[0050] According to one embodiment, a transparent film can be provided as a dielectric layer. In this case, the transparent film can include polyester resins such as polyethylene terephthalate, polyethylene isophthalate, polyethylene naphthalate, and polybutylene terephthalate; cellulose resins such as diacetyl cellulose and triacetyl cellulose; polycarbonate resins; acrylic resins such as polymethyl (meth)acrylate and polyethyl (meth)acrylate; styrene resins such as polystyrene and acrylonitrile-styrene copolymer; polyolefin resins such as polyethylene, polypropylene, polyolefins having a cyclic or norbornene structure, and ethylene-propylene copolymer; vinyl chloride resins; amino resins such as nylon and aromatic polyamide; imide resins; polyethersulfone resins; sulfone resins; polyetheretherketone resins; polyphenylenesulfone resins; vinyl alcohol resins; vinylidene chloride resins; vinyl butyral resins; acrylate resins; polyoxymethylene resins; and thermoplastic resins such as epoxy resins. These resins can be used alone or in combination of two or more. Alternatively, a transparent film made of a thermosetting resin such as a (meth)acrylic, urethane, acrylic urethane, epoxy, or silicone-based resin, or an ultraviolet curable resin may be used as the dielectric layer.

[0051] According to an embodiment, the dielectric layer may include an adhesive film such as an optically clear adhesive (OCA), an optically clear resin (OCR), etc.

[0052] According to an embodiment, the dielectric layer may be formed substantially as a single layer, or may include a multi-layer structure of at least two layers.

[0053] The dielectric layer can form capacitance or inductance, thereby adjusting the frequency band that the antenna unit 111 can drive or sense. When the dielectric constant of the dielectric layer exceeds about 12, the driving frequency is excessively reduced, and driving in the desired high frequency band may not be achieved. Therefore, according to one embodiment, the dielectric constant of the dielectric layer can be adjusted to a range of about 1.5 to 12, preferably, a range of about 2 to 12.

[0054] The antenna conductive layer may be disposed on the upper surface of the dielectric layer. The antenna conductive layer may include one or more antenna patterns, and the antenna pattern may include a radiation electrode and a transmission line.

[0055] The antenna pattern may include silver (Ag), gold (Au), copper (Cu), aluminum (Al), platinum (Pt), palladium (Pd), chromium (Cr), titanium (Ti), tungsten (W), niobium (Nb), tantalum (Ta), vanadium (V), iron (Fe), manganese (Mn), cobalt (Co), nickel (Ni), zinc (Zn), tin (Sn), molybdenum (Mo), calcium (Ca), or an alloy containing at least one of these. These may be used alone or in combination of two or more.

[0056] According to one embodiment, to achieve low resistance, the antenna pattern may include silver (Ag) or a silver alloy (e.g., a silver-palladium-copper (APC) alloy). According to another embodiment, to allow for low resistance and fine linewidth patterning, the antenna pattern may include copper (Cu) or a copper alloy (e.g., a copper-calcium (CuCa) alloy).

[0057] According to an embodiment, the antenna pattern may include a transparent conductive metal oxide such as indium tin oxide (ITO), indium zinc oxide (IZO), indium zinc tin oxide (ITZO), zinc oxide (ZnOx), copper oxide (CuO), or the like.

[0058] According to one embodiment, the antenna pattern may include a laminated structure of a transparent conductive oxide layer and a metal layer. Alternatively, the antenna pattern may have a two-layer structure of a transparent conductive oxide layer and a metal layer, or a three-layer structure of a transparent conductive oxide layer, a metal layer, and a transparent conductive oxide layer. In this case, the metal layer improves flexibility while reducing resistance to increase signal transmission speed. Furthermore, the transparent conductive oxide layer improves corrosion resistance and transparency.

[0059] Antenna substrate 112 can be electrically connected to antenna unit 111. More specifically, antenna substrate 112 can be bonded to the upper surface of antenna unit 111, and the transmission line of antenna substrate 112 can be electrically connected to the antenna pattern of antenna unit 111. For example, antenna substrate 112 can be electrically connected to antenna unit 111 using, but not limited to, ACF (Anisotropic Conductive Film) bonding technology or a coaxial cable. ACF bonding technology is a bonding method that uses anisotropic conductive film (ACF) to achieve conductivity from top to bottom and insulation from left to right.

[0060] According to an embodiment, the antenna substrate 112 may include a flexible printed circuit board (FPCB), but is not limited thereto.

[0061] The stage 210 may include a ground portion 211 and a substrate supporting portion 212 .

[0062] A portion of the antenna unit 111 may be disposed on the upper portion of the ground 211, and the remaining portion of the antenna unit 111 and the antenna substrate 112 may be disposed on the upper portion of the substrate support portion 212. The substrate support portion 212 supports the antenna substrate 220, and as shown in FIG. Figure 2 As shown, a step may be formed on the upper surface of the substrate support portion 212 so that the antenna substrate 112 and the antenna unit 111 may be joined to the antenna substrate 112 and the antenna substrate 112 may be disposed therewith.

[0063] According to one embodiment, the ground 211 may be formed of a metal having a low resistance value. In this case, the low resistance value may be 3Ω or less, preferably 1Ω or less. For example, the ground 211 may be formed of silver (Ag), gold (Au), copper (Cu), aluminum (Al), and alloys thereof (e.g., silver-palladium-copper (APC) alloy).

[0064] According to one embodiment, the substrate support portion 212 may be formed of a material with a relatively low dielectric constant, preferably a material with a dielectric constant less than 5 (eg, fluororesin (PTFE), expanded polystyrene, preferably polytetrafluoroethylene, side shock-absorbing plate (ISOPINK)).

[0065] The inspection substrate 220 may contact the antenna substrate 112 to be connected with the antenna substrate 112. More specifically, the inspection substrate 220 may contact the upper surface of the antenna substrate 112, and the transmission line of the inspection substrate 220 may be electrically connected with the transmission line of the antenna substrate 112.

[0066] According to an embodiment, the inspection substrate 220 may include a flexible printed circuit board (FPCB), but is not limited thereto.

[0067] The connection maintaining unit 230 maintains the contact and connection between the antenna substrate 112 and the inspection substrate 220. For example, while the stage 210 is fixed, the connection maintaining unit 230 descends from above the inspection substrate 220 in response to a predetermined control signal and presses the contact portion between the inspection substrate 220 and the antenna substrate 112 with a predetermined pressure, thereby maintaining the contact and connection between the inspection substrate 220 and the antenna substrate 112. Conversely, while the stage 210 is fixed, the connection maintaining unit 230 ascends. As a result, the connection maintaining unit 230 presses the contact portion between the inspection substrate 220 and the antenna substrate 122 with a predetermined pressure, thereby maintaining the contact and connection between the inspection substrate 220 and the antenna substrate 112. This allows for stable maintenance of the contact and connection between the inspection substrate 230 and the antenna substrate 112.

[0068] The inspection unit 240 may be mounted or connected to the inspection substrate 220 to inspect the antenna unit 111. For example, the inspection unit 240 may measure S parameters and antenna radiation efficiency, and inspect whether there is bonding failure or antenna pattern loss based on the measured values.

[0069] Figure 3 This is a diagram showing another embodiment of the antenna inspection device. Figure 3 The antenna inspection device 300 may be Figure 1 Another embodiment of the antenna inspection device 120.

[0070] Reference Figure 3 The antenna inspection device 300 may include a stage 210, an inspection substrate 220, a connection maintaining unit 230, an inspection unit 240, a first adjustment unit 250, a second adjustment unit 260, and a control unit 270. Here, since the stage 210, the inspection substrate 220, the connection maintaining unit 230, and the inspection unit 240 are similar to the reference Figure 2 The same as above, the detailed description is omitted.

[0071] The first adjustment unit 250 can determine the alignment state of the antenna unit 111 and the ground 211, and adjust the position of the antenna unit 111 or the ground 211 based on the determined alignment state. To this end, the first adjustment unit 250 may include a camera located above or below the ground 211, and a driver that moves the antenna unit 111 or the ground 211.

[0072] The characteristics of the antenna unit 111 may vary depending on the position of the ground 211, that is, the alignment between the antenna unit 111 and the ground 211. Therefore, according to one embodiment, the first adjustment portion 250 can improve the accuracy of the inspection of the antenna unit by accurately positioning and aligning the ground 211 with the lower portion of the antenna unit 111.

[0073] The second adjustment unit 260 can determine the alignment and / or contact state of the inspection substrate 220 and the antenna substrate 112, and adjust the position of the inspection substrate 220 or the antenna substrate 112 based on the determined alignment and / or contact state. To this end, the second adjustment unit 260 can include a camera located above the inspection substrate 220 and a driver for moving the inspection substrate 220 or the stage 210.

[0074] In order to electrically connect the inspection substrate 220 and the antenna substrate 112, the transmission lines of the inspection substrate 220 and the transmission lines of the antenna substrate 112 must be in contact. To achieve this, it is necessary to accurately align and contact the inspection substrate 220 and the antenna substrate 112. Therefore, according to one embodiment, the second adjustment unit 260 can electrically connect the inspection substrate 220 and the antenna substrate 112 by accurately aligning and / or contacting the inspection substrate 220 and the antenna substrate 112. This improves the accuracy of antenna unit inspection.

[0075] The control unit 270 can control the overall operation of the antenna inspection device 300 and process various signals related to the operation of the antenna inspection device 300. According to one embodiment, the control unit 270 can be implemented as one or more processors, one or more memories, or a combination thereof. The control unit 270 can be mounted on the inspection substrate 220 or on a separate substrate connected to the inspection substrate 220.

[0076] Figure 4 This is a diagram showing still another embodiment of the antenna inspection device. Figure 4 The antenna inspection device 400 may be Figure 1 Another embodiment of the antenna inspection device 120.

[0077] Reference Figure 4 , the antenna inspection device 400 may include a stage 410, an inspection substrate 220, a connection maintaining unit 230, an inspection unit 240, a first adjustment unit 250, a second adjustment unit 260, and a control unit 270. Here, since the inspection substrate 220, the connection maintaining unit 230, the inspection unit 240, the first adjustment unit 250, the second adjustment unit 260, and the control unit 270 are similar to the reference Figure 2 and Figure 3 The description is the same, and the detailed description is omitted.

[0078] The antenna device 110 to be inspected can be placed on the stage 410. Figure 2 The carrier 210 may include a ground portion 411 and a substrate supporting portion 412 .

[0079] The antenna unit 111 may be disposed on the upper portion of the ground 411, and the antenna substrate 112 may be disposed on the upper portion of the substrate support portion 412. The substrate support portion 212 supports the antenna substrate 112 and is different from the substrate support portion 212 in that Figure 2 The upper surface of the substrate supporting portion 212 may not have any step difference and may be relatively flat.

[0080] Figure 5 This is a diagram showing still another embodiment of the antenna inspection device. Figure 5 The antenna inspection device 500 may be Figure 1Another embodiment of the antenna inspection device 120. More specifically, Figure 5 The antenna inspection device 500 may be an embodiment when the antenna device as an inspection object is formed of only the antenna unit 111 .

[0081] Reference Figure 5 The antenna inspection device 500 may include a stage 510, an inspection substrate 520, a connection maintenance unit 230, an inspection unit 240, a first adjustment unit 250, a second adjustment unit 560, and a control unit 270. Here, since the connection maintenance unit 230, the inspection unit 240, the first adjustment unit 250, and the control unit 270 are similar to the reference Figures 2 to 4 The same as above, the detailed description is omitted.

[0082] The antenna device including the antenna unit 111 as the inspection object can be arranged on the stage 510. Figure 2 The same as above, detailed description is omitted.

[0083] The stage 510 may include a ground portion 511 and a substrate supporting portion 512 .

[0084] A portion of the antenna unit 111 may be disposed on the upper portion of the ground 511, and the remaining portion of the antenna unit 111 and the inspection substrate 520 may be disposed on the upper portion of the substrate support portion 512. The substrate support portion 512 supports the inspection substrate 520, and Figure 5 As shown, a step may be formed on the upper surface of the substrate support portion 512 so that the joint portion of the antenna unit 111 and the inspection substrate 520 in contact with each other can be arranged.

[0085] The inspection substrate 520 may contact the antenna unit 111 to be connected with the antenna unit 111. More specifically, the inspection substrate 520 may contact the upper surface of the antenna unit 111, and the transmission line of the inspection substrate 520 may be electrically connected with the antenna pattern of the antenna unit 111.

[0086] The second adjustment unit 560 can determine the alignment and / or contact state between the inspection substrate 520 and the antenna unit 111, and adjust the position of the inspection substrate 520 or the antenna unit 111 based on the determined alignment and / or contact state. To this end, the second adjustment unit 560 can include a camera located above the inspection substrate 520 and a driver that moves the inspection substrate 520 or the stage 510.

[0087] To electrically connect the inspection substrate 520 and the antenna unit 111, the transmission line of the inspection substrate 520 must contact the antenna pattern of the antenna unit 111. To achieve this, it is necessary to accurately align and contact the inspection substrate 520 and the antenna unit 111. Therefore, according to one embodiment, the second adjustment unit 560 can electrically connect the inspection substrate 520 and the antenna unit 111 by accurately aligning and / or contacting the inspection substrate 520 and the antenna unit 111. This improves the accuracy of antenna unit inspection.

[0088] Figure 6 This is a diagram showing still another embodiment of the antenna inspection device. Figure 6 The antenna inspection device 600 may be Figure 1 Another embodiment of the antenna inspection device 120. More specifically, Figure 6 The antenna inspection device 600 may be an embodiment when the antenna device as an inspection object is formed of only the antenna unit 111 .

[0089] Reference Figure 6 , the antenna inspection device 600 may include a stage 610, an inspection substrate 520, a connection maintaining unit 230, an inspection unit 240, a first adjustment unit 250, a second adjustment unit 560, and a control unit 270. Here, since the inspection substrate 520, the connection maintaining unit 230, the inspection unit 240, the first adjustment unit 250, the second adjustment unit 560, and the control unit 270 are similar to the reference Figures 2 to 5 The same as above, the detailed description is omitted.

[0090] The antenna device including the antenna unit 111 to be inspected can be placed on the stage 610. The stage 610 can be made of metal, preferably only of metal with low resistance (eg, 1Ω) to function as a ground.

[0091] Figure 7 This is a diagram showing an embodiment of an antenna inspection method. Figure 7 The antenna inspection method can be done by Figure 2 The antenna inspection device 200 performs.

[0092] Reference Figure 7 The antenna inspection device may be configured to place the antenna device on a grounded carrier (710). In this case, the antenna device may include an antenna unit and an antenna substrate connected to the antenna unit.

[0093] The antenna inspection device may bring the inspection substrate into contact with the upper surface of the antenna substrate of the antenna device so as to electrically connect the inspection substrate and the antenna substrate (720).

[0094] The antenna inspection device may press a contact portion of the inspection substrate in contact with the upper surface of the antenna substrate to maintain the connection between the antenna substrate and the inspection substrate (730).

[0095] The antenna inspection device can inspect the antenna device (740). For example, the antenna inspection device can measure the S parameters and antenna radiation efficiency of the antenna device, and check whether there is a poor connection or antenna pattern loss based on the measured values.

[0096] Figure 8 FIG. 1 is a diagram illustrating another embodiment of an antenna inspection method. Figure 8 The antenna inspection method can be done by Figure 3 and Figure 4 The antenna inspection device 300, 400 is executed.

[0097] Reference Figure 8 The antenna inspection device may be configured to place the antenna device on a grounded carrier (810). In this case, the antenna device may include an antenna unit and an antenna substrate connected to the antenna unit.

[0098] The antenna inspection device may determine an alignment state of the antenna unit and the ground, and adjust a position of the antenna unit or the ground based on the determined alignment state (820).

[0099] Depending on the position of the grounding, that is, the alignment of the antenna unit and the grounding, the characteristics of the antenna device may vary. Therefore, according to one embodiment, the antenna inspection device can improve the inspection accuracy of the antenna device by accurately positioning and aligning the grounding under the antenna unit.

[0100] The antenna inspection device may bring the inspection substrate into contact with the upper surface of the antenna substrate so as to electrically connect the inspection substrate and the antenna substrate (830).

[0101] The antenna inspection device may determine an alignment state and / or a contact state of the inspection substrate and the antenna substrate, and adjust a position of the inspection substrate or the antenna substrate based on the determined alignment state and / or contact state (840).

[0102] To electrically connect the inspection substrate and the antenna substrate, the transmission lines on the inspection substrate and the antenna substrate must be brought into contact. To achieve this, it is necessary to accurately align and contact the inspection substrate and the antenna substrate. Therefore, according to one embodiment, an antenna inspection device can electrically connect the inspection substrate and the antenna substrate by accurately aligning and / or contacting the inspection substrate and the antenna substrate. This improves the accuracy of antenna device inspection.

[0103] The antenna inspection device may press a contact portion of the inspection substrate in contact with the upper surface of the antenna substrate to maintain the connection between the antenna substrate and the inspection substrate (850).

[0104] The antenna inspection device can inspect the antenna device (860). For example, the antenna inspection device can measure the S parameters and antenna radiation efficiency of the antenna device, and based on the measured values, inspect whether there is poor bonding, antenna pattern loss, etc.

[0105] Figure 9 This is a diagram showing still another embodiment of the antenna inspection method. Figure 9 The antenna inspection method can be done by Figure 5 and Figure 6 The antenna inspection device 500, 600 is executed.

[0106] Reference Figure 9 The antenna inspection device may configure the antenna device on a grounded carrier (910). In this case, the antenna device may include an antenna unit.

[0107] The antenna inspection device may determine an alignment state of the antenna unit and the ground, and adjust a position of the antenna unit or the ground based on the determined alignment state (920).

[0108] Depending on the position of the grounding, that is, the alignment of the antenna unit and the grounding, the characteristics of the antenna device may vary. Therefore, according to one embodiment, the antenna inspection device can improve the inspection accuracy of the antenna device by accurately positioning and aligning the grounding under the antenna unit.

[0109] The antenna inspection device may bring the inspection substrate into contact with the upper surface of the antenna unit to electrically connect the inspection substrate and the antenna unit (930).

[0110] The antenna inspection device may determine an alignment state and / or a contact state between the inspection substrate and the antenna unit, and adjust a position of the inspection substrate or the antenna unit based on the determined alignment state and / or contact state (940).

[0111] To electrically connect the inspection substrate and the antenna unit, the transmission line of the inspection substrate and the antenna pattern of the antenna unit must be brought into contact. To achieve this, it is necessary to accurately align and contact the inspection substrate and the antenna unit. Therefore, according to one embodiment, an antenna inspection device can electrically connect the inspection substrate and the antenna unit by accurately aligning and / or contacting the inspection substrate and the antenna unit. This improves the accuracy of antenna device inspection.

[0112] The antenna inspection device may press a contact portion of the inspection substrate in contact with the upper surface of the antenna unit to maintain the connection between the antenna unit and the inspection substrate (950).

[0113] The antenna inspection device can inspect the antenna device (960). For example, the antenna inspection device can measure the S parameters and antenna radiation efficiency of the antenna device, and inspect whether there is poor bonding, antenna pattern loss, etc. based on the measured values.

[0114] The above-described embodiments can be implemented as computer-readable code in a computer-readable recording medium. Computer-readable recording media may include any type of recording device that stores data readable by a computer system. Examples of computer-readable recording media include ROM, RAM, CD-ROM, magnetic tape, floppy disk, optical disk, etc. In addition, the computer-readable recording medium can be distributed to computer systems connected via a network so that the computer-readable code can be written and executed in a distributed manner.

[0115] The analysis thus far has centered around the preferred embodiments. Those skilled in the art will appreciate that the present invention can be implemented in various variations without departing from its essential characteristics. Therefore, the scope of the present invention is not limited to the aforementioned embodiments but should be interpreted as encompassing various implementations within the scope equivalent to those recited in the claims.

Claims

1. An antenna inspection device, characterized in that: include: A carrier for arranging the antenna device, wherein the carrier includes a ground; inspecting a substrate that is in contact with and connected to the antenna assembly; a connection maintaining portion for maintaining contact and connection between the antenna device and the inspection substrate; a first adjustment unit configured to determine an alignment state between the antenna device and the ground; as well as An inspection unit is mounted on or connected to the inspection substrate to inspect the antenna device.

2. The antenna inspection device according to claim 1, wherein: The ground is formed of a metal having a resistance value of 3Ω or less.

3. The antenna inspection device according to claim 2, wherein: The grounding is formed of silver, gold, copper, aluminum and alloys thereof.

4. The antenna inspection device according to claim 1, wherein: The inspection substrate includes a flexible printed circuit board.

5. The antenna inspection device according to claim 1, wherein The connection maintaining portion presses a contact portion between the antenna device and the inspection substrate to maintain contact and connection between the antenna device and the inspection substrate.

6. The antenna inspection device according to claim 1, wherein: The inspection section measures an S parameter and antenna radiation efficiency of the antenna device.

7. The antenna inspection device according to claim 1, wherein: The first adjustment unit adjusts a position of the antenna device or the ground based on the determined alignment state.

8. The antenna inspection device according to claim 1, wherein: Also includes: A second adjustment unit determines an alignment state or a contact state between the inspection substrate and the antenna device.

9. The antenna inspection device according to claim 8, characterized in that The second adjustment section adjusts a position of the inspection substrate or the antenna device based on the determined alignment state or contact state.

10. The antenna inspection device according to claim 1, wherein: The carrier also includes a substrate supporting portion, The substrate supporting portion supports the antenna device or the inspection substrate.

11. The antenna inspection device according to claim 10, wherein: The substrate supporting portion is formed of polytetrafluoroethylene or a side vibration-proof plate.

12. An antenna inspection device, characterized in that: include: A carrier for arranging the antenna device and including a ground; inspecting a substrate that is in contact with and connected to the antenna assembly; a connection maintaining portion for maintaining contact and connection between the antenna device and the inspection substrate; a second adjustment unit configured to determine an alignment state or a contact state between the inspection substrate and the antenna device; as well as An inspection unit is mounted on or connected to the inspection substrate to inspect the antenna device.

13. An antenna inspection method, characterized in that: include: The step of disposing the antenna device on a carrier including a ground; a step of determining an alignment state between the antenna assembly and the ground; a step of adjusting the position of the antenna device or the ground based on the determined alignment state; a step of bringing the inspection substrate into contact with and connecting the antenna device; a step of pressing a contact portion between the inspection substrate and the antenna device; as well as Steps for inspecting the antenna device.

14. The antenna inspection method according to claim 13, wherein: Also includes: a step of determining an alignment state or a contact state between the inspection substrate and the antenna device; as well as A step of adjusting the position of the inspection substrate or the antenna device based on the determined alignment state or contact state.

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