A test system and method for high-resistance grounding identification device of distribution network
By using the hybrid waveform method to randomly mix the real, simulated and disturbed waveforms in the high-resistance ground recognition device test system of the distribution network, a test platform that can effectively test the high-resistance ground recognition device is built, which solves the difficulty of existing test methods It satisfies the problems of practical applications and flexible adjustment of fault waveforms, and realizes a comprehensive analysis of identification accuracy, misjudgment rate and misjudgment rate.
Patent Information
- Application Number
- CN202111204146.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2021-10-15
- Publication Date
- 2025-02-18
- Estimated Expiration
- 2041-10-15
AI Technical Summary
The existing testing methods based on real-time digital simulators and distribution network real-type laboratories are difficult to meet the needs of practical applications and flexible adjustment of fault waveforms, and cannot effectively test the identification accuracy and error of the distribution network high-resistance ground recognition device. judgment rate and miss judgment rate.
Provide a test system and testing method for high-resistance ground recognition device in the distribution network. The hybrid waveform method is used to randomly mix the real waveform, simulated waveform and interference waveform, and pass the waveform library module, test controller, waveform amplifier and test result analysis module. Build a test platform.
Analyzing the identification accuracy, misjudgment rate and misjudgment rate of high-resistance ground recognition devices in various fault environments, providing a reliable basis for the research and development and factory development of high-resistance ground recognition devices, and solving the difficulty of applying existing test methods. The problem of practical application and flexible adjustment of fault waveforms.
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Figure CN113933651B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of distribution network fault identification, and in particular to a test system and a test method based on a distribution network high-resistance grounding identification device. Background Art
[0002] A high-resistance ground fault (HIF) refers to a ground fault that occurs when a power line passes through conductive media such as roads, soil, branches or concrete buildings. A high-resistance ground fault in a distribution network can easily cause fires or electric shocks, affect the reliability of the distribution network, and cause a significant social impact.
[0003] Before the high-resistance grounding identification device is put into use, it is necessary to test the accuracy of the device under various fault environments and interference factors, so as to timely discover fault scenarios that the identification algorithm cannot identify, conduct targeted intensive training, and improve the generalization ability of the device. The distribution network digital dynamic simulation system is built based on a real-time digital simulator and connected with the test equipment to form a real-time closed-loop test platform. The simulation of distribution network devices has parameter neglect, and it is impossible to reproduce the multiple types of distribution network grounding fault waveforms with high fidelity, which is difficult to fit the actual application; the test device is connected to the distribution network real laboratory, and various fault environments are artificially simulated. The device collects real fault waveforms. The functional performance test method fixes the supported fault types and fault parameters during design, which has poor flexibility and cannot traverse the fault environment as much as possible. Summary of the invention
[0004] The embodiments of the present invention provide a test system and a test method for a high-resistance grounding identification device based on a distribution network, so as to solve the technical problems that the existing test methods based on real-time digital simulators and the test methods based on distribution network real laboratories are difficult to meet the requirements of practical applications and flexible adjustment of fault waveforms.
[0005] In view of this, a first aspect of the present invention provides a test system for a high-resistance grounding identification device of a distribution network, the system comprising: a waveform library module, a test controller, a waveform amplifier and a test result analysis module;
[0006] The waveform library module includes a measured waveform sub-library module, a simulated waveform sub-library module and an interference waveform sub-library module. The measured waveform sub-library module is used to store a real waveform set, the simulated waveform sub-library module is used to store a simulated waveform set, and the interference waveform sub-library module is used to store an interference waveform set, wherein both the real waveform set and the simulated waveform set contain high-resistance fault waveforms and non-high-resistance fault waveforms;
[0007] The test controller includes a parameter setting module and a waveform mixing module. The parameter setting module is used to set the test parameters. The waveform mixing module is used to randomly extract waveforms from the waveform library module for mixing to obtain a mixed waveform file.
[0008] The waveform amplifier is used to amplify or reduce the mixed waveform according to the waveform amplitude recorded in the mixed waveform file, and input the processed mixed waveform into the distribution network high-resistance grounding identification device;
[0009] The test result analysis module is used to receive the action results fed back by the distribution network high-resistance grounding identification device and perform statistical analysis on the action results.
[0010] Optionally, the parameter setting module is specifically used to set the number of tests, the high and low thresholds of the real waveform (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 .
[0011] Optionally, the waveform mixing module is specifically used for:
[0012] Randomly generate 3 random numbers, namely the first random number r 1 , the second random number r 2 and the third random number r 3 ;
[0013] The first random number r 1 , the second random number r 2 and the third random number r 3 Respectively with the real waveform high and low thresholds (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 Performing comparison and obtaining comparison results;
[0014] Determine the selected waveform according to the comparison result;
[0015] Mix the selected waveforms to obtain a mixed waveform file.
[0016] Optionally, the selected waveforms are mixed to obtain a mixed waveform file, including:
[0017] Cut the selected waveform into blocks according to the fixed window length to obtain waveform blocks of the selected waveform;
[0018] Calculate the permutation coefficient of each waveform block according to the KL divergence of each waveform block, where the permutation coefficient is the ratio of the KL divergence of the waveform block to the total KL divergence of all waveform blocks;
[0019] Arrange all waveform blocks in descending order according to the arrangement coefficients, and accumulate the arrangement coefficients of the waveform blocks in sequence until the sum of the arrangement coefficients is not less than the coefficient threshold;
[0020] The waveform blocks corresponding to the sum of the arrangement coefficients not less than the coefficient threshold are selected to form a mixed waveform file.
[0021] Optionally, determining the selected waveform according to the comparison result includes:
[0022] When 1 ≤l 1 When the real waveform is not selected, 1 <r 1 ≤h 1 When h 1 <r 1 Select any high-impedance real waveform;
[0023] When 2 ≤l 2 When the simulation waveform is not selected, 2 <r 2 ≤h 2 When selecting any non-high-resistance simulation waveform, when h 2 <r 2 Select any high-resistance simulation waveform;
[0024] When 3 ≤l 3 When no interference waveform is selected, when l 3 <r 3 Select any interference waveform.
[0025] Optionally, the test result analysis module is specifically used for:
[0026] Receive the action results fed back by the high-resistance grounding identification device of the distribution network and collect statistics on the action results;
[0027] The action accuracy, misjudgment rate and missed judgment rate of the high-resistance grounding identification device are calculated based on the statistical action results.
[0028] Optionally, it also includes:
[0029] The waveform simulation platform is used to connect with the simulation waveform sub-library module and supplement the corresponding simulation waveform to the simulation waveform sub-library module according to the waveform requirements of the simulation waveform sub-library module.
[0030] A second aspect of the present invention provides a method for testing a high-resistance grounding identification device in a distribution network, the method comprising:
[0031] Constructing a waveform library, the waveform library includes a real waveform set, a simulated waveform set and an interference waveform set, wherein the real waveform set and the simulated waveform set both include high-resistance fault waveforms and non-high-resistance fault waveforms;
[0032] Set the test parameters, randomly extract waveforms from the waveform library and mix them to obtain a mixed waveform file;
[0033] Amplify or reduce the mixed waveform according to the waveform amplitude recorded in the mixed waveform file, and input the processed mixed waveform into the distribution network high-resistance grounding identification device;
[0034] Receive the action results fed back by the distribution network high-resistance grounding identification device and perform statistical analysis on the action results.
[0035] Optionally, the test parameters include the number of tests, the high and low thresholds of the real waveform (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 .
[0036] Optionally, waveforms are randomly extracted from a waveform library and mixed to obtain a mixed waveform file, including:
[0037] Randomly generate 3 random numbers, namely the first random number r 1 , the second random number r 2 and the third random number r 3 ;
[0038] The first random number r 1 , the second random number r 2 and the third random number r 3 Respectively with the real waveform high and low thresholds (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 Performing comparison and obtaining comparison results;
[0039] Determine the selected waveform according to the comparison result;
[0040] Mix the selected waveforms to obtain a mixed waveform file.
[0041] It can be seen from the above technical solutions that the embodiments of the present invention have the following advantages:
[0042] The test system for the high-resistance grounding identification device of the distribution network provided in the present invention adopts a mixed waveform method to randomly mix the real waveform, the simulated waveform and the interference waveform, and ensures the authenticity of the fault waveform based on the measured real waveform, and the simulated waveform ensures the comprehensiveness of the fault environment. At the same time, the interference model is taken into account, and the anti-interference performance of the device during actual operation can be verified, and the recognition accuracy, misjudgment rate and missed judgment rate analysis of the high-resistance grounding identification device under various fault environments are realized, which provides a reliable basis for the research and development and delivery of the high-resistance grounding identification device, and solves the technical problems that the existing test methods based on real-time digital simulators and the test methods based on distribution network real laboratories are difficult to meet the requirements of practical applications and flexible adjustment of fault waveforms. BRIEF DESCRIPTION OF THE DRAWINGS
[0043] Figure 1 It is a structural schematic diagram of a distribution network high-resistance grounding identification device test system provided in an embodiment of the present invention;
[0044] Figure 2 A schematic diagram of the process of waveform extraction and mixing provided in an embodiment of the present invention;
[0045] Figure 3 The present invention is a flowchart of a method for testing a high-resistance grounding identification device for a distribution network provided in an embodiment of the present invention. DETAILED DESCRIPTION
[0046] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0047] For easier understanding, see Figure 1 , Figure 1 A test system for a high-resistance grounding identification device for a distribution network provided in an embodiment of the present invention is provided. Figure 1 As shown, the distribution network high-resistance grounding identification device test system includes:
[0048] Waveform library module, test controller, waveform amplifier and test result analysis module;
[0049] The waveform library module includes a measured waveform sub-library module, a simulated waveform sub-library module and an interference waveform sub-library module. The measured waveform sub-library module is used to store a real waveform set, the simulated waveform sub-library module is used to store a simulated waveform set, and the interference waveform sub-library module is used to store an interference waveform set, wherein both the real waveform set and the simulated waveform set contain high-resistance fault waveforms and non-high-resistance fault waveforms;
[0050] The test controller includes a parameter setting module and a waveform mixing module. The parameter setting module is used to set the test parameters. The waveform mixing module is used to randomly extract waveforms from the waveform library module for mixing to obtain a mixed waveform file.
[0051] The waveform amplifier is used to amplify or reduce the mixed waveform according to the waveform amplitude recorded in the mixed waveform file, and input the processed mixed waveform into the distribution network high-resistance grounding identification device;
[0052] The test result analysis module is used to receive the action results fed back by the distribution network high-resistance grounding identification device and perform statistical analysis on the action results.
[0053] It should be noted that the waveform library stores various types of real waveforms, simulated waveforms and interference waveforms, and uses parameters to record the waveform environment. The real waveforms in the measured waveform sub-library module include high-resistance fault waveforms and non-high-resistance fault waveforms, which are recorded as {waveform code, distribution network type, grounding form, grounding resistance, grounding phase, noise environment, grounding medium, sampling rate, sampling period}, the simulated waveforms in the simulated waveform sub-library module include high-resistance fault waveforms and non-high-resistance fault waveforms, which are recorded as {waveform code, distribution network type, grounding form, grounding resistance, grounding phase, noise environment, sampling rate, sampling period}, and the interference waveforms in the interference waveform sub-library module are recorded as {waveform code, interference waveform type, sampling rate, sampling period}. The interference waveform types include load switching, capacitor switching, electromagnetic saturation, etc. Interference waveforms can easily misjudge normal grid operation as high-resistance faults.
[0054] The test controller mainly includes a parameter setting module and a waveform mixing module. After the parameters are set in the parameter setting module, the waveform mixing module calls the waveform mixing in the waveform library according to the test instructions to generate a mixed waveform file, and outputs it to the waveform amplifier for processing. The waveform amplifier drives the corresponding fault current according to the waveform amplitude recorded in the mixed waveform file. The waveform amplifier can flexibly amplify and reduce the waveform amplitude, and a multi-stage amplifier can be connected after the waveform amplifier to flexibly adjust the fault current.
[0055] The test result analysis module records the result value of this test according to the reference result of the test controller and the feedback result of the device action. Initially, A, B, C, and D are all 0. Each time the test meets the preset conditions, the corresponding test result increases by 1 until all test waveforms are tested. The output reference result of the waveform mixture is shown in Table 1, and the test result statistics are shown in Table 2.
[0056] Table 1
[0057]
[0058]
[0059] Table 2
[0060] Reference results Device action feedback results Number of tests Condition 1 High resistance action A+1 Condition 2 High resistance No action B+1 Condition 3 Non-high impedance action C+1 Condition 4 Non-high impedance No action D+1
[0061] According to Table 2, the device performance indicators are calculated, including the accuracy rate, false positive rate and missed positive rate:
[0062] Correctness = (A+D) / (A+B+C+D)
[0063] False positive rate = C / (C+D)
[0064] Missed judgment rate = B / (A+B).
[0065] The distribution network high-resistance grounding identification device test system provided in the present invention can automatically and randomly generate test waveforms after setting parameters. It has a high degree of automation, and the generated waveforms are different for each test, which can overcome the problem of targeted optimization of the device for a certain type of test device and test waveform.
[0066] The test system for the high-resistance grounding identification device of the distribution network provided in the present invention adopts a mixed waveform method to randomly mix the real waveform, the simulated waveform and the interference waveform, and ensures the authenticity of the fault waveform based on the measured real waveform, and the simulated waveform ensures the comprehensiveness of the fault environment. At the same time, the interference model is taken into account, and the anti-interference performance of the device during actual operation can be verified, and the recognition accuracy, misjudgment rate and missed judgment rate analysis of the high-resistance grounding identification device under various fault environments are realized, which provides a reliable basis for the research and development and delivery of the high-resistance grounding identification device, and solves the technical problems that the existing test methods based on real-time digital simulators and the test methods based on distribution network real laboratories are difficult to meet the requirements of practical applications and flexible adjustment of fault waveforms.
[0067] Specifically, set the test times, the high and low thresholds of the real waveform (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 The waveform mixing module randomly generates three random numbers, namely the first random number r 1 , the second random number r 2 and the third random number r 3 , the first random number r 1 , the second random number r 2 and the third random number r 3 Respectively with the real waveform high and low thresholds (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l3 Compare and get the comparison result. When r 1 ≤l 1 When the real waveform is not selected, 1 <r 1 ≤h 1 When h is selected, any non-high-resistance real waveform is selected, that is, a waveform with a ground resistance less than 200 ohms is randomly selected. 1 <r 1 When r 2 ≤l 2 When the simulation waveform is not selected, 2 <r 2 ≤h 2 When h is selected, any non-high-resistance simulation waveform is selected, that is, a waveform with a ground resistance less than 200 ohms is randomly selected. 2 <r 2 When r 3 ≤l 3 When no interference waveform is selected, when l 3 <r 3 When selecting any interference waveform, the selected waveforms will be mixed to obtain a mixed waveform file.
[0068] See also Figure 2 , Figure 2 Schematic diagram of the process of waveform extraction and mixing provided in the present invention. In one embodiment, in order to reduce the amount of calculation and improve the test efficiency, the method of waveform mixing (i.e., mixing the selected waveforms to obtain a mixed waveform file) can also be optimized as follows:
[0069] (1) The selected waveform is cut into blocks according to a fixed window length to obtain waveform blocks of the selected waveform. That is, if the selected waveform includes a real waveform, a simulated waveform, and an interference waveform, the real waveform, the simulated waveform, and the interference waveform are cut into blocks according to the fixed window length; if there is only one or two waveforms in the selected waveform, the one or two waveforms are cut into blocks according to the fixed window length.
[0070] (2) Calculate the permutation coefficient of each waveform block according to the KL divergence of each waveform block, where the permutation coefficient is the ratio of the KL divergence of the waveform block to the total KL divergence of all waveform blocks.
[0071] According to the KL divergence calculation formula, the KL divergence of the real waveform block, the simulated waveform block and the interference waveform block are calculated respectively, kf x Expressed as the KL divergence of the x-th real waveform block, ks y Expressed as the KL divergence of the yth simulation waveform block, kdz It is expressed as the KL divergence of the zth interference waveform block. The calculation formula of the permutation coefficient of the waveform block is:
[0072]
[0073]
[0074]
[0075] Among them, X represents the number of real waveform blocks, Y represents the number of simulated waveform blocks, Z represents the number of interference waveform blocks, sf x Indicates the permutation coefficient of the xth real waveform block, ss y Indicates the arrangement coefficient of the yth simulation waveform block, sd z Represents the permutation coefficient of the zth interference waveform block.
[0076] (3) Arrange all waveform blocks in descending order according to the arrangement coefficients, and add the arrangement coefficients of the waveform blocks in sequence until the sum of the arrangement coefficients is not less than the coefficient threshold. The coefficient threshold can be selected according to actual conditions and is not limited here.
[0077] (4) The waveform blocks corresponding to the sum of the permutation coefficients not less than the coefficient threshold are selected to form a mixed waveform file. That is, if there are 20 waveform blocks, there are 20 corresponding permutation coefficients, then these 20 permutation coefficients are sorted in descending order. If the sum of the permutation coefficients of the first 10 waveform blocks is not less than the coefficient threshold, then the waveform blocks selected are the first 10 waveform blocks, and the first 10 waveform blocks are used to form a mixed waveform.
[0078] In one embodiment, the distribution network high-resistance grounding identification device test system of the present invention may also include:
[0079] The waveform simulation platform is used to connect with the simulation waveform sub-library module, and supplement the corresponding simulation waveform to the simulation waveform sub-library module according to the waveform requirements of the simulation waveform sub-library module. The addition of new waveforms by the waveform simulation platform is conducive to timely updating and iterating the simulation waveforms in the simulation waveform sub-library module to ensure the accuracy and reliability of the system. Of course, the real waveforms in the measured waveform sub-library module and the interference waveforms in the interference waveform sub-library can also be updated regularly or irregularly according to actual applications.
[0080] For easier understanding, see Figure 3 The present invention also provides an embodiment of a method for testing a high-resistance grounding identification device of a distribution network, comprising:
[0081] Step 101, constructing a waveform library, the waveform library including a real waveform set, a simulated waveform set and an interference waveform set, wherein the real waveform set and the simulated waveform set both contain high-resistance fault waveforms and non-high-resistance fault waveforms;
[0082] Step 102, setting test parameters, randomly extracting waveforms from the waveform library for mixing, and obtaining a mixed waveform file;
[0083] Step 103, amplify or reduce the mixed waveform according to the waveform amplitude recorded in the mixed waveform file, and input the processed mixed waveform into the distribution network high-resistance grounding identification device;
[0084] Step 104: Receive the action result fed back by the distribution network high-resistance grounding identification device, and perform statistical analysis on the action result.
[0085] Test parameters include test times, high and low thresholds of real waveform (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 .
[0086] Randomly extract waveforms from the waveform library and mix them to get a mixed waveform file, including:
[0087] Randomly generate 3 random numbers, namely the first random number r 1 , the second random number r 2 and the third random number r 3 ;
[0088] The first random number r 1 , the second random number r 2 and the third random number r 3 Respectively with the real waveform high and low thresholds (l 1 ,h 1 )、simulation waveform high and low thresholds (l 2 ,h 2 ) and interference waveform threshold l 3 Performing comparison and obtaining comparison results;
[0089] Determine the selected waveform according to the comparison result;
[0090] Mix the selected waveforms to obtain a mixed waveform file.
[0091] Mix the selected waveforms to obtain a mixed waveform file, including:
[0092] Cut the selected waveform into blocks according to the fixed window length to obtain waveform blocks of the selected waveform;
[0093] Calculate the permutation coefficient of each waveform block according to the KL divergence of each waveform block, where the permutation coefficient is the ratio of the KL divergence of the waveform block to the total KL divergence of all waveform blocks;
[0094] Arrange all waveform blocks in descending order according to the arrangement coefficients, and accumulate the arrangement coefficients of the waveform blocks in sequence until the sum of the arrangement coefficients is not less than the coefficient threshold;
[0095] The waveform blocks corresponding to the sum of the arrangement coefficients not less than the coefficient threshold are selected to form a mixed waveform file.
[0096] The selected waveform is determined based on the comparison result, including:
[0097] When 1 ≤l 1 When the real waveform is not selected, 1 <r 1 ≤h 1 When h 1 <r 1 Select any high-impedance real waveform;
[0098] When 2 ≤l 2 When the simulation waveform is not selected, 2 <r 2 ≤h 2 When selecting any non-high-resistance simulation waveform, when h 2 <r 2 Select any high-resistance simulation waveform;
[0099] When 3 ≤l 3 When no interference waveform is selected, when l 3 <r 3 Select any interference waveform.
[0100] When a simulation waveform update request is received, the corresponding simulation waveform is added to the waveform library.
[0101] The test method for the high-resistance grounding identification device of the distribution network provided in the present invention adopts a mixed waveform method to randomly mix the real waveform, the simulated waveform and the interference waveform, and ensures the authenticity of the fault waveform based on the measured real waveform, and the simulated waveform ensures the comprehensiveness of the fault environment. At the same time, the interference model is taken into account, and the anti-interference performance of the device during actual operation can be verified, and the recognition accuracy, misjudgment rate and missed judgment rate analysis of the high-resistance grounding identification device under various fault environments are realized, which provides a reliable basis for the research and development and delivery of the high-resistance grounding identification device, and solves the technical problems that the existing test methods based on real-time digital simulators and the test methods based on distribution network real laboratories are difficult to meet the requirements of practical applications and flexible adjustment of fault waveforms.
[0102] The distribution network high-resistance grounding identification device testing method provided in the present invention is executed in the distribution network high-resistance grounding identification device testing system in the aforementioned distribution network high-resistance grounding identification device testing system embodiment, and its working principle is the same as that of the aforementioned distribution network high-resistance grounding identification device testing system embodiment, which will not be repeated here.
[0103] As described above, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features thereof may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims
1. A distribution network high-resistance grounding identification device test system, characterized in that: include: Waveform library module, test controller, waveform amplifier and test result analysis module; The waveform library module includes a measured waveform sub-library module, a simulated waveform sub-library module and an interference waveform sub-library module. The measured waveform sub-library module is used to store a real waveform set, the simulated waveform sub-library module is used to store a simulated waveform set, and the interference waveform sub-library module is used to store an interference waveform set, wherein both the real waveform set and the simulated waveform set contain high-resistance fault waveforms and non-high-resistance fault waveforms; The test controller includes a parameter setting module and a waveform mixing module. The parameter setting module is used to set the test parameters. The waveform mixing module is used to randomly extract waveforms from the waveform library module for mixing to obtain a mixed waveform file. The waveform amplifier is used to amplify or reduce the mixed waveform according to the waveform amplitude recorded in the mixed waveform file, and input the processed mixed waveform into the distribution network high-resistance grounding identification device; The test result analysis module is used to receive the action results fed back by the distribution network high-resistance grounding identification device and perform statistical analysis on the action results; The parameter setting module is specifically used to set the number of tests, the high and low thresholds h1 and l1 of the real waveform, the high and low thresholds h2 and l2 of the simulated waveform, and the interference waveform threshold l3; The waveform mixing module is specifically used for: Randomly generate three random numbers, namely a first random number r1, a second random number r2 and a third random number r3; Compare the first random number r1, the second random number r2 and the third random number r3 with the real waveform high and low thresholds h1 and l1, the simulated waveform high and low thresholds h2 and l2, and the interference waveform threshold l3, respectively, to obtain a comparison result; Determine the selected waveform according to the comparison result; Mix the selected waveforms to obtain a mixed waveform file.
2. The distribution network high-resistance grounding identification device test system according to claim 1 is characterized in that: Mix the selected waveforms to obtain a mixed waveform file, including: Cut the selected waveform into blocks according to the fixed window length to obtain waveform blocks of the selected waveform; Calculate the permutation coefficient of each waveform block according to the KL divergence of each waveform block, where the permutation coefficient is the ratio of the KL divergence of the waveform block to the total KL divergence of all waveform blocks; Arrange all waveform blocks in descending order according to the arrangement coefficients, and accumulate the arrangement coefficients of the waveform blocks in sequence until the sum of the arrangement coefficients is not less than the coefficient threshold; The waveform blocks corresponding to the sum of the arrangement coefficients not less than the coefficient threshold are selected to form a mixed waveform file.
3. The distribution network high-resistance grounding identification device test system according to claim 1 is characterized in that: The selected waveform is determined based on the comparison result, including: When r1≤l1, do not select the real waveform; when l1<r1≤h1, select any non-high-resistance real waveform; when h1<r1, select any high-resistance real waveform; When r2≤l2, no simulation waveform is selected; when l2<r2≤h2, any non-high-resistance simulation waveform is selected; when h2<r2, any high-resistance simulation waveform is selected; When r3≤l3, no interference waveform is selected, and when l3<r3, any interference waveform is selected.
4. The distribution network high-resistance grounding identification device test system according to claim 1 is characterized in that: The test result analysis module is specifically used for: Receive the action results fed back by the high-resistance grounding identification device of the distribution network and collect statistics on the action results; The action accuracy, misjudgment rate and missed judgment rate of the high-resistance grounding identification device are calculated based on the statistical action results.
5. The distribution network high-resistance grounding identification device test system according to claim 1 is characterized in that: Also includes: The waveform simulation platform is used to connect with the simulation waveform sub-library module and supplement the corresponding simulation waveform to the simulation waveform sub-library module according to the waveform requirements of the simulation waveform sub-library module.
6. A method for testing a high-resistance grounding identification device in a distribution network, characterized in that: include: Constructing a waveform library, the waveform library includes a real waveform set, a simulated waveform set and an interference waveform set, wherein the real waveform set and the simulated waveform set both include high-resistance fault waveforms and non-high-resistance fault waveforms; Set the test parameters, randomly extract waveforms from the waveform library and mix them to obtain a mixed waveform file. The test parameters include the number of tests, the high and low thresholds h1 and l1 of the real waveform, the high and low thresholds h2 and l2 of the simulated waveform, and the interference waveform threshold l3; Amplify or reduce the mixed waveform according to the waveform amplitude recorded in the mixed waveform file, and input the processed mixed waveform into the distribution network high-resistance grounding identification device; Receive the action results fed back by the high-resistance grounding identification device of the distribution network and perform statistical analysis on the action results; Randomly extract waveforms from the waveform library and mix them to get a mixed waveform file, including: Randomly generate three random numbers, namely a first random number r1, a second random number r2 and a third random number r3; Compare the first random number r1, the second random number r2 and the third random number r3 with the real waveform high and low thresholds h1 and l1, the simulated waveform high and low thresholds h2 and l2, and the interference waveform threshold l3, respectively, to obtain a comparison result; Determine the selected waveform according to the comparison result; Mix the selected waveforms to obtain a mixed waveform file.
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