A high-reliability single-event transient prevention protection locking circuit

Abstract

This invention discloses a highly reliable protection and locking circuit capable of withstanding single-particle transients, belonging to the field of satellite power technology. Its key feature is that it includes at least: a trigger module that receives a signal Pro. SET Amplitude and time signals, Pro SET Amplitude and time signals with reference V REF The system compares data and outputs a trigger signal; a locking module receives the trigger signal and outputs an instruction on whether to execute the locking signal based on the trigger signal; a reset module sends a reset instruction to the locking module. This system is suitable for protection circuit design in medium and high orbit space power controllers or in high-radiation ground environments, and has the advantages of good radiation resistance, high reliability, and stable operation.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of satellite power supply, and particularly relates to a high-reliability protection locking circuit capable of preventing single event transients. BACKGROUND

[0002] In view of the application characteristics that the space power supply products in medium and high orbits are difficult to maintain in orbit, the space power supply products are required to have high reliability, automatic fault detection and self-isolation functions, the protection function is set in the power supply control circuit to prevent abnormal power supply caused by device failure or other external factors, but it is found that the protection circuit of multiple satellites abnormally operates in orbit, and the protection circuit is normal after reset or power-off restart, which is caused by insufficient protection circuit anti-single event transient effect margin. SUMMARY

[0003] The application provides a high-reliability protection locking circuit capable of preventing single event transients, which is suitable for the protection circuit design of space power supply controllers in medium and high orbits or in high radiation environments on the ground, and has the advantages of good radiation resistance, high reliability and stable reliability.

[0004] The application aims to provide a high-reliability protection locking circuit capable of preventing single event transients, which comprises:

[0005] a trigger module (1) receiving a signal Pro SET amplitude and time signal, comparing the Pro SET amplitude and time signal with a reference V REF and outputting a trigger signal;

[0006] a locking module (2) receiving the trigger signal and outputting an instruction of whether to execute a locking signal according to the trigger signal;

[0007] a reset module (3) sending a reset instruction to the locking module (2).

[0008] Preferably, the trigger module (1) comprises a trigger circuit, the Pro SET signal terminal is connected with a comparison terminal of the trigger circuit through a first resistor, the comparison terminal is connected with an output terminal of the trigger circuit through a third resistor, and the comparison terminal is grounded through a first capacitor; a reference terminal of the trigger circuit is grounded through a second capacitor, the reference terminal is connected with a reference power supply in sequence through a second capacitor, a second resistor and the reference power supply, the reference terminal is connected with a negative electrode of a voltage stabilizing diode, and a positive electrode of the voltage stabilizing diode is grounded.

[0009] Preferably, the locking module (2) comprises a latch circuit, the output terminal of the triggering module (1) is connected with the positive terminal of the latch circuit through a fourth resistance, the output terminal of the resetting module (3) is connected with the negative terminal of the latch circuit through a twelfth resistance, the positive terminal of the latch circuit is connected with the power supply through a fourth capacitor, the positive terminal of the latch circuit is connected with the output terminal of the latch circuit through a seventh resistance, the output terminal of the latch circuit is connected with the power supply through a seventh resistance and an eighth resistance in turn, the output terminal of the latch circuit is connected with the base of a first triode through a tenth resistance, the collector of the first triode is connected with the power supply, the emitter of the first triode is connected with the output signal output terminal through an eleventh resistance; the emitter of the first triode is grounded through a ninth resistance, the emitter of the first triode is grounded through a fifth capacitor, the negative resistance of the latch circuit is grounded through a third capacitor and a sixth resistance respectively, and the negative resistance of the latch circuit is connected with the power supply through a fifth resistance.

[0010] Preferably, the resetting module (3) comprises a second triode, the base of the second triode is connected with the resetting signal source terminal through a fourteenth resistance, the base of the second triode is grounded through a sixth capacitor and a thirteenth resistance respectively, the base of the second triode is connected with the emitter through a thirteenth resistance, and the collector of the second triode is connected with the resetting signal output terminal.

[0011] Preferably, the first triode and the second triode are both NPN type triodes.

[0012] The application has the advantages and positive effects that:

[0013] 1. The patent adopts a protection triggering circuit with hysteresis to realize the detection function of the protection signal, and due to the adoption of the hysteresis comparator, the pulse false signal can be effectively prevented, and the anti-interference performance of the circuit is improved.

[0014] 2. The patent adopts a resetting circuit function with input filtering function to realize the resetting function of the track protection circuit. Due to the adoption of the input filtering, the anti-interference performance of the circuit is improved.

[0015] 3. The patent adopts a protection locking circuit with anti-output transient jump to realize the anti-interference performance of the locking circuit to the single particle transient effect.

[0016] 4. The locking circuit output stage of the patent adopts a shoot level output circuit to improve the high reliability and output capacity of the circuit. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 The circuit diagram of the preferred embodiment of the application. DETAILED DESCRIPTION

[0018] To further understand the invention's content, features, and effects, the following embodiments are provided, and detailed descriptions are given below in conjunction with the accompanying drawings:

[0019] like Figure 1 As shown, the technical solution of the present invention is as follows:

[0020] A highly reliable protection and locking circuit that is resistant to single-particle transients includes:

[0021] Trigger module 1, receives signal Pro SET Amplitude and time signals, Pro SET Amplitude and time signals with reference V REF The comparison is then used to output a trigger signal;

[0022] Locking module 2 receives the trigger signal and outputs an instruction on whether to execute the locking signal based on the trigger signal;

[0023] Reset module 3 sends a reset command to lock module 2; wherein:

[0024] The trigger module 1 includes a trigger circuit, Pro SET The signal terminal is connected to the comparator terminal of the trigger circuit U1 through a first resistor R1. The comparator terminal is connected to the output terminal of the trigger circuit U1 through a third resistor R3. The comparator terminal is grounded through a first capacitor C1. The reference terminal of the trigger circuit U1 is grounded through a second capacitor C2. The reference terminal is connected in sequence through the second capacitor C2, the second resistor R2, and the reference power supply V. C The reference terminal is connected to the Zener diode R. REF1 The negative terminal of the Zener diode R is connected. REF1 The positive terminal is grounded.

[0025] The locking module 2 includes a latching circuit. The output terminal of the trigger module 1 is connected to the positive terminal of the latching circuit U2 through a fourth resistor R4. The output terminal of the reset module 3 is connected to the twelfth resistor R 12 The latch circuit U2 is connected to the negative terminal, and the positive terminal of the latch circuit U2 is connected to the power supply V through the fourth capacitor C4. CC The positive terminal of the latch circuit U2 is connected to the output terminal of the latch circuit U2 through the seventh resistor R7. The output terminal of the latch circuit U2 is connected to the power supply V through the seventh resistor R7 and the eighth resistor R8 in sequence. CC The output terminal of the latch circuit U2 is connected via the tenth resistor R. 10 The base of the first transistor Q1 is connected to the base, the collector of the first transistor Q1 is connected to the power supply, and the emitter of the first transistor Q1 is connected to the eleventh resistor R. 11The output terminal of the output signal is connected; the emitter of the first transistor Q1 is grounded through the ninth resistor R9, the emitter of the first transistor Q1 is grounded through the fifth capacitor C5, the negative resistance of the latch circuit U2 is grounded through the third capacitor C3 and the sixth resistor R6 respectively, the negative resistance of the latch circuit U2 is connected to the power supply V CC Connect.

[0026] The reset module 3 includes a second transistor Q2, the base of the second transistor Q2 is connected to the fourteenth resistor R 14 The reset signal source terminal is connected, the base of the second transistor Q2 is connected to the sixth capacitor C6 and the thirteenth resistor R 13 Ground, the base of the second transistor Q2 is connected to the thirteenth resistor R 13 The collector is connected to the emitter, and the collector of the second transistor Q2 is connected to the reset signal output terminal.

[0027] The first transistor Q1 and the second transistor Q2 are both NPN type transistors.

[0028] The above preferred embodiment mainly includes: trigger module, reset module, latch module three parts; when the signal Pro SET The amplitude and time exceed the reference V REF The trigger circuit U1 outputs V c To ground, at this time the capacitor C4 charges to ground through R4, when V B The voltage is greater than V A The point voltage, the protection latch circuit U2 outputs the point V d To ground output is in the on state, at this time Q1 changes to the off protection state, output is low, the lock circuit V L = V cc *R7 / (R8+R7), V a = V TRIG = V cc *R6 / (R5+R6), V L <V TRIG , at this time V C = V L <V a , at this time, no matter how the V C The point changes, the protection circuit OUT is in the low level and can be locked state.

[0029] Single event transient mutation:

[0030] Single particle is a common heavy particle in medium and high orbit space, which has an impact on the output state of the operational amplifier, comparator and other high gain devices, which is that the output state changes instantaneously, the duration is less than us, and then returns to normal. The sensitive point of the protection circuit is in theFigure 1 V c When U2 is subjected to single particle occurrence, causing V c point to suddenly change state, due to the presence of R4, C4, C5 in the circuit, V b , V d voltage will not change immediately with V c point mutation, improve the immunity of the single event transient of the lock protection, improve the interference performance.

[0031] The above only describes the preferred embodiments of the present application, and does not limit the present application in any form. Any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present application are within the scope of the technical solutions of the present application.

Claims

1. A high-reliability single-event transient immune protection latching circuit, characterized in that, At least comprising: The trigger module (1) receives the signal Pro SET amplitude and time signal, and outputs a trigger signal SET amplitude and time signal, and outputs a trigger signal REF amplitude and time signal, and outputs a trigger signal The locking module (2) receives the trigger signal and outputs the instruction of whether to execute the locking signal according to the trigger signal; the locking module (2) comprises a latch circuit, the output terminal of the trigger module (1) is connected with the positive terminal of the latch circuit through the fourth resistance, the output terminal of the reset module (3) is connected with the negative terminal of the latch circuit through the twelfth resistance, the positive terminal of the latch circuit is connected with the power supply through the fourth capacitor, the positive terminal of the latch circuit is connected with the output terminal of the latch circuit through the seventh resistance, the output terminal of the latch circuit is connected with the power supply through the seventh resistance and the eighth resistance in turn, the output terminal of the latch circuit is connected with the base of the first triode through the tenth resistance, the collector of the first triode is connected with the power supply, the emitter of the first triode is connected with the output signal output terminal through the eleventh resistance; the emitter of the first triode is grounded through the ninth resistance, the emitter of the first triode is grounded through the fifth capacitor, the negative resistance of the latch circuit is grounded through the third capacitor and the sixth resistance respectively, and the negative resistance of the latch circuit is connected with the power supply through the fifth resistance; The reset module (3) sends the reset instruction to the locking module (2).

2. The high-reliability single-event-transient immune latch circuit of claim 1, wherein, The trigger module (1) comprises a trigger circuit, Pro SET The signal terminal is connected with a comparison terminal of the trigger circuit through a first resistance, the comparison terminal is connected with an output terminal of the trigger circuit through a third resistance, and the comparison terminal is grounded through a first capacitor. The reference terminal of the trigger circuit is grounded through the second capacitor, the reference terminal is connected with the reference power supply through the second capacitor, the second resistance and the reference terminal in turn, the reference terminal is connected with the negative electrode of the voltage stabilizing diode, and the positive electrode of the voltage stabilizing diode is grounded.

3. The high-reliability single-event-transient immune latch circuit of claim 2, wherein, The reset module (3) comprises a second triode, the base of the second triode is connected with the reset signal source terminal through the fourteenth resistance, the base of the second triode is grounded through the sixth capacitor and the thirteenth resistance respectively, the base of the second triode is connected with the emitter through the thirteenth resistance, and the collector of the second triode is connected with the reset signal output terminal.

4. The high-reliability single-event-transient immune latch circuit of claim 3, wherein, The first triode and the second triode are both NPN type triodes.

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