Equipment selection test method, device, electronic equipment and storage medium

Abstract

The disclosed embodiment provides a device selection test method, apparatus, electronic device and storage medium, which obtains configuration information, wherein the configuration information represents the test items to be tested on the device to be tested; generates at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device to be tested to generate an executable file under the test running environment, wherein the test running environment corresponds to the device model of the device to be tested, and the executable file is used to test the test items corresponding to the device to be tested under the test running environment after being executed by the device to be tested; sorts the test packages to be compiled, and generates a test set based on the sorted test packages to be compiled; sends the test set to at least two devices to be tested, and receives the corresponding test results returned by each device to be tested, and determines the target device according to the test results returned by each device to be tested. Automatic selection test of different devices to be tested is realized, and the test efficiency of the selection test process is improved.

Description

Technical Field

[0001] The present disclosure relates to the field of computer technology, and in particular to a device selection test method, device, electronic device and storage medium. Background Art

[0002] In the current financial industry, business personnel, managers and consumers need to use dedicated business terminal devices to perform business operations such as querying and handling financial services. Among them, business terminal devices include embedded bank counter terminals for business personnel, and automated teller machines (ATM), video teller machines (VTM), smart teller machines (STM), etc. for consumers.

[0003] Business terminal equipment needs to be connected to the bank system to exchange data. Different from general terminal equipment, business terminal equipment used in the financial industry has higher requirements for security and performance. Therefore, before purchasing and installing such business terminal equipment, it is necessary to conduct selection tests on the business terminal equipment and select products that meet the performance and specifications from the equipment to be tested provided by different suppliers for installation.

[0004] In the prior art, the devices under test provided by different suppliers are usually tested one by one and item by item, and the test results are used to determine whether the devices under test meet the performance specification requirements of the service terminal equipment. However, due to the large number of devices under test, many test items and complex test content, the test efficiency is low, the test time is long and the test accuracy is low. Summary of the invention

[0005] The present invention provides a device selection test method, device, electronic device and storage medium, which are used to solve the problems of low test efficiency, long test time and low test accuracy caused by a large number of devices to be tested, a large number of test items and complex test contents during the device selection test process.

[0006] According to a first aspect of an embodiment of the present disclosure, the present disclosure provides a device selection test method, which is applied to a server, wherein the server is communicatively connected with a device to be tested, and the method includes:

[0007] Acquire configuration information, wherein the configuration information represents test items to be tested on the device under test; generate at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device under test to generate an executable file under a test running environment, wherein the test running environment corresponds to a device model of the device under test, and the executable file is used to test the test items corresponding to the device under test under the test running environment after being executed by the device under test; sort the test packages to be compiled, and generate a test set based on the sorted test packages to be compiled; send the test set to at least two of the devices under test, and receive corresponding test results returned by each of the devices under test, wherein the test results represent the execution results of the executable files corresponding to each test package to be compiled in the test set; determine the target device according to the test results returned by each of the devices under test.

[0008] In one possible implementation, the configuration information includes at least two test items and test information corresponding to each of the test items, and the test information is used to control the device under test to generate an executable file corresponding to the test item; according to the configuration information, at least two test packages to be compiled are generated, including: according to each of the test items and the test information corresponding to each of the test items, a test package to be compiled corresponding to each of the test items is generated.

[0009] In a possible implementation, the test package to be compiled includes test logic information and compilation logic information, the test logic information is used to characterize the implementation logic of testing the test item; the compilation logic information is used to characterize the implementation logic of controlling the device under test to generate an executable file under the corresponding test running environment; the compilation logic information includes a first execution function and a second execution function; the first execution function is used to control the device under test that receives the test package to be compiled to determine the test running environment corresponding to the device information of the device under test; the second execution function is used to control the device under test that receives the test package to be compiled to generate a corresponding executable file according to the test running environment.

[0010] In a possible implementation, the test packages to be compiled also include timing information, and the timing information is used to characterize the test timing corresponding to each of the test items; the test packages to be compiled are sorted, and a test set is generated based on the sorted test packages to be compiled, including: sorting the test packages to be compiled based on the test timing corresponding to the test items represented by the timing information, and generating the test set from the sorted test packages to be compiled.

[0011] In a possible implementation, a target device is determined based on the test results returned by each of the devices under test, including: determining a first result parameter and a second result parameter based on the test results, the first result parameter representing the test results of a mandatory test item, and the second result parameter representing the test results of a reference test item; based on the first result parameter, determining the devices under test whose test results of the mandatory test items meet the requirements as qualified devices; based on the second result parameter of each of the qualified devices, obtaining the test results of the reference test items corresponding to each of the qualified devices; performing weighted calculations on the test results of each of the reference test items based on preset weight information to generate a test evaluation value corresponding to each of the qualified devices; and based on the ranking of the test evaluation values ​​corresponding to each of the qualified devices, determining a preset number of qualified devices with the highest test evaluation values ​​as the target devices.

[0012] In a possible implementation, the test result includes log information, and the log information is used to characterize the system log generated during the process of the device under test executing the executable file; determining the first result parameter and the second result parameter based on the test result includes: generating the first result parameter and the second result parameter based on the log information.

[0013] In a possible implementation, the first result parameter includes at least one of the following: system compatibility information, wherein the system compatibility information characterizes the compatibility between the system of the device under test and a preset target system; specification information, wherein the specification information characterizes the technical specifications of the device under test; the second result parameter includes at least one of the following: resource consumption information, wherein the resource consumption information characterizes the amount of resources consumed by the device under test during the execution of the executable file; and device performance information, wherein the device performance information characterizes the computing power of the device under test during the execution of the executable file.

[0014] According to a second aspect of an embodiment of the present disclosure, the present disclosure provides a device selection test device, which is applied to a server, and the server is communicatively connected with a device to be tested. The device selection test device includes:

[0015] An acquisition module, used to acquire configuration information, wherein the configuration information represents a test item to be tested on the device under test;

[0016] A generation module, used to generate at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device to be tested to generate an executable file under a test running environment, wherein the test running environment corresponds to the device model of the device to be tested, and the executable file is used to test the test items corresponding to the device to be tested under the test running environment after being executed by the device to be tested; sorting the test packages to be compiled, and generating a test set based on the sorted test packages to be compiled;

[0017] A transceiver module, used to send the test set to at least two of the devices under test, and receive corresponding test results returned by each of the devices under test, wherein the test results represent execution results of executable files corresponding to each to-be-compiled test package in the test set;

[0018] The determination module is used to determine the target device according to the test results returned by each of the devices under test.

[0019] In a possible implementation, the configuration information includes at least two test items and test information corresponding to each of the test items, and the test information is used to control the device under test to generate an executable file corresponding to the test item; when the generation module generates at least two test packages to be compiled according to the configuration information, it is specifically used to: generate a test package to be compiled corresponding to each test item according to each of the test items and the test information corresponding to each of the test items.

[0020] In a possible implementation, the test package to be compiled includes test logic information and compilation logic information, the test logic information is used to characterize the implementation logic of testing the test item; the compilation logic information is used to characterize the implementation logic of controlling the device under test to generate an executable file under the corresponding test running environment; the compilation logic information includes a first execution function and a second execution function; the first execution function is used to control the device under test that receives the test package to be compiled to determine the test running environment corresponding to the device information of the device under test; the second execution function is used to control the device under test that receives the test package to be compiled to generate a corresponding executable file according to the test running environment.

[0021] In a possible implementation, the test package to be compiled also includes timing information, and the timing information is used to characterize the test timing corresponding to each of the test items; when the generation module sorts the test packages to be compiled and generates a test set based on the sorted test packages to be compiled, it is specifically used to: sort the test packages to be compiled based on the test timing corresponding to the test items represented by the timing information, and generate the test set from the sorted test packages to be compiled.

[0022] In a possible implementation, the determination module is specifically used to: determine a first result parameter and a second result parameter based on the test results, the first result parameter representing the test results of the mandatory test items, and the second result parameter representing the test results of the reference test items; based on the first result parameter, determine the tested devices whose test results of the mandatory test items meet the requirements as qualified devices; based on the second result parameters of each of the qualified devices, obtain the test results of the reference test items corresponding to each of the qualified devices; according to preset weight information, perform weighted calculation on the test results of each of the reference test items to generate a test evaluation value corresponding to each of the qualified devices; according to the ranking of the test evaluation values ​​corresponding to each of the qualified devices, determine a preset number of qualified devices with the highest test evaluation values ​​as the target devices.

[0023] In a possible implementation, the test result includes log information, and the log information is used to characterize the system log generated during the execution of the executable file by the device under test; when the determination module determines the first result parameter and the second result parameter based on the test result, it is specifically used to: generate the first result parameter and the second result parameter based on the log information.

[0024] In a possible implementation, the first result parameter includes at least one of the following: system compatibility information, wherein the system compatibility information characterizes the compatibility between the system of the device under test and a preset target system; specification information, wherein the specification information characterizes the technical specifications of the device under test; the second result parameter includes at least one of the following: resource consumption information, wherein the resource consumption information characterizes the amount of resources consumed by the device under test during the execution of the executable file; and device performance information, wherein the device performance information characterizes the computing power of the device under test during the execution of the executable file.

[0025] According to a third aspect of an embodiment of the present disclosure, the present disclosure provides an electronic device, including: a memory, a processor, and a computer program;

[0026] Wherein, the computer program is stored in the memory and is configured to be executed by the processor as the equipment selection and testing method as described in any one of the first aspects of the embodiments of the present disclosure.

[0027] According to the fourth aspect of the embodiments of the present disclosure, the present disclosure provides a computer-readable storage medium, in which computer execution instructions are stored. When the computer execution instructions are executed by a processor, they are used to implement the equipment selection and testing method as described in any one of the first aspect of the embodiments of the present disclosure.

[0028] According to a fifth aspect of an embodiment of the present disclosure, the present disclosure provides a computer program product, including a computer program, which, when executed by a processor, implements the above first aspect and various possible device selection and testing methods of the first aspect.

[0029] The device selection test method, apparatus, electronic device and storage medium provided by the present disclosure obtain configuration information, wherein the configuration information represents the test items to be tested on the device to be tested; generate at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device to be tested to generate an executable file under a test running environment, wherein the test running environment corresponds to the device model of the device to be tested, and the executable file is used to test the test items corresponding to the device to be tested under the test running environment after being executed by the device to be tested; sort the test packages to be compiled, and generate a test set based on the sorted test packages to be compiled; send the test set to at least two of the devices to be tested, and receive corresponding test results returned by each of the devices to be tested, wherein the test results represent the execution results of the executable files corresponding to each test package to be compiled in the test set; determine the target device according to the test results returned by each of the devices to be tested. It realizes the automatic selection test of the devices under test of different device models, and completes the selection and determination of the target device according to the test results. Since there is no need to test different devices under test one by one and item by item, the test efficiency of the selection test process is improved, the test time is reduced, and the test accuracy is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0031] Figure 1 An application scenario diagram of the device selection test method provided in the embodiment of the present disclosure;

[0032] Figure 2 A flow chart of a device selection and testing method provided for one embodiment of the present disclosure;

[0033] Figure 3 A schematic diagram of a process for generating a test set provided in an embodiment of the present disclosure;

[0034] Figure 4 A schematic diagram of a process of data interaction between a server and a device under test provided in an embodiment of the present disclosure;

[0035] Figure 5 A flow chart of a device selection and testing method provided for another embodiment of the present disclosure;

[0036] Figure 6A schematic diagram of a process for determining a target device provided by an embodiment of the present disclosure;

[0037] Figure 7 A schematic diagram of the structure of a device selection test device provided in one embodiment of the present disclosure;

[0038] Figure 8 A schematic diagram of an electronic device provided according to an embodiment of the present disclosure.

[0039] The above drawings show clear embodiments of the present disclosure, which will be described in more detail below. These drawings and text descriptions are not intended to limit the scope of the present disclosure in any way, but to illustrate the concepts of the present disclosure to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0040] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0041] The application scenarios of the embodiments of the present disclosure are explained below:

[0042] Figure 1 This is an application scenario diagram of the device selection test method provided in the embodiment of the present disclosure. The device selection test method provided in the embodiment of the present disclosure can be applied to the selection test scenario of the business terminal equipment in the financial industry. For example, Figure 1 As shown, the execution subject of the method provided by the embodiment of the present disclosure may be a server, which is communicatively connected to an operating device on one hand and to a device under test on the other hand, wherein an operator triggers the server to execute the device selection test method provided by the embodiment of the present disclosure by sending configuration information and selection test instructions on the operating device side. The server sends a unified test set to a plurality of devices under test of different models connected thereto by executing the method provided by the present embodiment, so that each device under test completes the test according to the test set, detects whether the performance and specifications of each device under test meet the requirements, and returns the test results to the server. The server determines one or more devices under test that meet the requirements as target devices based on the test results returned by each device under test, and returns the selection results to the operating device, thereby completing the process of automatic selection of the device under test.

[0043] At present, since the business terminal equipment in the financial industry needs to be connected to the bank system to exchange financial data, it is different from general terminal equipment. The business terminal equipment used in the financial industry has higher requirements for equipment security and equipment performance. Therefore, before purchasing and installing such business terminal equipment, it is necessary to conduct selection tests on the business terminal equipment, and select equipment products that meet the performance and specifications from the equipment to be tested provided by different suppliers for installation and online use. In the prior art, it is usually necessary to test the equipment to be tested provided by different suppliers one by one and item by item, and judge whether the equipment to be tested meets the performance specification requirements as a business terminal equipment based on the test results.

[0044] However, unlike the scenario of testing software, in the scenario of selecting and testing business terminal equipment, since the devices to be tested are provided by different suppliers, there are differences in hardware units, operating systems, CPU architectures (ARM, x86, x64, MIPS, etc.) of different models of devices to be tested. Therefore, it is necessary to develop test logic codes for different models of devices to be tested, one device at a time, and one test item at a time based on different test items, and then test the devices to be tested one by one and one item at a time. At the same time, in the scenario of selecting and testing business terminal equipment, there are problems such as a large number of devices to be tested that need to be selected and inconsistent test items for business terminal equipment corresponding to different businesses, which leads to problems such as low test efficiency, long test time, and low test accuracy when selecting and testing business terminal equipment.

[0045] The technical solution of the present invention and how the technical solution of the present invention solves the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0046] Figure 2 A flow chart of a device selection test method provided by an embodiment of the present disclosure is applied to a server, and the server is connected to the device under test in communication, such as Figure 2 As shown, the device selection test method provided in this embodiment includes the following steps:

[0047] Step S101: acquiring configuration information, where the configuration information represents test items to be tested on the device under test.

[0048] For example, reference Figure 1In the schematic diagram of the application scenario shown, a server that applies the device selection test method provided by the present disclosure is connected to the operating device in communication. On the operating device side, the operator sends a selection test instruction and configuration information to the server through the operating device. After receiving the selection test instruction and configuration information, the server triggers the steps of this embodiment and obtains the configuration information. In one possible implementation, the configuration information and the selection test instruction may be received asynchronously by the server. For example, the server first receives the configuration information sent by the operating device and stores the configuration information locally on the server. After a certain period of time, the server receives the selection test instruction sent by the operating device, executes the steps of this embodiment, and obtains the configuration information locally. Alternatively, after the server obtains the configuration information sent by the operating device, it stores the configuration information locally on the server, and executes the steps of this embodiment at a preset time according to the planned task information, and obtains the configuration information locally. Specific examples are not given here.

[0049] Among them, further, the configuration information represents the test items to be tested on the device under test, that is, the content of the test on the device under test, such as performance test, specification test, software and hardware compatibility test, etc. In one possible implementation, the configuration information includes specific test items, such as CPU architecture, power consumption per unit time, hard disk read and write speed, etc., which are not given one by one here. The test items in the configuration information can be set according to specific business needs. Among them, different test items correspond to different test processes; on devices of different device models, the implementation method for the same test item is also different.

[0050] Step S102, generating at least two test packages to be compiled according to the configuration information, the test packages to be compiled are used to control the device under test to generate executable files under the test running environment, wherein the test running environment corresponds to the device model of the device under test, and the executable files are used to test the test items corresponding to the device under test under the test running environment after being executed by the device under test.

[0051] Exemplarily, after receiving the configuration information, a corresponding test package to be compiled is generated according to the test items represented by the configuration information, and the test package to be compiled is used to control the device under test to generate an executable file under the test operation environment. Among them, the test operation environment includes both the hardware environment of the device under test (such as processor architecture ARM, x86, x64, MIPS, etc.) and the software operation environment of the device under test (such as software development environment Java, npm, Python, etc.). The configuration information is used to characterize at least two test items, and accordingly, at least two test packages to be compiled are generated according to the configuration information. Exemplarily, after the device under test receives the test package to be compiled sent by the server, the test package to be compiled contains code information for indicating the test items. The device under test compiles the code according to the test package to be compiled, combined with its own test operation environment, and can generate a corresponding executable file. Since the executable file is compiled by the device under test in its own operating environment, the generated executable file can be executed by the device under test, thereby achieving the purpose of testing the test items corresponding to the device under test.

[0052] In one possible implementation, the configuration information includes at least two test items and test information corresponding to each test item, and the test information is used to control the device under test to generate an executable file corresponding to the test item; according to the configuration information, at least two test packages to be compiled are generated, including: according to each test item and the test information corresponding to each test item, a test package to be compiled corresponding to each test item is generated.

[0053] Exemplarily, the test items in the configuration information and the test information corresponding to the test items are a set of corresponding data, and the configuration information includes at least two sets of the corresponding data. The test information is used to control the device under test to generate an executable file corresponding to the test item, that is, the test information represents the logic of generating the executable file corresponding to the test item, that is, the test logic for testing the test item. Specifically, for example, the test item is the hard disk write speed, and the test information corresponding to the test item represents "writing a preset file of 128kb to the hard disk for 10 seconds, and determining the total amount of the preset file written". It can be seen that the test items in the configuration information and the corresponding test information determine the problems of "what to test" and "how to test" of the device under test. Therefore, at least two corresponding test packages to be compiled generated with the configuration information as parameters can generate corresponding executable files that can be used to test the items under test after being compiled by the device under test.

[0054] In the steps of this embodiment, by configuring the test items and the test information corresponding to the test items in the configuration information, the test methods for the test items corresponding to different business needs are defined, thereby separating the design and implementation processes of testing the test items. There is no need to design test methods for each model of the device to be tested, thereby improving the efficiency of the selection test.

[0055] Furthermore, in a possible implementation, the test package to be compiled includes test logic information and compilation logic information, the test logic information is used to characterize the implementation logic for testing the test items; the compilation logic information is used to characterize the implementation logic for controlling the device under test to generate an executable file in the corresponding test running environment. Wherein, exemplarily, the test logic information and the compilation logic information respectively correspond to one or more data packets containing code files, the test logic information includes implementation code for testing the test items, and the compilation logic information includes implementation code for controlling the device under test to generate an executable file in the corresponding test running environment. Wherein, the implementation code corresponding to the test logic information is formed according to the test items in the configuration information and the test information corresponding to the test items; the implementation code corresponding to the compilation logic information is implemented according to the preset function code.

[0056] Further, exemplarily, the compilation logic information includes a first execution function and a second execution function; the first execution function is used to control the device under test that receives the test package to be compiled to determine the test running environment corresponding to the device information of the device under test; the second execution function is used to control the device under test that receives the test package to be compiled to generate a corresponding executable file according to the test running environment. Among them, the first execution function and the second execution function in the compilation logic information are implemented by general descriptive information and can be interpreted and executed under different development environments or operating systems. After receiving the test package to be compiled, the device under test obtains the test running environment, such as the development environment (Java, npm, Python, etc.) according to the first execution function, and then compiles and packages the test logic information according to the second execution function in the corresponding development environment using corresponding instructions to generate an executable file.

[0057] In the steps of this embodiment, according to the specific implementation method of the test package to be compiled, it is achieved that different models of devices under test can automatically generate executable files that conform to the current test running environment according to the test package to be compiled, thereby avoiding the problem of needing to independently develop and write test codes for different models of devices under test, and improving the efficiency of selecting and testing different models of devices under test.

[0058] Step S103: sorting the test packages to be compiled, and generating a test set based on the sorted test packages to be compiled.

[0059] Exemplarily, after obtaining the test package to be compiled according to the configuration information, each test package to be compiled corresponds to a test item. In the selection test process, it is usually necessary to perform multiple tests on the device to be tested in order to obtain the selection result. Therefore, it is necessary to package the test package to be compiled into a test set and send it to the device to be tested for execution. In this process, due to the test order between the test items, the test results will be affected to a certain extent. For example, among multiple test items (for example, including test items A, B, and C), test item A is a temperature test. Since the temperature of the device is related to the running time of the device and the load of the computing unit, therefore, putting test item A in the first place for testing and putting test item A in the last place for testing will be affected by the previous round of tests of the device to be tested, and different test results will be produced. Therefore, in order to solve this problem, it is necessary to sort the test packages to be compiled in a specific test sequence and generate a test set containing multiple test packages to be compiled arranged in a certain order. When the test set is executed, each test package to be compiled will be executed in sequence according to the order of the test packages to be compiled in the test set, and the corresponding executable files will be generated and executed, thereby ensuring that the test process of multiple test items is completed in an orderly manner and ensuring the accuracy of the test process.

[0060] Among them, exemplarily, the test package to be compiled also includes timing information, and the timing information is used to characterize the test timing corresponding to each test item. Based on the preset timing information, the test items corresponding to the test package to be compiled can be sorted, thereby realizing the sorting of the test package to be compiled, which is not described in detail here.

[0061] Figure 3 A schematic diagram of a process for generating a test set provided by an embodiment of the present disclosure, such as Figure 3 As shown, based on the data group consisting of test items and corresponding test information in the configuration information (shown as data group a and data group b in the figure, data group a includes test item a1 and corresponding test information a2; data group b includes test item b1 and corresponding test information b2); generate test logic information (shown as test logic information A, test logic information B, test logic information C in the figure), and then generate compilation logic information by the preset functional functions of the first execution function and the second execution function, and generate corresponding test packages to be compiled (shown as test package 01 to be compiled, test package 02 to be compiled, and test package 03 to be compiled) by the test logic information and the compilation logic information; then, based on the preset sorting rules, sort the test packages to be compiled corresponding to each test item, and generate a test set containing multiple sorted test packages to be compiled. In the steps of this embodiment, by splitting the test logic information and the compilation logic information, the two are independent of each other. When the subsequent business needs change and it is necessary to select and test new devices to be tested and new test items, the first execution function and the second execution function can be modified independently, reducing the workload of test development and improving the selection efficiency.

[0062] Step S104: sending a test set to at least two devices under test, and receiving corresponding test results returned by each device under test, wherein the test results represent execution results of executable files corresponding to each to-be-compiled test package in the test set.

[0063] Exemplarily, after obtaining the test set, the test set is sent to multiple different models of devices under test. After receiving the test set, the devices under test compile and package the test sets based on multiple ordered test packages to be compiled contained in the test set to generate corresponding executable files. The executable files are executed in sequence according to the timing information of the test packages to be compiled corresponding to the executable files, thereby realizing automatic test item-by-test testing of the devices under test.

[0064] Figure 4 A schematic diagram of a process of data interaction between a server and a device under test provided in an embodiment of the present disclosure, such as Figure 4 As shown, after generating the test set, the server sends the test set to multiple devices under test (shown as device under test A, device under test B, and device under test C in the figure). The devices under test obtain multiple ordered test packages to be compiled contained therein according to the received test set, and compile and package the test packages to be compiled to generate multiple executable files ( Figure 4 After the device A under test is compiled, it generates ordered executable files A02, executable files A03, and executable files A01. The types of devices under test B and C are not repeated here), and each executable file is executed in sequence according to the timing information in the test package to be compiled to test the corresponding test items. Among them, one device under test corresponds to one test result (shown as test result A, test result B, and test result C in the figure), and the test result includes the execution results of each executable file, and the test result includes, for example, CPU architecture information, power consumption per unit time, hard disk read and write speed, etc.

[0065] Furthermore, after each device under test generates a test result, the test result is returned to the server, so that the server can select a device according to the test result returned by each device under test.

[0066] Step S105: determining the target device according to the test results returned by each device under test.

[0067] Exemplarily, after receiving the test results returned by the device under test, the server compares the test results, selects the device under test that meets the business needs, and determines it as the target device. Specifically, for example, the test results characterize the computing power and power consumption of the device under test. According to the test results returned by each device under test, the computing power and power consumption are weighted and calculated to obtain a score value characterizing the performance of the device. Based on the score system, the devices under test are sorted, and one or more devices under test with the highest score system are determined as the target device, completing the selection test process for the device under test.

[0068] In this embodiment, by acquiring configuration information, the configuration information represents the test items to be tested on the device to be tested; according to the configuration information, at least two test packages to be compiled are generated, the test packages to be compiled are used to control the device to be tested to generate executable files under the test running environment, wherein the test running environment corresponds to the device model of the device to be tested, and the executable files are used to test the test items corresponding to the device to be tested under the test running environment after being executed by the device to be tested; the test packages to be compiled are sorted, and a test set is generated based on the sorted test packages to be compiled; the test set is sent to at least two devices to be tested, and the corresponding test results returned by each device to be tested are received, and the test results represent the execution results of the executable files corresponding to each test package to be compiled in the test set; according to the test results returned by each device to be tested, the target device is determined. Automatic selection test of devices to be tested of different device models is realized, and the selection and determination of the target device is completed according to the test results. Since it is not necessary to test different devices to be tested one by one and item by item, the test efficiency of the selection test process is improved, the test time is reduced, and the test accuracy is improved.

[0069] Figure 5 A flow chart of a device selection test method provided by another embodiment of the present disclosure, such as Figure 5 As shown, the equipment selection test method provided in this embodiment is Figure 2 On the basis of the device selection test method provided in the illustrated embodiment, step S105 is further refined, and the device selection test method provided in this embodiment includes the following steps:

[0070] Step S201: acquiring configuration information, where the configuration information represents test items to be tested on the device under test.

[0071] Step S202, generating at least two test packages to be compiled according to the configuration information, the test packages to be compiled are used to control the device under test to generate executable files under the test running environment, wherein the test running environment corresponds to the device model of the device under test, and the executable files are used to test the test items corresponding to the device under test under the test running environment after being executed by the device under test.

[0072] Step S203: sorting the test packages to be compiled, and generating a test set based on the sorted test packages to be compiled.

[0073] Step S204: sending a test set to at least two devices under test, and receiving corresponding test results returned by each device under test, wherein the test results represent execution results of executable files corresponding to each to-be-compiled test package in the test set.

[0074] Step S205: determining a first result parameter and a second result parameter according to the test result, wherein the first result parameter represents the test result of the mandatory test item, and the second result parameter represents the test result of the reference test item.

[0075] Exemplarily, after obtaining the test results sent by each device under test, it is necessary to screen each device under test based on the test results, and select the device under test that meets the business requirements in terms of software and hardware specifications, indicators, etc., and has better performance as the target device after selection. Among them, the test results include a first result parameter representation of the test results of mandatory test items, and a second result parameter representing the test results of reference test items. Mandatory test items correspond to device parameters that must meet the standards, such as adaptation voltage, system compatibility, and specific software and hardware specifications of the device, such as processor architecture. Reference test items correspond to device parameters that are allowed within a certain range, such as device computing power.

[0076] In a possible implementation, the test result includes log information, and the log information is used to characterize the system log generated during the execution of the executable file by the device under test; determining the first result parameter and the second result parameter based on the test result includes: generating the first result parameter and the second result parameter based on the log information.

[0077] Exemplarily, the log information is a system log generated during the execution of an executable file by the device under test, which records parameter information required for selecting the device under test, such as device temperature, CPU usage, memory usage, device CPU name, operating system name, etc. The steps of this embodiment provide a method for determining a first result parameter and a second result parameter. The parameters recorded in the log information are divided into a first result parameter and a second result parameter through log information and preset classification rules. When testing and selecting different business requirements, there is no need to make additional modifications to the configuration information. Instead, only the modification classification rules corresponding to the log information are needed to obtain the first result parameter and the second result parameter corresponding to the different business requirements, thereby improving the test efficiency in the process of selecting and testing business equipment corresponding to different business requirements and reducing the workload of selection testing.

[0078] Exemplarily, the first result parameter includes at least one of the following: system compatibility information, which indicates the compatibility between the system of the device under test and the preset target system; specification information, which indicates the technical specifications of the device under test. The second result parameter includes at least one of the following: resource consumption information, which indicates the resource consumption of the device under test during the execution of the executable file; device performance information, which indicates the computing power of the device under test during the execution of the executable file.

[0079] Step S206: Based on the first result parameter, the devices under test whose test results of the mandatory test items meet the requirements are determined as qualified devices.

[0080] Step S207: based on the second result parameter of each qualified device, obtain the test result of the reference test item corresponding to each qualified device.

[0081] Furthermore, according to the first result parameter and the second result parameter in the test result, the devices to be tested are first screened by the first result parameter, the devices to be tested that fail the mandatory test items are screened out, and the devices to be tested whose test results of the mandatory test items meet the requirements are determined as qualified devices. Afterwards, the second result parameter corresponding to each qualified device is obtained, such as device performance information and resource consumption information. In the subsequent steps, by calculating and sorting the second result parameters corresponding to the qualified devices, the amount of calculation and evaluation accuracy of the subsequent calculation and sorting steps can be reduced, so that the selected target device can better meet business needs.

[0082] Step S208, performing weighted calculation on the test results of each reference test item according to preset weight information, and generating a test evaluation value corresponding to each qualified device.

[0083] Step S209 , according to the ranking of the test evaluation values ​​corresponding to the qualified devices, a preset number of qualified devices with the highest test evaluation values ​​are determined as target devices.

[0084] Exemplarily, for each reference test item, there is a corresponding weight coefficient, and the preset weight information is used to characterize the weight coefficient corresponding to each reference test item. Specifically, for example, the reference test items include resource consumption values ​​and computing power values. According to the weight information, the weight coefficient corresponding to the resource consumption value is -0.3, and the weight coefficient of the computing power value is 0.7. Therefore, according to the preset weight coefficient, the resource consumption value and the computing power value are weighted and calculated to generate the test evaluation value corresponding to each qualified device. Among them, the test results corresponding to the resource consumption value and the test results corresponding to the computing power value are normalized values ​​based on the impact on business needs, and the specific process is not repeated here. After determining the test evaluation value corresponding to each qualified device, the qualified devices are sorted based on the test evaluation value, and one or more devices that best meet the business needs are selected, that is, the target devices.

[0085] Figure 6 A schematic diagram of a process for determining a target device provided by an embodiment of the present disclosure, such as Figure 6 As shown, first, based on the system compatibility information in the test results, each device to be tested (shown as device 01-device 07 in the figure) is screened to determine qualified devices that meet the system compatibility requirements (shown as device 01, device 02, device 05, device 07 in the figure). Then, based on the computing power value and energy consumption value of each qualified device, each device is weighted and sorted to obtain the device evaluation value, and device 02 with the highest evaluation value is determined as the target device.

[0086] In the present embodiment, since in the previous steps, the test set sent to the device under test can enable each device under test to return the test results corresponding to the same test items, automatic screening and horizontal comparison and sorting can be performed based on the test results returned by each device under test to realize automatic selection testing, thereby improving the efficiency and test effect of the selection testing and reducing the cost of the selection testing process.

[0087] In this embodiment, the implementation method of steps S201 to S204 is the same as that of the present disclosure. Figure 2 The implementation methods of step S101 to step S104 in the illustrated embodiment are the same and will not be described in detail here.

[0088] Figure 7 A schematic diagram of a device selection test device provided by an embodiment of the present disclosure is applied to a server, and the server is connected to the device under test in communication, such as Figure 7 As shown, the equipment selection test device 3 provided in this embodiment includes:

[0089] An acquisition module 31 is used to acquire configuration information, where the configuration information represents test items to be tested on the device under test;

[0090] A generating module 32 is used to generate at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device to be tested to generate an executable file under a test running environment, wherein the test running environment corresponds to the device model of the device to be tested, and the executable file is used to test the test items corresponding to the device to be tested under the test running environment after being executed by the device to be tested; sort the test packages to be compiled, and generate a test set based on the sorted test packages to be compiled;

[0091] The transceiver module 33 is used to send the test set to at least two devices under test and receive the corresponding test results returned by each device under test, where the test results represent the execution results of the executable files corresponding to each test package to be compiled in the test set;

[0092] The determination module 34 is used to determine the target device according to the test results returned by each device under test.

[0093] In one possible implementation, the configuration information includes at least two test items and test information corresponding to each test item, and the test information is used to control the device under test to generate an executable file corresponding to the test item; when the generation module generates at least two test packages to be compiled according to the configuration information, it is specifically used to: generate a test package to be compiled corresponding to each test item according to each test item and the test information corresponding to each test item.

[0094] In a possible implementation, the test package to be compiled includes test logic information and compilation logic information, the test logic information is used to characterize the implementation logic of testing the test items; the compilation logic information is used to characterize the implementation logic of controlling the device under test to generate an executable file under the corresponding test running environment; the compilation logic information includes a first execution function and a second execution function; the first execution function is used to control the device under test that receives the test package to be compiled to determine the test running environment corresponding to the device information of the device under test; the second execution function is used to control the device under test that receives the test package to be compiled to generate a corresponding executable file according to the test running environment.

[0095] In one possible implementation, the test package to be compiled also includes timing information, and the timing information is used to characterize the test timing corresponding to each test item; when the generation module sorts the test packages to be compiled and generates a test set based on the sorted test packages to be compiled, it is specifically used to: sort the test packages to be compiled based on the test timing corresponding to the test items represented by the timing information, and generate a test set for the sorted test packages to be compiled.

[0096] In one possible implementation, the determination module is specifically used to: determine a first result parameter and a second result parameter based on the test results, the first result parameter representing the test results of the mandatory test items, and the second result parameter representing the test results of the reference test items; based on the first result parameter, determine the devices under test whose test results of the mandatory test items meet the requirements as qualified devices; based on the second result parameters of each qualified device, obtain the test results of the reference test items corresponding to each qualified device; according to preset weight information, perform weighted calculation on the test results of each reference test item to generate a test evaluation value corresponding to each qualified device; according to the ranking of the test evaluation values ​​corresponding to each qualified device, determine a preset number of qualified devices with the highest test evaluation values ​​as target devices.

[0097] In one possible implementation, the test result includes log information, and the log information is used to characterize the system log generated during the execution of the executable file by the device under test; when the determination module determines the first result parameter and the second result parameter based on the test result, it is specifically used to: generate the first result parameter and the second result parameter based on the log information.

[0098] In one possible implementation, the first result parameter includes at least one of the following: system compatibility information, the system compatibility information characterizes the compatibility of the system of the device under test with a preset target system; specification information, the specification information characterizes the technical specifications of the device under test; the second result parameter includes at least one of the following: resource consumption information, the resource consumption information characterizes the resource consumption of the device under test during the execution of the executable file; device performance information, the device performance information characterizes the computing power of the device under test during the execution of the executable file.

[0099] The acquisition module 31, the generation module 32, the transceiver module 33 and the determination module 34 are connected in sequence. The equipment selection test device 3 provided in this embodiment can be executed as follows: Figure 2-Figure 6 The technical solutions of any of the method embodiments shown have similar implementation principles and technical effects, which will not be described in detail here.

[0100] Figure 8 A schematic diagram of an electronic device provided by an embodiment of the present disclosure, such as Figure 8 As shown, the electronic device provided in this embodiment includes: a memory 41, a processor 42 and a computer program.

[0101] The computer program is stored in the memory 41 and is configured to be executed by the processor 42 to implement the present disclosure. Figure 2-Figure 6 The equipment selection and testing method provided in any one of the corresponding embodiments.

[0102] The memory 41 and the processor 42 are connected via a bus 43 .

[0103] For related instructions, please refer to Figure 2-Figure 6 The relevant descriptions and effects corresponding to the steps in the corresponding embodiments can be understood, and no further elaboration is made here.

[0104] An embodiment of the present disclosure provides a computer-readable storage medium having a computer program stored thereon, and the computer program is executed by a processor to implement the present disclosure. Figure 2-Figure 6 The equipment selection and testing method provided in any one of the corresponding embodiments.

[0105] Among them, the computer-readable storage medium may be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.

[0106] An embodiment of the present disclosure provides a computer program product, including a computer program, which implements the present disclosure when executed by a processor. Figure 2-Figure 6 The equipment selection and testing method provided in any one of the corresponding embodiments.

[0107] In the several embodiments provided in the present disclosure, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules is only a logical function division, and there may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0108] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the applications disclosed herein. The present disclosure is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are intended to be exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0109] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A device selection test method, It is characterized in that Applied to a server, the server is in communication connection with the device under test, the method comprises: Acquire configuration information, where the configuration information represents test items to be tested on the device under test; Generate at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device under test to generate an executable file under a test running environment, wherein the test running environment corresponds to a device model of the device under test, and the executable file is used to test the test items corresponding to the device under test under the test running environment after being executed by the device under test; Sorting the test packages to be compiled, and generating a test set based on the sorted test packages to be compiled; Sending the test set to at least two of the devices under test, and receiving corresponding test results returned by each of the devices under test, wherein the test results represent execution results of executable files corresponding to each to-be-compiled test package in the test set; Determine a first result parameter and a second result parameter according to the test result, wherein the first result parameter represents the test result of the mandatory test item, and the second result parameter represents the test result of the reference test item; Based on the first result parameter, determining the device under test whose test result of the mandatory test item meets the requirements as a qualified device; Based on the second result parameters of each of the qualified devices, obtaining the test results of the reference test items corresponding to each of the qualified devices; According to the preset weight information, weighted calculation is performed on the test results of each of the reference test items to generate a test evaluation value corresponding to each of the qualified devices; According to the ranking of the test evaluation values ​​corresponding to the qualified devices, a preset number of qualified devices with the highest test evaluation values ​​are determined as target devices.

2. The method according to claim 1, It is characterized in that The configuration information includes at least two test items and test information corresponding to each of the test items, wherein the test information is used to control the device under test to generate an executable file corresponding to the test item; Generate at least two test packages to be compiled according to the configuration information, including: According to each of the test items and the test information respectively corresponding to each of the test items, a test package to be compiled corresponding to each of the test items is generated.

3. The method according to claim 2, It is characterized in that in, The test package to be compiled includes test logic information and compilation logic information, wherein the test logic information is used to characterize the implementation logic of testing the test item; the compilation logic information is used to characterize the implementation logic of controlling the device under test to generate an executable file under the corresponding test running environment; the compilation logic information includes a first execution function and a second execution function; The first execution function is used to control the device under test that receives the test package to be compiled to determine a test running environment corresponding to the device information of the device under test; The second execution function is used to control the device under test that receives the test package to be compiled to generate a corresponding executable file according to the test running environment.

4. The method according to claim 2, It is characterized in that The test package to be compiled also includes timing information, and the timing information is used to characterize the test timing corresponding to each of the test items; Sorting the test packages to be compiled, and generating a test set based on the sorted test packages to be compiled, including: The test packages to be compiled are sorted based on the test timings corresponding to the test items represented by the timing information, and the test set is generated from the sorted test packages to be compiled.

5. The method according to claim 1, It is characterized in that The test result includes log information, and the log information is used to represent the system log generated during the process of the device under test executing the executable file; Determining a first result parameter and a second result parameter according to the test result includes: The first result parameter and the second result parameter are generated according to the log information.

6. The method according to claim 5, It is characterized in that The first result parameter includes at least one of the following: System compatibility information, wherein the system compatibility information indicates the compatibility of the system of the device under test with a preset target system; Specification information, wherein the specification information represents the technical specifications of the device under test; The second result parameter includes at least one of the following: Resource consumption information, wherein the resource consumption information represents the amount of resource consumption during the process of the device under test executing the executable file; Device performance information, where the device performance information represents the computing capability of the device under test during the process of executing the executable file.

7. A device for testing equipment selection, It is characterized in that include: An acquisition module, used to acquire configuration information, wherein the configuration information represents a test item to be tested on the device under test; A generation module, used to generate at least two test packages to be compiled according to the configuration information, wherein the test packages to be compiled are used to control the device to be tested to generate an executable file under a test running environment, wherein the test running environment corresponds to the device model of the device to be tested, and the executable file is used to test the test items corresponding to the device to be tested under the test running environment after being executed by the device to be tested; sorting the test packages to be compiled, and generating a test set based on the sorted test packages to be compiled; A transceiver module, used to send the test set to at least two of the devices under test, and receive corresponding test results returned by each of the devices under test, wherein the test results represent execution results of executable files corresponding to each to-be-compiled test package in the test set; A determination module is used to determine a first result parameter and a second result parameter based on the test results, wherein the first result parameter represents the test results of mandatory test items, and the second result parameter represents the test results of reference test items; based on the first result parameter, determine the devices under test whose test results of the mandatory test items meet the requirements as qualified devices; based on the second result parameters of each qualified device, obtain the test results of the reference test items corresponding to each qualified device; according to preset weight information, perform weighted calculation on the test results of each reference test item to generate a test evaluation value corresponding to each qualified device; according to the ranking of the test evaluation values ​​corresponding to each qualified device, determine a preset number of qualified devices with the highest test evaluation values ​​as target devices.

8. An electronic device, It is characterized in that include: Memory, processor and computer program; The computer program is stored in the memory and is configured to be executed by the processor to implement the equipment selection test method according to any one of claims 1 to 6.

9. A computer-readable storage medium, It is characterized in that The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, are used to implement the equipment selection and testing method according to any one of claims 1 to 6.

10. A computer program product comprising a computer program, It is characterized in that When the computer program is executed by a processor, the device selection and testing method according to any one of claims 1 to 6 is implemented.

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