Electronic component translation type test handler

Abstract

This invention discloses an electronic component translational testing and sorting machine, belonging to the technical field of chip testing equipment. It features low-temperature testing capabilities for electronic components. The sorting machine includes a feed pipe, a feeding and conveying area, a testing area, and a discharging and conveying area. The feed pipe includes a feeding pipe for feeding and a discharging pipe for discharging. The sorting machine also includes a primary sealed cavity and a secondary sealed cavity. The primary sealed cavity is filled with drying gas. The testing area is located within the primary sealed cavity, while the feeding and discharging areas are located within the secondary sealed cavity. The primary and secondary sealed cavities, as well as the feed pipe and the secondary sealed cavity, are interconnected to accommodate electronic components. In this design, in addition to the sealing in the testing area, the feeding and discharging areas adjacent to the testing area are also sealed to increase the sealing range, reduce and slow down the escape of drying gas from the testing sealed cavity, ensure a dry environment in the testing area, and improve the anti-frost and anti-condensation effect.

Description

Technical Field

[0001] This invention relates to the field of chip testing equipment technology, and more specifically to an electronic component translational testing and sorting machine. Background Technology

[0002] With the continuous development and innovation of technology, the application and demand for integrated circuits (ICs) are increasing. Because electronic components undergo multiple precise manufacturing processes, they must undergo a series of electrical performance tests before being sold to ensure product quality. However, as the functions of electronic components continue to evolve and improve, the requirements for the testing environment are becoming increasingly stringent, and the testing needs are becoming more extensive.

[0003] Currently, sorting machines on the market can be categorized into gravity sorting machines, translational sorting machines, automated sorting machines, and probe stations. Electronic components with no leads or short leads, such as QFN and QFP, are generally tested for electrical performance using translational three-temperature sorting machines. However, leaded electronic components, such as SOP8 and SOP16, can only be tested on gravity sorting machines because they can only be loaded and unloaded using feed tubes. Gravity sorting machines suffer from drawbacks such as expensive components, long test changeover times, complex operating procedures, and low throughput. In contrast, translational three-temperature testing and sorting machines offer relatively inexpensive components, simple operation, and high throughput. Therefore, translational three-temperature testing and sorting machines are increasingly being promoted and applied, and are being tested for electrical performance testing of leaded products.

[0004] Translational sorting machines are further divided into ambient temperature and high temperature testing sorting machines and three-temperature testing sorting machines. Ambient temperature and high temperature testing sorting machines mainly provide both ambient temperature and high temperature testing environments for electronic components. Because there is no interference from low temperatures, this type of sorting machine has low design difficulty, low failure rate, various feeding and receiving methods, and no sealing requirements, but the testing is not comprehensive. On the other hand, three-temperature testing sorting machines mainly provide testing environments for electronic components at various temperature nodes, including low temperature, ambient temperature, and high temperature. The testing is comprehensive and can meet the testing specifications of high-precision and high-function electronic components, thereby ensuring the product quality of electronic components when shipped. However, when the three-temperature test sorting machine is in a low-temperature test environment, the water vapor in the air will condense when it reaches a certain content, causing frost and condensation, which affects the test results. In order to solve the problem of frost and condensation during low-temperature testing, the existing technology sets up a sealed cavity in the test area of ​​the three-temperature test sorting machine and fills the sealed cavity with dry air to ensure that the test area is a dry environment, thereby reducing the water vapor content and lowering the dew point. However, the three-temperature test sorting machine is relatively large, and the sealing of its test area is generally achieved by a glass cover and a thin metal plate. The sealing effect of the thin metal plate is poor, causing a large amount of dry air to escape, and external water vapor will also enter the sealed cavity, so the improvement of frost and condensation is not significant. Summary of the Invention

[0005] The purpose of this invention is to disclose an electronic component translational testing and sorting machine to at least partially solve the above-mentioned problems.

[0006] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0007] An electronic component translational testing and sorting machine has a low-temperature testing function for electronic components. The sorting machine includes a material pipe, a feeding and conveying area, a testing area, and a discharging and conveying area. The material pipe includes a feeding pipe for feeding and a discharging pipe for discharging. The sorting machine also includes a primary sealed cavity and a secondary sealed cavity. The primary sealed cavity is filled with dry gas. The testing area is located in the primary sealed cavity. The feeding and conveying areas are located in the secondary sealed cavity. The primary sealed cavity and the secondary sealed cavity, as well as the material pipe and the secondary sealed cavity, are interconnected to receive the electronic components.

[0008] The beneficial effects of adopting this solution are:

[0009] The translational testing and sorting machine in this solution uses a material tube for loading and unloading, enabling it to perform three-temperature testing on both leadless and leaded electronic components. This enhances its functionality, expands its applicability, reduces the testing cost of leaded electronic components, simplifies operation and processing, and increases production capacity. Furthermore, the material tube loading and unloading can directly handle loose materials, saving the tray-setting process, thus achieving the goal of cost reduction and efficiency improvement.

[0010] Based on the existing technology of three-temperature test sorting machines, which only set up a sealed cavity in the test area, resulting in a large amount of dry gas escaping, this solution not only sets up a seal in the test area, but also sets up seals in the feeding and unloading areas adjacent to the test area, so as to increase the sealing range, reduce and slow down the escape of dry gas in the test sealed cavity, ensure the dry environment of the test area, and improve the anti-frost and condensation effect.

[0011] The testing area is sealed separately from the feeding and unloading areas. The testing area is a primary sealed area, while the feeding and unloading areas are secondary sealed areas, forming a two-stage sealing structure. Compared to setting the testing area, feeding and unloading areas as a single sealed cavity, the two-stage sealing structure concentrates the drying gas mainly in the primary sealed cavity, which has a smaller space and better ensures the concentration of drying gas in the testing area.

[0012] Meanwhile, the dry air escaping from the primary sealing chamber flows into the secondary sealing chamber, ensuring that both the loading and unloading areas are in a dry environment. The loading area is in a high-temperature environment, allowing the electronic components to be dried during the loading process. This prevents moisture from being introduced into the testing area when the electronic components are loaded, thus avoiding condensation during low-temperature testing and further improving the anti-frost and condensation effect. The unloading area is also in a high-temperature environment, ensuring that the electronic components remain dry after testing. This prevents the electronic components from being discharged with a high temperature after high-temperature testing, which could easily cause condensation on their surface when exposed to ambient temperatures, thus affecting the quality and performance of the electronic components.

[0013] Preferably, a material inlet is provided between the primary sealing cavity and the secondary sealing cavity, and the electronic components are transferred between the primary sealing cavity and the secondary sealing cavity through the material inlet. Through the material inlet, the electronic components are taken out from the loading and conveying area and placed into the testing area for testing, or the tested electronic components are taken out from the testing area and placed into the unloading and conveying area for unloading, so as to realize the operation of the entire process of electronic components from loading to unloading.

[0014] Preferably, the material inlet is equipped with an automatic door and a power mechanism. The power mechanism controls the opening and closing of the automatic door to realize the opening and closing of the material inlet. By controlling the precision of the opening and closing of the automatic door through the power mechanism, it can be precisely coordinated with the picking up and taking down of electronic components, so that the automatic door opens when picking up materials and closes when picking up materials, ensuring the separation and sealing effect of the feeding area, the unloading area and the testing area, reducing the escape of drying gas from the primary sealing chamber to the secondary sealing chamber, and ensuring the concentration of drying gas in the testing area.

[0015] Preferably, the feeding area is also provided with a limit block to restrict the stroke of the power mechanism. By limiting the stroke of the power mechanism, the opening range of the automatic door is controlled. This ensures that the electronic components can be taken out smoothly, without prolonging the opening and closing time due to excessive opening, which would affect work efficiency and sealing effect.

[0016] Preferably, the secondary sealing cavity includes a feeding sealing cavity, and the material receiving port includes a first material receiving port opened between the feeding sealing cavity and the primary sealing cavity. The feeding and conveying area is located inside the feeding sealing cavity. The feeding and conveying area is provided with a feeding linear vibration track, a discharging track, and a discharging shuttle. The feeding linear vibration track is connected to the feeding pipe and receives electronic components in the feeding pipe. The discharging track is located at the end of the feeding linear vibration track away from the feeding pipe. The discharging shuttle reciprocates on the discharging track to transport the electronic components on the feeding linear vibration track to the first material receiving port, and the electronic components in the discharging shuttle are transported to the test area through the first material receiving port.

[0017] The feeding and conveying area utilizes the aforementioned device. During feeding, loose electronic components enter the feeding linear vibrating track through the feed pipe and move to the end of the track. Then, the feeding shuttle, moving along the feeding track, transports the electronic components to the first dispensing port for easy and precise handling. This combination of the feeding linear vibrating track, the feeding track, and the feeding shuttle integrates a translational testing and sorting machine with a feed pipe feeding system. This allows both leadless and leaded electronic components to undergo electrical performance testing by the translational testing and sorting machine, enhancing its functionality, reducing testing costs and operational complexity, and increasing production capacity. Simultaneously, the feeding shuttle prevents electronic components from slipping or being damaged during transport, improving safety and stability. Furthermore, the fixed frequency of the feeding shuttle's reciprocating motion on the feeding track ensures uniform and orderly feeding.

[0018] Preferably, the feeding sealing cavity includes a first feeding sealing cavity and a second feeding sealing cavity that are connected. The end of the feeding track away from the feeding linear vibration track is placed in the second feeding sealing cavity. The first material intake port is opened on the side wall and / or top wall of the second feeding sealing cavity. Compared with the first feeding sealing cavity, the second feeding sealing cavity is closer to the test area, which simplifies the material intake path and improves the material intake efficiency.

[0019] Preferably, the testing area is equipped with a preheating plate and a testing mechanism. The preheating plate preheats the electronic components in the receiving area. The preheated electronic components are then transported to the testing mechanism for testing. Before entering the testing mechanism, the electronic components are preheated according to the required temperature for testing, which saves the heating and cooling time in the testing mechanism and improves testing efficiency.

[0020] Preferably, the secondary sealing cavity includes a discharge sealing cavity, and the material inlet includes a second material inlet located between the discharge sealing cavity and the primary sealing cavity. The discharge conveying area is located within the discharge sealing cavity. The electronic components of the test area are transported to the discharge conveying area through the second material inlet. The discharge conveying area is provided with a first discharge track, a second discharge track, and a discharge shuttle. The discharge tube is connected to the first discharge track and receives the electronic components in the first discharge track. The second discharge track is located on the side of the first discharge track away from the discharge tube. The discharge shuttle reciprocates on the second discharge track to transport the electronic components from the second material inlet to the first discharge track.

[0021] The material feeding area utilizes the aforementioned device. Tested electronic components are transported through the second feeding port to the feeding shuttle waiting at the second feeding port for precise feeding. The movement of the feeding shuttle on the second feeding track transports the electronic components to the first feeding track, and then through the first feeding track into the feeding tube for feeding. This combination of the first feeding track, the second feeding track, and the feeding shuttle achieves the integration of a translational testing and sorting machine with tube feeding, allowing both leadless and leaded electronic components to be smoothly fed from the translational testing and sorting machine after testing without affecting subsequent tests. Simultaneously, the feeding shuttle prevents electronic components from slipping or being damaged during transport, improving the safety and stability of electronic component transport. Furthermore, the fixed frequency of the feeding shuttle's reciprocating motion on the second feeding track ensures uniform and orderly feeding.

[0022] Preferably, the material discharge sealing cavity includes a first material discharge sealing cavity and a second material discharge sealing cavity that are connected. The end of the second material discharge track away from the first material discharge track is placed in the second material discharge sealing cavity. The second material receiving port is opened on the side wall and / or top wall of the second material discharge sealing cavity. Compared with the first material discharge sealing cavity, the second material discharge sealing cavity is closer to the test area, which simplifies the material discharge path and improves the material discharge efficiency.

[0023] Preferably, a through hole is formed in the wall of the secondary sealing cavity, and the material tube is connected to the secondary sealing cavity through the through hole. The material tube and the corresponding track inside and outside the secondary sealing cavity are connected through the through hole. The electronic components in the feeding material tube are fed into the feeding linear vibrating track through the through hole, and the electronic components on the first unloading track are fed into the unloading material tube through the through hole.

[0024] These features and advantages of the invention will be disclosed in detail in the following specific embodiments and accompanying drawings. Attached Figure Description

[0025] The invention will be further described below with reference to the accompanying drawings:

[0026] Figure 1 This is a schematic diagram of the layout of the primary sealing cavity and the secondary sealing cavity of the present invention.

[0027] Figure 2 This is a schematic diagram of the material feeding and conveying area of ​​the present invention from a certain perspective, and shows a partial structure of the material feeding sealing cavity.

[0028] Figure 3 This is a partial structural diagram of the material feeding sealing cavity of the present invention.

[0029] Figure 4 This is a top view of the electronic component translational testing and sorting machine of the present invention, showing a partial structure of the secondary sealed cavity.

[0030] Figure label:

[0031] 100. Material feeding and conveying area; 110. Material feeding linear vibrating track; 120. Material unloading track; 130. Material unloading shuttle; 140. First NPN robot arm;

[0032] 200. Testing area; 210. First robotic arm; 220. Preheating tray; 230. Testing mechanism; 240. Feeding track; 250. Feeding shuttle; 260. Discharge track; 270. Discharge shuttle; 280. Manual material collection tube;

[0033] 300. Material unloading and conveying area; 310. First unloading track; 320. Second unloading track; 330. Unloading shuttle; 340. Fourth robotic arm; 350. Second NPN robotic arm;

[0034] 410. Feeding pipe; 420. Discharging pipe;

[0035] 500. Test the sealed cavity;

[0036] 600, Feeding sealing cavity; 610, First feeding sealing cavity; 611, Front wall of the first feeding sealing cavity; 6111, Observation sealing door; 620, Second feeding sealing cavity; 621, Top wall of the second feeding sealing cavity; 6211, First material unloading port; 622, Side wall of the second feeding sealing cavity; 630, First automatic door; 640, First power mechanism; 650, First limiting block;

[0037] 700, Discharge sealing cavity; 710, First discharge sealing cavity; 720, Second discharge sealing cavity; 721, Top wall of the second discharge sealing cavity; 730, Second automatic door; 740, Second power mechanism; 750, Second limit block;

[0038] 800. Substrate. Detailed Implementation

[0039] The technical solutions of the embodiments of the present invention will be explained and described below with reference to the accompanying drawings. However, the following embodiments are only preferred embodiments of the present invention and not all of them. Other embodiments obtained by those skilled in the art based on the embodiments in the implementation methods without creative effort are all within the protection scope of the present invention.

[0040] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "clockwise," and "counterclockwise," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0041] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, unless otherwise stated, "a plurality of" means two or more, unless explicitly defined otherwise.

[0042] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0043] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0044] The “front end” and “tail end” of the device mentioned in this invention are defined by the flow direction of the electronic components. The end where the electronic components flow into a device is defined as the “front end”, and the end where the electronic components flow out of a device is defined as the “tail end”.

[0045] The electronic component translational testing and sorting machine of the present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments:

[0046] The present invention will be described below using a translational three-temperature testing and sorting machine that has the functions of high temperature, room temperature and low temperature testing of electronic components as an example. However, those skilled in the art will understand that the present invention can also be applied to a translational low temperature testing and sorting machine that only has the function of low temperature testing, or to a translational two-temperature testing and sorting machine that has the functions of low temperature testing and room temperature testing, or has the functions of low temperature testing and high temperature testing.

[0047] The translational three-temperature testing and sorting machine includes a base plate at the bottom, on which a feeding area, a testing area and an unloading area are arranged in sequence. Electronic components are transported from the feeding area into the testing area and tested, and then unloaded through the unloading area.

[0048] Existing translational three-temperature testing and sorting machines generally use a material box or tray loading and unloading method, which limits their use to testing electronic components with no leads or short leads. Electronic components with leads, on the other hand, require material tube loading and unloading and can only be tested on gravity sorting machines. Gravity sorting machines suffer from problems such as expensive supporting components, long test changeover time, complex operation and processing procedures, and low production capacity.

[0049] To reduce testing costs for leaded electronic components, simplify handling, and increase production capacity, refer to Figure 4 According to one embodiment of the present invention, a material tube is provided on the translational three-temperature test and sorting machine to realize the loading and unloading of electronic components with pins on the translational three-temperature test and sorting machine through the material tube, and then to perform performance testing on the translational three-temperature test and sorting machine.

[0050] Reference Figure 4 The feed pipes on the translational three-temperature testing and sorting machine specifically include a feed pipe 410 for feeding and a discharge pipe 420 for discharging. The feed pipe 410 works with the feed conveying area 100 to feed loose electronic components, and the discharge pipe 420 works with the discharge conveying area 300 to discharge the tested electronic components.

[0051] To achieve feeding of materials through the feeding pipe 410 on the translational three-temperature testing and sorting machine, refer to... Figure 1 and Figure 4 In this embodiment, the feeding and conveying area 100 is specifically provided with a feeding linear vibration track 110, a discharging track 120 and a discharging shuttle 130. The feeding linear vibration track 110 is connected to the feeding pipe 410 and receives the electronic components in the feeding pipe 410. The discharging track 120 is located at the end of the feeding linear vibration track 110 away from the feeding pipe 410. The end of the discharging track 120 away from the feeding linear vibration track 110 is close to the test area 200. The discharging shuttle 130 is located on the discharging track 120 and can reciprocate on the discharging track 120.

[0052] During feeding, electronic components near the end of the feeding tube 410 are blown into the feeding linear vibrating track 110 and move to the end of the feeding linear vibrating track 110. The end of the feeding linear vibrating track 110 is equipped with a first NPN robot 140. The first NPN robot 140 transports the electronic components at the end of the feeding linear vibrating track 110 to the unloading shuttle 130. The unloading shuttle 130 moves forward on the unloading track 120 to a position close to the test area 200. The test area 200 is equipped with a first robot 210, which transports the electronic components in the unloading shuttle 130 to the test area 200.

[0053] To improve the efficiency of electronic component conveying, preferably, two unloading tracks 120 and two first NPN robots 140 are respectively set on the left and right sides of the tail end of the feeding linear vibrating track 110. Unloading shuttles 130 are respectively set on the two unloading tracks 120. The two unloading shuttles 130 work alternately, and the two first NPN robots 140 take materials from the tail end of the feeding linear vibrating track 110 and put them into the two unloading shuttles 130 respectively, so as to achieve the purpose of high-efficiency production.

[0054] The combination of a feeding and conveying system—including a feeding linear vibrating track 110, a discharging track 120, and a discharging shuttle 130—achieves a combination of a translational testing and sorting machine and a material tube feeding system. This allows electronic components with leads to undergo electrical performance testing via the translational testing and sorting machine, enhancing its functionality, reducing testing costs and operational complexity, and increasing production capacity. Simultaneously, the discharging shuttle 130 prevents electronic components from slipping or being damaged during transport, improving safety and stability. Furthermore, the fixed frequency of the discharging shuttle 130's reciprocating motion on the discharging track 120 ensures uniform and orderly feeding.

[0055] The test area 200 is equipped with a preheating plate 220 and a test mechanism 230. The first robot arm 210 transports the electronic components in the feeding shuttle 130 to the preheating plate 220. After the preheating plate 220 preheats the electronic components, the electronic components are transported to the test mechanism 230 for testing. Before entering the test mechanism 230, the electronic components are preheated according to the temperature required for testing, which saves the heating and cooling time in the test mechanism 230 and improves the testing efficiency.

[0056] Specifically, a feeding track 240 is provided between the preheating plate 220 and the testing mechanism 230, and a feeding shuttle 250 is provided on the feeding track 240, which reciprocates on the feeding track 240.

[0057] The preheated electronic components are taken out by the first robotic arm 210 and placed into the feed shuttle 250.

[0058] Of course, in other embodiments, a second robotic arm may be provided between the preheating plate 220 and the testing mechanism 230, and the preheated electronic components may be taken out by the second robotic arm and placed into the feed shuttle 250.

[0059] A third robotic arm is installed at point 230 of the testing facility.

[0060] The feed shuttle 250 transports the electronic components to the testing mechanism 230. The third robot arm removes the electronic components from the feed shuttle 250 and places them into the testing mechanism 230 for testing.

[0061] Preferably, two feeding tracks 240 are provided, and feeding shuttles 250 are provided on the two feeding tracks 240 respectively. The two feeding shuttles 250 work alternately to form two conveying channels, which are used in conjunction with the two unloading channels in the feeding and conveying area 100 to improve feeding efficiency.

[0062] Preferably, there are two third robotic arms, which are used to pick up and put in the electronic components in the two feed shuttles 250 respectively. The two third robotic arms work alternately to improve testing efficiency and reduce interference.

[0063] In order to transport the tested electronic components out of the testing mechanism 230, a discharge track 260 is provided on the side of the testing mechanism 230 away from the preheating plate 220. A discharge shuttle 270 is provided on the discharge track 260. The discharge shuttle 270 reciprocates on the discharge track 260. After the electronic components are tested, they are taken out by the third robot arm and placed into the discharge shuttle 270, and then transported to the unloading and conveying area 300 through the discharge shuttle 270.

[0064] Preferably, two discharge tracks 260 are provided, and discharge shuttles 270 are provided on the two discharge tracks 260 respectively to form two discharge channels. The two discharge shuttles 270 work alternately to cooperate with two third robotic arms.

[0065] In this embodiment, the translational three-temperature testing and sorting machine uses a refrigerant machine for cooling during low-temperature testing and a heating rod for heating during high-temperature testing. The three-temperature testing mechanism for electronic components is existing technology and will not be described in detail in this embodiment.

[0066] To enable the feeding tube 420 to feed materials onto the translational three-temperature testing and sorting machine, the feeding and conveying area 300 in this embodiment is equipped with a first feeding track 310, a second feeding track 320, a feeding shuttle 330, a fourth robotic arm 340, and a second NPN robotic arm 350. The feeding tube 420 is connected to the first feeding track 310 and receives the electronic components in the first feeding track 310. The second feeding track 320 is located on the side of the first feeding track 310 away from the feeding tube 420. The end of the second feeding track 320 away from the first feeding track 310 is close to the testing area 200. The feeding shuttle 330 reciprocates on the second feeding track 320.

[0067] During unloading, the fourth robot 340 transports the electronic components in the discharge shuttle 270 to the unloading shuttle 330. The unloading shuttle 330 moves to the front end of the first unloading track 310. The second NPN robot 350 transports the electronic components in the unloading shuttle 330 to the front end of the first unloading track 310. Through the vibration and air blowing of the first unloading track 310, the electronic components pass through the tail end of the first unloading track 310 and enter the unloading tube 420. Under the air blowing, they move to the tail end of the unloading tube 420, completing the unloading.

[0068] To improve the efficiency of electronic component conveying, preferably, two second feeding tracks 320 and two second NPN robots 350 are respectively set on the left and right sides of the front end of the first feeding track 310. The two second feeding tracks 320 are respectively equipped with feeding shuttles 330. The two feeding shuttles 330 work alternately to form two feeding channels, which are used in conjunction with the two discharge tracks 260 in the test area 200 to improve feeding efficiency. The two second NPN robots 350 take materials from the two feeding shuttles 330 alternately and put them into the front end of the first feeding track 310 to achieve the purpose of high-efficiency production.

[0069] The combination of the first feeding track 310, the second feeding track 320, and the feeding shuttle 330 integrates the translational testing and sorting machine with the material tube feeding mechanism. This allows electronic components with pins to be smoothly unloaded from the translational testing and sorting machine after testing without affecting subsequent tests. Simultaneously, the feeding shuttle 330 prevents electronic components from slipping or being damaged during transport, improving the safety and stability of component transport. Furthermore, the fixed frequency of the reciprocating motion of the feeding shuttle 330 on the second feeding track 320 ensures uniform and orderly feeding.

[0070] In order to separate the unqualified electronic components, a manual receiving tube 280 is also provided in the test area 200. After the unqualified electronic components come out of the test mechanism 230, they are directly sent to the manual receiving tube 280 through the discharge shuttle 270.

[0071] The translational three-temperature testing and sorting machine in this embodiment adopts a material tube loading and unloading system, which enables it to perform three-temperature testing functions for both leadless and leaded electronic components, thereby enhancing its functionality, expanding its application range, reducing the testing cost of leaded electronic components, reducing operational processing difficulty, and increasing production capacity. Furthermore, the material tube loading and unloading system can directly load and unload loose materials, saving the tray-setting process, thus achieving the goal of cost reduction and efficiency improvement.

[0072] When the three-temperature test sorting machine is in a low-temperature test environment, the water vapor in the air will condense when it reaches a certain content, causing frost and condensation, which will affect the test results. In order to prevent frost and condensation during low-temperature testing, the existing technology will set up a test sealing chamber in the test area and fill the test sealing chamber with dry air to achieve the sealing and drying of the test area, so as to play the function of preventing frost and condensation during low-temperature testing.

[0073] However, the three-temperature test sorting machine is relatively large in size. Its test sealing chamber is generally surrounded by a glass cover on top and thin metal plates around it. The sealing effect between the thin metal plates and the substrate is poor, which will cause a large amount of dry air to escape to the outside, and external moisture will also enter the sealing chamber, thus not significantly improving the condensation phenomenon.

[0074] To solve the above technical problems, refer to Figure 1 According to one embodiment of the present invention, sealing cavities are also provided in the feeding and conveying area 100 and the unloading and conveying area 300 to form a two-stage sealing structure on the sorting machine. The test sealing cavity 500 is a primary sealing cavity, and the sealing cavities in the feeding and conveying area 100 and the unloading and conveying area 300 are secondary sealing cavities. The primary sealing cavity and the secondary sealing cavity, as well as the material pipe and the secondary sealing cavity, can be connected to receive electronic components.

[0075] In this embodiment, in addition to setting a seal in the test area 200, the loading and unloading areas 100 and 300 adjacent to the test area 200 are also sealed to increase the sealing range, reduce and slow down the escape of dry gas in the primary sealing cavity, ensure the dry environment of the test area 200, and improve the effect of preventing condensation.

[0076] The test area 200 is sealed separately from the feeding and conveying areas 100 and 300. The test area 200 is a primary sealed area, while the feeding and conveying areas 100 and 300 are secondary sealed areas, forming a two-stage sealing structure. Compared to setting the test area 200, feeding and conveying areas 100 and 300 as a single sealed cavity, the two-stage sealing structure ensures that the drying gas is mainly concentrated in the primary sealed cavity, which has a smaller space and better guarantees the concentration of drying gas in the test area 200.

[0077] Meanwhile, the dry air escaping from the primary sealing chamber flows into the secondary sealing chamber, ensuring that the loading and unloading conveying areas 100 and 300 are also in a dry environment. The loading and unloading conveying area 100 is in a relatively high-temperature environment, ensuring that the electronic components are dried during the loading and unloading process. This prevents moisture from being carried into the testing area 200 when the electronic components are loaded, which could lead to condensation during low-temperature testing, further enhancing the effect of preventing condensation. The unloading conveying area 300 is in a relatively high-temperature environment, ensuring that the electronic components remain dry after testing. When the electronic components are unloaded after low-temperature testing, they still have a low temperature. The dry environment prevents condensation from forming on the surface of the electronic components entering the unloading conveying area 300, thus avoiding any impact on the quality and performance of the electronic components.

[0078] To achieve the connection between the primary and secondary sealing cavities, a material handling port is provided between them. Through the material handling port, electronic components are taken out from the loading and conveying area 100 and placed into the testing area 200 for testing, or the tested electronic components are taken out from the testing area 200 and placed into the unloading and conveying area 300 for unloading, so as to realize the operation of the entire process of electronic components from loading to unloading.

[0079] like Figure 1 As shown, since the feeding and conveying area 100 and the unloading and conveying area 300 are located on both sides of the test area 200, the secondary sealing cavity includes the feeding sealing cavity 600 and the unloading sealing cavity 700. The feeding and conveying area 100 is located in the feeding sealing cavity 600, and the unloading and conveying area 300 is located in the unloading sealing cavity 700.

[0080] like Figures 1-3 As shown, in order to achieve communication between the feeding sealing cavity 600 and the primary sealing cavity, a first material inlet 6211 is provided between the feeding sealing cavity 600 and the primary sealing cavity. Specifically, the feeding sealing cavity 600 includes a first feeding sealing cavity 610 and a second feeding sealing cavity 620 that are connected. The front ends of the feeding linear vibration track 110 and the discharging track 120 are located in the first feeding sealing cavity 610, and the rear ends of the discharging track 120 are located in the second feeding sealing cavity 620. The first material inlet 6211 is located on the top wall 621 of the second feeding sealing cavity. During feeding, the discharging shuttle 130 moves on the discharging track 120 to the first material inlet 6211. The first robotic arm 210 takes out the electronic components in the discharging shuttle 130 through the first material inlet 6211 and transports them to the preheating plate 220 of the test area 200 to achieve precise material handling.

[0081] Of course, in other embodiments, the first feeding port 6211 may also be provided on the side wall 622 of the second feeding sealing cavity.

[0082] To simultaneously achieve the functions of material handling and reducing the flow of drying gas, the first material handling port 6211 is equipped with a first automatic door 630 and a first power mechanism 640 for controlling the opening and closing of the first automatic door 630. The first power mechanism 640 is preferably a cylinder. The first automatic door 630 is opened and closed by extending and retracting the push rod in the cylinder, and the movement accuracy of the push rod is controlled so that the first automatic door 630 opens when material is handled, which is precisely coordinated with the handling of electronic components. After material handling is completed, the first automatic door 630 closes, ensuring the separation and sealing effect between the material handling area 100 and the testing area 200, reducing the escape of drying gas from the first sealed cavity to the material sealing cavity 600, and ensuring the concentration of drying gas in the first sealed cavity.

[0083] In order to limit the opening range of the first automatic door 630, a first limit block 650 is provided at the front end of the cylinder to limit the cylinder extension stroke. By limiting the cylinder extension stroke, the opening range of the first automatic door 630 is controlled. This ensures that the electronic components can be taken out smoothly, without prolonging the opening and closing time due to the large opening, and without affecting the work efficiency and sealing effect.

[0084] Of course, in other embodiments, the first power mechanism 640 may also be an electric lead screw or an electric pulley, etc.

[0085] The feeding tube 410 is located outside the feeding sealing cavity 600. In order to achieve the connection between the feeding tube 410 and the feeding linear vibration track 110, a first through hole (not shown in the figure) is provided on the cavity wall of the feeding sealing cavity 600 away from the primary sealing cavity. The electronic components in the feeding tube 410 are blown into the feeding linear vibration track 110 through the first through hole.

[0086] To achieve communication between the feeding sealing cavity 700 and the primary sealing cavity, a second material inlet is provided between the feeding sealing cavity 700 and the primary sealing cavity. Specifically, the feeding sealing cavity 700 includes a first feeding sealing cavity 710 and a second feeding sealing cavity 720 that are connected. The rear ends of the first feeding track 310 and the second feeding track 320 are located in the first feeding sealing cavity 710, and the front end of the second feeding track 320 is located in the second feeding sealing cavity 720. The second material inlet (not shown in the figure) is located on the top wall 721 of the second feeding sealing cavity. During feeding, the feeding shuttle 330 moves on the feeding track 120 to the second material inlet. The fourth robot arm 340 transports the electronic components in the discharge shuttle 270 to the feeding shuttle 330 through the second material inlet to achieve precise material picking.

[0087] Of course, in other embodiments, the second material inlet may also be located on the side wall of the second material discharge sealing cavity 720.

[0088] To simultaneously achieve the functions of material handling and reducing the flow of drying gas, the second material handling port is equipped with a second automatic door 730 and a second power mechanism 740 for controlling the opening and closing of the second automatic door 730. The second power mechanism 740 is preferably a cylinder. The cylinder drives the second automatic door 730 to open and close by extending and retracting a push rod, and controls the precision of the push rod's movement so that the second automatic door 730 opens precisely when handling material, coordinating with the handling of electronic components. After handling material, the second automatic door 730 closes, ensuring the separation and sealing effect between the material feeding area 300 and the testing area 200, reducing the escape of drying gas from the first sealed cavity to the material feeding sealed cavity 700, and ensuring the concentration of drying gas in the first sealed cavity.

[0089] In order to limit the opening range of the second automatic door 730, a second limit block 750 is provided at the front end of the cylinder to limit the cylinder extension stroke. By limiting the cylinder extension stroke, the opening range of the second automatic door 730 is controlled. This ensures that the electronic components can be taken out smoothly, without prolonging the opening and closing time due to the large opening, and without affecting the work efficiency and sealing effect.

[0090] Of course, in other embodiments, the second power mechanism 740 may also be an electric lead screw or an electric pulley, etc.

[0091] The feeding tube 420 is located outside the feeding sealing cavity 700. In order to achieve the connection between the first feeding track 310 and the feeding tube 420, a second through hole (not shown in the figure) is provided on the cavity wall of the feeding sealing cavity 700 away from the first sealing cavity. The electronic components on the first feeding track 310 are blown into the feeding tube 420 through the second through hole.

[0092] To simplify the structure and reduce processing difficulty, this embodiment uses a sealing cover to form a sealed space above the feeding area 100, the testing area 200, and the unloading area 300. The sealed space is then divided into a primary sealed cavity, a feeding sealed cavity 600, and an unloading sealed cavity 700 by partitions. To facilitate processing, ensure strength, and reduce costs, the sealing cover is made of thin metal plates around its perimeter and transparent glass on top to allow observation of the internal operation of the mobile three-temperature testing and sorting machine. Alternatively, windows can be opened in the surrounding thin metal plates, with transparent glass installed at the windows to allow observation of the internal operation from multiple angles. Thin metal plate partitions are also preferred. The structure of the feeding sealed cavity 600 is described in detail below:

[0093] The partition between the feeding sealing cavity 600 and the primary sealing cavity specifically includes a first partition extending downwards, with a notch cut at the position of the feeding track 120 to allow the feeding shuttle 130 to pass through the notch. The partition also includes a second partition extending from the upper edge of the notch toward the primary sealing cavity, a third partition extending from the side edge of the notch toward the primary sealing cavity, and a fourth partition blocking the front ends of the second and third partitions. The second, third, and fourth partitions, along with the underlying substrate 800, form a seal for sealing the feeding track 120. The components form the second feeding sealed cavity 620. The first partition forms the front wall 611 of the first feeding sealed cavity, the second partition forms the top wall 621 of the second feeding sealed cavity, and the third partition forms the side wall 622 of the second feeding sealed cavity. The front wall 611 of the first feeding sealed cavity and the top wall 621 of the second feeding sealed cavity form a stepped portion. Preferably, the first material outlet 6211 is opened on the top wall 621 of the second feeding sealed cavity. At the same time, the first automatic door 630, the first power mechanism 640 and the first limiting block 650 are also arranged on the top wall 621 of the second feeding sealed cavity.

[0094] like Figures 1-3 As shown, in order to observe or maintain the material feeding area 100, an observation sealing door 6111 is provided on the front wall 611 of the first material feeding sealing cavity. When the material feeding linear vibrating track 110 or the material discharging shuttle 130 malfunctions or the whole machine is stacked or tilted, the fault can be detected by man in time, and subsequent maintenance and rectification can be guaranteed.

[0095] The unloading sealing cavity 700 has the same structure as the loading sealing cavity 600 and is symmetrically arranged on both sides of the primary sealing cavity. Therefore, the construction of the unloading sealing cavity 700 will not be described in detail again.

[0096] The working process of the electronic component translational testing and sorting machine in this invention is as follows:

[0097] The operator places the feeding tube 410 containing electronic components at the feeding position. The electronic components are blown into the feeding linear vibrating track 110 by air blowing, and move to the end of the track under the combined action of air blowing and the vibration of the track 110. The first NPN robot 140 transports the electronic components from the end of the track 110 to the unloading shuttle 130. The unloading shuttle 130 moves on the unloading track 120 to the first dispensing port 6211. At this time, the first automatic door 630 is activated by the cylinder. Under the action of the cylinder, the first robotic arm 210 takes the electronic components from the feeding shuttle 130 through the first feeding port 6211. The first automatic door 630 then closes under the action of the cylinder, and the feeding shuttle 130 returns to the feeding end of the turntable to continue receiving materials. After the first robotic arm 210 places the electronic components taken from the feeding shuttle 130 into the preheating plate 220 for preheating, the first robotic arm 210 then places the preheated electronic components into the feeding shuttle 250. The feeding shuttle 250 transports the electronic components to the testing mechanism 23 along the feeding track 240. At position 0, the third robotic arm removes the electronic components from the feed shuttle 250 and places them into the testing mechanism 230 for testing. Tested electronic components are placed into the discharge shuttle 270. Electronic components that fail the test are transported via the discharge shuttle 270 to the manual receiving tube 280 by the fourth robotic arm 340. Tested electronic components are transported by the discharge shuttle 270 along the discharge track 260 to a position near the unloading area 300. At this time, the unloading shuttle 330 is located at the second feeding port, and the fourth robotic arm... The robotic arm 340 transports the electronic components in the discharge shuttle 270 to the discharge shuttle 330 through the second feeding port. The discharge shuttle 330 moves on the second discharge track 320 to the front end near the first discharge track 310. The second NPN robotic arm 350 transports the electronic components in the discharge shuttle 330 to the first discharge track 310. Through the combined action of air blowing and the vibration of the first discharge track 310, the electronic components enter the discharge tube 420 through the first discharge track 310 and are discharged under the action of air blowing.

[0098] The above description is merely a specific embodiment of the invention, but the scope of protection of the invention is not limited thereto. Those skilled in the art should understand that the invention includes, but is not limited to, the contents described in the accompanying drawings and the specific embodiments above. Any modifications that do not depart from the functional and structural principles of the invention will be included within the scope of the claims.

Claims

1. An electronic component translational testing and sorting machine, featuring low-temperature testing of electronic components, the sorting machine comprising a material pipe, a feeding and conveying area, a testing area, and a discharging and conveying area, wherein the material pipe includes a feeding pipe for feeding and a discharging pipe for discharging, characterized in that, The sorting machine further includes a primary sealed chamber and a secondary sealed chamber, both filled with dry gas. The testing area is located within the primary sealed chamber, enabling low-temperature testing of the electronic components. The feeding and discharging areas are located within the secondary sealed chamber. The primary and secondary sealed chambers, as well as the material pipe and the secondary sealed chamber, are interconnected to receive the electronic components. The cooperation between the primary and secondary sealed chambers prevents condensation on the electronic components in the relatively low-temperature testing area and the relatively high-temperature feeding and discharging areas. A material inlet is provided between the primary sealing cavity and the secondary sealing cavity, and the electronic components are transferred between the primary sealing cavity and the secondary sealing cavity through the material inlet. The material inlet is equipped with an automatic door and a power mechanism, and the power mechanism controls the opening and closing of the automatic door to realize the opening and closing of the material inlet. The secondary sealing cavity includes a feeding sealing cavity, and the material receiving port includes a first material receiving port opened between the feeding sealing cavity and the primary sealing cavity. The feeding and conveying area is located inside the feeding sealing cavity. The feeding and conveying area is provided with a feeding linear vibration track, a discharging track, and a discharging shuttle. The feeding linear vibration track is connected to the feeding tube and receives the electronic components in the feeding tube. The discharging track is located at one end of the feeding linear vibration track away from the feeding tube. The discharging shuttle reciprocates on the discharging track to transport the electronic components on the feeding linear vibration track to the first material receiving port, and the electronic components in the discharging shuttle are transported to the test area through the first material receiving port. The feeding sealing cavity includes a first feeding sealing cavity and a second feeding sealing cavity that are connected. The end of the feeding track away from the feeding linear vibration track is placed in the second feeding sealing cavity. The first material outlet is opened on the side wall and / or top wall of the second feeding sealing cavity. The electronic component is either a leaded electronic component or a leadless electronic component.

2. The electronic component translational testing and sorting machine according to claim 1, characterized in that, The feeding area is also equipped with a limit block that restricts the stroke of the power mechanism.

3. The electronic component translational testing and sorting machine according to any one of claims 1 to 2, characterized in that, The testing area is equipped with a preheating plate and a testing mechanism. The preheating plate preheats the electronic components in the receiving area, and the preheated electronic components are then transported to the testing mechanism for testing.

4. The electronic component translational testing and sorting machine according to any one of claims 1 to 2, characterized in that, The secondary sealing cavity further includes a discharge sealing cavity, and the material inlet further includes a second material inlet located between the discharge sealing cavity and the primary sealing cavity. The discharge conveying area is located within the discharge sealing cavity. The electronic components of the test area are transported to the discharge conveying area through the second material inlet. The discharge conveying area is provided with a first discharge track, a second discharge track, and a discharge shuttle. The discharge tube is connected to the first discharge track and receives the electronic components in the first discharge track. The second discharge track is located on the side of the first discharge track away from the discharge tube. The discharge shuttle reciprocates on the second discharge track to transport the electronic components from the second material inlet to the first discharge track.

5. The electronic component translational testing and sorting machine according to claim 4, characterized in that, The material feeding sealing cavity includes a first material feeding sealing cavity and a second material feeding sealing cavity that are connected. The end of the second material feeding track away from the first material feeding track is placed in the second material feeding sealing cavity. The second material receiving port is opened on the side wall and / or top wall of the second material feeding sealing cavity.

6. The electronic component translational testing and sorting machine according to any one of claims 1 to 2 and 5, characterized in that, A through hole is formed in the wall of the secondary sealing cavity, and the material tube communicates with the secondary sealing cavity through the through hole.

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