Method of forming a semiconductor structure and semiconductor structure
CN114078777BActive Publication Date: 2026-08-28CHANGXIN MEMORY TECH INC
Patent Information
- Application Number
- CN202010814732.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-08-13
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2040-08-13
AI Technical Summary
Technical Problem
[0003]然而发明人发现:形成双面电容的过程中,若形成的双面电容的深宽比较大,在刻蚀形成空心电容柱的过程中,电容结构不稳定,容易出现倒塌的现象,且双面电容的内层电容存在电性不稳定的情况,从而影响半导体结构的良率
Benefits of technology
[0006]与现有技术形成双面电容的方式相比,本发明实施例通过在半导体基底上先形成稳定的支撑结构,基于稳定的支撑结构形成柱状结构的电容结构;由于具有稳定的支撑结构,形成的柱状电容的高度相比于双面电容有极大的提高,即柱状电容具有更大的深宽比;且在形成柱状电容的过程中,不需要刻蚀形成高深宽比的电容孔,工艺步骤更加简单,节约成本;由于不需要刻蚀形成高深宽比的电容孔,还保证了形成的电容结构的稳定性;另外,柱状电容相比于双面电容,避免了双面电容的内层电容存在典型不稳定的情况,从而提高了半导体结构的良率。
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Abstract
The application provides a semiconductor structure forming method and a semiconductor structure. The semiconductor structure forming method comprises the following steps: providing a semiconductor substrate, wherein the semiconductor substrate comprises at least a discrete conductive layer; forming discrete support structures on the semiconductor substrate, the bottom of the support structure comprises a bottom conductive layer, and the support structures comprise a capacitor opening, and the bottom conductive layer is electrically connected with the conductive layer; forming a lower electrode on the sidewall of the support structure, and the lower electrode is electrically connected with the bottom conductive layer; forming a capacitor dielectric layer covering the top of the support structure, the sidewall of the lower electrode and the bottom of the capacitor opening; and forming an upper electrode covering the capacitor dielectric layer to form a capacitor structure. The application forms a stable support structure to form a stable columnar capacitor, improves the aspect ratio of the formed capacitor structure, and the formed capacitor structure is stable and not easy to collapse, thereby improving the yield of the semiconductor structure.
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Citation Information
Patent Citations
Capacitor and forming method thereof, and semiconductor device and forming method thereof
CN110957303A
Capacitor and method for fabricating the same, and semiconductor device and method for fabricating the same
US20020102791A1