Chip testing method and device

Abstract

The present invention provides a chip testing method, which is executed on a data server storing a test parameter package, including: obtaining an updated test parameter input by a user, querying in the test parameter package whether there is a historical test parameter corresponding to the updated test parameter; when the test parameter package has the corresponding historical test parameter, storing the updated test parameter and recording the version of the updated test parameter; when the test parameter package does not have the corresponding historical test parameter, storing the updated test parameter, and sending an update notification to a test server executing a test program, so that the test server obtains the updated test program corresponding to the updated test parameter. The chip testing method and device provided by the present invention can decouple the test parameters from the test program itself. When no new functional modules and test methods are added, the test parameters are updated separately without upgrading the test program, thereby reducing the manpower and time required for the maintenance process.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a chip testing method and device. Background Art

[0002] During the chip testing process, the setting of test parameters is to use corner chips with different process corners for characteristic testing, so as to obtain the characteristic features of different functional modules (IP) of the overall product. Based on the collected characteristic features, test parameters that can represent the characteristics of each functional module are selected and set in the test program. In this way, it can be ensured that the chips with normal functional modules pass, and the chips with abnormal functions can be screened out. The current common test parameter setting method is to set the test parameters directly in the test program. During the test process, test engineers of different functional modules will collect characteristic test data of different functional modules and update the test parameters in the tests of each functional module. After collecting the updated test parameters, the test programs of each functional module will be integrated to make a new version of the test program.

[0003] In the process of implementing the present invention, the inventors found that there are at least the following technical problems in the prior art:

[0004] During the testing process, a large amount of test data will be obtained. During the testing process, the test parameters need to be adjusted according to the test data. Since the test parameters are set in the test program, the update of the test parameters will be accompanied by the upgrade of the test program. Therefore, the test program will be frequently upgraded during the testing process, and a lot of manpower and time will be required during the maintenance process. Summary of the invention

[0005] The chip testing method and device provided by the present invention can decouple the test parameters from the test program itself. When no new functional modules and test methods are added, the test parameters are updated separately without upgrading the test program, thereby reducing the manpower and time required for the maintenance process.

[0006] In a first aspect, the present invention provides a chip testing method, which is executed on a data server storing a test parameter package, comprising:

[0007] Acquire the updated test parameters input by the user, and query whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0008] When the test parameter package has corresponding historical test parameters, storing the updated test parameters and updating the test parameter package version;

[0009] When the test parameter package does not have corresponding historical test parameters, the updated test parameters are stored and the test parameter package version is updated, and an update notification is sent to the test server that executes the test program, so that the test server obtains the updated test program corresponding to the updated test parameters.

[0010] Optionally, it also includes:

[0011] Receive a data download request sent by the test server, and send a corresponding test parameter package to the test server.

[0012] Optionally, querying whether there is a historical test parameter corresponding to the updated test parameter in the test parameter package includes:

[0013] Acquire attribute information of the update test parameter, the attribute information including a function module field and a test method field;

[0014] When the test parameter package has at least one first historical test data, determining that the test parameter package has corresponding historical test parameters; the attribute information of the first historical test data is the same as the attribute information of the update test parameter;

[0015] When the test parameter package does not include the first historical test data, it is determined that the test parameter package does not include the corresponding historical test parameter.

[0016] Optionally, it also includes:

[0017] A version switching request of the user is obtained, and the corresponding historical test parameter is switched to an available state according to the version switching request.

[0018] In a second aspect, the present invention provides a chip testing method executed on a testing server, comprising:

[0019] When initializing the test program, determine whether an update notification sent by the data server is currently received;

[0020] When receiving the update notification sent by the data server, the test server obtains the update test program corresponding to the update test parameters in response to the update notification, so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0021] When no update notification is received from the data server, the current test program is kept unchanged.

[0022] Optionally, it also includes:

[0023] In response to a test request sent by a user and when initializing a test program, sending a data download request to the data server;

[0024] A test parameter package sent by a data server is received and a test program is executed based on the test parameter package to complete the test of the functional module.

[0025] In a third aspect, the present invention provides a chip testing method, comprising:

[0026] The control data server obtains the updated test parameters input by the user, and queries whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0027] When the test parameter package does not have the corresponding historical test parameters, the control data server stores the updated test parameters and updates the test parameter package version, and sends an update notification to the test server executing the test program;

[0028] Control the test server to receive the update notification, and obtain the update test program corresponding to the update test parameters in response to the update notification; so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0029] When the test parameter package has corresponding historical test parameters, the control data server stores the updated test parameters and updates the test parameter package version.

[0030] Optionally, it also includes:

[0031] Controlling the test server to respond to the test request sent by the user and sending a data download request to the data server when initializing the test program;

[0032] Controlling the data server to receive the data download request sent by the test server, and sending a corresponding test parameter package to the test server;

[0033] The test server is controlled to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

[0034] In a fourth aspect, the present invention provides a chip testing device, which is applied to a data server storing a test parameter package, comprising:

[0035] An acquisition module, used for acquiring the updated test parameters input by the user, and querying whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0036] A first response module, configured to store the updated test parameters and update the test parameter package version when the test parameter package has corresponding historical test parameters;

[0037] The second response module is used to store the updated test parameters and update the test parameter package version when the test parameter package does not have the corresponding historical test parameters, and send an update notification to the test server that executes the test program so that the test server obtains the updated test program corresponding to the updated test parameters.

[0038] Optionally, it also includes:

[0039] The data sending module is used to receive a data download request sent by the test server and send a corresponding test parameter package to the test server.

[0040] Optionally, the acquisition module includes:

[0041] An attribute extraction unit, used to obtain attribute information of the update test parameter, wherein the attribute information includes a function module field and a test method field;

[0042] A first judgment unit is used to determine that the test parameter package has corresponding historical test parameters when the test parameter package has at least one first historical test data; the attribute information of the first historical test data is the same as the attribute information of the update test parameter;

[0043] The second judgment unit is used to determine that the test parameter package does not have the corresponding historical test parameter when the test parameter package does not have the first historical test data.

[0044] Optionally, it also includes:

[0045] The version switching module is used to obtain a version switching request from a user, and switch the corresponding historical test parameters to an available state according to the version switching request.

[0046] In a fifth aspect, the present invention provides a chip testing device, which is applied to a testing server, comprising:

[0047] A judgment module, used to judge whether an update notification sent by a data server is currently received when the test program is initialized;

[0048] A program update module, for, when receiving an update notification sent by the data server, responding to the update notification to obtain an update test program corresponding to the update test parameters; so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0049] The program maintaining module is used to maintain the current test program unchanged when no update notification sent by the data server is received.

[0050] Optionally, it also includes:

[0051] A download request module, used to respond to a test request sent by a user and send a data download request to the data server when initializing the test program;

[0052] The data receiving module is used to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

[0053] In a sixth aspect, the present invention provides a chip testing device, comprising:

[0054] A status query module, used to control the data server to obtain the updated test parameters input by the user, and query whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0055] A notification sending module, used for controlling the data server to store the updated test parameters and update the test parameter package version when the test parameter package does not have the corresponding historical test parameters, and sending an update notification to the test server executing the test program;

[0056] A notification response module, used to control the test server to receive the update notification, and to respond to the update notification to obtain an update test program corresponding to the update test parameters; so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0057] The data updating module is used to control the data server to store the updated test parameters and update the version of the test parameter package when the test parameter package has corresponding historical test parameters.

[0058] Optionally, it also includes:

[0059] A test request module, used to control the test server to respond to the test request sent by the user and to send a data download request to the data server when initializing the test program;

[0060] A request response module, used to control the data server to receive the data download request sent by the test server, and send a corresponding test parameter package to the test server;

[0061] The test execution module controls the test server to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

[0062] In the technical solution provided by the present invention, the test parameter package is stored in a data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional module or test method is added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0063] Figure 1 This is a flow chart of a chip testing method according to an embodiment of the present invention;

[0064] Figure 2 A flowchart of historical test parameter matching judgment of a chip test method according to another embodiment of the present invention;

[0065] Figure 3 A flowchart of a chip testing method according to another embodiment of the present invention;

[0066] Figure 4 A parameter loading flow chart of a chip testing method according to another embodiment of the present invention;

[0067] Figure 5 A flowchart of a chip testing method according to another embodiment of the present invention;

[0068] Figure 6 A parameter loading flow chart of a chip testing method according to another embodiment of the present invention;

[0069] Figure 7 A schematic diagram of a chip testing device according to an embodiment of the present invention;

[0070] Figure 8 A schematic diagram of an acquisition module in a chip testing device according to an embodiment of the present invention;

[0071] Fig. 9 A schematic diagram of a chip testing device according to an embodiment of the present invention;

[0072] Fig.10 A schematic diagram of a chip testing device with a parameter loading function according to an embodiment of the present invention;

[0073] Fig.11 A schematic diagram of a chip testing device according to an embodiment of the present invention;

[0074] Fig.12 It is a schematic diagram of a chip testing device with a parameter loading function according to an embodiment of the present invention. DETAILED DESCRIPTION

[0075] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0076] The embodiment of the present invention provides a chip testing method, which is executed on a data server storing a test parameter package, such as Figure 1 As shown, including:

[0077] Step 110, obtaining the updated test parameters input by the user, and querying whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0078] In some embodiments, updating test parameters refers to adding test parameters in subsequent tests of a specific functional module after collecting process corner characteristic test data of the functional module. Subsequently, the test data packet is queried to see whether there are corresponding historical test parameters. If there are corresponding historical parameters, it indicates that the updated test parameters are updates to parameters in an existing functional module and test method. If there are no corresponding historical test parameters, it indicates that the updated test parameters are test parameters corresponding to a newly added functional module or test parameters of a newly added test method.

[0079] Step 121, when the test parameter package has corresponding historical test parameters, the updated test parameters are stored and the test parameter package version is updated;

[0080] In some embodiments, when corresponding historical test parameters are available, it indicates that the updated test parameters are test parameters updated for existing functional modules and test methods. Therefore, in this step, the updated test parameters are saved and the test parameter package version is updated. At the same time, the historical test parameters should be kept saved to facilitate switching of the test data package version in subsequent testing processes.

[0081] Step 122, when the test parameter package does not have the corresponding historical test parameters, the updated test parameters are stored and the test parameter package version is updated, and an update notification is sent to the test server that executes the test program, so that the test server obtains the updated test program corresponding to the updated test parameters.

[0082] In some embodiments, when the corresponding historical test parameters are not available, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated. At the same time, the updated test parameters will be stored and the version of the test parameter package will be updated.

[0083] In the technical solution provided by this embodiment, the test parameter package is stored in the data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional modules or test methods are added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods.

[0084] As an optional implementation, the chip testing method further includes:

[0085] Receive a data download request sent by the test server, and send a corresponding test parameter package to the test server. In some embodiments, whenever the test server tests the chip, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs the test based on the latest test parameters.

[0086] As an optional implementation, Figure 2 As shown, in step 110, querying in the test parameter package whether there is a historical test parameter corresponding to the updated test parameter includes:

[0087] Step 111, obtaining attribute information of the update test parameter, wherein the attribute information includes a function module field and a test method field;

[0088] In some embodiments, in the process of identifying the correspondence between the updated test parameters and the historical test parameters, since their parameter information is usually different, while their attribute information is always consistent, in this step, the attribute information is first identified to facilitate subsequent matching.

[0089] Step 112, when the test parameter package has at least one first historical test data, determining that the test parameter package has corresponding historical test parameters; the attribute information of the first historical test data is the same as the attribute information of the update test parameter;

[0090] In some embodiments, when the attribute information is the same, it indicates that the historical test parameters and the updated test parameters are parameters for testing the same functional module and the same test method, and therefore, it indicates that there is a corresponding relationship between the historical test parameters and the updated test parameters.

[0091] Step 113: When the test parameter package does not contain the first historical test data, determine that the test parameter package does not contain the corresponding historical test parameter.

[0092] In some embodiments, when the attribute information is different, it indicates that the updated test parameters and the historical test parameters are for different functional modules or different test methods, and therefore, it indicates that there is no corresponding relationship between the historical test parameters and the updated test parameters.

[0093] In this embodiment, the same attribute information between the historical test parameters and the updated test parameters is extracted, and the attribute information is used as the basis for determining the corresponding relationship, so that the determination result of the corresponding relationship can be obtained simply and accurately.

[0094] As an optional implementation, the chip testing method further includes:

[0095] Obtain the user's version switching request, and switch the corresponding historical test parameters to an available state according to the version switching request. In some embodiments, since historical test parameters are more optimal during the testing process of some functional modules, in this embodiment, the historical test parameters are reused by switching the version.

[0096] The embodiment of the present invention also provides a chip testing method, which is executed on a test server, such as Figure 3 As shown, including:

[0097] Step 210, when initializing the test program, determining whether an update notification sent by the data server is currently received;

[0098] In some embodiments, the judgment process in this step refers to a judgment process that is continuously executed when the test process is not executed. Since the test data packet may send an update notification at any time, the judgment process can be continuously executed. Continuously executing the judgment process means judging whether an update notification is received at a predetermined time interval. For example, judging once every 1 second, or once every 5 seconds.

[0099] Step 221, when receiving the update notification sent by the data server, and responding to the update notification, obtaining the update test program corresponding to the update test parameters; so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0100] In some embodiments, when an update notification is received, it indicates that the current updated test parameters in the data server do not have corresponding historical test parameters. When there are no corresponding historical test parameters, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated.

[0101] Step 222: When no update notification is received from the data server, the current test program is kept unchanged.

[0102] In some embodiments, when there are corresponding historical test parameters, it indicates that the updated test parameters are test parameters updated for existing functional modules and test methods. Therefore, in this step, the data server saves the updated test parameters and records their versions. At the same time, the saved state of the historical test parameters should be maintained to facilitate switching the version of the test data package in the subsequent test process. The test server keeps the current test program unchanged.

[0103] In the technical solution provided by this embodiment, the test parameter package is stored in the data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional modules or test methods are added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods.

[0104] As an optional implementation, Figure 4 As shown, the chip testing method also includes:

[0105] Step 230, responding to the test request sent by the user and sending a data download request to the data server when initializing the test program;

[0106] In some embodiments, whenever the test server initializes the test program, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs testing based on the latest test parameters.

[0107] Step 240, receiving the test parameter package sent by the data server and executing the test program based on the test parameter package to complete the test of the functional module.

[0108] In some embodiments, after the test server receives the test parameter package, it obtains the latest test parameters. At this time, the test program is executed based on the latest test parameters to obtain the test results of the latest test requirements of the functional module.

[0109] In this embodiment, the test server sends a request to the data server to obtain the latest test parameter package and then executes the test program, which can ensure that the test program is tested based on the latest test parameters, that is, ensure that the test results are in accordance with the latest test requirements.

[0110] The present invention also provides a chip testing method, such as Figure 5 As shown, including:

[0111] Step 310, controlling the data server to obtain the updated test parameters input by the user, and querying whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0112] In some embodiments, updating test parameters refers to adding test parameters in subsequent tests of a specific functional module after collecting process corner characteristic test data of the functional module. Subsequently, the test data packet is queried to see whether there are corresponding historical test parameters. If there are corresponding historical parameters, it indicates that the updated test parameters are updates to parameters in an existing functional module and test method. If there are no corresponding historical test parameters, it indicates that the updated test parameters are test parameters corresponding to a newly added functional module or test parameters of a newly added test method.

[0113] Step 321, when the test parameter package does not have the corresponding historical test parameters, the control data server stores the updated test parameters and updates the test parameter package version, and sends an update notification to the test server executing the test program;

[0114] In some embodiments, when the corresponding historical test parameters are not available, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated at the same time, so an update notification needs to be issued. At the same time, the updated test parameters will also be stored and the version of the test parameter package will be updated.

[0115] Step 3211, controlling the test server to receive the update notification, and obtaining an updated test program corresponding to the updated test parameters in response to the update notification; so that the test server can execute the updated test program based on the updated test parameters to complete the test of the functional module;

[0116] In some embodiments, when an update notification is received, it indicates that the current updated test parameters in the data server do not have corresponding historical test parameters. When there are no corresponding historical test parameters, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated.

[0117] Step 322: When the test parameter package has corresponding historical test parameters, the control data server stores the updated test parameters and updates the test parameter package version.

[0118] In some embodiments, when corresponding historical test parameters are available, it indicates that the updated test parameters are test parameters updated for existing functional modules and test methods. Therefore, in this step, the updated test parameters are saved and the test parameter package is updated. At the same time, the saved status of the historical test parameters should be maintained to facilitate switching of the version of the test data package in subsequent testing processes.

[0119] In the technical solution provided by this embodiment, the test parameter package is stored in the data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional modules or test methods are added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods.

[0120] As an optional implementation, Figure 6 As shown, the chip testing method also includes:

[0121] Step 330, controlling the test server to respond to the test request sent by the user and sending a data download request to the data server when initializing the test program;

[0122] In some embodiments, whenever the test server initializes the test program, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs testing based on the latest test parameters.

[0123] Step 340, controlling the data server to receive the data download request sent by the test server, and sending a corresponding test parameter package to the test server;

[0124] In some embodiments, whenever the test server tests the chip, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs the test based on the latest test parameters.

[0125] Step 350: Control the test server to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

[0126] In some embodiments, after the test server receives the test parameter package, it obtains the latest test parameters. At this time, the test program is executed based on the latest test parameters to obtain the test results of the latest test requirements of the functional module.

[0127] In this embodiment, the test server sends a request to the data server to obtain the latest test parameter package and then executes the test program, which can ensure that the test program is tested based on the latest test parameters, that is, ensure that the test results are in accordance with the latest test requirements.

[0128] The embodiment of the present invention also provides a chip testing device, which is applied to a data server storing a test parameter package, such as Figure 7 As shown, including:

[0129] An acquisition module, used for acquiring the updated test parameters input by the user, and querying whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0130] In some embodiments, updating test parameters refers to adding test parameters in subsequent tests of a specific functional module after collecting process corner characteristic test data of the functional module. Subsequently, the test data packet is queried to see whether there are corresponding historical test parameters. If there are corresponding historical parameters, it indicates that the updated test parameters are updates to parameters in an existing functional module and test method. If there are no corresponding historical test parameters, it indicates that the updated test parameters are test parameters corresponding to a newly added functional module or test parameters of a newly added test method.

[0131] A first response module, configured to store the updated test parameters and update the test parameter package version when the test parameter package has corresponding historical test parameters;

[0132] In some embodiments, when corresponding historical test parameters are available, it indicates that the updated test parameters are test parameters updated for existing functional modules and test methods. Therefore, in this step, the updated test parameters are saved and the test parameter package is updated. At the same time, the saved status of the historical test parameters should be maintained to facilitate switching of the version of the test data package in subsequent testing processes.

[0133] The second response module is used to store the updated test parameters and update the test parameter package version when the test parameter package does not have the corresponding historical test parameters, and send an update notification to the test server that executes the test program so that the test server obtains the updated test program corresponding to the updated test parameters.

[0134] In some embodiments, when the corresponding historical test parameters are not available, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated. At the same time, the updated test parameters will be stored and the version of the test parameter package will be updated.

[0135] In the technical solution provided by this embodiment, the test parameter package is stored in the data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional modules or test methods are added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods.

[0136] As an optional implementation, the chip testing device further includes:

[0137] The data sending module is used to receive the data download request sent by the test server and send the corresponding test parameter package to the test server. In some embodiments, whenever the test server tests the chip, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs the test based on the latest test parameters.

[0138] As an optional implementation, Figure 8 As shown, the acquisition module includes:

[0139] An attribute extraction unit, used to obtain attribute information of the update test parameter, wherein the attribute information includes a function module field and a test method field;

[0140] In some embodiments, in the process of identifying the correspondence between the updated test parameters and the historical test parameters, since their parameter information is usually different, while their attribute information is always consistent, in this step, the attribute information is first identified to facilitate subsequent matching.

[0141] A first judgment unit is used to determine that the test parameter package has corresponding historical test parameters when the test parameter package has at least one first historical test data; the attribute information of the first historical test data is the same as the attribute information of the update test parameter;

[0142] In some embodiments, when the attribute information is the same, it indicates that the historical test parameters and the updated test parameters are parameters for testing the same functional module and the same test method, thus indicating that there is a corresponding relationship between the historical test parameters and the updated test parameters.

[0143] The second judgment unit is used to determine that the test parameter package does not have the corresponding historical test parameter when the test parameter package does not have the first historical test data.

[0144] In some embodiments, when the attribute information is different, it indicates that the updated test parameters and the historical test parameters are for different functional modules or different test methods, and therefore, it indicates that there is no corresponding relationship between the historical test parameters and the updated test parameters.

[0145] In this embodiment, the same attribute information between the historical test parameters and the updated test parameters is extracted, and the attribute information is used as the basis for determining the corresponding relationship, so that the determination result of the corresponding relationship can be obtained simply and accurately.

[0146] As an optional implementation, the chip testing device further includes:

[0147] The version switching module is used to obtain the user's version switching request and switch the corresponding historical test parameters to an available state according to the version switching request. In some embodiments, since historical test parameters are more optimal during the testing process of some functional modules, in this embodiment, the historical test parameters are reused by switching the version.

[0148] The embodiment of the present invention also provides a chip testing device, which is applied to a testing server, such as Fig. 9 As shown, including:

[0149] A judgment module, used to judge whether an update notification sent by a data server is currently received when the test program is initialized;

[0150] In some embodiments, the judgment process in this step refers to a judgment process that is continuously executed when the test process is not executed. Since the test data packet may send an update notification at any time, it is necessary to continuously execute the judgment process. Continuously executing the judgment process means judging whether an update notification is received at a predetermined time interval. For example, judging once every 1 second, or once every 5 seconds.

[0151] A program update module, for, when receiving an update notification sent by the data server, responding to the update notification to obtain an update test program corresponding to the update test parameters; so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0152] In some embodiments, when an update notification is received, it indicates that the current updated test parameters in the data server do not have corresponding historical test parameters. When there are no corresponding historical test parameters, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated.

[0153] The program maintaining module is used to maintain the current test program unchanged when no update notification sent by the data server is received.

[0154] In some embodiments, when there are corresponding historical test parameters, it indicates that the updated test parameters are test parameters updated for existing functional modules and test methods. Therefore, in this step, the data server saves the updated test parameters and records their versions. At the same time, the saved state of the historical test parameters should be maintained to facilitate switching the version of the test data package in the subsequent test process. The test server keeps the current test program unchanged.

[0155] In the technical solution provided by this embodiment, the test parameter package is stored in the data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional modules or test methods are added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods.

[0156] As an optional implementation, Fig.10 As shown, the chip testing device also includes:

[0157] A download request module, used to respond to a test request sent by a user and send a data download request to the data server when initializing the test program;

[0158] In some embodiments, whenever the test server initializes the test program, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs testing based on the latest test parameters.

[0159] The data receiving module is used to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

[0160] In some embodiments, after the test server receives the test parameter package, it obtains the latest test parameters. At this time, the test program is executed based on the latest test parameters to obtain the test results of the latest test requirements of the functional module.

[0161] In this embodiment, the test server sends a request to the data server to obtain the latest test parameter package and then executes the test program, which can ensure that the test program is tested based on the latest test parameters, that is, ensure that the test results are in accordance with the latest test requirements.

[0162] The embodiment of the present invention also provides a chip testing device, such as Fig.11 As shown, including:

[0163] A status query module, used to control the data server to obtain the updated test parameters input by the user, and query whether there are historical test parameters corresponding to the updated test parameters in the test parameter package;

[0164] In some embodiments, updating test parameters refers to adding test parameters in subsequent tests of a specific functional module after collecting process corner characteristic test data of the functional module. Subsequently, the test data packet is queried to see whether there are corresponding historical test parameters. If there are corresponding historical parameters, it indicates that the updated test parameters are updates to parameters in an existing functional module and test method. If there are no corresponding historical test parameters, it indicates that the updated test parameters are test parameters corresponding to a newly added functional module or test parameters of a newly added test method.

[0165] A notification sending module, used for controlling the data server to store the updated test parameters and update the test parameter package version when the test parameter package does not have the corresponding historical test parameters, and sending an update notification to the test server executing the test program;

[0166] In some embodiments, when the corresponding historical test parameters are not available, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated at the same time, so an update notification needs to be issued. At the same time, the updated test parameters will also be stored and the version of the test parameter package will be updated.

[0167] A notification response module, used to control the test server to receive the update notification, and to respond to the update notification to obtain an update test program corresponding to the update test parameters; so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module;

[0168] In some embodiments, when an update notification is received, it indicates that the current updated test parameters in the data server do not have corresponding historical test parameters. When there are no corresponding historical test parameters, it indicates that the corresponding functional module or test method has not been tested before, and the test program does not have a test program module executed based on the updated test parameters. Therefore, when it is detected that the test parameter package does not have the corresponding historical test parameters, the test program needs to be updated.

[0169] The data updating module is used to control the data server to store the updated test parameters and update the version of the test parameter package when the test parameter package has corresponding historical test parameters.

[0170] In some embodiments, when corresponding historical test parameters are available, it indicates that the updated test parameters are test parameters updated for existing functional modules and test methods. Therefore, in this step, the updated test parameters are saved and the test parameter package version is updated. At the same time, the saved status of the historical test parameters should be maintained to facilitate switching of the test data package version in subsequent testing processes.

[0171] In the technical solution provided by this embodiment, the test parameter package is stored in the data server, and the test program is executed on the test server, and the two are set independently. When the test parameter package is updated, if no new functional modules or test methods are added, it only involves the change of parameters, and there is no need to update the test program. When it comes to the change of functional modules or test methods, since there is no corresponding program module in the original test program to perform the corresponding parameter test, it is necessary to update the test program together to facilitate the testing of the changed functional modules and test methods.

[0172] As an optional implementation, Fig.12 As shown, the chip testing device also includes:

[0173] A test request module, used to control the test server to respond to the test request sent by the user and to send a data download request to the data server when initializing the test program;

[0174] In some embodiments, whenever the test server initializes the test program, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs testing based on the latest test parameters.

[0175] A request response module, used to control the data server to receive the data download request sent by the test server, and send a corresponding test parameter package to the test server;

[0176] In some embodiments, whenever the test server tests the chip, it first sends a data download request to the data server. After receiving the download request, the data server sends the latest test data packet to the test server to ensure that the test server performs the test based on the latest test parameters.

[0177] The test execution module controls the test server to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

[0178] In some embodiments, after the test server receives the test parameter package, it obtains the latest test parameters. At this time, the test program is executed based on the latest test parameters to obtain the test results of the latest test requirements of the functional module.

[0179] In this embodiment, the test server sends a request to the data server to obtain the latest test parameter package and then executes the test program, which can ensure that the test program is tested based on the latest test parameters, that is, ensure that the test results are in accordance with the latest test requirements.

[0180] Those skilled in the art can understand that all or part of the processes in the above method embodiments can be implemented by instructing related hardware through a computer program, and the program can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes in the above method embodiments. The storage medium can be a disk, an optical disk, a read-only memory (ROM) or a random access memory (RAM), etc.

[0181] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the present invention should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A chip testing method, characterized in that: Executed on a data server storing test parameter packages, including: Acquire the updated test parameters input by the user, and query whether there are historical test parameters with the same attribute information as the updated test parameters in the test parameter package, wherein the updated test parameters and the historical test parameters in the test parameter package both include parameter information and attribute information, and the attribute information includes a function module field and a test method field; When the test parameter package has at least one historical test parameter with the same attribute information as the updated test parameter, the updated test parameter is stored and the test parameter package version is updated, while the historical test parameters with the same attribute information as the updated test parameter continue to be saved. In the latest test parameter package, the updated test parameter is in an available state to ensure that the test is performed based on the latest test parameter, and the historical test parameters with the same attribute information as the updated test parameter become unavailable and are switched to available state when version switching is required; When the test parameter package does not have historical test parameters with the same attribute information as the updated test parameters, the updated test parameters are stored and the test parameter package version is updated, and an update notification is sent to the test server that executes the test program. The update notification is used to instruct the test server to update the test program so that the test server obtains the updated test program corresponding to the updated test parameters.

2. The chip testing method according to claim 1, characterized in that: Also includes: Receive a data download request sent by the test server, and send a corresponding test parameter package to the test server.

3. The chip testing method according to claim 1, characterized in that: Also includes: A version switching request of the user is obtained, and the corresponding historical test parameter is switched to an available state according to the version switching request.

4. A chip testing method, characterized in that: include: The control data server obtains the updated test parameters input by the user, and queries in the test parameter package whether there are historical test parameters with the same attribute information as the updated test parameters, wherein the updated test parameters and the historical test parameters in the test parameter package both include parameter information and attribute information, and the attribute information includes a function module field and a test method field; When the test parameter package does not have the same historical test parameters as the attribute information of the updated test parameters, the control data server stores the updated test parameters and updates the test parameter package version, and sends an update notification to the test server executing the test program, wherein the update notification is used to instruct the test server to update the test program; Controlling the test server to receive the update notification, responding to the update notification, and obtaining an update test program corresponding to the update test parameters, so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module; When the test parameter package has at least one historical test parameter with the same attribute information as the updated test parameter, the control data server stores the updated test parameter and updates the test parameter package version, while continuing to save the historical test parameters with the same attribute information as the updated test parameter. In the latest test parameter package, the updated test parameter is in an available state to ensure testing based on the latest test parameters. The historical test parameters with the same attribute information as the updated test parameter become unavailable and are switched to an available state when version switching is required.

5. The chip testing method according to claim 4, characterized in that: Also includes: Controlling the test server to respond to the test request sent by the user and sending a data download request to the data server when initializing the test program; Controlling the data server to receive the data download request sent by the test server, and sending a corresponding test parameter package to the test server; The test server is controlled to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

6. A chip testing device, characterized in that: Applicable to the data server storing the test parameter package, including: an acquisition module, used for acquiring the updated test parameters input by the user, and querying in the test parameter package whether there are historical test parameters with the same attribute information as the updated test parameters, wherein the updated test parameters and the historical test parameters in the test parameter package both include parameter information and attribute information, and the attribute information includes a function module field and a test method field; A first response module is used for storing the updated test parameters and updating the version of the test parameter package when the test parameter package has at least one historical test parameter with the same attribute information as the updated test parameter, while continuing to save the historical test parameters with the same attribute information as the updated test parameter, so that in the latest test parameter package, the updated test parameters are in an available state to ensure that the test is performed based on the latest test parameters, and the historical test parameters with the same attribute information as the updated test parameters become unavailable, and are switched to available state when version switching is required; The second response module is used to store the updated test parameters and update the test parameter package version when the test parameter package does not have the same historical test parameters as the attribute information of the updated test parameters, and send an update notification to the test server that executes the test program, wherein the update notification is used to instruct the test server to update the test program so that the test server obtains the updated test program corresponding to the updated test parameters.

7. The chip testing device according to claim 6, characterized in that: Also includes: The data sending module is used to receive a data download request sent by the test server and send a corresponding test parameter package to the test server.

8. The chip testing device according to claim 6, characterized in that: Also includes: The version switching module is used to obtain a version switching request from a user, and switch the corresponding historical test parameters to an available state according to the version switching request.

9. A chip testing device, characterized in that: include: A status query module, used to control the data server to obtain the updated test parameters input by the user, and query whether there are historical test parameters with the same attribute information as the updated test parameters in the test parameter package, wherein the updated test parameters and the historical test parameters in the test parameter package both include parameter information and attribute information, and the attribute information includes a function module field and a test method field; A notification sending module, used for, when the test parameter package does not have the same historical test parameters as the attribute information of the updated test parameters, controlling the data server to store the updated test parameters and update the version of the test parameter package, and sending an update notification to the test server executing the test program, wherein the update notification is used to instruct the test server to update the test program; A notification response module, used to control the test server to receive the update notification, respond to the update notification, and obtain an update test program corresponding to the update test parameters, so that the test server can execute the update test program based on the update test parameters to complete the test of the functional module; A data update module is used to control the data server to store the updated test parameters and update the test parameter package version when the test parameter package has at least one historical test parameter with the same attribute information as the updated test parameter, while continuing to save the historical test parameters with the same attribute information as the updated test parameter. In the latest test parameter package, the updated test parameters are in an available state to ensure testing based on the latest test parameters, and the historical test parameters with the same attribute information as the updated test parameters become unavailable and are switched to an available state when version switching is required.

10. The chip testing device according to claim 9, characterized in that: Also includes: A test request module, used to control the test server to respond to the test request sent by the user and to send a data download request to the data server when initializing the test program; A request response module, used to control the data server to receive the data download request sent by the test server, and send a corresponding test parameter package to the test server; The test execution module controls the test server to receive the test parameter package sent by the data server and execute the test program based on the test parameter package to complete the test of the functional module.

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