Test system

Abstract

A test system for testing a device under test in the air. The test system includes a test position for the device under test, a reflector facing the test position, and a measurement feed antenna pointing to the reflector, so as to establish a signal path between the measurement feed antenna and the test position through the reflector. The test system includes a locator for the device under test, which is capable of rotating the device under test to at least four different measurement positions of the device under test. The test system includes a second measurement antenna, and when the device under test is placed at the test position, the position of the second measurement antenna is offset from the center of a side surface of the device under test facing the second measurement antenna. A method for testing a device under test in the air is also disclosed.

Description

Technical Field

[0001] The present invention relates to a test system for testing a device under test (DUT) over-the-air (OTA). Background Art

[0002] In the prior art, it is known to test a device under test (DUT) with a test system having a test chamber in which the individual devices under test are placed for testing purposes. These test systems relate to so-called Compact Antenna Test Ranges (CATR) because even with a small test chamber size, the far-field characteristics of the device under test can be tested. Generally, the test system includes a feed antenna for testing the device under test, where the feed antenna receives a test signal that is converted into radio waves by the antenna and is used to test the device under test.

[0003] To fully test the characteristics of the device under test, it is also known to use a positioner and / or multiple antennas to test all different sides of the device under test. The positioner has to be a multi-axis positioner, but it is expensive, thus increasing the overall cost of the test system. In fact, so far, there are two different methods known to properly test the device under test, for example, a mobile device (such as a mobile phone) in frequency range 1 (FR1) or frequency range 2 (FR2).

[0004] These methods involve using multiple Direct Far-Field (DFF) antennas that are placed at the exact positions where the antenna modules of the device under test are located, thus ensuring that each direct far-field antenna communicates with one of the dedicated antenna modules in each individual antenna module. However, the direct far-field antennas have to be repositioned for each individual device, thus increasing the amount of work required to test the device under test. Alternatively, a single direct far-field antenna can be used with a complex positioner that can move the device under test along different axes to reach different measurement positions. However, this takes a lot of time, thus increasing the total cost of testing the device under test.

[0005] Therefore, there is a need for a simple and cost-effective method for over-the-air testing of a device under test. Summary of the Invention

[0006] The present invention provides a test system for over-the-air testing of a device under test. The test system includes a test position for the device under test, a reflector facing the test position, and a measurement feed antenna pointing at the reflector, thereby establishing a signal path between the measurement feed antenna and the test position through the reflector. The test system includes a positioner for the device under test that is capable of rotating the device under test to at least four different measurement positions. The test system includes a second measurement antenna that, when the device under test is placed in the test position, is positioned offset from the center of a side of the device under test facing the second antenna.

[0007] The present invention is based on the discovery that by measuring the interaction between a feeding antenna and a reflector, an indirect far-field characteristic can be established, wherein an additional measuring antenna, i.e., a second measuring antenna, is used for direct interaction with a device under test placed at a test position. In other words, the second measuring antenna is related to a direct far-field antenna because the second measuring antenna directly interacts with the device under test. Generally, when the device under test is placed at the test position, two antennas, i.e., a measuring feeding antenna and the second measuring antenna, at least partially cover different sides of the device under test, thereby reducing the overall workload of testing the device under test in the air. Since the position of the second measuring antenna is offset from the center of the side of the device under test facing the second measuring antenna, the corresponding position of the second measuring antenna is also offset from the measuring feeding antenna, which is usually oriented such that its central axis coincides with the central axis of the device under test, especially the center of the side of the device under test facing the second measuring antenna. In other words, the central axes of the device under test, the measuring feeding antenna, and / or the test position coincide with each other, while the central axis of the second measuring antenna is offset relative to the mutually coinciding central axes of the previously mentioned components of the test system.

[0008] The device under test may relate to a mobile phone, especially a mobile phone supporting 5G communication. For example, the device under test is related to a mobile device (such as a mobile phone) in frequency range 1 (FR1) or frequency range 2 (FR2).

[0009] The test system is enabled to test the device under test at at least four different measurement positions while rotating the device under test by means of a locator. Therefore, when the device under test is appropriately rotated, the device under test is converted into at least four different measurement positions by means of the locator. At each different measurement position, a specific side of the device under test faces the reflector, where the specific side is the side that is tested in the air by the measuring feeding antenna at each measurement position.

[0010] Generally, the measuring feeding antenna and the reflector together establish a quiet zone, especially an indirect quiet zone, while the second measuring antenna provides a second quiet zone, especially a direct far-field quiet zone. The second quiet zone may be located within the first quiet zone that has a larger size compared to the second quiet zone.

[0011] One aspect stipulates that in a top view of the test system, the centers of the measuring antenna and the test position are located on a common axis, where the position of the second measuring antenna is offset from the common axis. As described above, the respective central axes of the device under test, the test position, and / or the measuring feeding antenna coincide with each other, i.e., on the common axis, while the second measuring antenna is offset therefrom.

[0012] In other words, the second measurement antenna can be positioned offset from the line of sight between the measurement feed antenna and the test position. The line of sight corresponds to the minimum distance between the respective components (i.e., the measurement feed antenna and the test position). However, the line of sight may be blocked by certain objects (such as any shielding components), which ensure that electromagnetic waves do not interact directly between the measurement feed antenna and the device under test placed at the test position. In fact, the electromagnetic waves must be redirected to the reflector in order to be reflected to the measurement feed antenna or the device under test.

[0013] Typically, the test system is configured to test both the reception characteristics and the transmission characteristics of the device under test. Therefore, the electromagnetic waves used for testing can propagate in two directions such that they can be transmitted by the measurement feed antenna towards the device under test or by the device under test towards the measurement feed antenna.

[0014] Another aspect stipulates that the side of the device under test facing the second measurement antenna cannot be measured by means of the measurement feed antenna. In other words, the positioner cannot rotate the device under test such that the side of the device under test facing the second measurement antenna will face the reflector in order to receive electromagnetic waves from the reflector or transmit electromagnetic waves to the reflector.

[0015] Furthermore, the side of the device under test facing the measurement antenna can be perpendicular to the sides of the device under test that are measured by the measurement feed antenna at at least four different measurement positions of the device under test.

[0016] Therefore, the second measurement antenna has a radiation direction perpendicular to the signal path established between the reflector and the test position, in particular the device under test located at the test position.

[0017] Another aspect stipulates that the measurement feed antenna and the second measurement antenna together are configured to test the device under test with respect to 1.5 sides at a single measurement position established by the positioner. Since the position of the second measurement antenna is offset from the center of the respective side of the device under test facing the second measurement antenna, the quiet zone provided by the second measurement antenna (i.e., the second quiet zone) may cover only half of each side as it is smaller compared to the quiet zone provided by the measurement feed antenna and the reflector together.

[0018] As described above, the second quiet zone only covers a part of the respective side facing the second measurement antenna. However, the rotation of the device under test ensures that the second quiet zone covers several different parts of the respective side, with the entire side being fully covered. At different measurement positions, the parts covered by the second quiet zone can overlap each other.

[0019] In addition, the measurement feed antenna and the second measurement antenna together can be configured to test the device under test with respect to three sides at two different measurement positions established by the locator. The two different measurement positions relate to opposite directions of the device under test. Thus, the device under test has been flipped by 180 degrees to obtain the second of the two different measurement positions. Since the position of the second measurement antenna is offset from the center of the side facing the measurement antenna, the second measurement antenna covers the entire side at the two different measurement positions, provided that the two different measurement positions are related to the flipping direction of the device under test. The measurement feed antenna is assigned to two opposite sides of the device under test at the two different measurement positions, thus ensuring that the test system can fully test three different sides even when only two different measurement positions are used. Therefore, the total time required to test the device under test can be significantly reduced.

[0020] Therefore, the locator can be rotated along a single axis to rotate the device under test. Thus, a simple locator can be used, which is also cost-effective, thereby reducing the total cost of the test system.

[0021] Another aspect provides that at least four different measurement positions of the device under test are associated with at least four different sides of the device under test that are perpendicular to each other. Thus, four different measurement positions of the device under test are associated with rotating or turning the device under test by 90 degrees between the respective measurement positions, thereby ensuring that one of the four circumferential sides of the device under test faces the reflector for testing purposes. The four circumferential sides of the device under test together form the envelope surface of the device under test.

[0022] Therefore, the device under test can be measured with respect to five different sides or regions out of a total of six sides or regions. Generally, one of the six sides or rather regions of the device under test is less interesting or even irrelevant for the corresponding air measurement aimed at calibrating the device under test, since the antenna (module) to be tested is not located on that particular side / region.

[0023] In fact, at least four different sides of the device under test can involve the front side of the device under test, the back side of the device under test, and at least two opposite lateral sides of the device under test, with the two lateral sides being incorporated into the front side and the back side respectively. Therefore, the envelope surface of the device under test is tested through at least four different measurement positions reached by the single-axis locator. At the same time, even if the position of the second measurement antenna deviates from the center of the corresponding side, the entire front side (also known as the front side or end face) of the device under test can be fully measured by the second measurement antenna at the four measurement positions. Since the device under test rotates by at least 90° between different measurement positions for performing the corresponding measurements, it is ensured that the second measurement antenna covers the entire front side of the device under test facing the second measurement antenna. Generally, flipping the device under test by 180° can already ensure that the second measurement antenna covers the entire front side of the device under test. In other words, the second quiet zone provided by the second measurement antenna is applied multiple times to different parts of the front side of the device under test facing the second measurement antenna, thus ensuring that the entire front side is covered by the second measurement antenna.

[0024] Generally speaking, the locator can be configured to continuously rotate the device under test, such that several intermediate positions between the four main measurement positions can be used to perform measurements, where the main measurement positions are related to a 90° rotation of the device under test.

[0025] The test system can be configured to test five different sides of the device under test that are perpendicular to each other. As described above, the four sides measured by using the locator can be perpendicular to each other, and the side facing the second measurement antenna is also perpendicular to all these sides, thus ensuring that the five different sides of the device under test are perpendicular to each other.

[0026] In fact, at least 80% of the entire surface of the device under test can be tested by using four different measurement positions and a defined test system, where the position of the second measurement antenna of the system deviates.

[0027] Another aspect stipulates that the test system includes a measurement device having a signal generator and / or a signal analyzer. As described above, the test system can generally be used to test the receiving characteristics and the transmitting characteristics of the device under test. Therefore, a signal can be generated by means of the signal generator, and the generated signal output by the signal generator is used to test the receiving characteristics of the device under test. The device under test can be connected to the signal analyzer. Alternatively, the device under test has an internal analysis module for analysis purposes. Alternatively, the device under test generates a signal that is received by the measurement feed antenna and forwarded to the measurement device, i.e., the signal analyzer, for analyzing the received signal in order to test the transmitting characteristics of the device under test.

[0028] According to another aspect, a plurality of offset antennas with different positions are provided. The plurality of offset antennas, especially a plurality of direct far-field antennas, can be used to cover a larger or wider device under test. By using a plurality of offset antennas, the accuracy, coverage, and / or error compensation can be improved. Generally, the plurality of offset antennas correspond to a plurality of second measurement antennas with different positions. Together, the plurality of offset antennas can cover half of the corresponding sides facing the second measurement antenna. Moreover, the plurality of offset antennas can be arranged asymmetrically to compensate for the spatial requirements of the direct far-field antenna.

[0029] In addition, the plurality of offset antennas can face opposite sides of the device under test, that is, the two front sides of the device under test. Therefore, all sides of the device under test can be tested at four different measurement positions, especially due to the flipping of the device under test when using the locator.

[0030] A quiet zone can be established by the measurement feed antenna together with the reflector, where the test position is located within the quiet zone. Since the device under test is located at the test position, the device under test is also located within the quiet zone to ensure accurate measurement conditions.

[0031] The quiet zone established by the measurement feed antenna together with the reflector corresponds to an indirect far-field quiet zone (IFF quiet zone), while the second measurement antenna provides a direct far-field quiet zone (DFF quiet zone). The IFF quiet zone covers the entire device under test, so a complete test is performed on one side facing the reflector, while the DFF quiet zone only covers a certain part of the device under test, especially the side facing the second measurement antenna.

[0032] Another aspect provides that the test system includes at least one device under test held at the test position by a locator. In fact, the locator defines the test position because the locator provides the position of the device under test, and for test purposes, the device under test should be placed at this position. The device under test can be fixed to the locator at the test position so that the device under test is firmly fixed by the locator during different measurement processes. This ensures that the device under test can be rotated without the risk of losing the device under test.

[0033] In addition, a plurality of devices under test can be placed at the test position. Multiple devices under test are placed in the respective quiet zones established by the measurement feed antenna and the reflector. When the measurement feed antenna and the second measurement antenna are used simultaneously, multiple devices under test can be tested sequentially.

[0034] Therefore, the total time required to test multiple devices under test can be greatly reduced.

[0035] In addition, the second measurement antenna can be connected to the locator, especially to the locator used to rotate the device under test.

[0036] The second measurement antenna can be a direct far - field antenna that provides far - field conditions directly at the test position, meaning without any reflectors. However, compared to the quiet zone established by the measurement feed antenna and the reflector together, the quiet zone (i.e., the second quiet zone) provided by the second measurement antenna is reduced in size.

[0037] Generally, a test system can be established through a Compact Antenna Test Range (CATR) extended by the second measurement antenna. The test range of a compact antenna is typically characterized by the indirect far - field conditions provided in a test chamber that contains the test position where the device under test is located. Thus, the test range of the compact antenna is extended by the second measurement antenna, which is established by a far - field antenna directly facing the device under test for testing purposes.

[0038] The present invention also provides a method for testing a device under test in the air, which method comprises the following steps:

[0039] Provide the device under test;

[0040] Provide a test system for testing the device under test in the air, wherein the test system includes a locator for the device under test, a test position for the device under test, a reflector facing the test position, and a measurement feed antenna pointing to the reflector, thereby establishing a signal path between the measurement feed antenna and the test position through the reflector, and wherein the test system includes a second measurement antenna whose position is offset from the measurement feed antenna;

[0041] Place the device under test at the test position with one side of the device under test facing the second measurement antenna; and

[0042] Conduct an in - air measurement, wherein at least in part, two different sides of the device under test are tested simultaneously by means of the measurement feed antenna and the second measurement antenna.

[0043] In fact, the same aspects and advantages of the above - mentioned test system also apply to the method in a similar manner.

[0044] The above - mentioned test system can generally be used to perform the method of testing a device under test in the air. In addition, the method of testing a device under test in the air can use the test system as described above.

[0045] One aspect stipulates that during the in - air measurement, the device under test rotates along a single axis, thereby subsequently testing multiple different sides of the device under test by means of the measurement feed antenna, wherein the second measurement antenna always faces the same side of the device under test. Thus, in addition to one side of the device under test, all sides of the device under test can be tested accordingly by the test system and method, thereby ensuring the overall characteristics of the device under test in a low - cost manner.

[0046] In addition, several devices under test can be located in the first quiet zone established by the measurement feed antenna and the reflector, i.e., the IFF quiet zone. By using the measurement feed antenna and the second measurement antenna, multiple devices under test can be tested sequentially. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] When considered in conjunction with the accompanying drawings, other aspects and advantages of the claimed subject matter will become more readily understood, as the claimed subject matter can be better understood, by reference to the following detailed description. In these drawings:

[0048] Figure 1 A test system according to the present invention is schematically illustrated;

[0049] Figure 2 is shown in a partially transparent manner Figure 1 of the test system;

[0050] Figure 3 shows Figure 2 the details of;

[0051] Figure 4 shows a top view of the test system in a first position;

[0052] Figure 5 shows a top view of the test system in a second position; and

[0053] Figure 6 shows an overview of the area of the device under test at at least four different measurement positions, the at least four different measurement positions being used by the test method of the device under test according to the present invention. DETAILED DESCRIPTION

[0054] The following detailed description, presented in conjunction with the accompanying drawings (where like reference numerals refer to like elements), is intended as a description of various embodiments of the disclosed subject matter and is not intended to represent only the embodiments. Each embodiment described in this disclosure is provided only as an example or illustration and should not be construed as preferred or advantageous over other embodiments. The illustrative examples provided herein are not intended to be exhaustive or to limit the claimed subject matter to the precise forms disclosed.

[0055] For the purposes of this disclosure, for example, the phrase "at least one of A, B, and C" means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B, and C), including all further possible permutations when more than three elements are listed. In other words, the term "at least one of A and B" generally refers to "A and / or B", i.e., A alone, B alone, or A and B.

[0056] In Figure 1In [description], a test system 10 is shown, which includes a test chamber 12 surrounded by a housing 14 and a lid 16, and the housing 14 and the lid 16 together define the space of the test chamber 12.

[0057] The test system 10 further includes an antenna assembly 18 connected to a connection interface 20 of the test chamber 12. The connection interface 20 is located at a wall 22 of the test chamber 12, which is part of the housing 14, particularly a side wall.

[0058] In Figure 2 the test system 10 is shown in a partially transparent manner because the housing 14 and the lid 16 are shown as partially transparent, thus providing an insight into the test chamber 12. Figure 1 In

[0059] In Figure 2 it is shown that a reflector 24 and a test position 26 are provided within the test chamber 12, which are surrounded by the housing 14 and the lid 16. The reflector 24 can be connected to the lid 16 such that when the lid 16 is placed on the housing 14, i.e., in the installed state of the test system 10, the reflector 24 is oriented in a defined manner.

[0060] Generally, a signal path is established between the antenna assembly 18 and the test position 26 via the reflector 24, where the antenna assembly 18 is located at the focal point of the reflector 24. The signal path is represented by the respective symbols in Figure 2 where signals can be exchanged in both directions in order to test the receiving characteristics and transmitting characteristics of the device under test located at the test position 26.

[0061] Generally, the antenna assembly 18 includes a measurement feed antenna 28, which together with the reflector 24 provides an indirect far-field condition at the test position 26.

[0062] In addition, a shielding member 30 is shown between the antenna assembly 18, particularly the measurement feed antenna 28, and the test position 26. The shielding member 30 ensures that the device under test located at the test position 26 only receives signals that have been reflected by the reflector 24 from the measurement feed antenna 28.

[0063] In a similar manner, the shielding member 30 also ensures that the device under test located at the test position 26 only transmits signals to the measurement feed antenna 28 via the reflector 24.

[0064] In addition, the test system 10 includes a second measurement antenna 32, which is located on a different side of the shielding member 30 relative to the measurement feed antenna 28, and the second measurement antenna 32 directly faces the test position 26.

[0065] The second measurement antenna 32 refers to a direct far - field (DFF) antenna that does not interact with the reflector 24 or any other reflector to provide far - field conditions at the test position 26, which will be described in more detail later.

[0066] In Figure 3 the antenna assembly 18 with the measurement feed antenna 28, the shielding member 30, the second measurement antenna 32, and the test position 26 is shown in more detail. It is obvious that the shielding member 30 is directly located between the antenna assembly 18, particularly the measurement feed antenna 28 and the test position 26, and the shielding member 30 also separates the measurement feed antenna 28 and the second measurement antenna 32.

[0067] Figure 4 and Figure 5 shows Figures 1 to 3 a top view of the test system 10 shown, further revealing that the position of the second measurement antenna 32 is offset from the measurement feed antenna 28.

[0068] In fact, as Figure 4 and Figure 5 shown, a common axis A is shown that is aligned with the respective central axes of the measurement antenna 28 and the test position 26 and the central axis of the device under test 34 located at the test position.

[0069] The position of the second measurement antenna 32 is offset from the common axis A.

[0070] Therefore, the position of the second measurement antenna 32 is offset from the line of sight between the measurement feed antenna 28 and the test position 26 corresponding to the common axis A.

[0071] As Figure 4 and 5 shown, the device under test 34 faces the second measurement antenna 32 through the side 36, which is the narrow side of the device under test 34. The position of the second measurement antenna 32 is offset from the center C of the side 36 of the device under test 34, where the center C is located on the common axis A.

[0072] Generally, the measurement feed antenna 28 together with the reflector 24 establishes a first quiet zone 38 associated with the test position 26.

[0073] In addition, the second measurement antenna 32 established by the direct far - field antenna establishes a second quiet zone 40, but the size of the second quiet zone 40 is relatively smaller than that of the first quiet zone 38.

[0074] As Figure 4 and 5 shown, the second quiet zone 40 only covers a part of the side 36 of the device under test 34 due to its smaller size, while the first quiet zone 38 completely covers the device under test 34.

[0075] However, inFigure 4 The measurement positions shown enable the test system 10 to cover more than one side of the device under test 34, as two different quiet zones 38, 40 associated with different sides of the device are provided. The different sides associated with the quiet zones 38, 40 are perpendicular to each other.

[0076] At Figure 4 the measurement positions shown, the measurement feed antenna 28 and the second measurement antenna 32 together enable testing of the device under test 34 with respect to 1.5 sides at the single measurement position shown. In fact, the second quiet zone 40 established by the second measurement antenna 32 covers half of one side of the device under test 34, i.e., half of side 36 facing the second measurement antenna 32, while the quiet zone 38 established by the measurement feed antenna 28 and the reflector 24 covers the entire rear side of the device under test 34.

[0077] Typically, the test system 10 also includes a locator 42 that provides the test position 26 on which the device under test 34 is placed. In other words, the device under test 34 is fixed to the locator 42 such that the locator 42 can rotate the device under test 34 within the first quiet zone 38 established by the measurement feed antenna 28 and the reflector 24.

[0078] At Figure 4 and 5 two different positions of the locator 42 are shown, which correspond to two different measurement positions of the device under test 34 as the device under test 34 is flipped 180°.

[0079] Thus, when the device under test 34 is oriented at Figure 4 and Figure 5 the different measurement positions shown, the second quiet zone 40 is associated with the entire (narrow) side 36 of the device under test 34.

[0080] In other words, the position of the second measurement antenna 32 is offset from the center C of the side 36 of the device under test 34 facing the second measurement antenna 32, and the measurement feed antenna 28 and the second measurement antenna 32 together can test the device under test 34 with respect to three different sides at Figure 4 and 5 the two different measurement positions shown. Thus, since both measurement positions correspond to a 180° flip of the device under test 34, side 36 can be completely covered by the small quiet zone 40 provided by the second measurement antenna 32.

[0081] At Figure 4 the measurement position shown, the first quiet zone 38 covers the entire back side of the device under test 34, while at Figure 5 the measurement position shown, the first quiet zone 38 covers the entire front side of the device under test 34.

[0082] In addition, at the measurement positions shown in Figure 4 the second quiet zone 40 covers at least the first half of the entire (narrow) side 36 of the device under test 34, while at the measurement positions shown in Figure 5 the second quiet zone 40 covers at least the second half of the entire (narrow) side 36 of the device under test 34. The coverage areas at the two measurement positions can at least partially overlap each other.

[0083] In Figure 6 an overview diagram is provided, which shows different sides of the device under test 34 located in the respective quiet zones 38, 40 established by the measurement feed antenna 28 and the reflector 24 and the second measurement antenna 32 respectively.

[0084] Figure 6 The upper diagram in Figure 6 illustrates four different sides measured through the first quiet zone 38 (i.e., the IFF quiet zone) when the first device under test 34 is rotated to four different measurement positions by the uniaxial positioner 42. In fact, the device under test 34 is rotated by 90° between the four different measurement positions shown in

[0085] Therefore, the entire envelope surface of the device under test 34 can be completely measured by means of the first quiet zone 38, where the first quiet zone 38 is established by the indirect far-field conditions provided at the test position 26.

[0086] Figure 6 The lower diagram in

[0087] illustrates the influence of the second quiet zone 40 on the (narrow) side 36 of the device under test 34 that faces the second measurement antenna 32. Figure 4 and Figure 5 the two measurement positions shown.

[0088] Therefore, the test system 10 is enabled to test five different sides of the device under test 34 that are perpendicular to each other, because Figure 6 the four different sides shown in the upper diagram of

[0089] are perpendicular to each other. Moreover, the (narrow) side 36 of the device under test 34 that faces the second measurement antenna 32 is also perpendicular to all the sides exposed to the IFF quiet zone 38.

[0090] Additionally, the test system 10 may include a measurement device 44 having a signal generator 46 and / or a signal analyzer 48. The measurement device 44 is generally used to provide signals for testing the device under test 34, or rather, to receive signals generated by the device under test 34. Thus, the receiving characteristics as well as the transmitting characteristics of the device under test 34 can be appropriately tested.

[0091] Furthermore, the test system 10 may include a plurality of second measurement antennas 32 that are positioned offset from the measurement feed antenna 28 in order to cover a larger area, thereby ensuring that the test system 10 can be used to test larger / wider devices under test 34. Additionally, a plurality of offset antennas, i.e., a plurality of second measurement antennas 32.

[0092] Furthermore, a plurality of devices under test 34 can be tested simultaneously, especially with respect to their lateral sides relative to the Figure 6 shown + / -90° measurement positions.

[0093] Generally, the test system 10 corresponds to a compact antenna test range extended by the second measurement antennas 32, since the test system 10 includes indirect far field (IFF) conditions as well as direct far field (DFF) conditions at the test position 26. Thus, at least one side of the device under test 34 can be tested by the direct far field (DFF) conditions, while at least four different sides of the device under test 34 are tested by the indirect far field (IFF) conditions.

[0094] The total test time required to fully test the device under test 34 can be significantly reduced.

Claims

1. A test system for testing a device under test (34) in the air, wherein the test system (10) includes a test position (26) for the device under test (34), a reflector (24) facing the test position (26), and a measurement feed antenna (28) facing the reflector (24), thereby establishing a signal path between the measurement feed antenna (28) and the test position (26) through the reflector (24), wherein the test system (10) includes a locator (42) for the device under test (34), the locator (42) being capable of rotating the device under test (34) to at least four different measurement positions of the device under test (34), and wherein the test system (10) includes a second measurement antenna (32), when the device under test (34) is placed on the test position (26), the position of the second measurement antenna (32) is offset from the center (C) of a side surface (36) of the device under test (34) facing the second measurement antenna (32), and wherein the respective central axes of the device under test (34), the test position (26), and / or the measurement feed antenna (28) coincide with each other on a common axis (A).

2. The test system according to claim 1, wherein the position of the second measurement antenna (32) is offset from the common axis (A).

3. The test system according to claim 1 or 2, wherein the position of the second measurement antenna (32) is offset from the line of sight between the measurement feed antenna (28) and the test position (26).

4. The test system according to claim 1 or 2, wherein a side surface (36) of the device under test (34) facing the second measurement antenna (32) cannot be measured by means of the measurement feed antenna (28).

5. The test system according to claim 1 or 2, wherein a side surface (36) of the device under test (34) facing the second measurement antenna (32) is perpendicular to a side surface of the device under test (34) that is measured by the measurement feed antenna (28) at at least four different measurement positions of the device under test (34).

6. The test system according to claim 1 or 2, wherein the measurement feed antenna (28) and the second measurement antenna (32) together are configured to test the device under test (34) with respect to 1.5 side surfaces at a single measurement position established by the locator (42).

7. The test system according to claim 1 or 2, wherein the measurement feed antenna (28) and the second measurement antenna (32) together are configured to test the device under test (34) with respect to three side surfaces at two different measurement positions established by the locator (42).

8. The test system according to claim 1 or 2, wherein the locator (42) is capable of rotating the device under test (34) along a single axis.

9. The test system according to claim 1 or 2, wherein at least four different measurement positions of the device under test (34) are associated with at least four different sides of the device under test (34) that are perpendicular to each other.

10. The test system according to claim 9, wherein at least four different sides of the device under test (34) relate to the front side of the device under test (34), the back side of the device under test (34), and at least two opposite lateral sides of the device under test (34), and the at least two opposite lateral sides are respectively incorporated into the front side and the back side.

11. The test system according to claim 1 or 2, wherein the test system (10) is configured to test the device under test (34) with respect to five different sides that are perpendicular to each other.

12. The test system according to claim 1 or 2, wherein the test system (10) includes a measuring device having a signal generator and / or a signal analyzer.

13. The test system according to claim 1 or 2, wherein a plurality of offset bias antennas are provided.

14. The test system according to claim 1 or 2, wherein an anechoic region (38) is established by the measurement feed antenna (28) together with the reflector (24), and wherein the test position (26) is located within the anechoic region (38).

15. The test system according to claim 1 or 2, wherein the test system (10) includes at least one device under test (34) held at the test position (26) by the locator (42).

16. The test system according to claim 1 or 2, wherein a plurality of devices under test are placed at the test position (26).

17. The test system according to claim 1 or 2, wherein the test system (10) is established by a compact antenna test range extended by the second measurement antenna (32).

18. A method for testing a device under test (34) in the air, wherein the method includes the following steps: Providing the device under test (34); Providing a test system (10) for testing the device under test (34) in the air, wherein the test system (10) includes a locator (42) for the device under test (34), a test position (26) for the device under test (34), a reflector (24) facing the test position (26), and a measurement feed antenna (28) pointing to the reflector (24), thereby establishing a signal path between the measurement feed antenna (28) and the test position (26) through the reflector (24), and wherein the test system (10) includes a second measurement antenna (32), and the position of the second measurement antenna is offset from the measurement feed antenna (28); Placing the device under test (34) at the test position (26) such that one side (36) of the device under test (34) faces the second measurement antenna (32), wherein the respective central axes of the device under test (34), the test position (26), and / or the measurement feed antenna (28) coincide with each other on a common axis (A); and An aerial measurement is carried out, wherein two different sides of the device under test (34) are tested simultaneously at least partially by means of the measurement feed antenna (28) and the second measurement antenna (32).

19. The method according to claim 18, wherein during the aerial measurement, the device under test (34) is rotated along a single axis, so that subsequently a plurality of different sides of the device under test (34) are tested by means of the measurement feed antenna (28), wherein the second measurement antenna (32) always faces the same side (36) of the device under test (34).

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