A sample analysis system and sample management method

Abstract

A sample analysis system and a sample management method are provided. The sample analysis system comprises: one or more analysis devices (10) for testing a sample; a scanning component (01) for scanning the sample to obtain scanning information before the analysis device (10) tests the sample; an image information acquisition component (02) for acquiring image information of an area in the sample containing a sample identifier; and a processor (03) for identifying the sample identifier of the sample based on at least one of the scanning information or the image information of the sample. The system can acquire the sample identifier of the sample in both ways, thereby improving the efficiency of sample testing.

Description

Technical Field

[0001] The present invention relates to a sample analysis system and a sample management method thereof. Background Art

[0002] Analytical equipment for samples is a type of instrument used to measure samples, which may include cell analyzers, coagulation analyzers, urine analyzers, biochemical analyzers, immunoassay analyzers, slide pushers and slide readers, etc.

[0003] With the demand for large-scale sample testing, in order to meet high throughput and reduce time, a sample analysis system that uses pipeline testing has emerged. This sample analysis system cascades multiple analytical devices, which are connected by tracks. Its main feature is that the samples to be tested are placed in an input module, which determines which test items the samples need to undergo. The samples are then dispatched to the corresponding analytical devices for testing in sequence via the tracks. After the test is completed in one analytical device, if the sample needs to be tested in another analytical device, the system will automatically dispatch the sample to the corresponding other analytical device for testing until all items of the sample are tested. SUMMARY OF THE INVENTION

[0005] Technical issues

[0006] In order to complete the sample testing more conveniently and automatically, whether it is a stand-alone analytical device for sample testing or a system in which multiple analytical devices are cascaded to form a pipeline for sample testing, barcode mode technology is currently generally used, that is, the sample identification of the sample is obtained by scanning the sample, thereby automatically determining the test items of the sample and subsequently associating the sample test results with the sample; but in actual situations, the scanning often fails due to various circumstances - such as poor barcode quality and scratches on the sample, and the system is unable to obtain the sample identification of the sample, causing the sample test to be disturbed or even interrupted.

[0007] Solution to the problem

[0008] Technical Solutions

[0009] To solve the above problems, the present invention mainly provides a sample analysis system and a sample management method thereof.

[0010] According to a first aspect, an embodiment provides a sample analysis system, comprising:

[0011] one or more analytical devices for performing tests on the samples;

[0012] A scanning component, used for scanning the sample to obtain scanning information before the analysis device tests the sample;

[0013] An image information acquisition component is used to acquire image information of an area in the sample containing a sample identifier;

[0014] A processor is configured to identify a sample identifier of the sample based on at least one of the scanning information or the image information of the sample.

[0015] According to a second aspect, an embodiment provides a sample analysis system, comprising:

[0016] An input module for receiving a sample; the input module includes a scanning component for scanning the sample to obtain scanning information;

[0017] One or more analysis devices for testing a sample; any of the analysis devices includes a scanning component for scanning the sample to obtain scanning information before the analysis device tests the sample;

[0018] a track for connecting an input module and the analysis device;

[0019] scheduling means for scheduling samples through the track;

[0020] a processor, configured to determine a sample identifier of each sample based on the scan information of each sample; and

[0021] An image information acquisition component is used to acquire image information of an area containing a sample identifier in a sample; wherein for any sample, if the processor is unable to determine its sample identifier based on the scanning information of the sample, the image information acquisition component acquires the image information of the area containing the sample identifier of the sample, and uses it to determine the sample identifier of the sample.

[0022] According to a third aspect, an embodiment provides a sample analysis system, comprising:

[0023] A measuring component, used for measuring a sample to obtain a project test result of the sample;

[0024] A sample component, used to carry the sample to be tested and provide the sample to the measuring component after aspirating the sample;

[0025] A reagent component, used for carrying reagents and providing the reagents to the assay component after drawing the reagents;

[0026] A scanning component, used for scanning a sample to obtain scanning information before the sample is tested;

[0027] a processor, configured to determine a sample identifier of each sample based on the scan information of each sample; and

[0028] An image information acquisition component is used to acquire image information of an area containing a sample identifier in a sample; wherein for any sample, if the processor is unable to determine its sample identifier based on the scanning information of the sample, the image information acquisition component acquires the image information of the area containing the sample identifier of the sample, and uses it to determine the sample identifier of the sample.

[0029] In one embodiment, when the processor is unable to determine the sample identification based on the scan information of the sample, the processor determines the sample identification based on the image information of the sample acquired by the image information acquisition component.

[0030] In one embodiment, when the processor cannot determine the sample identification based on the scanning information of the sample, the processor determines the sample identification based on the image information of the sample acquired by the image information acquisition component, and determines the test items of the sample based on the sample identification of the sample.

[0031] In one embodiment, when the processor cannot determine the sample identification according to the scanning information of the sample, the processor assigns a unique invalid identification to the sample and controls the activation of a specific test mode for the sample.

[0032] In one embodiment, the processor controls enabling a specific test mode for the sample, including: the processor controls enabling a test mode supported by the maximum items of the analysis device for the sample, or the processor controls enabling a test mode supported by the commonly used items of the analysis device for the sample.

[0033] In one embodiment, the sample analysis system further includes a display, the display being configured to display a sample identification modification interface, the sample identification modification interface including an invalid identification of an invalid sample, a sample identification image of the invalid sample, and an interface for inputting a sample identification; wherein the invalid sample is a sample having an invalid identification, and the sample identification image is generated by a processor based on image information of an area containing the sample identification;

[0034] The processor receives the input sample identification through the interface;

[0035] The processor modifies the invalid identifier of the invalid sample to the input sample identifier.

[0036] In one embodiment, the processor determines a sample identifier of the invalid sample based on image information of the invalid sample, and inputs the sample identifier into the interface for display by the display, wherein the sample identifier input by the processor at the interface can be modified by the user;

[0037] In response to the determination command, the processor receives the input sample identifier through the interface again, and modifies the invalid identifier of the invalid sample to the currently input sample identifier.

[0038] In one embodiment, the processor further obtains a position index and a sample identifier of each sample, and establishes a mapping relationship between the position index and the sample identifier for each sample;

[0039] In the case that the processor cannot determine the sample identification of the sample according to the scanning information of the sample, the processor further determines the sample identification of the sample based on the position index of the sample through the mapping relationship.

[0040] In one embodiment, when the processor is unable to determine the sample identifier based on the scan information of the sample, the image information acquisition component acquires image information of a region in the sample containing the sample identifier.

[0041] According to a fourth aspect, an embodiment provides a sample management method, including:

[0042] Scan the sample to obtain scan information;

[0043] Obtain image information of the area containing the sample identifier in the sample;

[0044] A sample identifier of the sample is identified based on at least one of the scanning information or the image information of the sample.

[0045] According to a fifth aspect, an embodiment provides a sample management method, including:

[0046] Scanning the sample to obtain scanning information, wherein the scanning information is used to determine a sample identification of the sample;

[0047] In the case where the sample identification cannot be determined based on the scanning information of the sample, image information of the area of ​​the sample containing the sample identification is obtained to determine the sample identification of the sample.

[0048] In one embodiment, when the sample identification cannot be determined based on the scan information of the sample, the sample identification is determined based on the acquired image information of the sample.

[0049] In one embodiment, when the sample identification cannot be determined based on the scan information of the sample, the sample identification is determined based on the acquired image information of the sample, and the test items of the sample are determined based on the sample identification.

[0050] In one embodiment, when the sample identification cannot be determined based on the scanning information of the sample, the processor assigns a unique invalid identification to the sample and controls the activation of a specific test mode for the sample.

[0051] In one embodiment, the controlling of enabling a specific test mode for the sample includes: controlling enabling a test mode supported by a maximum number of items of the analysis device for the sample, or controlling enabling a test mode supported by commonly used items of the analysis device for the sample.

[0052] In one embodiment, the sample management method further includes:

[0053] Displaying a sample identification modification interface, the sample identification modification interface including an invalid identification of an invalid sample, a sample identification image of the invalid sample, and an interface for inputting a sample identification; wherein the invalid sample is a sample with an invalid identification, and the sample identification image is generated from image information of an area containing the sample identification;

[0054] receiving a sample identifier input through the interface;

[0055] The invalid identifier of the invalid sample is modified to the input sample identifier.

[0056] In one embodiment, the sample management method further includes:

[0057] further determining a sample identifier of the invalid sample based on the image information of the invalid sample, and inputting the sample identifier into the interface for display, wherein the sample identifier input into the interface can be modified by a user;

[0058] In response to the determination command, the input sample identifier is received through the interface, and the invalid identifier of the invalid sample is modified to the currently input sample identifier.

[0059] In one embodiment, the sample management method further includes:

[0060] Obtain the location index and sample identifier of each sample, and establish a mapping relationship between the location index and the sample identifier for each sample;

[0061] In the case that the sample identification cannot be determined according to the scanning information of the sample, the sample identification of the sample is determined based on the position index of the sample through the mapping relationship.

[0062] In one embodiment, when the sample identifier cannot be determined based on the scan information of the sample, image information of the region of the sample containing the sample identifier is obtained.

[0063] According to a sixth aspect, an embodiment provides a computer-readable storage medium, comprising a program, wherein the program can be executed by a processor to implement the method described in any embodiment herein.

[0064] Advantageous Effects of the Invention

[0065] Brief description of the accompanying drawings BRIEF DESCRIPTION OF THE DRAWINGS

[0066] Figure 1 A schematic diagram of a sample information code according to an embodiment;

[0067] Figure 2 is a schematic structural diagram of a sample analysis system according to an embodiment;

[0068] Figure 3 A schematic structural diagram of an analysis device according to an embodiment;

[0069] Figure 4 A schematic structural diagram of an analysis device according to another embodiment;

[0070] Figure 5 is a schematic structural diagram of a sample analysis system according to another embodiment;

[0071] Figure 6 is a structural diagram of a sample analysis system according to another embodiment;

[0072] Figure 7 Schematic diagram of the structure of a pre-processing module according to an embodiment;

[0073] Figure 8 Schematic diagram of the structure of a post-processing module according to an embodiment;

[0074] Figure 9 This is a schematic structural diagram of a sample analysis system according to another embodiment;

[0075] Figure 10 A schematic structural diagram of a sample analysis system according to another embodiment;

[0076] Figure 11 A schematic diagram of a sample identification modification interface according to an embodiment;

[0077] Figure 12 is a flow chart of a sample management method according to an embodiment;

[0078] Figure 13 A flow chart of a sample management method according to another embodiment;

[0079] Figure 14 The flowchart of an embodiment of modifying a sample identification through a sample identification modification interface is shown.

[0080] Invention Embodiments

[0081] Modes for Carrying Out the Invention

[0082] The present invention will be further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core of the present application being overwhelmed by excessive descriptions, and for those skilled in the art, it is not necessary to describe these related operations in detail. They will fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0083] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various embodiments. Furthermore, the steps or actions in the method description may be reordered or adjusted in a manner readily apparent to those skilled in the art. Therefore, the various sequences in the specification and drawings are provided solely for the purpose of clearly describing a particular embodiment and are not intended to be mandatory, unless otherwise specified.

[0084] The serial numbers assigned to components herein, such as "first," "second," etc., are used solely to distinguish the objects being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings).

[0085] The sample analysis system in this article can be a related system of analytical equipment used as a single machine for testing, or it can be a system in which multiple analytical equipment are cascaded to form a pipeline for sample testing. In order to enable those skilled in the art to better understand the present invention, the barcode technology is first explained.

[0086] After a user, such as a medical professional, collects a sample—which can be a biological test object like blood or tissue—they place it in a sample container. Depending on the actual needs, the sample container can be a test tube or a slide. The container has an information code that uniquely identifies the sample. Typically, the code is a barcode, QR code, or other unique identifier. The system uses a barcode scanner to scan the information code on the sample container to obtain the scanned information. The system then decodes the scanned information to obtain the sample ID.

[0087] A barcode scanner, also known as a barcode reader or barcode scanning gun, is a device used to read information codes such as barcodes and QR codes. The working principle of one type of barcode scanner is as follows: the barcode scanner emits light to the information code to be read. The light is reflected by the information code, and the barcode scanner then receives the light reflected by the information code and converts it into an electrical signal through photoelectric conversion to obtain the scanned information; by decoding the scanned information, the content contained in the read information code can be obtained.

[0088] Taking a sample analysis system that performs testing as a stand-alone machine as an example, after the analysis device in the system receives the sample inserted by the user, it will scan the sample to obtain the scanning information, and then determine the sample identification of the sample through the scanning information. The system can determine the sample number and the test items to be performed on the sample through the sample identification (for example, based on the sample identification, the system can query various information about the sample through the LIS system), and then control the various test items to be performed on the sample, and associate the test results with the sample number.

[0089] Taking the example of a sample analysis system in which multiple analysis devices are cascaded to form a pipeline, generally, the input module and the analysis device will scan the sample. The sample is scanned at the input module mainly so that the system can know which test items the sample needs to undergo, so as to dispatch the sample to the corresponding one or more analysis devices for the corresponding project test - for example, sample S1 and sample S2, after being scanned at the input module, the system determines that sample S1 needs to go to the first analysis device for items Test11 to Test14 and needs to go to the second analysis device for items Test21 to Test25; the system determines that sample S2 only needs to go to the second analysis device for items Test21 to Test23; therefore, the system will control the dispatching of sample S1 to the first and second analysis devices for testing, and dispatch sample S2 only to the second analysis device for testing; the sample will be scanned again at each analysis device, mainly so that the analysis device knows which test items the current sample needs to undergo Some item tests are performed, so that the samples are tested according to the item tests that need to be performed on the samples, and the test results are associated with the corresponding samples - for example, after sample S1 is dispatched to the first analysis device, the first analysis device scans sample S1 and determines that sample S1 needs to perform items Test11 to Test14, so the first analysis device performs items Test11 to Test14 on sample S1, and associates the test results with sample S1; after sample S1 and sample S2 are dispatched to the second analysis device, the second analysis device scans sample S1 and sample S2 respectively, and determines that sample S1 needs to perform items Test21 to Test25 and sample S2 needs to perform items Test21 to Test23, so the second analysis device performs items Test21 to Test25 on sample S1, and associates the test results with sample S1, and performs items Test21 to Test23 on sample S2, and associates the test results with sample S2.

[0090] It can be seen that when the sample analysis system is unable to obtain the sample identification based on the scanned information due to poor signal code quality or scratches on the sample, the sample test may be disrupted or even interrupted. To address this situation, the applicant is considering scanning the sample to obtain scanned information and also obtaining image information of the area containing the sample identification, and identifying the sample identification based on at least one of the scanned information or the image information. For example, for any sample, when the system can determine its sample identification based on either its scan information or its image information, the system may select either one to determine the sample identification. Preferably, the scan information may be selected to determine the sample identification, or the system may determine the sample identification based on both the scan information and the image information, and then compare the sample identification determined by the scan information with the sample identification determined by the image information. If they are consistent, it means that the sample identification is correct. If they are inconsistent, a prompt is issued. Optionally, at this time, the sample identification determined by either the scan information or the image information may be temporarily used as a temporary sample identification for the sample to perform project testing and associate the test results. In some cases, such as when the image information is blurred, so that the system can only determine the sample identification based on the scan information but not the image information, the system may determine the sample identification based on the scan information. In some cases, such as when the information code portion of the sample is stained, so that the system can only determine the sample identification based on the image information but not the scan information, the system may determine the sample identification based on the image information, or the system may generate an image based on the image information for the user to view, so that the user can fill in the number in the image into the system to determine the sample identification.

[0091] It is understood by those skilled in the art that the scan information and image information herein are different concepts. One is the information obtained by scanning the sample, and the other is the information obtained by, for example, taking a photo of the sample. For illustration, the sample information code is a barcode. Please refer to Figure 1 By scanning the barcode on the sample carrying container (i.e. the black and white barcode in the picture), the information obtained about the black and white barcode in the picture is called scanning information. By decoding the scanning information, the sample identification can be obtained - for example, the number below the barcode that represents the real information of the black and white barcode; by taking a picture of the area containing the barcode, the image information of the area containing the sample identification can be obtained, and by performing image recognition on the image information - for example, performing OCR (Optical Character Recognition) on the number below the barcode in the image, the sample identification is obtained, or the image information of the area containing the sample identification generates and displays the corresponding image for the user to view, so that the user can fill in the number in the image into the system, so that the system can determine the sample identification. It should be noted that Figure 1The barcodes in the figure are for illustration only and are not intended to limit the sample information to this type of code.

[0092] The sample analysis system of the present invention is described in detail below.

[0093] Please refer to Figure 2 The sample analysis system includes one or more analysis devices 10, a scanning component 01, an image information acquisition component 02 and a processor 03; wherein the analysis device 10 is used to test the sample; the scanning component 01 is used to scan the sample to obtain scanning information before the analysis device 10 tests the sample; the image information acquisition component 02 is used to obtain image information of the area in the sample containing the sample identification. The scanning component 01 can be an existing barcode scanner, etc., and the image information acquisition component 01 can be a camera, etc. The processor 03 is used to identify the sample identification of the sample based on at least one of the scanning information or image information of the sample - for example, for any sample, when the processor 01 can determine its sample identification based on either its scanning information or image information, the processor 01 can select either one to determine the sample identification. Preferably, the scanning information can be selected to determine the sample identification, or the processor 01 can determine the sample identification based on the scanning information and the image information respectively, and then compare the sample identification determined by the scanning information with the sample identification determined by the image information. If they are consistent, it means that the sample identification is correct. If they are inconsistent, a prompt is issued. Optionally, at this time, the sample identification determined by one of the scanning information or the image information can be temporarily used as a temporary sample identification for the sample to perform project testing and associate the test results; in some cases, such as when the image information is blurred, the processor 01 can only determine the sample identification based on its scanning information and cannot determine the sample identification based on its image information, then the processor 01 determines the sample identification based on its scanning information; in some cases, such as when the information code part of the sample is stained, the processor 01 can only determine the sample identification based on its image information and cannot determine the sample identification based on its scanning information, then the processor 01 determines the sample identification based on the image information.

[0094] As described above, the sample analysis system may include one or more analysis devices 10. When the sample analysis system includes only one analysis device 10, the sample analysis system is effectively a stand-alone testing system. When the sample analysis system includes multiple cascaded analysis devices 10, the sample analysis system is effectively a pipelined sample analysis system.

[0095] Please refer to Figure 3 The analysis device 10 of some embodiments may include a sample component 11, a reagent component 14 and a determination component 17, which will be described in detail below.

[0096] The sample part 11 is used to carry the sample to be tested and to provide the sample to the measuring part 17 after the sample is sucked. Figure 4 In some embodiments, the sample component 11 may include a sample injection component 12 and a sample dispensing mechanism 13. The sample injection component 12 is used to carry samples. In some examples, the sample injection component 12 may include a sample delivery module (SDM) and a front track; in other examples, the sample injection component 12 may also be a sample tray, which includes a plurality of sample positions for placing sample tubes, and the sample tray can dispatch samples to corresponding positions by rotating its tray structure, such as positions for the sample dispensing mechanism 13 to absorb samples. The sample dispensing mechanism 13 is used to absorb samples and discharge them into a reaction cup to be loaded with samples. For example, the sample dispensing mechanism 13 may include a sample needle, which performs two-dimensional or three-dimensional movement in space through a two-dimensional or three-dimensional driving mechanism, so that the sample needle can move to absorb the sample carried by the sample injection component 12, and move to the reaction cup to be loaded with samples, and discharge the sample into the reaction cup.

[0097] The reagent component 14 is used to carry the reagent, and after absorbing the reagent, it is provided to the measuring component 17. In some embodiments, the reagent component 14 may include a reagent carrying component 15 and a reagent dispensing mechanism 16. The reagent carrying component 15 is used to carry the reagent. In one embodiment, the reagent carrying component 15 can be a reagent disk, which is arranged in a disc-shaped structure and has a plurality of positions for carrying reagent containers. The reagent carrying component 15 can rotate and drive the reagent container it carries to rotate, and is used to rotate the reagent container to a specific position, such as a position where the reagent is absorbed by the reagent dispensing mechanism 16. The number of reagent carrying components 15 can be one or more. The reagent dispensing mechanism 16 is used to absorb the reagent and discharge it into a reaction cup to be added with the reagent. In one embodiment, the reagent dispensing mechanism 16 may include a reagent needle, which performs two-dimensional or three-dimensional movement in space through a two-dimensional or three-dimensional driving mechanism, so that the reagent needle can move to absorb the reagent carried by the reagent carrying component 15, and move to the reaction cup to be added with the reagent, and discharge the reagent into the reaction cup.

[0098] The measuring component 17 is used to test the sample to obtain test data. In some embodiments, the measuring component 17 may include a reaction component 18 and a light measuring component 19. The reaction component 18 has at least one placement position, which is used to place a reaction cup and incubate the reaction liquid in the reaction cup. For example, the reaction component 18 can be a reaction disk, which is arranged in a disc-shaped structure and has one or more placement positions for placing reaction cups. The reaction disk can rotate and drive the reaction cups in its placement positions to rotate, and is used to arrange reaction cups in the reaction disk and incubate the reaction liquid in the reaction cups. The light measuring component 19 is used to perform light measurement on the reaction liquid after incubation to obtain the reaction data of the sample. For example, the light measuring component 19 detects the luminous intensity of the reaction liquid to be tested, and calculates the concentration of the component to be tested in the sample through a calibration curve. In one embodiment, the light measuring component 19 is separately arranged outside the reaction component 18.

[0099] The above is a description of the structure of the analysis device 10. When the sample analysis system includes only one analysis device 10, the scanning component 01, image information acquisition component 02, and processor 03 in the sample analysis system can be integrated into the analysis device 10. For example, the scanning component 01 and the image information acquisition component 01 can both be disposed on the sample introduction component 12. Specifically, when the sample introduction component 12 is a sample tray, the scanning component 01 and the image information acquisition component 01 can be disposed at a certain position on the sample tray. When the sample introduction component 12 is a sample distribution module and a front-end track, the scanning component 01 and the image information acquisition component 01 can be disposed at a certain position on the front-end track.

[0100] As described above, in some embodiments, the sample analysis system includes multiple cascaded analysis devices 10 to form a pipeline testing system. Figure 5 and Figure 6 In order to better test samples in a pipelined manner, in some embodiments of the sample analysis system including multiple cascaded analysis devices 10, it may further include an input module 20, a pre-processing module 30, a track 40, a scheduling device 50 and a post-processing module 60. It should be noted that Figure 5 Shown are three analytical devices, Figure 6 Two analysis devices are shown in the figure, which is for illustration only and is not intended to limit the number of analysis devices in the sample analysis system to only two or three.

[0101] The input module 20 can be used to receive a sample to be tested inserted by a user. In some embodiments, the input module 20 can be provided with the aforementioned scanning component 01 and / or image information acquisition component 02. The scanning component 01 at the input module 20 is used to scan the sample at the input module 20 to obtain scanning information, and the image information acquisition component 02 is used to obtain image information of an area containing a sample identifier at the input module 20.

[0102] The pre-processing module 30 is used to pre-process the sample to be tested received by the input module. Generally, after the user puts the sample into the input module 20, the sample identification of the sample is determined by the scanning information and / or image information of the sample at the input module 20, and the scheduling device 50 will then schedule the sample to the pre-processing module 30 for pre-processing. The pre-processed sample will then be dispatched from the pre-processing module 30 to the corresponding analysis device 10 for testing. In one embodiment, please refer to Figure 7 The pre-treatment module 30 may include one or more of a centrifugal module 31, a serum detection module 32, a decapping module 33 and a dispensing module 34. The centrifugal module 31 is used to centrifuge the sample to be centrifuged, and the number of the centrifugal modules 31 can be one or more. The serum detection module 32 is used to detect whether the amount of serum in the sample is sufficient and / or whether the serum quality of the sample is qualified, so as to determine whether the sample after centrifugation can be used for subsequent determination. The decapping module 33 is used to decap the sample after centrifugation - it can be understood that the capping, filming, decapping and demembraning of the sample in this article refers to the capping, filming, decapping and demembraning of the sample tube containing the sample; generally, the sample needs to be decapped after centrifugation for subsequent sample dispensing or sampling by the dispensing module 34 or the analysis equipment. The dispensing module 34 is used to sample, for example, to divide a sample into multiple samples, so as to send them to different analysis equipment 10 for determination. A typical pre-processing process of the pre-processing module 30 is as follows: the centrifugation module 31 receives the sample dispatched by the input module 20 and centrifuges the sample; the serum detection module 32 detects the serum of the centrifuged sample to determine whether it can be used for subsequent measurements. If the serum volume is insufficient or the quality is unqualified, it cannot be used for subsequent measurements; if the test passes, the sample is dispatched to the decapping module 33, and the decapping module 33 removes the cover of the sample. If there is a dispensing module 34, the dispensing module 34 divides the removed sample, and then dispatches the divided sample to the corresponding analysis device 10 for measurement. If there is no dispensing module 34, the sample is dispatched from the decapping module 33 to the corresponding analysis device 10 for measurement. It should be noted that the pre-processing module 30 is not required, and the sample analysis system of some embodiments may not include the pre-processing module 30. For example, Figure 5 As an example, the sample analysis system of some embodiments may also include a pre-processing module 30, such as Figure 6 is an example.

[0103] Track 40 is used to connect various devices. For example, track 40 connects input module 20 and multiple analytical devices 10, allowing samples to be dispatched from input module 20 to various analytical devices 10 for testing via track 40. In some examples including pre-processing module 30 and post-processing module 60, track 40 sequentially connects input module 20, pre-processing module 30, various analytical devices 10, and post-processing module 60.

[0104] The scheduling device 50 is used to schedule samples through the track 40 , for example, scheduling samples from the input module 20 to the analysis device 10 , or scheduling from one analysis device 10 to another analysis device 10 .

[0105] The post-processing module 60 is used to complete the post-processing of the sample. Figure 8 , the post-processing module 60 includes one or more of a filming / capping module 61, a cold storage module 62 and a film removal / capping module 63. The filming / capping module 61 is used to film or cap the sample; the cold storage module 62 is used to store the sample; the film removal / capping module 63 is used to remove the film or cap from the sample. A typical post-processing flow of the post-processing module 60 is: after the sample is sucked into all the analysis devices 10 that need to be measured, it will be dispatched to the filming / capping module 61, and the filming / capping module 61 will film or cap the sample after the measurement, and then dispatch it to the cold storage module 62 for storage; if the sample needs to be re-measured, the sample will be dispatched from the cold storage module 62, and will be removed from the film removal / capping module 63, and then dispatched to the corresponding analysis device 10 for measurement. It should be noted that the post-processing module 60 is not required, and the sample analysis system of some embodiments may not include the post-processing module 60, for example Figure 5 As an example, the sample analysis system of some embodiments may also include a post-processing module 60, such as Figure 6 is an example.

[0106] Figure 9 Another structural diagram of the sample analysis system provided by the present invention includes a pre-processing module 30 and a post-processing module 60. Figure 9 As shown, each device or module may also be provided with a module buffer, the track 40 may also have a track buffer, and the entire track may be a circular track. It should be noted that each type of module shown in the figure is one, but those skilled in the art will understand that there is no limit to the number here. For example, there may be multiple centrifugal modules 31, multiple decapping modules 33, etc.

[0107] When the sample analysis system includes only multiple analysis devices 10, the sample analysis system may include one or both of the scanning component 01 and the image information acquisition component 02 in the input module 20 and any one or more of the analysis devices 10. For example, the scanning component 01 and the image information acquisition component 02 may be provided at the input module 20; or any one of the analysis devices 10 may also include one or both of the scanning component 01 and the image information acquisition component 02. The number of processors 03 may be one or more, for example, a processor 03 may be provided at the input module 20, or a processor 03 may be integrated into each analysis device 10, or a unified processor 03 may be used to process the scan information and / or image information acquired by the input module 20 and each analysis device 10. Alternatively, the sum of the components at the input module 20 and each analysis device that have information processing functions may be collectively referred to as the processor 03 herein. When the processor 03 is specifically implemented, it can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. The general-purpose processor can be a microprocessor or any conventional processor.

[0108] Of course, in some embodiments, the sample analysis system may also include a display 70, for example Figure 10 is an example.

[0109] The above is some description of the sample analysis system.

[0110] In some embodiments, if the processor 03 is unable to determine the sample identification based on the sample's scanned information, the image information of the sample's region containing the sample identification, acquired by the image information acquisition component 02, is used to determine the sample identification. Typically, for example, due to poor quality or scratches on the sample's information code, the scanning component 01 may acquire incorrect or even empty scan information when scanning the sample. This situation is referred to as a scan failure, and the processor 03 is unable to correctly decode the scan information. Accordingly, the sample identification cannot be determined based on the scan information. In this case, the image information of the sample's region containing the sample identification, acquired by the image information acquisition component 02, is used to determine the sample identification. It is understood that in some cases, when the scanning component 01 scans the sample, the image information acquisition component 02 captures the sample to acquire image information of the sample's region containing the sample identification. In other cases, when the scanning component 01 scans the sample and the processor 03 is unable to determine the sample identification based on the sample's scanned information, the image information acquisition component 02 captures the sample to acquire image information of the sample's region containing the sample identification.

[0111] The following describes how the image information of the sample is used to determine the sample identification when scanning fails.

[0112] In some cases, when the sample identification cannot be determined based on the scanning information of the sample, the sample identification can be determined based on the image information of the area of ​​the sample containing the sample identification.

[0113] Therefore, in some embodiments, when the processor 03 is unable to determine the sample identification based on the sample's scan information, the processor 03 determines the sample identification based on the sample's image information acquired by the image information acquisition component 02. For example, the processor 03 performs image recognition on the image information and extracts the sample identification (e.g., extracts a numerical number representing the sample identification), thereby determining the sample identification. The processor 03 determines the sample identification based on the sample's image information acquired by the image information acquisition component 02 either when the scan fails or after the test results are available, as described below.

[0114] When scanning fails, the sample identification is determined based on the image information, allowing the system to continue according to the normal testing process. Therefore, in some embodiments, when the processor 03 cannot determine the sample identification based on the scanned information of the sample, the processor 03 determines the sample identification based on the image information of the sample obtained by the image information acquisition component 02, and determines the test items for the sample based on the sample identification.

[0115] One scenario is: when the scanning component 01 at the input module 20 fails to scan a sample, the processor 03 determines the sample identification based on the image information of the sample acquired by the image information acquisition component 02 at the input module 20, thereby allowing the test to proceed normally. For example, the test item of the sample is determined based on the sample identification determined by the image information, and the system dispatches the sample to the corresponding analysis device 10 for testing. Another scenario is: after the analysis device 10 receives the sample, if the scanning component 01 at the analysis device 10 fails to scan a sample, the processor 03 determines the sample identification based on the image information of the sample acquired by the image information acquisition component 02 at the analysis device 10, thereby allowing the test to proceed normally. For example, the test item of the sample is determined based on the sample identification determined by the image information, and the analysis device 10 tests the sample and associates the test results with the sample.

[0116] In some cases, after a scan fails—for example, after the test results are released—the sample identification is determined using image information. Therefore, in some embodiments, when the processor 03 is unable to determine the sample identification based on the sample's scan information, the processor 03 assigns a unique invalid identifier to the sample and controls the activation of a specific test mode for the sample. For example, the processor 03 controls the activation of a test mode for the maximum number of items supported by the analysis device, or the processor 03 controls the activation of a test mode for commonly used items by the analysis device. The test mode for the maximum number of items supported by the analysis device refers to the number of items tested on the sample based on the number of items currently supported by the analysis device. For example, a maximum item support set can be pre-established for the analysis device, including one or more items. When the analysis device activates the test mode for the maximum item support, the sample is tested for the items in the maximum item support set. The test mode for commonly used items refers to the number of items tested on the sample based on the items routinely performed by the analysis device. For example, a commonly used item set can be pre-established for the analysis device, including one or more items. When the analysis device activates the test mode for commonly used items, the sample is tested for the items in the commonly used item set. It can be seen that although the sample does not have the correct sample identifier, the processor 03 gives the sample analysis a unique invalid identifier and enables a specific test mode, so that the sample can continue to be tested and the test results are associated with the invalid identifier. The invalid identifier can be modified to the correct sample identifier later.

[0117] Therefore, in some embodiments, the processor 03 can subsequently determine the sample identification of the sample based on the sample identification determined by the image information, and modify the invalid identification of the sample to the correct sample identification. Figure 11The display 70 can be used to display a sample identification modification interface, which includes an invalid identification of an invalid sample, a sample identification image of the invalid sample, and an interface for inputting a sample identification; wherein the invalid sample is a sample with an invalid identification, and the sample identification image is generated by the processor 03 based on image information of an area containing the sample identification of the invalid sample. Figure 11 In the example, the invalid invalid identifier is inv.102210, where the letters inv indicate that the sample identifier is an invalid identifier, and 102210 is the hour, minute, and second when the sample failed to be scanned. For example, 102210 represents the sample that failed to be scanned at 10:22:10 am. In this way, the invalid identifier can be determined to be unique. Of course, the invalid identifier can also be constructed in other ways, which will not be repeated here. The image displayed below the invalid identifier in the figure is the image generated by the image information of the corresponding area of ​​the sample identifier. The user can view the image and fill in the correct sample identifier, such as the digital number in the figure, into the box below the image - the box in the figure is the interface mentioned above. The processor 03 receives the input sample identifier through the interface, and then converts the sample identifier into the correct one. The invalid identifier of the invalid sample is modified to the input sample identifier, so that the test results of the sample can be associated with the correct sample identifier; optionally, in some embodiments, the processor 03 can determine the sample identifier of the invalid sample based on the image information of the invalid sample, and input the sample identifier into the interface for display on the display, so that the user only needs to check whether the processor 03 recognizes it correctly. If it is correct, click the OK button to input the OK command to the system. If it is incorrect, the user modifies the sample identifier in the interface through an input tool such as a keyboard, and then clicks the OK button to input the OK command to the system. The processor 03 responds to the OK command, receives the input sample identifier through the interface, and modifies the invalid identifier of the invalid sample to the currently input sample identifier.

[0118] One scenario is: after the analysis device 10 receives the sample, when the scanning component 01 of the analysis device 10 fails to scan the sample, the processor 03 obtains the image information of the sample based on the image information acquisition component 02 of the analysis device 10, and the processor 03 assigns a unique invalid identifier to the sample, and the analysis device 10 enables a specific test mode for the sample, such as enabling the test mode supported by the maximum item of the analysis device or the test mode of the commonly used items of the analysis device, and associates the test result with the invalid identifier; then the processor 03 automatically identifies the invalid sample based on the image information to determine its sample identifier, or the processor 03 obtains its sample identifier through the interface of the above-mentioned sample identifier modification interface, and modifies the invalid identifier of the invalid sample to the correct sample identifier, so that the test result of the sample can be associated with the correct sample identifier.

[0119] In the case where the sample analysis system includes multiple analysis devices 10, if two or more analysis devices 10 cannot scan the sample correctly, then the analysis devices 10 that failed to scan will assign an invalid identifier to the sample that currently failed to scan. A possible scenario is that the same sample cannot be scanned correctly on multiple analysis devices 10, which causes the same sample to be assigned multiple invalid identifiers respectively. For example, the first analysis device 10 and the second analysis device 10 fail to scan the sample S at 10:22:10 and 11:01:02 respectively, then the sample S is assigned an invalid identifier inv.102210 in the first analysis device 10, the first analysis device 10 tests the sample S and associates the test result with the invalid identifier inv.102210; the sample S is assigned an invalid identifier inv.110102 in the second analysis device 10, and the second analysis device 10 fails to scan the sample S at 10:22:10 and 11:01:02 respectively. 0 tests sample S and associates the test result with the invalid identifier inv.110102. If the invalid identifier of an invalid sample is modified through the sample identifier modification interface, the user needs to modify it twice: once when modifying the invalid identifier inv.102210. The sample identifier modification interface displays the image captured by the image information acquisition component 02 of the first analysis device 10. The user modifies the invalid identifier inv.102210 to the correct sample identifier based on this image; and once when modifying the invalid identifier inv.110102. The sample identifier modification interface displays the image captured by the image information acquisition component 02 of the second analysis device 10. The user modifies the invalid identifier inv.110102 to the correct sample identifier based on this image. This is obviously inconvenient. Another possible scenario is that the same sample can be successfully scanned on one or more analysis devices 10, and the sample identifier can be determined based on the scan information, but may fail to be scanned on other analysis devices 10, and the sample identifier cannot be determined based on the scan information.

[0120] Therefore, considering the above situations, in some embodiments, the processor 03 also obtains the position index and sample identification of each sample, and establishes a mapping relationship between the position index and the sample identification for each sample; in the case where the processor 03 cannot determine the sample identification of the sample based on the scanning information of the sample, the processor also determines the sample identification of the sample based on the position index of the sample through the mapping relationship. One scenario is: when the input module 20 or some analysis devices 10 scan it successfully and can determine the sample identification based on its scanning information, but some analysis devices 10 fail to scan and cannot determine their sample identification based on the scanning information, or even when the user or the processor 03 cannot determine its sample identification based on the image information, then because the same sample has the same position index, the invalid identification can be modified by the correct sample identification corresponding to the position index, or, instead of introducing an invalid identification, the correct sample identification corresponding to the position index can be directly assigned to the sample that failed to scan. One scenario is: after the user changes the invalid identifier of an invalid sample to the correct sample identifier in the sample identifier modification interface, if the position index associated with the invalid identifier of the invalid sample also corresponds to other invalid identifiers of the invalid sample, the processor 03 automatically modifies the corresponding other invalid identifiers to the correct sample identifier, and the user does not need to modify multiple invalid identifiers of the same sample one by one.

[0121] It should be noted that the position index of the sample is different from the sample identification. For example, the position index of the sample may include: the identification information of the test tube rack where the sample is located, such as the rack number, and the position of the sample in the test tube rack, wherein the rack number of the test tube rack is the identification information carried by the test tube rack itself, such as test tube rack No. 1, which carries a rack number numbered "1"; the identification information of the sample rack, such as the rack number, can be determined by scanning the information code (such as a barcode, etc.) on the sample rack. The identification information of the test tube rack, such as the rack number, is used to identify a test tube rack, which is unique. Generally, a test tube rack can hold multiple sample carrying containers. It can be seen that the position index is different from the sample identification. The position index is used to characterize the position of the sample in a specific test tube rack; the sample identification is used to characterize different samples. For example: the tube rack of the test tube rack is numbered 2. The sample holding container on the test tube rack is scanned to determine that the four samples with sample identifications A, B, C and D in the test tube rack are located at positions 1, 2, 3 and 4 of the test tube rack with test tube number 2, respectively. Then the position indexes of sample A, sample B, sample C and sample D are represented as 2-1, 2-2, 2-3 and 2-4, respectively. The sample identification and position index can be displayed on the display interface for the user to view.

[0122] The above is a sample analysis system of some embodiments of the present invention. In some embodiments, the present invention further discloses a sample management method. The sample management method of the present invention can be applied to a sample analysis system including one or more analysis devices.

[0123] Please refer to Figure 12 , some embodiments disclose a sample management method including steps 110 to 130, which are described in detail below.

[0124] Step 110: Scan the sample to obtain scanning information, for example, by scanning an information code of the sample.

[0125] Step 120: Obtain image information of the area containing the sample identifier in the sample, for example, by taking a photo of the sample.

[0126] Step 130: Identify a sample identifier of the sample based on at least one of the scan information or the image information of the sample. For example, for any sample, when step 130 can determine its sample identification based on either its scan information or its image information, step 130 may select either one to determine the sample identification. Preferably, the scan information may be selected to determine the sample identification, or step 130 may determine the sample identification based on both the scan information and the image information, and then compare the sample identification determined by the scan information with the sample identification determined by the image information. If they are consistent, it means that the sample identification is correct. If they are inconsistent, a prompt is issued. Optionally, at this time, the sample identification determined by either the scan information or the image information may be temporarily used as a temporary sample identification for the sample to perform project testing and associate the test results. In some cases, such as when the image information is blurred, so that step 130 can only determine the sample identification based on the scan information but not the image information, step 130 may determine the sample identification based on the scan information. In some cases, such as when the information code portion of the sample is stained, so that step 130 can only determine the sample identification based on the image information but not the scan information, step 130 may determine the sample identification based on the image information.

[0127] Please refer to Figure 13 , some embodiments disclose a sample management method including steps 210 to 220, which are described in detail below.

[0128] Step 210: Scan the sample to obtain scanning information, where the scanning information is used to determine a sample identification of the sample.

[0129] Step 220: If the sample identification cannot be determined based on the sample's scan information, image information of the area of ​​the sample containing the sample identification is obtained to determine the sample identification of the sample. In some embodiments, only when the sample identification cannot be determined based on the sample's scan information does step 220 photograph the sample and obtain image information of the area of ​​the sample containing the sample identification. In other embodiments, regardless of whether the sample identification can be determined based on the sample's scan information, step 220 photographs the sample. If the sample identification can be determined based on the sample's scan information, step 220 no longer obtains image information of the area of ​​the sample containing the sample identification to determine the sample identification of the sample. If the sample identification cannot be determined based on the sample's scan information, step 220 obtains image information of the area of ​​the sample containing the sample identification to determine the sample identification of the sample.

[0130] The following describes how the image information of the sample is used to determine the sample identification when scanning fails.

[0131] In some cases, when the sample identification cannot be determined based on the scanning information of the sample, the sample identification can be determined based on the image information of the area of ​​the sample containing the sample identification.

[0132] Therefore, in some embodiments, if step 220 is unable to determine the sample identification based on the sample's scan information, step 220 determines the sample identification based on the acquired image information of the sample. For example, step 220 performs image recognition on the image information to extract the sample identification (e.g., extract a numerical number representing the sample identification), thereby determining the sample identification. Step 220 determining the sample identification based on the acquired image information of the sample can be performed when the scan fails, or can be performed later after the test results are available, as described below.

[0133] If the scan fails, the sample identification is determined based on the image information, allowing the system to continue with the normal testing process. Therefore, in some embodiments, if the sample identification cannot be determined based on the scan information of the sample in step 220, step 220 determines the sample identification based on the acquired image information of the sample, and determines the test items for the sample based on the sample identification.

[0134] In some cases, after a scan fails, for example, after the test results come out, the sample identification is determined by the image information. Therefore, in some embodiments, when step 220 cannot determine the sample identification of the sample based on the scan information of the sample, step 220 assigns a unique invalid identification to the sample, and controls the activation of a specific test mode for the sample, for example, step 220 controls the activation of the test mode supported by the maximum items of the analysis device for the sample, or step 220 controls the activation of the test mode of the commonly used items of the analysis device for the sample. The test modes supported by the maximum items of the analysis device and the test modes of the commonly used items can be referred to the description above and will not be repeated here. In some embodiments, step 220 can subsequently determine the sample identification of the sample based on the sample identification determined by the image information, and modify the invalid identification of the sample to the correct sample identification. In other embodiments, please refer to Figure 14 , step 220 may include steps 221 to 223. Step 221 displays the sample identification modification interface. The sample identification modification interface includes an invalid identification of an invalid sample, a sample identification image of the invalid sample, and an interface for inputting a sample identification; wherein the invalid sample is a sample with an invalid identification, and the sample identification image is generated by the processor 03 based on the image information of the area containing the sample identification of the invalid sample. Figure 11 This is an example of a sample identification modification interface. Step 222 receives the input sample identification through the interface, and step 223 modifies the invalid identification of the invalid sample to the input sample identification, so that the test results of the sample can be associated with the correct sample identification; optionally, in some embodiments, step 222 can determine the sample identification of the invalid sample based on the image information of the invalid sample, and input the sample identification into the interface for display, so that the user only needs to check whether step 222 is correctly identified. If correct, click the OK button to input a confirmation command to the system. If incorrect, the user can modify the sample identification in the interface through an input tool such as a keyboard, and then click the OK button to input a confirmation command to the system. In response to the confirmation command, step 223 receives the input sample identification through the interface again, and modifies the invalid identification of the invalid sample to the currently input sample identification.

[0135] Referring to FIG. 15 , in some embodiments, the sample management method further includes steps 310 and 320 , which are described in detail below.

[0136] Step 310: Obtain the position index and sample identifier of each sample, and establish a mapping relationship between the position index and the sample identifier for each sample.

[0137] Step 320: When the sample identifier cannot be determined based on the scanning information of the sample, the sample identifier of the sample is determined based on the position index of the sample through the mapping relationship.

[0138] One scenario is: when the input module 20 or some analysis devices 10 scan it successfully and can determine the sample identifier based on its scanning information, but some analysis devices 10 fail to scan and cannot determine their sample identifier based on the scanning information, or even when the user or processor 03 cannot determine their sample identifier based on the image information, then because the same sample has the same position index, the invalid identifier can be modified by the correct sample identifier corresponding to the position index. Alternatively, there is no need to introduce an invalid identifier, but the correct sample identifier corresponding to the position index can be directly assigned to the sample that failed to scan. Another scenario is: after the user modifies the invalid identifier of an invalid sample to a correct sample identifier in the sample identifier modification interface, if the position index associated with the invalid identifier of the invalid sample also corresponds to other invalid identifiers of the invalid sample, the processor 03 automatically modifies the corresponding other invalid identifiers to the correct sample identifier, and the user does not need to modify multiple invalid identifiers of the same sample one by one.

[0139] It should be noted that the position index of the sample is different from the sample identification. For example, the position index of the sample may include: the identification information of the test tube rack where the sample is located, such as the rack number, and the position of the sample in the test tube rack, wherein the rack number of the test tube rack is the identification information carried by the test tube rack itself, such as test tube rack No. 1, which carries a rack number numbered "1"; the identification information of the sample rack, such as the rack number, can be determined by scanning the information code (such as a barcode, etc.) on the sample rack. The identification information of the test tube rack, such as the rack number, is used to identify a test tube rack, which is unique. Generally, a test tube rack can hold multiple sample carrying containers. It can be seen that the position index is different from the sample identification. The position index is used to characterize the position of the sample in a specific test tube rack; the sample identification is used to characterize different samples. For example: the tube rack of the test tube rack is numbered 2. The sample holding container on the test tube rack is scanned to determine that the four samples with sample identifications A, B, C and D in the test tube rack are located at positions 1, 2, 3 and 4 of the test tube rack with test tube number 2, respectively. Then the position indexes of sample A, sample B, sample C and sample D are represented as 2-1, 2-2, 2-3 and 2-4, respectively. The sample identification and position index can be displayed on the display interface for the user to view.

[0140] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope of this document. For example, the various operational steps and components used to perform the operational steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or incorporated into other steps) depending on the specific application or considering any number of cost functions associated with the operation of the system.

[0141] In the above embodiments, all or part of the embodiments may be implemented through software, hardware, firmware, or any combination thereof. Furthermore, as will be appreciated by those skilled in the art, the principles herein may be embodied in a computer program product on a computer-readable storage medium pre-installed with computer-readable program code. Any tangible, non-transitory computer-readable storage medium may be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-ROMs, DVDs, Blu-ray discs, etc.), flash memory, and / or the like. These computer program instructions may be loaded onto a general-purpose computer, a special-purpose computer, or other programmable data processing device to form a machine, such that the instructions executed on the computer or other programmable data processing device can generate a device that implements a specified function. These computer program instructions may also be stored in a computer-readable memory, which can instruct the computer or other programmable data processing device to operate in a specific manner, such that the instructions stored in the computer-readable memory can form an article of manufacture, including an implementation device that implements a specified function. The computer program instructions may also be loaded onto a computer or other programmable data processing device, thereby causing the computer or other programmable device to execute a series of operational steps to generate a computer-implemented process, such that the instructions executed on the computer or other programmable device can provide the steps for implementing the specified function.

[0142] Although the principles of this invention have been shown in various embodiments, many modifications of structure, arrangement, proportion, elements, materials and components that are particularly suitable for specific environments and operational requirements can be used without departing from the principles and scope of this invention. The above modifications and other changes or amendments are intended to be included within the scope of this invention.

[0143] The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the present disclosure will be considered in an illustrative rather than a restrictive sense, and all such modifications will be included within its scope. Similarly, the advantages, other advantages and solutions to the problems of the various embodiments have been described above. However, the benefits, advantages, solutions to the problems and any elements that can produce these, or make them more specific, should not be interpreted as critical, required or necessary. The term "comprising" and any other variants used in this article are all non-exclusive inclusions, so that a process, method, article or device that includes a list of elements includes not only these elements, but also other elements that are not explicitly listed or do not belong to the process, method, system, article or device. In addition, the term "coupled" and any other variants used in this article refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections and / or any other connections.

[0144] Those skilled in the art will recognize that many changes can be made to the details of the above-described embodiments without departing from the basic principles of the invention. Therefore, the scope of the present invention should be determined solely by the following claims.

Claims

1. A sample analysis system, characterized in that: include: one or more analytical devices for performing tests on the samples; A scanning component, used for scanning the sample carrying container to obtain scanning information of the sample identification before the analysis device tests the sample; an image information acquisition component, configured to acquire image information of an area containing a sample identifier on the sample carrying container; a processor, configured to determine the sample identification according to the scan information of the sample identification; if the sample identification cannot be determined according to the scan information of the sample identification, determine the sample identification according to the acquired image information; Determine the test items of the sample according to the sample identification.

2. A sample analysis system, characterized in that: include: An input module for receiving a sample; the input module includes a scanning component for scanning the sample carrying container to obtain scanning information of the sample identification; One or more analytical devices for testing the sample; any one of the analytical devices includes a scanning component for scanning the sample-carrying container to obtain scan information of the sample identification before the analytical device tests the sample; a track for connecting the input module and the analysis device; scheduling means for scheduling samples through the track; an image information acquisition component, configured to acquire image information of an area containing a sample identifier on the sample carrying container; as well as A processor is configured to determine the sample identification of each sample based on the scanned information of the sample identification of each sample; wherein, for any sample, if its sample identification cannot be determined based on the scanned information of its sample identification, its sample identification is determined based on image information obtained of the area containing its sample identification on its sample carrying container, and its test item is determined based on its sample identification.

3. A sample analysis system, characterized in that: include: A measuring component, used for measuring a sample to obtain a project test result of the sample; A sample component, used to carry the sample to be tested and provide the sample to the measuring component after aspirating the sample; A reagent component, used for carrying reagents and providing the reagents to the assay component after drawing the reagents; A scanning component, used for scanning the sample carrying container to obtain scanning information of the sample identification before the sample is tested; an image information acquisition component, configured to acquire image information of an area containing a sample identifier on the sample carrying container; as well as A processor is configured to determine the sample identification of each sample based on the scanned information of the sample identification of each sample; wherein, for any sample, if its sample identification cannot be determined based on the scanned information of its sample identification, its sample identification is determined based on image information obtained of the area containing its sample identification on its sample carrying container, and its test item is determined based on its sample identification.

4. The sample analysis system according to any one of claims 1 to 3, wherein: When the processor cannot determine the sample identifier according to the scanning information of the sample identifier, the processor assigns a unique invalid identifier to the sample and controls the activation of a specific test mode for the sample.

5. The sample analysis system according to claim 4, wherein: The processor controls enabling a specific test mode for the sample, including: the processor controls enabling a test mode supported by a maximum item of an analysis device for the sample, or the processor controls enabling a test mode of commonly used items of an analysis device for the sample.

6. The sample analysis system according to claim 4, wherein: The system further includes a display configured to display a sample identification modification interface, wherein the sample identification modification interface includes an invalid identification for an invalid sample, a sample identification image for an invalid sample, and an interface for inputting a sample identification; wherein the invalid sample is a sample having an invalid identification, and the sample identification image is generated by the processor based on image information of an area containing the sample identification; The processor receives the input sample identification through the interface; The processor modifies the invalid identifier of the invalid sample to the input sample identifier.

7. The sample analysis system according to claim 6, wherein: The processor determines a sample identifier of the invalid sample based on the image information of the invalid sample, and inputs the sample identifier of the invalid sample into the interface for display by the display, wherein the sample identifier input by the processor at the interface can be modified by a user; In response to the determination command, the processor receives the input sample identifier through the interface again, and modifies the invalid identifier of the invalid sample to the currently input sample identifier.

8. The sample analysis system according to any one of claims 1 to 3, wherein: The processor further obtains a position index and a sample identifier of each sample, and establishes a mapping relationship between the position index and the sample identifier for each sample; In a case where the processor is unable to determine the sample identifier according to the scanning information of the sample identifier, the processor further determines the sample identifier through the mapping relationship based on the position index of the sample.

9. The sample analysis system according to any one of claims 1 to 3, wherein: In a case where the processor cannot determine the sample identifier according to the scan information of the sample identifier, the image information acquiring component acquires image information of a region on the sample carrying container containing the sample identifier.

10. A sample management method, characterized in that: include: Scanning the sample carrier to obtain scan information of the sample identification; Acquiring image information of an area containing a sample identifier on the sample holding container; determining a sample identifier based on scanned information of the sample identifier; If the sample identification cannot be determined based on the scan information of the sample identification, determining the sample identification based on the acquired image information; and Determine the test items of the sample according to the sample identification.

11. A sample management method, characterized in that: include: Scanning the sample carrying container to obtain scan information of the sample identification, wherein the scan information of the sample identification is used to determine the sample identification of the sample; If the sample identification of the sample cannot be determined based on the scanned information of the sample identification, obtaining image information of the area on the sample carrier containing the sample identification to determine the sample identification of the sample; determining the sample identification of the sample based on the obtained image information; and Determine the test items of the sample according to the sample identification.

12. The sample management method according to claim 10 or 11, wherein: When the sample identification of the sample cannot be determined according to the scanning information of the sample identification, a unique invalid identification is assigned to the sample, and a specific test mode is controlled to be enabled for the sample.

13. The sample management method according to claim 12, wherein: The controlling of enabling a specific test mode for the sample includes: controlling enabling a test mode supported by a maximum item of an analysis device for the sample, or controlling enabling a test mode supported by a common item of an analysis device for the sample.

14. The sample management method according to claim 12, wherein: Also includes: Displaying a sample identification modification interface, the sample identification modification interface including an invalid identification of an invalid sample, a sample identification image of the invalid sample, and an interface for inputting a sample identification; wherein the invalid sample is a sample with an invalid identification, and the sample identification image is generated from image information of an area containing the sample identification; receiving a sample identifier input through the interface; The invalid identifier of the invalid sample is modified to the input sample identifier.

15. The sample management method according to claim 14, wherein: Also includes: determining a sample identifier of the invalid sample according to the image information of the invalid sample, and inputting the sample identifier of the invalid sample into the interface for display, wherein the sample identifier input into the interface can be modified by a user; In response to the determination command, the input sample identifier is received through the interface, and the invalid identifier of the invalid sample is modified to the currently input sample identifier.

16. The sample management method according to claim 10 or 11, wherein: Also includes: Obtain the location index and sample identifier of each sample, and establish a mapping relationship between the location index and the sample identifier for each sample; In the case that the sample identifier cannot be determined according to the scanning information of the sample identifier, the sample identifier is also determined through the mapping relationship based on the position index of the sample.

17. A computer-readable storage medium, characterized in that The method comprises a program which can be executed by a processor to implement the method according to any one of claims 10 to 16.

Images