Temperature measuring crystal calibration device and method thereof

Abstract

The application provides a temperature measuring crystal calibration device, which comprises a vertical high-temperature resistance furnace, a temperature measuring thermocouple in the furnace, a temperature measuring crystal calibration sample mounting hole on a calibration sample, a calibration sample temperature measuring thermocouple connected to the calibration sample, a support, and a boom with one end connected to the calibration sample and the other end slidingly connected to the support. When the furnace door of the vertical high-temperature resistance furnace is opened, the end of the boom connected to the calibration sample can extend into or retract from the furnace chamber of the vertical high-temperature resistance furnace. When the end of the boom connected to the calibration sample extends into the furnace chamber of the vertical high-temperature resistance furnace and the furnace door is closed, the gap on the furnace door is clamped on the boom.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of temperature measuring crystal calibration, and particularly relates to a temperature measuring crystal calibration device and a method thereof. BACKGROUND

[0002] Currently, thermocouples are used to measure the wall surface temperature of each component of an aero-engine and the airflow temperature of each system. However, due to the complex structure of the engine, there are some positions where thermocouples cannot be installed. Therefore, temperature measuring crystals are introduced to measure the wall surface temperature of each component of an aero-engine and the airflow temperature of each system.

[0003] A temperature measuring crystal is a micro-sized, micro-weight, leadless temperature measuring sensor. When measuring the wall surface temperature of each component of an aero-engine and the airflow temperature of each system, the temperature measuring crystal is pasted on the wall surface of the temperature measuring position or is buried in a pit dug in the wall surface of the temperature measuring position. In the case of a known maximum temperature duration, the maximum temperature is obtained according to the change rate of the crystal face spacing of the temperature measuring crystal.

[0004] A temperature measuring crystal is an irreversible temperature measuring sensor, and the change rate of the crystal face spacing of the temperature measuring crystal is related to the maximum temperature and its duration in the temperature change history. Therefore, the temperature measuring crystal needs to be calibrated when used. It is difficult to calibrate the temperature measuring crystal by using the current general calibration method.

[0005] The present application is proposed in view of the above technical defects.

[0006] It should be noted that the disclosure of the above background art content is only used to assist in understanding the inventive concept and technical solutions of the present application, and it does not necessarily belong to the prior art of the present patent application. In the absence of explicit evidence that the above content has been disclosed on the filing date of the present application, the above background art should not be used to evaluate the novelty and inventiveness of the present application. SUMMARY

[0007] The purpose of the present application is to provide a temperature measuring crystal calibration device and a method thereof to overcome or alleviate at least one aspect of the known technical defects.

[0008] The technical solution of the present application is:

[0009] In one aspect, a temperature measuring crystal calibration device is provided, comprising:

[0010] A vertical high-temperature resistance furnace has a notch on the furnace door;

[0011] A temperature measuring thermocouple is arranged in the furnace chamber of the vertical high-temperature resistance furnace;

[0012] A temperature measuring crystal calibration sample mounting hole is formed in the temperature measuring crystal calibration sample mounting hole;

[0013] a calibration sample block temperature measuring thermocouple connected to the calibration sample block;

[0014] a support;

[0015] a boom, one end of which is connected to the calibration sample block and the other end of which is slidingly connected to the support;

[0016] When the door of the vertical high-temperature resistance furnace is opened, the end of the boom connected to the calibration sample block can extend into or retract from the furnace chamber of the vertical high-temperature resistance furnace;

[0017] When the end of the boom connected to the calibration sample block extends into the furnace chamber of the vertical high-temperature resistance furnace, the gap on the door of the vertical high-temperature resistance furnace is clamped on the boom when the door of the vertical high-temperature resistance furnace is closed.

[0018] According to at least one embodiment of the present application, in the above-mentioned temperature measuring crystal calibration device, a uniform temperature tube is arranged in the furnace chamber of the vertical high-temperature resistance furnace, so as to form a uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace;

[0019] The furnace chamber temperature measuring thermocouple is arranged in the uniform temperature zone;

[0020] When the end of the boom connected to the calibration sample block extends into the furnace chamber of the vertical high-temperature resistance furnace, it can reach the uniform temperature zone.

[0021] According to at least one embodiment of the present application, in the above-mentioned temperature measuring crystal calibration device, the temperature measuring crystal calibration sample block is in a columnar shape, has a temperature measuring crystal calibration sample mounting hole at one end, and is connected to the calibration sample block temperature measuring thermocouple at the other end.

[0022] According to at least one embodiment of the present application, in the above-mentioned temperature measuring crystal calibration device, it further comprises:

[0023] A door driving linear module is connected to the vertical high-temperature resistance furnace and connected to the door of the vertical high-temperature resistance furnace, so as to drive the door of the vertical high-temperature resistance furnace to open or close;

[0024] A boom driving linear module is connected between the support and the end of the boom away from the calibration sample block, so as to drive the end of the boom away from the calibration sample block to slide on the support.

[0025] According to at least one embodiment of the present application, in the above-mentioned temperature measuring crystal calibration device, it further comprises:

[0026] A controller is connected to the vertical high-temperature resistance furnace, the furnace chamber temperature measuring thermocouple and the calibration sample block temperature measuring thermocouple, so as to regulate and control the temperature in the vertical high-temperature resistance furnace according to the temperature signals fed back by the furnace chamber temperature measuring thermocouple and the calibration sample block temperature measuring thermocouple;

[0027] The controller is connected with the furnace door driving linear module to control the action of the furnace door driving linear module, so that the furnace door of the vertical high-temperature resistance furnace is opened or closed.

[0028] The controller is connected with the boom driving linear module to control the action of the boom driving linear module, so that the end of the boom away from the calibration sample block slides on the support.

[0029] According to at least one embodiment of the present application, the temperature measuring crystal calibration device further comprises:

[0030] The fan is connected to the furnace chamber of the vertical high-temperature resistance furnace through the pipeline to cool the furnace chamber of the vertical high-temperature resistance furnace.

[0031] The controller is connected with the fan to control the start and stop of the fan.

[0032] In another aspect, a temperature measuring crystal calibration method is provided, comprising:

[0033] The temperature measuring crystal calibration sample is installed in the temperature measuring crystal calibration sample installation hole and is fixed by high-temperature resistant water-soluble glue.

[0034] The temperature in the furnace chamber of the vertical high-temperature resistance furnace is controlled to preheat the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace.

[0035] The furnace door of the vertical high-temperature resistance furnace is opened, and the temperature measuring crystal calibration sample block is placed in the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace, and then the furnace door of the vertical high-temperature resistance furnace is closed.

[0036] The temperature in the furnace chamber of the vertical high-temperature resistance furnace is controlled to preheat the temperature measuring crystal calibration sample block.

[0037] The temperature in the furnace chamber of the vertical high-temperature resistance furnace is controlled to keep the temperature of the temperature measuring crystal calibration sample block at the calibration temperature for the calibration time.

[0038] The furnace door of the vertical high-temperature resistance furnace is opened, and the temperature measuring crystal calibration sample block is taken out from the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace.

[0039] The temperature measuring crystal calibration sample block is cooled.

[0040] The fast-drying glue is used to surround the temperature measuring crystal calibration sample block to form a cylindrical shape, and water is injected into the temperature measuring crystal calibration sample installation hole to dissolve the high-temperature resistant water-soluble glue, and then the temperature measuring crystal calibration sample is taken out.

[0041] The X-ray diffractometer is used to measure and analyze the crystal face spacing of the temperature measuring crystal calibration sample, and the crystal face spacing change rate of the temperature measuring crystal calibration sample is calculated.

[0042] The temperature measuring crystal calibration sample is replaced, and the calibration temperature and calibration time are changed to repeat the above steps.

[0043] Draw the calibration temperature-crystal face spacing rate of change at each calibration time, and complete the calibration of the temperature measuring crystal.

[0044] According to at least one embodiment of the present application, in the temperature measuring crystal calibration method, the temperature in the vertical high-temperature resistance furnace is controlled, and the temperature uniform zone in the vertical high-temperature resistance furnace is preheated, specifically as follows:

[0045] The temperature uniform zone in the vertical high-temperature resistance furnace is heated, and the temperature T h = T b - ΔT is maintained for 1 min and then ends; wherein:

[0046] T h is the temperature of the temperature uniform zone in the vertical high-temperature resistance furnace;

[0047] T b is the calibration temperature of the temperature measuring crystal calibration sample;

[0048] ΔT is the temperature calibration accuracy of the temperature measuring crystal calibration sample;

[0049] The temperature in the vertical high-temperature resistance furnace is controlled, and the temperature measuring crystal calibration sample is preheated, specifically as follows:

[0050] The temperature in the vertical high-temperature resistance furnace is controlled, and the temperature measuring crystal calibration sample is preheated, specifically as follows:

[0051] After the temperature T k of the temperature measuring crystal calibration sample rises to 0.7T b , the temperature in the vertical high-temperature resistance furnace is controlled, and the temperature uniform zone is heated at max(0.7(T b - ΔT-T k ), ΔT) per minute until T k = T b - ΔT ends.

[0052] According to at least one embodiment of the present application, in the temperature measuring crystal calibration method, the temperature in the vertical high-temperature resistance furnace is controlled, and the temperature measuring crystal calibration sample is preheated, specifically as follows:

[0053] The temperature in the vertical high-temperature resistance furnace is adjusted every 1 min until the cumulative time reaches the calibration time, and the adjustment mode is as follows:

[0054] If T b + 1 / 2 ΔT ≤ T k ≤ T b + ΔT, the temperature in the vertical high-temperature resistance furnace is controlled, and the temperature uniform zone is cooled by T k -T b ;

[0055] If T b- ΔT ≤ T k ≤ T b - 1 / 2 ΔT, the temperature in the furnace of the vertical high-temperature resistance furnace is controlled to make the temperature of the uniform temperature zone rise T b - T k . BRIEF DESCRIPTION OF DRAWINGS

[0056] Figure 1 is a schematic diagram of a temperature measuring crystal calibration device provided by the embodiment of the present application;

[0057] Figure 2 is a schematic diagram of a temperature measuring crystal calibration sample and the cooperation of the calibration sample temperature measuring thermocouple and the temperature measuring crystal calibration sample of the calibration sample of the temperature measuring crystal provided by the embodiment of the present application;

[0058] Figure 3 is a schematic diagram of the calibration temperature-crystal face spacing change rate under each calibration time provided by the embodiment of the present application;

[0059] Figure 4 is a schematic diagram of preheating the uniform temperature zone in the furnace of the vertical high-temperature resistance furnace and the temperature measuring crystal calibration sample provided by the embodiment of the present application;

[0060] Figure 5 is a schematic diagram of controlling the temperature in the furnace of the vertical high-temperature resistance furnace to make the temperature of the temperature measuring crystal calibration sample last for the calibration time at the calibration temperature provided by the embodiment of the present application;

[0061] wherein:

[0062] 1-vertical high-temperature resistance furnace; 2-furnace temperature measuring thermocouple; 3-temperature measuring crystal calibration sample; 4-calibration sample temperature measuring thermocouple; 5-bracket; 6-hanger; 7-controller; 8-fan; 9-temperature measuring crystal calibration sample.

[0063] In order to better illustrate the embodiment, some components in the drawings may be omitted, enlarged or reduced, and do not represent the actual product size; in addition, the drawings are used for exemplary illustration, and the positional relationship is limited to exemplary illustration only, and cannot be understood as a limitation on the patent. DETAILED DESCRIPTION

[0064] In order to make the technical solutions of the present application and its advantages clearer, the technical solutions of the present application will be further clearly and completely described in combination with the drawings, it can be understood that the specific embodiments described herein are only part of the embodiments of the present application, and are only used to explain the present application, but not to limit the present application. It should be noted that, in order to facilitate the description, only the parts related to the present application are shown in the drawings, and other related parts can be referred to the usual design, and in the case of no conflict, the embodiments in the present application and the technical features in the embodiments can be combined to obtain new embodiments.

[0065] In addition, unless otherwise defined, technical terms or scientific terms used in the description of the present application shall be understood as the general meaning understood by those of ordinary skill in the art to which the present application belongs. The words of orientation such as "upper", "lower", "left", "right", "center", "vertical", "horizontal", "inner", "outer" and the like used in the description of the present application only indicate relative directions or positional relationships, and do not imply that the device or element must have a particular orientation, be constructed and operated in a particular orientation, and the relative positional relationship thereof may also change accordingly when the absolute position of the described object changes, therefore it cannot be understood as a limitation on the present application. The "first", "second", "third" and the like used in the description of the present application are only for the purpose of description, in order to distinguish different components, and cannot be understood as indicating or implying relative importance. The "one", "an" or "the" and the like used in the description of the present application should not be understood as an absolute limitation on the quantity, but should be understood as the presence of at least one. The "includes" or "contains" and the like used in the description of the present application means that the elements or objects appearing before the word are covered by the elements or objects listed after the word and their equivalents, without excluding other elements or objects.

[0066] In addition, it should be further pointed out that, unless otherwise explicitly specified and limited, the "mounting", "connection", "connection" and the like used in the description of the present application should be understood in a broad sense, for example, the connection can be fixed connection, or detachable connection, or integral connection; can be mechanical connection, or electrical connection; can be directly connected, or indirectly connected through intermediate medium, or the internal communication of two elements, those skilled in the art can understand the specific meaning of the present application according to the specific circumstances.

[0067] The following will be described in detail in combination with the accompanying drawings Figures 1 to 5 The present application will be further described in detail.

[0068] In one aspect, a temperature measuring crystal calibration device is provided, comprising:

[0069] The vertical high-temperature resistance furnace 1 has a notch on the furnace door;

[0070] The temperature measuring thermocouple 2 is arranged in the furnace chamber of the vertical high-temperature resistance furnace 1;

[0071] The temperature measuring crystal calibration sample block 3 has a temperature measuring crystal calibration sample mounting hole thereon;

[0072] The calibration sample block temperature measuring thermocouple 4 is connected to the calibration sample block 3;

[0073] The bracket 5;

[0074] The boom 6 has one end connected to the calibration sample block 3 and the other end slidingly connected to the bracket 5;

[0075] When the furnace door of the vertical high-temperature resistance furnace 1 is opened, the end of the hanger rod 6 connected to the calibration sample block 3 can extend into the furnace chamber of the vertical high-temperature resistance furnace 1 or retract from the furnace chamber of the vertical high-temperature resistance furnace 1;

[0076] When the end of the hanger rod 6 connected to the calibration sample block 3 extends into the furnace chamber of the vertical high-temperature resistance furnace 1, the gap on the furnace door is clamped on the hanger rod 6 when the furnace door of the vertical high-temperature resistance furnace 1 is closed.

[0077] For the temperature measuring crystal calibration device disclosed in the above embodiment, those skilled in the art can understand that it can realize rapid calibration of the temperature measuring crystal, and the specific calibration process can refer to the temperature measuring crystal calibration method disclosed in the present application.

[0078] In some optional embodiments, in the temperature measuring crystal calibration device, a uniform temperature tube is arranged in the furnace chamber of the vertical high-temperature resistance furnace 1, so as to form a uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1;

[0079] The furnace chamber temperature measuring thermocouple 2 is arranged in the uniform temperature zone;

[0080] The end of the hanger rod 6 connected to the calibration sample block 3 extends into the furnace chamber of the vertical high-temperature resistance furnace 1 and can reach the uniform temperature zone.

[0081] In some optional embodiments, in the temperature measuring crystal calibration device, the temperature measuring crystal calibration sample block 3 is in a columnar shape, has a temperature measuring crystal calibration sample mounting hole at one end, and is connected to the calibration sample block temperature measuring thermocouple 4 at the other end.

[0082] In some optional embodiments, the temperature measuring crystal calibration device further comprises:

[0083] The furnace door driving linear module is connected to the vertical high-temperature resistance furnace 1 and connected to the furnace door of the vertical high-temperature resistance furnace 1, so as to drive the furnace door of the vertical high-temperature resistance furnace 1 to open or close;

[0084] The hanger rod driving linear module is connected between the bracket 5 and the end of the hanger rod 6 away from the calibration sample block 3, so as to drive the end of the hanger rod 6 away from the calibration sample block 3 to slide on the bracket 5.

[0085] In some optional embodiments, the temperature measuring crystal calibration device further comprises:

[0086] The controller 7 is connected to the vertical high-temperature resistance furnace 1, the furnace chamber temperature measuring thermocouple 2, and the calibration sample block temperature measuring thermocouple 4, so as to regulate and control the temperature in the vertical high-temperature resistance furnace 1 according to the temperature signals fed back by the furnace chamber temperature measuring thermocouple 2 and the calibration sample block temperature measuring thermocouple 4;

[0087] The controller 7 is connected with the furnace door driving linear module, so as to control the action of the furnace door driving linear module, and make the furnace door of the vertical high-temperature resistance furnace 1 open or close.

[0088] The controller 7 is connected with the boom driving linear module, so as to control the action of the boom driving linear module, and make the end of the boom 6 away from the calibration sample block 3 slide on the support 5.

[0089] For the temperature measuring crystal calibration device disclosed in the above embodiment, those skilled in the art can understand that a corresponding program can be embedded in the controller 7, so that the calibration of the temperature measuring crystal can be automatically completed.

[0090] In some optional embodiments, the temperature measuring crystal calibration device disclosed above further comprises:

[0091] The fan 8 is connected to the furnace chamber of the vertical high-temperature resistance furnace 1 through a pipeline, so as to air cool the furnace chamber of the vertical high-temperature resistance furnace 1.

[0092] The controller 7 is connected with the fan 8, so as to control the start and stop of the fan 8.

[0093] In another aspect, a temperature measuring crystal calibration method is provided, comprising:

[0094] The temperature measuring crystal calibration sample 9 is installed in the temperature measuring crystal calibration sample installation hole, and is fixed by high-temperature resistant water-soluble glue.

[0095] The temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled, and the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1 is preheated.

[0096] The furnace door of the vertical high-temperature resistance furnace 1 is opened, the temperature measuring crystal calibration sample block 3 is placed in the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1, and the furnace door of the vertical high-temperature resistance furnace 1 is closed.

[0097] The temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled, and the temperature measuring crystal calibration sample block 3 is preheated.

[0098] The temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled, so that the temperature of the temperature measuring crystal calibration sample block 3 is kept at the calibration temperature for a calibration time.

[0099] The furnace door of the vertical high-temperature resistance furnace 1 is opened, and the temperature measuring crystal calibration sample block 3 is taken out from the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1.

[0100] The temperature measuring crystal calibration sample block 3 is cooled, and when it is cooled to 0.7T b , it is considered that the heat preservation process of the calibration operation of the temperature measuring crystal calibration sample block 3 is successful, and the following steps are performed after cooling to room temperature.

[0101] The fast-drying adhesive is used to surround the temperature measuring crystal calibration sample 9 to form a cylinder, and water is injected into the cylinder to dissolve the high-temperature resistant water-soluble adhesive, and then the temperature measuring crystal calibration sample 9 is taken out;

[0102] The interplanar spacing of the temperature measuring crystal calibration sample 9 is measured and analyzed by an X-ray diffractometer, and the interplanar spacing change rate Δd of the temperature measuring crystal calibration sample 9 is calculated, where d0 is the original interplanar spacing of the temperature measuring crystal calibration sample 9, and d is the original interplanar spacing of the temperature measuring crystal calibration sample 9 after calibration;

[0103] The temperature measuring crystal calibration sample 9 is replaced, and the above steps are repeated by changing the calibration temperature and the calibration time.

[0104] The calibration temperature-interplanar spacing change rate at each calibration time is plotted, as shown in Figure 3 , and the calibration of the temperature measuring crystal is completed.

[0105] In some optional embodiments, the temperature measuring crystal calibration method is described, and the temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled, and the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1 is preheated, as shown in Figure 4 , specifically as follows:

[0106] The uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1 is heated, and the temperature T h =T b -ΔT is maintained for 1 min and then ended; wherein:

[0107] T h is the temperature of the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace 1, which is measured by the temperature measuring thermocouple 2 in the furnace chamber;

[0108] T b is the calibration temperature of the temperature measuring crystal calibration sample 9;

[0109] ΔT is the temperature calibration accuracy of the temperature measuring crystal calibration sample 9;

[0110] The temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled, and the temperature measuring crystal calibration sample 3 is preheated, as shown in Figure 4 , specifically as follows:

[0111] The temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled to heat the temperature measuring crystal calibration sample 3;

[0112] After the temperature T k of the temperature measuring crystal calibration sample 3 rises to 0.7T b , the temperature in the furnace chamber of the vertical high-temperature resistance furnace 1 is controlled to heat the uniform temperature zone by max(0.7(T b -ΔT-T k ), ΔT) per minute, until T k =Tb - ATend, wherein the temperature T of the temperature measuring crystal calibration sample 3 k , is the temperature of the temperature measuring crystal calibration sample 9, measured by the calibration sample temperature measuring thermocouple 4.

[0113] In some alternative embodiments, in the temperature measuring crystal calibration method described above, the temperature in the furnace of the vertical high-temperature resistance furnace 1 is controlled so that the temperature of the temperature measuring crystal calibration sample 3 is maintained at the calibration temperature for the calibration time, as shown in Figure 5 , specifically:

[0114] The temperature in the furnace of the vertical high-temperature resistance furnace 1 is adjusted every 1 min until the cumulative time reaches the calibration time, and the adjustment method is as follows:

[0115] If T b + 1 / 2 AT < T k < T b + AT, the temperature in the furnace of the vertical high-temperature resistance furnace 1 is controlled so that the temperature in the uniform temperature zone is decreased by T k - T b ;

[0116] If T b - AT < T k < T b - 1 / 2 AT, the temperature in the furnace of the vertical high-temperature resistance furnace 1 is controlled so that the temperature in the uniform temperature zone is increased by T b - T k ;

[0117] In the process of controlling the temperature in the furnace of the vertical high-temperature resistance furnace 1 so that the temperature of the temperature measuring crystal calibration sample 3 is maintained at the calibration temperature for the calibration time, the temperature of the temperature measuring crystal calibration sample 3 can be maintained between T b - 1 / 2 AT and T b + 1 / 2 AT by referring to the above method, which meets the accuracy requirement of temperature calibration of the temperature measuring crystal calibration sample 3. If the temperature of the temperature measuring crystal calibration sample 3 is less than T b - AT or greater than T b + AT during this process, the temperature calibration of the temperature measuring crystal calibration sample 3 fails.

[0118] In a specific embodiment, when the temperature measuring crystal is used for temperature measurement during the test of an aero-engine, the calibration temperature, calibration time, and calibration accuracy selection are determined as follows when the temperature measuring crystal is calibrated:

[0119] The test course of the aero-engine is generally a step course, the test course of the aero-engine crystal temperature measurement is divided into individual steps, the test time of each individual step is counted, and the test time is respectively t1, t2, t3, …, tn minutes from small to large, a set of calibration time is formed, the general calibration time t is a positive integer, t1 is not less than 3 minutes, and tn is not greater than 60 minutes.

[0120] The temperature measurement range required by the aero-engine test is determined as the calibration temperature range Tx-Ty℃, the measurement accuracy is determined as the calibration temperature accuracy ±ΔT, Tx≥100, Ty≤1800, and ΔT≥10.

[0121] The maximum state test time of the temperature measurement crystal is greater than or equal to 15 minutes when the temperature is less than 400℃.

[0122] The combination of the calibration temperature and the calibration time is determined as follows:

[0123]

[0124] The embodiments in the specification are described in a progressive manner, and each embodiment focuses on the difference from other embodiments. The same or similar parts between the embodiments can be referred to each other.

[0125] So far, the technical scheme of the application has been described in combination with the preferred embodiments shown in the drawings. It should be understood by those skilled in the art that the protection scope of the application is obviously not limited to these specific embodiments. Without deviating from the principles of the application, those skilled in the art can make equivalent changes or replacements to the related technical features, and the technical scheme after the changes or replacements will fall within the protection scope of the application.

Claims

1. A temperature measuring crystal calibration method based on a temperature measuring crystal calibration device, the temperature measuring crystal calibration device comprising: a vertical high-temperature resistance furnace (1) having a gap on the furnace door; a temperature measuring thermocouple (2) arranged in the furnace chamber of the vertical high-temperature resistance furnace (1); a temperature measuring crystal calibration sample block (3) having a temperature measuring crystal calibration sample mounting hole; a calibration sample block temperature measuring thermocouple (4) connected to the calibration sample block (3); a support (5); a boom (6) having one end connected to the calibration sample block (3) and the other end slidingly connected to the support (5); when the furnace door of the vertical high-temperature resistance furnace (1) is opened, one end of the boom (6) connected to the calibration sample block (3) can be extended into or retracted from the furnace chamber of the vertical high-temperature resistance furnace (1); when one end of the boom (6) connected to the calibration sample block (3) is extended into the furnace chamber of the vertical high-temperature resistance furnace (1), the gap on the furnace door is clamped on the boom (6) when the furnace door of the vertical high-temperature resistance furnace (1) is closed; the temperature measuring crystal calibration method comprises: installing a temperature measuring crystal calibration sample (9) in the temperature measuring crystal calibration sample mounting hole and fixing it with high-temperature resistant water-soluble glue; controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to preheat the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace (1); opening the furnace door of the vertical high-temperature resistance furnace (1), placing the temperature measuring crystal calibration sample block (3) in the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace (1), and closing the furnace door of the vertical high-temperature resistance furnace (1); controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to preheat the temperature measuring crystal calibration sample block (3); controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to maintain the temperature of the temperature measuring crystal calibration sample block (3) at the calibration temperature for a calibration time; opening the furnace door of the vertical high-temperature resistance furnace (1) and taking out the temperature measuring crystal calibration sample block (3) from the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace (1); cooling the temperature measuring crystal calibration sample block (3); surrounding the temperature measuring crystal calibration sample mounting hole with fast-drying glue water on the temperature measuring crystal calibration sample block (3), injecting water into it, dissolving the high-temperature resistant water-soluble glue, and taking out the temperature measuring crystal calibration sample (9); measuring and analyzing the interplanar spacing of the temperature measuring crystal calibration sample (9) with an X-ray diffractometer, and calculating the interplanar spacing change rate of the temperature measuring crystal calibration sample (9); replacing the temperature measuring crystal calibration sample (9), changing the calibration temperature and calibration time, and repeating the above steps; drawing the calibration temperature-interplanar spacing change rate at each calibration time to complete the calibration of the temperature measuring crystal; and the specific steps of controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to preheat the uniform temperature zone in the furnace chamber of the vertical high-temperature resistance furnace (1) are: ΔT is the temperature calibration accuracy of the temperature measuring crystal calibration sample (9); the specific steps of controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to preheat the temperature measuring crystal calibration sample block (3) are: controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to heat the temperature measuring crystal calibration sample block (3); and the specific steps of controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to maintain the temperature of the temperature measuring crystal calibration sample block (3) at the calibration temperature for a calibration time are: controlling the temperature in the furnace chamber of the vertical high-temperature resistance furnace (1) to heat the temperature measuring crystal calibration sample block (3). ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ ​ The uniform temperature zone in the hearth of the vertical high-temperature resistance furnace (1) is heated, and the temperature is T h = T b - ΔT, and the heating lasts for 1 min, and then ends; wherein: T h Temperature of uniform temperature zone in furnace of vertical high-temperature resistance furnace (1) T b to calibrate the sample (9) to a calibration temperature; ​ ​ ​ The temperature T of the temperature-sensing crystal calibration block (3) is measured k to 0.7T b After that, the temperature in the hearth of the vertical high-temperature resistance furnace (1) is controlled to make the temperature in the uniform temperature zone increase by max(0.7(T b -ΔT-T k ), ΔT) per minute until T k =T b -ΔT is finished; the temperature in the hearth of the vertical high-temperature resistance furnace (1) is controlled to make the temperature of the temperature-sensing crystal calibration block (3) last for a calibration time at the calibration temperature, specifically: The temperature in the furnace of the vertical high-temperature resistance furnace (1) is adjusted every 1 min until the cumulative time reaches the calibration time, and the adjustment mode is as follows: If T b +1 / 2ΔT≤T k ≤T b +ΔT, then control the temperature in the hearth of the vertical high-temperature resistance furnace (1) to decrease the temperature in the uniform temperature zone T k -T b ; If T b -ΔT≤T k ≤T b -1 / 2ΔT, then control the temperature in the hearth of the vertical high-temperature resistance furnace (1) to make the temperature in the uniform temperature zone rise T b -T k .

2. The temperature measuring crystal calibration method of claim 1, wherein, In the temperature measuring crystal calibration device, a uniform temperature tube is arranged in the furnace of the vertical high-temperature resistance furnace (1), and a uniform temperature zone can be formed in the furnace of the vertical high-temperature resistance furnace (1); The furnace temperature measuring thermocouple (2) is arranged in the uniform temperature zone; One end of the boom (6) connected to the calibration sample block (3) extends into the furnace of the vertical high-temperature resistance furnace (1) and can reach the uniform temperature zone.

3. The temperature measuring crystal calibration method of claim 2, wherein, In the temperature measuring crystal calibration device, the temperature measuring crystal calibration sample block (3) is columnar, one end has the temperature measuring crystal calibration sample mounting hole, and the other end is connected to the calibration sample block temperature measuring thermocouple (4).

4. The temperature measuring crystal calibration method of claim 3, wherein, The temperature measuring crystal calibration device further comprises: A furnace door driving linear module is connected to the vertical high-temperature resistance furnace (1) and connected to the furnace door of the vertical high-temperature resistance furnace (1) to drive the furnace door of the vertical high-temperature resistance furnace (1) to open or close; A boom driving linear module is connected between the bracket (5) and one end of the boom (6) away from the calibration sample block (3) to drive one end of the boom (6) away from the calibration sample block (3) to slide on the bracket (5).

5. The temperature measuring crystal calibration method of claim 4, wherein, The temperature measuring crystal calibration device further comprises: A controller (7) is connected to the vertical high-temperature resistance furnace (1), the furnace temperature measuring thermocouple (2), and the calibration sample block temperature measuring thermocouple (4) to regulate the temperature in the vertical high-temperature resistance furnace (1) according to the temperature signals fed back by the furnace temperature measuring thermocouple (2) and the calibration sample block temperature measuring thermocouple (4); The controller (7) is connected to the furnace door driving linear module to control the action of the furnace door driving linear module to open or close the furnace door of the vertical high-temperature resistance furnace (1); The controller (7) is connected to the boom driving linear module to control the action of the boom driving linear module to make one end of the boom (6) away from the calibration sample block (3) slide on the bracket (5).

6. The temperature measuring crystal calibration method of claim 5, wherein, The temperature measuring crystal calibration device further comprises: A fan (8) is connected to the furnace of the vertical high-temperature resistance furnace (1) through a pipeline to air cool the furnace of the vertical high-temperature resistance furnace (1); The controller (7) is connected to the fan (8) to control the start and stop of the fan (8).

Images