Manufacturing method of multi-layer light guide, performance control system and electronic device

Abstract

The present application discloses a manufacturing method and a performance control system and an electronic device for a multi-layer light guide. The manufacturing method for the multi-layer light guide comprises: taking at least two light guides to form a simulated light guide; deflecting the debugged light guide relative to the reference light guide for multiple times, and measuring the deflection angle after each deflection and the optical parameters of the simulated light guide, determining the correspondence between the deflection angle and the optical parameter, and obtaining the deflection threshold of the deflection angle under a predetermined threshold of the optical parameter according to the correspondence; superimposing at least two of the light guides so that the deflection angle between any two of the light guides is within the deflection threshold, and obtaining a multi-layer light guide. The present application controls the parallelism between the light guides during the manufacturing process, so that the obtained multi-layer light guide exhibits good optical performance and improves the imaging effect of the multi-layer light guide.

Description

Technical Field

[0001] The present application relates to optical waveguides, and more specifically, to a method for manufacturing a multi-layer light guide, a performance control system, and an electronic device. Background Art

[0002] An optical waveguide is a medium device that guides light waves to propagate therein, also known as a dielectric optical waveguide, and is often used in AR (augmented reality) devices. According to the functional requirements of some products, the processed single-color waveguide sheets need to be stacked again to improve the optical performance of the optical waveguide to meet the normal functions of optical waveguide AR lenses and other devices.

[0003] In a multi-layer optical waveguide, the parallelism between the waveguide sheets will affect the final imaging angle of the optical waveguide. However, in the existing lamination process of the multi-layer optical waveguide, the parallelism between the waveguide sheets is usually not controlled, which causes the imaging angle of each waveguide sheet to shift, resulting in lower optical performance parameters of the finished optical waveguide and poor imaging effect. Summary of the invention

[0004] One purpose of the present application is to provide a method for manufacturing a multi-layer light guide and a performance control system as well as a new technical solution for electronic devices.

[0005] According to a first aspect of the present application, a method for manufacturing a multi-layer light guide is provided, comprising:

[0006] Take at least two light guides, fix one of them as a reference light guide, and fix the other as debugging light guides parallel to the reference light guide, the reference light guide and the debugging light guide form a simulated light guide;

[0007] Deflecting the debugging light guide sheet relative to the reference light guide sheet for multiple times, and measuring the deflection angle after each deflection and the optical parameters of the simulated light guide, determining the corresponding relationship between the deflection angle and the optical parameters, and obtaining the deflection threshold of the deflection angle under a predetermined threshold of the optical parameters according to the corresponding relationship;

[0008] At least two of the light guide sheets are overlapped so that the deflection angle between any two of the light guide sheets is within the deflection threshold, thereby obtaining a multi-layer light guide component.

[0009] Optionally, deflecting the debugging light guide sheet multiple times relative to the reference light guide sheet includes:

[0010] The debugging light guide is deflected along the X direction and / or the Y direction relative to the reference light guide; and the debugging light guide is deflected along the X direction and / or the Y direction with multiple amplitudes.

[0011] Optionally, measuring the deflection angle after each deflection and the optical parameters of the simulated light guide comprises:

[0012] A plurality of measuring positions are respectively set on the simulated light guide along the X direction and / or the Y direction. After each deflection of the debug light guide, the thickness of the air gap between the debug light guide and the reference light guide at any two of the measuring positions in the corresponding deflection direction and the distance between the two measuring positions are measured. The deflection angle is calculated based on the measurement results.

[0013] Optionally, the distance between the two measuring positions is: a distance between the two measuring positions projected onto the debugging light guide sheet or projected onto the reference light guide sheet.

[0014] Optionally, the plurality of measurement positions are distributed at the edge of the simulated light guide.

[0015] Optionally, a thickness detection probe is respectively arranged at the two measurement positions to measure the thickness of the air gap in real time, and to measure the distance between the two thickness detection probes.

[0016] Optionally, making the deflection angle within the deflection threshold includes:

[0017] When at least two of the light guide sheets are superimposed, the position of the reference light guide sheet is fixed, and the deflection angles of the remaining debugging light guide sheets relative to the reference light guide sheet are controlled to fall within the deflection threshold; and

[0018] After overlapping at least two light guide sheets, the deflection angle between any two of the light guide sheets is measured to screen out the multi-layer light guide components that fall within the deflection threshold.

[0019] According to a second aspect of the present application, a performance control system for a multi-layer light guide is provided, which is applied to the manufacturing method described in the first aspect, and includes:

[0020] A fixing fixture, the fixing fixture is used to fix the simulated light guide and adjust the deflection angle of the debugging light guide;

[0021] An optical machine, the optical machine being used to project a test pattern onto the simulated light guide;

[0022] A camera, the camera being used to acquire the test pattern emitted from the simulated light guide;

[0023] A thickness tester, comprising a plurality of thickness detection probes, for measuring the thickness of the air gap between the debugging light guide and the reference light guide; the deflection angle is measured by the air gap thickness and the distance between the thickness detection probes.

[0024] Optionally, the fixing tool comprises:

[0025] A base and a deflection frame capable of deflecting relative to the base, wherein the base and the deflection frame are both frame-shaped structures with a hollow area at the center, and the frame-shaped structure is provided with a plurality of air suction holes;

[0026] The reference light guide is fixed on the base through the plurality of air suction holes, the debugging light guide is fixed on the deflection frame through the plurality of air suction holes, and the thickness tester is arranged in the hollow area of ​​the frame structure.

[0027] According to a third aspect of the present application, an electronic device is provided, comprising the multi-layer light guide member described in the first aspect.

[0028] According to one embodiment of the present application, two light guides are fixed to form a simulated light guide, and the debug light guide is deflected multiple times relative to the reference light guide, the deflection angle each time and the optical parameters of the current simulated light guide are measured to obtain a correspondence between the two, and based on this correspondence, the deflection threshold of the deflection angle within a predetermined threshold of the optical parameter can be inferred, and this deflection threshold is the maximum tolerable amount that the debug light guide can deflect relative to the reference light guide.

[0029] In the process of superimposing at least two light guides, the deflection angle between any two of the light guides is made within the deflection threshold, thereby achieving control over the parallelism of the light guides, so that the multi-layer light guide component obtained after superposition exhibits good optical properties, thereby improving the imaging effect of the multi-layer light guide component.

[0030] Other features and advantages of the present application will become apparent from the following detailed description of exemplary embodiments of the present application with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the application and, together with the description, serve to explain the principles of the application.

[0032] Figure 1 It is a schematic diagram of the deflection of the debugging light guide plate relative to the reference light guide plate of the present application.

[0033] Figure 2 It is a schematic diagram of the distribution of various measurement positions on the debugging light guide plate of the present application.

[0034] Figure 3 It is a schematic diagram of calculating the deflection angle in this application.

[0035] Figure 4 It is a schematic diagram of a control device for a multi-layer light guide in the present application.

[0036] Figure 5 It is a schematic diagram of the structure of the base or deflection frame of the fixed tooling in this application.

[0037] Among them, 1. reference light guide; 2. debugging light guide; 21. measurement position; 3. optical machine; 4. camera; 5. fixing tool; 51. frame structure; 52. hollow area; 53. air intake hole; 6. thickness tester; a. air gap; θ, deflection angle. DETAILED DESCRIPTION

[0038] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that unless otherwise specifically stated, the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present application.

[0039] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present application, its application, or uses.

[0040] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.

[0041] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0042] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0043] like Figures 1 to 5As shown, according to an embodiment of the present application, a method for manufacturing a multi-layer light guide is provided, comprising: taking at least two light guides, fixing one of them as a reference light guide 1, and fixing the other as a debugging light guide 2 parallel to the reference light guide 1, wherein the reference light guide 1 and the debugging light guide 2 form a simulated light guide; deflecting the debugging light guide 2 relative to the reference light guide 1 for multiple times, and measuring the deflection angle θ after each deflection and the optical parameters of the simulated light guide, determining the corresponding relationship between the deflection angle θ and the optical parameters, and obtaining the deflection threshold of the deflection angle θ under a predetermined threshold of the optical parameters according to the corresponding relationship; superimposing at least two of the light guides, so that the deflection angle θ between any two of the light guides is within the deflection threshold, and obtaining a multi-layer light guide. It is worth noting that the light guide is an optical waveguide, and the light guide is a waveguide.

[0044] Specifically, in actual production, the above manufacturing method can be carried out according to the following steps:

[0045] refer to Figure 4 , take at least two light guides, and in this embodiment, two light guides are taken as examples, one of which is used as a reference light guide 1 and can be fixed parallel to the horizontal plane, and the other is used as a debugging light guide 2, which is fixed above the reference light guide 1, and the debugging light guide 2 is parallel to the reference light guide 1, and there is an air gap a between the parallel debugging light guide 2 and the reference light guide 1. At this time, the module formed by the two light guides is a simulated light guide, and the optical performance of the light guide after being actually superimposed into a finished product can be reflected by measuring its optical parameters.

[0046] refer to Figure 1 , control the debugging light guide 2 to perform deflection debugging at multiple angles, and measure the deflection angle θ and the optical parameters of the simulated light guide after each deflection. Among them, the deflection angle θ refers to the angle between the plane where the debugging light guide 2 is located and the plane where the reference light guide 1 is located. The measurement method can be directly measured by an angle measuring instrument, or it can be obtained by indirectly calculating by measuring other parameters. This application does not limit this. In addition, the optical parameters of the simulated light guide can be one optical parameter or multiple optical parameters, such as contrast, MTF (modulation transfer function), brightness uniformity, chromaticity uniformity, optical efficiency, distortion, chromatic aberration, etc., which can be selected according to the optical device used, and this application does not limit this.

[0047] Through the above measurement, a one-to-one correspondence between the deflection angle θ and the optical parameter can be obtained. Based on this correspondence, the deflection threshold of the deflection angle θ under the predetermined threshold of the optical parameter can be inferred. That is, the predetermined thresholds (critical values ​​of optical performance) of one or several optical parameters can be set according to the requirements of the optical device to which the multi-layer light guide is applied. Based on the predetermined thresholds of the optical parameters, the deflection threshold of the deflection angle θ can be determined by referring to the correspondence.

[0048] With the above-mentioned range standard of the deflection threshold, the parallelism of each light guide plate can be controlled during the manufacturing process of the light guide plate, so as to obtain a multi-layer light guide that can exhibit predetermined optical parameters to improve its optical performance. If the deflection angle θ between each light guide plate of the stacked multi-layer light guide falls within the deflection threshold range, it means that its optical performance meets the design requirements. If the deflection angle θ falls outside the range of the deflection threshold, it means that its optical performance is poor and does not meet the design requirements. During the manufacturing process, by controlling the deflection angle θ between each light guide plate within the deflection threshold, defective products are screened out in advance, and then the optical performance of the finished product is optimized to ensure that the optical performance of the final product is improved. Among them, the stacking process refers to the process of gluing the light guide plates to form a fixed position relationship.

[0049] Alternatively, if Figure 1 and Figure 2 As shown, the debugging light guide plate 2 is deflected multiple times relative to the reference light guide plate 1, including deflecting the debugging light guide plate 2 relative to the reference light guide plate 1 along the X direction and / or the Y direction respectively; and deflecting the debugging light guide plate 2 along the X direction and / or the Y direction respectively with multiple amplitudes.

[0050] Specifically, when the debugging light guide 2 is deflected multiple times, the deflection debugging can be performed along the X direction, the Y direction or the XY direction respectively, so as to obtain the correspondence between the deflection angle θ in multiple directions and the optical parameters of the simulated light guide. In addition, multiple amplitudes of deflection debugging can be performed in each direction, that is, the debugging light guide 2 is deflected by multiple deflection angles θ of different sizes relative to the reference light guide 1 in each direction, so as to obtain the correspondence between multiple deflection angles θ and optical parameters in the same direction. Through multiple adjustments in the above two aspects, the correspondence between the obtained deflection angle θ and the optical parameters will be more precise, so that the final deflection threshold value calculated will be more accurate, further improving the optical performance and imaging effect of the final multi-layer light guide.

[0051] Alternatively, if Figure 1 and Figure 2As shown, the deflection angle θ after each deflection and the optical parameters of the simulated light guide are measured, including: setting a plurality of measuring positions 21 on the simulated light guide along the X direction and / or the Y direction, respectively. Preferably, the plurality of measuring positions 21 are distributed at the edge of the simulated light guide. After each deflection of the debugging light guide 2, the thickness of the air gap a between the debugging light guide 2 and the reference light guide 1 and the distance between the two measuring positions 21 are measured at any two measuring positions 21 in the corresponding deflection direction. Optionally, the distance between the two measuring positions 21 projected on the debugging light guide 2 or projected on the reference light guide 1 is measured. According to the above measurement results, the deflection angle θ is calculated.

[0052] Specifically, a plurality of measuring positions 21 are set on the simulated light guide, and the measuring positions 21 may be preferably located at the edges of the simulated light guide (eg, located above the debugging light guide sheet 2) distributed along the X direction and the Y direction, such as Figure 2 As shown, the light guide is rectangular, that is, it can be set in the middle of the four edges of the rectangle. Here, the amplitude of the deflection of the light guide 2 for debugging is more obvious, and it is more convenient and accurate to obtain data during measurement. In addition, in actual operation, the air gap a between the light guides when they are parallel is generally about 100μm, which can ensure the optical performance, so that the maximum deflection amount of the light guide 2 debugged at each measuring position 21 is maintained within 20μm each time, so as to save test time. The deflection amount of the light guide 2 debugged each time can be increased or decreased with equal amplitude at the same measuring position 21 for deflection. For example, the deflection amplitude of one of the measuring positions 21 can be maintained at 1-2μm. Whether it is a mechanical method or an electrical control method, it is easy to control the deflection of the light guide 2 debugged, which improves the efficiency of deflection debugging in the manufacturing process and reduces the management and control costs.

[0053] An implementation method of calculating the deflection angle θ based on the thickness of the air gap a and the distance between the measuring position 21 is as follows: Figure 1 and 2 As shown, x1, x2 and y1, y2 are two measurement positions 21 along the X direction and the Y direction respectively. Taking the X direction as an example, Figure 3 As shown, Tx1 and Tx2 are set as the thickness of the air gap a at the two measuring positions 21 shown in the figure, and Dx1x2 is the distance of the corresponding measuring position 21 projected on the debugging light guide plate 2 or the reference light guide plate 1.

[0054] When Dx1x2 is the distance between two measurement positions 21 projected on the reference light guide plate 1:

[0055] According to the trigonometric formula, we can get: Tanθ x =(Tx1-Tx2) / Dx1x2;

[0056] When Dx1x2 is the distance between two measuring positions 21 projected on the debugging light guide plate 2:

[0057] According to the trigonometric function formula, we can get: Sinθ x =(Tx1-Tx2) / Dx1x2;

[0058] After the measured data is brought in, the deflection angle θ of the debugging light guide plate 2 along the X direction can be obtained. Similarly, the deflection angle θ of the debugging light guide plate 2 along the Y direction or the XY direction can be obtained, which will not be repeated here.

[0059] Alternatively, if Figures 2 to 4 As shown, a thickness detection probe is respectively arranged at the two measuring positions 21 to measure the thickness of the air gap a in real time and to measure the distance between the two thickness detection probes.

[0060] Specifically, the thickness of the air gap a between the debugging light guide 2 and the reference light guide 1 at the two measuring positions 21 is measured in real time by the multi-layer thickness detection probe, and the distance between the two thickness detection probes is measured. The deflection angle θ is controlled in real time according to the measurement results so that it falls within the deflection threshold, thereby improving the optical performance of the multi-layer light guide.

[0061] Optionally, making the deflection angle θ within the deflection threshold comprises:

[0062] When overlapping at least two of the light guides, the position of the reference light guide 1 is fixed, and the deflection angle θ of the remaining debug light guides 2 relative to the reference light guide 1 is controlled to fall within the deflection threshold; and after overlapping at least two of the light guides, the deflection angle θ between any two of the light guides is measured to screen out the multilayer light guide components that fall within the deflection threshold.

[0063] Specifically, in this embodiment, the control of the deflection angle θ may exist during the process of overlapping the light guide sheets, or may exist after the process of overlapping the light guide sheets, to further ensure that the optical properties of the ultimately obtained multi-layer light guide component can be improved.

[0064] According to the second aspect of the present application, Figure 4 and Figure 5As shown, the present embodiment provides a performance control system for a multi-layer light guide, which is applied to the manufacturing method described in the first aspect, and includes a fixing tool 5, an optical machine 3, a camera 4 and a thickness tester 6; the fixing tool 5 is used to fix the simulated light guide and adjust the deflection angle θ of the debug light guide 2; the optical machine 3 is used to project a test pattern onto the simulated light guide; the camera 4 is used to obtain the test pattern emitted from the simulated light guide; the thickness tester 6 includes a plurality of thickness detection probes, and the thickness tester 6 is used to measure the thickness of the air gap a between the debug light guide 2 and the reference light guide 1; the deflection angle θ is measured by the thickness of the air gap a and the distance between the thickness detection probe.

[0065] The performance control system of the multi-layer light guide provided in the present application can be applied to any of the above-mentioned embodiments, and can detect or provide relevant test data for multiple light guides during the overlapping process. It has a simple structure, accurate measurement data, and is easy to operate, which improves the process efficiency of the multi-layer light guide during the manufacturing process and ensures the optical performance of the final product.

[0066] Optionally, the fixed tooling 5 includes: a base and a deflection frame capable of deflecting relative to the base, the base and the deflection frame are both a frame-shaped structure 51 with a hollow area at the center, and a plurality of air suction holes 53 are provided on the frame-shaped structure 51; the reference light guide 1 is fixed to the base through the plurality of air suction holes 53, the debugging light guide 2 is fixed to the deflection frame through the plurality of air suction holes 53, and the thickness tester 6 is arranged in the hollow area 52 of the frame-shaped structure 51.

[0067] Specifically, in this embodiment, the deflection of the debugging light guide sheet 2 is achieved by a fixing fixture 5, and the multiple suction holes 53 on the base and the deflection frame can adsorb and fix the reference light guide sheet 1 or the debugging light guide sheet 2, and can slowly adjust the pitch angle of the deflection frame to generate different deflection angles θ between the debugging light guide sheet 2 and the reference light guide sheet 1. The thickness of the air gap a between the debugging light guide sheet 2 and the reference light guide sheet 1 is measured by a thickness tester 6, and the deflection angle θ of the debugging light guide sheet 2 is calculated, so that the deflection angle θ is adjusted within the deflection threshold.

[0068] According to the third aspect of the present application, this embodiment provides an electronic device, including the multi-layer light guide provided by any embodiment of the present application.

[0069] The multi-layer light guide provided in the embodiment of the present application is applied to electronic devices. Since the parallelism between the light guide sheets is controlled during the lamination process, the optical performance of the multi-layer light guide is improved, so that the electronic device finally prepared has a good imaging effect. The electronic device in the present application can be an AR glasses or other device, and the present application does not limit this.

[0070] The above embodiments focus on the differences between the various embodiments. As long as the different optimization features between the various embodiments are not contradictory, they can be combined to form a better embodiment. Considering the simplicity of the text, they will not be repeated here.

[0071] Although some specific embodiments of the present application have been described in detail by way of example, it should be understood by those skilled in the art that the above examples are only for illustration, not for limiting the scope of the present application. It should be understood by those skilled in the art that the above embodiments may be modified without departing from the scope and spirit of the present application. The scope of the present application is defined by the appended claims.

Claims

1. A method for manufacturing a multi-layer light guide, characterized in that: include: Take at least two light guides, fix one of them as a reference light guide, and fix the other as debugging light guides parallel to the reference light guide, the reference light guide and the debugging light guide form a simulated light guide; Deflecting the debugging light guide sheet relative to the reference light guide sheet for multiple times, and measuring the deflection angle after each deflection and the optical parameters of the simulated light guide, determining the corresponding relationship between the deflection angle and the optical parameters, and obtaining the deflection threshold of the deflection angle under a predetermined threshold of the optical parameters according to the corresponding relationship; The step of deflecting the debugging light guide sheet relative to the reference light guide sheet for multiple times comprises: deflecting the debugging light guide sheet relative to the reference light guide sheet along the X direction and / or the Y direction respectively; and deflecting the debugging light guide sheet along the X direction and / or the Y direction for multiple amplitudes respectively; At least two of the light guide sheets are overlapped so that the deflection angle between any two of the light guide sheets is within the deflection threshold, thereby obtaining a multi-layer light guide component.

2. The method for manufacturing a multi-layer light guide according to claim 1, characterized in that: Measuring the deflection angle after each deflection and the optical parameters of the simulated light guide, including: A plurality of measuring positions are respectively set on the simulated light guide along the X direction and / or the Y direction. After each deflection of the debug light guide, the thickness of the air gap between the debug light guide and the reference light guide at any two of the measuring positions in the corresponding deflection direction and the distance between the two measuring positions are measured. The deflection angle is calculated based on the measurement results.

3. The method for manufacturing a multi-layer light guide according to claim 2, characterized in that: The distance between the two measuring positions is: the distance between the two measuring positions projected on the debugging light guide sheet or projected on the reference light guide sheet.

4. The method for manufacturing a multi-layer light guide according to claim 2, characterized in that: The plurality of measurement positions are distributed at the edge of the simulated light guide.

5. The method for manufacturing a multi-layer light guide according to claim 2, further comprising: A thickness detection probe is respectively arranged at the two measurement positions to measure the thickness of the air gap in real time and to measure the distance between the two thickness detection probes.

6. The method for manufacturing a multi-layer light guide according to claim 1, characterized in that: The step of making the deflection angle within the deflection threshold comprises: When at least two of the light guide sheets are superimposed, the position of the reference light guide sheet is fixed, and the deflection angles of the remaining debugging light guide sheets relative to the reference light guide sheet are controlled to fall within the deflection threshold; and After overlapping at least two light guide sheets, the deflection angle between any two of the light guide sheets is measured to screen out the multi-layer light guide components that fall within the deflection threshold.

7. A performance control system for a multi-layer light guide, applied to the manufacturing method according to any one of claims 1 to 6, characterized in that: include: A fixing fixture, the fixing fixture is used to fix the simulated light guide and adjust the deflection angle of the debugging light guide; An optical machine, the optical machine being used to project a test pattern onto the simulated light guide; A camera, the camera being used to acquire the test pattern emitted from the simulated light guide; A thickness tester, comprising a plurality of thickness detection probes, for measuring the thickness of the air gap between the debugging light guide and the reference light guide; the deflection angle is measured by the air gap thickness and the distance between the thickness detection probes.

8. The performance control system of the multi-layer light guide according to claim 7, characterized in that: The fixed tooling comprises: A base and a deflection frame capable of deflecting relative to the base, wherein the base and the deflection frame are both frame-shaped structures with a hollow area at the center, and the frame-shaped structure is provided with a plurality of air suction holes; The reference light guide is fixed on the base through the plurality of air suction holes, the debugging light guide is fixed on the deflection frame through the plurality of air suction holes, and the thickness tester is arranged in the hollow area of ​​the frame structure.

9. An electronic device, characterized in that: A multi-layer light guide comprising the multi-layer light guide as described in any one of claims 1 to 6.

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