A test device and test method for the insulation wire resistance

Abstract

The present invention relates to the technical field of thin-film solar cells, and particularly relates to a test device and a test method for the insulation wire resistance. The test device and test method for the insulation wire resistance include: a frame; a support table adapted to support a front electrode layer; a detection frame mounted on the frame and located above the support table; a plurality of module interfaces embedded in the detection frame and evenly distributed along the length direction of the support table, each of the module interfaces being provided with a lead interface, and the lead interface being adapted to be connected to an external power supply through a lead; and a plurality of probes inserted into the module interfaces adjacent to or at intervals, and connected to the corresponding lead interfaces. The test device and test method for the insulation wire resistance provided by the present invention can be applicable to the detection of front electrode layers with different segmentation distances, and have a wider application range.

Description

Technical Field

[0001] The present invention relates to the technical field of thin-film solar cells, and particularly relates to a test device and a test method for the insulation wire resistance. Background Art

[0002] A thin-film solar cell is a device that converts solar energy into clean electric energy and plays an active role in the strategy of realizing the sustainable development of mankind. It can be seen that in the near future, as the cost of thin-film solar cells gradually decreases, the proportion of clean electric energy provided by them in the total global power consumption will gradually increase.

[0003] A thin-film solar cell includes a front electrode layer, a functional layer (PN junction or PIN junction), and a back electrode. After the front electrode layer is prepared, it needs to be effectively segmented to form a plurality of front electrode blocks. After segmentation, it is ensured that the area of each front electrode block is equal and two adjacent front electrode blocks are insulated from each other to form an insulation wire. Two front electrode blocks that are not completely insulated will result in a lack of an effective power generation area and reduce the photoelectric conversion efficiency of the thin-film solar cell. At this time, the front electrode layer needs to be re-segmented.

[0004] Existing devices generally have a plurality of probes with fixed spacings. The probes are externally connected to a power supply and are connected in series with an ammeter. The insulation wire resistance is calculated through the voltage value and current value between adjacent probes: if the ammeter cannot detect the current or the calculated insulation wire resistance is greater than the preset resistance value, it is qualified; if the calculated insulation wire resistance is less than the preset resistance value, it is unqualified. This structure can only test the insulation resistance at a fixed distance. Once the segmentation distance of the front electrode layer changes, the test device cannot meet the tests of all insulation wires. Summary of the Invention

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the defect that the existing devices cannot detect the front electrode layer with different segmentation distances, so as to provide a test device and a test method for the insulation wire resistance.

[0006] To solve the above technical problem, a test device for the insulation wire resistance provided by the present invention includes:

[0007] A frame;

[0008] A support table adapted to support the front electrode layer;

[0009] A detection frame installed on the frame and located above the support table;

[0010] A plurality of module interfaces embedded in the detection frame and evenly distributed along the length direction of the support table. Each module interface is provided with a lead interface, and the lead interface is adapted to be connected to an external power supply through a lead;

[0011] Multiple probes are inserted into the module interface adjacent to or at intervals, and are connected to the corresponding lead interfaces.

[0012] Further, the probe includes:

[0013] A sleeve adapted to be inserted into the module body;

[0014] A probe, partially inserted into the sleeve and slidable along the sleeve;

[0015] A probe head fixed at the end of the probe outside the sleeve;

[0016] A spring pressed in the sleeve and adapted to drive the probe to slide in a direction away from the module interface.

[0017] Further, the probe head is spherical or crescent-shaped.

[0018] Further, the detection rack is mounted on the rack and is adjustable in height.

[0019] Further, there are at least two detection racks distributed along the width direction of the support table, and all the probes on the same side of the insulating wire are connected in parallel.

[0020] Further, it further includes:

[0021] A DC power supply, connected to the corresponding lead interfaces of two adjacent probes through leads, and adapted to provide a fixed voltage difference for the two adjacent probes;

[0022] Multiple ammeters, corresponding to the probes one by one, and adapted to collect the current between two adjacent probes;

[0023] A multi-channel data acquisition module adapted to collect the current values of all the ammeters;

[0024] A data processing module adapted to calculate the corresponding resistance value according to the voltage value between two adjacent probes and the current value of the corresponding ammeter.

[0025] Further, the detection rack is a U-shaped groove member, and the module interface is located at the bottom of the U-shaped groove member.

[0026] The present invention also provides a method for testing the resistance of an insulating wire, which is implemented based on the aforementioned testing device for the resistance of an insulating wire, and specifically includes the following steps:

[0027] S1. Place the divided front electrode layer on the support table;

[0028] S2. Determine the spacing between adjacent probes according to the division distance of the front electrode layer, insert multiple probes into the corresponding module interfaces, and make the lower ends of the probes abut against the front electrode layer;

[0029] S3, connecting the lead interface of the module interface plugged with the probe to an external power supply through a lead wire, and starting detection;

[0030] S4. Read all resistance values. If there is data that is less than the preset resistance value, it does not meet the standard.

[0031] The technical solution of the present invention has the following advantages:

[0032] 1. The test device for insulating wire resistance provided by the present invention is provided with a plurality of module interfaces evenly distributed along the length direction of the support platform. The probe spacing can be adjusted by plugging the probes into different module interfaces to ensure that each divided front electrode block is contacted by a probe, and is suitable for detecting front electrode layers with a variety of different division distances.

[0033] 2. The insulated wire resistance testing device provided by the present invention has a probe with an elastic structure composed of a sleeve, a probe, a probe head, and a spring, which can ensure elastic contact between the probe head and the front electrode layer, avoid damage to the front electrode layer by the probe head, and also protect the probe head.

[0034] 3. In the test device for insulating wire resistance provided by the present invention, the probe head is set to be spherical or crescent-shaped, which can further reduce the damage to the front electrode layer.

[0035] 4. In the test device for the insulated wire resistance provided by the present invention, the detection frame can be raised and lowered and installed on the frame, and the height of the detection frame can be adjusted according to the thickness of the glass substrate, so as to control the probe to fully contact the front electrode layer. In addition, the raising and lowering of the detection frame also facilitates the placement and transportation of the front electrode layer.

[0036] 5. The test device for the resistance of an insulated wire provided by the present invention is provided with at least two detection frames distributed along the width direction of the support platform. The multiple detection frames can detect different positions in the width direction of the front electrode layer, thereby avoiding the misjudgment of a larger resistance value caused by a defect occurring at the far end when a single row of probes detects current.

[0037] 6. The insulated wire resistance testing device provided by the present invention is provided with a DC power supply, an ammeter, a multi-channel data acquisition module, and a data processing module, and can realize automated detection.

[0038] 7. In the test device for the resistance of an insulated wire provided by the present invention, the detection frame is configured as a U-shaped groove member. The probe is lifted up by a spring when not subject to external force and is compressed when in contact with the front electrode. The two wings of the U-shaped groove member can protect the probe and the front electrode layer to avoid irreversible damage caused by excessive force.

[0039] 8. The method for testing the insulated wire resistance provided by the present invention is implemented based on the aforementioned device, so it has any one of the advantages of the aforementioned device. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0041] Figure 1 Structural schematic diagram of the test device according to an embodiment of the present invention;

[0042] Figure 2 A specific structure of the probe according to an embodiment of the present invention;

[0043] Figure 3 Another specific structure of the probe according to an embodiment of the present invention;

[0044] Figure 4 Schematic diagram of the working states of two detection frames according to an embodiment of the present invention;

[0045] Figure 5 Structural schematic diagram of the detection frame according to an embodiment of the present invention;

[0046] Figure 6 Schematic diagram of the resistance calculation principle when two detection frames are adopted according to an embodiment of the present invention;

[0047] Figure 7 Schematic diagram of the resistance calculation principle when a single detection frame is adopted according to an embodiment of the present invention.

[0048] Explanation of reference numerals:

[0049] 1. Frame; 2. Support table; 3. Detection frame; 4. Module interface; 5. Probe; 51. Sleeve; 52. Probe; 53. Probe head; 54. Spring; 55. Ring-shaped cover plate; 56. Baffle. Specific embodiments

[0050] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the drawings. Obviously, the described embodiments are some embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0051] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention. In addition, the terms "first", "second", "third" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0052] In the description of the present invention, it should be noted that unless otherwise clearly specified and defined, the terms "installed", "connected", "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0053] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0054] Embodiment

[0055] Combined Figure 1 And Figure 5 As shown, the test device for the insulation wire resistance provided in this embodiment includes a frame 1, a support table 2, a detection frame 3, a module interface 4, and a probe 5.

[0056] Among them, the frame 1 mainly plays a role of hardware support and can be fixedly connected to the support table 2 or can be independently set.

[0057] Among them, the support table 2 is suitable for supporting the front electrode layer.

[0058] Among them, the detection frame 3 is installed on the frame 1 and is located above the support table 2.

[0059] Among them, there are multiple module interfaces 4, and multiple means at least three. They are embedded in the detection frame 3 and are evenly distributed along the length direction of the support table 2. Each module interface 4 is provided with a lead interface, and the lead interface is suitable for connecting to an external power supply through a lead.

[0060] Among them, there are multiple probes 5, which are inserted into the module interface 4 adjacent to or at intervals, and are connected to the corresponding lead interfaces. The number of probes 5 is determined according to the number of insulating wires of the front electrode sheet to be detected, and the number of probes 5 is one more than the number of insulating wires; the insertion position of the probes 5 in the module interface 4 is determined according to the segmentation width of the front electrode sheet to be detected, and it is necessary to ensure that there is only one probe 5 on each front electrode block (for a single detection rack 3).

[0061] The test device of this embodiment is provided with multiple module interfaces 4. By inserting multiple probes 5 into different module interfaces 4, the detection requirements of the front electrode layers with different segmentation distances can be met, overcoming the defect that the existing equipment can only detect the front electrode layers with a fixed segmentation distance, and has a wide application range.

[0062] As a preferred structure of the above technical solution, the probe 5 includes: a sleeve 51, which is suitable for being inserted into the module body; a probe 52, partially inserted into the sleeve 51 and slidable along the sleeve 51; a probe head 53, fixed at the end of the probe 5 outside the sleeve 51; a spring 54, pressed in the sleeve 51 and suitable for driving the probe 52 to slide in a direction away from the module interface 4. Of course, in order to maintain the structural connection relationship of the probe 52 sliding in the sleeve 51, a limiting member needs to be provided on the sleeve 51 to prevent the probe 52 from falling out of the sleeve 51. Specifically, it can be a protrusion on the inner wall of the sleeve 51 or an additional annular end cover 55, etc. For example Figure 2 and Figure 3 As shown in, an annular end cover 55 is fixed at the end of the sleeve 51. The probe 52 passes through it and a baffle 56 is fixed at the inner end. The diameter of the baffle 56 is larger than that of the probe 52 to limit the spring 54, and the diameter of the baffle 56 is larger than the inner hole diameter of the annular cover plate 55 to prevent slipping. The fixing method of the probe head 53 at the end of the probe 52 can be fixed connection such as welding, bolts, etc., or integrally formed.

[0063] Referring to Figure 2 and Figure 3 , this preferred structure can ensure elastic contact between the probe head 53 and the front electrode layer, avoid damage to the front electrode layer by the probe head 53, and at the same time protect the probe head 53.

[0064] Referring to Figure 2 and Figure 3 , preferably, the probe head 53 is spherical or crescent-shaped. The spherical or crescent-shaped surface is relatively smooth, which can further reduce the damage to the front electrode layer.

[0065] As a further improvement of the above technical solution, the detection frame 3 is installed on the frame 1 and can be adjusted in height. To save manpower, it is preferably to externally connect the detection frame 3 to driving components such as cylinders, linear motors, and electric push rods. On the one hand, the height of the detection frame 3 can be adaptively adjusted according to the thickness of the glass substrate, so that the probe 5 can be in full contact with the front electrode layer; on the other hand, the detection frame 3 can be lifted and lowered, which is also convenient for the placement and transfer of the front electrode layer. During operation, first place the front electrode layer, and then lift and lower the detection frame 3 so that the probe 5 contacts the front electrode layer.

[0066] Referring to Figure 1 and Figure 4 , as a further improvement of the above technical solution, at least two detection frames 3 are provided and distributed along the width direction of the support table 2, and all the probes 5 on the same side of the insulating wire are connected in parallel. This structure can avoid misjudgment of too large resistance values caused by defects located at the far end.

[0067] The following is a detailed explanation of this principle:

[0068] Referring to Figure 6 and Figure 7 , A1 and B1 are two probes 52 on the terminal 1, A2 and B2 are two probes 52 on the terminal 2; A3 is the probe 52 on the terminal 3, A4 is the probe 52 on the terminal 4; M and M' are the points where etching defects occur, and it is assumed that the positions of M and M' are the same; RMA1 is the resistance between M and A1, and so on. Then the resistance between the terminal 1 and the terminal 2:

[0069]

[0070] The resistance between the terminal 3 and the terminal 4:

[0071] R 34 = R M′A3 + R M′ + R M′A4

[0072] It can be known that R12 < R34. Once a defect point occurs, the data analysis outputs a smaller value of resistance, and it is more intuitive to judge the existence of the defect.

[0073] As a further improvement of the above technical solution, the testing device further includes:

[0074] A DC power supply, which is connected to the lead interfaces corresponding to two adjacent probes 5 through leads, and is suitable for providing a fixed voltage difference for the two adjacent probes 5; specifically, a single DC power supply can be used, which can ensure that the voltage difference between every two adjacent probes 5 is the same, or multiple DC power supplies can be used, which are respectively connected to every two adjacent probes 5, but it is also necessary to ensure that the voltage difference between each group of adjacent probes 52 is the same;

[0075] Multiple ammeters, corresponding to the probes 5 one by one, are suitable for collecting the current between two adjacent probes 52; the ammeters located at the two boundaries detect the current of the corresponding probe 5, and this current is a single current, that is, the current passing through the insulated wire. The current of the probe 5 detected by the ammeters in the middle part is the sum of the currents of two adjacent insulated wires. According to the boundary current, the current flowing through each insulated wire can be calculated;

[0076] A multi-channel data acquisition module, suitable for collecting the current values of all ammeters;

[0077] A data processing module, suitable for calculating the corresponding resistance value according to the voltage value between two adjacent probes 5 and the current value of the corresponding ammeter.

[0078] Refer to Figure 5 , as a further improvement of the above technical solution, the detection frame 3 is a U-shaped groove part, and the module interface 4 is located at the bottom of the U-shaped groove part. When the probe 5 is compressed too much, the wing part of the U-shaped groove part abuts against the front electrode layer, which can avoid irreversible damage caused by excessive force on the front electrode layer and the probe 5.

[0079] The testing method of the above-mentioned testing device for the insulated wire resistance specifically includes the following steps:

[0080] S1. Place the divided front electrode layer on the support table 2;

[0081] S2. Determine the distance between adjacent probes 5 according to the division distance of the front electrode layer, insert multiple probes 5 into the corresponding module interfaces 4, and make the lower ends of the probes 5 abut against the front electrode layer;

[0082] S3. Connect the lead interface of the module interface 4 with the inserted probe 5 to an external power supply through a lead and start detection;

[0083] S4. Read all resistance values. If they are less than the preset resistance value, they do not meet the standard.

[0084] Based on the specific implementation form of the testing device in Embodiment 1, the measurement method in this embodiment is as follows:

[0085] S1. Place the divided front electrode layer on the support table 2;

[0086] S2. Determine the distance between adjacent probes 5 according to the division distance of the front electrode layer, insert multiple probes 5 into the corresponding module interfaces 4, and the two detection frames 3 have the same probe 5 arrangement;

[0087] S3. Control the detection frame 3 to descend so that the lower end of the probe 5 abuts against the front electrode layer;

[0088] S4. Connect the lead interface of the module interface 4 with the inserted probe 5 to an external power supply through a lead and start detection;

[0089] S4. Read all the resistance values. If they are less than the preset resistance value, it fails to meet the standard.

[0090] Obviously, the above embodiments are merely examples given for clear illustration and are not limitations on the implementation manners. For those of ordinary skill in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation manners here. And the obvious changes or modifications derived therefrom are still within the protection scope of the present invention.

Claims

1. A test device for the insulation wire resistance, characterized in that, it includes: a frame (1); a support table (2), adapted to support the front electrode layer; a detection frame (3), mounted on the frame (1) and located above the support table (2); a plurality of module interfaces (4), embedded in the detection frame (3) and evenly distributed along the length direction of the support table (2), each of the module interfaces (4) is provided with a lead interface, and the lead interface is adapted to be connected to an external power supply through a lead; a plurality of probes (5), adjacent or spaced and inserted into the module interfaces (4), and connected to the corresponding lead interfaces; a DC power supply, connected to the lead interfaces corresponding to two adjacent probes (5) through a lead, adapted to provide a fixed voltage difference for the two adjacent probes (5); a plurality of ammeters, corresponding to the probes (5) one by one, adapted to collect the current between two adjacent probes (52); the detection frame (3) is provided with at least two and distributed along the width direction of the support table (2), and are respectively located at both ends of the width direction of the support table (2); all the probes (5) on the same side of the insulation wire are connected in parallel.

2. The test device for the insulation wire resistance according to claim 1, characterized in that, the probe (5) includes: a sleeve (51), adapted to be inserted into the module body; a probe (52), partially inserted into the sleeve (51) and slidable along the sleeve (51); a probe head (53), fixed at the end of the probe (5) outside the sleeve (51); a spring (54), pressed in the sleeve (51) and adapted to drive the probe (52) to slide in a direction away from the module body.

3. The test device for the insulation wire resistance according to claim 2, characterized in that, the probe head (53) is spherical or crescent-shaped.

4. The test device for the insulation wire resistance according to claim 1, characterized in that, the detection frame (3) is mounted on the frame (1) and can be adjusted in height.

5. The test device for the insulation wire resistance according to any one of claims 1-4, characterized in that, it further includes: a multi-channel data acquisition module, adapted to acquire the current values of all ammeters; a data processing module, adapted to calculate the corresponding resistance value according to the voltage value between two adjacent probes (5) and the current value of the corresponding ammeter.

6. The test device for the insulation wire resistance according to claims 1-4, characterized in that, the detection frame (3) is a U-shaped groove member, and the module interface (4) is located at the bottom of the U-shaped groove member.

7. A test method for the insulation wire resistance, characterized in that, it is implemented based on the test device for the insulation wire resistance according to any one of claims 1-6, and specifically includes the following steps: S1. Place the divided front electrode layer on the support table (2); S2. Determine the spacing between adjacent probes (5) according to the division distance of the front electrode layer, insert a plurality of the probes (5) into the corresponding module interfaces (4), and make the lower ends of the probes (5) abut against the front electrode layer; S3. Connect the lead interfaces of the module interfaces (4) inserted with the probes (5) to an external power supply through a lead, and start detection; S4. Read all the resistance values. If there is data smaller than the preset resistance value, it fails to meet the standard.

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