Automatic testing machine with signal processing function and information processing method thereof

Abstract

An automated test machine with signal processing function and its information processing method, including a test head for testing more than one device under test, the test head including a test processing device for providing more than one electrical test signal to the device under test, and receiving more than one electrical feedback signal fed back by the device under test, performing signal processing analysis to generate analysis result information. By directly setting the test processing module capable of signal processing in the test head, the signal obtained from the device under test can be directly analyzed and processed, thereby achieving the purpose of reducing the volume, improving the efficiency of signal processing, convenience and reducing costs.

Description

Technical Field

[0001] The present invention relates to a testing machine, and in particular to an automatic testing machine with a signal processing function and an information processing method thereof. Background Art

[0002] Please refer to Figure 1 The figure shows an automatic test system (ATE). The automatic test system is used to test different devices under testing (DUTs), such as wafers or ICs. The automatic test system includes a carrier A, a test head B, a cable C, and an external computing device D. In use, the device under test is placed on the carrier A, and the pins on the test head B contact the device under test for testing, and the obtained signal is transmitted to the external computing device D through the cable C for processing to analyze the test results.

[0003] Since the test head B of the traditional automated testing equipment does not have the ability to process signals, the signal needs to be transmitted to the external computing device D through the cable C for processing. Not only is the equipment bulky, but the signal processing is also time-consuming and inconvenient. Summary of the invention

[0004] In view of the problems existing in the above-mentioned prior art, at least one purpose of the present invention is to provide an automated test machine with signal processing function and an information processing method thereof, by directly setting a module with signal processing function on the test machine head to directly process and analyze the received signal in real time. Since there is no need to connect an external computing device through a cable, and transmit the signal to the external computing device for analysis, the efficiency of signal processing can be effectively improved, and the size and cost of the equipment can be reduced.

[0005] One technical means adopted to achieve the above-mentioned purpose is to make the aforementioned automatic testing machine with signal processing function include: a testing head for testing more than one device under test, and the testing head includes: a test processing device for providing more than one electrical test signal to the device under test, and receiving more than one electrical feedback signal fed back by the device under test, performing signal processing analysis to generate analysis result information.

[0006] Optionally, the test processing device includes: an integrated test module for generating more than one electrical test condition; a test coupling control module coupled to the integrated test module and providing a corresponding electrical test signal to the integrated test module according to the electrical test condition.

[0007] Optionally, the integrated test module includes: a signal storage module for storing signals; a test and signal collection module coupled to the signal storage module and used to transmit the electrical test signal to the device under test and obtain the electrical feedback signal; a signal operation module coupled to the test and signal collection module through the signal storage module and used to provide the electrical test conditions and perform the signal processing and analysis on the electrical feedback signal.

[0008] Optionally, the signal operation module includes: a memory unit for storing a plurality of instructions; a signal operation unit for providing the electrical test conditions according to the plurality of instructions, and performing the signal processing analysis on the electrical feedback signal.

[0009] Optionally, the test head further includes a probe adapter module coupled to the test processing device; the probe adapter module tests the device under test according to the electrical test signal.

[0010] Optionally, the electrical test signal includes a multi-level multi-phase power supply test signal, a plurality of grounding design test signals, an anti-noise circuit test signal, a digital switching design test signal or a synchronous coupling control test signal.

[0011] Optionally, the system is further connected to a main control computer via a network to transmit the analysis result information or the electrical feedback signal to the main control computer, or to adjust instructions according to instructions sent by the main control computer to store newly added instructions or delete corresponding instructions.

[0012] Another technical means adopted to achieve the above-mentioned purpose is to use the information processing method of the aforementioned automatic test machine with signal processing function to test more than one device under test, and the test processing device in the test head of the automatic test machine performs the following steps: providing more than one electrical test signal to the device under test; receiving more than one electrical feedback signal fed back by the device under test; performing signal processing and analysis on the electrical feedback signal to generate analysis result information.

[0013] Optionally, the test head generates corresponding electrical test signals according to more than one electrical test conditions.

[0014] Optionally, the provided electrical test signal includes a multi-level multi-phase power supply test signal, a variety of grounding design test signals, an anti-noise circuit test signal, a digital switching design test signal or a synchronous coupling control test signal.

[0015] From the above content, it can be known that by directly setting the test processing device for signal processing in the test head of the automatic test machine, the signal obtained by testing the device under test can be processed in real time. Since there is no need to connect the external computing device through a cable, and transmit the signal to the external computing device for analysis, the efficiency of signal processing can be effectively improved, and the size and cost of the equipment can be reduced. In this way, the purpose of reducing the size, improving the efficiency of signal processing, convenience and reducing costs can be achieved.

[0016] In order to further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, this description and the attached drawings are only used to illustrate the present invention, and do not impose any limitation on the scope of rights of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0018] Figure 1 is a schematic diagram of a known automated testing device;

[0019] Figure 2 is a schematic diagram of the architecture of an automated testing machine according to an embodiment of the present invention;

[0020] Figure 3 is based on Figure 2 A schematic diagram of the structure of the test head of the embodiment shown;

[0021] Figure 4 is another schematic diagram of the architecture of an automated testing machine according to another embodiment of the present invention;

[0022] Figure 5 It is a flowchart of an information processing method of an automatic testing machine according to an embodiment of the present invention.

[0023] Reference numerals

[0024] 10. Automated testing machine

[0025] 11. Test machine bearing parts

[0026] 12 Test head

[0027] 13 Test Processing Device

[0028] 131 Test coupling control module

[0029] 132 Integrated test modules

[0030] 1321 Signal Operation Module

[0031] 13211 Signal Operation Unit

[0032] 13212 Memory Unit

[0033] 1322 Test and signal collection module

[0034] 1323 Signal Storage Module

[0035] 14 Probe Adapter Module

[0036] 20 Main control computer

[0037] Steps S31 to S33

[0038] X Device under test

[0039] A Load-bearing components

[0040] B Test head

[0041] C cable

[0042] D External computing device DETAILED DESCRIPTION

[0043] For an embodiment of the present invention, please refer to Figure 2 As shown, an automatic test machine 10 with a signal processing function is disclosed. The automatic test machine 10 is used to set a device under test X and test the device under test X.

[0044] The automated test machine 10 includes a test machine bearing component 11 and a test machine head 12. A test processing device 13 is integrated in the test machine head 12. The test machine bearing component 11 is used to set the test machine head 12 and set, bear, and place the device under test X. The test machine head 12 is used to detect the device under test X and process and analyze the detected results.

[0045] In one embodiment, the test machine carrying component 11 may include an automatic feeding mechanism (not shown). The automatic feeding mechanism is used to automatically load the device under test X, and then the test head 12 performs testing and signal analysis on the device under test X, and then the automatic feeding mechanism removes the tested device under test X into the storage box.

[0046] The test head 12 is provided with a circuit substrate (not shown), and the test processing device 13 having a signal processing function and a signal storage function is provided on the circuit substrate, and is electrically coupled with a plurality of circuits (not shown) on the circuit substrate, thereby integrating and providing the test processing device 13 in the test head 12. The test processing device 13 provides a signal for testing, and transmits it to the device under test X through the test head 12, so as to perform tests of different types or requirements. The test processing device 13 obtains the signal fed back by the device under test X through the test head 12 for processing and analysis. The specific structure of the test processing device 13 will be described in the following content.

[0047] In addition, in order to test the device under test X more effectively and accurately, the test head 12 also includes a probe adapter module 14. The probe adapter module 14 is coupled to the test processing device 13. The probe adapter module 14 includes a probe card (not shown) for contacting the device under test X, and an adapter module (not shown) for accurately installing, assembling, and combining the device under test X. Among them, the adapter module includes a socket, a PIB (Probe Interface Board), and a POGO tower.

[0048] In one embodiment, please refer to Figure 3 As shown, the test processing device 13 in the test head 12 includes a test coupling control module 131 and an integrated test module 132 . The integrated test module 132 is coupled to the test coupling control module 131 .

[0049] The integrated test module 132 stores a plurality of instructions and automatically executes corresponding instructions according to user requirements or settings to generate one or more electrical test conditions, and processes and analyzes the signals obtained from the device under test X to confirm whether the device under test X is qualified.

[0050] The test coupling control module 131 automatically generates one or more corresponding electrical test signals according to the electrical test conditions generated by the integrated test module 132 , and provides the signals to the integrated test module 132 .

[0051] The integrated test module 132 transmits the electrical test signal to the device under test X for testing, and receives and stores one or more electrical feedback signals fed back by the device under test X. The integrated test module 132 performs signal processing and analysis on the electrical feedback signal to generate analysis result information, and stores and provides it to the user for reference. The analysis result information can be used to confirm whether the device under test X is qualified or unqualified, so as to effectively confirm whether the quality of the device under test X is up to standard.

[0052] In addition, when the test processing device 13 confirms that the device under test X is qualified according to the analysis result information, the automatic feeding mechanism on the test machine carrying component 11 is controlled to remove the device under test X from the storage box storing qualified devices under test X. On the contrary, when the device under test X is confirmed to be unqualified, the automatic feeding mechanism on the test machine carrying component 11 is controlled to remove the device under test X from the storage box storing unqualified devices under test X. By automating the testing of the device under test X and automatically classifying according to the analysis results, the convenience of use and the efficiency of classification are improved.

[0053] The electrical test signals include multi-level multi-phase power supply test signals, various grounding design test signals, anti-noise circuit test signals, digital switching design test signals, synchronous coupling control test signals and feedback signals of various ICs under test.

[0054] In one embodiment, the integrated test module 132 includes a signal operation module 1321, a test and signal collection module 1322, and a signal storage module 1323. The signal operation module 1321 is coupled to the test and signal collection module 1322 via the signal storage module 1323.

[0055] The signal operation module 1321 includes a signal operation unit 13211 and a memory unit 13212. The memory unit 13212 stores the above-mentioned multiple instructions and the signals required for the signal operation unit 13211 to process the signals. The signal operation unit 13211 reads and executes the corresponding instructions from the memory unit 13212 according to the relevant settings of the user on the automatic test machine 10 to generate corresponding electrical test conditions, and transmits them to the test coupling control module 131 to exchange and obtain corresponding electrical test signals. The signal operation module 1321 can be a CPU, a GPU, an FPGA, a special-purpose IC or a special-purpose IP, etc.

[0056] The test and signal collection module 1322 transmits the electrical test signal to the probe adapter module 14 to test the device under test X. The test and signal collection module 1322 collects the electrical feedback signal fed back by the device under test X through the probe adapter module 14, and transmits it to the signal storage module 1323 for storage. By directly storing the signal in the signal storage module 1323, the time for signal copying and transmission is reduced, thereby improving the efficiency of signal processing.

[0057] The signal operation unit 13211 of the signal operation module 1321 directly obtains the electrical feedback signal from the signal storage module 1323 , and performs the signal processing analysis to generate the analysis result information, and stores the information in the signal storage module 1323 .

[0058] The signal processing analysis may be a massive mathematical algorithm, a test standard algorithm, or a neural analysis algorithm.

[0059] According to the above content, by directly integrating and setting the test processing device 13 with signal processing and signal storage functions in the test head 12, a signal for testing is directly generated for the device under test X, and according to the electrical feedback signal fed back by the device under test X, the signal is stored in real time and processed and analyzed to quickly obtain the analysis result information. Since there is no need to connect an external computing device through a cable and transmit the signal to the external computing device for analysis, the efficiency of signal processing can be effectively improved, and the size of the equipment can be reduced, and the cost of the equipment can also be reduced. In this way, the purpose of improving the efficiency and convenience of signal processing and reducing costs is achieved.

[0060] Regarding another embodiment of the present invention, the content of this embodiment is substantially the same as that of the above embodiment. For this embodiment, it is convenient for other users who are not at the location of the automated test machine 10 to obtain the required signals for other related analysis, thereby improving the flexibility and expandability of signal processing. It is also convenient for users to remotely add, delete, and adjust the instructions stored in the test processing device 13.

[0061] Please refer to Figure 4 As shown, the automated testing machine 10 can be connected to a host computer 20 via a network. The host computer 20 can be a desktop computer, a notebook computer, a tablet computer, or a device with built-in computing and memory functions.

[0062] The test processing device 13 of the automated test machine 10 receives the signal request instruction sent by the host computer 20 , and sends the analysis result information or the electrical feedback signal to the host computer 20 .

[0063] In addition, the test processing device 13 of the automated test machine 10 receives the instruction adjustment instruction transmitted by the main control computer 20, and then stores the newly added instruction or deletes the corresponding instruction. When the test processing device 13 stores the newly added instruction, it can store the instruction separately or replace the corresponding old instruction for storage.

[0064] Based on the above, please refer to Figure 5As shown, the information processing method applied to the automatic test machine with signal processing function is further summarized, which is used to test more than one device under test X, and the test processing device 13 in the test head 12 of the automatic test machine 10 performs the following steps:

[0065] Providing one or more electrical test signals to the device under test X (S31);

[0066] receiving one or more electrical feedback signals fed back by the device under test X (S32);

[0067] The electrical feedback signal is subjected to signal processing and analysis to generate analysis result information (S33).

[0068] In one embodiment, the test processing device 13 generates corresponding electrical test signals according to more than one electrical test condition.

[0069] In one embodiment, the provided electrical test signals include multi-level multi-phase power supply test signals, multiple grounding design test signals, anti-noise circuit test signals, digital switching design test signals, and synchronous coupling control test signals.

[0070] In one embodiment, the test processing device 13 stores the electrical feedback signal after obtaining it. The test processing device 13 stores the analysis result information after generating it.

[0071] In one embodiment, the automated testing machine 10 can transmit the analysis result information and the electrical feedback signal to the host computer 20 for reference via a network.

[0072] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention.

Claims

1. An automatic testing machine with signal processing function, characterized in that: include: A test head, used for testing more than one device under test, the test head comprising: A test processing device, used to provide one or more electrical test signals to the device under test, and receive one or more electrical feedback signals fed back by the device under test, perform signal processing and analysis to generate analysis result information, the test processing device comprising: An integrated test module for generating more than one electrical test condition; and A test coupling control module coupled to the integrated test module and providing a corresponding electrical test signal to the integrated test module according to the electrical test condition; The integrated test module comprises: A signal storage module, used for storing signals; A testing and signal collection module, coupled to the signal storage module, and used for transmitting the electrical test signal to the device under test and obtaining the electrical feedback signal; and A signal operation module, coupled to the test and signal collection module through the signal storage module, and used for providing the electrical test conditions and performing the signal processing analysis on the electrical feedback signal; wherein the test coupling control module generates the electrical test signal according to the electrical test condition provided by the signal operation module, and provides the electrical test signal to the integrated test module; The test and signal collection module transmits the electrical test signal to the device under test, collects the electrical feedback signal fed back by the device under test, and transmits it to the signal storage module for storage; The signal operation module directly obtains the electrical feedback signal from the signal storage module, performs the signal processing analysis on the electrical feedback signal to generate the analysis result information, and stores the analysis result information in the signal storage module.

2. The automatic testing machine with signal processing function according to claim 1, characterized in that: The signal operation module includes: A memory unit that stores multiple instructions; The signal operation unit provides the electrical test conditions according to the plurality of instructions and performs the signal processing analysis on the electrical feedback signal.

3. The automatic testing machine with signal processing function according to claim 2, characterized in that: The test head further comprises a probe adapter module coupled to the test processing device; the probe adapter module tests the device under test according to the electrical test signal.

4. The automatic testing machine with signal processing function according to claim 3, characterized in that: The electrical test signal includes a multi-level multi-phase power supply test signal, a variety of grounding design test signals, an anti-noise circuit test signal, a digital switching design test signal or a synchronous coupling control test signal.

5. The automatic testing machine with signal processing function according to claim 4, characterized in that: It is further connected to a main control computer via a network to transmit the analysis result information or the electrical feedback signal to the main control computer, or to adjust instructions to store newly added instructions or delete corresponding instructions according to the instructions sent by the main control computer.

6. An information processing method for an automatic testing machine with signal processing function, characterized in that: The method is used to test more than one device under test, and the test processing device in the test head of the automatic test machine performs the following steps: Providing one or more electrical test signals to the device under test; Receiving one or more electrical feedback signals fed back by the device under test; The electrical feedback signal is subjected to signal processing and analysis to generate analysis result information. The test processing device comprises: An integrated test module for generating more than one electrical test condition; and A test coupling control module coupled to the integrated test module and providing a corresponding electrical test signal to the integrated test module according to the electrical test condition; The integrated test module comprises: A signal storage module, used for storing signals; A testing and signal collection module, coupled to the signal storage module, and used for transmitting the electrical test signal to the device under test and obtaining the electrical feedback signal; and A signal operation module, coupled to the test and signal collection module through the signal storage module, and used for providing the electrical test conditions and performing the signal processing analysis on the electrical feedback signal; wherein the test coupling control module generates the electrical test signal according to the electrical test condition provided by the signal operation module, and provides the electrical test signal to the integrated test module; The test and signal collection module transmits the electrical test signal to the device under test, collects the electrical feedback signal fed back by the device under test, and transmits it to the signal storage module for storage; The signal operation module directly obtains the electrical feedback signal from the signal storage module, performs the signal processing analysis on the electrical feedback signal to generate the analysis result information, and stores the analysis result information in the signal storage module.

7. The information processing method of the automatic testing machine with signal processing function according to claim 6, characterized in that: The electrical test signals provided include multi-level multi-phase power supply test signals, various grounding design test signals, anti-noise circuit test signals, digital switching design test signals or synchronous coupling control test signals.

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