Board-level sample test system and test method

Abstract

The present invention discloses a board-level sample test system and a test method. The shielding body is used to shield radiation. There is a test space inside the shielding body. The shielding body includes a shielding door body for opening or closing the test space. The sample placement table includes a base and a sample fixture. The sample fixture is used to fix the sample. The sample fixture is detachably connected to the base. The base is arranged inside the test space. The base can drive the sample fixture to move along a first direction and a second direction respectively. The first direction and the second direction are arranged at an angle. The sample can be fixed on the sample fixture outside the shielding body, and then the sample fixture is sent into the test space. The position of the sample is adjusted along the first direction or the second direction on the base. The operator can withdraw from the test space, and radiation tests are carried out on the sample. The residence time of the operator in the test space can be reduced, the harm of radiation tests to the human body can be reduced, and better safety performance is achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of radiation test equipment, and in particular to a board-level sample test system and a test method. Background Art

[0002] Equipment working in a radiation environment is continuously exposed to radiation, which may cause device data errors, function failures or even burnout. Moreover, this problem becomes increasingly serious as the device feature size decreases and the integration density increases, seriously affecting the reliability of electronic devices. Therefore, it is necessary to verify the radiation reliability of products, explore the failure mechanism of electronic devices, and provide feedback for the reinforcement design direction. Currently, there is no systematic design at home and abroad. Radiation is harmful to the human body, and general test devices are prone to failure in a radiation environment, especially in a high-energy particle radiation environment due to the use of electronic components. Considering test safety and efficiency, test personnel should not enter the radiation chamber as much as possible, and the time for test personnel and test equipment staying in the radiation chamber should not be too long. Summary of the Invention

[0003] Based on this, the present invention aims to overcome the problems existing in the prior art and provides a board-level sample test system and a test method that can reduce the time staying in the radiation environment.

[0004] Its technical solution is as follows:

[0005] A board-level sample test system, comprising:

[0006] A shielding body for shielding radiation, a test space is provided inside the shielding body, and the shielding body includes a shielding door for opening or closing the test space; and

[0007] A sample placement table, the sample placement table includes a base and a sample fixture for fixing a sample. The sample fixture is detachably connected to the base, the base is arranged in the test space, and the base can drive the sample fixture to move along a first direction and a second direction respectively. The first direction and the second direction are arranged at an angle.

[0008] The above-mentioned board-level sample test system can fix the sample on the sample fixture outside the shield, then send the sample fixture into the test space, install the sample fixture on the base, and at the same time, the position of the sample can be adjusted along the first direction or the second direction on the base, making the arrangement position of the sample more accurate, improving the test accuracy. After the adjustment is completed, the operator can withdraw from the test space and close the shield door to conduct a radiation test on the sample. After the test is over, the sample fixture can be removed from the base and taken out of the test space. Since the operator does not need to move the entire sample placement table, the operation of sending the sample into or out of the test space can be simplified. Therefore, the residence time of the operator in the test space can be reduced, the radiation dose received by the operator can be reduced, the harm of the radiation test to the human body can be reduced, and better safety can be achieved.

[0009] In one embodiment, the base includes a first base body, a second base body and a third base body. The second base body is slidably arranged on the first base body, and the second base body reciprocates relative to the first base body along the first direction or the direction opposite to the first direction. The third base body is slidably arranged on the second base body, and the third base body reciprocates relative to the second base body along the second direction or the direction opposite to the second direction. The sample fixture is detachably connected to the third base body.

[0010] In one embodiment, the moving base assembly further includes a fourth base body. The fourth base body is rotatably matched with the second base body, so that the rotation axis of the second base body relative to the fourth base body is arranged along the second direction. The fourth base body is slidably arranged on the first base body, and the fourth base body reciprocates relative to the first base body along the second direction or the direction opposite to the second direction.

[0011] In one embodiment, the above-mentioned board-level sample test system further includes a base. When there is one base, the first base body slides on the base along the third direction, and the plane formed by the third direction and the first direction is arranged at an angle to the second direction; when there are at least two bases, the first base body of at least one base slides on the base along the third direction, and the first base bodies of adjacent two bases can move relative to each other.

[0012] In one embodiment, the above-mentioned board-level sample test system further includes a power assembly. There are at least two power assemblies, and the power assemblies are electric sliders; or the power assemblies are manual assemblies. The manual assembly includes a hand-cranked wheel, a translation member, and a lead screw matching the translation member. The hand-cranked wheel is used to drive the lead screw to rotate, so that the translation member reciprocates along the lead screw. Among them, the two power assemblies are respectively a first power assembly and a second power assembly. The first power assembly is used to drive the third seat body to reciprocate relative to the second seat body along the first direction or the direction opposite to the first direction, and the second power assembly is used to drive the second seat body to reciprocate relative to the first seat body along the first direction or the direction opposite to the first direction.

[0013] In one embodiment, when there are at least two bases, the power assembly on one of the bases is the electric slider, and the power assembly on one of the bases is the manual assembly.

[0014] In one embodiment, the above-mentioned board-level sample test system further includes a support table. The support table is detachably connected to the base, and the support table is movably arranged and can enter or leave the test space.

[0015] Optionally, the tabletop of the support table is a porous structure. After placing the sample on the support table, the sample can be fixed by tying, screws or bolt groups, etc. to prevent the sample from moving.

[0016] In one embodiment, the third seat body includes a back plate and a side frame. The back plate is slidably matched with the second seat body. The side frame is arranged on the side of the back plate away from the second seat body. A first positioning groove is provided on the back plate, and a second positioning groove is provided on the side frame. The first positioning groove communicates with the second positioning groove. Two adjacent sides of the sample fixture are respectively inserted and matched with the first positioning groove and the second positioning groove.

[0017] In one embodiment, the sample fixture is an L-shaped frame body, and an L-shaped groove is provided on the sample fixture for inserting and matching with two adjacent sides of the sample; or a first magnetic member is provided on the third seat body, and a second magnetic member that attracts the first magnetic member is provided on the sample fixture.

[0018] A test method includes the following steps:

[0019] Place the sample on the sample fixture and fix it outside the shielding body;

[0020] Send the sample fixture into the test space and install it on the base;

[0021] Adjust the position of the sample fixture on the base in the first direction and / or the second direction;

[0022] Close the shielding door body;

[0023] Conduct a test on the sample.

[0024] In the above test method, the sample can be fixed on the sample fixture outside the shielding body, and then the sample fixture is sent into the test space and installed on the base. At the same time, the position of the sample can be adjusted on the base in the first direction and / or the second direction to make the arrangement position of the sample more accurate, improving the test accuracy. After the adjustment is completed, the operator can withdraw from the test space and close the shielding door body, and then conduct a radiation test on the sample. After the test is completed, the sample fixture can be removed from the base and taken out of the test space. Since the operator does not need to move the entire sample placement table, the operation of sending the sample into or out of the test space can be simplified. Therefore, the residence time of the operator in the test space can be reduced, the radiation dose received by the operator can be reduced, the harm of the radiation test to the human body can be reduced, and better safety can be achieved. Description of the Drawings

[0025] The drawings forming a part of this application are used to provide a further understanding of the present invention. The schematic embodiments and descriptions thereof of the present invention are used to explain the present invention and do not constitute an improper limitation of the present invention.

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0027] Figure 1 Oblique view of the sample placement table according to the embodiment of the present invention Figure 1 ;

[0028] Figure 2 Oblique view of the sample placement table according to the embodiment of the present invention Figure 2 ;

[0029] Figure 3 Oblique view of the base according to the embodiment of the present invention;

[0030] Figure 4 Oblique view of the base according to the embodiment of the present invention;

[0031] Figure 5 Oblique view of the support table according to the embodiment of the present invention;

[0032] Figure 6Schematic diagram of the assembly of the third base body and the sample fixture according to the embodiments of the present invention.

[0033] Explanation of reference numerals:

[0034] 100, sample placement table; 110, base; 111, first base body; 112, second base body; 113, third base body; 1131, back plate; 1131a, first positioning groove; 1132, side frame; 1132a, second positioning groove; 114, fourth base body; 115, base; 1151, fixing part; 120, sample fixture; 121, L-shaped groove; 130, power assembly; 130a, first power assembly; 130b, second power assembly; 130c, third power assembly; 131, electric slide table; 132, manual assembly; 1321, hand crank wheel; 1322, translation member; 1323, lead screw; 200, support table; 210, Fuma wheel. Detailed implementation manners

[0035] In order to make the above objects, features and advantages of the present invention more obvious and understandable, the following detailed description of the specific implementation manners of the present invention will be given with reference to the accompanying drawings. Many specific details are set forth in the following description in order to fully understand the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present invention. Therefore, the present invention is not limited by the specific embodiments disclosed below.

[0036] As Figure 1 and Figure 3 shown, an embodiment discloses a board-level sample test system, including a shielding body and a sample placement table 100. The shielding body is used for shielding radiation, and a test space is provided inside the shielding body. The shielding body includes a shielding door body for opening or closing the test space. The sample placement table 100 includes a base 110 and a sample fixture 120. The sample fixture 120 is used for fixing a sample. The sample fixture 120 is detachably connected to the base 110. The base 110 is arranged inside the test space, and the base 110 can drive the sample fixture 120 to move along a first direction and a second direction respectively. The first direction and the second direction are arranged at an angle.

[0037] The above-mentioned board-level sample test system can fix the sample on the sample fixture 120 outside the shielding body. Subsequently, the sample fixture 120 is sent into the test space and installed on the base 110. At the same time, the position of the sample can be adjusted on the base 110 in the first direction or the second direction, making the arrangement position of the sample more accurate, improving the test accuracy. After the adjustment is completed, the operator can withdraw from the test space and close the shielding door to conduct radiation tests on the sample. After the test is over, the sample fixture 120 can be removed from the base 110 and taken out of the test space. Since the operator does not need to move the entire sample placement table 100, the operation of sending the sample into or out of the test space can be simplified. Therefore, the residence time of the operator in the test space can be reduced, the radiation dose received by the operator can be reduced, the harm of radiation tests to the human body can be reduced, and better safety can be achieved.

[0038] In this specific embodiment, the first direction and the second direction are perpendicular or approximately perpendicular. In other embodiments, the included angle between the first direction and the second direction can also be other angles, but the included angle between the first direction and the second direction is not 0° or 180°.

[0039] Optionally, the main materials of the base 110 and the sample fixture 120 are non-metallic or aluminum alloy, which are not easy to absorb radiation and can reduce the influence of radiation on the operator and equipment.

[0040] Optionally, the shielding body includes the above-mentioned shielding door, the long-term shielding main body and the detachable shielding sub-body. The shielding sub-body can be detachably installed on the wall of the long-term shielding main body. At this time, the shielding effect is better, which can prevent high-energy particles from penetrating and ensure the safety of the operator. Specifically, the long-term shielding main body includes a bottom plate provided on the ground. At this time, the shielding effect is good, which can prevent radiation from remaining on the ground.

[0041] In one of the embodiments, as Figure 1 and Figure 3 shown, the base 110 includes a first seat body 111, a second seat body 112 and a third seat body 113. The second seat body 112 is slidably arranged on the first seat body 111, and the second seat body 112 reciprocates relative to the first seat body 111 in the first direction or the direction opposite to the first direction. The third seat body 113 is slidably arranged on the second seat body 112, and the third seat body 113 reciprocates relative to the second seat body 112 in the second direction or the direction opposite to the second direction. The sample fixture 120 is detachably connected to the third seat body 113. After the sample is fixed by using the sample fixture 120, the sample can be sent into the test space, and the sample fixture 120 is connected to the third seat body 113. Subsequently, the position of the third seat body 113 relative to the second seat body 112 and the position of the second seat body 112 relative to the first seat body 111 can be adjusted to realize the adjustment of the position of the sample fixture 120 in the first direction and the second direction, making the setting position of the sample more accurate and the test effect better.

[0042] In other embodiments, the position of the sample fixture 120 on the base 110 can also be adjusted in the first direction and the second direction by other means. For example, a lifting platform is provided on the base 110, which can drive the sample fixture 120 to lift in the first direction. At the same time, a cylinder or a hydraulic cylinder connected to the sample fixture 120 is provided on the lifting platform, which can drive the sample fixture 120 to move in the second direction.

[0043] In one embodiment, as Figure 1 and Figure 3 shown, the moving seat assembly further includes a fourth seat body 114. The fourth seat body 114 is rotatably matched with the second seat body 112, so that the rotation axis of the second seat body 112 relative to the fourth seat body 114 is arranged along the second direction. The fourth seat body 114 is slidably arranged on the first seat body 111, and the fourth seat body 114 reciprocates relative to the first seat body 111 in the second direction or the direction opposite to the second direction. The second seat body 112 is slidably matched with the first seat body 111 through the fourth seat body 114, and the second seat body 112 is rotated through the fourth seat body 114 to adjust the orientation of the third seat body 113, so as to improve the flexibility of adjusting the position of the sample.

[0044] In other embodiments, the rotation axis of the second seat body 112 relative to the fourth seat body 114 can also be arranged along the first direction; or arranged along other directions.

[0045] In one embodiment, as Figures 1 to 4 shown, the above-mentioned board-level sample test system further includes a base 115. When there is one base 110, the first seat body 111 is slidably arranged on the base 115 along the third direction, and the plane formed by the third direction and the first direction is arranged at an angle with the second direction; when there are at least two bases 110, the first seat body 111 of at least one base 110 is slidably arranged on the base 115 along the third direction, and the first seat bodies 111 of two adjacent bases 110 can move relative to each other. When the first seat body 111 can be slidably arranged on the base 115 along the third direction, the sample fixture 120 and the sample located on the first seat body 111 can also move along the third direction. Then the sample can move along the first direction, the second direction and the third direction respectively. Since the plane formed by the third direction and the first direction is arranged at an angle with the second direction, at this time, the sample can be adjusted to any position within a certain space range, and the position of the sample can be adjusted more precisely. When the number of bases 110 is at least two, the first seat bodies 111 of two adjacent bases 110 can move relative to each other, and the distance between the two bases 110 can be adjusted to reduce the mutual interference between the samples on the two bases 110 during the test.

[0046] Optionally, any two of the first direction, the second direction, and the third direction are perpendicular or approximately perpendicular, and are correspondingly set with the X-axis, Y-axis, and Z-axis in the three-dimensional coordinate system. In other embodiments, the included angle between any two of the first direction, the second direction, and the third direction can also be other angles, but the included angle between the first direction and the second direction is not 0° or 180°.

[0047] Optionally, as Figures 1 to 4 shown, when the number of the bases 110 is at least two, the first body 111 of at least one base 110 is fixedly arranged on the base 115; or the first bodies 111 of all the bases 110 can be slidably arranged on the base 115 along the third direction.

[0048] In one embodiment, as Figures 1 to 4 shown, the above-mentioned board-level sample test system further includes power components 130. There are at least two power components 130, and the power components 130 are electric sliders 131; or the power components 130 are manual components 132. The manual components 132 include a hand-cranked wheel 1321, a translation member 1322, and a lead screw 1323 that matches the translation member 1322. The hand-cranked wheel 1321 is used to drive the lead screw 1323 to rotate, so that the translation member 1322 reciprocates along the lead screw 1323. Two of the power components 130 are the first power component 130a and the second power component 130b respectively. The first power component 130a is used to drive the third body 113 to reciprocate relative to the second body 112 along the first direction or the direction opposite to the first direction, and the second power component 130b is used to drive the second body 112 to reciprocate relative to the first body 111 along the first direction or the direction opposite to the first direction. The driving can be realized by two methods: the electric slider 131 or the manual component 132. When the electric slider 131 is adopted, the position of the sample can be adjusted outside the test space, reducing the stay time of the operator in the test space. When the manual component 132 is adopted, the interference and damage of the radiation test to the electronic components can be reduced, and the reliability is relatively high.

[0049] Optionally, as Figures 1 to 4 shown, there are three power components 130, and another power component 130 is the third power component 130c. The sliding of the first body 111 relative to the base 115 is driven by the third power component 130c; the fourth body 114 can be an electric rotary table or a manual rotary table.

[0050] Specifically, whether the first power component 130a is an electric slider 131 or a manual component 132, a ball screw drive mechanism with a self-locking function is set, that is, the translation member 1322 used in the manual component 132 and the lead screw 1323 cooperate to form a ball screw drive mechanism.

[0051] Specifically, whether the second power component 130b is an electric slide 131 or a manual component 132, a trapezoidal screw 1323 transmission mechanism with better vertical self-locking function is provided, that is, the translation member 1322 used in the manual component 132 cooperates with the screw 1323 to form a trapezoidal screw 1323 transmission mechanism.

[0052] Specifically, as Figures 1 to 4 shown, when the third power component 130c is a manual component 132, the manual component 132 is arranged on the base 115, and a fixing part 1151 is arranged on the base 115. The first seat body 111 of one of the bases 110 is arranged on the fixing part 1151, and the first seat body 111 of the other base 110 is arranged on the translation member 1322.

[0053] Optionally, the power sources of the above-mentioned electric slide 131 and the electric rotary table are motors, and aluminum housing is assembled outside the motors to reduce the influence of radiation on the motors. The motors can be radiation-resistant stepper motors or radiation-resistant servo motors. Specifically, the radiation-resistant motor is a radiation-resistant stepper motor. Compared with the radiation-resistant servo motor, the radiation-resistant stepper motor has higher reliability in the radiation environment. In addition, due to the functional characteristics of the stepper motor, signal loss may occur during the high-energy radiation process. If there is signal loss, the missing number of steps can be input again until the stepper motor reaches the target stroke.

[0054] Among them, since the entire system is used in a radiation environment and considering fire protection issues, all components except the transmission parts must be degreased and cleaned, and the transmission components need to be coated with grease that meets the vacuum requirements to prevent dust from being generated due to long-term dry grinding between metals.

[0055] In one of the embodiments, when there are at least two bases 110, the power component 130 on one of the bases 110 is an electric slide 131, and the power component 130 on one of the bases 110 is a manual component 132. At this time, since two bases 110 with different driving forms are used simultaneously, even if the base 110 with the electric slide 131 fails, the other can still be used as a substitute for testing.

[0056] In other embodiments, all drives are motor-driven; or all drives are manually driven.

[0057] In one of the embodiments, as Figure 1 and Figure 5 shown, the above-mentioned board-level sample test system further includes a support table 200. The support table 200 is detachably connected to the base 115. The support table 200 is movably arranged and can enter or leave the test space. At this time, the position of the sample placement table 100 in the test space can be adjusted, and the sample placement table 100 can be moved out of the test space when necessary.

[0058] Optionally, asFigure 5 As shown, a Formica wheel 210 is disposed on the support platform 200 , and the level of the support platform 200 surface can be adjusted after the position is moved, so as to adjust the posture of the sample placement platform 100 .

[0059] In one embodiment, if Figure 1 and Figure 6 As shown, the third base body 113 includes a back plate 1131 and a side frame 1132. The back plate 1131 is slidably matched with the second base body 112. The side frame 1132 is arranged on the side of the back plate 1131 away from the second base body 112. The back plate 1131 is provided with a first positioning groove 1131a, and the side frame 1132 is provided with a second positioning groove 1132a. The first positioning groove 1131a is connected with the second positioning groove 1132a. The two adjacent side edges of the sample fixture 120 are respectively plugged and matched with the first positioning groove 1131a and the second positioning groove 1132a. At this time, the sample fixture 120 can be directly placed on the third base body 113, and the first positioning groove 1131a and the second positioning groove 1132a are used to limit and fix the sample fixture 120. The operation is simple, the positioning of the sample fixture 120 can be achieved, and the operation time is reduced, thereby reducing the operator's stay in the test space.

[0060] Optionally, there are multiple side frames 1132, which can hold different numbers of sample holders 120 as required.

[0061] In one embodiment, if Figure 1 and Figure 6 As shown, the sample fixture 120 is an L-shaped frame, and an L-shaped groove is provided on the sample fixture 120 for plugging and matching with the adjacent two sides of the sample. The sample can be more conveniently loaded into the sample fixture 120 through the L-shaped groove 121, and it is also more convenient to remove it, which is particularly suitable for fixing and limiting plate-shaped samples.

[0062] In other embodiments, the sample fixture 120 may also be provided with an elastic clamp to clamp the sample; or the sample may be detachably fixed to the sample fixture 120 using screws, bolts, etc.

[0063] Optionally, the sample fixture 120 is provided with a threaded hole, which is connected to the L-shaped groove 121. A screw or bolt can be screwed into the threaded hole and pressed against the sample inserted into the L-shaped groove to assist in fixing the sample and prevent the sample from falling off.

[0064] In one embodiment, a first magnetic member is disposed on the third base 113, and a second magnetic member attracted to the first magnetic member is disposed on the sample holder 120. The mutual attraction between the first magnetic member and the second magnetic member can prevent the sample holder 120 from being separated from the third base 113, and the installation is more stable.

[0065] Optionally, the above-mentioned board-level sample test system further includes an indoor wire and a console. When the power sources of the electric sliding table 131 and the electric rotating table are radiation-resistant motors, a docking member for electrically connecting with the power component is provided on the base 115. The console is arranged outside the shielding body. The first end of the indoor wire penetrates through the shielding body and extends into the test space. The first end of the indoor wire is connected to the docking member, and the second end of the indoor wire is arranged outside the shielding body and is electrically connected to the console. After the sample is placed in the test space, the docking member and the console are electrically connected through the indoor wire, and the position of the sample is adjusted outside the shielding body. The console is located outside the shielding body, which can minimize the time for the operator to stay in the test space during debugging, reduce the radiation received by the operator, and improve safety. At the same time, the electronic components in the console will not be irradiated and are not prone to failure, which can improve the service life and reliability during use.

[0066] Optionally, the above-mentioned board-level sample test system further includes a camera, a first beam collimator, and a second beam collimator. The first beam collimator is arranged in the test space, and the second beam collimator is arranged on the third base body 113. The camera is used to photograph the laser surfaces emitted by the first beam collimator and the second beam collimator. The sample placement table 100 is used to align the intersection line of the laser surfaces emitted by the first beam collimator and the second beam collimator with the sample placed on the sample fixture 120. The radiation beam is invisible. Therefore, the board-level sample test system can be calibrated by the cooperation of the camera, the first beam collimator, and the second beam collimator. When it is detected by the camera that the intersection line of the laser surfaces emitted by the first beam collimator and the second beam collimator is aligned with the sample placed on the sample fixture 120, the sample is adjusted in place, and the intersection line is the beam line of the radiation beam.

[0067] Specifically, the camera can also observe the position of the sample in the test space, and the irradiation angle of the sample and the like can be observed through the camera and cooperate with the console. Even during the radiation test process, when it is necessary to adjust the irradiated position of the sample, the console is used to control the sample placement table 100 outside the test space to adjust the position of the sample. Therefore, the above-mentioned board-level sample test system can perform radiation tests on multiple regions of the sample in sequence without the operator entering the test space, realizing long-term unmanned operation in the test space. The remote adjustment of the sample can reduce the number of times the operator enters the test space, and even realize long-term unmanned operation of the radiation test in the test space, which can reduce the working pressure of the operator.

[0068] Specifically, a device scale is also arranged in the test space, which can provide a reference and facilitate judging whether the position of the sample is adjusted in place through the camera.

[0069] Optionally, a wire routing channel is provided on the bottom plate. The first end of the indoor wire can extend into the test space through the wire routing channel. When the indoor wire is needed, it can be threaded into the test space through the wire routing channel, and can be withdrawn when not needed, reducing the impact of radiation on the indoor wire. Specifically, a shielding plug is provided on the bottom plate to block the wire routing channel and prevent radiation from escaping through the wire routing channel.

[0070] Optionally, the above-mentioned board-level sample test system further includes an evacuation component for evacuating the air in the test space. After the test is completed, first start the evacuation component to evacuate the air in the test space, and wait for a certain period of time after the air is evacuated before the operator can enter the test space, which can reduce the activation of high-energy particles in the air, reduce the impact of radiation on the operator, and improve safety.

[0071] A test method includes the following steps:

[0072] Place the sample on the sample fixture 120 and fix it outside the shielding body;

[0073] Send the sample fixture 120 into the test space and install it on the base 110;

[0074] Adjust the position of the sample fixture 120 on the base 110 in the first direction and / or the second direction;

[0075] Close the shielding door body;

[0076] Conduct a test on the sample.

[0077] In the above test method, the sample can be fixed on the sample fixture 120 outside the shielding body, and then the sample fixture 120 is sent into the test space and installed on the base 110. At the same time, the position of the sample can be adjusted in the first direction and / or the second direction on the base 110 to make the arrangement position of the sample more accurate, improving the test accuracy. After the adjustment is completed, the operator can withdraw from the test space and close the shielding door body, and then conduct a radiation test on the sample. After the test is completed, the sample fixture 120 can be removed from the base 110 and taken out of the test space. Since the operator does not need to move the entire sample placement table 100, the operation of sending the sample into or out of the test space can be simplified. Therefore, the residence time of the operator in the test space can be reduced, the radiation dose received by the operator can be reduced, the harm of the radiation test to the human body can be reduced, and better safety can be achieved.

[0078] The technical features of the above embodiments can be combined arbitrarily. For the sake of brief description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered to be within the scope described in this specification.

[0079] The above embodiments merely illustrate several implementation manners of the present invention. The description thereof is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can still be made, and these all fall within the protection scope of the present invention. Therefore, the protection scope of the present invention patent shall be subject to the appended claims.

[0080] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation on the present invention.

[0081] In addition, the terms "first" and "second" are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise specifically and clearly defined.

[0082] In the present invention, unless otherwise clearly specified and defined, the terms such as "mounted", "connected", "connected to", "fixed" should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0083] In the present invention, unless otherwise clearly specified and defined, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on" the second feature may be that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "under" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.

[0084] It should be noted that when an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or there may also be an intermediate element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intermediate element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation.

Claims

1. A board-level sample test system, characterized in that, Comprising: A shielding body for shielding radiation, with a test space provided inside the shielding body, and the shielding body includes a shielding door for opening or closing the test space; And A sample placement table, which includes a base and a sample fixture. The sample fixture is used to fix the sample, and the sample fixture is detachably connected to the base. The base is disposed inside the test space, and the base can drive the sample fixture to move along a first direction and a second direction respectively. The first direction and the second direction are arranged at an angle; The base includes a first seat body, a second seat body and a third seat body. The second seat body is slidably disposed on the first seat body, and the second seat body reciprocates relative to the first seat body along the first direction or the direction opposite to the first direction. The third seat body is slidably disposed on the second seat body, and the third seat body reciprocates relative to the second seat body along the second direction or the direction opposite to the second direction. The sample fixture is detachably connected to the third seat body.

2. The board-level sample test system according to claim 1, wherein The base further includes a fourth seat body, and the fourth seat body is rotatably matched with the second seat body, so that the rotation axis of the second seat body relative to the fourth seat body is arranged along the second direction. The fourth seat body is slidably disposed on the first seat body, and the fourth seat body reciprocates relative to the first seat body along the second direction or the direction opposite to the second direction.

3. The board-level sample test system according to claim 1, wherein It further includes a base. When there is one base, the first seat body slides along a third direction on the base, and the plane formed by the third direction and the first direction is arranged at an angle to the second direction; when there are at least two bases, the first seat body of at least one base slides along the third direction on the base, and the first seat bodies of adjacent two bases can move relative to each other.

4. The board-level sample test system according to claim 3, wherein, It further includes a power assembly. There are at least two power assemblies, and the power assemblies are electric sliding tables; or the power assemblies are manual assemblies, and the manual assemblies include a hand-cranked wheel, a translation member and a lead screw matched with the translation member. The hand-cranked wheel is used to drive the lead screw to rotate, so that the translation member reciprocates along the lead screw. Among them, two power assemblies are respectively a first power assembly and a second power assembly. The first power assembly is used to drive the third seat body to reciprocate relative to the second seat body along the first direction or the direction opposite to the first direction, and the second power assembly is used to drive the second seat body to reciprocate relative to the first seat body along the first direction or the direction opposite to the first direction.

5. The board-level sample test system according to claim 4, wherein When there are at least two bases, the power assembly on one of the bases is the electric sliding table, and the power assembly on one of the bases is the manual assembly.

6. The board-level sample test system according to claim 3, characterized in that, It further includes a support table, which is detachably connected to the base, and the support table is movably arranged and can enter or leave the test space.

7. The board-level sample test system according to any one of claims 1-6, characterized in that The third body includes a back plate and a side frame. The back plate is slidably engaged with the second body. The side frame is disposed on a side of the back plate away from the second body. A first positioning groove is provided on the back plate, and a second positioning groove is provided on the side frame. The first positioning groove communicates with the second positioning groove. Two adjacent sides of the sample fixture are respectively inserted and engaged with the first positioning groove and the second positioning groove.

8. The board-level sample test system according to claim 7, wherein, The sample fixture is an L-shaped frame body, and an L-shaped groove is provided on the sample fixture for inserting and engaging with two adjacent sides of the sample.

9. The board-level sample test system according to claim 7, wherein A first magnetic attraction member is provided on the third body, and a second magnetic attraction member that attracts the first magnetic attraction member is provided on the sample fixture.

10. A test method, characterized in that, Applied to the board-level sample test system according to any one of claims 1-9, the test method includes the following steps: Place the sample on the sample fixture and fix it outside the shield. Send the sample fixture into the test space and install it on the base. Adjust the position of the sample fixture on the base in a first direction and / or a second direction. Close the shield door. Conduct a test on the sample.

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