A universal backlight test fixture and test method based on sensor detection and control

Abstract

The present invention discloses a general jig and test method for backlight testing based on sensing detection and regulation, and relates to the technical field of LED product detection. In the present invention: a pressure sensing strip is embedded on one side of the side limit baffle; a pin detection photoelectric sensor module for sensing and detecting exposed pins is embedded on the side of the fixed base plate; a probe substrate for directional movement is configured in the upper area of ​​the fixed base plate, and a side of the probe substrate is configured with a plurality of test probes with increasing spacing in sequence; a probe detection photoelectric sensor module for sensing and detecting test probes is embedded on the side of the fixed base plate; a main control box is installed on the bottom side of the fixed base plate, and a main processing controller is configured in the main control box. The present invention realizes the matching, adjustment, and coordinated connection of the targeted test probes for the exposed pins, and can automatically, conveniently, and low-loss complete the test operation of the backlight.

Description

Technical Field

[0001] The present invention relates to the technical field of LED product testing, and in particular to a universal backlight testing fixture and a testing method based on sensor detection and regulation. Background Art

[0002] At present, LED backlight products have a variety of pin-out methods (outlet wires, PCB pins, PIN pins, etc.). For example, when testing finished products such as PCB pins and PIN pins, which have been preliminarily fixed in their own pin positions, manual testing is required. An alligator clip is used to clamp one pin and then another pin. After the test is completed, the alligator clip is removed. The test requires a lot of manual operation, is slow, and is easy to damage the product.

[0003] In addition, during the production process, there are many types of product specifications, and there are differences in product pin specifications. In addition, errors are inevitable during the actual production process. It is difficult to conduct connection tests on the pins of backlight products with more uncertainties.

[0004] In summary, how to achieve automatic, convenient and low-loss backlight component testing has become a problem that needs to be solved in the LED backlight product testing process. Summary of the invention

[0005] The technical problem to be solved by the present invention is to provide a universal backlight test fixture and test method based on sensor detection and control, which completes the targeted test probe matching, adjustment, and coordinated connection of exposed pins, and can automatically, conveniently, and low-loss complete the test operation of the backlight component.

[0006] To solve the above technical problems, the present invention is achieved through the following technical solutions:

[0007] The present invention relates to a universal backlight test fixture based on sensor detection and regulation. The upper area of ​​a fixed base plate is configured with a directional moving transverse push plate and a longitudinal push plate. A backlight component to be tested is placed on the upper side of the fixed base plate and is located between the transverse push plate and the longitudinal push plate. The backlight component to be tested includes two exposed pins located on one side thereof, and the exposed pins include an outer end of the pin at an outer end.

[0008] A lateral movement photoelectric sensor module that matches the moving range of the lateral push plate is embedded on the side surface of the fixed base plate, and a longitudinal movement photoelectric sensor module that matches the moving range of the longitudinal push plate is embedded on the side surface of the fixed base plate; a side limit baffle is disposed on the side surface of the fixed base plate, and a pressure sensor strip is embedded on one side of the side limit baffle; a pin detection photoelectric sensor module for sensing and detecting exposed pins is embedded on the side surface of the fixed base plate; a directionally movable probe substrate is disposed in the upper area of ​​the fixed base plate, and a plurality of test probes with successively increasing spacings are disposed on one side of the probe substrate; a probe detection photoelectric sensor module for sensing and detecting test probes is embedded on the side surface of the fixed base plate; a main control box is installed on the bottom side of the fixed base plate, and a main processing controller is configured in the main control box.

[0009] As an optimal technical solution for the universal backlight test fixture in the present invention: the lateral movement photoelectric sensor module, the longitudinal movement photoelectric sensor module, the pressure sensor bar, the pin detection photoelectric sensor module, and the probe detection photoelectric sensor module are connected to the main processing controller through a signal transmission line.

[0010] As an optimal technical solution for the universal backlight test fixture in the present invention: a group of transverse guide grooves are opened on the upper side of the fixed base plate, and a guide structure matching the transverse guide grooves is set on the lower side of the transverse push plate; a group of longitudinal guide grooves are opened on the side of the fixed base plate, and a guide structure matching the longitudinal guide grooves is set on the lower side of the longitudinal push plate.

[0011] As a preferred technical solution of the universal backlight test fixture in the present invention: the probe detection photoelectric sensor module and the pin detection photoelectric sensor module have the same structural dimensions, and the probe detection photoelectric sensor module and the pin detection photoelectric sensor module are aligned in parallel.

[0012] As an optimal technical solution of the universal fixture for backlight testing in the present invention: the moving directions of the horizontal push plate and the longitudinal push plate are perpendicular to each other; a horizontal driving device is arranged on one side of the fixed base plate, a horizontal shaft is arranged on the output side of the horizontal driving device, and the end side of the horizontal shaft is fixedly connected to the horizontal push plate; a longitudinal driving device is arranged on one side of the fixed base plate, a longitudinal shaft is arranged on the output side of the longitudinal driving device, and the end side of the longitudinal shaft is fixedly connected to the longitudinal push plate; a longitudinal displacement device is arranged on one side of the fixed base plate, a longitudinal adjustment rod is arranged on the output side of the longitudinal displacement device, and the end side of the longitudinal adjustment rod is fixedly connected to the probe substrate; the main processing controller is connected to the horizontal driving device, the longitudinal driving device, and the longitudinal displacement device through an electrical control circuit.

[0013] As an optimal technical solution of the universal backlight test fixture in the present invention: one side of the pin detection photoelectric sensor module is the entry sensing side, one side of the probe detection photoelectric sensor module is the touch sensing side, and the end side position of the test probe matches the position of the touch sensing side.

[0014] As an optimal technical solution of the universal backlight test fixture in the present invention: the end side of the test probe is located on the inner side of the touch sensing side of the probe detection photoelectric sensor module, and there is a distance of at least one photoelectric sensing accuracy between the end side of the test probe and the touch sensing side of the probe detection photoelectric sensor module.

[0015] The present invention relates to a backlight testing method based on sensor detection and regulation, comprising the following contents:

[0016] ㈠Place the backlight component to be tested between the horizontal push plate, the vertical push plate and the side limit baffle. The main processing controller determines that the current backlight component to be tested is correctly placed according to the blocking signals of the horizontal photoelectric sensor module and the vertical photoelectric sensor module, and then starts the vertical driving device. ㈡The vertical driving device pushes the vertical push plate, and the vertical push plate pushes the backlight component to be tested toward the side limit baffle. When the pressure sensor strip on one side of the side limit baffle detects the pressure signal, the vertical driving device drives in the reverse direction, driving the vertical push plate to return and separate from the backlight component to be tested. ㈢The main processing controller starts the horizontal driving device, and the horizontal driving device pushes the horizontal push plate to move, and the horizontal push plate pushes the backlight component to be tested to move horizontally. When the pin-entry sensor side sensor of the pin detection photoelectric sensor module detects the pin outer end of the exposed pin, the main processing controller obtains the distance between the pin outer ends of the two exposed pins of the backlight component to be tested, and at the same time, the main processing controller obtains the position information of the pin outer ends of the two exposed pins located in the pin detection photoelectric sensor module. ㈣ The main processing controller drives the longitudinal displacement device to adjust the two adjacent test probes that meet the spacing conditions to a position that is horizontally flush with the outer ends of the exposed pins. ㈤ The main processing controller drives the horizontal driving device to push the backlight component to be tested to continue to move horizontally by the distance of the horizontal overlap spacing, and the outer ends of the exposed pins contact the corresponding test probes, the test circuit is connected, and the detection system detects the backlight component to be tested; wherein, the moving horizontal overlap spacing is the horizontal distance between the foot-entry sensing side and the touch sensing side.

[0017] As a preferred technical solution of the backlight testing method in the present invention: when the backlight component to be tested is placed between the horizontal push plate, the vertical push plate and the side limit baffle, the horizontal photoelectric sensor module and the vertical photoelectric sensor module transmit the blocked signal above it to the main processing controller. ① If the horizontal photoelectric sensor module has a blocking signal that is not from the horizontal push plate, and the vertical photoelectric sensor module has a blocking signal that is not from the vertical push plate, the main processing controller determines that the backlight component to be tested is placed correctly; ② If any one of the horizontal photoelectric sensor module and the vertical photoelectric sensor module does not detect the blocking signal of the backlight component to be tested, the main processing controller determines that the backlight component to be tested is not placed correctly.

[0018] Compared with the prior art, the present invention has the following beneficial effects:

[0019] The present invention configures a matching driving device and components for placement detection and position adjustment of a backlight test piece on a fixed base plate, and configures a pin detection photoelectric sensor module to sense and detect exposed pins of the backlight test piece. At the same time, adjustable test probes with multiple specifications and a probe detection photoelectric sensor module for cooperative sensing detection are configured, thereby completing targeted test probe matching, adjustment, and cooperative connection of exposed pins, and can automatically, conveniently, and low-loss complete the test operation of the backlight piece. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a schematic diagram of the structure of the universal jig for backlight testing in the present invention;

[0021] Figure 2 for Figure 1 A schematic diagram of the structure with a partial enlargement at the center;

[0022] Figure 3 It is a schematic diagram of the local matching relationship between the test probe and the probe detection photoelectric sensor module in the present invention;

[0023] Among them: 1-fixed base plate; 2-lateral push plate; 3-longitudinal push plate; 4-lateral driving device; 5-lateral shaft; 6-lateral guide groove; 7-lateral photoelectric sensor module; 8-longitudinal driving device; 9-longitudinal shaft; 10-longitudinal guide groove; 11-longitudinal photoelectric sensor module; 12-backlight to be tested; 13-side limit baffle; 14-pressure sensor strip; 15-probe base plate; 16-test probe; 17-longitudinal displacement device; 18-longitudinal adjustment rod; 19-exposed pin; 20-pin outer end; 21-pin detection photoelectric sensor module; 22-foot sensing side; 23-probe detection photoelectric sensor module; 24-touch sensing side. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0025] Embodiment 1

[0026] See also Figure 1 , Figure 2 , Figure 3In the present invention, the upper area of ​​the fixed base plate 1 is used, and the lateral push plate 2 can push the backlight to be tested to move horizontally linearly, and the longitudinal push plate 3 can push the backlight to be tested 12 to move vertically linearly. The side limit baffle 13 forms a side limit for the backlight to be tested, and also forms a guide during the pushing process of the lateral push plate 2. When the lateral push plate 2 pushes the backlight to be tested horizontally, when the exposed pin 19 of the backlight to be tested enters the pin entry sensor side 22 of the pin detection photoelectric sensor module 21, the main processing controller obtains the spacing between the two exposed pins 19 and the longitudinal position occupied by the exposed pin 19 on the pin detection photoelectric sensor module 21. The main processing controller drives the longitudinal displacement device 17 to drive the probe substrate 15 to move longitudinally, and adjusts the qualified test probe combination to a position flush with the exposed pin 19, so that the exposed pin 19 can come into contact with the corresponding test probe 16, thereby realizing the detection of the backlight to be tested.

[0027] Embodiment 2

[0028] See also Figure 2 , Figure 3 There is still a certain distance between the test probe 16 and the touch sensing side 24 boundary of the probe detection photoelectric sensor module 23, that is, a sensing detection accuracy of the probe detection photoelectric sensor module 23, for example Figure 3 After entering the touch sensing side 24 of the probe detection photoelectric sensor module 23, the exposed pin 19 first occupies the first sensing detection accuracy position on the inner side of the touch sensing side 24 boundary, that is, after the exposed pin 19 moves forward a distance d, it contacts the test probe 16.

[0029] In actual situations, after the exposed pin 19 enters the touch sensing side 24 and occupies a distance d of sensing detection accuracy, it is too late for the lateral drive device 4 to prepare to stop. In order to solve this contradiction, a test probe 16 with a certain elasticity can be used. Even if there is a certain pressure or slight deformation, it can be restored after the pressure is released. Alternatively, multiple sensing detection accuracy units d are reserved between the test probe 16 and the touch sensing side 24. After the exposed pin 19 occupies the first sensing detection accuracy unit d, the main processing controller performs corresponding parking control on the lateral drive device 4.

[0030] Embodiment 3

[0031] In the present invention, the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor module 23 are both built with a large number of matrix arrayed photoelectric elements. For example, the arrayed distribution of the photoelectric elements of the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor module 23 is:

[0032] ...[pin detection photoelectric sensor module coordinate matrix parameters]; ...[Probe detection photoelectric sensor module coordinate matrix parameters];

[0033] The main processing controller performs horizontal and vertical coordinate parameterization on the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor module 23 according to the arrayed distribution position, and the corresponding XOY two-dimensional parameter coordinates are formed in the main processing controller. The coordinate parameter information in the pin detection photoelectric sensor module 21 and the probe detection photoelectric sensor module 23 is completely aligned, so the main processing controller can obtain the longitudinal coordinates occupied by the two exposed pins 19 and the spacing between the two exposed pins 19. The main processing controller drives the longitudinal displacement device 17 to move the combination of test probes 16 that meets the current spacing between the two exposed pins 19 to the same longitudinal parameter position as the exposed pins 19. Assuming that the pin detection photoelectric sensor module 21 senses that the spacing size between the two exposed pins 19 is Lx, the main processing controller finds the adjacent test probe 16 combination whose spacing size meets the spacing between the two exposed pins 19. Figure 2 Where Ls is the spacing between adjacent test probes 16, that is, looking for an Ls=Lx, or Ls≈Lx [the exposed pins themselves have a certain width. Under the premise that the test probes 16 can touch the exposed pins, the spacing between two test probes 16 is very close to the spacing between two exposed pins 19, and the test operation can also be carried out].

[0034] Combination Figure 2 , Figure 3 As shown, when the outer end of the pin enters the foot-entry sensing side 22 of the pin detection photoelectric sensor module 21, that is, it occupies the first photoelectric sensing accuracy distance on the inner side of the foot-entry sensing side 22 of the pin detection photoelectric sensor module 21, and the distance between the foot-entry sensing side 22 and the touch sensing side 24 is Da, after the exposed pin 19 continues to move forward a distance of Da, the exposed pin 19 will enter the touch sensing side 24 of the probe detection photoelectric sensor module 23, occupy the first photoelectric sensing accuracy distance on the inner side of the touch sensing side 24 of the probe detection photoelectric sensor module 23, and come into contact with the test probe 16.

[0035] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A universal backlight test fixture based on sensor detection and control, comprising a fixed base plate (1), wherein the upper area of ​​the fixed base plate (1) is provided with a directional movable transverse push plate (2) and a longitudinal push plate (3), wherein a backlight component (12) to be tested is placed on the upper side of the fixed base plate (1) and is located between the transverse push plate (2) and the longitudinal push plate (3), wherein the backlight component (12) to be tested comprises two exposed pins (19) located on one side thereof, wherein the exposed pins (19) comprise an outer pin end at an outer end, and wherein: The upper side surface of the fixed base plate (1) is embedded with a transverse photoelectric sensor module (7) that matches the range of motion of the transverse push plate (2), and the upper side surface of the fixed base plate (1) is embedded with a longitudinal photoelectric sensor module (11) that matches the range of motion of the longitudinal push plate (3); The upper side of the fixed base plate (1) is provided with a side limit baffle (13), and a pressure sensing strip (14) is embedded in one side of the side limit baffle (13), wherein the side limit baffle (13) is located at the opposite side of the longitudinal push plate (3); A pin detection photoelectric sensor module (21) for sensing and detecting exposed pins (19) is embedded on the upper side of the fixed base plate (1); A probe substrate (15) that moves in a directional manner is disposed in the upper area of ​​the fixed base plate (1), and a plurality of test probes (16) with successively increasing spacings are disposed on one side of the probe substrate (15); A probe detection photoelectric sensor module (23) configured with a sensor detection test probe (16) is embedded on the upper side of the fixed base plate (1); A longitudinal displacement device (17) is disposed on one side of the fixed base plate (1), a longitudinal adjustment rod (18) is disposed on the output side of the longitudinal displacement device (17), and an end side of the longitudinal adjustment rod (18) is fixedly connected to the probe base plate (15); A main control box is installed on the bottom side of the fixed base plate (1), and a main processing controller is configured in the main control box for driving the longitudinal displacement device (17) to drive the test probe (16) on the probe base plate (15) to align with the exposed pin (19); The main processing controller obtains information about the distance between the pin outer ends of two exposed pins (19) of the backlight component (12) to be tested and the position of the pin outer ends of the two exposed pins (19) at the pin detection photoelectric sensor module (21) through the pin detection photoelectric sensor module (21).

2. According to claim 1, a universal backlight test fixture based on sensor detection and control is characterized in that: The lateral movement photoelectric sensor module (7), the longitudinal movement photoelectric sensor module (11), the pressure sensor strip (14), the pin detection photoelectric sensor module (21), and the probe detection photoelectric sensor module (23) are connected to the main processing controller via a signal transmission line.

3. A universal backlight test fixture based on sensor detection and control according to claim 1 or 2, characterized in that: A group of transverse guide grooves (6) are provided on the upper side of the fixed base plate (1), and a guide structure matching the transverse guide grooves (6) is provided on the lower side of the transverse push plate (2); A group of longitudinal guide grooves (10) are provided on the upper side of the fixed base plate (1), and a guide structure matching the longitudinal guide grooves (10) is provided on the lower side of the longitudinal push plate (3).

4. The universal backlight test fixture based on sensor detection and control according to claim 1 is characterized in that: The probe detection photoelectric sensor module (23) and the pin detection photoelectric sensor module (21) have the same structural dimensions, and the probe detection photoelectric sensor module (23) and the pin detection photoelectric sensor module (21) are aligned in parallel.

5. The universal backlight test fixture based on sensor detection and control according to claim 1, characterized in that: The moving directions of the transverse push plate (2) and the longitudinal push plate (3) are perpendicular to each other; A transverse driving device (4) is disposed on one side of the fixed base plate (1), a transverse shaft rod (5) is disposed on the output side of the transverse driving device (4), and an end side of the transverse shaft rod (5) is fixedly connected to the transverse push plate (2); A longitudinal drive device (8) is disposed on one side of the fixed base plate (1), a longitudinal shaft rod (9) is disposed on the output side of the longitudinal drive device (8), and an end side of the longitudinal shaft rod (9) is fixedly connected to the longitudinal push plate (3); The main processing controller is connected to the transverse drive device (4), the longitudinal drive device (8), and the longitudinal displacement device (17) via an electric control circuit.

6. The universal backlight test fixture based on sensor detection and control according to claim 1, characterized in that: One side of the pin detection photoelectric sensor module (21) is a pin entry sensing side (22), one side of the probe detection photoelectric sensor module (23) is a touch sensing side (24), and the end side position of the test probe (16) matches the position of the touch sensing side (24).

7. The universal backlight test fixture based on sensor detection and control according to claim 6, characterized in that: The end side of the test probe (16) is located inside the touch sensing side (24) of the probe detection photoelectric sensing module (23), and a distance of at least one photoelectric sensing accuracy is left between the end side of the test probe (16) and the touch sensing side (24) of the probe detection photoelectric sensing module (23).

8. A backlight testing method based on sensor detection and regulation, characterized in that: A universal backlight test fixture based on sensor detection and control according to any one of claims 1 to 7, comprising the following contents: (i) Place the backlight component to be tested between the horizontal push plate, the vertical push plate and the side limit baffle. The main processing controller determines that the current backlight component to be tested is correctly placed according to the blocking signals of the horizontal photoelectric sensor module and the vertical photoelectric sensor module, and then starts the vertical driving device; (ii) The longitudinal driving device pushes the longitudinal push plate, and the longitudinal push plate pushes the backlight component to be tested toward the side limit baffle. When the pressure sensor strip on one side of the side limit baffle detects a pressure signal, the longitudinal driving device drives in the reverse direction, driving the longitudinal push plate to return and separate from the backlight component to be tested; (iii) The main processing controller starts the lateral driving device, which drives the lateral push plate to move, and the lateral push plate drives the backlight component to be tested to move lateraly. When the pin-entry sensing side of the pin detection photoelectric sensor module detects the pin outer end of the exposed pin, the main processing controller obtains the distance between the pin outer ends of the two exposed pins of the backlight component to be tested, and at the same time, the main processing controller obtains the position information of the pin outer ends of the two exposed pins located in the pin detection photoelectric sensor module; (iv) The main processing controller drives the longitudinal displacement device to adjust two adjacent test probes that meet the spacing conditions to a position that is laterally flush with the outer ends of the exposed pins; (v) The main processing controller drives the lateral driving device to push the backlight component to be tested to continue to move horizontally by the distance of the lateral overlap spacing, the outer ends of the exposed pins contact with the corresponding test probes, the test circuit is connected, and the detection system detects the backlight component to be tested; The moving lateral overlap spacing is the lateral distance between the foot-entry sensing side and the touch sensing side.

9. The backlight testing method based on sensor detection and regulation according to claim 8, characterized in that: When the backlight component to be tested is placed between the horizontal push plate, the vertical push plate and the side limit baffle, the horizontal photoelectric sensor module and the vertical photoelectric sensor module transmit the shielding signal above it to the main processing controller; ① If the transverse photoelectric sensor module has an occlusion signal of a non-transverse push plate, and the longitudinal photoelectric sensor module has an occlusion signal of a non-longitudinal push plate, the main processing controller determines that the backlight to be tested is placed correctly; ② If any one of the transverse photoelectric sensor module and the longitudinal photoelectric sensor module does not detect the shielding signal of the backlight component to be tested, the main processing controller determines that the backlight component to be tested is not placed correctly.

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