A method, device, electronic device and storage medium for determining ice coating thickness
The backscattered optical power spectrum of the fiber line is obtained through distributed fiber sensing technology, and the temperature of the ice-covered and unfilled ice-covered areas is determined, which solves the accuracy and difficulty of ice-covered monitoring in the prior art, and realizes efficient ice-covered thickness calculation.
Patent Information
- Application Number
- CN202210118361.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-02-08
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2042-02-08
AI Technical Summary
The existing ice-covered monitoring methods for power transmission lines have problems such as poor anti-interference ability, short service life, poor data transmission reliability, and difficulty in monitoring the status of the entire line, which makes ice-covered monitoring difficult.
The distributed fiber sensing technology is used to determine the temperature of the ice-covered and unfilled areas by obtaining the backscattered optical power spectrum of at least two test points on the fiber line, thereby calculating the ice-covered thickness, and no additional sensors are required to be installed using Brillouin or Raman optical time-domain reflection technology.
It improves the accuracy of determining the thickness of ice covering, reduces the difficulty of ice covering monitoring of transmission lines, and is easy to implement, providing a new idea.
Smart Images

Figure CN114441061B_ABST
Abstract
Description
Technical Field
[0001] The embodiments of the present invention relate to the technical field of optical fiber sensing, and in particular, to a method, device, electronic device and storage medium for determining ice coating thickness. Background Art
[0002] With the development of the power system, the application of power optical cables is becoming more and more extensive. These power optical cables are erected in the air and are also called optical fiber composite overhead lines. They are prone to external force damage, lightning strikes, wind blows, ice coating, and wildfires during actual operation, resulting in faults. Therefore, how to predict the ice coating state and avoid the occurrence of faults is valuable for improving power supply reliability.
[0003] Currently, the ice coating monitoring of transmission lines mainly includes the weighing method, the image method, the conductor inclination method, the fiber Bragg grating method, etc. These monitoring methods have made contributions to ensuring the normal operation of transmission lines and avoiding accidents. However, the above methods have certain limitations, such as poor anti-interference ability, short service life, poor data transmission reliability, and difficulty in monitoring the state of the entire transmission line. Therefore, the problem of ice coating monitoring of transmission lines needs to be further studied. Summary of the Invention
[0004] The present invention provides a method, device, electronic device and storage medium for determining ice coating thickness, so as to achieve the effect of reducing the difficulty of ice coating monitoring of transmission lines and improving the accuracy of determining ice coating thickness.
[0005] In a first aspect, an embodiment of the present invention provides a method for determining ice coating thickness, the method includes:
[0006] Obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light opposite to the propagation direction of the incident light;
[0007] Determine the temperature of the ice-coated area and the temperature of the non-ice-coated area in the optical fiber line according to the backscattered light power spectra of the at least two test points;
[0008] Determine the ice coating thickness of the optical fiber line according to the temperature of the ice-coated area and the temperature of the non-ice-coated area.
[0009] In a second aspect, an embodiment of the present invention further provides a device for determining ice coating thickness, the device includes:
[0010] A spectrum acquisition module, configured to obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light opposite to the propagation direction of the incident light;
[0011] A temperature determination module, configured to determine the temperature of the ice-coated area and the temperature of the non-ice-coated area in the optical fiber line according to the backscattered light power spectra of the at least two test points;
[0012] A thickness determination module, configured to determine the ice-covering thickness of the optical fiber line according to the temperature in the ice-covered area and the temperature in the non-ice-covered area.
[0013] In a third aspect, an embodiment of the present invention further provides an electronic device, which includes:
[0014] One or more processors;
[0015] A storage device, configured to store one or more programs,
[0016] When the one or more programs are executed by the one or more processors, the one or more processors implement the method for determining the ice-covering thickness according to any embodiment of the present invention.
[0017] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the method for determining the ice-covering thickness according to any embodiment of the present invention is implemented.
[0018] The method, device, electronic device and storage medium for determining the ice-covering thickness provided by the embodiment of the present invention obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the opposite direction to the propagation direction of the incident light; according to the backscattered light power spectra of the at least two test points, determine the temperature in the ice-covered area and the temperature in the non-ice-covered area in the optical fiber line; according to the temperature in the ice-covered area and the temperature in the non-ice-covered area, determine the ice-covering thickness of the optical fiber line. The present invention adopts the distributed optical fiber sensing technology, and can accurately determine the temperature along the optical fiber line according to the scattered power along the optical fiber line, and then estimate the ice-covering thickness of the whole line, improving the accuracy of determining the ice-covering thickness, and without the need to additionally install sensors, which is convenient to implement, reduces the difficulty of ice-covering monitoring of transmission lines, and provides a new idea for ice-covering monitoring of transmission lines. Description of the Drawings
[0019] Figure 1A is a flowchart of a method for determining the ice-covering thickness provided by Embodiment 1 of the present invention;
[0020] Figure 1B is a schematic diagram of the OPGW temperature field model provided by Embodiment 1 of the present invention;
[0021] Figure 1C is a graph showing the relationship between the optical fiber temperature and time in the ice-covered area within 0-10 hours with different ice-covering thicknesses provided by Embodiment 1 of the present invention;
[0022] Figure 1D is a graph showing the relationship between the optical fiber temperature and time in the non-ice-covered area within 0-10 hours with different ice-covering thicknesses provided by Embodiment 1 of the present invention;
[0023] Figure 1E It is a graph showing the relationship between the temperature difference between the iced area and the non-iced area of the optical fiber and time under different ice thicknesses provided by Embodiment 1 of the present invention;
[0024] Figure 1F It is a graph showing the relationship between the temperature difference of the optical fiber at steady state and the ice thickness provided by Embodiment 1 of the present invention;
[0025] Figure 2 It is a flowchart of a method for determining ice thickness provided by Embodiment 2 of the present invention;
[0026] Figure 3 It is a flowchart of a method for determining ice thickness provided by Embodiment 3 of the present invention;
[0027] Figure 4 It is a flowchart of a method for determining ice thickness provided by Embodiment 4 of the present invention;
[0028] Figure 5 It is a structural block diagram of a device for determining ice thickness provided by Embodiment 5 of the present invention;
[0029] Figure 6 It is a schematic structural diagram of an electronic device provided by Embodiment 6 of the present invention. Detailed Embodiments
[0030] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present invention, rather than limiting the present invention. Additionally, it should be noted that for the sake of description, only parts related to the present invention are shown in the accompanying drawings, rather than all the structures.
[0031] Embodiment 1
[0032] Figure 1A It is a flowchart of a method for determining ice thickness provided by Embodiment 1 of the present invention. This embodiment is applicable to the situation of ice monitoring on transmission lines. This method can be executed by the device for determining ice thickness provided by the embodiments of the present invention. The device can be implemented in software and / or hardware and can be integrated on an electronic device.
[0033] Specifically, as Figure 1A shown, the method for determining ice thickness provided by the embodiments of the present invention may include the following steps:
[0034] S110. Obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the direction opposite to the propagation direction of the incident light.
[0035] Among them, the optical fiber line refers to the power optical cable used for power transmission, which is applied in the power system to balance power transmission and information communication, including the Optical Power Grounded Waveguide (OPGW), the All-Dielectric Self-Supporting Cable (ADSS), and the Optical phase Conductor (OPPC). Optical fibers are compounded in OPGW, ADSS, and OPPC. Based on Brillouin Optical Time Domain Reflectometer (BOTDR) or Raman Optical Time Domain Reflectometry (ROTDR), the temperature along the optical fiber can be monitored without additional installation of sensors, which is convenient to implement. And the icing state may affect the temperature of the optical fiber. Therefore, the icing state can be judged based on the temperature along the optical fiber.
[0036] The pulsed light is incident on the optical fiber from the incident end, and Brillouin scattering or Raman scattering occurs when the light propagates in the optical fiber. The scattered light in the opposite direction to the propagation direction of the incident light is the backward scattered light. At the incident end, the backward scattered light power can be detected through a coupler, a circulator, a photoelectric detector, etc., and the backward scattered light power spectra of at least two test points on the optical fiber line can be obtained. It should be noted that when detecting the backward scattered light power at different frequencies, the relationship between the backward scattered light power and the frequency is the backward scattered light power spectrum.
[0037] S120. Determine the temperature of the iced area and the temperature of the non-iced area in the optical fiber line according to the backward scattered light power spectra of at least two test points.
[0038] Considering the correlation between the parameter characteristics of the backward scattered light power spectrum and the temperature, the optical fiber temperature of each test point can be determined according to the backward scattered light power spectra of at least two test points, so as to determine the temperature of the iced area and the temperature of the non-iced area in the optical fiber line.
[0039] Optionally, the understanding of the iced area and the non-iced area can be that the optical fiber lines in the iced area are all wrapped by ice layers, and the optical fiber lines in the non-iced area are not wrapped by ice layers.
[0040] Exemplarily, in this embodiment, taking the optical fiber composite overhead ground wire with the model number OPGW-24B1-145 as an example, an axial two-dimensional temperature field model of the ice-covered OPGW is established. OPGW-24B1-145 contains an optical unit, and inside this optical unit, there are 24 G.652 optical fibers. Since the OPGW does not generate heat, only the heat transfer between the air, the OPGW, and the ice layer through convection and radiation is considered in the model. The temperature field model is to model the cross-section of OPGW-24B1-145, adding an ice-covered area around the line, and the outside of the ice-covered area is air. According to the heat transfer principle, the outer surface of the ice-covered area is the interface between the ice layer and the air, belonging to the convective heat transfer boundary, which conforms to the third type of boundary condition. The materials and parameters involved in the model are shown in Table 1.
[0041] Since the volume of the optical unit is very small and has little influence on the temperature distribution, it is ignored, and the line is considered to be a mixture of aluminum and steel. The cross-sectional size of the OPGW is very small compared to its length, and it can be simplified as a cylinder when modeling, and two-dimensional axisymmetry is used for modeling. The total length of the constructed OPGW line is 7.5 m. The OPGW is ice-covered in two regions of 1.5 m - 3 m and 4.5 m - 6 m, and the OPGW is not ice-covered in three regions of 0 - 1.5 m, 3 m - 4.5 m, and 6 m - 7.5 m. The schematic diagram of the modeling is as Figure 1B shown. The outside of the line in the non-ice-covered area and the outside of the ice layer are convective heat transfer boundaries. The ice thickness (i.e., the thickness of the ice layer) is set to 4 mm.
[0042] Table 1 Material parameters involved in the model
[0043]
[0044] The initial ambient temperature is set to 0 °C, and the air temperature drops at a rate of 2 °C / h. Analyze the variation law of the temperature of the OPGW and the ice layer with time within 0 - 10 h. The finite element method is used to calculate the temperature field model of the OPGW under ice-covered conditions, and the temperature distributions in the non-ice-covered area, the junction between the non-ice-covered and ice-covered areas, and the ice-covered area at the 10th h are obtained. The temperature of the OPGW in the non-ice-covered area is about -16.3 °C; the temperatures of the OPGW and the ice layer at the junction between the non-ice-covered and ice-covered areas are about -16.2 °C, and the temperature is higher closer to the ice layer; the temperatures of the OPGW and the ice layer in the ice-covered area are about -16.1 °C. It can be seen that the temperatures of the OPGW in the ice-covered area and the non-ice-covered area are different, and the temperature of the OPGW in the ice-covered area is significantly higher than that in the non-ice-covered area. This is because the air temperature is lower than the OPGW temperature. Whether in the ice-covered area or the non-ice-covered area, the temperature gradually approaches the air temperature. And the ice coverage affects the heat transfer.
[0045] However, when the entire optical fiber line is wrapped by ice, the definitions of the ice-covered area and the non-ice-covered area are relative. At this time, the ice-covered area can be understood as the area with the thickest ice layer on the entire optical fiber line, while the non-ice-covered area can be understood as the area with the thinnest ice layer on the entire optical fiber line. Correspondingly, the temperature in the ice-covered area is the highest temperature in the optical fiber line, and the temperature in the non-ice-covered area is the lowest temperature in the optical fiber line.
[0046] S130. Determine the ice thickness of the optical fiber line according to the temperature in the ice-covered area and the temperature in the non-ice-covered area.
[0047] Based on the established temperature field model of OPGW in the ice-covered state, the ice thickness is set to be 1 - 10 mm respectively, with a step size of 1 mm, and other parameters remain unchanged. The finite element method is used to solve this model, and the temperatures along the optical fiber at 2 h, 4 h, 6 h, and 10 h when the ice thickness is 4 mm are calculated. It can be seen that the temperature of the optical fiber in the ice-covered area is higher than that in the non-ice-covered area at different times, and the temperature difference between the two shows an increasing trend with the increase of time. The relationships between the temperatures of the optical fiber in the ice-covered area and the non-ice-covered area and time under different ice thicknesses are respectively as Figure 1C and Figure 1D shown. It can be seen that the temperature of the optical fiber in the ice-covered area is higher than that in the non-ice-covered area, and the temperature difference between the two also increases with the increase of the ice thickness. This result is consistent with that when the ice thickness is 4 mm, further verifying the reliability of this conclusion. The relationship between the temperature difference between the two and time under different ice thicknesses is as Figure 1E shown. The thicker the ice, the faster the increase rate of the temperature difference between the two with the decrease of time / temperature. The reason is that the ice affects the heat conduction process.
[0048] When the time is 10 h, the temperature difference of the optical fiber reaches a stable value, and this stable value is closely related to the ice thickness. The thicker the ice, the greater the temperature difference of the optical fiber. When the time is 10 h, the relationship between the temperature difference between the two and the ice thickness is as Figure 1F shown. Considering the curve shape and generalization ability, it is assumed that the ice thickness and the temperature difference satisfy the following linear relationship:
[0049] d = aΔT + b
[0050] where ΔT is the temperature difference between the optical fiber in the ice-covered area and the non-ice-covered area, with the unit of °C; d is the ice thickness, with the unit of mm; a and b are coefficients. Through fitting, it is obtained that:
[0051] d = 9.22ΔT + 1.30
[0052] The corresponding curve and error are also as Figure 1FAs shown in the figure. Since the temperature difference of the optical fiber has reached a stable value with time change at 10 h, the ice accretion thickness can be predicted based on the temperature difference of the optical fiber in the stable state in this embodiment. It should be noted that this embodiment only takes the linearity of the above model as an example for illustration. When the model parameters change, the temperature difference of the optical fiber and the ice accretion thickness are still correlated in the stable state, and the coefficients a and b can be re-determined by fitting for predicting the ice accretion thickness according to the temperature difference of the optical fiber.
[0053] The technical solution of this embodiment is to obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the opposite direction to the propagation direction of the incident light; determine the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the backscattered light power spectra of at least two test points; and determine the ice accretion thickness of the optical fiber line according to the temperature of the ice-covered area and the temperature of the non-ice-covered area. The present invention adopts the distributed optical fiber sensing technology, and can accurately determine the temperature along the optical fiber line according to the scattered power along the optical fiber line, and then estimate the ice accretion thickness of the whole line, improving the accuracy of determining the ice accretion thickness, and without the need to install additional sensors, which is convenient to implement, reduces the difficulty of monitoring the ice accretion on the transmission line, and provides a new idea for monitoring the ice accretion on the transmission line.
[0054] Embodiment 2
[0055] Figure 2 It is a flowchart of a method for determining the ice accretion thickness provided by Embodiment 2 of the present invention. This method is further optimized on the basis of the above embodiment, and gives a specific introduction on how to determine the temperature of the ice-covered area, the temperature of the non-ice-covered area and the temperature difference.
[0056] Specifically, as Figure 2 shown, the method includes:
[0057] S210. Obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the opposite direction to the propagation direction of the incident light.
[0058] S220. Determine the optical fiber temperature of each test point according to the backscattered light power spectra of at least two test points.
[0059] In this embodiment, considering the correlation between the parameter characteristics of the backscattered light power spectrum and the temperature, the optical fiber temperature of each test point can be determined according to the backscattered light power spectra of at least two test points.
[0060] If the backscattered light is Brillouin scattered light, the Brillouin frequency shift of each measurement point can be determined according to the Brillouin spectra of at least two measurement points. Considering that loose-tube optical fibers are usually used in OPGW and the optical fibers do not bear strain, there is a linear relationship between the Brillouin frequency shift and temperature. Further, the optical fiber temperature of each measurement point can be determined according to the Brillouin frequency shift of each measurement point and the linear relationship between the Brillouin shift and temperature.
[0061] If the backscattered light is Raman scattered light, the intensity of the anti-Stokes light and the Stokes light of each measurement point can be determined according to the Raman scattering power spectra of at least two measurement points; then, the optical fiber temperature of each measurement point can be determined according to the intensity of the anti-Stokes light and the Stokes light of each measurement point.
[0062] S230. Determine the temperature of the ice-covered area and the non-ice-covered area in the optical fiber line according to the optical fiber temperature of each measurement point.
[0063] As can be seen from the above embodiments, the temperature of the OPGW in the ice-covered area is significantly higher than that in the non-ice-covered area. Preferably, the temperature of the ice-covered area can be set as the highest temperature in the optical fiber line, and the temperature of the non-ice-covered area can be set as the lowest temperature in the optical fiber line.
[0064] In this way, when the entire optical fiber line is wrapped by ice, the definitions of the ice-covered area and the non-ice-covered area are relative. At this time, the ice-covered area can be understood as the area with the thickest ice layer in the entire optical fiber line, and the non-ice-covered area can be understood as the area with the thinnest ice layer in the entire optical fiber line. Correspondingly, the temperature of the ice-covered area is the highest temperature in the optical fiber line, and the temperature of the non-ice-covered area is the lowest temperature in the optical fiber line.
[0065] S240. Determine the temperature difference between the optical fibers in the ice-covered area and the non-ice-covered area according to the temperature of the ice-covered area and the temperature of the non-ice-covered area.
[0066] Since the temperature of the ice-covered area is the highest temperature in the optical fiber line and the temperature of the non-ice-covered area is the lowest temperature in the optical fiber line, the temperature difference between the optical fibers in the ice-covered area and the non-ice-covered area can be determined according to the highest temperature and the lowest temperature in the optical fiber line.
[0067] S250. Determine the ice thickness of the optical fiber line according to the temperature difference.
[0068] As can be seen from the above embodiments, in the steady state, the optical fiber temperature difference and the ice thickness are correlated, and the ice thickness can be predicted based on the optical fiber temperature difference in the steady state. Among them, the steady state can be understood as a state in which the optical fiber temperature difference has reached a steady value with the change of time.
[0069] The technical solution of this embodiment provides a specific introduction to determining the temperature of the ice-covered area, the temperature of the non-ice-covered area, and the temperature difference. By determining the optical fiber temperature of each test point according to the backscattered light power spectra of at least two test points, determining the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the optical fiber temperature of each test point, determining the temperature difference between the optical fibers in the ice-covered area and the non-ice-covered area according to the temperature of the ice-covered area and the temperature of the non-ice-covered area, and determining the ice thickness of the optical fiber line according to the temperature difference, the accuracy of determining the ice thickness can be improved.
[0070] Embodiment III
[0071] Figure 3 As shown in the flowchart of a method for determining ice thickness provided in Embodiment III of the present invention, this method is further optimized on the basis of the above embodiment, and provides a specific introduction to the case where the backscattered light is Brillouin scattered light.
[0072] Specifically, as Figure 3 shown, this method includes:
[0073] S310. Obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the direction opposite to the propagation direction of the incident light.
[0074] S320. If the backscattered light is Brillouin scattered light, determine the Brillouin frequency shift of each test point according to the Brillouin spectra of at least two test points.
[0075] Specifically, the method for determining the Brillouin frequency shift according to the Brillouin spectra can be a method commonly used by those skilled in the art, and this embodiment does not make specific limitations.
[0076] S330. Determine the optical fiber temperature of each test point according to the Brillouin frequency shift of each test point and the linear relationship between the Brillouin shift and the temperature.
[0077] Considering that loose-tube optical fibers are usually used in OPGW and the optical fibers do not bear strain, there is a linear relationship between the Brillouin frequency shift and the optical fiber temperature. The temperature calculation method is as follows:
[0078]
[0079] In the formula, T is the optical fiber temperature, which can be the temperature at each position of the entire optical fiber, and the time difference between the incidence of the incident light and the arrival of the backscattered light at the incident end can be used for positioning; v B is the Brillouin frequency shift of the optical fiber to be measured, which can be obtained by least square fitting; v B0 is the Brillouin frequency shift of the optical fiber at the reference temperature and without strain; C cT is the temperature sensitivity coefficient of the Brillouin frequency shift; T0 is the reference temperature, and a value close to the ambient temperature can be selected.
[0080] S340. Determine the icing zone temperature and non-icing zone temperature in the optical fiber line according to the optical fiber temperatures at each test point.
[0081] S350. Determine the icing thickness of the optical fiber line according to the icing zone temperature and non-icing zone temperature.
[0082] The technical solution of this embodiment determines the optical fiber temperature at each test point according to the Brillouin frequency shift at each test point and the linear relationship between the Brillouin shift and temperature, and can accurately determine the optical fiber temperature according to the Brillouin scattered light, which is conducive to accurately determining the icing thickness.
[0083] Embodiment 4
[0084] Figure 4 It is a flowchart of a method for determining the icing thickness provided by Embodiment 4 of the present invention. This method is further optimized on the basis of the above embodiment, and introduces the specific situation where the backscattered light is Raman scattered light.
[0085] Specifically, as Figure 4 shown, the method includes:
[0086] S410. Obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the direction opposite to the propagation direction of the incident light.
[0087] S420. If the backscattered light is Raman scattered light, determine the anti-Stokes light intensity and Stokes light intensity at each test point according to the Raman scattered light power spectra of at least two test points.
[0088] Among them, the Stokes light intensity and anti-Stokes light intensity can be detected by optical devices.
[0089] S430. Determine the optical fiber temperature at each test point according to the anti-Stokes light intensity and Stokes light intensity at each test point.
[0090] Since there is a correlation between the anti-Stokes light intensity, Stokes light intensity and the optical fiber temperature, after determining the anti-Stokes light intensity and Stokes light intensity at each test point, the optical fiber temperature at each test point can be determined according to the anti-Stokes light intensity and Stokes light intensity at each test point.
[0091] Specifically, the temperature calculation formula is as follows:
[0092]
[0093] In the formula, T0 is the reference temperature; Planck's constant h = 6.626×10 -34 J·s; Boltzmann constant k = 1.38×10-23 J / K; Raman shift Δγ = 13.2 THz; c is the speed of light in vacuum; Is0 and I sf are the Stokes light intensities of the optical fiber to be measured at the reference temperature and the actual temperature respectively; I as0 and I asf are the anti-Stokes light intensities of the optical fiber to be measured at the reference temperature and the actual temperature respectively.
[0094] S440. Determine the ice-covered area temperature and the non-ice-covered area temperature in the optical fiber line according to the optical fiber temperatures at each test point.
[0095] S450. Determine the ice thickness of the optical fiber line according to the ice-covered area temperature and the non-ice-covered area temperature.
[0096] The technical solution of this embodiment determines the optical fiber temperature at each test point according to the anti-Stokes light intensity and the Stokes light intensity at each test point, and can accurately determine the optical fiber temperature according to the Raman scattered light, which is beneficial to accurately determining the ice thickness.
[0097] Embodiment Five
[0098] Figure 5 is a schematic structural diagram of a device for determining ice thickness provided in Embodiment Five of the present invention. This device is applicable to execute the method for determining ice thickness provided in the embodiment of the present invention, and can reduce the difficulty of ice-covered transmission line monitoring and improve the accuracy of determining ice thickness. As Figure 5 shown, this device includes a spectrum acquisition module 510, a temperature determination module 520, and a thickness determination module 530.
[0099] Among them, the spectrum acquisition module 510 is used to acquire the backscattered light power spectra of at least two test points on the optical fiber line; among them, the backscattered light is the scattered light in the direction opposite to the propagation direction of the incident light;
[0100] The temperature determination module 520 is used to determine the ice-covered area temperature and the non-ice-covered area temperature in the optical fiber line according to the backscattered light power spectra of at least two test points;
[0101] The thickness determination module 530 is used to determine the ice thickness of the optical fiber line according to the ice-covered area temperature and the non-ice-covered area temperature.
[0102] The technical solution of this embodiment is to obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light opposite to the propagation direction of the incident light; determine the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the backscattered light power spectra of at least two test points; and determine the ice thickness of the optical fiber line according to the temperature of the ice-covered area and the temperature of the non-ice-covered area. The present invention adopts the distributed optical fiber sensing technology, and can accurately determine the temperature along the optical fiber line according to the scattered power along the optical fiber line, and then estimate the ice thickness of the whole line, improving the accuracy of determining the ice thickness. Moreover, no additional sensors need to be installed, which is convenient to implement, reduces the difficulty of monitoring the icing of transmission lines, and provides a new idea for monitoring the icing of transmission lines.
[0103] Preferably, the above temperature determination module specifically includes: a test point temperature determination unit and a region temperature determination unit. Among them, the test point temperature determination unit is used to determine the optical fiber temperature of each test point according to the backscattered light power spectra of at least two test points; the region temperature determination unit is used to determine the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the optical fiber temperature of each test point.
[0104] Preferably, the above temperature of the ice-covered area is the highest temperature in the optical fiber line, and the above temperature of the non-ice-covered area is the lowest temperature in the optical fiber line.
[0105] Preferably, the above test point temperature determination unit is specifically used for: if the backscattered light is Brillouin scattered light, determine the Brillouin frequency shift of each test point according to the Brillouin spectra of at least two test points; and determine the optical fiber temperature of each test point according to the Brillouin frequency shift of each test point and the linear relationship between the Brillouin shift and the temperature.
[0106] Preferably, the above test point temperature determination unit is also specifically used for: if the backscattered light is Raman scattered light, determine the intensity of the anti-Stokes light and the intensity of the Stokes light of each test point according to the Raman scattered light power spectra of at least two test points; and determine the optical fiber temperature of each test point according to the intensity of the anti-Stokes light and the intensity of the Stokes light of each test point.
[0107] Preferably, the above thickness determination module 530 includes: a temperature difference determination unit and a thickness determination unit. Among them, the temperature difference determination unit is used to determine the temperature difference between the optical fibers in the ice-covered area and the non-ice-covered area according to the temperature of the ice-covered area and the temperature of the non-ice-covered area; the thickness determination unit is used to determine the ice thickness of the optical fiber line according to the temperature difference.
[0108] The device for determining the ice thickness provided by the embodiment of the present invention can execute the method for determining the ice thickness provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects for executing the method.
[0109] Embodiment Six
[0110] Figure 6 This is a schematic structural diagram of an electronic device provided in Embodiment 6 of the present invention. Figure 6 The block diagram of an exemplary electronic device 12 suitable for implementing the embodiments of the present invention is shown. Figure 6 The displayed electronic device 12 is merely an example and should not impose any limitation on the functions and usage scope of the embodiments of the present invention.
[0111] As Figure 6 shown, the electronic device 12 is presented in the form of a general-purpose computing device. The components of the electronic device 12 may include, but are not limited to: one or more processors or processing units 16, a system memory 28, and a bus 18 connecting different system components (including the system memory 28 and the processing unit 16).
[0112] The bus 18 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, a graphics acceleration port, a processor, or a local bus using any of the various bus structures. For example, these architectures include, but are not limited to, Industry Standard Architecture (ISA) bus, Micro Channel Architecture (MCA) bus, Enhanced ISA bus, Video Electronics Standards Association (VESA) local bus, and Peripheral Component Interconnect (PCI) bus.
[0113] The electronic device 12 typically includes a variety of computer system-readable media. These media can be any available media accessible by the electronic device 12, including volatile and non-volatile media, removable and non-removable media.
[0114] The system memory 28 may include computer system-readable media in the form of volatile memory, such as random access memory (RAM) 30 and / or cache memory 32. The electronic device 12 may further include other removable / non-removable, volatile / non-volatile computer system storage media. By way of example only, a storage system 34 may be used for reading and writing non-removable, non-volatile magnetic media ( Figure 6 not shown, commonly referred to as a "hard disk drive"). Although Figure 6 not shown in, a disk drive for reading and writing removable non-volatile disks (such as "floppy disks") and an optical disk drive for reading and writing removable non-volatile optical disks (such as CD-ROM, DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to the bus 18 through one or more data media interfaces. The system memory 28 may include at least one program product having a set (such as at least one) of program modules configured to perform the functions of the embodiments of the present invention.
[0115] A program / utility 40 having a set (at least one) of program modules 42 can be stored, for example, in the system memory 28. Such program modules 42 include, but are not limited to, an operating system, one or more application programs, other program modules, and program data. Each or some combination of these examples may include the implementation of a network environment. The program modules 42 generally execute the functions and / or methods in the embodiments described in the present invention.
[0116] The electronic device 12 can also communicate with one or more external devices 14 (such as a keyboard, a pointing device, a display 24, etc.), and can also communicate with one or more devices that enable a user to interact with the electronic device 12, and / or communicate with any device that enables the electronic device 12 to communicate with one or more other computing devices (such as a network card, a modem, etc.). Such communication can be carried out through the input / output (I / O) interface 22. In addition, the electronic device 12 can also communicate with one or more networks (such as a local area network (LAN), a wide area network (WAN), and / or a public network, such as the Internet) through the network adapter 20. As shown in the figure, the network adapter 20 communicates with other modules of the electronic device 12 through the bus 18. It should be understood that although not shown in the figure, other hardware and / or software modules can be used in combination with the electronic device 12, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems, etc.
[0117] The processing unit 16 executes various functional applications and data processing by running the programs stored in the system memory 28, such as implementing the method for determining the ice accretion thickness provided in the embodiments of the present invention.
[0118] Embodiment Seven
[0119] Embodiment Seven of the present invention also provides a computer-readable storage medium, on which a computer program is stored. When the program is executed by a processor, it implements the method for determining the ice accretion thickness provided in any embodiment of the present application.
[0120] The computer storage medium of the embodiments of the present invention may adopt any combination of one or more computer-readable media. The computer-readable media may be computer-readable signal media or computer-readable storage media. The computer-readable storage media may be, for example, but not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or components, or any combination of the above. More specific examples (non-exhaustive list) of the computer-readable storage media include: electrical connections with one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the above. In this document, the computer-readable storage media may be any tangible medium that contains or stores a program, and this program may be used by or in combination with an instruction execution system, device, or component.
[0121] The computer-readable signal media may include data signals propagated in a baseband or as part of a carrier wave, which carry computer-readable program codes. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. The computer-readable signal media may also be any computer-readable media other than the computer-readable storage media, and this computer-readable media may send, propagate, or transmit a program for use by or in combination with an instruction execution system, device, or component.
[0122] The program codes contained on the computer-readable media may be transmitted by any appropriate medium, including but not limited to wireless, wire, optical cable, RF, etc., or any suitable combination of the above.
[0123] The computer program codes for performing the operations of the present invention may be written in one or more programming languages or combinations thereof. The programming languages include object-oriented programming languages such as Java, Smalltalk, C++, and also include conventional procedural programming languages - such as the "C" language or similar programming languages. The program codes may be executed entirely on the user's computer, partially on the user's computer, executed as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (for example, by using an Internet service provider to connect through the Internet).
[0124] Note that the above is only a preferred embodiment of the present invention and the technical principles applied. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein. Various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments. Without departing from the concept of the present invention, it can also include more other equivalent embodiments, and the scope of the present invention is determined by the scope of the appended claims.
Claims
1. A method for determining the ice coating thickness, characterized in that, The method includes: Obtaining the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the direction opposite to the propagation direction of the incident light; Determining the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the backscattered light power spectra of the at least two test points; Determining the ice thickness of the optical fiber line according to the temperature of the ice-covered area and the temperature of the non-ice-covered area; The determining the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the backscattered light power spectra of the at least two test points includes: Determining the optical fiber temperature of each test point according to the backscattered light power spectra of the at least two test points; Determining the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the optical fiber temperature of each test point; The temperature of the ice-covered area is the highest temperature in the optical fiber line, and the temperature of the non-ice-covered area is the lowest temperature in the optical fiber line.
2. The method according to claim 1, wherein The determining the optical fiber temperature of each test point according to the backscattered light power spectra of the at least two test points includes: If the backscattered light is Brillouin scattered light, determining the Brillouin frequency shift of each test point according to the Brillouin spectra of at least two test points; Determining the optical fiber temperature of each test point according to the Brillouin frequency shift of each test point and the linear relationship between the Brillouin shift and the temperature.
3. The method according to claim 1, wherein The determining the optical fiber temperature of each test point according to the backscattered light power spectra of the at least two test points includes: If the backscattered light is Raman scattered light, determining the intensity of the anti-Stokes light and the intensity of the Stokes light of each test point according to the Raman scattered light power spectra of at least two test points; Determining the optical fiber temperature of each test point according to the intensity of the anti-Stokes light and the intensity of the Stokes light of each test point.
4. The method according to claim 1, wherein The determining the ice thickness of the optical fiber line according to the temperature of the ice-covered area and the temperature of the non-ice-covered area includes: Determining the temperature difference between the optical fiber in the ice-covered area and the optical fiber in the non-ice-covered area according to the temperature of the ice-covered area and the temperature of the non-ice-covered area; Determining the ice thickness of the optical fiber line according to the temperature difference.
5. A device for determining the ice coating thickness, characterized in that, The device includes: A spectrum acquisition module, configured to obtain the backscattered light power spectra of at least two test points on the optical fiber line; wherein, the backscattered light is the scattered light in the direction opposite to the propagation direction of the incident light; A temperature determination module, configured to determine the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the backscattered light power spectra of the at least two test points; A thickness determination module, configured to determine the ice thickness of the optical fiber line according to the temperature of the ice-covered area and the temperature of the non-ice-covered area; The temperature determination module includes: A test point temperature determination unit, configured to determine the optical fiber temperature of each test point according to the backscattered light power spectra of the at least two test points; A region temperature determination unit, configured to determine the temperature of the ice-covered area and the temperature of the non-ice-covered area in the optical fiber line according to the optical fiber temperature of each test point; The temperature of the ice-covered area is the highest temperature in the optical fiber line, and the temperature of the non-ice-covered area is the lowest temperature in the optical fiber line.
6. An electronic device, characterized in that, The electronic device includes: One or more processors; A storage device, configured to store one or more programs, When the one or more programs are executed by the one or more processors, the one or more processors implement the method for determining ice accretion thickness according to any one of claims 1-4.
7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, the method for determining ice accretion thickness according to any one of claims 1-4 is implemented.
Citation Information
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