Panel brightness analysis method, device, electronic device and storage medium

Abstract

The present application discloses a method, device, electronic device and storage medium for analyzing panel brightness. The method includes: obtaining a simulation model of a liquid crystal panel; determining the transmittance influence parameters of each node of the simulation model according to the simulation model; calculating the node transmittance of each node of the simulation model according to the transmittance influence parameters; and determining the transmitted light brightness value of each node according to the incident light brightness and the node transmittance. In the embodiments of the present application, for liquid crystal panel products with external force in the actual use process, the brightness distribution is quantitatively calculated in the design stage, avoiding repeated sample production for experiments.

Description

Technical Field

[0001] The present application relates to the field of display technologies, and particularly to a method, apparatus, electronic device, and storage medium for analyzing panel brightness. Background Art

[0002] Thin film transistor-liquid crystal display (TFT-LCD) controls the deflection state of liquid crystal molecules inside a liquid crystal cell (Cell) by changing the driving voltage, and adjusts the optical transmittance of three sub-pixels of red (R), green (G), and blue (B), thereby displaying a color picture with a specific color and brightness. Therefore, the optical transmittance is an important factor determining the brightness index of the liquid crystal panel. If the transmittance of a local area increases or decreases due to certain reasons, the liquid crystal screen will have uneven brightness, that is, the Mura phenomenon, which shows dark state light leakage at low gray levels and bright state dark clusters at high gray levels, both seriously affecting the optical quality of LCD products. Therefore, how to quantitatively evaluate the mechanical Mura problem is an urgent problem to be solved. Summary of the Invention

[0003] Embodiments of the present application provide a method, apparatus, electronic device, and storage medium for analyzing panel brightness, which can quantitatively calculate the brightness distribution of a liquid crystal panel product under external force during the design stage, avoiding repeated sample production and testing.

[0004] In a first aspect, embodiments of the present application provide a method for analyzing panel brightness, including:

[0005] Obtaining a simulation model of a liquid crystal panel;

[0006] Determining the transmittance influence parameters of each node of the simulation model according to the simulation model;

[0007] Calculating the node transmittance of each node of the simulation model according to the transmittance influence parameters;

[0008] Determining the transmitted light brightness value of each node according to the incident light brightness and the node transmittance.

[0009] In some embodiments, the transmittance influence parameters include panel transmittance, aperture ratio, and light intensity absorption coefficient. The determining the transmittance influence parameters of each node of the simulation model according to the simulation model includes:

[0010] Determining the liquid crystal cell thickness, internal stress of the substrate, substrate thickness, and relative misalignment amount between corresponding nodes according to the simulation model, where the corresponding nodes are the nodes corresponding to each other on the upper glass substrate and the lower glass substrate of the liquid crystal panel in the initial state;

[0011] Determine the panel transmittance based on the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness;

[0012] Determine the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount;

[0013] Obtain the light intensity absorption coefficient of the liquid crystal panel.

[0014] In some embodiments, the determining the panel transmittance based on the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness includes:

[0015] Determine the liquid crystal cell Jones matrix according to the liquid crystal cell thickness;

[0016] Determine the substrate Jones matrix according to the internal stress of the substrate and the substrate thickness;

[0017] Determine the panel transmittance according to the liquid crystal cell Jones matrix and the substrate Jones matrix.

[0018] In some embodiments, the internal stress of the substrate includes a normal stress component and a shear stress component. The determining the substrate transmittance Jones matrix according to the internal stress of the substrate and the substrate thickness includes:

[0019] Divide the upper glass substrate and the lower glass substrate of the liquid crystal panel into a plurality of glass layers respectively;

[0020] Calculate the stress components of each glass layer according to the normal stress component and the shear stress component;

[0021] Calculate the layer-by-layer Jones matrix of each glass layer according to the stress components;

[0022] Determine the substrate Jones matrix according to the layer-by-layer Jones matrix of each glass layer.

[0023] In some embodiments, the calculating the node transmittance of each node of the simulation model according to the transmittance influence parameters includes:

[0024] Calculate the node transmittance of each node of the simulation model according to the liquid crystal cell Jones matrix, the substrate Jones matrix, the aperture ratio, and the light intensity absorption coefficient of each node.

[0025] In some embodiments, the obtaining the simulation model of the liquid crystal panel includes:

[0026] Obtain the parameter information of the liquid crystal panel under a preset working condition;

[0027] Establish a simulation model according to the parameter information.

[0028] In some embodiments, establishing a simulation model according to the parameter information includes:

[0029] Discretizing the upper glass substrate and the lower glass substrate of the liquid crystal panel in an initial state into shell elements respectively, where the nodes between the shell elements correspond to a sub-pixel, and the nodes of the upper glass substrate correspond one-to-one with the nodes of the lower glass substrate;

[0030] Assigning values to the shell elements and the nodes according to the parameter information to obtain the simulation model.

[0031] In a second aspect, the present application provides a panel brightness analysis device, including:

[0032] A model acquisition module for acquiring a simulation model of a liquid crystal panel;

[0033] A parameter analysis module communicatively connected to the model acquisition module, configured to determine the transmittance influence parameters of each node of the simulation model according to the simulation model; calculate the node transmittance of each node of the simulation model according to the transmittance influence parameters;

[0034] A brightness analysis module communicatively connected to the parameter analysis module, configured to determine the transmitted light brightness value of each node according to the incident light brightness and the node transmittance.

[0035] In some embodiments, the transmittance influence parameters include the panel transmittance, the aperture ratio, and the light intensity absorption coefficient. The parameter analysis module is further configured to determine the liquid crystal cell thickness, the internal stress of the substrate, the substrate thickness, and the relative misalignment amount between corresponding nodes according to the simulation model, where the corresponding nodes are the nodes of the upper glass substrate and the lower glass substrate of the liquid crystal panel that correspond to each other in the initial state; determine the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness; determine the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount; and obtain the light intensity absorption coefficient of the liquid crystal panel.

[0036] In some embodiments, the parameter analysis module is further configured to determine the liquid crystal cell Jones matrix according to the liquid crystal cell thickness; determine the substrate Jones matrix according to the internal stress of the substrate and the substrate thickness; and determine the panel transmittance according to the liquid crystal cell Jones matrix and the substrate Jones matrix.

[0037] In some embodiments, the internal stress of the substrate includes a normal stress component and a shear stress component, and the parameter analysis module is further configured to divide the upper glass substrate and the lower glass substrate of the liquid crystal panel into a plurality of glass layers respectively; calculate the stress components of each glass layer according to the normal stress component and the shear stress component; calculate the layer-by-layer Jones matrix of each glass layer according to the stress components; and determine the substrate Jones matrix according to the layer-by-layer Jones matrix of each glass layer.

[0038] In some embodiments, the parameter analysis module is further configured to calculate the node transmittance of each node of the simulation model according to the liquid crystal cell Jones matrix, the substrate Jones matrix, the aperture ratio, and the light intensity absorption coefficient of each node.

[0039] In some embodiments, the model acquisition module is further configured to acquire the parameter information of the liquid crystal panel under a preset working condition; and establish a simulation model according to the parameter information.

[0040] In some embodiments, the model acquisition module is further configured to discretize the upper glass substrate and the lower glass substrate of the liquid crystal panel in an initial state into shell elements respectively, a node between the shell elements corresponds to a sub-pixel, and the nodes of the upper glass substrate correspond to the nodes of the lower glass substrate one by one; and assign values to the shell elements and the nodes according to the parameter information to obtain the simulation model.

[0041] In a third aspect, the present application provides an electronic device, which includes a processor, a memory, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the steps in any one of the panel brightness analysis methods described above.

[0042] In a fourth aspect, the present application provides a storage medium, in which a plurality of instructions are stored, and the instructions are used for a controller to execute to implement any one of the methods described above.

[0043] The panel brightness analysis method, device, electronic device, and storage medium provided by the embodiments of the present application establish a finite element simulation model, calculate the node transmittance based on the transmittance influence parameters of each node of the simulation model, and then determine the transmitted light brightness value of each node, quantitatively calculate its brightness distribution in the design stage, avoid repeatedly making samples for experiments, facilitate the evaluation and optimization of the design scheme, and reduce the product development time and cost. Description of the Drawings

[0044] The following combines the drawings and details the specific implementation manners of the present application, and the technical solutions and other beneficial effects of the present application will be obvious.

[0045] Figure 1 is a schematic structural diagram of a liquid crystal panel in an embodiment of the present application;

[0046] Figure 2 It is a schematic flowchart of the panel brightness analysis method in an embodiment of the present application;

[0047] Figure 3 It is a schematic flowchart of the panel brightness analysis method in another embodiment of the present application;

[0048] Figure 4 It is a schematic structural diagram of the panel brightness analysis device in an embodiment of the present application. Detailed implementation manners

[0049] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts belong to the scope of protection of the present application.

[0050] In the description of the present application, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of the described features. In the description of the present application, "a plurality of" means two or more, unless otherwise specifically defined.

[0051] In the description of the present application, the word "for example" is used to mean "serving as an example, illustration, or explanation". Any embodiment described as "for example" in the present application is not necessarily construed as being more preferred or having more advantages than other embodiments. In order for any person skilled in the art to implement and use the present invention, the following description is given. In the following description, details are set forth for the purpose of explanation. It should be understood that those skilled in the art can recognize that the present invention can be implemented without using these specific details. In other instances, well-known structures and processes are not elaborated in detail to avoid obscuring the description of the present invention with unnecessary details. Therefore, the present invention is not intended to be limited to the embodiments shown, but is consistent with the broadest scope that conforms to the principles and features disclosed in the present application.

[0052] The stress state of the liquid crystal panel during use will affect the transmittance of its optical system. The changes in the liquid crystal cell thickness (Cell Gap) caused by external forces, the photoelastic effect of the glass substrate, and the relative misalignment of the upper and lower substrates (Pixel Shift) are three main influencing factors. Among them, the former two influencing mechanisms are the phase delay of the light vector caused by the liquid crystal layer and the glass stress, while the latter is that the black matrix (BM) blocks the pixel opening area due to the relative misalignment of the upper and lower substrates during deformation.

[0053] Taking the vertical alignment (VA) liquid crystal display mode as an example for illustration, similar analyses can also be performed for other types (such as TN, IPS, FFS, etc.). The optical system of the liquid crystal panel can be simplified as Figure 1 As shown, for each sub-pixel, the incident light from the backlight 1 passing through the optical film 2 will sequentially pass through the lower polarizer 3, the lower glass substrate (not shown in the figure), each layer of the TFT 4, the liquid crystal layer 5, each layer of the CF 6, the upper glass substrate (not shown in the figure), and the upper polarizer 7, and finally reach the human eye. Among the above-mentioned layers, the upper and lower polarizers, the upper and lower glass substrates (when there is stress inside), and the liquid crystal layer (when it is deflected) will change the polarization state of the incident light. Therefore, the transmittance P of the panel can be calculated by the Jones matrix; the metal layer on the TFT and the BM layer on the CF will determine the aperture ratio. When the upper and lower substrates are deformed, relative misalignment occurs, resulting in the black matrix (BM) blocking the pixel aperture area and thus affecting the transmittance. Assuming its aperture ratio is AR; the remaining optically isotropic layers will also have an absorption effect on the incident light intensity. Assuming the comprehensive absorption coefficient is α. Then, the overall transmittance T of the LCD optical system corresponding to this sub-pixel can be obtained from Equation -1 below, T = P * AR * α.

[0054] Among them, when the upper and lower glass substrates have a normal relative displacement, causing a change in the cell gap of the liquid crystal cell, which changes the phase delay of the incident light by the liquid crystal layer and thus affects the panel transmittance P; when stress is generated inside the upper and lower glass substrates, the photoelastic effect (stress birefringence) occurs, which has a phase delay on the incident light and thus affects the panel transmittance P; when the upper and lower glass substrates have a tangential relative displacement, that is, the upper and lower substrate layers corresponding to each sub-pixel are misaligned, resulting in the black matrix (BM) blocking the pixel aperture area, thereby affecting the AR value of the aperture ratio.

[0055] Please refer to Figure 2 , an embodiment of the present application provides a method for analyzing the panel brightness. The method includes steps S101 to S104, specifically as follows:

[0056] S101, obtaining a simulation model of the liquid crystal panel.

[0057] Specifically, a simulation model of the liquid crystal panel is established according to the actual working conditions of the liquid crystal panel. The actual stress state of each component in the liquid crystal panel is reflected in the simulation model, and thus the displacement and stress of each component relative to the case where no external force is applied in the initial state can be calculated.

[0058] In one embodiment, this step includes: S201, obtaining the parameter information of the liquid crystal panel under a preset working condition; S202, establishing a simulation model according to the parameter information.

[0059] Specifically, parameter information of a liquid crystal panel under a preset working condition is obtained. The liquid crystal deflection conditions of the liquid crystal panel and the force conditions of the upper and lower glass substrates are different under different working conditions. The preset working condition is the working condition of the liquid crystal panel to be analyzed, which can be selected according to the purpose of analysis and is not specifically limited in this embodiment. Among them, the parameter information includes, but is not limited to, the shape, size, connection relationship, material, density, etc. of each component in the liquid crystal panel. A simulation model is established based on the parameter information, and the simulation model is consistent with the state of the liquid crystal panel under the preset working condition.

[0060] In one embodiment, step S202, establishing a simulation model according to the parameter information includes: S301, discretizing the upper glass substrate and the lower glass substrate of the liquid crystal panel in the initial state into shell elements respectively, where the nodes between the shell elements correspond to one sub-pixel, and the nodes of the upper glass substrate correspond one-to-one with the nodes of the lower glass substrate; S302, assigning values to the shell elements and the nodes according to the parameter information to obtain the simulation model.

[0061] Specifically, since the components that affect the transmittance of the liquid crystal panel in terms of mechanics are only the liquid crystal, the upper glass substrate, and the lower glass substrate of the liquid crystal panel, and the thickness of the liquid crystal cell can be obtained by the distance between the upper glass substrate and the lower glass substrate, the simulation model actually only needs to set the upper glass substrate and the lower glass substrate.

[0062] The simulation model is a finite element simulation model. A corresponding model in the initial state is established according to the parameter information such as the shape, size, and connection relationship of the upper glass substrate and the lower glass substrate of the liquid crystal panel, and then the upper glass substrate and the lower glass substrate are discretized into shell elements respectively, and the nodes between the shell elements correspond to one sub-pixel. Among them, the initial state is the state where the upper glass substrate and the lower glass substrate are not affected by external forces. Therefore, the shell elements of the upper glass substrate and the lower glass substrate correspond one-to-one, and the nodes also correspond one-to-one.

[0063] In addition, values are assigned to the shell elements and the nodes according to the parameter information, that is, the materials, densities, external forces, etc. of the shell elements and the nodes are set, so that the states of the shell elements and the nodes conform to the preset working condition, and finally the simulation model is obtained. In the simulation model, since the shell elements and the nodes are all affected by external forces, the nodes that correspond to each other in the initial state may be misaligned with each other.

[0064] S102, determining the transmittance influence parameters of each node of the simulation model according to the simulation model.

[0065] Specifically, the relative displacement and stress conditions, etc. between each node of the upper glass substrate and the lower glass substrate under the preset working condition are determined through the simulation model, and the transmittance influence parameters are determined according to the relative displacement and stress conditions, etc. between each node.

[0066] Among them, the transmittance influencing parameters include the panel transmittance, the aperture ratio, and the light intensity absorption coefficient. The panel transmittance is the parameter that affects the transmittance due to mechanical factors, the aperture ratio is the parameter that affects the transmittance due to the change of the black matrix (BM), and the light intensity absorption coefficient is the parameter that affects the transmittance due to the absorption of the incident light intensity by each optically isotropic layer in the liquid crystal panel.

[0067] In one embodiment, as Figure 3 shown, this step includes: S401, determining the liquid crystal cell thickness, the internal stress of the substrate, the substrate thickness, and the relative misalignment amount between corresponding nodes according to the simulation model, where the corresponding nodes are the nodes corresponding to each other between the upper glass substrate and the lower glass substrate of the liquid crystal panel in the initial state; S402, determining the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness; S403, determining the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount; S404, obtaining the light intensity absorption coefficient of the liquid crystal panel.

[0068] Specifically, in the initial state, that is, when the upper glass substrate and the lower glass substrate of the liquid crystal panel are not subjected to external forces, there is no misalignment between the corresponding nodes and they correspond one by one. However, in the simulation model, since both the upper glass substrate and the lower glass substrate are subjected to external forces, there may be misalignment between the nodes corresponding to each other in the initial state. According to the simulation model, determine the liquid crystal cell thickness, the internal stress of the substrate, the substrate thickness, and the relative misalignment amount between the corresponding nodes. The normal distance between the corresponding nodes of the upper and lower glass substrates is the liquid crystal cell thickness. The internal stress of the substrate includes a normal stress component and a shear stress component. The tangential displacement between the corresponding nodes of the upper and lower substrates is the relative misalignment amount.

[0069] When the upper and lower glass substrates have a normal relative displacement, resulting in a change in the liquid crystal cell thickness, it changes the phase delay of the incident light by the liquid crystal layer, thereby affecting the panel transmittance. When stress is generated inside the upper and lower glass substrates, the photoelastic effect (stress birefringence) occurs, which has a phase delay on the incident light and thus affects the panel transmittance. Therefore, determine the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness.

[0070] When the upper and lower glass substrates have a tangential relative displacement, that is, the film layers of the upper and lower substrates corresponding to each sub-pixel are misaligned, resulting in the black matrix blocking the pixel opening area, thereby affecting the aperture ratio AR value. Therefore, determine the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount. Among them, the relative misalignment amount includes the misalignment amounts of the upper and lower substrates in two orthogonal in-plane directions. The corresponding relationship between the preset aperture ratio and the relative misalignment amount can be calibrated through a finite number of experiments, and will not be elaborated one by one in this embodiment. Similarly, the light intensity absorption coefficient of each component of the liquid crystal panel can be obtained through experiments and other means.

[0071] In one embodiment, step S402 of determining the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness includes: S501, determining the liquid crystal cell Jones matrix according to the liquid crystal cell thickness; S502, determining the substrate Jones matrix according to the internal stress of the substrate and the substrate thickness; S503, determining the panel transmittance according to the liquid crystal cell Jones matrix and the substrate Jones matrix.

[0072] Specifically, the liquid crystal cell Jones matrix is calculated according to the liquid crystal cell thickness, and the substrate Jones matrix is determined according to the internal stress of the substrate and the substrate thickness. The substrate Jones matrix includes the upper substrate Jones matrix and the lower substrate Jones matrix. The panel transmittance is determined according to the liquid crystal cell Jones matrix and the substrate Jones matrix, and the panel transmittance is obtained by multiplying all the Jones matrices. It should be noted that if liquid crystal parameters are also required to calculate the liquid crystal cell Jones matrix according to the liquid crystal cell thickness, such as the dispersion curve of the liquid crystal, the inclination angle of the liquid crystal optical axis, and the optical axis twist angle, etc., they can be obtained according to the calculation requirements of the liquid crystal cell Jones matrix, and no specific limitation is made in this embodiment.

[0073] S103, calculating the node transmittance of each node of the simulation model according to the transmittance influence parameter.

[0074] Specifically, calculate the transmittance influence parameter of each corresponding node between the upper glass substrate and the lower glass substrate of the liquid crystal panel according to the above process, and then calculate the node transmittance of each node of the simulation model.

[0075] In one embodiment, this step includes: S701, calculating the node transmittance of each node of the simulation model according to the liquid crystal cell Jones matrix, the substrate Jones matrix, the aperture ratio, and the light intensity absorption coefficient of each node.

[0076] Specifically, the transmittance influence parameters include the panel transmittance, the aperture ratio, and the light intensity absorption coefficient. According to the panel transmittance P, the aperture ratio AR, and the light intensity absorption coefficient α of each node, calculate the node transmittance T of each node of the simulation model, T = P * AR * α.

[0077] S104, determining the transmitted light luminance value of each node according to the incident light luminance and the node transmittance.

[0078] Specifically, obtain the incident light luminance, and the incident light luminance is set according to the analysis requirements, and no specific limitation is made in this embodiment. Determine the transmitted light luminance value L' of each node according to the incident light luminance L and the node transmittance T, L' = T * L.

[0079] In this embodiment, for a liquid crystal panel product (such as a curved liquid crystal panel) that is subject to external forces during actual use, the brightness distribution can be quantitatively calculated at the design stage, avoiding repeated sample production for testing, facilitating the evaluation and optimization of the design scheme, reducing the product development time and cost, and at the same time, the panel or module structure can be optimized based on the analysis results to solve related technical problems.

[0080] To better implement the panel brightness analysis method in the embodiments of the present application, based on the panel brightness analysis method, an embodiment of the present application also provides a panel brightness analysis device, such as Figure 4 shown, the panel brightness analysis device 900 includes:

[0081] A model acquisition module 910, configured to acquire a simulation model of the liquid crystal panel;

[0082] A parameter analysis module 920, communicatively connected to the model acquisition module 910, configured to determine the transmittance influence parameters of each node of the simulation model according to the simulation model; calculate the node transmittance of each node of the simulation model according to the transmittance influence parameters;

[0083] A brightness analysis module 930, communicatively connected to the parameter analysis module 920, configured to determine the transmitted light brightness value of each node according to the incident light brightness and the node transmittance.

[0084] In some embodiments of the present application, the transmittance influence parameters include the panel transmittance, the aperture ratio, and the light intensity absorption coefficient. The parameter analysis module 920 is further configured to determine the liquid crystal cell thickness, the internal stress of the substrate, the substrate thickness, and the relative misalignment amount between corresponding nodes according to the simulation model, where the corresponding nodes are the nodes corresponding to each other between the upper glass substrate and the lower glass substrate of the liquid crystal panel in the initial state; determine the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness; determine the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount; and acquire the light intensity absorption coefficient of the liquid crystal panel.

[0085] In some embodiments of the present application, the parameter analysis module 920 is further configured to determine the liquid crystal cell Jones matrix according to the liquid crystal cell thickness; determine the substrate Jones matrix according to the internal stress of the substrate and the substrate thickness; and determine the panel transmittance according to the liquid crystal cell Jones matrix and the substrate Jones matrix.

[0086] In some embodiments of the present application, the internal stress of the substrate includes a normal stress component and a shear stress component. The parameter analysis module 920 is further configured to separately divide the upper glass substrate and the lower glass substrate of the liquid crystal panel into a plurality of glass layers; calculate the stress components of each glass layer according to the normal stress component and the shear stress component; calculate the stratified Jones matrix of each glass layer according to the stress components; and determine the substrate Jones matrix according to the stratified Jones matrices of each glass layer.

[0087] In some embodiments of the present application, the parameter analysis module 920 is further configured to calculate the node transmittance of each node of the simulation model according to the liquid crystal cell Jones matrix, the substrate Jones matrix, the aperture ratio, and the light intensity absorption coefficient of each node.

[0088] In some embodiments of the present application, the model acquisition module 910 is further configured to acquire the parameter information of the liquid crystal panel under a preset working condition; and establish a simulation model according to the parameter information.

[0089] In some embodiments of the present application, the model acquisition module 910 is further configured to discretize the upper glass substrate and the lower glass substrate of the liquid crystal panel in an initial state into shell elements respectively. A node between the shell elements corresponds to a sub-pixel, and the nodes of the upper glass substrate correspond to the nodes of the lower glass substrate one by one; and assign values to the shell elements and the nodes according to the parameter information to obtain the simulation model.

[0090] In the above embodiments, the descriptions of the respective embodiments have their own emphases. For parts not detailed in a certain embodiment, reference may be made to the relevant descriptions of other embodiments.

[0091] In some embodiments of the present application, an electronic device is provided, including one or more processors; a memory; and one or more application programs, wherein the one or more application programs are stored in the memory and configured to be executed by the processor to perform the steps of the above panel brightness analysis method. Here, the steps of the panel brightness analysis method may be the steps of the panel brightness analysis method in the above respective embodiments.

[0092] In some embodiments of the present application, a computer-readable storage medium is provided, storing a computer program, and the computer program is loaded by a processor, so that the processor performs the steps of the above panel brightness analysis method. Here, the steps of the panel brightness analysis method may be the steps of the panel brightness analysis method in the above respective embodiments.

[0093] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Any reference to a memory, storage, database, or other medium used in the various embodiments provided in this application can include at least one of non-volatile and volatile memories. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0094] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0095] The above has introduced in detail a panel brightness analysis method, device, electronic device, and storage medium provided by the embodiments of the present application. Specific examples are used herein to elaborate on the principles and implementation manners of the present invention. The description of the above embodiments is only used to help understand the method and its core idea of the present invention; at the same time, for those skilled in the art, according to the idea of the present invention, there will be changes in the specific implementation manners and application scopes. In summary, the content of this specification should not be construed as a limitation to the present invention.

Claims

1. A method for analyzing panel brightness, characterized in that Including: Obtaining a simulation model of a liquid crystal panel; Determining the transmittance influence parameters of each node of the simulation model according to the simulation model, where the transmittance influence parameters include panel transmittance, aperture ratio, and light intensity absorption coefficient; Calculating the node transmittance of each node of the simulation model according to the transmittance influence parameters; Determining the transmitted light luminance value of each node according to the incident light luminance and the node transmittance; The determining the transmittance influence parameters of each node of the simulation model according to the simulation model includes: determining the relative misalignment amount between corresponding nodes according to the simulation model, where the corresponding nodes are the nodes corresponding to each other in the initial state of the upper glass substrate and the lower glass substrate of the liquid crystal panel, and the tangential displacement of the corresponding nodes in the upper glass substrate and the lower glass substrate is the relative misalignment amount; determining the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount; The calculating the node transmittance of each node of the simulation model according to the transmittance influence parameters includes: calculating the node transmittance of each node of the simulation model according to the panel transmittance, the aperture ratio, and the light intensity absorption coefficient of each node.

2. The panel brightness analysis method according to claim 1, wherein The determining the transmittance influence parameters of each node of the simulation model according to the simulation model further includes: Determining the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness between the corresponding nodes according to the simulation model; Determining the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness; Obtaining the light intensity absorption coefficient of the liquid crystal panel.

3. The panel brightness analysis method according to claim 2, wherein The determining the panel transmittance according to the liquid crystal cell thickness, the internal stress of the substrate, and the substrate thickness includes: Determining the liquid crystal cell Jones matrix according to the liquid crystal cell thickness; Determining the substrate Jones matrix according to the internal stress of the substrate and the substrate thickness; Determining the panel transmittance according to the liquid crystal cell Jones matrix and the substrate Jones matrix.

4. The panel brightness analysis method according to claim 3, wherein, The internal stress of the substrate includes a normal stress component and a shear stress component. The determining the substrate Jones matrix according to the internal stress of the substrate and the substrate thickness includes: Respectively dividing the upper glass substrate and the lower glass substrate of the liquid crystal panel into a plurality of glass layers; Calculating the stress components of each glass layer according to the normal stress component and the shear stress component; Calculating the layer-by-layer Jones matrix of each glass layer according to the stress components; Determining the substrate Jones matrix according to the layer-by-layer Jones matrix of each glass layer.

5. The panel brightness analysis method according to claim 1, characterized in that, The obtaining the simulation model of the liquid crystal panel includes: Obtaining the parameter information of the liquid crystal panel under a preset working condition; Establishing a simulation model according to the parameter information.

6. The panel brightness analysis method according to claim 5, wherein The establishing a simulation model according to the parameter information includes: Respectively discretizing the upper glass substrate and the lower glass substrate of the liquid crystal panel in the initial state into shell elements, where the nodes between the shell elements correspond to a sub-pixel, and the nodes of the upper glass substrate correspond one-to-one with the nodes of the lower glass substrate; Assigning values to the shell elements and the nodes according to the parameter information to obtain the simulation model.

7. A panel brightness analysis device, characterized in that, Including: A model obtaining module, configured to obtain a simulation model of a liquid crystal panel; A parameter analysis module, communicatively connected to the model acquisition module, is configured to determine the transmittance influence parameters of each node of the simulation model according to the simulation model, where the transmittance influence parameters include panel transmittance, aperture ratio, and light intensity absorption coefficient; and calculate the node transmittance of each node of the simulation model according to the transmittance influence parameters. A brightness analysis module, communicatively connected to the parameter analysis module, is configured to determine the transmitted light brightness value of each node according to the incident light brightness and the node transmittance. The determination of the transmittance influence parameters of each node of the simulation model according to the simulation model includes: determining the relative misalignment amount between corresponding nodes according to the simulation model, where the corresponding nodes are the nodes corresponding to each other in the initial state of the upper glass substrate and the lower glass substrate of the liquid crystal panel, and the tangential displacement of the corresponding nodes in the upper glass substrate and the lower glass substrate is the relative misalignment amount; and determining the aperture ratio according to the relative misalignment amount and the corresponding relationship between the preset aperture ratio and the relative misalignment amount. The calculation of the node transmittance of each node of the simulation model according to the transmittance influence parameters includes: calculating the node transmittance of each node of the simulation model according to the panel transmittance, the aperture ratio, and the light intensity absorption coefficient of each node.

8. An electronic device, characterized in that, The electronic device includes a processor, a memory, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the steps in the panel brightness analysis method according to any one of claims 1 to 6.

9. A storage medium, wherein a number of instructions are stored in the storage medium, characterized in that, The instructions are for a controller to execute to implement the method according to any one of claims 1 to 6.

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