An information interaction system and method

By establishing an information interaction system and method between the clamping device and the testing device, and utilizing an information reader and software modules to achieve communication functionality, the problem of high cost and long development cycle of customized solutions is solved, resulting in cost savings and improved versatility.

CN114545179BActive Publication Date: 2025-11-14NANTONG FUJITSU MICROELECTRONICS
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Patent Information

Application Number
CN202111651198.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-12-30
Publication Date
2025-11-14
Estimated Expiration
2041-12-30

AI Technical Summary

Technical Problem

In existing technologies, customized development solutions are expensive and time-consuming, lack versatility, and cannot effectively support equipment and processes from different manufacturers.

Method used

An information interaction system and method are provided. Through serial communication between a clamping device and a testing device, an information reader scans the information of the workpiece under test, and an information sending station is set in the clamping device to realize the communication function between the clamping device and the testing device. This avoids hardware modification and achieves communication only through software modification.

Benefits of technology

It effectively saves costs, shortens the development cycle, and improves the versatility of the modification solution, making it suitable for different types of clamping and testing equipment.

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Abstract

This application discloses an information interaction system and method. The information interaction system includes multiple test stations; an information reader for scanning and reading information of a device under test (DUT); and a clamping device, serially communicating with the information reader, for clamping and moving the DUT. The clamping device includes an information sending module for setting the information sending station of the DUT, where the information sending station is one of the multiple test stations. Multiple test devices are configured, each corresponding to one of the test stations, for sequentially testing the DUT. Each test device includes a main test device, which is located at the test station corresponding to the information sending station and serially communicates with the clamping device. This method enables communication between the clamping device and the test devices, effectively saving costs and shortening the development cycle.
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Description

Technical Field

[0001] This application relates to the field of semiconductor testing technology, and in particular to an information interaction system and method. Background Technology

[0002] To monitor the testing process of semiconductor products, the identification information of semiconductor products is correlated with test data to achieve information-based traceability of the semiconductor product testing process.

[0003] In existing technologies, test modes for multi-station serial testing typically employ customized development solutions. For example, for a specific model of equipment, it is necessary to modify the communication boards of the test equipment and clamping equipment, and add corresponding identifier bits to identify the test station that needs to obtain product information.

[0004] However, the inventors of this application have found through long-term research that modifying the communication board of a device often requires a huge cost, the cost of customized development is high, and the design cycle of the development solution is long. In addition, customized development solutions often lack universality and are often subject to greater limitations on equipment and processes from different manufacturers, with varying degrees of support. Summary of the Invention

[0005] The main technical problem addressed by this application is to provide an information interaction system and method that enables communication between clamping devices and testing devices, effectively saving costs and shortening the development cycle.

[0006] To solve the above-mentioned technical problems, this application adopts the following technical solution: An information interaction system is provided, including multiple test stations; an information reader for scanning and reading information of the device under test (DUT); a clamping device, serially communicating with the information reader, for clamping and moving the DUT; wherein the clamping device includes an information sending module for setting the information sending station of the DUT, the information sending station being one of the multiple test stations; multiple test devices, each test device corresponding to each test station, for sequentially testing the DUT; wherein each test device includes a main test device, and the main test device is set at the test station corresponding to the information sending station and serially communicates with the clamping device.

[0007] The test stations are arranged at intervals along a preset direction, and the clamping device is used to clamp the test piece and make the test piece pass through each test station in sequence along the preset direction; wherein the information reader is located at the first test station passed.

[0008] When the device under test passes through the station of the main test device set in the information sending module, the clamping device obtains the information of the device under test from the information reader and sends it to the main test device.

[0009] The clamping device includes a robotic arm, and the information reader includes a QR code information reader.

[0010] The information interaction system includes a serial cable, which is connected between the robotic arm and the main testing device, as well as between the robotic arm and the QR code information reader, to realize the transmission of QR code information.

[0011] The information interaction system includes a database, which is communicatively connected to the main test device, and is used to store the mapping relationship between the test data of the main test device and the information of the device under test.

[0012] To address the aforementioned technical problems, another technical solution adopted in this application is: providing an information interaction method, comprising: clamping a test piece (DPT) using a clamping device and moving it to the position of an information reader; in response to receiving information about the DPT scanned and acquired by the information reader, setting the information transmission station of the DPT in the information transmission module of the clamping device; clamping the DPT and moving it sequentially to the test equipment of each test station; determining whether the current test station of the DPT is consistent with the set information transmission station; if so, transmitting the information of the DPT to the test equipment of the current test station; otherwise, performing normal testing on the DPT.

[0013] The step of transmitting the information of the test piece to the test equipment at the current test station includes: the clamping device sending a test start signal to the test equipment; in response to receiving an information acquisition signal from the test equipment, the clamping device sending the information of the test piece to the test equipment; and in response to receiving a test completion signal from the test equipment, the clamping device clamping the test piece and moving to the next test station.

[0014] To address the aforementioned technical problems, another technical solution adopted in this application is: providing an information interaction method, comprising: in response to receiving a start test signal from a clamping device, the testing device sending an information acquisition signal to the clamping device; in response to receiving information about the workpiece under test, the testing device starting the test and transmitting a test completion signal to the clamping device.

[0015] The method further includes, after the step of transmitting the test completion signal to the clamping device, acquiring the test data of the current test device; establishing a mapping relationship between the information of the test piece and the test data; and storing the mapping relationship in a database.

[0016] Unlike existing technologies, the advantages of this application are as follows: This application provides an information interaction system and method, wherein the information interaction system includes multiple test stations; an information reader for scanning and reading information of a device under test; a clamping device, serially communicating with the information reader, for clamping and moving the device under test; wherein the clamping device includes an information sending module for setting the information sending station of the device under test, the information sending station being one of the multiple test stations; multiple test devices, each test device corresponding to each test station, for sequentially testing the device under test; wherein the test devices include a main test device, and the main test device is set at the test station corresponding to the information sending station and serially communicating with the clamping device. The above design scheme utilizes the equipped information reader to read and record information about the device under test (DUT). By adding a software module to the clamping device to set the information transmission station for the DUT information, the communication function between the clamping device and the testing device regarding the DUT information is realized. This design method avoids customized hardware modifications, eliminating the need for expensive hardware facilities and achieving communication functionality through simple software modifications, effectively saving costs and shortening the development cycle. Furthermore, this design method is applicable to different types of clamping devices and testing devices, effectively improving the versatility of the modification scheme. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein:

[0018] Figure 1 This is a schematic diagram of one embodiment of the information interaction system of this application;

[0019] Figure 2 This is a schematic diagram of another embodiment of the information interaction system of this application;

[0020] Figure 3 This is a flowchart illustrating one embodiment of the information interaction method of this application;

[0021] Figure 4 yes Figure 3A flowchart illustrating an implementation method for step S105;

[0022] Figure 5 This is a flowchart illustrating another implementation of the information exchange method of this application;

[0023] Figure 6 yes Figure 5 A flowchart illustrating an embodiment following step S302. Detailed Implementation

[0024] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0025] Please see Figure 1 , Figure 1 This is a schematic diagram of one embodiment of the information interaction system of this application. The information interaction system 100 provided in this application includes an information reader 10, a clamping device 20, multiple test stations 30, and multiple test devices 40. Among them, the information reader 10 is used to scan the pattern information on the test piece (not shown) and read and record the identity information of the test piece.

[0026] The clamping device 20 communicates serially with the information reader 10 and is used to clamp and move the test piece. The clamping device 20 includes an information transmission module 201 for setting the information transmission station for the test piece. This information transmission station is one of multiple test stations 30. For example, inputting a third station in the information transmission module 201 of the clamping device 20 indicates that the acquired test piece information will be sent to the third test station 30.

[0027] Furthermore, each test device 40 is configured in a one-to-one correspondence with a test station 30 for sequentially testing the device under test (DUT). Each test device 40 includes a main test device 401, which communicates serially with the clamping device 20. It should be noted that the test station 30 where the main test device 401 is located is the same as the information transmission station. Since the main test device 401 is used to complete the core testing process of the DUT, which requires matching, verifying, and saving the DUT's information with the test data, the test station 30 where the main test device 401 is located must be consistent with the information transmission station set in the information transmission module 201 to ensure correct transmission and matching of the DUT's information and avoid misalignment. For example, if the information transmission module 201 inputs a third station, i.e., the third test station 30 is used as the information transmission station for the DUT, then the main test device 401 must be set in the third test station 30.

[0028] Through the above implementation method, the information reader 10 is used to read and record the information of the device under test (DUT). By setting the information transmission station of the DUT information through the information transmission module 201 added to the clamping device 20, the communication function between the clamping device 20 and the testing device 40 regarding the DUT information is realized. This design method avoids customized hardware modification and does not require expensive hardware facilities. The communication function is realized only through simple software modification, which effectively saves costs and shortens the development cycle. On the other hand, this design method is applicable to different types of clamping devices 20 and testing devices 40, which effectively improves the versatility of the solution.

[0029] Please continue reading. Figure 1 In this embodiment, multiple test stations 30 are arranged sequentially at intervals along a preset direction X. The clamping device 20 clamps the test piece (DPT) and causes it to pass sequentially through each test station 30 along the preset direction X. The information reader 10 is located in the first test station 30 traversed by the DPT, and the test devices 40 are sequentially located in the second to the nth test stations 30. It is understood that n here depends on the number of test devices 40. For example, if there are 4 test devices 40, then n is 5; or, for example, if there are 6 test devices 40, then n is 7. This embodiment ensures that the clamping device 20 has already acquired the DPT's information before testing, avoiding information matching errors.

[0030] Please continue reading. Figure 1In one embodiment, when the device under test (DUT) passes the station of the main test device 401 set in the information transmission module 201, the clamping device 20 acquires the DUT information from the information reader 10 and sends it to the main test device 401. Through the above embodiment, the information reader 10 is used to read and record the DUT information. By setting the information transmission station of the DUT information in the newly added information transmission module 201 in the clamping device 20, the communication function between the clamping device 20 and the main test device 401 regarding the DUT information is realized. This method can effectively save costs and shorten the development cycle.

[0031] In one embodiment, the gripping device mentioned in the above embodiments includes a robotic arm, which performs the grasping and clamping operations on the test piece, and moves the test piece sequentially through each test station along a preset direction. Additionally, the information reader mentioned in the above embodiments may include a QR code reader. In this embodiment, information about the test piece is stored in a QR code. When the QR code on the test piece is scanned using the QR code reader, the information is acquired and recorded in the QR code reader. Of course, in other embodiments, the information reader mentioned in the above embodiments may also include a barcode reader. The information of the test piece is stored in a corresponding barcode. When the barcode on the test piece is scanned using the barcode reader, the information is acquired and recorded in the barcode reader. Through the above embodiments, the robotic arm is used to fix the position of the test piece, and the QR code reader is used to acquire the information of the test piece, enriching the application scenarios of this design and providing technical support for the realization of communication functions.

[0032] The information interaction system provided in this embodiment also includes several serial cables, which are connected between the robotic arm and the main testing device, and also between the robotic arm and the QR code reader, for transmitting QR code information. Through the above implementation, communication functions between the robotic arm and the main testing device, and between the robotic arm and the QR code reader, are achieved using separately configured conventional serial cables. This method is easy to implement, has low cost, and requires no additional hardware support to complete the transmission of QR code information.

[0033] Please see Figure 2 , Figure 2 This is a schematic diagram of another embodiment of the information interaction system of this application. The information interaction system 100 provided in this embodiment also includes a database 50. The database 50 is communicatively connected to the main testing device 401 and is used to store the mapping relationship between the test data of the main testing device 401 and the information of the device under test (DUT). Through the above implementation, by utilizing the information of the DUT, test data mapped to the DUT information can be found, thereby ensuring the traceability of the DUT test data.

[0034] Please see Figure 3 , Figure 3 This is a flowchart illustrating one embodiment of the information interaction method of this application. The information interaction method provided in this embodiment specifically includes the following steps:

[0035] S101: Use a clamping device to clamp the workpiece under test and move it to the position of the information reader.

[0036] Optionally, the clamping device may include a robotic arm, which is used to perform gripping, clamping and moving operations on the workpiece under test; the information reader includes a QR code reader, which is used to scan the QR code on the workpiece under test and obtain QR code information about the workpiece under test.

[0037] S102: In response to receiving the test piece information scanned and acquired by the information reader, the information transmission station of the test piece is set in the information transmission module of the clamping device.

[0038] Optionally, the control interface of the clamping device is supplemented with an information transmission module for setting the information transmission station of the test piece, wherein the information transmission station is one of multiple test stations. S103: The clamped test piece is moved sequentially to the test equipment of each test station.

[0039] Optionally, test stations are arranged at intervals along a preset direction, and test equipment is correspondingly set in each test station. The part under test (DUT) passes through each test station sequentially along the preset direction under the action of the clamping device. The test equipment includes a main test device used to complete the core testing tasks of the DUT. It should be noted that the station where the main test device is located must be consistent with the information sending station set in the information sending module.

[0040] S104: Determine whether the current test station of the device under test is consistent with the set information sending station.

[0041] S105: If so, the information of the device under test will be transmitted to other test equipment at the current test station.

[0042] Optionally, if the current test station and the information sending station are consistent, it indicates that the device under test is currently at the station where the main test equipment is located. Therefore, the information of the device under test needs to be sent to the main test equipment to achieve a one-to-one correspondence between the information of the device under test and the test data.

[0043] Please see Figure 4 , Figure 4 yes Figure 3 A flowchart illustrating one embodiment of step S105. Step S105 includes:

[0044] S201: The clamping device sends a signal to the test device to start the test.

[0045] Optionally, the signal to start the test includes the SOT signal. In this embodiment, the clamping device sends the SOT signal to the test device.

[0046] S202: In response to receiving the information acquisition signal from the test device, the clamping device sends the information of the test piece to the test device.

[0047] Optionally, the information acquisition signal includes an RD signal. In this embodiment, in response to the clamping device receiving the RD signal, the clamping device transmits the test device information obtained from the information reader to the test device using a separately configured serial cable.

[0048] S203: In response to receiving the test completion signal from the test equipment, the clamping device clamps the test piece and moves to the next test station.

[0049] Optionally, the test completion signal includes an EOT signal and a BIN signal. In this embodiment, in response to the clamping device receiving the EOT signal and the BIN signal, indicating that the task of the current test station has been completed, the clamping device clamps the test piece and moves to the next test station until all test stations have been traversed.

[0050] Through the above implementation method, the designated transmission of the test piece information is added on the basis of the existing technology, the information transmission between the main test device and the clamping device is completed, and the communication function interoperability between the clamping device and the main test device is realized.

[0051] S106: Otherwise, perform normal testing on the current device under test.

[0052] Optionally, in response to the inconsistency between the current test station and the information sending station, it can be assumed that the device under test is currently in a test device other than the main test device. Since the other test devices do not need to match and associate with the device under test information, they can directly perform normal testing on the current device under test.

[0053] Through the above implementation method, the information reader is used to read and record the information of the device under test (DUT). By setting the information transmission station of the DUT information through the information transmission module added to the clamping device, the communication function between the clamping device and the testing device regarding the DUT information is realized. This design method avoids customized hardware modifications and does not require expensive hardware facilities. The communication function is realized only through simple software modifications, which effectively saves costs and shortens the development cycle. On the other hand, this design method is applicable to different types of clamping devices and testing devices, which effectively improves the versatility of the solution.

[0054] The above information interaction method is described from the perspective of the clamping device. The following section further describes this information interaction method from the perspective of the testing device. Please refer to... Figure 5 , Figure 5 This is a flowchart illustrating another embodiment of the information interaction method of this application. The information interaction method provided by this application includes:

[0055] S301: In response to receiving the start test signal from the clamping device, the test device sends an information acquisition signal to the clamping device.

[0056] Optionally, the start test signal includes the SOT signal, and the information acquisition signal includes the RD signal. In this embodiment, when the test device receives the SOT signal, in response to the fact that the current station of the test device matches the information transmission station set in the clamping device, the test device sends the RD signal to the clamping device to request information about the device under test. It should be noted that the test device in this embodiment refers to the main test device.

[0057] S302: In response to receiving information about the device under test, the test equipment starts the test and transmits the test completion signal to the clamping device.

[0058] Optionally, the test completion signal includes an EOT signal and a BIN signal. In this embodiment, when the test task of the device under test is completed, the test equipment sends the EOT signal and the BIN signal to the clamping device.

[0059] Through the above implementation method, information exchange between the clamping device and the testing device is achieved by utilizing signal transmission between the two.

[0060] Please see Figure 6 , Figure 6 yes Figure 5 A flowchart illustrating an embodiment following step S302. The information interaction method provided in this embodiment further includes the following steps after step S302:

[0061] S401: Obtain test data from the current test device.

[0062] S402: Establish the mapping relationship between the information of the device under test and the test data.

[0063] S403: Store the mapping relationship in the database.

[0064] Optionally, the database is connected to the main test equipment to store the mapping relationship between the test data of the main test equipment and the information of the device under test.

[0065] Through the above implementation method, the test data that maps to the test data is found by using the information of the test device, thereby ensuring the traceability of the test data of the test device.

[0066] In summary, unlike existing technologies, this application provides an information interaction system and method. The information interaction system includes multiple test stations; an information reader for scanning and reading information about a workpiece under test (DUT); and a clamping device that communicates serially with the information reader for clamping and moving the DUT. The clamping device includes an information sending module for setting the information sending station for the DUT, where the information sending station is one of the multiple test stations. Multiple test devices are configured, each corresponding to one of the test stations, for sequentially testing the DUT. Each test device includes a main test device, which is located at the test station corresponding to the information sending station and communicates serially with the clamping device. The above design scheme utilizes the equipped information reader to read and record information about the device under test (DUT). By adding a software module to the clamping device to set the information transmission station for the DUT information, the communication function between the clamping device and the testing device regarding the DUT information is realized. This design method avoids customized hardware modifications, eliminating the need for expensive hardware facilities and achieving communication functionality through simple software modifications, effectively saving costs and shortening the development cycle. Furthermore, this design method is applicable to different types of clamping devices and testing devices, effectively improving the versatility of the modification scheme.

[0067] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. An information interaction system, characterized in that, include: Multiple test stations; Information reader, used to scan and read information from the device under test; A clamping device, serially communicating with the information reader, is used to clamp and move the test piece; wherein, the clamping device includes an information sending module for setting the information sending station of the test piece, the information sending station being one of a plurality of test stations; the information sending module is a software module; Multiple testing devices are provided, each of which is configured in a one-to-one correspondence with each of the testing stations, for sequentially testing the device under test; wherein, each testing device includes a main testing device, which is configured at the testing station corresponding to the information sending station and communicates serially with the clamping device.

2. The information interaction system according to claim 1, characterized in that, Multiple test stations are arranged sequentially at intervals along a preset direction. The clamping device is used to clamp the test piece and make the test piece pass through each test station sequentially along the preset direction; wherein, the information reader is located at the first test station passed.

3. The information interaction system according to claim 2, characterized in that, When the device under test passes through the station of the main test device set in the information sending module, the clamping device obtains the information of the device under test from the information reader and sends it to the main test device.

4. The information interaction system according to any one of claims 1-3, characterized in that, The clamping device includes a robotic arm, and the information reader includes a QR code information reader.

5. The information interaction system according to claim 4, characterized in that, Also includes: A serial cable is connected between the robotic arm and the main testing device, and between the robotic arm and the QR code reader, respectively, to enable the transmission of QR code information.

6. The information interaction system according to claim 1, characterized in that, Also includes: A database, which is communicatively connected to the main test device, is used to store the mapping relationship between the test data of the main test device and the information of the device under test.

7. An information exchange method, characterized in that, include: The workpiece to be tested is held in place by a clamping device and moved to the position of the information reader; In response to receiving the information of the test piece obtained by the information reader, the information transmission station of the test piece is set in the information transmission module of the clamping device; The information sending module is a software module; The test piece is held and moved sequentially to other test equipment at each test station; Determine whether the current test station of the device under test is consistent with the set information sending station; If so, the information of the device under test will be transmitted to the test equipment of the current test station; Otherwise, perform normal testing on the device under test.

8. The information interaction method according to claim 7, characterized in that, The step of transmitting the information of the device under test to the test equipment at the current test station includes: The clamping device sends a signal to start the test to the test device; In response to receiving the information acquisition signal from the testing device, the clamping device sends the information of the test piece to the testing device; In response to receiving the test completion signal from the test equipment, the clamping device clamps the test piece and moves it to the next test station.

9. An information exchange method, characterized in that, The information interaction method is applied in the information interaction system according to any one of claims 1 to 6, and the method includes: In response to receiving a start test signal from the clamping device, the test device sends an information acquisition signal to the clamping device; In response to receiving information about the device under test, the testing device starts the test and transmits a test completion signal to the clamping device.

10. The information interaction method according to claim 9, characterized in that, After the step of transmitting the test completion signal to the clamping device, the method further includes: Obtain the test data of the currently described test equipment; Establish a mapping relationship between the information of the device under test and the test data; store the mapping relationship in the database.

Citation Information

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