Aging time setting method, device, equipment and readable storage medium

Abstract

The present invention provides an aging time setting method, device, equipment and readable storage medium. The method includes: performing an aging test on a component group to be tested, and recording the number of faults in each time period within a set time length T, wherein the total number of time periods included in T is M, and the length of each time period is t; calculating the sum of the failure rates of the component group to be tested in the first N time periods, wherein the initial value of N is 1; if the sum of the failure rates is not greater than a first threshold, taking N+1 as N, and recalculating the sum of the failure rates of the first N time periods; if the sum of the failure rates is greater than the first threshold, determining whether N is less than M; if N is less than M, setting the aging time of the component group to be tested to N*t; if N is equal to M, setting the aging time of the component group to be tested to T+t. The present invention solves the problem that the method for setting the aging time of the component to be tested in the existing scheme is not flexible enough and the aging time cannot be dynamically adjusted.

Description

Technical Field

[0001] The present invention relates to the field of server automated testing, and in particular to an aging time setting method, device, equipment and a readable storage medium. Background Art

[0002] During the production process of server product parts, aging tests are performed to eliminate early failure product parts. The setting of the aging time in the aging test will directly affect the quality of server product parts. Too short aging time will lead to a higher factory defect rate of product parts; while too long aging time will reduce the production efficiency of the server and increase the production cost during the production process. Therefore, it is particularly important to choose a suitable aging time.

[0003] The aging time selection of existing solutions is basically to manually set the aging time of the test component based on experience values. This method of setting the aging time based on artificial experience values ​​is not flexible enough and cannot dynamically adjust the aging time. Summary of the invention

[0004] The main purpose of the present invention is to provide an aging time setting method, device, equipment and readable storage medium, aiming to solve the problem that the technical solution for setting the aging time of the test component in the existing solution is not flexible enough and the aging time cannot be dynamically adjusted.

[0005] In a first aspect, the present invention provides an aging time setting method, the aging time setting method comprising:

[0006] Perform an aging test on the component group to be tested, and record the number of failures of the component group to be tested in each time period within a set time length T, where the total number of time periods included in T is M, and the length of each time period is t;

[0007] Calculate the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures recorded in each time period of the component group to be tested within the set time length T, where the initial value of N is 1;

[0008] If the sum of the failure rates is not greater than the first threshold, taking N+1 as N, executing the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within the set time length T;

[0009] If the sum of the failure rates is greater than a first threshold, determining whether N is less than M;

[0010] If N is less than M, the aging time of the component group to be tested is set to N*t;

[0011] If N is equal to M, the aging time of the component group to be tested is set to T+t.

[0012] Optionally, the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the recorded number of failures of the component group to be tested in each time period within the set time length T includes:

[0013] The number of failures k in the i-th time period i Substituting into the first preset formula, the failure rate of the component group to be tested in the i-th time period of the set time length T is calculated. The first preset formula is as follows:

[0014]

[0015] Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M];

[0016] The failure rate λ of the component group to be tested in the i-th time period of set length T i Substituting into the second preset formula, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. The second preset formula is as follows:

[0017]

[0018] Wherein, ρ is the sum of the failure rates of the component group to be tested in the first N time periods.

[0019] Optionally, the set time length T is set based on the aging time of the last batch of component groups to be tested, wherein the set time length of the first batch of component groups to be tested is a default value.

[0020] Optionally, the aging time setting method further includes:

[0021] Obtaining the aging time of each component group to be tested, wherein each component group to be tested belongs to the same target type;

[0022] The aging time of the target type is determined according to the acquired aging time of each component group to be tested.

[0023] Optionally, the step of determining the aging time of the target type according to the acquired aging time of each component group to be tested includes:

[0024] The mode of the aging time of each component group to be tested is determined according to the acquired aging time of each component group to be tested, and the mode is used as the aging time of the target type.

[0025] Optionally, the step of determining the aging time of the target type according to the acquired aging time of each component group to be tested includes:

[0026] The average aging time of each component group to be tested is calculated according to the acquired aging time of each component group to be tested, and the average is used as the aging time of the target type.

[0027] In a second aspect, the present invention further provides an aging time setting device, the aging time setting device comprising:

[0028] A recording module is used to perform an aging test on the component group to be tested, and record the number of failures of the component group to be tested in each time period within a set time length T, wherein the total number of time periods included in T is M, and the length of each time period is t;

[0029] A calculation module, used to calculate the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within a set time length T, wherein the initial value of N is 1;

[0030] An execution module, configured to, if the sum of the failure rates is not greater than a first threshold, take N+1 as N and execute the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within a set time length T;

[0031] A judging module, used for judging whether N is less than M if the sum of the failure rates is greater than a first threshold value; a first setting module, used for setting the aging time of the component group to be tested to N*t if N is less than M;

[0032] The second setting module is used to set the aging time of the component group to be tested to T+t if N is equal to M.

[0033] Optionally, the computing module is specifically used for:

[0034] The number of failures k in the i-th time period i Substituting into the first preset formula, the failure rate of the component group to be tested in the i-th time period of the set time length T is calculated. The first preset formula is as follows:

[0035]

[0036] Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M];

[0037] The failure rate λ of the component group to be tested in the i-th time period of set length T i Substituting into the second preset formula, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. The second preset formula is as follows:

[0038]

[0039] Wherein, ρ is the sum of the failure rates of the component group to be tested in the first N time periods.

[0040] In a third aspect, the present invention also provides an aging time setting device, which includes a processor, a memory, and an aging time setting program stored in the memory and executable by the processor, wherein when the aging time setting program is executed by the processor, the steps of the aging time setting method as described above are implemented.

[0041] In a fourth aspect, the present invention further provides a readable storage medium, on which an aging time setting program is stored, wherein when the aging time setting program is executed by a processor, the steps of the aging time setting method as described above are implemented.

[0042] In the present invention, an aging test is performed on a component group to be tested, and the number of failures of the component group to be tested in each time period within a set time length T is recorded, wherein the total number of time periods included in T is M, and the length of each time period is t; based on the recorded number of failures of the component group to be tested in each time period within the set time length T, the sum of the failure rates of the component group to be tested in the first N time periods is calculated, wherein the initial value of N is 1; if the sum of the failure rates is not greater than a first threshold value, N+1 is taken as N, and the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the recorded number of failures of the component group to be tested in each time period within the set time length T is performed; if the sum of the failure rates is greater than the first threshold value, it is determined whether N is less than M; if N is less than M, the aging time of the component group to be tested is set to N*t; if N is equal to M, the aging time of the component group to be tested is set to T+t. Through the present invention, based on the recorded number of failures of the component group to be tested in each time period within the set time length T, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. If the sum of the failure rates is greater than the first threshold value, and N is less than M, the aging time of the component group to be tested is set to N*t. If the sum of the failure rates is greater than the first threshold value, and N is equal to M, the aging time of the component group to be tested is set to T+t. The aging time of the component to be tested is no longer set by relying on manual experience values. The aging time of the component to be tested can be quickly obtained through statistical analysis and the setting of the aging time can be dynamically adjusted, which solves the problem that the method for setting the aging time of the component to be tested in the existing solution is not flexible enough and the aging time cannot be dynamically adjusted. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 A schematic diagram of the hardware structure of an aging time setting device involved in an embodiment of the present invention;

[0044] Figure 2 A schematic diagram of a flow chart of an embodiment of an aging time setting method of the present invention;

[0045] Figure 3 It is a functional module diagram of an embodiment of an aging time setting device of the present invention.

[0046] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0047] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0048] In a first aspect, an embodiment of the present invention provides an aging time setting device, which may be a device having a data processing function, such as a personal computer (PC), a notebook computer, or a server.

[0049] Reference Figure 1 , Figure 1 The hardware structure diagram of the aging time setting device involved in the embodiment of the present invention is shown in FIG. 1 . In the embodiment of the present invention, the aging time setting device may include a processor 1001 (e.g., a central processing unit (CPU)), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. Among them, the communication bus 1002 is used to realize the connection and communication between these components; the user interface 1003 may include a display screen (Display) and an input unit such as a keyboard (Keyboard); the network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity WIreless-FIdelity, WI-FI interface); the memory 1005 may be a high-speed random access memory (random access memory, RAM) or a stable memory (non-volatile memory), such as a disk storage. The memory 1005 may optionally be a storage device independent of the aforementioned processor 1001. Those skilled in the art will understand that Figure 1 The hardware structure shown in the figure does not constitute a limitation of the present invention, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0050] Continue to refer to Figure 1 , Figure 1 The memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and an aging time setting program. The processor 1001 may call the aging time setting program stored in the memory 1005 and execute the aging time setting method provided in the embodiment of the present invention.

[0051] In a second aspect, an embodiment of the present invention provides a method for setting an aging time.

[0052] In one embodiment, referring to Figure 2 , Figure 2 FIG. 1 is a flow chart of an embodiment of the aging time setting method of the present invention. Figure 2 As shown, the aging time setting method includes:

[0053] Step S10, performing an aging test on the component group to be tested, and recording the number of failures of the component group to be tested in each time period within a set time length T, wherein the total number of time periods included in T is M, and the length of each time period is t;

[0054] In this embodiment, the component group to be tested includes at least 2 components to be tested. If the component group to be tested includes 50 components to be tested, after the aging test is performed on the component group to be tested, the number of failures of the 50 components to be tested included in the component group to be tested in each time period within the set time length T is recorded, wherein the total number of time periods included in T is M, and the length of each time period is t.

[0055] Specifically, the number of failures of the 50 components to be tested included in the component group to be tested in the time period from 0 to t, the number of failures in the time period from t to 2t, the number of failures in the time period from 2t to 3t, the number of failures in the time period from (M-1)t to Mt, and so on are recorded, and the number of failures of the component group to be tested in each time period of the set duration T is recorded.

[0056] Step S20, calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within the set time length T, wherein the initial value of N is 1;

[0057] In this embodiment, the failure rate of the component group to be tested in the i-th time period is obtained by dividing the number of failures of the component group to be tested in the i-th time period by the sum of the number of failures of the component group to be tested in each time period within the set time length T. The failure rates of the first N time periods are added together to calculate the sum of the failure rates of the component group to be tested in the first N time periods, where the initial value of N is 1.

[0058] Furthermore, in one embodiment, step S20 includes:

[0059] The number of failures k in the i-th time period i Substituting into the first preset formula, the failure rate of the component group to be tested in the i-th time period of the set time length T is calculated. The first preset formula is as follows:

[0060]

[0061] Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M];

[0062] The failure rate λ of the component group to be tested in the i-th time period of set length T i Substituting into the second preset formula, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. The second preset formula is as follows:

[0063]

[0064] Wherein, ρ is the sum of the failure rates of the component group to be tested in the first N time periods.

[0065] In this embodiment, if i is 1, the number of failures k1 in the first time period is substituted into the first preset formula to obtain the failure rate of the component group to be tested in the first time period of the set time length T. If i is 2, the number of failures k2 in the second time period is substituted into the first preset formula to obtain the failure rate of the component group to be tested in the second time period of the set time length T. Similarly, according to the number of failures of the component group to be tested in each time period, the failure rate of the component group to be tested in each time period can be calculated respectively. Among them, the first preset formula is as follows:

[0066]

[0067] Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M].

[0068] If N is 3, the failure rate λ1 of the component group to be tested in the first time period of the set time length T, the failure rate λ2 of the component group to be tested in the second time period of the set time length T, and the failure rate λ3 of the component group to be tested in the third time period of the set time length T are substituted into the second preset formula The sum ρ of the failure rates of the component group to be tested in the first N time periods is calculated, where ρ=λ1+λ2+λ3.

[0069] Step S30, if the sum of the failure rates is not greater than the first threshold, taking N+1 as N, executing the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within the set time length T;

[0070] In this embodiment, if the sum ρ of the failure rates of the component group to be tested in the first N time periods calculated in step S20 is not greater than the first threshold value, the value of N is increased by 1, that is, N+1 is taken as N, and then the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the recorded number of failures of the component group to be tested in each time period within the set time length T is performed.

[0071] Step S40, if the sum of the failure rates is greater than the first threshold, determining whether N is less than M;

[0072] In this embodiment, if the sum ρ of the failure rates of the component group to be tested in the first N time periods calculated in step S20 is greater than the first threshold, it is determined whether N is less than M.

[0073] Step S50, if N is less than M, then the aging time of the component group to be tested is set to N*t;

[0074] In this embodiment, if the judgment result is that N is less than M, it means that the failure rate of the component group to be tested has met the expected value before the test time reaches the set time T, and the aging time of the component group to be tested is set to N*t.

[0075] Specifically, if the set duration T is 3h, the total number of time periods included in T is 3, the duration of each time period is 1h, and the first threshold is 95%, if the sum of the failure rates of the first two time periods is 96%, that is, the failure rate meets the expected value in advance, because N is 2 at this time, that is, N is less than M, so the aging time of the component group to be tested is set to 2*1h=2h. And because the set duration of the component group to be tested in this batch is based on the aging time of the component group to be tested in the previous batch, it can be known that the aging time of the component group to be tested in this batch is adjusted from 3h of the previous batch to 2h.

[0076] Step S60: if N is equal to M, then the aging time of the component group to be tested is set to T+t.

[0077] In this embodiment, if the judgment result is that N is equal to M, it means that when the test time of the component group to be tested reaches the set time T, the component group to be tested still has a high failure rate. It can be inferred that the failure rate of the component group to be tested may still be high in the next time period, so it is necessary to increase the set time of the component group to be tested, and set the aging time of the component group to be tested to T+t, which solves the defect that the aging time of the component to be tested cannot be dynamically adjusted when setting the aging time of the component to be tested in the existing solution. Among them, the failure rate of the component to be tested is the probability of occurrence of functional failure of the component to be tested.

[0078] Specifically, if the set duration T is 3h, the total number of time periods included in T is 3, the duration of each time period is 1h, and the first threshold is 95%, if the sum of the failure rates of the first two time periods is 93%, and the sum of the failure rates of the first three time periods is 100%, because N is 3 at this time, that is, N is equal to M, the aging time of the component group to be tested is set to 3h+1h=4h. And because the set duration of the component group to be tested in this batch is based on the aging time setting of the component group to be tested in the previous batch, it can be known that the aging time of the component group to be tested in this batch is adjusted from 3h of the previous batch to 4h.

[0079] In this embodiment, an aging test is performed on the component group to be tested, and the number of failures of the component group to be tested in each time period within a set time length T is recorded, wherein the total number of time periods included in T is M, and the length of each time period is t; based on the recorded number of failures of the component group to be tested in each time period within the set time length T, the sum of the failure rates of the component group to be tested in the first N time periods is calculated, wherein the initial value of N is 1; if the sum of the failure rates is not greater than a first threshold value, N+1 is taken as N, and the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the recorded number of failures of the component group to be tested in each time period of the set time length T is performed; if the sum of the failure rates is greater than the first threshold value, it is determined whether N is less than M; if N is less than M, the aging time of the component group to be tested is set to N*t; if N is equal to M, the aging time of the component group to be tested is set to T+t. Through this embodiment, based on the recorded number of failures of the component group to be tested in each time period within the set time length T, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. If the sum of the failure rates is greater than the first threshold value, and N is less than M, the aging time of the component group to be tested is set to N*t. If the sum of the failure rates is greater than the first threshold value, and N is equal to M, the aging time of the component group to be tested is set to T+t. The aging time of the component to be tested is no longer set by relying on manual experience. The aging time of the component to be tested can be quickly obtained through statistical analysis and the setting of the aging time can be dynamically adjusted. This solves the problem that the method for setting the aging time of the component to be tested in the existing solution is not flexible enough and the aging time cannot be dynamically adjusted.

[0080] Furthermore, in one embodiment, the set time length T is set based on the aging time of the last batch of component groups to be tested, wherein the set time length of the first batch of component groups to be tested is a default value.

[0081] In this embodiment, the set time length T is set based on the aging time of the previous batch of component groups to be tested. If the aging time of the previous batch of component groups to be tested is T, the set time length of the current batch of component groups to be tested is T. Further, if the aging time of the current batch of component groups to be tested is T+t, the set time length of the next batch of component groups to be tested is T+t, wherein the aging time set for the first batch of component groups to be tested is a default value.

[0082] Furthermore, in one embodiment, the aging time setting method further includes:

[0083] Obtaining the aging time of each component group to be tested, wherein each component group to be tested belongs to the same target type;

[0084] The aging time of the target type is determined according to the acquired aging time of each component group to be tested.

[0085] In this embodiment, the set duration of the component groups to be tested in this batch is determined according to the aging time of the component groups to be tested in the previous batch, and then the aging time of the component groups to be tested in this batch is obtained through steps S10 to S60. By analogy, the aging time of each component group to be tested can be obtained, wherein each component group to be tested belongs to the same target type.

[0086] According to the aging time of each component group to be tested, a scientific and reasonable aging time of the target type can be obtained through statistical analysis. The target type includes CPU, hard disk or internal memory.

[0087] Furthermore, in one embodiment, the step of determining the aging time of the target type according to the acquired aging time of each component group to be tested includes:

[0088] The mode of the aging time of each component group to be tested is determined according to the acquired aging time of each component group to be tested, and the mode is used as the aging time of the target type.

[0089] In this embodiment, after the aging time of each component group to be tested is obtained, the mode of the aging time of each component group to be tested is determined according to the obtained aging time of each component group to be tested, and the mode of the aging time of each component group to be tested is used as the aging time of the target type.

[0090] Specifically, after obtaining the aging time of 20 component groups to be tested, determine the mode of the aging time of these 20 component groups to be tested. For example, the target type of these 20 component groups to be tested is CPU, and among the aging times of these 20 component groups to be tested, the aging time of 5 component groups to be tested is 3h, the aging time of 12 component groups to be tested is 4h, and the aging time of 3 component groups to be tested is 5h. The mode of the aging time of these 20 component groups to be tested is 4h, and 4h is taken as the aging time of the CPU.

[0091] Furthermore, after the aging time of each component group to be tested is obtained, the aging time of at least H consecutive component groups to be tested that are the same can be used as the aging time of the target type according to the obtained aging time of each component group to be tested.

[0092] Furthermore, in one embodiment, the step of determining the aging time of the target type according to the acquired aging time of each component group to be tested includes:

[0093] The average aging time of each component group to be tested is calculated according to the acquired aging time of each component group to be tested, and the average is used as the aging time of the target type.

[0094] In this embodiment, after the aging time of each component group to be tested is obtained, the average aging time of each component group to be tested is calculated according to the obtained aging time of each component group to be tested, and the average aging time of each component group to be tested is used as the aging time of the target type.

[0095] Specifically, if the aging time of 20 component groups to be tested is obtained, and the target type of these 20 component groups to be tested is hard disk, and among the aging time of these 20 component groups to be tested, the aging time of 5 component groups to be tested is 3h, the aging time of 12 component groups to be tested is 4h, and the aging time of 3 component groups to be tested is 5h, and the average aging time of these 20 component groups to be tested is calculated to be 3.9h, then 3.9h is used as the aging time of the hard disk.

[0096] In a third aspect, an embodiment of the present invention further provides an aging time setting device.

[0097] In one embodiment, referring to Figure 3 , Figure 3 FIG. 1 is a functional module diagram of an embodiment of an aging time setting device of the present invention. Figure 3 As shown, the aging time setting device comprises:

[0098] The recording module 10 is used to perform an aging test on the component group to be tested, and record the number of failures of the component group to be tested in each time period within a set time length T, wherein the total number of time periods included in T is M, and the length of each time period is t;

[0099] A calculation module 20, for calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period of a set time length T, wherein the initial value of N is 1;

[0100] An execution module 30 is used for, if the sum of the failure rates is not greater than a first threshold value, taking N+1 as N, executing the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period of the set time length T;

[0101] A judgment module 40, configured to judge whether N is less than M if the sum of the failure rates is greater than a first threshold;

[0102] A first setting module 50, for setting the aging time of the component group to be tested to N*t if N is less than M;

[0103] The second setting module 60 is used to set the aging time of the component group to be tested to T+t if N is equal to M.

[0104] Furthermore, in one embodiment, the calculation module 20 is used to:

[0105] The number of failures k in the i-th time period i Substituting into the first preset formula, the failure rate of the component group to be tested in the i-th time period of the set time length T is calculated. The first preset formula is as follows:

[0106]

[0107] Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M];

[0108] The failure rate λ of the component group to be tested in the i-th time period of set length T i Substituting into the second preset formula, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. The second preset formula is as follows:

[0109]

[0110] Wherein, ρ is the sum of the failure rates of the component group to be tested in the first N time periods.

[0111] Furthermore, in one embodiment, the set time length T is set based on the aging time of the last batch of component groups to be tested, wherein the set time length of the first batch of component groups to be tested is a default value.

[0112] Furthermore, in one embodiment, the aging time setting device further includes a determination module, which is used to:

[0113] Obtaining the aging time of each component group to be tested, wherein each component group to be tested belongs to the same target type;

[0114] The aging time of the target type is determined according to the acquired aging time of each component group to be tested.

[0115] Furthermore, in one embodiment, the determination module is further configured to:

[0116] The mode of the aging time of each component group to be tested is determined according to the acquired aging time of each component group to be tested, and the mode is used as the aging time of the target type.

[0117] Furthermore, in one embodiment, the determination module is further configured to:

[0118] The average aging time of each component group to be tested is calculated according to the acquired aging time of each component group to be tested, and the average is used as the aging time of the target type.

[0119] Among them, the functional implementation of each module in the above-mentioned aging time setting device corresponds to each step in the above-mentioned aging time setting method embodiment, and its functions and implementation processes are no longer repeated here.

[0120] In a fourth aspect, an embodiment of the present invention further provides a readable storage medium.

[0121] The readable storage medium of the present invention stores an aging time setting program, wherein when the aging time setting program is executed by a processor, the steps of the aging time setting method described above are implemented.

[0122] The method implemented when the aging time setting program is executed can refer to the various embodiments of the aging time setting method of the present invention, which will not be described in detail here.

[0123] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0124] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0125] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a number of instructions for a terminal device to execute the methods described in each embodiment of the present invention.

[0126] The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A method for setting an aging time, characterized in that: The aging time setting method comprises: Perform an aging test on the component group to be tested, and record the number of failures of the component group to be tested in each time period within a set time length T, where the total number of time periods included in T is M, and the length of each time period is t; Calculate the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures recorded in each time period of the component group to be tested within the set time length T, where the initial value of N is 1; If the sum of the failure rates is not greater than the first threshold, taking N+1 as N, executing the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within the set time length T; If the sum of the failure rates is greater than a first threshold, determining whether N is less than M; If N is less than M, the aging time of the component group to be tested is set to N*t; If N is equal to M, the aging time of the component group to be tested is set to T+t; The step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the recorded number of failures of the component group to be tested in each time period within the set time length T comprises: The number of failures k in the i-th time period i Substituting into the first preset formula, the failure rate of the component group to be tested in the i-th time period of the set time length T is calculated. The first preset formula is as follows: Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M]; The failure rate λ of the component group to be tested in the i-th time period of set length T i Substituting into the second preset formula, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. The second preset formula is as follows: Wherein, ρ is the sum of the failure rates of the component group to be tested in the first N time periods.

2. The aging time setting method according to claim 1, characterized in that: The set time length T is set based on the aging time of the last batch of component groups to be tested, wherein the set time length of the first batch of component groups to be tested is a default value.

3. The aging time setting method according to claim 2, characterized in that: The aging time setting method further includes: Obtaining the aging time of each component group to be tested, wherein each component group to be tested belongs to the same target type; The aging time of the target type is determined according to the acquired aging time of each component group to be tested.

4. The aging time setting method according to claim 3, characterized in that: The step of determining the aging time of the target type according to the acquired aging time of each component group to be tested comprises: The mode of the aging time of each component group to be tested is determined according to the acquired aging time of each component group to be tested, and the mode is used as the aging time of the target type.

5. The aging time setting method according to claim 3, characterized in that: The step of determining the aging time of the target type according to the acquired aging time of each component group to be tested comprises: The average aging time of each component group to be tested is calculated according to the acquired aging time of each component group to be tested, and the average is used as the aging time of the target type.

6. An aging time setting device, characterized in that: The aging time setting device comprises: A recording module is used to perform an aging test on the component group to be tested, and record the number of failures of the component group to be tested in each time period within a set time length T, wherein the total number of time periods included in T is M, and the length of each time period is t; A calculation module, used to calculate the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within a set time length T, wherein the initial value of N is 1; An execution module, configured to, if the sum of the failure rates is not greater than a first threshold, take N+1 as N and execute the step of calculating the sum of the failure rates of the component group to be tested in the first N time periods based on the number of failures of the component group to be tested in each time period within a set time length T; A judging module, used for judging whether N is less than M if the sum of the failure rates is greater than a first threshold value; a first setting module, used for setting the aging time of the component group to be tested to N*t if N is less than M; A second setting module, for setting the aging time of the component group to be tested to T+t if N is equal to M; The computing module is specifically used for: The number of failures k in the i-th time period i Substituting into the first preset formula, the failure rate of the component group to be tested in the i-th time period of the set time length T is calculated. The first preset formula is as follows: Among them, λ i is the failure rate of the component group to be tested in the i-th time period of the set time length T, and the value range of i is [1, M]; The failure rate λ of the component group to be tested in the i-th time period of set length T i Substituting into the second preset formula, the sum of the failure rates of the component group to be tested in the first N time periods is calculated. The second preset formula is as follows: Wherein, ρ is the sum of the failure rates of the component group to be tested in the first N time periods.

7. An aging time setting device, characterized in that: The aging time setting device includes a processor, a memory, and an aging time setting program stored in the memory and executable by the processor, wherein when the aging time setting program is executed by the processor, the steps of the aging time setting method as described in any one of claims 1 to 5 are implemented.

8. A readable storage medium, characterized in that: The readable storage medium stores an aging time setting program, wherein when the aging time setting program is executed by a processor, the steps of the aging time setting method according to any one of claims 1 to 5 are implemented.

Images