A method and apparatus for monitoring power quality in a communication device

Abstract

The present application relates to the power distribution technology field of communication equipment, in particular to a communication equipment power supply quality monitoring method and device. The power supply quality is continuously monitored, and the power supply quality of the power supply environment is logged. Effective data support is provided for subsequent troubleshooting of the power supply side faults, and the engineering maintainability is improved. The device can be used as a voltage waveform observation tool to assist remote testing or fault diagnosis of the communication equipment, and the intelligent level of the equipment is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power distribution of communication equipment, and particularly relates to a communication equipment power supply quality monitoring method and device. BACKGROUND

[0002] In the prior art communication equipment-48V power supply distribution circuit, the following problems exist:

[0003] From the column head cabinet, PDP, power supply panel to the service machine panel, the entire-48V power main circuit, although part of the machine panel has voltage detection function, the existing mode detection period is long, generally needs 2S to 3S, the data after detection is not processed locally, and needs to be reported when the device network management side is actively polled, and it is difficult to monitor and record-48V voltage transient event. For the device restart problem caused by-48V voltage transient fluctuation in engineering, the voltage information record at the time of fault is lacking, and it is difficult to troubleshoot and analyze after the fault is eliminated.

[0004] The prior art usually adopts the following two detection methods:

[0005] The first kind adopts A / D sampling unit sampling, samples once each time, and reports one piece, which is obtained by the device network management through polling mode, but the polling machine panel quantity will affect the timeliness of the reported data, the real-time performance is poor, and the data is easy to lose, and the transient voltage fluctuation is easy to miss;

[0006] The second kind adopts comparator detection-48V voltage, and outputs a voltage abnormal alarm signal when overvoltage or undervoltage occurs. The defect is that there is no corresponding voltage abnormal detail information record, and the judgment threshold of overvoltage and undervoltage is usually a fixed value, which cannot be flexibly modified.

[0007] Therefore, it is urgent to overcome the defects of the prior art in the technical field. SUMMARY

[0008] The technical problem to be solved by the present application is to provide a communication equipment power supply quality monitoring method.

[0009] The technical problem to be solved by the present application is to provide a communication equipment power supply quality monitoring method.

[0010] The present application adopts the following technical scheme:

[0011] In a first aspect, a communication equipment power supply quality monitoring method comprises:

[0012] The power supply voltage of the communication equipment is taken as a sampled voltage, and an A / D sampling unit samples it at a preset sampling period, and a window comparator compares the sampling value of the sampled voltage;

[0013] When the sampling value is higher than the preset high voltage threshold of the window comparator or lower than the preset low voltage threshold of the window comparator, it is judged that the sampled voltage has transient voltage fluctuation, the sampling value is buffered, and a timer is started to count, recording the time length of the transient voltage fluctuation.

[0014] Preferably, the MCU is further configured to buffer the sampling value of the sampled voltage in a specified region according to the comparison result of the window comparator.

[0015] Preferably, the MCU buffers the sampling value of the sampled voltage in a specified region according to the comparison result of the window comparator, and the buffering specifically comprises:

[0016] When the sampling value of the sampled voltage is lower than the preset high voltage threshold of the window comparator and higher than the preset low voltage threshold of the window comparator, the sampled voltage does not have transient voltage fluctuation, the window comparator does not send a trigger signal to the MCU, and the MCU buffers the sampling value of the sampled voltage in a first data recording area.

[0017] When the sampling value of the sampled voltage is higher than the preset high voltage threshold of the window comparator or lower than the preset low voltage threshold of the window comparator, the sampled voltage has transient voltage fluctuation, the window comparator sends a trigger signal to the MCU, and the MCU buffers the sampling value of the sampled voltage in a second data recording area.

[0018] Preferably, when the window comparator sends a trigger signal to the MCU, the MCU starts the timer, and the starting specifically comprises:

[0019] The timer outputs a pulse at a preset output period, and the MCU counts the output pulse of the timer.

[0020] Preferably, when the window comparator stops sending a trigger signal to the MCU, the MCU stops the timer, and the stopping further comprises:

[0021] The duration length of the transient voltage waveform is obtained according to the counting of the output pulse of the timer by the MCU between the time when the window comparator starts sending a trigger signal to the MCU and the time when the window comparator stops sending a trigger signal to the MCU.

[0022] Preferably, the MCU buffers the sampling value of the sampled voltage in the first data recording area, and the buffering further comprises:

[0023] The MCU extracts the sampled voltage sample value from the first data recording area according to a preset extraction period.

[0024] Preferably, the MCU extracts the sampled voltage sample value from the first data recording area according to a preset extraction period, and the extracted sampled voltage sample value further comprises:

[0025] The sampled voltage sample value extracted by the MCU and the corresponding extraction time are merged into a performance value record and stored in a preset recording position.

[0026] Preferably, when the window comparator stops sending the trigger signal to the MCU and obtains the duration length of the transient voltage waveform, it further comprises:

[0027] The MCU extracts the sampled voltage sample value of the second data recording area and merges it with the duration length of the transient voltage waveform into a fault information record and stores it in a preset recording position.

[0028] Preferably, when the window comparator stops sending the trigger signal to the MCU and obtains the duration length of the transient voltage waveform, it further comprises:

[0029] When the duration length of the transient voltage waveform obtained according to the count of the output pulse of the timer is greater than the first preset time length or less than the second preset time length, the corresponding merging and storing of the fault information record is not performed.

[0030] In a second aspect, a communication device power supply quality monitoring device comprises at least one processor and a memory in communication connection with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the processor to perform the communication device power supply quality monitoring method of claims 1-9.

[0031] The present application provides a communication device power supply quality monitoring device, which continuously monitors the power supply quality, provides log records for the power supply quality of the power supply environment, provides effective data support for subsequent troubleshooting of power supply faults on the power supply side, improves engineering maintainability, and can be used as a voltage waveform observation tool to assist remote testing or fault diagnosis of communication devices and improve the intelligent level of the devices. BRIEF DESCRIPTION OF DRAWINGS

[0032] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required to be used in the embodiments of the present application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained from these drawings without creative labor.

[0033] Figure 1 is a circuit schematic diagram of a communication device power supply quality monitoring method provided by an embodiment of the application;

[0034] Figure 2 is a cycle schematic diagram of a sampling cycle of a communication device power supply quality monitoring method provided by an embodiment of the application;

[0035] Figure 3 is a flow schematic diagram of a communication device power supply quality monitoring method provided by an embodiment of the application;

[0036] Figure 4 is a circuit schematic diagram of a communication device power supply quality monitoring method provided by an embodiment of the application;

[0037] Figure 5 is a circuit schematic diagram of a communication device power supply quality monitoring method provided by an embodiment of the application;

[0038] Figure 6 is a device schematic diagram of a communication device power supply quality monitoring device provided by an embodiment of the application. DETAILED DESCRIPTION

[0039] In order to make the objects, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and should not be used to limit the present application.

[0040] In the description of the present application, the terms "inner", "outer", "longitudinal", "transverse", "upper", "lower", "top", "bottom" and the like indicate the orientation or positional relationship shown in the drawings, and are only used to facilitate the description of the present application and do not require the present application to be constructed and operated in a particular orientation, therefore should not be understood as a limitation on the present application.

[0041] In addition, the technical features involved in each embodiment of the present application described below can be combined with each other as long as they do not conflict with each other.

[0042] Embodiment 1:

[0043] Embodiment 1 of the present application provides a communication device power supply quality monitoring method, which specifically comprises:

[0044] The power supply voltage of the communication device is taken as a sampled voltage, and an A / D sampling unit samples it at a preset sampling cycle, and a window comparator compares the sampling value of the sampled voltage;

[0045] As Figure 1As shown, when the sampling value is higher than the preset high voltage threshold of the window comparator or lower than the preset low voltage threshold of the window comparator, it is judged that the sampled voltage has transient voltage fluctuation, the sampling value is buffered, and a timer is started to count, and the time length of the transient voltage fluctuation is recorded.

[0046] The power supply of the communication device is -48V, or the power supply is selected and set by the person skilled in the art according to the actual situation;

[0047] The power distribution system of the communication device includes a power supply cabinet output end, a column head cabinet, a PDP, a communication device DC power supply panel, and a DC-DC power supply module inlet.

[0048] The A / D sampling unit samples the analog voltage signal according to a sampling period and converts it into a digital signal output; in the present application, the preset sampling period is 10-20us, or it is set by the person skilled in the art according to the actual situation, which should not limit the protection scope of the present patent;

[0049] As shown in the figure, Figure 2 The window comparator is a voltage comparator with a high voltage threshold and a low voltage threshold, when the voltage value input into the window comparator is lower than the high voltage threshold and higher than the low voltage threshold, the output of the window comparator remains unchanged; when the voltage value input into the window comparator is higher than the high voltage threshold or lower than the low voltage threshold, the output of the window comparator flips; in the present application, the preset high voltage threshold value and the low voltage threshold value are designed by the person skilled in the art according to the actual situation and the sensitivity requirement of triggering transient waveform recording;

[0050] The timer is a timer that outputs pulses according to an output period, when the timer is started, the output pulse times of the timer are counted, and the output pulse times are multiplied by the output period to obtain the duration during which the timer is started, so as to count the time;

[0051] The A / D sampling unit is used to continuously and rapidly sample the -48V voltage according to a preset sampling period, so as to avoid the poor timeliness and real-time performance of data reporting caused by the polling mode, and thus the transient voltage fluctuation is avoided; the sampling value of the sampled voltage is sent to the window comparator for comparison, when the transient voltage fluctuation occurs in the -48V power supply process of the communication device, the sampling value of the sampled voltage is higher than the preset high voltage threshold or lower than the preset low voltage threshold, at this time, the timer is started to time the duration of the transient voltage fluctuation, when the transient voltage fluctuation ends, the sampling value of the sampled voltage returns to normal and is lower than the high voltage threshold and higher than the low voltage threshold, at this time, the timer is stopped to end the timing of the duration of the transient voltage fluctuation, and according to the sampling value of the sampled voltage obtained by sampling, in combination with the time when the sampling is performed, the power supply quality of the -48V of the communication device can be continuously monitored and recorded.

[0052] Therefore, the power supply quality of the -48V power supply of the communication device is continuously monitored by continuous sampling, and the power supply quality of the power supply environment is logged; for the transient voltage fluctuation fault that has occurred in the -48V power supply process of the communication device, the real-time comparison of the collected voltage in the power supply process by the window comparator and the real-time timing of the timer can clearly provide monitoring records at the time of the fault, provide effective data support for subsequent fault troubleshooting, and improve the maintainability of the project.

[0053] As shown in Figure 3 The communication device power supply quality monitoring method comprises the following steps:

[0054] When the voltage in the -48V power supply process of the communication device is sampled, the sampling voltage of the sampled voltage needs to be buffered and processed, so as to monitor and record the power supply quality of the -48V of the communication device, therefore, the present application also relates to the following preferred design:

[0055] In step 301, the A / D sampling unit samples the voltage of the -48V of the communication device at a preset sampling period;

[0056] In step 302, the sampling value of the sampled voltage is sent to the MCU, and the MCU buffers the sampling value of the sampled voltage according to the comparison result of the window comparator on the sampling value of the sampled voltage.

[0057] The MCU is a micro control unit, the A / D sampling unit sends the sampling value of the sampled voltage to the MCU, the window comparator compares the sampling value of the sampled voltage, the MCU judges whether the sampled voltage has transient voltage fluctuation according to the comparison result of the window comparator, and caches the sampling value of the sampled voltage to the corresponding position for subsequent processing.

[0058] When the communication equipment is powered by 48V, different records and processing are required for the voltage without transient voltage fluctuation and the voltage with transient voltage fluctuation, so the voltage without transient voltage fluctuation and the voltage with transient voltage fluctuation need to be cached in different positions for different records and processing, therefore the application also relates to the following preferred method:

[0059] In step 303, the MCU checks whether the sampling value of the sampled voltage triggers the high voltage threshold or the low voltage threshold of the window comparator; when the sampling value of the sampled voltage is greater than the high voltage threshold or less than the low voltage threshold, the window comparator is triggered, and the process jumps to step 305; when the sampling value of the sampled voltage is less than the high voltage threshold and greater than the low voltage threshold, the window comparator is not triggered, and the process jumps to step 304;

[0060] The MCU caches the sampling value of the sampled voltage according to the comparison result of the window comparator, and the caching specifically includes:

[0061] In step 304, when the sampling value of the sampled voltage is lower than the preset high voltage threshold of the window comparator and higher than the preset low voltage threshold of the window comparator, the sampled voltage does not have transient voltage fluctuation, the window comparator does not send a trigger signal to the MCU, and the MCU caches the sampling value of the sampled voltage in the first data recording area;

[0062] In step 305, when the sampling value of the sampled voltage is higher than the preset high voltage threshold of the window comparator or lower than the preset low voltage threshold of the window comparator, the sampled voltage has transient voltage fluctuation, the window comparator sends a trigger signal to the MCU, and the MCU caches the sampling value of the sampled voltage in the second data recording area;

[0063] When the sampling value of the sampled voltage is compared by the window comparator and sent back to the MCU, the MCU caches the sampling value of the sampled voltage in the memory, which is RAM or selected by the person skilled in the art without limiting the protection scope of the present application; the first data recording area only caches voltage data without transient voltage fluctuation, and the storage space of the first data recording area is fixed capacity. When the storage space of the first data recording area reaches the upper limit, the sampling value of the sampled voltage that needs to be cached into the first data recording area is overwritten in the first data recording area according to the order of writing into the first data recording area; the second data recording area only caches voltage data with transient voltage fluctuation. When a transient voltage fluctuation occurs, the window comparator sends a trigger signal to the MCU, wherein the trigger signal is an interrupt signal. The interrupt caches the sampling value of the sampled voltage in the first data recording area and then caches the sampling value of the sampled voltage in the second data recording area. After the transient voltage fluctuation is completed, the sampling value cached in the second data recording area from the beginning of the transient voltage fluctuation to the end of the transient voltage fluctuation is extracted and processed. After the processing is completed, the cached data in the second data recording area is emptied, and the new sampling value of the corresponding sampled voltage is cached in the real-time second data recording area after the next transient voltage fluctuation.

[0064] When a transient voltage fluctuation occurs, the sampling value of the sampled voltage is sent to the second data recording area, and the duration of the transient voltage fluctuation needs to be recorded to ensure follow-up monitoring and recording of faults. The timer measures the duration of the transient voltage fluctuation, so the present application also relates to the following preferred method:

[0065] When the sampled voltage has a transient voltage fluctuation, the window comparator continuously sends a trigger signal to the MCU, and the MCU caches the sampling value of the sampled voltage in the second data recording area. At the same time, the MCU starts the timer, the timer outputs a pulse at a preset output period, and the MCU counts the output pulse of the timer.

[0066] When the pre-stage sampling circuit sends the sampling value of the sampling voltage to the A / D sampling unit and the window comparator, and the window comparator compares that the sampling value of the sampling voltage is higher than the preset high voltage threshold of the window comparator or lower than the preset low voltage threshold of the window comparator, the window comparator sends a trigger signal to the MCU, the MCU stops buffering the sampling value of the sampling voltage to the first data recording area and buffers the sampling value of the sampling voltage to the second data recording area instead, and starts the timer, the timer outputs a pulse at a preset output period, wherein the preset output period is the time difference between the previous output pulse and the next output pulse of the timer, the MCU counts the output pulse of the timer, and thus the time obtained by multiplying the count and the preset output period is the duration of the timer starting.

[0067] Since the timer is used to measure the duration of the transient voltage fluctuation in the process of the communication equipment-48V power supply, the starting and ending of the timer should be synchronized with the duration of the transient voltage fluctuation, and start and end at the same time, so as to ensure that the duration of the opening of the timer is the duration of the transient voltage fluctuation, and thus the present application also relates to the following preferred method:

[0068] When the window comparator stops sending the trigger signal to the MCU, the MCU buffers the sampling value of the sampling voltage in the first data recording area again, and the MCU closes the timer, and the duration of the transient voltage waveform is obtained according to the count of the output pulse of the timer of the MCU between the time when the window comparator starts sending the trigger signal to the MCU and the time when the window comparator stops sending the trigger signal to the MCU.

[0069] When the sampling value of the sampling voltage returns to the interval lower than the high voltage threshold of the window comparator and higher than the low voltage threshold of the window comparator, the transient voltage fluctuation stops, the window comparator stops sending the trigger signal to the MCU, the MCU closes the timer, the timer stops outputting the pulse, the MCU stops counting the output pulse of the timer, and the duration of the output pulse of the timer is obtained by multiplying the count value and the preset output period according to the count of the output pulse of the timer during the transient voltage fluctuation, so as to obtain the duration of the transient voltage waveform.

[0070] In order to ensure that the storage space of the first data recording area does not exceed the upper limit of the capacity to reach the upper limit, the MCU needs to extract the sampled values of the sampled voltage from the first data recording area periodically, avoiding the continuous caching of the sampled values of the sampled voltage by the MCU as the A / D sampling unit samples the voltage of the communication equipment-48V power supply, which causes the storage space of the first data recording area to reach the upper limit, therefore, the present application also has the following preferred method:

[0071] In step 306, the MCU extracts the sampled values of the sampled voltage from the first data recording area according to the preset extraction period.

[0072] Wherein, the preset extraction period is designed by those skilled in the art according to the actual situation, mainly according to the storage space of the first data recording area, to ensure that the sampled values of the sampled voltage are continuously cached into the first data recording area within the preset extraction period, and the storage space of the first data recording area will not reach the upper limit, after the sampled values of the sampled voltage in the first data recording area are extracted and processed, the new sampled values of the sampled voltage are repeatedly covered according to the order of the cached sampled values in the first data recording area.

[0073] The sampled values of the sampled voltage extracted by the MCU from the first data recording area according to the preset extraction period need to be processed into detection records, therefore the present application also relates to the following preferred method:

[0074] The sampled values of the sampled voltage extracted by the MCU from the first data recording area according to the preset extraction period are combined with the corresponding extraction time into a performance value record and stored to a preset recording position.

[0075] The preset recording position is a non-volatile memory, which can be selected as FLASH and a memory card, or the memory of the preset position can be selected by those skilled in the art according to the actual situation, which should not limit the protection scope of the present application; the performance value record is a normal power supply record without failure during the power supply of the communication equipment-48V.

[0076] When the transient voltage fluctuation stops, the MCU extracts all the sampled values of the sampled voltage cached into the second data recording area within the duration of the transient voltage fluctuation, and needs to process the sampled values of the sampled voltage into detection records, therefore the present application also relates to the following preferred method:

[0077] In step 307, when the window comparator stops sending the trigger signal to the MCU and obtains the duration length of the transient voltage waveform, the MCU extracts the sampled values of the sampled voltages in the second data recording area and merges them with the duration length of the transient voltage waveform into a fault information record;

[0078] In step 308, the fault information record is stored in a preset recording position.

[0079] After the MCU extracts the sampled values of the sampled voltages in the second data recording area during the duration of the transient voltage fluctuation, the sampled values of the sampled voltages are merged with the duration length of the output pulse of the timer into a fault information record and stored in a preset position. The preset recording position is the same as the preset recording position of the stored performance value record. The preset recording position is a non-volatile memory, which can be selected from a FLASH and a memory card. Alternatively, the memory of the preset position can be selected by a person skilled in the art according to the actual situation, which should not limit the protection scope of the present application. The fault information record is a fault power supply record of a communication device during a transient voltage fluctuation of a 48V power supply.

[0080] When the duration of the transient voltage fluctuation is too short, the influence of the transient voltage fluctuation on the communication device can be ignored. When the duration of the transient voltage fluctuation is too long, the transient voltage fluctuation will have a serious impact on the communication device, and usually the communication device cannot maintain a normal state at this time. Therefore, in order to save storage space and reduce the waste of resources of the MCU, the present application also relates to the following preferred method:

[0081] When the duration length of the transient voltage waveform obtained according to the count of the output pulse of the timer is greater than a first preset time length or less than a second preset time length, the corresponding merging and storing of the fault information record are not performed.

[0082] When the duration length of the transient voltage waveform is greater than the first preset time length, the transient voltage fluctuation will cause serious impact on the communication equipment, and usually the communication equipment cannot maintain normal state at this time, the first preset time length is 10s or is designed by the person skilled in the art according to the actual situation, which should not limit the protection scope of the present application; when the duration length of the transient voltage waveform is less than the second preset time length, the influence of the transient voltage fluctuation on the communication equipment can be ignored, the second preset time length is 50us or is designed by the person skilled in the art according to the actual situation, which should not limit the protection scope of the present application; when the duration length of the transient voltage waveform is greater than the first preset time length or less than the second preset time length, the corresponding fault information record is not merged, and is not stored in the preset record position.

[0083] Embodiment 2:

[0084] Embodiment 2 of the present application provides a communication equipment power supply quality monitoring method, and embodiment 2 of the present application shows the implementation process of the present scheme from a more specific scenario compared with embodiment 1.

[0085] The main components are as follows:

[0086]

[0087] As Figure 4 shown, it is a window comparator schematic diagram;

[0088] The window comparator parameters are set as follows:

[0089] R1=100KΩ, R2=2.49KΩ, R3=2.49KΩ, high voltage threshold (OV)=0.024*input voltage value, low voltage threshold (UV)=0.047*input voltage value, the communication equipment operating voltage range is 40.0-57.6V, the high voltage threshold of the window comparator is 58.5V, the low voltage threshold of the window comparator is 36.0V, Ref1=0.047*36=1692mV, Ref2=0.024*58.5=1404mv;

[0090] The Ref1 and Ref2 are set by the MCU through software and output to the window comparator by D / A; since the R1, R2 and R3 resistance values are fixed, when the Ref1 and Ref2 are changed, the high voltage threshold and the low voltage threshold will change accordingly;

[0091] The window comparator outputs a constant high level when the input voltage is between the overvoltage and undervoltage thresholds, and the output becomes low when the voltage is higher than the high voltage threshold or lower than the low voltage threshold, providing a falling edge interrupt trigger signal to the MCU; the interrupt signal is eliminated when the voltage with transient fluctuation returns to the range between the overvoltage and undervoltage thresholds.

[0092] As shown in Figure 5 a schematic diagram of a monitoring system

[0093] The parameters of the monitoring system are set as follows:

[0094] R4 = 100KΩ, R5 = 2KΩ, and the voltage transient fluctuation amplitude is not more than 200V, which can be monitored;

[0095] The buffer is built using LM2904 operational amplifier;

[0096] The A / D sampling unit uses 16-bit AD7699, and the sampling rate is set to 125KSPS, completing sampling once every 8us;

[0097] The MCU uses STM32F429 chip, and the external 32.768KHz crystal oscillator provides RTC real-time clock, and the external 24MHz crystal oscillator is used for system clock;

[0098] The D / A sampling unit uses AD5061, which supports 0-4.096V output range setting;

[0099] The SDRAM uses SCB33S256160AE with 166MHz / 256MBit 16bit data interface;

[0100] The SPI Flash uses W25Q256JVFIQ / 256Mbit;

[0101] The timer is generated by software after the 180MHz system clock of the MCU is divided, and the MCU has 17 timers, using 32Bit general-purpose timer TIM2 with a maximum clock rate of 45MHz, corresponding to each clock cycle of 22.2ns, which can record a single time length of 95.44S; TIM2 timer supports 4 capture channels, that is, it can support simultaneous processing of 4 interrupt signals timing;

[0102] The digital isolator uses NSI8100 with I2C interface, which is used for isolated communication with the remote host system.

[0103] System workflow:

[0104] System power on, MCU set D / A output, Ref1, Ref2 generate output, corresponding detection threshold is UV 36.0V, OV 58.5V;

[0105] Enable TIM2 timer, input mode is capture mode, start by external pin interrupt signal;

[0106] Start A / D, work in continuous mode, continuous sampling conversion according to every 8us, transmit to MCU by SPI bus;

[0107] SDRAM every 4M byte capacity is a bank, a total of 8 banks, A / D every sampling generates 2 byte data, 244K byte data per second; 4 low address bit banks are divided into cache area A; 4 high address bit banks are divided into cache area B; two cache areas can cache sampling data for 67S time length;

[0108] MCU generates a 15S cycle software timer, every time the timer is full, it generates an overflow interrupt signal, if MCU does not receive the interrupt signal of window comparator output, it extracts the latest data written in cache area A; the extracted sampling cache data is packaged and recorded into Flash with current system time; then MCU resets the 15S software timer and starts timing again; before receiving the interrupt signal of window comparator, A / D sampling data is continuously written into bank0~bank3 space of cache area A, and after writing, it is recycled (according to low to high); the software timer can be modified in the range of 0.5S~60S, and the corresponding sampling data compression ratio is adjusted accordingly;

[0109] When the window comparator has an interrupt signal, MCU performs two operations, one is to cache A / D data to cache area B, that is, bank4~bank7 of SDRAM; at the same time, start TIM2 timer 1 to start timing; TIM2 has 4 channels that can be independently timed, when transient waveform oscillates, continuously triggers OV threshold and UV threshold, two channels of TIM2 can be used simultaneously for timing;

[0110] When the interrupt signal ends, MCU extracts the data of cache area B, and at the same time, acquires the current system time, and writes it into Flash after packaging; considering the continuous two times of triggering interrupt caused by transient waveform oscillation, MCU can delay 1~10ms before extracting the data of cache area B and performing extraction and cache area B emptying processing on the data of cache area B.

[0111] When extracting the data of the buffer area B, the MCU also needs to extract and judge the timing result of channel 1 of TIM2. For data less than 50us and greater than 10S, according to the foregoing reasons, it can be ignored and does not need to be recorded to the flash;

[0112] For the storage capacity usage of the flash, when reaching 90% capacity, the MCU will generate a full capacity state prompt to remind the user to extract the log as soon as possible;

[0113] Embodiment 3:

[0114] As Figure 6 shown in FIG. 1, which is a device schematic diagram of the communication device power supply quality monitoring device according to an embodiment of the present application. The communication device power supply quality monitoring device according to the embodiment includes one or more processors 61 and a memory 62. Among them, Figure 6 The processor 61 is taken as an example.

[0115] The processor 61 and the memory 62 can be connected through a bus or other means, Figure 6 which is taken as an example of connection through a bus.

[0116] The memory 62, as a kind of non-volatile computer readable storage medium, can be used to store non-volatile software programs and non-volatile computer executable programs, such as the communication device power supply quality monitoring in embodiment 1. The processor 61 executes the communication device power supply quality monitoring method by running the non-volatile software programs and instructions stored in the memory 62.

[0117] The memory 62 can include a high-speed random access memory, and can also include a non-volatile memory, for example, at least one magnetic disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 62 can optionally include a memory remotely arranged with respect to the processor 61, and these remote memories can be connected to the processor 61 through a network. Examples of the above-mentioned network include but are not limited to the Internet, an intranet, a local area network, a mobile communication network, and a combination thereof.

[0118] The program instructions / modules are stored in the memory 62, and when executed by the one or more processors 61, the communication device power supply quality monitoring method in embodiment 1 is executed, for example, the above-described Figure 1 and Figure 2 each step shown in FIG. 1.

[0119] The above only describes the preferred embodiments of the present application and does not limit the present application. Any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A method for monitoring power supply quality of communication equipment, characterized in that: include: The power supply voltage of the communication device is used as the sampled voltage, the A / D sampling unit samples it at a preset sampling period, and the window comparator compares the sampled values ​​of the sampled voltage; When the sampled value is higher than a preset high voltage threshold of the window comparator or lower than a preset low voltage threshold of the window comparator, it is determined that the sampled voltage has a transient voltage fluctuation, the sampled value is cached, and a timer is started to count and record the duration of the transient voltage fluctuation; The system further includes an MCU, the MCU being configured to obtain a sampled value from the A / D sampling unit, and the MCU being configured to cache the sampled value of the sampled voltage in a designated area according to a comparison result of the sampled value of the sampled voltage by a window comparator; When the sampled value of the sampled voltage is higher than a preset high voltage threshold of the window comparator or lower than a preset low voltage threshold of the window comparator, a transient voltage fluctuation occurs in the sampled voltage, and the window comparator sends a trigger signal to the MCU, and the MCU caches the sampled value of the sampled voltage in a second data recording area; When the window comparator sends a trigger signal to the MCU, the MCU starts the timer at the same time. The timer outputs pulses at a preset output period, and the MCU counts the output pulses of the timer.

2. The method for monitoring power supply quality of communication equipment according to claim 1, wherein: The MCU caches the sampled voltage sampled value in a designated area according to a comparison result of the sampled voltage sampled value by the window comparator, specifically comprising: When the sampling value of the sampled voltage is lower than the preset high voltage threshold of the window comparator and higher than the preset low voltage threshold of the window comparator, the sampled voltage does not experience transient voltage fluctuation, the window comparator does not send a trigger signal to the MCU, and the MCU caches the sampling value of the sampled voltage in the first data recording area.

3. The method for monitoring power supply quality of communication equipment according to claim 2, wherein: When the window comparator stops the MCU from sending a trigger signal, the MCU turns off the timer, further comprising: The duration of the transient voltage waveform is obtained according to the count of the output pulses of the timer by the MCU between the time when the window comparator starts sending the trigger signal to the MCU and the time when the window comparator stops sending the trigger signal to the MCU.

4. The method for monitoring power supply quality of communication equipment according to claim 2, wherein: The MCU caches the sampled value of the sampled voltage in the first data recording area, and further includes: The MCU extracts the sampled value of the sampled voltage from the first data recording area according to a preset extraction period.

5. The method for monitoring power supply quality of communication equipment according to claim 4, characterized in that: The MCU extracts a sampled value of the sampled voltage from the first data recording area according to a preset extraction period, and further includes: The sampling value of the sampled voltage extracted by the MCU and the corresponding extraction time are combined into a performance value record and stored in a preset record location.

6. The method for monitoring power supply quality of communication equipment according to claim 3, wherein: When the window comparator stops sending the trigger signal to the MCU and obtains the duration of the transient voltage waveform, the method further includes: The MCU extracts the sampled voltage value of the second data recording area and combines it with the duration of the transient voltage waveform to form a fault information record, which is then transferred to a preset recording location.

7. The method for monitoring power supply quality of communication equipment according to claim 6, wherein: When the window comparator stops sending the trigger signal to the MCU and obtains the duration of the transient voltage waveform, the method further includes: When the duration of the transient voltage waveform obtained by counting the output pulses of the timer is greater than the first preset time length or less than the second preset time length, the corresponding fault information records are not merged and transferred.

8. A communication equipment power supply quality monitoring device, characterized in that: The power supply quality monitoring device for communication equipment includes at least one processor and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the processor to execute the power supply quality monitoring method for communication equipment described in any one of claims 1-7.

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