Optical deviation recognition method and device, chromosome scanning device, and storage medium
By identifying the field-of-view image deviation of the optical microscope objective, calculating and adjusting the position of the sample stage, the problem of non-parallel optical axes is solved, improving observation accuracy and automated detection capabilities.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHENZHEN REETOO BIOTECHNOLOGY CO LTD
- Filing Date
- 2020-11-30
- Publication Date
- 2026-05-15
AI Technical Summary
When switching objectives in an optical microscope, if the optical axes are not parallel, the sample stage will be difficult to move accurately, affecting the precision and integrity of chromosome observation.
By identifying the field-of-view images of the first and second objectives, the reference position and the target position are obtained, the deviation value is calculated, and the position of the sample stage is adjusted using the camera's pixel size and the objective lens magnification to achieve field-of-view overlap.
It improves the observation accuracy after objective lens conversion, simplifies sample position adjustment, supports automated detection, and enables rapid calibration and precise alignment.
Smart Images
Figure CN114577796B_ABST
Abstract
Description
Technical Field
[0001] This application relates to optical microscopy, and in particular to optical deviation identification methods and devices, chromosome scanning devices and storage media. Background Technology
[0002] An optical microscope (OM) is an optical instrument that uses optical principles to magnify and image tiny objects that are indistinguishable to the human eye, allowing people to extract information about their fine structures. Taking biological microscopy as an example, for chromosome karyotype analysis and observation of the intermediate phase of cell division, it is necessary to use a low-power objective to scan the entire slide, and then use a high-power objective to observe the selected karyotype in detail. The field of view of the low-power objective is larger than that of the high-power objective, and the selected cells in metaphase are scattered. Therefore, the accuracy of the center field of view positioning is crucial when switching from low-power to high-power objectives. Poor positioning quality can easily lead to an incomplete field of view or deviation from the center of the field of view, and in severe cases, it can result in missing chromosome images, affecting the interpretation of the results.
[0003] When observing any specimen, you must first use a low-power objective lens to determine the position of the target. The product of the eyepiece magnification and the objective magnification is the magnification of the original object. If the image is not in the center of the field of view, slowly move it to the center and adjust accordingly. Then switch to a high-power objective lens. Under normal circumstances, after the high-power objective lens is aligned, a blurry image can be seen in the center of the field of view. Then fine-tune the focus to obtain a clear image. When observing with a high-power objective lens, the field of view becomes smaller and darker. You need to readjust the brightness of the field of view, which can be done by raising the condenser or using a concave mirror. Whether the objective lens is fixed or rotating, when changing the objective lens, the sample stage needs to move the sample to the corresponding position. The sample stage moves the sample from the low-power objective lens to the corresponding position of the high-power objective lens. Due to installation deviations of the objective lenses or long-term use, the optical axes of the high-power and low-power objectives may not be perfectly parallel. Therefore, the control precision of the sample stage movement is very high. On the one hand, it is necessary to strictly control the movement position, and on the other hand, it is necessary to adapt to the manufacturing errors of each optical microscope. Therefore, if the sample stage moves only according to the theoretical distance between the optical axes of the high and low objectives, it will be difficult to move the sample into the field of view of the high magnification lens. Summary of the Invention
[0004] Therefore, it is necessary to provide an optical deviation identification method and device, a chromosome scanning device and a storage medium, namely, an optical system deviation identification method, an optical system deviation identification device, a chromosome scanning device and a storage medium.
[0005] A deviation identification method for an optical system, the optical system including a first objective lens, a second objective lens, and a camera, the camera being used to form a first field-of-view image corresponding to the first objective lens and a second field-of-view image corresponding to the second objective lens, the deviation identification method including the following steps: identifying the first field-of-view image to obtain a first reference position; identifying the second field-of-view image to obtain a second reference position; determining the target position of the second reference position in the second field-of-view image based on the first reference position; and calculating the deviation value between the second reference position and the target position.
[0006] The aforementioned deviation identification method for optical systems, by comparing the first reference position with the target position in the second field-of-view image, has several advantages. First, it helps to clearly identify the deviation value after objective lens conversion, adapting to the manufacturing errors of each optical microscope. Second, it provides accurate deviation values to ensure the sample stage accurately moves the sample, thus controlling the overlap of the observation field of view after objective lens conversion. Third, it simplifies the adjustment of the sample position after objective lens conversion, improving conversion accuracy and facilitating automated optical inspection. Fourth, it simplifies deviation identification, as the sample carrier does not move and sample inspection is not involved, facilitating rapid debugging and calibration before product delivery.
[0007] In one embodiment, calculating the deviation between the second reference position and the target position includes:
[0008] The reference pixel position and the actual pixel position of the second reference position and the target position in the second field of view image are determined respectively, and the difference in the number of pixels between the reference pixel position and the actual pixel position is obtained;
[0009] The deviation between the second reference position and the target position is calculated based on the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels.
[0010] In one embodiment, obtaining the difference in the number of pixels between the reference pixel position and the actual pixel position includes:
[0011] Obtain the difference N between the horizontal pixel count of the reference pixel position and the actual pixel position. X Difference N between vertical and vertical pixel count Y ;
[0012] The step of calculating the deviation between the second reference position and the target position based on the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels includes:
[0013] Based on the magnification M of the second objective lens, the pixel size P of the camera, and the difference in the number of horizontal pixels N.X Difference N between vertical and vertical pixel count Y Calculate the lateral deviation ΔX and longitudinal deviation ΔY between the second reference position and the target position, where the lateral deviation ΔX = (N... X ×P) / M, longitudinal deviation ΔY=(N Y ×P) / M.
[0014] In one embodiment, identifying the first field-of-view image and obtaining the first reference position includes: identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position;
[0015] The step of identifying the second field-of-view image and obtaining the second reference position includes: identifying the second field-of-view image and obtaining the second reference coordinates of the second reference position;
[0016] Determining the target position of the second reference position in the second field of view based on the first reference position includes: determining the target coordinates of the target position based on the first reference coordinates of the first reference position;
[0017] The calculation of the deviation between the second reference position and the target position includes: calculating the deviation between the second reference coordinates and the target coordinates.
[0018] In one embodiment, the first field-of-view image includes a first field-of-view image region and a first scale image region, and the step of identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position includes:
[0019] Identify the first field-of-view image region to obtain the first reference position;
[0020] Identify the first scale image area to obtain the first reference coordinates of the first reference position;
[0021] The second field-of-view image includes a second field-of-view image area and a second scale image area. The step of identifying the second field-of-view image and obtaining the second reference position includes:
[0022] Identify the second field-of-view image region to obtain the second reference position;
[0023] Identify the second ruler image area to obtain the second reference coordinates of the second reference position.
[0024] In one embodiment, determining the target location of the second reference position in the second field-of-view image based on the first reference position includes:
[0025] Obtain the theoretical distance between the first optical axis of the first objective lens and the second optical axis of the second objective lens;
[0026] The target location is determined based on the theoretical distance value and the first reference location.
[0027] In one embodiment, the magnification of the first objective lens is higher than that of the second objective lens.
[0028] In one embodiment, a chromosome scanning device includes an optical system and a sample carrier. The optical system includes a first objective lens, a second objective lens, and a camera. The optical system employs the deviation identification method described in any embodiment, and the sample carrier adjusts the sample position according to the deviation value.
[0029] In one embodiment, a deviation identification device for an optical system includes a processor and a memory, the memory storing a computer program, the processor being coupled to the memory, the processor being used to execute the computer program to implement the deviation identification method described in any embodiment.
[0030] In one embodiment, a storage medium stores a computer program that is executed by a processor to implement the deviation identification method described in any embodiment. Attached Figure Description
[0031] Figure 1 This is a flowchart illustrating one embodiment of the present application.
[0032] Figure 2 This is a flowchart illustrating another embodiment of this application.
[0033] Figure 3 This is a flowchart illustrating another embodiment of this application.
[0034] Figure 4 This is a flowchart illustrating another embodiment of this application.
[0035] Figure 5 This is a flowchart illustrating another embodiment of this application.
[0036] Figure 6 A simplified diagram illustrating the field of view image formed by the camera.
[0037] Figure 7 for Figure 6 The diagram shows a state diagram with gradations in the field of view image.
[0038] Figure 8 This is a schematic diagram showing the first field-of-view image corresponding to the high-magnification objective lens formed by the camera, with the first reference position adjusted to the center of the field-of-view image.
[0039] Figure 9 This is a schematic diagram of the first field of view image, including the first scale image area, corresponding to the high-power objective lens.
[0040] Figure 10 This is a schematic diagram of the theoretical second field of view image, including the second scale image area, corresponding to the low-power objective lens.
[0041] Figure 11 This is a schematic diagram of the actual second field of view image converted to the low-power objective lens.
[0042] Figure 12 for Figure 11 The diagram shown illustrates the state of the second field of view image, including the second scale image area.
[0043] Figure 13 This is a schematic diagram for calculating the deviation between the second reference position and the target position.
[0044] Figure 14 for Figure 13 A partially enlarged schematic diagram.
[0045] Reference numerals: Productive surface 100, graduation line 200, horizontal reference line 110, vertical reference line 120, first pixel 101, second pixel 102, first reference position 666, second reference position 888, target position 999. Detailed Implementation
[0046] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0047] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0048] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0049] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0050] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0051] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.
[0052] In one embodiment of this application, a deviation recognition method for an optical system is provided. The optical system includes a first objective lens, a second objective lens, and a camera. The camera is used to form a first field-of-view image corresponding to the first objective lens and a second field-of-view image corresponding to the second objective lens, respectively. Figure 1As shown, the deviation identification method includes the following steps: identifying the first field-of-view image and obtaining a first reference position; identifying the second field-of-view image and obtaining a second reference position; determining the target position of the second reference position in the second field-of-view image based on the first reference position; and calculating the deviation value between the second reference position and the target position. This deviation identification method for the optical system, by comparing the first reference position and the target position in the second field-of-view image, has several advantages. First, it helps to clearly define the deviation value after objective lens conversion, adapting to the manufacturing errors of each optical microscope. Second, it provides accurate deviation values to accurately coordinate the sample stage with the sample movement, thereby controlling the overlap of the observation field of view after objective lens conversion. Third, it simplifies the adjustment of the sample position after objective lens conversion, improving conversion accuracy and facilitating automated optical inspection. Fourth, it simplifies deviation identification, as the sample carrier does not move and sample inspection is not involved, facilitating rapid debugging and calibration before product delivery.
[0053] It is understood that the optical system may also include a light source and other structures. In one embodiment, the identification of the first field-of-view image is achieved by the camera of the optical system in conjunction with a first objective lens. The first objective lens, in conjunction with the camera, presents the first field-of-view image. The camera or other structures of the optical system identify the first field-of-view image and obtain a first reference position. In one embodiment, the center position of the first field-of-view image is used as the first reference position. In other embodiments, other positions of the first field-of-view image can also be used as the first reference position, as long as the relative deviation of the two objective lenses can be accurately compared. The identification of the second field-of-view image and the acquisition of the second reference position are similar and will not be described in detail.
[0054] To further address the automatic identification problem, in one embodiment, before identifying the first field-of-view image, the deviation identification method further includes the following steps: using a first objective lens to form the first field-of-view image through the camera; in one embodiment, before identifying the second field-of-view image, the deviation identification method further includes the following steps: using a second objective lens to form the second field-of-view image through the camera; in one embodiment, after obtaining the first reference position and before identifying the second field-of-view image or before forming the second field-of-view image through the camera, the deviation identification method further includes the following steps: converting the first objective lens to the second objective lens. In one embodiment, when forming the first field-of-view image or the second field-of-view image through the camera, or when identifying the first field-of-view image or the second field-of-view image, that is, during deviation identification, the object-carrying device does not move, sample detection is not involved, and an optical path conversion component is not required. After deviation identification, the moving distance of the carrying device is the sum or difference of the theoretical distance between the optical axes of the two objectives and the deviation value, thus enabling rapid debugging and calibration before product delivery. Therefore, the deviation identification method of the optical system described in each embodiment can also be called the debugging and calibration method of the optical system. In each embodiment, after calculating the deviation value between the second reference position and the target position, the optical system or its camera is calibrated according to the deviation value, or the deviation value is used as the compensation value of the optical system or its camera or related carrying device to compensate when the first objective and the second objective in the optical system are switched. In the embodiments of this application, the field of view image includes the first field of view image and the second field of view image, which have mutually independent image coordinates and mechanical coordinates. In practical applications, a camera is provided above the objective lens, and the image captured by the camera through the objective lens is the field of view image. The images captured by the camera through different objective lenses are different field of view images.
[0055] For a camera, its field of view (or field of view) is composed of many pixels, and the number of pixels is related to the camera's pixel size. In one embodiment, calculating the deviation between the second reference position and the target position includes: determining the reference pixel position and the actual pixel position of the second reference position and the target position in the second field of view image, respectively; obtaining the difference in the number of pixels between the reference pixel position and the actual pixel position; and calculating the deviation between the second reference position and the target position based on the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels. That is, since cameras exhibit a large difference in the number of pixels at different pixel sizes, it is necessary to comprehensively consider the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels to obtain the deviation between the second reference position and the target position corresponding to the current objective lens magnification and the current pixel size of the camera. Therefore, this deviation is relative and closely related to the optical system. Figure 2 As shown, the deviation recognition method includes the following steps: recognizing the first field-of-view image to obtain a first reference position; recognizing the second field-of-view image to obtain a second reference position; determining the target position of the second reference position in the second field-of-view image based on the first reference position; determining the reference pixel position and the actual pixel position of the second reference position and the target position in the second field-of-view image respectively, and obtaining the pixel number difference between the reference pixel position and the actual pixel position; calculating the deviation value between the second reference position and the target position based on the magnification of the second objective lens, the pixel size of the camera, and the pixel number difference. Other embodiments follow the same principle and will not be elaborated further. This design is beneficial for accurately determining the deviation value between the second reference position and the target position based on the pixel size of the camera and the pixels in the field-of-view image.
[0056] To accurately represent the first and second reference positions for automated control, in one embodiment, identifying the first field-of-view image and obtaining the first reference position includes: identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position; identifying the second field-of-view image and obtaining the second reference position includes: identifying the second field-of-view image and obtaining the second reference coordinates of the second reference position; determining the target position of the second reference position in the second field-of-view image based on the first reference position includes: determining the target coordinates of the target position based on the first reference coordinates of the first reference position; calculating the deviation between the second reference position and the target position includes: calculating the deviation between the second reference coordinates and the target coordinates. That is, the first reference position can be represented by the first reference coordinates, or it can be defined manually; the second reference position and the target position are similarly defined and will not be elaborated further. Figure 3As shown, the deviation identification method includes the following steps: identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position; identifying the second field-of-view image and obtaining the second reference coordinates of the second reference position; determining the target coordinates of the target position based on the first reference coordinates of the first reference position; and calculating the deviation value between the second reference coordinates and the target coordinates. Other embodiments follow the same principle and will not be elaborated further. This design facilitates accurate positioning of the first and second reference positions, digitizes the difference between them, facilitates automated computer processing, and also helps to improve switching accuracy in conjunction with the control steps in the deviation control method, thereby achieving automated optical detection.
[0057] To accurately represent the first and second reference positions, in one embodiment, the first field-of-view image includes a first field-of-view image area and a first scale image area. The step of identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position includes: identifying the first field-of-view image area to obtain the first reference position; and identifying the first scale image area to obtain the first reference coordinates of the first reference position. The second field-of-view image includes a second field-of-view image area and a second scale image area. The step of identifying the second field-of-view image and obtaining the second reference position includes: identifying the second field-of-view image area to obtain the second reference position; and identifying the second scale image area to obtain the second reference coordinates of the second reference position. Figure 4 As shown, the deviation identification method includes the following steps: identifying the first field of view image area to obtain the first reference position; identifying the first scale image area to obtain the first reference coordinates of the first reference position; identifying the second field of view image area to obtain the second reference position; identifying the second scale image area to obtain the second reference coordinates of the second reference position; determining the target coordinates of the target position based on the first reference coordinates of the first reference position; and calculating the deviation value between the second reference coordinates and the target coordinates. Other embodiments follow the same principle and are not described in detail. Further, in one embodiment, the first reference coordinates include a first horizontal reference coordinate and a first vertical reference coordinate; further, in one embodiment, the second reference coordinates include a second horizontal reference coordinate and a second vertical reference coordinate; further, in one embodiment, the target coordinates include a target horizontal coordinate and a target vertical coordinate. Further, in one embodiment, the first reference coordinates include a first horizontal reference coordinate and a first vertical reference coordinate; the second reference coordinates include a second horizontal reference coordinate and a second vertical reference coordinate; the target coordinates include a target horizontal coordinate and a target vertical coordinate. Other embodiments follow the same principle and are not described in detail. This design facilitates automatic instrument identification or manual identification and calculation, and also helps to accurately describe the specific locations of the first and second reference positions.
[0058] The optical system deviation exists because the theoretical distance between the first optical axis of the first objective lens and the second optical axis of the second objective lens has errors in practical applications. To address the impact of this error, in one embodiment, determining the target position of the second reference position in the second field of view image based on the first reference position includes: obtaining the theoretical distance between the first optical axis of the first objective lens and the second optical axis of the second objective lens; and determining the target position based on the theoretical distance value and the first reference position. The first optical axis of the first objective lens and the second optical axis of the second objective lens, as objective realities, have a theoretical distance value in their design. This theoretical distance value is a constant for a physical optical system. However, in actual manufacturing and assembly, this theoretical distance value differs slightly from the actual optical system product. This difference is the deviation value described in the embodiments of this application. No matter how precise the structure, there will inevitably be differences in design and manufacturing, and these differences will be amplified in a magnifying environment. However, the theoretical distance value can serve as a key reference indicator, providing an excellent reference indication for the target position. After all, under normal circumstances, the target position will appear near the theoretical distance value. Combined with the first reference position as another reference indicator, it is beneficial to determine the target position in the second field of view image using the second reference position, so as not to lose the target position due to changes in magnification. Figure 5 As shown, the deviation recognition method includes the following steps: recognizing the first field-of-view image to obtain a first reference position; recognizing the second field-of-view image to obtain a second reference position; obtaining the theoretical distance value between the first optical axis of the first objective lens and the second optical axis of the second objective lens; determining the target position based on the theoretical distance value and the first reference position; and calculating the deviation value between the second reference position and the target position. Other embodiments follow the same principle and will not be elaborated further. This design facilitates quickly determining the approximate range of the target position in the second field-of-view image using the second reference position, and then accurately determining the target position.
[0059] To prevent the second reference position from changing too drastically and exceeding the visible range of the field of view when switching from a low-magnification objective to a high-magnification objective, in one embodiment, the magnification of the first objective is higher than that of the second objective. This design ensures that, after identifying the first field of view and obtaining the first reference position, switching objectives, and then identifying the second field of view and obtaining the second reference position, the second reference position is essentially located within the second field of view. This helps avoid the need for manual adjustments by operators and facilitates automated detection. However, if the magnification of the second objective is higher than that of the first objective (i.e., switching from a low-magnification to a high-magnification objective), the image in the first field of view may be partially magnified into the image in the second field of view, potentially causing the second reference position to change too drastically and exceed the visible range of the field of view.
[0060] Considering the influence of the magnification of the second objective lens on the second field of view image of the camera, in one embodiment, obtaining the pixel count difference between the reference pixel position and the actual pixel position includes: obtaining the lateral pixel count difference N between the reference pixel position and the actual pixel position. X Difference N between vertical and vertical pixel count Y The step of calculating the deviation between the second reference position and the target position based on the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels includes: based on the magnification M of the second objective lens, the pixel size P of the camera, and the difference in the number of horizontal pixels N. X Difference N between vertical and vertical pixel count Y Calculate the lateral deviation ΔX and longitudinal deviation ΔY between the second reference position and the target position, where the lateral deviation ΔX = (N... X ×P) / M, longitudinal deviation ΔY=(N Y ×P) / M. The above steps are explained below with reference to the attached diagram.
[0061] The simplified view image formed by the camera is as follows: Figure 6 As shown, the productive surface 100 of the camera chip, where the intersection of the horizontal reference line 110 and the vertical reference line 120, i.e., the intersection of the dashed crosshairs, is the center of the crosshairs that the camera software can choose to display. Depending on the camera's resolution, the productive surface 100 has a large number of pixels, including first pixel 101 and second pixel 102, etc. Different resolutions correspond to different pixel sizes; therefore, when calculating the deviation between the second reference position and the target position, the pixel size corresponding to the camera's resolution needs to be considered. Figure 7As shown, the image of the scale forms graduation lines 200 on the production surface 100 to more accurately represent the specific position. In this embodiment, the unit of the numerical markings shown by the graduation lines 200 is mm, such as 4mm, 8mm, 12mm or 16mm.
[0062] Using a 100x objective lens as the first objective lens, the first field-of-view image corresponding to the high-magnification objective lens formed by the camera is as follows: Figure 8 As shown in the figure, the first reference position 666 is located at the center of the field of view image, i.e., the center of the first field of view image. In other embodiments, the first reference position 666 may also be located at other positions in the first field of view image. Using a 10x objective lens as the second objective lens, when switching from a 100x objective lens to a 10x objective lens, there is a theoretically constant distance between the first optical axis of the 100x objective lens and the second optical axis of the 10x objective lens. This theoretical distance is a constant. Assuming the theoretical distance between the first optical axis of the 100x objective lens and the second optical axis of the 10x objective lens is +32mm, then... Figure 9 As shown, the first reference position 666 corresponds to the 32mm graduation line of the graduation line 200; it can be understood that, correspondingly, the theoretical distance between the first optical axis of the 100x objective lens and the second optical axis of the 10x objective lens is -32mm.
[0063] If there is no deviation in the actual distance between the first optical axis of the 100x objective lens and the second optical axis of the 10x objective lens, then after switching from the 100x objective lens to the 10x objective lens, the second reference position 888 in the second field of view image should be as follows: Figure 10 As shown, the second reference position 888 and the target position 999 coincide, both located at the center of the graduation line 200, i.e., 0mm. However, in reality, in a magnified field of view, from design to actual product, the relative deviation between the first and second objectives is unavoidable. Therefore, when switching to a low-magnification objective, the second reference position in the second field of view image is as follows: Figure 11 As shown, it is located in the upper right position; please refer to it as well. Figure 6 and Figure 7 Since the image field of view has a uniformly distributed pixel grid, the deviation between the second reference position 999 and the target position 888 can be calculated based on the number of pixel grids between them. This deviation can be calculated using the magnification M of the second objective lens, the pixel size P of the camera, and the difference in the number of horizontal pixels N. X Difference N between vertical and vertical pixel count Y Calculate the lateral deviation ΔX and longitudinal deviation ΔY between the second reference position 888 and the target position 999. The lateral deviation ΔX = (N X ×P) / M, longitudinal deviation ΔY=(N Y ×P) / M.
[0064] For ease of calculation, such as Figure 6, Figure 12 , Figure 13 and Figure 14 As shown, the difference in the number of horizontal pixels and the difference in the number of vertical pixels can also be determined by counting or by computer automatic recognition. That is, the number of horizontal pixels corresponding to the horizontal deviation ΔX and the number of vertical pixels corresponding to the vertical deviation ΔY. Then, by combining the magnification of the second objective lens and the pixel size of the camera, the horizontal deviation ΔX and the vertical deviation ΔY can be calculated.
[0065] That is, under 100x objective lens observation, align the graduations on the scale with the camera's center line in the X and Y directions. The illustration shows alignment with the 32mm graduation line. After alignment, keep the scale stationary. The 32mm in the illustration is the theoretical distance between the optical axes of the high and low magnification lenses. Then switch to 10x objective lens observation and use the camera's measuring tool to measure the distance N in the Y direction between the 0mm graduation value and the center of the crosshairs, in pixels. Y Theoretically, when switching to a 10x objective lens, the center of the crosshairs should fall on the 0mm mark, given the distance NX in the X direction. However, in reality, there is a deviation. Since the pixel size P and magnification M are known, the deviation of the two-magnification objective lens can be calculated: ΔY = (N... Y ×P) / M,ΔX=(N X ×P) / M. After deviation identification, the moving distance of the sample carrier is the sum of the theoretical distance between the optical axes of the two objectives and the deviation value. With this design, when actually testing samples, after changing objectives, only the position of the sample to be tested needs to be finely adjusted on the sample stage according to the deviation value to achieve a precise alignment effect. Combined with an automated control structure, automated position alignment can be achieved. Furthermore, combined with an automated detection structure, such as an automatic camera instrument, automated detection can be achieved, which is particularly suitable for application in the field of conventional optical detection of biometrics.
[0066] It is understood that, in each embodiment, the deviation identification method, i.e. the deviation identification method of the optical system, can be replaced by a deviation control method or a deviation control method of the optical system.
[0067] Further, in one embodiment, the deviation identification method further includes the step of: when an objective lens change occurs, controlling the sample carrier to adjust the sample position based on the deviation values of the two objectives related to the change. Further, in one embodiment, the sample stage is used to carry the sample to be tested and adjust the position of the sample (i.e., the sample to be tested) on a plane; further, in one embodiment, the sample stage is used to adjust the position of the sample to be tested in two directions on the plane, including the X and Y directions. In this case, the sample stage can be called an XY platform or an XY carrier. For ease of control, in one embodiment, the X and Y directions are set perpendicular to each other. The sample stage can be a manual platform or an electric platform. Its XY direction movement includes the theoretical distance between the optical axes of the two objectives in the XY direction and the deviation value of the objective lens change. This deviation value can also be understood as the compensation value of the optical path change. The deviation values of the second reference position and the target position in the X and Y directions are determined through relevant steps and then input to the XY moving platform for constant compensation movement. It is understood that, in one embodiment, this deviation identification method is performed upon initial use of the optical system, upon re-use after a long period of inactivity, or before each use. In one embodiment, the objective lens switching includes selecting an objective lens using an optical path adjustment method, during which both objectives remain in their original positions. Further, in one embodiment, selecting an objective lens using an optical path adjustment method includes adjusting the optical path using a total internal reflection mirror, controlling the optical path direction to correspond to the observation direction and the optical axis of the selected objective lens, with both objectives remaining in their original positions. That is, during objective lens switching, only the optical path is adjusted; the objective lens itself remains stationary. In one embodiment, when selecting an objective lens using an optical path adjustment method, the focusing and exiting direction of the light source is also adjusted by translation to align the focusing and exiting direction with the optical axis of the selected objective lens. This design simplifies the adjustment of the sample position after objective lens switching, improves switching accuracy, and ensures that the second reference position is centered in the second field of view image after objective lens switching.
[0068] In one embodiment, a chromosome scanning device includes an optical system and a sample carrier. The optical system includes a first objective lens, a second objective lens, and a camera. The optical system employs the deviation recognition method described in any embodiment, and the sample carrier adjusts the sample position according to the deviation value. That is, the optical system is implemented using the deviation recognition method described in any embodiment. Alternatively, the chromosome scanning device is implemented using the deviation recognition method described in any embodiment. In one embodiment, the chromosome scanning device or the optical system has a functional structure for performing each step of the deviation recognition method. In one embodiment, the chromosome scanning device or the optical system includes: a first acquisition module, a second acquisition module, a determination module, and a calculation module. The first acquisition module is used to identify a first field-of-view image and acquire a first reference position; the second acquisition module is used to identify a second field-of-view image and acquire a second reference position; the determination module is used to determine the target position of the second reference position in the second field-of-view image based on the first reference position; the calculation module is used to calculate the deviation value between the second reference position and the target position; wherein the first field-of-view image is obtained by the cooperation of the first objective lens and the camera, and the second field-of-view image is obtained by the cooperation of the second objective lens and the camera. Other embodiments follow the same principle and will not be described in detail.
[0069] In one embodiment, a deviation identification device for an optical system includes a processor and a memory, the memory storing a computer program, the processor being coupled to the memory, the processor being used to execute the computer program to implement the deviation identification method described in any embodiment.
[0070] In one embodiment, a storage medium stores a computer program that is executed by a processor to implement the deviation identification method described in any embodiment. Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program may be stored in a non-volatile computer-readable storage medium, and when executed, it may include the processes of the embodiments of the methods described above. Any references to memory, storage, databases, or other media used in the embodiments provided in this application may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
[0071] It should be noted that other embodiments of this application also include an optical system deviation identification method, an optical system deviation identification device, a chromosome scanning device, and a storage medium formed by combining the technical features of the above embodiments.
[0072] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0073] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A method for identifying deviations in an optical system, the optical system comprising a first objective lens, a second objective lens, and a camera, the camera being used to generate a first field-of-view image corresponding to the first objective lens and a second field-of-view image corresponding to the second objective lens, characterized in that, The deviation identification method includes the following steps: Identify the first field-of-view image and obtain the first reference position; Identify the second field-of-view image and obtain the second reference position; The target position of the second reference position in the second field of view is determined based on the first reference position; Calculate the deviation between the second reference position and the target position; The magnification of the first objective lens is higher than that of the second objective lens; Determining the target location of the second reference position in the second field-of-view image based on the first reference position includes: Obtain the theoretical distance between the first optical axis of the first objective lens and the second optical axis of the second objective lens; The target location is determined based on the theoretical distance value and the first reference location; The objective lens conversion includes: selecting an objective lens by means of optical path adjustment, during which both objective lenses remain in their original positions; wherein, selecting an objective lens by means of optical path adjustment includes: adjusting the optical path using a total reflection mirror, controlling the optical path direction to correspond to the observation direction and the optical axis of the selected objective lens respectively, and both objective lenses remain in their original positions, and also adjusting the focusing emission direction of the light source by means of translation, so that the focusing emission direction coincides with the optical axis of the selected objective lens; Furthermore, when the camera forms the first field-of-view image or the second field-of-view image, or when it identifies the first field-of-view image or the second field-of-view image, the object carrier does not move. After the deviation is identified, the moving distance of the object carrier is the sum or difference of the theoretical distance between the optical axes of the two objectives and the deviation value.
2. The deviation identification method according to claim 1, characterized in that, The calculation of the deviation between the second reference position and the target position includes: The reference pixel position and the actual pixel position of the second reference position and the target position in the second field of view image are determined respectively, and the difference in the number of pixels between the reference pixel position and the actual pixel position is obtained; The deviation between the second reference position and the target position is calculated based on the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels.
3. The deviation identification method according to claim 2, characterized in that, The step of obtaining the difference in the number of pixels between the reference pixel position and the actual pixel position includes: Obtain the difference N between the horizontal pixel count of the reference pixel position and the actual pixel position. X Difference N between vertical and vertical pixel count Y ; The step of calculating the deviation between the second reference position and the target position based on the magnification of the second objective lens, the pixel size of the camera, and the difference in the number of pixels includes: Based on the magnification M of the second objective lens, the pixel size P of the camera, and the difference in the number of horizontal pixels N. X Difference N between vertical and vertical pixel count Y Calculate the lateral deviation ΔX and longitudinal deviation ΔY between the second reference position and the target position. The lateral deviation ΔX = (N... X ×P) / M, longitudinal deviation ΔY=(N Y ×P) / M.
4. The deviation identification method according to claim 1, characterized in that, The step of identifying the first field-of-view image and obtaining the first reference position includes: identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position; The step of identifying the second field-of-view image and obtaining the second reference position includes: identifying the second field-of-view image and obtaining the second reference coordinates of the second reference position; Determining the target position of the second reference position in the second field of view based on the first reference position includes: determining the target coordinates of the target position based on the first reference coordinates of the first reference position; The calculation of the deviation between the second reference position and the target position includes: calculating the deviation between the second reference coordinates and the target coordinates.
5. The deviation identification method according to claim 4, characterized in that, The first field-of-view image includes a first field-of-view image area and a first scale image area. The step of identifying the first field-of-view image and obtaining the first reference coordinates of the first reference position includes: Identify the first field-of-view image region to obtain the first reference position; Identify the first scale image area to obtain the first reference coordinates of the first reference position; The second field-of-view image includes a second field-of-view image area and a second scale image area. The step of identifying the second field-of-view image and obtaining the second reference position includes: Identify the second field-of-view image region to obtain the second reference position; Identify the second ruler image area to obtain the second reference coordinates of the second reference position.
6. The deviation identification method according to any one of claims 1 to 5, characterized in that, To identify the first field-of-view image and obtain the first reference position, specifically: the first field-of-view image is identified only once, and the first reference position is obtained only once; The second field-of-view image is identified, and the second reference position is obtained. Specifically, the second field-of-view image is identified only once, and the second reference position is obtained only once.
7. A chromosome scanning device, the chromosome scanning device comprising an optical system and a transport device, the optical system comprising a first objective lens, a second objective lens, and a camera, characterized in that, The optical system employs the deviation identification method as described in any one of claims 1 to 6, and the object carrier adjusts the sample position according to the deviation value.
8. A deviation identification device for an optical system, characterized in that, The device includes a processor and a memory, the memory storing a computer program, the processor being coupled to the memory, and the processor being used to execute the computer program to implement the deviation identification method as described in any one of claims 1 to 6.
9. A storage medium, characterized in that, The storage medium stores a computer program that is executed by a processor to implement the deviation identification method as described in any one of claims 1 to 6.