Display module, display module testing method and electronic device

Abstract

The embodiment of the present application discloses a display module, a test method for the display module, and an electronic device, wherein the display module comprises: a first binding area, comprising a plurality of control signal lines; a second binding area, comprising a plurality of control signal line groups, each control signal line group consisting of a plurality of control signal lines of the same type among the plurality of control signal lines, wherein the plurality of control signal lines of the same type in each control signal line group are short-circuited with each other; a first cutting path, arranged on a side of the second binding area away from the first binding area, the first cutting path being used to form a plurality of first test points corresponding to the plurality of control signal line groups; a detection device, being used to perform binding tests on the plurality of first test points respectively, and obtain a plurality of first test results corresponding to the plurality of control signal line groups. The present application designs an intermediate form that meets the module testing requirements by short-circuiting some of the same type of control signal lines in the second binding area, thereby reducing the R&D testing costs and accelerating the project development progress.

Description

Technical Field

[0001] The present application belongs to the technical field of display modules, and in particular, relates to a display module, a display module testing method, and an electronic device. Background Art

[0002] As a new generation of display technology, OLED (Organic Light-Emitting Diode) display module is an active light-emitting device. OLED display module does not require a backlight source and has the advantages of low power consumption, high color gamut, high brightness, wide viewing angle, high response speed, and low driving voltage. Therefore, it is favored by the market.

[0003] However, for large-size OLED display modules, in order to achieve independent display of each pixel unit in the display module, thousands of signal lines are required to individually control each control signal, which makes the project have a longer R&D cycle and the test stability during the project's R&D and testing process will also be reduced. Summary of the invention

[0004] The embodiments of the present application provide a display module, a display module testing method and an electronic device, which reduce R&D testing costs and speed up project development progress.

[0005] In a first aspect, an embodiment of the present application provides a display module, including:

[0006] a first binding region, the first binding region comprising a plurality of control signal lines;

[0007] A second binding area, the second binding area includes a plurality of control signal line groups, each of the control signal line groups is composed of a plurality of control signal lines of the same type among the plurality of control signal lines, wherein the plurality of control signal lines of the same type in each of the control signal line groups are short-circuited with each other;

[0008] a first cutting path, the first cutting path being arranged at a side of the second binding region away from the first binding region, the first cutting path being used to form a plurality of first test points corresponding to the plurality of control signal line groups;

[0009] A detection device is used to perform binding tests on the multiple first test points respectively to obtain multiple first test results corresponding to the multiple control signal line groups.

[0010] Optionally, the display module further includes a second cutting path, which is disposed between the first binding area and the second binding area, and is used to form a plurality of second test points corresponding to the plurality of control signal lines in the first binding area.

[0011] Optionally, the detection device is also used for:

[0012] If the plurality of first test results are all qualified results, binding tests are performed on the plurality of second test points respectively to obtain a plurality of second test results corresponding to the plurality of control signal lines.

[0013] Optionally, the detection device is also used for:

[0014] If the plurality of first test results include an unqualified result, determining a target control signal line group corresponding to the unqualified first test result;

[0015] Binding tests are performed on multiple second test points corresponding to multiple target control signal lines of the same type in the target control signal line group respectively to obtain unqualified target second test results.

[0016] Optionally, the multiple control signal lines include multiple R pixel control signal lines, multiple G pixel control signal lines, multiple B pixel control signal lines and multiple sensor control signal lines, and the driving circuits corresponding to each of the R pixel control signal lines, each of the G pixel control signal lines and each of the B pixel control signal lines include a first thin film transistor, a second thin film transistor, a third thin film transistor and a storage capacitor.

[0017] Optionally, the first thin film transistor, the second thin film transistor, and the third thin film transistor are thin film transistors of the same type.

[0018] In a second aspect, an embodiment of the present application provides a method for testing a display module, wherein the display module includes a first binding area and a second binding area, wherein the first binding area includes a plurality of control signal lines, and a second binding area, wherein the second binding area includes a plurality of control signal line groups, each of the control signal line groups being composed of a plurality of control signal lines of the same type among the plurality of control signal lines, wherein the plurality of control signal lines of the same type in each of the control signal line groups are short-circuited with each other; the method for testing the display module includes:

[0019] Cutting the second binding area away from the first binding area to obtain a first cutting path, and forming a plurality of first test points corresponding to the plurality of control signal line groups on the first cutting path;

[0020] The control detection device performs binding tests on a plurality of first test points corresponding to a plurality of control signal line groups formed by the first cutting road, respectively, to obtain a plurality of first test results corresponding to the plurality of control signal line groups.

[0021] Optionally, the display module further includes a second cutting path, the second cutting path is arranged between the first binding area and the second binding area, the second cutting path is used to form a plurality of second test points corresponding to the plurality of control signal lines in the first binding area, and the method further includes:

[0022] If the multiple first test results are all qualified results, the detection device is controlled to perform binding tests on the multiple second test points respectively to obtain multiple second test results corresponding to the multiple control signal lines.

[0023] Optionally, the method further includes:

[0024] If the plurality of first test results include an unqualified result, determining a target control signal line group corresponding to the unqualified first test result;

[0025] The detection device is controlled to perform binding tests on multiple second test points corresponding to multiple target control signal lines of the same type in the target control signal line group, respectively, to obtain unqualified target second test results.

[0026] In a third aspect, an embodiment of the present application further provides an electronic device, including:

[0027] A display module, wherein the display module is the display module as described in any one of the above items;

[0028] a memory storing a computer program;

[0029] A processor, wherein the processor executes the display module testing method as described in any one of the above items by calling the computer program stored in the memory.

[0030] The display module provided by the embodiment of the present application includes a first binding area, a second binding area, a first cutting path and a detection device, the first binding area includes a plurality of control signal lines, the second binding area includes a plurality of control signal line groups, each control signal line group is composed of a plurality of control signal lines of the same type among the plurality of control signal lines, wherein the plurality of control signal lines of the same type in each control signal line group are short-circuited with each other, the first cutting path is arranged at a side of the second binding area away from the first binding area, the first cutting path is used to form a plurality of first test points corresponding to the plurality of control signal line groups, and the detection device is used to perform binding tests on the plurality of first test points respectively, and obtain a plurality of first test results corresponding to the plurality of control signal line groups. In the process of project development and testing, the present application short-circuits some of the same type of control signal lines originally in the first binding area, and adopts a method of bundling a plurality of the same type of control signal lines in the first binding area to form a plurality of control signal line groups located in the second binding area. The binding test results of the plurality of control signal line groups can be used to judge the binding test results of the plurality of control signal lines in the first binding area, thereby designing an intermediate form that meets the module testing requirements, reducing the R&D testing costs, and accelerating the project development progress. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The technical solution and beneficial effects of the present application will be made apparent by describing in detail the specific implementation methods of the present application in conjunction with the accompanying drawings.

[0032] Figure 1 This is a first structural block diagram of the display module provided in an embodiment of the present application.

[0033] Figure 2 This is a schematic diagram of the first structure of the display module provided in the embodiment of the present application.

[0034] Figure 3 It is a structural schematic diagram of a pixel driving circuit in a display module provided in an embodiment of the present application.

[0035] Figure 4 This is a second structural schematic diagram of the display module provided in an embodiment of the present application.

[0036] Figure 5 This is a second structural block diagram of the display module provided in an embodiment of the present application.

[0037] Figure 6 It is a flowchart of a method for testing a display module provided in an embodiment of the present application.

[0038] Figure 7 It is a structural block diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0039] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0040] During the development of large-size OLED display modules, in order to achieve independent display of each pixel unit in the display module, thousands of signal lines are required to individually control each control signal, which makes the project have a longer development cycle and the test stability during the project's development and testing process will also be reduced.

[0041] In order to speed up the development progress and reduce the cost of technology development, the present application embodiment provides a display module, please refer to Figure 1 , Figure 1 1 is a first structural block diagram of a display module provided in an embodiment of the present application. The display module 100 may be an actively luminous display module, such as an OLED display module, an LED display module, etc. The display module 100 may include a first binding area 110, a second binding area 120, a first cutting path 130, and a detection device 140.

[0042] See also Figure 2 , Figure 2 1 is a schematic diagram of the first structure of the display module provided by the embodiment of the present application. The first binding area 110 may include a plurality of control signal lines, and the plurality of control signal lines may include a plurality of R pixel control signal lines, a plurality of G pixel control signal lines, a plurality of B pixel control signal lines, and a plurality of sensor control signal S lines.

[0043] like Figure 3 As shown, Figure 3 : is a schematic diagram of the structure of the pixel driving circuit in the display module provided by the embodiment of the present application. Among them, each R pixel control signal line, each G pixel control signal line and each B pixel control signal line correspond to a pixel driving circuit. The pixel driving circuit corresponding to each R pixel control signal line, each G pixel control signal line and each B pixel control signal line includes a first thin film transistor, a second thin film transistor, a third thin film transistor and a storage capacitor, and of course, may also include a light-emitting element.

[0044] Specifically, the source of the first thin film transistor T1 is electrically connected to the data signal Data, and the drain of the first thin film transistor T1 is electrically connected to the first node a; the first end of the storage capacitor Cst is electrically connected to the first node a, and the second end of the storage capacitor Cst is electrically connected to the second node b; the gate of the second thin film transistor T2 is electrically connected to the first node a, the source of the second thin film transistor T2 is electrically connected to the power control signal VDD, and the drain of the second thin film transistor T2 is electrically connected to the second node b; the cathode end of the light emitting element D is electrically connected to the second node b, and the anode end of the light emitting element D is electrically connected to the ground terminal VSS; the gate of the third thin film transistor T3 is electrically connected to the control signal RD, which can be provided by an external timing device, the source of the third thin film transistor T3 is electrically connected to the sensor control signal Sense, and the drain of the third thin film transistor T3 is electrically connected to the second node b. It should be noted that the sensor control signal can be used to detect the actual current of the pixel driving circuit, and compare the actual current with the preset current to generate a compensation voltage of the pixel driving circuit, thereby providing brightness compensation to the pixel unit through the sensor control signal Sense.

[0045] Wherein, the first thin film transistor T1 may be a switch thin film transistor, the second thin film transistor T2 may be a driving thin film transistor, and the third thin film transistor T3 may be a compensation thin film transistor. The first thin film transistor T1, the second thin film transistor T2 and the third thin film transistor T3 are thin film transistors of the same type, such as the first thin film transistor T1, the second thin film transistor T2 and the third thin film transistor T3 are all N-type thin film transistors, that is, the first thin film transistor T1, the second thin film transistor T2 and the third thin film transistor T3 can all be turned on at a low level; or the first thin film transistor T1, the second thin film transistor T2 and the third thin film transistor T3 are all P-type thin film transistors, that is, the first thin film transistor T1, the second thin film transistor T2 and the third thin film transistor T3 can all be turned on at a high level. By setting the thin film transistors in the pixel driving circuit to the same type of thin film transistors, the differences between different types of thin film transistors can be avoided from affecting the pixel driving circuit.

[0046] The number of R pixel control signal lines, G pixel control signal lines, B pixel control signal lines and sensor control signal lines S included in the multiple control signal lines in the first binding area 110 is related to the size of the divided first binding area 110. In order to meet the brightness and color requirements of each pixel unit, at least four control signal lines, namely R pixel control signal lines, G pixel control signal lines, B pixel control signal lines and sensor control signal lines S, are required. The number of the multiple control signal lines in the first binding area 110 can be an integer multiple of the adjacent R pixel control signal lines, G pixel control signal lines, B pixel control signal lines and sensor control signal lines S, such as 40 R pixel control signal lines, 40 G pixel control signal lines, 40 B pixel control signal lines and 40 sensor control signal lines S, etc. The specific number of the multiple control signal lines can be divided into the first binding area 110 of response size according to the actual needs in the test process, and is not specifically limited here.

[0047] It should be noted that in the display of large-size OLED display modules, each pixel unit needs to have R sub-pixels, G sub-pixels and B sub-pixels for displaying different colors and brightness, so at least three signal lines are required to control the three sub-pixels respectively, that is, the R sub-pixel is controlled by the R pixel control signal line, the G sub-pixel is controlled by the G pixel control signal line, and the B sub-pixel is controlled by the B pixel control signal line. In the 3T1C pixel driving circuit, in addition to the above three signal lines, a power control signal line and a sensor control signal line are also required, wherein the power control signal line can provide current to the pixel unit through the power control signal, and the sensor control signal line can provide brightness compensation to the pixel unit through the sensor control signal, that is, each pixel unit includes at least five signal lines.

[0048] During the R&D and testing process of the project, the early testing process does not require independent control of each pixel unit to implement module testing. In order to reduce the testing cycle, the display module 100 in the embodiment of the present application also includes a second binding area 120 .

[0049] See also Figure 4 , Figure 4: is a second structural schematic diagram of the display module provided in an embodiment of the present application. The second binding area 120 may include a plurality of control signal line groups, each control signal line group being composed of a plurality of control signal lines of the same type among the plurality of control signal lines in the first binding area 110. Specifically, if the first binding area 110 includes 40 R pixel control signal lines, 40 G pixel control signal lines, 40 B pixel control signal lines, and 40 sensor control signal lines S, the 40 R pixel control signal lines may be combined into one control signal line group in the second binding area 120, the 40 G pixel control signal lines may be combined into one control signal line group in the second binding area 120, the 40 B pixel control signal lines may be combined into one control signal line group in the second binding area 120, and the 40 sensor control signal lines S may be combined into one control signal line group in the second binding area 120.

[0050] Among them, multiple control signal lines of the same type in each control signal line group are short-circuited with each other, for example, 40 adjacent R pixel control signal lines are short-circuited with each other, 40 adjacent G pixel control signal lines are short-circuited with each other, 40 adjacent B pixel control signal lines are short-circuited with each other, and 40 adjacent sensor control signal lines S are short-circuited with each other.

[0051] It should be noted that if the first binding area 110 includes 80 R pixel control signal lines, 80 G pixel control signal lines, 80 B pixel control signal lines and 80 sensor control signal lines S, 40 R pixel control signal lines, 40 G pixel control signal lines, 40 B pixel control signal lines and 40 sensor control signal lines S can be respectively formed into 4 control signal line groups in the second binding area 120, and the other 40 R pixel control signal lines, 40 G pixel control signal lines, 40 B pixel control signal lines and 40 sensor control signal lines S can be further formed into 4 control signal line groups, for a total of 8 signal control line groups. That is, when the number of control signal lines of the same type included in the first binding area 120 is large, in order to improve the detection accuracy, the control signal lines of the same type can be divided into multiple control signal line groups for separate testing.

[0052] The first cutting lane 130 may be disposed on a side of the second binding region 120 away from the first binding region 110 , and a plurality of first test points 51 corresponding to a plurality of control signal line groups may be formed by cutting.

[0053] The detection device 140 can perform binding tests on multiple first test points 51 formed by the first cutting road 130 respectively, and obtain multiple first test results corresponding to multiple control signal line groups in the second binding area 120. By short-circuiting some of the same type of control signal lines in the display module 100, an intermediate form that meets the test requirements can be designed. That is, in the early stage of research and development testing, there is no need to control each pixel unit individually, and multiple pixel units of the same type can be bound and tested, thereby speeding up the research and development progress. While improving the test stability, it can respond to reduce the research and development costs.

[0054] In addition, an intermediate form that meets the module test requirements is designed by short-circuiting some control signal lines of the same type in the second binding area 120, and multiple first test results are obtained. If a single pixel unit needs to be individually controlled in the subsequent R&D test process, further testing can be performed based on multiple first test results.

[0055] See also Figure 5 , Figure 5 is a second structural block diagram of a display module provided in an embodiment of the present application. Figure 1 Based on the display module 100 shown, the display module 100 may further include a second cutting path 150. The second cutting path 150 may be arranged between the first binding area 110 and the second binding area 120. A plurality of second test points 52 corresponding to a plurality of control signal lines in the first binding area 110 are formed by cutting. The number of the second test points 52 is the same as the number of the control signal lines in the first binding area 110, thereby realizing a separate control test of a single pixel unit.

[0056] Specifically, if all of the multiple first test results detected by the detection device 140 are qualified results, it means that the binding test on the second binding area 120 has met the early requirements of the R&D test. In order to meet the later requirements, the detection device 140 can be used to perform binding tests on the multiple second test points 52 located in the second cutting road 150, respectively, to obtain multiple second test results corresponding to the multiple control signal lines in the first binding area 110. The qualified rate of the multiple control signal lines can be determined through the multiple second test results, and based on the separate control of the multiple control signal lines, when unqualified results occur, the unqualified second test results can be quickly determined, thereby determining the faulty control signal line, so as to facilitate replacement and repair by R&D personnel, so as to achieve good screen control of the display module 100.

[0057] If the multiple first test results detected by the detection device 140 include unqualified results, the target control signal line group corresponding to the unqualified first test results is determined, and the multiple second test points 52 corresponding to the multiple target control signal lines of the same type in the target control signal line group are respectively subjected to binding tests to obtain unqualified target second test results, thereby determining the control signal line with the fault. It should be noted that when unqualified results appear in the multiple first test results, the R&D personnel can perform binding tests on the multiple target control signal lines of the same type in the target control signal line group with the fault in the early stage, or mark the target control signal line group in the early stage, and then perform binding tests on the multiple target control signal lines of the same type contained therein in the later R&D test. The specific test process can be specifically set according to the project R&D requirements and actual conditions, and is not specifically limited here.

[0058] As can be seen from the above, the display module 100 in this embodiment includes a first binding area 110, a second binding area 120, a first cutting path 130 and a detection device 140. The first binding area 110 includes multiple control signal lines, the second binding area 120 includes multiple control signal line groups, each control signal line group is composed of multiple control signal lines of the same type among multiple control signal lines, wherein the multiple control signal lines of the same type in each control signal line group are short-circuited with each other, the first cutting path 130 is arranged on the side of the second binding area 120 away from the first binding area 110, the first cutting path 130 is used to form multiple first test points 51 corresponding to the multiple control signal line groups, and the detection device 140 is used to perform binding tests on the multiple first test points 51 respectively to obtain multiple first test results corresponding to the multiple control signal line groups. During the project development and testing process, some of the same type of control signal lines originally in the first binding area 110 are short-circuited with each other, and multiple control signal lines of the same type in the first binding area 110 are bundled to form a plurality of control signal line groups located in the second binding area 120. The binding test results of the multiple control signal line groups can be used to determine the binding test results of the multiple control signal lines in the first binding area 110, thereby designing an intermediate form that meets the module testing requirements, reducing R&D testing costs, and accelerating project development progress.

[0059] In addition, by setting up the second cutting road 150, on the premise that the multiple first test results corresponding to the second binding area 120 meet the early test requirements, in the later R&D test process, the multiple control signal lines in the first binding area 110 can be individually controlled, thereby ensuring that the display module 100 can meet the test requirements throughout the entire R&D cycle, saving R&D costs in the early testing, and improving the R&D progress of the entire project.

[0060] The present application also provides a method for testing a display module. Figure 6 , Figure 6 1 is a flow chart of a method for testing a display module provided in an embodiment of the present application. The processor may execute the method for testing the display module by calling a computer program stored in a memory. The method for testing the display module may include the following steps:

[0061] 101 , cutting a side of the second binding area away from the first binding area to obtain a first cutting path, and forming a plurality of first test points corresponding to a plurality of control signal line groups on the first cutting path.

[0062] In this embodiment, the display module can be an actively luminous display module, such as an OLED display module, an LED display module, etc. The display module may include a first binding area, a second binding area, a first cutting path, and a detection device. The first binding area may include a plurality of control signal lines, and the plurality of control signal lines may include a plurality of R pixel control signal lines, a plurality of G pixel control signal lines, a plurality of B pixel control signal lines, and a plurality of sensor control signal lines S. Among them, each R pixel control signal line, each G pixel control signal line, and each B pixel control signal line has a pixel driving circuit. Each R pixel control signal line, each G pixel control signal line, and each B pixel control signal line include a first thin film transistor, a second thin film transistor, a third thin film transistor, and a storage capacitor, and of course, may also include a light-emitting element.

[0063] The number of R pixel control signal lines, G pixel control signal lines, B pixel control signal lines and sensor control signal lines S included in the multiple control signal lines in the first binding area is related to the size of the divided first binding area. In order to meet the brightness and color requirements of each pixel unit, at least four control signal lines, namely R pixel control signal lines, G pixel control signal lines, B pixel control signal lines and sensor control signal lines S, are required. The number of multiple control signal lines in the first binding area can be an integer multiple of the adjacent R pixel control signal lines, G pixel control signal lines, B pixel control signal lines and sensor control signal lines S, such as 40 R pixel control signal lines, 40 G pixel control signal lines, 40 B pixel control signal lines and 40 sensor control signal lines S, etc. The specific number of the multiple control signal lines can be divided into the first binding area of ​​response size according to the actual needs in the test process, and is not specifically limited here.

[0064] The second binding area may include a plurality of control signal line groups, each control signal line group being composed of a plurality of control signal lines of the same type among the plurality of control signal lines in the first binding area. Specifically, if the first binding area 110 includes 40 R pixel control signal lines, 40 G pixel control signal lines, 40 B pixel control signal lines, and 40 sensor control signal lines S, the 40 R pixel control signal lines may be composed of one control signal line group in the second binding area, the 40 G pixel control signal lines may be composed of one control signal line group in the second binding area, the 40 B pixel control signal lines may be composed of one control signal line group in the second binding area, and the 40 sensor control signal lines S may be composed of one control signal line group in the second binding area.

[0065] Among them, multiple control signal lines of the same type in each control signal line group are short-circuited with each other, for example, 40 adjacent R pixel control signal lines are short-circuited with each other, 40 adjacent G pixel control signal lines are short-circuited with each other, 40 adjacent B pixel control signal lines are short-circuited with each other, and 40 adjacent sensor control signal lines S are short-circuited with each other.

[0066] The first cutting path may be arranged at a side of the second binding region away from the first binding region, and a plurality of first test points corresponding to a plurality of control signal line groups may be formed by cutting.

[0067] 102 , a control detection device performs binding tests on a plurality of first test points corresponding to a plurality of control signal line groups formed by the first cutting path, respectively, to obtain a plurality of first test results corresponding to the plurality of control signal line groups.

[0068] The control detection device performs binding tests on multiple first test points formed by the first cutting path, and obtains multiple first test results corresponding to multiple control signal line groups in the second binding area. By short-circuiting some of the same type of control signal lines in the display module, an intermediate form that meets the test requirements can be designed. That is, in the early stage of research and development testing, there is no need to control each pixel unit individually, and multiple pixel units of the same type can be bound and tested, thereby speeding up the research and development progress. While improving the test stability, it can respond to reduce the research and development costs.

[0069] In addition, by short-circuiting some control signal lines of the same type in the second binding area, an intermediate form that meets the module test requirements is designed to obtain multiple first test results. If a single pixel unit needs to be individually controlled in the subsequent R&D test process, further testing can be performed based on multiple first test results.

[0070] The display module may further include a second cutting path, which may be arranged between the first binding area and the second binding area, and a plurality of second test points corresponding to the plurality of control signal lines in the first binding area may be formed by cutting, wherein the number of the second test points is the same as the number of the control signal lines in the first binding area, thereby realizing a separate control test of a single pixel unit.

[0071] Specifically, if all of the multiple first test results detected by the detection device are qualified results, it means that the early requirements of the R&D test have been met through the binding test of the second binding area. In order to meet the later requirements, the detection device can be used to perform binding tests on the multiple second test points located in the second cutting path, and obtain multiple second test results corresponding to the multiple control signal lines in the first binding area. The qualified rate of the multiple control signal lines can be determined through the multiple second test results, and based on the separate control of the multiple control signal lines, when unqualified results occur, the unqualified second test results can be quickly determined, thereby determining the faulty control signal line, so that the R&D personnel can replace and repair it, so as to achieve the screen control of the display module in a good form.

[0072] If the multiple first test results detected by the detection device include unqualified results, the target control signal line group corresponding to the unqualified first test results is determined, and the multiple second test points corresponding to the multiple target control signal lines of the same type in the target control signal line group are respectively subjected to binding tests to obtain unqualified target second test results, thereby determining the control signal line with the fault. It should be noted that when unqualified results appear in the multiple first test results, the R&D personnel can perform binding tests on the multiple target control signal lines of the same type in the target control signal line group with the fault in the early stage, or mark the target control signal line group in the early stage, and then perform binding tests on the multiple target control signal lines of the same type contained therein in the later R&D test. The specific test process can be set according to the project R&D needs and actual conditions, and is not specifically limited here.

[0073] As can be seen from the above, in this embodiment, the first cutting path is obtained by cutting the side of the second binding area away from the first binding area, and multiple first test points corresponding to multiple control signal line groups are formed on the first cutting path. The control detection device performs binding tests on the multiple first test points corresponding to the multiple control signal line groups formed by the first cutting path, respectively, to obtain multiple first test results corresponding to the multiple control signal line groups. By short-circuiting some of the same type of control signal lines in the second binding area, an intermediate form that meets the module testing requirements is designed, reducing R&D testing costs and accelerating project development progress.

[0074] In addition, by setting up a second cutting lane, on the premise that the multiple first test results corresponding to the second binding area meet the early test requirements, in the later R&D test process, the multiple control signal lines in the first binding area can be individually controlled, thereby ensuring that the display module can meet the test requirements throughout the entire R&D cycle, saving R&D costs in the early testing, and improving the R&D progress of the entire project.

[0075] The present application also provides an electronic device. Figure 7 , Figure 7 1 is a block diagram of the structure of an electronic device provided in an embodiment of the present application. The electronic device 200 may include a display module 100, a processor 210 having one or more processing cores, a memory 220 having one or more computer-readable storage media, and a computer program stored in the memory 220 and executable on the processor 210. The processor 210 is electrically connected to the memory 220. It will be understood by those skilled in the art that the electronic device structure shown in the figure does not constitute a limitation on the electronic device, and may include more or fewer components than shown, or combine certain components, or arrange components differently.

[0076] The processor 210 is the control center of the electronic device 200. It uses various interfaces and lines to connect various parts of the entire electronic device 200, executes various functions of the electronic device 200 and processes data by running or loading software programs and / or modules stored in the memory 220, and calling data stored in the memory 220, thereby monitoring the electronic device 200 as a whole.

[0077] In the embodiment of the present application, the processor 210 in the electronic device 200 will load instructions corresponding to the processes of one or more application programs into the memory 220 according to the following steps, and the processor 210 will run the application programs stored in the memory 220 to implement various functions:

[0078] Cutting the second binding area away from the first binding area to obtain a first cutting path, and forming a plurality of first test points corresponding to a plurality of control signal line groups on the first cutting path;

[0079] The control detection device performs binding tests on a plurality of first test points corresponding to a plurality of control signal line groups formed by the first cutting path, respectively, to obtain a plurality of first test results corresponding to the plurality of control signal line groups.

[0080] The specific implementation of the above operations can be found in the previous embodiments, which will not be described in detail here.

[0081] A person of ordinary skill in the art will appreciate that all or part of the steps in the various methods of the above embodiments may be completed by instructions, or by controlling related hardware through instructions. The instructions may be stored in a computer-readable storage medium and loaded and executed by a processor.

[0082] To this end, an embodiment of the present application provides a computer-readable storage medium, in which multiple computer programs are stored. The computer programs can be loaded by a processor to execute the steps in any display device control method provided in the embodiment of the present application.

[0083] The storage medium may include: a read-only memory (ROM), a random access memory (RAM), a magnetic disk, an optical disk, or other media that can store program codes.

[0084] Since the computer program stored in the storage medium can execute the steps in any one of the display module testing methods provided in the embodiments of the present application, the beneficial effects that can be achieved by any one of the display module testing methods provided in the embodiments of the present application can be achieved. Please refer to the previous embodiments for details and will not be repeated here.

[0085] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0086] The display module, the testing method of the display module and the electronic device provided in the embodiments of the present application are introduced in detail above. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A display module, characterized in that: include: a first binding region, the first binding region comprising a plurality of control signal lines; A second binding area, the second binding area includes a plurality of control signal line groups, each of the control signal line groups is composed of a plurality of control signal lines of the same type among the plurality of control signal lines, wherein the plurality of control signal lines of the same type in each of the control signal line groups are short-circuited with each other; a first cutting path, the first cutting path being arranged at a side of the second binding region away from the first binding region, the first cutting path being used to form a plurality of first test points corresponding to the plurality of control signal line groups; a second cutting path, arranged between the first binding area and the second binding area, the second cutting path being used to form a plurality of second test points corresponding to the plurality of control signal lines in the first binding area, the number of the second test points being the same as the number of the control signal lines in the first binding area, so as to realize a separate control test of a single pixel unit; A detection device, the detection device is used to perform binding tests on the multiple first test points respectively to obtain multiple first test results corresponding to the multiple control signal line groups, and the detection device is also used to: If the plurality of first test results are all qualified results, performing binding tests on the plurality of second test points respectively to obtain a plurality of second test results corresponding to the plurality of control signal lines; If the multiple first test results include unqualified results, determine the target control signal line group corresponding to the unqualified first test results; perform binding tests on multiple second test points corresponding to multiple target control signal lines of the same type in the target control signal line group, and obtain unqualified target second test results.

2. The display module according to claim 1, characterized in that: The multiple control signal lines include multiple R pixel control signal lines, multiple G pixel control signal lines, multiple B pixel control signal lines and multiple sensor control signal lines, and the driving circuits corresponding to each of the R pixel control signal lines, each of the G pixel control signal lines and each of the B pixel control signal lines include a first thin film transistor, a second thin film transistor, a third thin film transistor and a storage capacitor.

3. The display module according to claim 2, characterized in that: The first thin film transistor, the second thin film transistor and the third thin film transistor are thin film transistors of the same type.

4. A method for testing a display module, for testing a display module as claimed in any one of claims 1 to 3, characterized in that: The display module includes a first binding area and a second binding area, the first binding area includes a plurality of control signal lines, and a second binding area, the second binding area includes a plurality of control signal line groups, each of the control signal line groups is composed of a plurality of control signal lines of the same type among the plurality of control signal lines, wherein the plurality of control signal lines of the same type in each of the control signal line groups are short-circuited with each other; the test method of the display module includes: Cutting the second binding area away from the first binding area to obtain a first cutting path, and forming a plurality of first test points corresponding to the plurality of control signal line groups on the first cutting path; The control detection device performs binding tests on a plurality of first test points corresponding to a plurality of control signal line groups formed by the first cutting road, respectively, to obtain a plurality of first test results corresponding to the plurality of control signal line groups.

5. The display module testing method according to claim 4, characterized in that: The display module further includes a second cutting path, the second cutting path is arranged between the first binding area and the second binding area, the second cutting path is used to form a plurality of second test points corresponding to the plurality of control signal lines in the first binding area, and the method further includes: If the multiple first test results are all qualified results, the detection device is controlled to perform binding tests on the multiple second test points respectively to obtain multiple second test results corresponding to the multiple control signal lines.

6. The display module testing method according to claim 4, characterized in that: The method further comprises: If the plurality of first test results include an unqualified result, determining a target control signal line group corresponding to the unqualified first test result; The detection device is controlled to perform binding tests on multiple second test points corresponding to multiple target control signal lines of the same type in the target control signal line group, respectively, to obtain unqualified target second test results.

7. An electronic device, characterized in that: include: A display module, wherein the display module is the display module according to any one of claims 1 to 3; a memory storing a computer program; A processor, wherein the processor executes the display module testing method according to any one of claims 4 to 6 by calling the computer program stored in the memory.

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