Circuit Measuring Device and Method

Abstract

The present invention discloses a circuit measurement device and method. A final measurement station provides a voltage source to supply a shared voltage, such that a calibration current with a default current value flows from a current-voltage converter to the final measurement station. The current-voltage converter converts the calibration current into a calibration voltage for output, and at this time, a voltage sensing component senses the cross voltage between the input end and the output end of the current-voltage converter to output calibration sensing data. The current-voltage converter converts the measurement current output by the circuit under test into a measurement voltage, and at this time, the voltage sensing component senses the cross voltage between the input end and the output end of the current-voltage converter to output actual sensing data. When the final measurement station determines that the difference between the calibration sensing data and the actual sensing data is greater than a threshold value, it adjusts the circuit under test.

Description

Technical Field

[0001] The present invention relates to a circuit, and more particularly to a circuit measuring device and method for measuring light emitting diodes (LEDs) applicable to measurement display devices. Background Art

[0002] With the continuous progress of technology, the backlight technology of liquid crystal display devices has been continuously developed. Due to the excellent performance and lifespan of LEDs, LEDs have been widely used in various fields and even provided as the backlight of display devices. However, during the terminal test of display devices, due to factors such as insufficient input power of traditional measuring devices, the measuring time required is very long, and there are errors in the measuring devices that have not been improved. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a circuit measuring device for the deficiencies of the prior art, including a final measuring station and at least one current sensing circuit. The current sensing circuit includes a current-voltage converter and a voltage sensing component. The final measuring station is connected to the current sensing circuit. The final measuring station is configured to be connected to the current source in a calibration mode and to the circuit under test in a measurement mode. In the calibration mode and the measurement mode, the final measuring station is connected to a voltage source to receive a shared voltage, so that in the calibration mode, a calibration current with a default current value flows from the current-voltage converter to the final measuring station as the output current of the current source. The current-voltage converter converts the calibration current into a calibration voltage for output. In the measurement mode, the current-voltage converter receives a measurement current from the circuit under test and converts the measurement current into a measurement voltage for output. The voltage sensing component is connected to the current-voltage converter. The voltage sensing component is configured to sense the voltage across between the input terminal and the output terminal of the current-voltage converter in the calibration mode to output a calibration sensing data, and to sense the voltage across between the input terminal and the output terminal of the current-voltage converter in the measurement mode to output an actual sensing data. In the measurement mode, the final measuring station is configured to calculate a difference between the calibration sensing data and the actual sensing data, and when it is determined that the difference is greater than a difference threshold, output an adjustment signal to instruct the circuit under test to adjust the output measurement current.

[0004] In one embodiment, the number of at least one current sensing circuit is multiple, and each of the multiple current sensing circuits includes a current-voltage converter and includes a voltage sensing component. In the measurement mode, the multiple current-voltage converters are configured to respectively convert multiple measurement currents output by the circuit under test into multiple measurement voltages for output.

[0005] In one embodiment, the final measurement machine provides a switching circuit. The switching circuit is connected to the current sensing circuit. The switching circuit is configured to sequentially switch a plurality of current sensing circuits to be connected to the final measurement machine in a calibration mode, so that a plurality of calibration currents respectively output by the plurality of current sensing circuits flow to the final measurement machine at different time points.

[0006] In one embodiment, the switching circuit includes a multiplexer.

[0007] In one embodiment, the calibration current output by the current-voltage converter includes a first calibration current and a second calibration current. When the current-voltage converter converts the first calibration current into a first calibration voltage and outputs it, the voltage sensing component generates a first calibration sensing data output based on the sensed cross voltage. When the current-voltage converter converts the second calibration current into a second calibration voltage and outputs it, the voltage sensing component generates a second calibration sensing data output based on the sensed cross voltage. In the calibration mode, the final measurement machine is configured to generate a calibration equation based on the first calibration current, the first calibration sensing data, the second calibration current, and the second calibration sensing data, and calculate the calibration sensing data when the current sensing circuit receives the calibration current with the target current value according to the calibration equation. In the measurement mode, the final measurement machine is configured to compare the calibration sensing data with the actual sensing data to determine whether the circuit under test outputs a measurement current with the target current value.

[0008] In one embodiment, the calibration equation is expressed as: DX = α × IX + β, where DX represents the calibration sensing data, IX represents the calibration current with the target current value, α represents the gain, and β represents the offset value.

[0009] In one embodiment, the final measurement machine is configured to generate a first sensing calibration equation based on the first calibration current and the first calibration sensing data, generate a second sensing calibration equation based on the second calibration current and the second calibration sensing data, and generate a calibration equation after operating on the first sensing calibration equation and the second sensing calibration equation.

[0010] In one embodiment, the first sensing calibration equation is expressed as: D0 = α × I0 + β, where D0, α, and β respectively represent the first calibration sensing data, the gain, and the offset value when the current-voltage converter outputs the first calibration current. The second sensing calibration equation is expressed as: D1 = α × I1 + β, where D1, α, and β respectively represent the second calibration sensing data, the gain, and the offset value when the current-voltage converter outputs the second calibration current. The calibration equation is expressed as: DX = α × IX + β, where DX represents the calibration sensing data, IX represents the calibration current with the target current value, α represents the gain, and β represents the offset value.

[0011] In addition, the present invention provides a circuit measurement method, comprising the following steps: in a calibration mode, supplying a shared voltage; in the calibration mode, supplying a calibration current with a default current value; in the calibration mode, converting the calibration current into a calibration voltage; in the calibration mode, sensing the calibration voltage to output calibration sensing data; in a measurement mode, supplying the shared voltage; in the measurement mode, converting a measurement current received from a circuit under test into a measurement voltage; in the measurement mode, sensing the measurement voltage to output actual sensing data; in the measurement mode, calculating a difference between the calibration sensing data and the actual sensing data; and determining whether the difference is greater than a difference threshold, if so, outputting an adjustment signal to indicate adjusting the measurement current output by the circuit under test, if not, outputting a test end signal.

[0012] In one embodiment, the circuit measurement method further comprises the following steps: in the measurement mode, respectively converting a plurality of sub-measurement currents output by the circuit under test into a plurality of sub-measurement voltages for output; and in the measurement mode, respectively sensing the plurality of sub-measurement voltages to respectively output corresponding plurality of actual sensing data.

[0013] In one embodiment, the circuit measurement method further comprises the following steps: in the calibration mode, receiving the shared voltage to output a first calibration current; in the calibration mode, converting the first calibration current into a first calibration voltage for output; in the calibration mode, sensing the first calibration voltage to output a first calibration sensing data for output; in the calibration mode, receiving the shared voltage to output a second calibration current; in the calibration mode, converting the second calibration current into a second calibration voltage for output; in the calibration mode, sensing the second calibration voltage to output second calibration sensing data; in the calibration mode, generating a calibration equation based on the first calibration current, the first calibration sensing data, the second calibration current, and the second calibration sensing data; in the calibration mode, calculating, according to the calibration equation, the calibration sensing data when the current sensing circuit receives a calibration current with a target current value; in the measurement mode, comparing the calibration sensing data with the actual sensing data to determine whether the circuit under test outputs a measurement current with a target current value, if so, outputting a test end signal, if not, outputting an adjustment signal.

[0014] In one embodiment, the circuit measurement method further comprises the following steps: in the calibration mode, generating a calibration equation based on the first calibration current, the first calibration sensing data, the second calibration current, and the second calibration sensing data, expressed as: DX = α × IX + β, where DX represents the calibration sensing data, IX represents the calibration current with a target current value, α represents the gain, and β represents the offset value.

[0015] In one embodiment, the circuit measurement method further comprises the following steps: generating a first sensing correction equation based on a first calibration current and first calibrated sensing data; generating a second sensing correction equation based on a second calibration current and second calibrated sensing data; and generating a correction equation by operating on the first sensing correction equation and the second sensing correction equation.

[0016] In one embodiment, the circuit measurement method further comprises the following steps: generating a first sensing correction equation based on a first calibration current and first calibrated sensing data, expressed as: D0 = α × IO + β, where D0, α, and β respectively represent the first calibrated sensing data, gain, and offset value when the first calibration current is output; generating a second sensing correction equation based on a second calibration current and second calibrated sensing data, expressed as: D1 = α × I1 + β, where D1, α, and β respectively represent the second calibrated sensing data, gain, and offset value when the second calibration current is output; and generating a correction equation by operating on the first sensing correction equation and the second sensing correction equation, expressed as: DX = α × IX + β, where DX represents the calibrated sensing data, IX represents the calibration current with a target current value, α represents the gain, and β represents the offset value.

[0017] As described above, the present invention provides a circuit measurement device and method, which have the following advantages:

[0018] 1. Using multiple current sensing circuits to simultaneously measure a circuit under test, thereby effectively reducing the measurement time.

[0019] 2. Using the configuration of multiple current sensing circuits to reduce the hardware requirements of the final test machine (FT machine), for example, there is no need to set up a large number of voltage sources and current sources.

[0020] 3. Accurately determining whether the output current of the circuit under test meets the target value, and adjusting the circuit under test when it does not meet the target value.

[0021] To further understand the features and technical content of the present invention, please refer to the following detailed description and drawings of the present invention. However, the provided drawings are only for reference and illustration, and are not used to limit the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a circuit component configuration diagram of the circuit measurement device in the calibration mode according to the first embodiment of the present invention.

[0023] Figure 2 It is a circuit component configuration diagram of the circuit measurement device in the measurement mode according to the first embodiment of the present invention.

[0024] Figure 3Circuit component configuration diagram of the circuit measurement device according to the second embodiment of the present invention in the calibration mode.

[0025] Figure 4 Circuit component configuration diagram of the circuit measurement device according to the second embodiment of the present invention in the measurement mode.

[0026] Figure 5 Circuit component configuration diagram of the circuit measurement device according to the third embodiment of the present invention in the calibration mode.

[0027] Figure 6 Circuit component configuration diagram of the circuit measurement device according to the third embodiment of the present invention in the measurement mode.

[0028] Figure 7 Flowchart of the calibration procedure of the circuit measurement method according to the fourth embodiment of the present invention.

[0029] Figure 8 Flowchart of the measurement procedure of the circuit measurement method according to the fourth embodiment of the present invention. Detailed implementation manners

[0030] The following are specific embodiments to illustrate the implementation manners of the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. Additionally, the drawings of the present invention are only for simple schematic illustration and are not drawn according to actual dimensions, which is hereby stated in advance. The following implementation manners will further detail the related technical content of the present invention, but the disclosed content is not used to limit the protection scope of the present invention. In addition, the term "or" used herein should, depending on the actual situation, possibly include any one or a combination of more of the associated listed items.

[0031] [First Embodiment]

[0032] Please refer to Figure 1 and Figure 2 , wherein Figure 1 is the circuit component configuration diagram of the circuit measurement device according to the first embodiment of the present invention in the calibration mode; Figure 2 is the circuit component configuration diagram of the circuit measurement device according to the first embodiment of the present invention in the measurement mode.

[0033] As Figure 1 and Figure 2As shown, the circuit measurement device according to an embodiment of the present invention may include a final test machine (Final test machine, or simply referred to as FTM) FTM and a current sensing circuit CSU1. The current sensing circuit CSU1 may include a current-voltage converter CV1 and a voltage sensing component VS1.

[0034] Since the data sensed by any voltage sensing component in the market, such as the voltage sensing component VS1, may have an error from the actual data. Therefore, the circuit measurement device needs to execute a calibration program.

[0035] As Figure 1 shown, in the calibration mode, the final test machine FTM provides a voltage source VDC. This voltage source VDC is connected to the first node NE1 of the current sensing circuit CSU1. The input terminal of the current-voltage converter CV1 is connected to the first node NE1 of the current sensing circuit CSU1 to be connected to the voltage source VDC through the first node NE1.

[0036] In the calibration mode, the output terminal of the current-voltage converter CV1 is connected to the second node NE2 of the current sensing circuit CSU1 to be connected to the current source IDC provided by the final measurement machine FTM through the second node NE2 of the current sensing circuit CSU1. The final measurement machine FTM supplies a shared voltage to the current-voltage converter CV1 of the current sensing circuit CSU1 through the voltage source VDC, so that a calibration current IDC1 with a preset current value flows from the current-voltage converter CV1 of the current sensing circuit CSU1 to the final measurement machine FTM.

[0037] In the calibration mode, the voltage sensing component VS1 is connected to the input terminal and the output terminal of the current-voltage converter CV1. The output terminal of the voltage sensing component VS1 is connected to the third node NE3 of the current sensing circuit CSU1 to be connected to the final measurement machine FTM through the third node NE3.

[0038] In the calibration mode, the voltage sensing component VS1 senses the cross-voltage between the input terminal and the output terminal of the current-voltage converter CV1 to output calibration sensing data TDATA1 to the final measurement machine FTM. Specifically, the voltage sensing component VS1 senses the first voltage value at the input terminal of the current-voltage converter CV1 and senses the second voltage value at the output terminal of the current-voltage converter CV1, and then calculates the difference between the first voltage value and the second voltage value to output the calibration sensing data TDATA1.

[0039] As described above, after the calibration mode is executed, when the calibration current IDC1 with the default current value flows from the current-voltage converter CV1 to the final measurement machine FTM, the current-voltage converter CV1 senses the calibration sensing data TDATA1. Then, the circuit measurement device executes a measurement program on the circuit under test DUT (such as, but not limited to, a light-emitting diode (LED) of a display device), which is specifically described as follows.

[0040] As Figure 2 shown, in the measurement mode, the final measurement machine FTM provides a voltage source VDC. This voltage source VDC is connected to the first node NE1 of the current sensing circuit CSU1. The first end of the current-voltage converter CV1 is connected to the first node NE1 of the current sensing circuit CSU1 to be connected to the voltage source VDC through the first node NE1.

[0041] It should be noted that, in the measurement mode, the second end of the current-voltage converter CV1 is connected to the circuit under test DUT through the second node NE2 of the current sensing circuit CSU1. The pins SCL and SDA of the final measurement machine FTM can output a frequency signal to trigger the circuit under test DUT to output a current as a measurement current. The second end of the current-voltage converter CV1 receives the measurement current output by the circuit under test DUT and converts this measurement current into a measurement voltage, which is output through the first end of the current-voltage converter CV1.

[0042] In the measurement mode, the voltage sensing component VS1 is connected to the first end and the second end of the current-voltage converter CV1. The output end of the voltage sensing component VS1 is connected to the third node NE3 of the current sensing circuit CSU1 to be connected to the final measurement machine FTM through the third node NE3.

[0043] In the measurement mode, the voltage sensing component VS1 senses the cross-voltage between the first end (here as the output end) and the second end (here as the output end) of the current-voltage converter CV1 to output the actual sensing data MDATA1 to the final measurement machine FTM.

[0044] Finally, in the measurement mode, the final measurement machine FTM calculates the voltage difference between the calibration sensing data TDATA1 and the actual sensing data MDATA1. When the final measurement machine FTM determines that this voltage difference is greater than a difference threshold (such as zero), the pins SDA and SCL of the final measurement machine FTM output an adjustment signal to the circuit under test DUT to indicate adjusting the measurement current value output by the circuit under test DUT. Until the voltage difference between the calibration sensing data TDATA1 and the actual sensing data MDATA1 is less than this difference threshold, no further adjustment is required.

[0045] [Second Embodiment]

[0046] Please refer to Figure 3 and Figure 4 wherein Figure 3 is the circuit component configuration diagram of the circuit measurement device according to the second embodiment of the present invention in the calibration mode; Figure 4 is the circuit component configuration diagram of the circuit measurement device according to the second embodiment of the present invention in the measurement mode.

[0047] Figure 3 The difference between Figure 2 is that, as shown in Figure 2 the circuit measurement device only sets one current sensing circuit CSU1, while as shown in Figure 3 the circuit measurement device sets multiple current sensing circuits CSU1 to CSUn, configured to sense more currents simultaneously, where n can be any appropriate integer value greater than 1.

[0048] As Figure 3 shown, the circuit measurement device executes the calibration mode, and the specific description is as follows.

[0049] As Figure 3 shown, in the calibration mode, the final measurement machine FTM provides a voltage source VDC. This voltage source VDC is connected to the first node NE1 of each current sensing circuit CSU1 to CSUn. The input ends of the current-voltage converters CV1 to CVn are respectively connected to the first node NE1 of the current sensing circuits CSU1 to CSUn, so as to be connected to the voltage source VDC through the first node NE1.

[0050] It should be noted that the data sensed by the current sensing circuits CSU1 to CSUn will have errors compared with the actual data, and due to the differences in characteristics or other factors among the multiple current sensing circuits CSU1 to CSUn, the error values of different current sensing circuits CSU1 to CSUn may not be equal. Therefore, a calibration program needs to be executed for each of the multiple current sensing circuits CSU1 to CSUn respectively.

[0051] In order to execute the calibration program for each of the multiple current sensing circuits CSU1 to CSUn respectively, the second node NE2 of each current sensing circuit CSU1 to CSUn is connected to the final measurement machine FTM through a multiplexer MUX (multiplexer) (which can be replaced by other switching circuits or switch circuits, etc.).

[0052] In the calibration mode, the final measurement machine FTM can supply a shared voltage to the current-voltage converters CV1 to CVn of the current sensing circuits CSU1 to CSUn respectively through the voltage source VDC, so that the calibration currents IDC1 to IDCn each having a preset current value flow from the current-voltage converters CV1 to CVn to the final measurement machine FTM respectively.

[0053] In the calibration mode, the multiplexer MUX allows a plurality of calibration currents IDC1 to IDCn each having a preset current value output from a plurality of current-voltage converters CV1 to CVn to be sequentially transmitted to the final measurement machine FTM, as Figure 3 shown, the current value output from the current source IDC is equal to this preset current value. Thus, the final measurement machine FTM can confirm that the current values of the calibration currents IDC1 to IDCn output from each of the current-voltage converters CV1 to CVn are the preset current values.

[0054] In the calibration mode, each voltage sensing component VS1 to VSn is configured to sense the voltage across the input and output ends of the current-voltage converters CV1 to CVn provided in the same current sensing circuit CSU1 to CSUn, so as to output a calibration sensing data TDATA1.

[0055] In the calibration mode, when the calibration currents IDC1 to IDCn each having a preset current value sequentially flow from the plurality of current-voltage converters CV1 to CVn to the final measurement machine FTM, the final measurement machine FTM sequentially records the calibration sensing data TDATA1 to TDATAn respectively output from the voltage sensing components VS1 to VSn to the final measurement machine FTM.

[0056] After the description of executing the calibration mode as Figure 3 shown, then the circuit measurement device as Figure 4 shown executes the measurement mode.

[0057] As Figure 2 shown, the first circuit measurement device is only provided with a single current sensing circuit CSU1 for detecting a single measured current value output from the device under test DUT. In contrast, as Figure 4 shown, the circuit measurement device of this embodiment is provided with a plurality of current sensing circuits CSU1 to CSUn for simultaneously detecting a plurality of measured current values output from the same device under test DUT (actually, it can also be replaced with different devices under test).

[0058] As Figure 4 shown, in the measurement mode, a plurality of output terminals ICH1 to ICHn of the device under test DUT respectively output a plurality of measured currents to a plurality of current-voltage converters CV1 to CVn.

[0059] The plurality of current-voltage converters CV1 to CVn respectively convert the plurality of measured currents to output different measured voltages. The plurality of voltage sensing components VS1 to VSn respectively sense the voltage across the input and output ends of the connected plurality of current-voltage converters CV1 to CVn, so as to respectively output a plurality of actual sensing data MDATA1 to MDATAn.

[0060] In the measurement mode, the final measurement machine FTM calculates the differences between each actual sensed data MDATA1 to MDATAn and the corresponding calibrated sensed data TDATA1 to TDATAn, such as the difference between the actual sensed data MDATA1 and the calibrated sensed data TDATA1, the difference between the calibrated sensed data TDATAn and the calibrated sensed data TDATAn, etc.

[0061] In the measurement mode, when the final measurement machine FTM determines that each difference is greater than a difference threshold (such as zero), the pins SDA and SCL of the final measurement machine FTM output an adjustment signal to the circuit under test DUT to indicate adjusting the measured current value output by the circuit under test DUT.

[0062] As described above, only a single calibration current flows through each current-voltage converter CV1 to CVn to the final measurement machine FTM, but the present invention is not limited thereto. In fact, in the calibration mode, the final measurement machine FTM can obtain a first calibration current with a first preset current value and a second calibration current with a second default value flowing through each current-voltage converter CV1 to CVn at different time points.

[0063] In the calibration mode, when each current-voltage converter CV1 to CVn converts the first calibration current into a first calibrated voltage output, each voltage sensing component VS1 to VSn senses the voltage across the input and output terminals of the current-voltage converter CV1 to CVn connected thereto to generate a first calibrated sensed data output.

[0064] In the calibration mode, when each current-voltage converter CV1 to CVn converts the second calibration current into a second calibrated voltage output, each voltage sensing component VS1 to VSn senses the voltage across the input and output terminals of the current-voltage converter CV1 to CVn connected thereto to generate a second calibrated sensed data output.

[0065] In the calibration mode, the final measurement machine FTM can generate a calibration equation based on the first calibration current, the first calibrated sensed data, the second calibration current, and the second calibrated sensed data, and then calculate the calibrated sensed data when each current sensing circuit CSU1 to CSUn receives a calibration current with a target current value according to the calibration equation.

[0066] The calibration equation can be expressed as: DX = α × IX + β, where DX represents the calibrated sensed data, α represents the gain, IX represents the calibration current with the target current value, and β represents the offset value.

[0067] In the measurement mode, the final measurement machine FTM compares the calibrated sensed data with the actual sensed data to determine whether the circuit under test DUT outputs a measured current with the target current value.

[0068] Alternatively, the final measurement machine FTM can first calculate the first sensing correction equation and the second sensing correction equation, and finally calculate the above-mentioned correction equation based on these two equations.

[0069] Specifically, the final measurement machine FTM can first generate a first sensing correction equation based on the first correction current and the first correction sensing data, expressed as: D0 = α × I0 + β, where D0, α, and β respectively represent the first correction sensing data, gain, and offset value when each current-voltage converter CV1 to CVn outputs the first correction current.

[0070] The final measurement machine FTM then generates a second sensing correction equation based on the second correction current and the second correction sensing data, expressed as: D1 = α × I1 + β, where D1, α, and β respectively represent the second correction sensing data, gain, and offset value when each current-voltage converter CV1 to CVn outputs the second correction current.

[0071] Finally, the first sensing correction equation and the second sensing correction equation are operated on to generate the above-mentioned correction equation.

[0072] [Third Embodiment]

[0073] Please refer to Figure 5 , which is a circuit component configuration diagram of the circuit measurement device according to the third embodiment of the present invention in the calibration mode.

[0074] As Figure 5 shown in the second embodiment and as Figure 3 shown in the second embodiment, the difference lies only in the setting positions of the voltage source VDC and the multiplexer MUX.

[0075] As Figure 5 shown, the voltage source VDC provided by the final measurement machine FTM is connected to the second node NE2 of each current sensing circuit CSU1 to CSUn. The multiplexer MUX is connected to the first node NE1 of each current sensing circuit CSU1 to CSUn.

[0076] Therefore, in the direction of the calibration currents IDC1 to IDCn as Figure 3 shown (flowing from the first node NE1 to the second node NE2), it is opposite to the direction of the calibration currents IDC1 to IDCn as Figure 5 shown (flowing from the second node NE2 to the first node NE1). However, Figure 3 and Figure 5 the operations performed by the circuit measurement devices shown are the same, so they will not be elaborated here.

[0077] Please refer to Figure 6, which is the circuit component configuration diagram of the circuit measurement device according to the third embodiment of the present invention in the measurement mode.

[0078] As Figure 6 shown in the second embodiment and as Figure 4 shown in the second embodiment, the difference lies only in the setting positions of the voltage source VDC and the circuit under test DUT.

[0079] As Figure 6 shown, the voltage source VDC provided by the final measurement machine FTM is connected to the second node NE2 of each current sensing circuit CSU1 to CSUn. The output terminals ICH1 to ICHn of the circuit under test DUT are respectively connected to the first node NE1 of the current sensing circuits CSU1 to CSUn. Therefore, multiple measurement currents output by the circuit under test DUT respectively flow from the first node NE1 of the multiple current sensing circuits CSU1 to CSUn to the current-voltage converters CV1 to CVn.

[0080] [Fourth Embodiment]

[0081] Please refer to Figure 7 and Figure 8 , where Figure 7 is the step flow chart of the calibration program of the circuit measurement method according to the fourth embodiment of the present invention; Figure 8 is the step flow chart of the measurement program of the circuit measurement method according to the fourth embodiment of the present invention.

[0082] The circuit measurement method of this embodiment includes steps S101 to S109 (i.e., the calibration program) as Figure 7 shown and steps S201 to S215 (i.e., the measurement program) as Figure 8 shown, which can be executed by the circuit measurement device of the aforementioned second or third embodiment.

[0083] First, starting from step S101, enter the calibration mode.

[0084] In the calibration mode, execute the calibration program of steps S103 to S109.

[0085] In step S103, use the voltage source VDC provided by the final measurement machine FTM to supply a common voltage to each current sensing circuit CSU1 to CSUn.

[0086] In step S105, output calibration currents IDC0 to IDCn from the current-voltage converters CV1 to CVn, each having a preset current value.

[0087] In step S107, the current-voltage converters CV1 to CVn respectively convert the calibration currents IDC0 to IDCn into multiple calibration voltages.

[0088] In step S109, multiple calibration voltages (or the voltage across the input and output terminals of current-voltage converters CV1 to CVn as described above) are sensed by multiple voltage sensing components VS1 to VSn respectively, to output multiple calibration sensing data TDATA1 to TDATAn respectively.

[0089] Next, starting from step S201, the measurement mode is entered. In the measurement mode, the measurement procedures of steps S203 to S215 are executed.

[0090] In step S203, a common voltage is supplied to each current sensing circuit CSU1 to CSUn by the voltage source VDC provided by the final measurement machine FTM.

[0091] In step S205, multiple measurement currents are respectively received from the device under test DUT by multiple current-voltage converters CV1 to CVn, and the multiple measurement currents are respectively converted into multiple measurement voltages for output.

[0092] In step S207, the voltages at the output terminals of multiple current-voltage converters CV1 to CVn (i.e., multiple measurement voltages, which is the difference between the voltages at the input terminals of multiple current sensing circuits CSU1 to CSUn) are sensed by multiple voltage sensing components VS1 to VSn, to output multiple actual sensing data MDATA1 to MDATAn respectively.

[0093] In step S209, the final measurement machine FTM calculates the differences between multiple actual sensing data MDATA1 to MDATAn and multiple calibration sensing data TDATA1 to TDATAn sensed in the previous step S109 respectively.

[0094] In step S211, the final measurement machine FTM determines whether the differences between the actual sensing data MDATA1 to MDATAn and the corresponding calibration sensing data TDATA1 to TDATAn are greater than a difference threshold value, such as zero. If so, step S213 is then executed. If not, step S215 is then executed.

[0095] In step S213, the final measurement machine FTM outputs an adjustment signal to the device under test DUT to instruct the device under test DUT to adjust the output measurement current, and then returns to step S201, and enters the measurement mode again to execute the measurement procedure for the adjusted measurement current.

[0096] In step S215, the final measurement machine FTM outputs a test end signal to indicate that the measurement current output by the device under test DUT has a default / target current value.

[0097] [Advantages of the Embodiment]

[0098] One of the beneficial effects of the present invention is that the circuit measurement device and method provided by the present invention have the following advantages:

[0099] Simultaneously measure a circuit under test using multiple current sensing circuits to effectively reduce the measurement time.

[0100] Reduce the hardware requirements of the final measurement machine (FT machine) by configuring multiple current sensing circuits. For example, there is no need to set up a large number of voltage sources and current sources.

[0101] Accurately determine whether the output current of the circuit under test meets the target value, and adjust the circuit under test when it does not meet the target value.

[0102] The content disclosed above is only the preferred feasible embodiment of the present invention, and does not limit the claims of the present invention. Therefore, all equivalent technical changes made by using the content of the specification and drawings of the present invention are included in the claims of the present invention.

Claims

1. A circuit measurement device, characterized in that, The circuit measurement device includes: A final measurement station configured to provide a voltage source to supply a shared voltage in a calibration mode and a measurement mode, and to provide a current source in the calibration mode; and At least one current sensing circuit connected to the final measurement station, at least one of the current sensing circuits including: A current-voltage converter configured to be connected to the current source in the calibration mode, and to be connected to a circuit under test in the measurement mode, and to be connected to the voltage source in the calibration mode and the measurement mode to receive the shared voltage, so that in the calibration mode, a calibration current with a preset current value flows from the current-voltage converter to the final measurement station as the output current of the current source, and the current-voltage converter converts the calibration current into a calibration voltage for output, and in the measurement mode, the current-voltage converter receives a measurement current from the circuit under test and converts the measurement current into a measurement voltage for output; and A voltage sensing component connected to the current-voltage converter, configured to sense the voltage across between the input terminal and the output terminal of the current-voltage converter in the calibration mode to output calibration sensing data, and to sense the voltage across between the input terminal and the output terminal of the current-voltage converter in the measurement mode to output actual sensing data; Wherein in the measurement mode, the final measurement station is configured to calculate the difference between the calibration sensing data and the actual sensing data, and when it is determined that the difference is greater than a difference threshold, to output an adjustment signal to instruct the circuit under test to adjust the output measurement current.

2. The circuit measurement device according to claim 1, wherein The number of at least one of the current sensing circuits is multiple, and each of the multiple current sensing circuits includes the current-voltage converter and includes the voltage sensing component. In the measurement mode, the multiple current-voltage converters are configured to respectively convert multiple measurement currents output by the circuit under test into multiple measurement voltages for output.

3. The circuit measurement device according to claim 2, wherein, The final measurement station provides a switching circuit, the switching circuit is connected to the multiple current sensing circuits, and is configured to sequentially switch the multiple current sensing circuits to be connected to the final measurement station in the calibration mode, so that multiple calibration currents respectively output by the multiple current sensing circuits flow to the final measurement station at different times.

4. The circuit measurement device according to claim 3, characterized in that, The switching circuit includes a multiplexer.

5. The circuit measurement device according to claim 1, wherein The calibration current output by the current-voltage converter includes a first calibration current and a second calibration current; Wherein when the current-voltage converter converts the first calibration current into a first calibration voltage for output, the voltage sensing component generates a first calibration sensing data output based on the sensed voltage across between the input terminal and the output terminal of the current-voltage converter; Wherein when the current-voltage converter converts the second calibration current into a second calibration voltage for output, the voltage sensing component generates a second calibration sensing data output based on the sensed voltage across between the input terminal and the output terminal of the current-voltage converter; In the calibration mode, the final measurement station is configured to generate a calibration equation based on the first calibration current, the first calibration sensing data, the second calibration current, and the second calibration sensing data, and calculate the calibration sensing data when the current sensing circuit receives the calibration current with a target current value according to the calibration equation; In the measurement mode, the final measurement station is configured to compare the calibration sensing data with the actual sensing data to determine whether the DUT outputs the measurement current with the target current value.

6. The circuit measurement device according to claim 5, wherein, The calibration equation is expressed as: DX = α × IX + β, where DX represents the calibration sensing data, IX represents the calibration current with the target current value, α represents the gain, and β represents the offset value.

7. The circuit measurement device according to claim 5, wherein, The final measurement station is configured to generate a first sensing calibration equation based on the first calibration current and the first calibration sensing data, generate a second sensing calibration equation based on the second calibration current and the second calibration sensing data, and generate the calibration equation after operating on the first sensing calibration equation and the second sensing calibration equation.

8. The circuit measurement device according to claim 7, wherein, The first sensing calibration equation is expressed as: D0 = α × I0 + β, where D0, α, and β respectively represent the first calibration sensing data, the gain, and the offset value when the current-voltage converter outputs the first calibration current; where the second sensing calibration equation is expressed as: D1 = α × I1 + β, where D1, α, and β respectively represent the second calibration sensing data, the gain, and the offset value when the current-voltage converter outputs the second calibration current; where the calibration equation is expressed as: DX = α × IX + β, where DX represents the calibration sensing data, IX represents the calibration current with the target current value, α represents the gain, and β represents the offset value.

9. A circuit measurement method, characterized in that, The circuit measurement method includes the following steps: In the calibration mode, supply a shared voltage; In the calibration mode, generate a calibration current with a preset current value; In the calibration mode, convert the calibration current into a calibration voltage; In the calibration mode, sense the calibration voltage to output calibration sensing data; In the measurement mode, supply the shared voltage; In the measurement mode, convert the measurement current received from the DUT into a measurement voltage; In the measurement mode, sense the measurement voltage to output actual sensing data; In the measurement mode, calculate the difference between the calibration sensing data and the actual sensing data; and Determine whether the difference is greater than a difference threshold. If so, output an adjustment signal to indicate adjusting the measurement current output by the DUT. If not, output a test end signal.

10. The circuit measurement method according to claim 9, characterized in that, The circuit measurement method further includes the following steps: In the measurement mode, respectively convert a plurality of the measurement currents output by the DUT into a plurality of measurement voltages for output; and In the measurement mode, respectively sense the plurality of measurement voltages to respectively output corresponding plurality of the actual sensing data.

11. The circuit measurement method according to claim 9, wherein The circuit measurement method further includes the following steps: In the calibration mode, receive the shared voltage to generate a first calibration current; In the calibration mode, convert the first calibration current into a first calibration voltage for output; In the calibration mode, sense the first calibration voltage to output first calibration sensed data; In the calibration mode, receive the shared voltage to generate a second calibration current; In the calibration mode, convert the second calibration current into a second calibration voltage for output; In the calibration mode, sense the second calibration voltage to output second calibration sensed data; In the calibration mode, generate a calibration equation based on the first calibration current, the first calibration sensed data, the second calibration current, and the second calibration sensed data; In the calibration mode, calculate the calibration sensed data when the current sensing circuit receives the calibration current with a target current value according to the calibration equation; In the measurement mode, compare the calibration sensed data with the actual sensed data to determine whether the DUT outputs the measurement current with the target current value. If so, output the test end signal; if not, output the adjustment signal.

12. The circuit measurement method according to claim 11, wherein The circuit measurement method further includes the following steps: In the calibration mode, generate the calibration equation based on the first calibration current, the first calibration sensed data, the second calibration current, and the second calibration sensed data, expressed as: DX = α × IX + β, where DX represents the calibration sensed data, IX represents the calibration current with the target current value, α represents the gain, and β represents the offset value.

13. The circuit measurement method according to claim 11, wherein The circuit measurement method further includes the following steps: In the calibration mode, generate a first sensed calibration equation based on the first calibration current and the first calibration sensed data; In the calibration mode, generate a second sensed calibration equation based on the second calibration current and the second calibration sensed data; and In the calibration mode, perform an operation on the first sensed calibration equation and the second sensed calibration equation to generate the calibration equation.

14. The circuit measurement method according to claim 13, wherein, The circuit measurement method further includes the following steps: In the calibration mode, generate the first sensed calibration equation based on the first calibration current and the first calibration sensed data, expressed as: D0 = α × I0 + β, where D0, α, and β respectively represent the first calibration sensed data, the gain, and the offset value when the first calibration current is output; In the calibration mode, generate the second sensed calibration equation based on the second calibration current and the second calibration sensed data, expressed as: D1 = α × I1 + β, where D1, α, and β respectively represent the second calibration sensed data, the gain, and the offset value when the second calibration current is output; and In the calibration mode, perform an operation on the first sensed calibration equation and the second sensed calibration equation to obtain the calibration equation, expressed as: DX = α × IX + β, Where DX represents the corrected sensed data, IX represents the corrected current having the target current value, α represents the gain, and β represents the offset value.

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