A reliable data transmission verification method for chip test results

By integrating IQC and OQC data to generate GDC and comparing it with the GDC provided by customers, the problem of inconsistent data transmission is solved, ensuring the consistency between the data received by customers and the shipping map.

CN114625711BActive Publication Date: 2025-10-10SINO IC TECH CO LTD
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Patent Information

Application Number
CN202210188380.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-02-28
Publication Date
2025-10-10
Estimated Expiration
2042-02-28

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Abstract

The application relates to the technical field of wafer testing, in particular to a reliable data transmission verification method for chip test results, wherein when receiving materials, IQC data provided by a customer is acquired, the IQC data is stored in a test factory system after analysis, wafer generation data is uploaded to the customer after testing, OQC data is uploaded to the customer during shipment inspection, the IQC and OQC data are integrated according to the data in the test factory system during shipment, GDC is generated for the customer, the customer calculates the GDC according to the customer's own IQC data, in combination with the data generated by the test factory and the OQC data, and feeds back the GDC to the test factory, the test factory judges whether the GDC is consistent with the customer, if yes, the shipment can be made, otherwise, new GDC is generated after the data is re-uploaded and is checked with the customer, and the shipment can be made only when the check is consistent. Compared with the prior art, the IQC and OQC data and the GDC data are compared and matched, so that the data received by the customer and the final shipment Map diagram are completely consistent.
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Description

TECHNICAL FIELD

[0001] The present application relates to the field of wafer testing, in particular to a reliable data transmission verification method for chip test results. BACKGROUND

[0002] In the process of semiconductor wafer testing, the number of Pass and Fail of test results is counted after each test, and the corresponding Map is generated and sent to the customer for confirmation. After the customer confirms, the test data and Map received are required to be retested or packaged and shipped according to the test data and Map.

[0003] When the data received by the customer and the final shipment Map are inconsistent, unnecessary losses will be caused to the customer. Therefore, it is very important to ensure that the data received by the customer is the final test result in the actual testing process.

[0004] In the existing semiconductor test result confirmation, the IT system sends the data to the customer and sends the Map to the packaging manufacturer. However, due to data transmission and retesting, the data received by the customer and the actual packaging Map are inconsistent.

[0005] Therefore, a reliable data transmission verification method for chip test results is needed to solve the above technical problems. After testing, the test results are sorted into a specific format file by the engineer, which is sent to the customer through ftp to ensure that the data received by the customer and the final shipment Map are completely consistent. SUMMARY

[0006] The present application aims to provide a reliable data transmission verification method for chip test results to solve the problems mentioned in the background.

[0007] To achieve the above purpose, the present application provides the following technical scheme: a reliable data transmission verification method for chip test results, comprising the following steps:

[0008] S1: When receiving the material, obtain the IQC data provided by the customer, and store it in the test factory system after analysis;

[0009] S2: Test the wafer, and upload the data to the customer after generation;

[0010] S3: When shipping inspection, upload the OQC data to the customer;

[0011] S4: When shipping, integrate the IQC and OQC data according to the data in the test factory system, and generate GDC for the customer;

[0012] S5: The customer calculates the GDC according to the self-owned IQC data, combines the data generated by the test factory and the OQC data, and feeds back to the test factory;

[0013] S6: The test factory compares the GDC data fed back by the customer with the GDC data of the test factory itself, and if the GDC of both parties is consistent, it is determined that the data of both parties matches, and the product can be shipped;

[0014] S7: The test factory judges whether the GDC is consistent with the customer, if consistent, the product can be shipped; otherwise, after uploading the data again, a new GDC is generated and checked with the customer, and only when the check is consistent can the product be shipped.

[0015] The data generated in S2 includes but is not limited to RawData, STDF data.

[0016] Compared with the prior art, by comparing and matching the IQC and OQC data and the GDC data, the data received by the customer and the final Map chart of the shipped product are completely consistent. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 is a workflow schematic diagram of the present application; DETAILED DESCRIPTION

[0018] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0019] Please refer to Figure 1 The present application provides a technical solution: a reliable data transmission verification method for chip test results, comprising the following steps:

[0020] S1: When the incoming material is received, the IQC data provided by the customer is obtained and stored in the test factory system after analysis;

[0021] S2: Test the wafer, and upload the data to the customer after generation;

[0022] S3: When the product is shipped, upload the OQC data to the customer;

[0023] S4: When the product is shipped, integrate the IQC and OQC data according to the data in the test factory system, and generate GDC for the customer;

[0024] S5: The customer calculates the GDC according to the IQC data of the customer, combines the data generated by the test factory and the OQC data, and feeds back to the test factory;

[0025] S6: The testing factory compares the GDC data provided by the customer with its own GDC data. If the GDCs of both parties are consistent, the data is considered matched and the product can be shipped.

[0026] S7: The testing factory determines whether the GDC is consistent with the customer. If so, the product can be shipped. Otherwise, the data is re-uploaded and a new GDC is generated for verification with the customer. Only when they are consistent can the product be shipped.

[0027] The data generated in S2 includes but is not limited to RawData and STDF data.

[0028] Example:

[0029] 1. When receiving incoming materials, obtain the IQC data provided by the customer and store it in the testing factory system.

[0030] 2.Upload data including but not limited to RawData, STDF and other data to customers after each piece of testing is completed.

[0031] 3. During inspection, generate OQC data for customers.

[0032] 4. When shipping, we integrate IQC and OQC data based on the data in the testing plant system and generate GDC for customers.

[0033] 5. The customer calculates GDC based on its own IQC data, combined with the Rawdata data and OQC data generated by the test factory, and feeds it back to the test factory.

[0034] 6. The testing factory compares the GDC data provided by the customer with its own GDC data. If the GDCs of both parties are consistent, it is determined that the data match and the product can be shipped.

[0035] 7. If the GDCs of both parties are inconsistent, both parties check RawData, IQC, and OQC, retransmit the data, and repeat steps 5 and 6.

[0036] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.

[0037] The present invention comprehensively solves the problem in the prior art that the data received by the customer is inconsistent with the actual packaged Map due to data transmission and retesting. After the test, the engineer will organize the test results into a file in a specific format and send it to the customer via FTP, ensuring that the data received by the customer is completely consistent with the final shipped Map.

Claims

1. A reliable data transmission and verification method for chip test results, characterized in that: The following steps are involved: S1: When receiving incoming materials, obtain the IQC data provided by the customer, analyze it and store it in the testing plant system; S2: Test wafers, generate data and upload it to customers; S3: Upload OQC data to customers during shipment inspection; S4: When shipping, integrate IQC and OQC data based on the data in the test plant system and generate GDC for the customer; S5: The customer calculates GDC based on its own IQC data, combined with the data generated by the test factory and OQC data, and feeds it back to the test factory; S6: The testing factory compares the GDC data provided by the customer with its own GDC data. If the GDCs of both parties are consistent, the data is considered matched and the product can be shipped. S7: The testing factory determines whether the GDC is consistent with the customer's. If so, the product can be shipped. Otherwise, the data is re-uploaded and a new GDC is generated for verification with the customer. Only when they are consistent can the product be shipped.

2. The reliable data transmission and verification method for chip test results according to claim 1, characterized in that: The data generated in S2 includes but is not limited to RawData and STDF data.

Citation Information

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