Apparatus and method for manufacturing an electrode assembly and method for manufacturing a secondary battery including the electrode assembly

Abstract

The present invention relates to a method for manufacturing an electrode assembly. The method for manufacturing an electrode assembly comprises: step (a), transferring a plurality of basic units from a first set position to a second set position one by one; step (b), measuring the distance between the full width end of the first electrode, that is, the end in the full width direction, and the full width end of the second electrode, that is, the end in the full width direction; step (c), measuring the distance (B1) from the reference point (O) of the second set position to the full width end of the first electrode of the first basic unit; step (d), stacking the second basic unit on the first basic unit; step (e), measuring the distance (B2) from the reference point (O) of the second set position to the full width end of the first electrode of the second basic unit; step (f), measuring the distance (C1) between the full width end of the first electrode of the first basic unit and the full width end of the second electrode of the second basic unit by adding the distance B2 and the distance A2 to each other, and then subtracting the distance B1 from the sum of the distance B2 and the distance A2; and step (g), comparing the distance C1 with the distance A1 to determine whether the stacking is defective.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims the benefit of priority to Korean Patent Application No. 10-2019-0161729, filed on December 6, 2019, and Korean Patent Application No. 10-2020-0154997, filed on November 18, 2020, which are hereby incorporated by reference in their entirety. Technical Field

[0003] The present invention relates to an apparatus and method for manufacturing an electrode assembly capable of improving stacking alignment, and a method for manufacturing a secondary battery including the electrode assembly. Background Art

[0004] Generally, a secondary battery refers to a battery that can be charged and discharged, unlike a primary battery that is not rechargeable. Secondary batteries are being widely used in high-tech electronic fields such as mobile phones, notebook computers, and camcorders.

[0005] Secondary batteries are classified into can-type secondary batteries in which the electrode assembly is built into a metal can, and pouch-type secondary batteries in which the electrode assembly is built into a pouch. Electrode assemblies are classified into stacked structures, wound (jelly roll) structures, or stacked / folded structures. A stacked electrode assembly has a structure in which a plurality of basic units are stacked.

[0006] However, the stacked type electrode assembly has a problem in that a plurality of basic units cannot be uniformly stacked. Summary of the invention

[0007] Technical issues

[0008] The present invention has been invented to solve the above problems, and provides an apparatus and method for manufacturing an electrode assembly capable of improving stack alignment by measuring positions of basic units, and a method for manufacturing a secondary battery including the electrode assembly.

[0009] Technical Solution

[0010] To achieve the above-mentioned purpose, the method for manufacturing an electrode assembly according to the present invention comprises: step (a), transferring a plurality of basic units in which a first electrode, a diaphragm, a second electrode and a diaphragm are sequentially stacked from a first set position to a second set position one by one; step (b), comprising a process of measuring distance A, in which the basic unit is photographed at the first set position to measure distance A1, distance A2 and distance An, wherein distance A1 is the distance between the full width end of the first electrode set in the photographed first basic unit, that is, the end in the full width direction and the full width of the second electrode set in the photographed first basic unit. The distance A2 is the distance between the full-width end of the first electrode arranged in the second basic unit to be photographed, that is, the end in the full-width direction and the full-width end of the second electrode arranged in the second basic unit to be photographed, that is, the end in the full-width direction; the distance An is the distance between the full-width end of the first electrode arranged in the nth basic unit to be photographed, that is, the end in the full-width direction and the full-width end of the second electrode arranged in the nth basic unit to be photographed, that is, the end in the full-width direction; step (c) includes a process of measuring the distance B1, in which, When the first basic unit of which the distance A1 is measured is transferred to the second setting position, the distance B1 from the reference point (O) of the second setting position to the full-width end of the first electrode of the first basic unit is measured; step (d), stacking the second basic unit transferred from the first setting position to the second setting position on the first basic unit; step (e), comprising the process of measuring the distance B2 from the reference point (O) of the second setting position to the full-width end of the first electrode of the second basic unit; step (f), comprising the process of comparing the distance B2 with the distance The invention further comprises the following steps: measuring a distance C1 between the full-width end of the first electrode of the first basic unit and the full-width end of the second electrode of the second basic unit by adding the distances B2 and A2 to each other and then subtracting the distance B1 from the sum of the distance B2 and the distance A2 to measure the distance C1 between the full-width end of the first electrode of the first basic unit and the full-width end of the second electrode of the second basic unit; and step (g), comprising a full-width inspection process, in which the distance C1 and the distance A1 are compared with each other, and when the difference value between the distance C1 and the distance A1 is within the input deviation value, it is determined to be a normal stacking, and when the difference value is outside the input deviation value, it is determined to be a defective stacking.

[0011] The step (b) may further include the following process: when the distance A1 measured in the process of measuring the distance A1 is within the input set value, it is determined to be a normal stack; when the distance A1 is outside the input set value, it is determined to be a defective stack.

[0012] The step (b) may further include a process of removing the base unit so as not to be transferred to the second setting position when it is determined that the base unit is defective at the first setting position.

[0013] In the step (b), the distance between the full-width end of the first electrode of the base unit and the full-width end of the second electrode of the base unit may be measured at the first set position by using a vision alignment tester.

[0014] The step (c) may further include the following process: checking whether the reference point (O) of the second set position is consistent with the reference point of the first basic unit, wherein the reference point of the first basic unit is the point where a line that divides the first basic unit equally in the full width direction and a line that divides the first basic unit equally in the full length direction intersect each other.

[0015] The step (c) may further include the following process: when the reference point (O) of the second set position is inconsistent with the reference point of the first basic unit, the first basic unit is moved so that the reference point (O) of the second set position is consistent with the reference point of the first basic unit.

[0016] The step (g) may further include a process of adjusting the position of the second base unit by a difference value obtained by comparing the distance C1 with the distance A1 of the first base unit when the stack is determined to be defective in the full width inspection process.

[0017] In the step (a), the first electrode may have an area smaller than that of the second electrode.

[0018] The step (g) may further include the following process: when it is determined that the stacking is normal, combining the first base unit and the second base unit with each other.

[0019] The method may further include: step (h), after step (g), stacking the nth basic unit transferred from the first setting position to the second setting position on the second basic unit; step (i), including the process of measuring the distance Bn from the reference point (O) of the second setting position to the full-width end of the first electrode of the nth basic unit; step (j), including the process of measuring the distance Cn between the full-width end of the first electrode of the second basic unit and the full-width end of the second electrode of the nth basic unit by adding the distance Bn and the distance An to each other and then subtracting the distance B2 from the sum of the distance Bn and the distance An; and step (k), comparing the distance Cn with the distance A2 of the second basic unit, and when the difference value between the distance Cn and the distance A2 is within the input deviation value, it is determined to be a normal stacking, and when the difference value is outside the input deviation value, it is determined to be a defective stacking.

[0020] The step (b) may further include a process of measuring the distance D, in which the distance D1, the distance D2 and the distance Dn are measured, wherein the distance D1 is the distance between the full-length end of the first electrode arranged in the first basic unit to be photographed, that is, the end in the full-length direction and the full-length end of the second electrode arranged in the first basic unit to be photographed, that is, the end in the full-length direction; the distance D2 is the distance between the full-length end of the first electrode arranged in the second basic unit to be photographed, that is, the end in the full-length direction and the full-length end of the second electrode arranged in the second basic unit to be photographed, that is, the end in the full-length direction; the distance Dn is the distance between the full-length end of the first electrode arranged in the nth basic unit to be photographed, that is, the end in the full-length direction and the full-length end of the second electrode arranged in the nth basic unit to be photographed, that is, the end in the full-length direction, and the step (c) may further include the following process: when the first basic unit is transferred to the second set position, measuring the distance from the reference point ( O) to the full-length end of the first electrode of the first basic unit, the step (e) further includes a process of measuring the distance E2 from the reference point (O) of the second set position to the full-length end of the first electrode of the second basic unit, the step (f) may further include a process of measuring the distance F1 between the full-length end of the first electrode of the first basic unit and the full-length end of the second electrode of the second basic unit by adding the distance E2 and the distance D2 of the second basic unit to each other and then subtracting the distance E1 from the sum of the distance E2 and the distance D2, and the step (g) further includes a full-length inspection process, in which the distance F1 is compared with the distance D1 of the first basic unit, and when the difference value between the distance F1 and the distance D1 is within the input deviation value, it is determined to be a normal stack, and when the difference value is outside the input deviation value, it is determined to be a defective stack.

[0021] The step (g) may further include a process of adjusting the position of the second base unit by a difference value obtained by comparing the distance F1 with the distance D1 of the first base unit when the stack is determined to be defective in the full-length inspection process.

[0022] The step (i) may further include a process of measuring the distance En from the reference point (O) of the second set position to the full-length end of the first electrode of the nth basic unit, the step (j) may further include a process of measuring the distance Fn between the full-length end of the first electrode of the second basic unit and the full-length end of the second electrode of the nth basic unit by adding the distance En and the distance Dn of the nth basic unit to each other and then subtracting the distance E2 from the sum of the distance En and the distance Dn, and the step (k) may further include the following process: comparing the distance Fn with the distance D2 of the second basic unit, when the difference value between the distance Fn and the distance D2 is within the input deviation value, it is determined to be a normal stack, and when the difference value is outside the input deviation value, it is determined to be a defective stack.

[0023] The method for manufacturing a secondary battery according to the present invention comprises: step (A), manufacturing an electrode assembly according to the method for manufacturing an electrode assembly; and step (B), accommodating the electrode assembly in a battery case and injecting an electrolyte into the battery case to manufacture the secondary battery.

[0024] The apparatus for manufacturing an electrode assembly according to the present invention comprises: a loading box in which a plurality of basic units in which a first electrode, a separator, a second electrode and a separator are sequentially stacked are loaded in the up-down direction; a conveying member configured to convey the uppermost basic unit among the basic units loaded in the loading box to a first set position (H1) and to convey the basic unit disposed at the first set position (H1) to a second set position (H2); a first measuring member configured to measure a distance A1 from an end of a first electrode disposed in a basic unit that is first conveyed and disposed at the first set position (H1) to an end of a second electrode disposed in the basic unit, and a distance A2 from an end of a first electrode disposed in a basic unit that is second conveyed and disposed at the first set position (H1) to an end of the second electrode disposed in the basic unit; and a second measuring member configured to measure a distance A1 from an end of a first electrode disposed in a basic unit that is first conveyed and disposed at the first set position (H1) to an end of a second electrode disposed in the basic unit. Unit, wherein the distance B1 from the reference point (O) of the second set position (H2) to the end of the first electrode of the basic unit transmitted first is measured, the distance B2 from the reference point (O) of the second set position (H2) to the end of the first electrode of the basic unit transmitted second and stacked on the basic unit transmitted first is measured, the distance C1 between the end of the first electrode of the basic unit transmitted first and the end of the second electrode of the basic unit transmitted second is measured by adding the distance B2 and the distance A2 of the basic unit transmitted second to each other, and then subtracting the distance B1 of the basic unit transmitted first from the sum of the distance B2 and the distance A2, and the distance C1 is compared with the distance A1 of the basic unit transmitted first, when the difference value between the distance C1 and the distance A1 is within the input deviation value, it is determined as a normal stacking, and when the difference value is outside the input deviation value, it is determined as a defective stacking.

[0025] Beneficial Effects

[0026] In the method for manufacturing an electrode assembly according to the present invention, a stacking failure of basic units to be stacked together can be confirmed. In particular, when a stacking failure occurs, the position of the basic unit can be changed by a difference value to improve the stacking alignment. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 is a side view of an electrode assembly according to a first embodiment of the present invention.

[0028] Figure 2 is a diagram illustrating an apparatus for manufacturing an electrode assembly according to a first embodiment of the present invention.

[0029] Figure 3 is a flowchart illustrating a method of manufacturing an electrode assembly according to a first embodiment of the present invention.

[0030] Figure 4a and Figure 4b is a side view illustrating step (b) of the method of manufacturing an electrode assembly according to the first embodiment of the present invention.

[0031] Figure 5 yes Figure 4a Floor plan.

[0032] Figure 6a and Figure 6b is a side view illustrating step (c) of the method of manufacturing an electrode assembly according to the first embodiment of the present invention.

[0033] Figure 7 yes Figure 6a Floor plan.

[0034] Figure 8 is a side view illustrating a process of correcting a position in step (c) of the method of manufacturing an electrode assembly according to the first embodiment of the present invention.

[0035] Fig. 9 is a side view illustrating step (d) of the method of manufacturing an electrode assembly according to the first embodiment of the present invention.

[0036] Fig.10a and Fig.10b is a side view illustrating step (e), step (f), and step (g) of the method of manufacturing an electrode assembly according to the first embodiment of the present invention.

[0037] Fig.11a and Fig.11b is a side view illustrating step (h), step (i), step (j), and step (k) of the method of manufacturing an electrode assembly according to the first embodiment of the present invention.

[0038] Fig.12 is a cross-sectional view of a secondary battery according to a second embodiment of the present invention. DETAILED DESCRIPTION

[0039] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings in a manner that a person of ordinary skill in the art to which the present invention belongs can easily implement the technical concept of the present invention. However, the present invention can be implemented in different forms and should not be construed as being limited to the embodiments set forth herein. In the accompanying drawings, any unnecessary content for describing the present invention will be omitted for the sake of clarity, and in addition, the same reference numerals in the drawings represent the same elements.

[0040] [Electrode assembly according to first embodiment of the present invention]

[0041] like Figure 1 As shown in , the electrode assembly 100 according to the first embodiment of the present invention has a structure in which basic units 110 in which the same number of electrodes and separators are alternately disposed to be integrated with each other are repeatedly disposed.

[0042] For example, the electrode assembly 100 according to the first embodiment of the present invention includes a plurality of base units 110 stacked up and down. Each base unit 110 has a four-layer structure in which a first electrode 111, a separator 112, a second electrode 113, and a separator 112 are sequentially stacked.

[0043] Here, the first electrode 111 and the second electrode 113 may have opposite polarities to each other. For example, when the first electrode 111 is a positive electrode, the second electrode 113 is a negative electrode. In addition, the first electrode 111 has an area smaller than that of the second electrode 113.

[0044] The electrode assembly 100 having the above-described stack structure according to the first embodiment of the present invention is manufactured using an apparatus for manufacturing the electrode assembly 100 .

[0045] [Apparatus for manufacturing an electrode assembly according to a first embodiment of the present invention]

[0046] like Figure 2 As shown in , the apparatus for manufacturing an electrode assembly according to the first embodiment of the present invention stacks a plurality of basic units in the up-down direction. Here, the plurality of basic units may be stacked to be aligned at the same position. The apparatus for manufacturing an electrode assembly according to the first embodiment of the present invention includes a loading box 200, a conveying member 300, a first measuring member 400, and a second measuring member 500.

[0047] Loading box

[0048] The loading box 200 is configured to load a plurality of base units 110 in an up-and-down direction. A loading space opened upward is formed in the loading box 200, and a plurality of base units 110 are loaded in the loading space.

[0049] Transmission components

[0050] The conveying member 300 takes out the uppermost basic unit 110 among the basic units 110 loaded in the loading box 200 from the loading box 200 to convey the basic unit 110 to the first setting position H1, and then conveys the basic unit 110 at the first setting position H1 to the second setting position H2. Here, the conveying member 300 may be a jig or a conveyor belt.

[0051] First measuring member

[0052] The first measuring member 400 is configured to measure the position of the base unit 110 at the first set position H1 , and includes a first lighting portion 410 and a first measuring portion 420 .

[0053] The first lighting unit 410 is disposed below the base unit 110 at the first set position H1 to emit light to the bottom surface of the base unit 110. As a result, the second electrode 113 is illuminated by the light of the first lighting unit 410 onto the diaphragm 112 disposed at the uppermost end, so that the position of the second electrode 113 disposed between the diaphragms 112 can be checked.

[0054] The first measuring unit 420 is configured to measure the basic unit 110 transferred to the first set position H1, and the first measuring unit 420 is arranged above the basic unit 110 (hereinafter referred to as the basic unit) that is first transferred and located at the first set position H1 to capture the upper part of the basic unit 110, thereby measuring the distance A1 between the end of the first electrode 111 and the end of the second electrode 113 displayed on the diaphragm 112 based on the captured image.

[0055] That is, the first measuring section 420 measures the upper portion of the basic unit 110 located at the first set position H1, thereby measuring the distance A1 between the end of the first electrode 111 and the end of the second electrode 113 based on the image of the top surface of the basic unit 110. Here, when the measured value (distance) A1 is within the input set value, the first measuring section 420 determines that it is normal, and when the measured distance A1 is outside the input set value, the first measuring section 420 determines that it is defective. In particular, when the first measuring section 420 determines that it is defective, the defective basic unit 110 located at the first set position H1 is removed so as not to be transferred to the second set position H2.

[0056] The first measuring unit 420 continues to measure the distance A2 between the end of the first electrode 111 of the second basic unit that is secondly transmitted to the first set position H1 and the end of the second electrode 113 displayed on the diaphragm 112, and the distance An between the end of the first electrode 111 of the nth basic unit that is nthly transmitted to the first set position and the end of the second electrode displayed on the diaphragm 112.

[0057] Second measuring member

[0058] The second measuring member 500 is configured to measure the base unit 110 transferred to the second setting position H2 , and includes a second lighting portion 510 and a second measuring portion 520 .

[0059] The second lighting part 510 is disposed under the base unit 110 transferred to the second setting position H2 to emit light to the base unit 110 transferred to the second setting position H2 to illuminate the base unit 110 .

[0060] The second measuring section 520 is configured to measure the basic unit 110 transferred to the second set position H2. The second measuring section 520 measures the distance B1 from the reference point O of the second set position H2 to the end of the first electrode 111 of the first basic unit, measures the distance B2 from the reference point O of the second set position H2 to the end of the first electrode 111 of the basic unit (hereinafter referred to as the second basic unit) that is transferred and stacked on the first basic unit second, and measures the distance C1 between the end of the first electrode 111 of the first basic unit and the end of the second electrode 113 of the second basic unit by adding the distances B2 and A2 of the second basic unit to each other and then subtracting the distance B1 of the first basic unit from the sum of the distances B2 and A2. Here, when the difference value between the distance C1 and the distance A1 of the first basic unit is within the input deviation value, it is determined to be a normal stack, and when the difference value is outside the input deviation value, it is determined to be a defective stack.

[0061] That is, the second measuring member 500 can measure the alignment of the base units 110 sequentially stacked at the second set position H2 through the second lighting part 510 and the second measuring part 520. In particular, when stacking deviation occurs, the position of the second base unit can be adjusted by the difference value to improve the stacking alignment.

[0062] Thus, in the apparatus for manufacturing an electrode assembly according to the first embodiment of the present invention, the radical units 110 may be sequentially stacked at the same position, thereby improving stack alignment.

[0063] Hereinafter, a method of manufacturing an electrode assembly according to a first embodiment of the present invention will be described.

[0064] [Method of Manufacturing an Electrode Assembly According to a First Embodiment of the Present Invention]

[0065] like Figure 3 to Figure 11b As shown in, the method for manufacturing an electrode assembly according to the first embodiment of the present invention includes: step (a), conveying a basic unit; step (b), measuring a basic unit located at a first set position; step (c), measuring a distance between a second set position and the first basic unit; step (d), stacking the first basic unit and the second basic unit; step (e), measuring a distance between the second set position and the second basic unit; step (f), measuring a distance between the first basic unit and the second basic unit; and step (g), determining whether the stacking is defective by comparing the measured value of the first basic unit with the measured value of the second basic unit.

[0066] Hereinafter, a method of manufacturing an electrode assembly according to a first embodiment of the present invention will be described in detail with reference to the accompanying drawings. Figure 1 The reference symbol x shown in refractory 2 denotes the full width direction of the basic unit, and the reference symbol y denotes the full length direction of the basic unit.

[0067] Step (a)

[0068] In step (a), refer to Figure 2 , the plurality of basic units 110 loaded in the loading box 200 are transferred one by one from the first setting position H1 to the second setting position H2 using the transfer member 300. For example, in step (a), the first basic unit located at the uppermost end among the plurality of basic units 110 loaded in the loading box 200 is transferred to the first setting position H1, and the first basic unit located at the first setting position H1 is transferred to the second setting position H2 after a set time. Next, the second basic unit located at the uppermost end among the plurality of basic units 110 is transferred to the first setting position H1, and the second basic unit located at the first setting position H1 is transferred to the second setting position H2 after a set time. Next, the nth basic unit located at the uppermost end among the plurality of basic units 110 is transferred to the first setting position H1, and the nth basic unit located at the first setting position H1 is transferred to the second setting position H2 after a set time. In step (a), all the basic units 110 loaded in the loading box 200 are transferred in the above manner.

[0069] Here, in step (a), when the first basic unit is located at the second set position H2, the second basic unit is stacked on the first basic unit. That is, the first basic unit to the nth basic unit are sequentially stacked in the above manner. Thus, the first basic unit, the second basic unit, and the nth basic unit are sequentially stacked upward at the second set position H2, thereby manufacturing an electrode assembly.

[0070] The base unit 110 has a four-layer structure in which a first electrode 111 , a separator 112 , a second electrode 113 , and a separator 112 are sequentially stacked.

[0071] Hereinafter, for the sake of clarity, the first basic unit taken out from the loading box 200 is referred to as the first basic unit and is indicated by reference numeral 110A. In addition, the second basic unit taken out from the loading box 200 and stacked on the first basic unit 110A is referred to as the second basic unit and is indicated by reference numeral 110B. In addition, the nth basic unit taken out from the loading box 200 and stacked on the second basic unit 110B is referred to as the nth basic unit and is indicated by reference numeral 110N.

[0072] A placement plate for arranging the base unit is provided at each of the first setting position H1 and the second setting position H2, and thus the base unit can be stably placed by the placement plate.

[0073] Thus, in step (a), the first base unit 110A among the plurality of base units loaded in the loading box 200 is transferred from the first setting position H1 to the second setting position H2.

[0074] Step (b)

[0075] Step (b) includes the process of measuring the distance A. Figure 4a As shown in FIG. 1 , in the process of measuring the distance A, the base unit transferred to the first setting position H1, that is, the first base unit 110A, is photographed to measure the full width end of the first electrode 111 provided in the first base unit 110A, that is, the end in the full width direction x (when in FIG. 1 ). Figure 4a The right end of the first electrode when viewed in the middle) and the full width end of the second electrode 113 arranged in the first basic unit 110A, that is, the end in the full width direction x (when in Figure 4a The distance A1 between the right end of the second electrode when viewed in the middle).

[0076] That is, the distance A1 represents the distance from the full-width end of the first electrode 111 disposed in the first base unit to the full-width end of the second electrode 113 disposed in the first base unit.

[0077] Here, the first electrode 111 has an area smaller than that of the second electrode 113 , so that the position of the second electrode 113 provided between the diaphragms 112 can be effectively photographed using perspective.

[0078] Here, step (b) further includes the following process: when the measured distance A1 is within the set value, it is determined to be normal, and when the measured distance A1 is outside the set value, it is determined to be defective. That is, step (b) further includes a process of checking whether the basic unit is defective. In this process, the stacking deviation between the first electrode 111 and the second electrode 113 stacked up and down can be detected to check whether it is defective.

[0079] More specifically, in step (b), when the measured distance A1 is within the input set value, it is judged as a normal stack in which the reference point of the first electrode 111 and the reference point of the second electrode 113 are stacked on the same vertical line, and when the measured distance A1 is outside the input set value, it is judged as a defective stack because the reference point of the first electrode 111 and the reference point of the second electrode 113 are not stacked on the same vertical line.

[0080] Step (b) further includes the following process: when it is determined that the first basic unit 110A is defective at the first setting position H1, the first basic unit 110A is removed so that the first basic unit 110A is not transferred to the second setting position H2. That is, in step (b), the first basic unit 110A determined to be defective is removed, so that the electrode assembly is not manufactured using the defective basic unit.

[0081] The first measuring member 400 measures a distance A1 between a full width end of the first electrode 111 of the first base unit 110A and a full width end of the second electrode 113 of the first base unit 110A by using a vision alignment tester. Here, the vision alignment tester takes an image of a product by using a camera to check the quantity, omission, position, shape, size, barcode, appearance, etc. of the product. Here, the vision alignment tester can detect all the precise detections that are difficult to detect by human eyes.

[0082] The input setting value may be 1.0 mm or less. That is, when the distance A1 is greater than 1.0 mm, there is a possibility of a short circuit due to defective stacking of the first electrode 111 and the second electrode 113. Thus, in step (b), only the basic unit having the distance A1 of 1.0 mm or less is transferred to the second setting position H2 to prevent the manufacture of a defective electrode assembly.

[0083] In the process of measuring the distance A, continue to measure the distance A2 between the full-width end of the first electrode 111 of the second basic unit that is secondly transmitted to the first set position H1 and the full-width end of the second electrode 113 displayed on the diaphragm 112, and the distance An between the full-width end of the first electrode 111 of the nth basic unit that is transmitted to the first set position for the nth time and the full-width end of the second electrode 113 displayed on the diaphragm 112.

[0084] Step (b) further includes the step of measuring the distance D. Figure 4b As shown in , in the process of measuring the distance D, the image captured by the first measuring member 400 is used to measure the distance D between the full-length end of the first electrode 111, that is, the end in the full-length direction y and the full-length end of the second electrode 113, that is, the end in the full-length direction y.

[0085] That is, the distance D1 represents the distance from the full-length end of the first electrode 111 to the full-length end of the second electrode 113 .

[0086] Therefore, step (b) further includes the following process: when the measured distances A1 and D1 are within the input set values, it is determined to be normal, and when the measured distances A1 and D1 are outside the input set values, it is determined to be defective. Due to this feature, it is possible to check in advance whether the basic unit is defective to prevent the manufacture of defective electrode assemblies.

[0087] In addition, step (b) further includes the following process: when it is determined that the basic unit is defective at the first setting position, the basic unit is removed so as not to be transferred to the second setting position. Due to this feature, stacking of defective basic units can be prevented.

[0088] In the process of measuring the distance D, the distance D2 between the full-length end of the first electrode 111 of the second basic unit that is secondly transmitted to the first set position H1 and the full-length end of the second electrode 113 displayed on the diaphragm 112, and the distance Dn between the full-length end of the first electrode 111 of the nth basic unit that is transmitted to the first set position for the nth time and the full-length end of the second electrode 113 displayed on the diaphragm 112 are continued to be measured.

[0089] Step (c)

[0090] Step (c) includes the step of measuring the distance B1. Figure 5 and Figure 6a As shown in , in the process of measuring the distance B1, when the basic unit whose distance A1 is measured is transferred to the second set position H2, the second measuring member 500 is used to measure the distance B1 from the reference point O of the second set position H2 to the full width end of the first electrode 111 of the first basic unit 110A.

[0091] Here, if Figure 7 and Figure 8 As shown in , step (c) further includes the following process: checking whether the reference point O of the second setting position H2 and the reference point Oa of the first basic unit 110A are consistent with each other. That is, in step (c), when the reference point O of the second setting position H2 and the reference point Oa of the first basic unit 110A are consistent with each other, it is determined to be normal, and when the reference point O of the second setting position H2 and the reference point Oa of the first basic unit 110A are inconsistent with each other, it is determined to be defective. In particular, when the reference point O of the second setting position H2 and the reference point Oa of the first basic unit 110A are inconsistent with each other, the first basic unit 110A is moved by the difference value between the reference point O of the second setting position H2 and the reference point Oa of the first basic unit 110A by using the conveying member 300, so that the reference point O of the second setting position H2 and the reference point Oa of the first basic unit 110A are consistent with each other.

[0092] The reference point Oa of the first basic unit 110A may be a point where a line that divides the first basic unit 110A in the full width direction x and a line that divides the first basic unit 110A in the full length direction y intersect each other. Thus, the measured distance values ​​of the basic units transmitted to the second set position H2 can be measured uniformly. Of course, the reference lines of the first electrode 111 and the second electrode 113 may be lines that divide the first electrode 111 and the second electrode 113 in the width direction, respectively.

[0093] Step (c) includes the step of measuring the distance E1. Figure 5 and Figure 6b As shown in , in the process of measuring the distance E1, when the basic unit whose distance D1 is measured is transferred to the second set position H2, the second measuring member 500 is used to measure the distance E1 from the reference point O of the second set position H2 to the full-length end of the first electrode 111 of the first basic unit 110A.

[0094] Step (d)

[0095] In step (d), if Fig. 9 As shown in FIG. 1 , the second base unit 110B transferred from the first setting position H1 to the second setting position H2 is stacked on the first base unit 110A measured by the distance B1. Thus, a stacked body in which the second base unit 110B and the first base unit 110A are arranged one above the other can be manufactured at the second setting position H2.

[0096] Here, in the second basic unit 110B, the full width end portion of the first electrode 111 provided in the second basic unit 110B is measured at the first setting position H1 (when the full width end portion of the first electrode 111 provided in the second basic unit 110B is Fig.10a The right end of the first electrode when viewed in FIG. 10A ) and the full width end of the second electrode 113 disposed in the second basic unit 110B (when viewed in FIG. 10B ). Fig.10a The distance A2 between the right end of the second electrode when viewed in the middle).

[0097] Furthermore, in the second base unit 110B, a distance D2 between the full-length end of the first electrode 111 and the full-length end of the second electrode 113 is measured at the first set position H1.

[0098] Step (e)

[0099] Step (e) includes the step of measuring the distance B2. Fig.10a As shown in FIG. 1 , in the process of measuring the distance B2 , the distance B2 from the reference point O at the second set position H2 to the full width end of the first electrode 111 of the second base unit 110B is measured.

[0100] Step (e) includes the step of measuring the distance E2. Fig.10b As shown in FIG. 1 , in the process of measuring the distance E2 , the distance E2 from the reference point O at the second set position H2 to the full-length end of the first electrode 111 of the second base unit 110B is measured.

[0101] Step (f)

[0102] Step (f) includes a process of measuring the distance C1. In the process of measuring the distance C1, the distance C1 between the full-width end of the first electrode 111 of the first base unit 110A and the full-width end of the second electrode 113 of the second base unit 110B is measured by adding the distance B2 and the distance A2 of the second base unit 110B to each other and then subtracting the distance B1 of the first base unit 110A from the sum of the distance B2 and the distance A2.

[0103] That is, a calculation formula expressed as B2+A2-B1=C1 can be obtained.

[0104] Step (f) includes a process of measuring the distance F1. In the process of measuring the distance F1, the distance F1 between the full-length end of the first electrode 111 of the first base unit 110A and the full-length end of the second electrode 113 of the second base unit 110B is measured by adding the distance E2 and the distance D2 of the second base unit 110B to each other and then subtracting the distance E1 of the first base unit 110A from the sum of the distance E2 and the distance D2.

[0105] That is, a calculation formula expressed as E2+D2-E1=F1 can be obtained.

[0106] Step (g)

[0107] Step (g) includes a full width inspection process of inspecting the alignment of the first basic unit and the second basic unit in the full width direction x. In the full width inspection process, the distance C1 and the distance A1 of the first basic unit 110A are compared with each other. When the difference between the distance C1 and the distance A1 is within the input deviation value, it is determined to be a normal stacking, and when the difference is outside the input deviation value, it is determined to be a defective stacking. Here, the deviation value may be in the range of 0.1 mm to 2 mm.

[0108] That is, in the full width inspection process of step (g), when the difference between the distance C1 and the distance A1 of the first basic unit 110A is within the deviation value, since the full width end of the first electrode 111 of the second basic unit 110B and the full width end of the second electrode 113 are arranged on the same vertical line, it is determined to be normal stacking. In addition, when the difference between the distance C1 and the distance A1 of the first basic unit 110A is outside the deviation value, since the full width end of the first electrode 111 of the second basic unit 110B and the full width end of the second electrode 113 are significantly separated from each other, it is determined to be defective stacking.

[0109] The full width inspection process of step (g) includes the following process: when the distance C1 and the distance A1 of the first base unit 110A are different from each other, the position of the second base unit 110B is adjusted by the difference between the distance C1 and the distance A1 of the first base unit 110A. Thus, the stacking alignment of the first base unit 110A and the second base unit 110B in the full width direction can be improved.

[0110] Step (g) includes a full-length inspection process of inspecting the alignment of the first basic unit and the second basic unit in the full-length direction y. In the full-length inspection process, the distance F1 and the distance D1 of the first basic unit 110A are compared with each other, and when the difference between the distance F1 and the distance D1 is within the input deviation value, it is determined to be a normal stack, and when the difference is outside the input deviation value, it is determined to be a defective stack.

[0111] That is, in the full-length inspection process of step (g), when the difference between the distance F1 and the distance D1 of the first basic unit 110A is within the deviation value, since the full-length end of the first electrode 111 of the second basic unit 110B and the full-length end of the second electrode 113 are arranged on the same vertical line, it is determined to be normal stacking. In addition, when the difference between the distance F1 and the distance D1 of the first basic unit 110A is outside the deviation value, since the full-length end of the first electrode 111 of the second basic unit 110B and the full-length end of the second electrode 113 are significantly separated from each other, it is determined to be defective stacking.

[0112] The full-length inspection process of step (g) includes the following process: when the distance F1 and the distance D1 of the first base unit 110A are different from each other, the position of the second base unit 110B is adjusted by the difference between the distance F1 and the distance D1. Thus, the stacking alignment of the first base unit 110A and the second base unit 110B in the full-length direction can be improved.

[0113] When it is determined to be normally stacked in the full width inspection process and the full length inspection process, step (g) further includes a process of bonding the first base unit 110A to the second base unit 110B to prevent a misalignment defect from occurring.

[0114] Here, the bonding force between the first base unit 110A and the second base unit 110B may be smaller than the bonding force between the electrode and the diaphragm provided in each of the first base unit 110A and the second base unit 110B. Thus, even if the first base unit 110A and the second base unit 110B are separated from each other when necessary, the electrode and the diaphragm provided in each of the first base unit 110A and the second base unit 110B may be prevented from being separated from each other.

[0115] After step (g), step (h), step (i), step (j) and step (k) may be further performed.

[0116] Step (h)

[0117] In step (h), after step (g), the nth base unit 110N transferred to the second setting position H2 via the first setting position H1 is stacked on the second base unit 110B.

[0118] Here, in the nth basic unit 110N, the full width end portion of the first electrode 111 disposed in the nth basic unit 110N is measured at the first setting position H1 (when the full width end portion of the first electrode 111 disposed in the nth basic unit 110N is measured at the first setting position H1). Fig.11a The right end of the first electrode when viewed in FIG. 10 ) and the full width end of the second electrode 113 disposed in the nth basic unit 110N (when viewed in FIG. 10 ). Fig.11a The distance An between the right end of the second electrode when observed in the middle).

[0119] Furthermore, in step (h), the full length end of the first electrode 111 disposed in the nth basic unit 110N is measured at the first set position H1 (when the Fig.11b The right end of the first electrode when viewed in FIG. 10A ) and the full-length end of the second electrode 113 disposed in the nth basic unit 110N (when viewed in FIG. 10B ). Fig.11b The distance Dn between the right end of the second electrode when viewed in the middle).

[0120] Step (i)

[0121] Step (i) includes the process of measuring the distance Bn. Fig.11a As shown in FIG. 1 , in the process of measuring the distance Bn, the distance Bn from the reference point O at the second set position H2 to the full width end of the first electrode 111 of the nth base unit 110N is measured.

[0122] In addition, step (i) includes a process of measuring the distance En. Fig.11b As shown in FIG. 1 , in the process of measuring the distance En, the distance En from the reference point O at the second set position H2 to the full-length end of the first electrode 111 of the n-th base unit 110N is measured.

[0123] Step (j)

[0124] Step (j) includes a process of measuring the distance Cn. In the process of measuring the distance Cn, the distance Cn between the full-width end of the first electrode 111 of the second basic unit 110B and the full-width end of the second electrode 113 of the nth basic unit 110N is measured by adding the distance Bn and the distance An of the nth basic unit 110N to each other and then subtracting the distance B2 of the second basic unit 110B from the sum of the distance Bn and the distance An.

[0125] That is, a calculation formula expressed as Bn+An-B2=Cn can be obtained.

[0126] In addition, step (j) includes a process of measuring the distance Fn. In the process of measuring the distance Fn, the distance Fn between the full-length end of the first electrode 111 of the second basic unit 110B and the full-length end of the second electrode 113 of the nth basic unit 110N is measured by adding the distance En and the distance Dn of the nth basic unit 110N to each other and then subtracting the distance E2 of the second basic unit 110B from the sum of the distance En and the distance Dn.

[0127] That is, a calculation formula expressed as En+Dn-E2=Fn can be obtained.

[0128] Step (k)

[0129] Step (k) includes a full width inspection process for inspecting the alignment of the second basic unit and the nth basic unit in the full width direction. In the full width inspection process, the distance Cn and the distance A2 of the second basic unit 110B are compared with each other. When the difference between the distance Cn and the distance A2 is within the input deviation value, it is determined to be a normal stack, and when the difference is outside the input deviation value, it is determined to be a defective stack. In addition, the criteria for determining a normal or defective stack are the same as in the above step (g).

[0130] In addition, step (k) includes a full-length inspection process for inspecting the alignment of the second basic unit and the n-th basic unit in the full-length direction. In the full-length inspection process, the distance Fn and the distance D2 of the second basic unit 110B are compared with each other. When the difference between the distance Fn and the distance D2 is within the input deviation value, it is determined to be a normal stack, and when the difference is outside the input deviation value, it is determined to be a defective stack. In addition, the criteria for determining a normal or defective stack are the same as in the above step (g).

[0131] Therefore, in the method of manufacturing an electrode assembly according to the first embodiment of the present invention, a plurality of radical units 110 may be stacked up and down to manufacture the electrode assembly 100 having an improved stacking alignment as described above.

[0132] Hereinafter, in describing another embodiment of the present invention, configurations and methods having the same functions and methods as those of the aforementioned embodiment will be given the same reference numerals in the drawings, and thus repeated description will be omitted.

[0133] [Method of Manufacturing Secondary Battery According to Second Embodiment of the Present Invention]

[0134] like Fig.12 As shown in , the method for manufacturing a secondary battery according to the second embodiment of the present invention includes: step (A), manufacturing an electrode assembly 100; and step (B), accommodating the electrode assembly 100 in a battery case 120 and injecting an electrolyte into the battery case 120 to manufacture the secondary battery 10.

[0135] Here, step (A) is the same as the method of manufacturing the electrode assembly according to the above-described first embodiment, and thus repeated description will be omitted.

[0136] Therefore, in the method of manufacturing a secondary battery according to the second embodiment of the present invention, the secondary battery 10 including the electrode assembly 100 having improved alignment may be manufactured, thereby significantly reducing the occurrence of defects and improving commodity value.

[0137] Therefore, the scope of the present invention is defined by the appended claims rather than by the foregoing description and the exemplary embodiments described herein. Various modifications made within the equivalent meaning of the claims of the present invention and within the claims should be considered to be within the scope of the present invention.

[0138] [Description of Reference Numbers]

[0139] 100: Electrode assembly

[0140] 110: Basic unit

[0141] 120: Battery housing.

Claims

1. A method for manufacturing an electrode assembly, the method include: Step (a), transferring the uppermost basic unit among a plurality of basic units in which a first electrode, a diaphragm, a second electrode and a diaphragm are sequentially stacked and loaded in a loading box to a first set position and transferring the basic unit at the first set position to a second set position, and then transferring all the basic units in the above manner; Step (b), comprising a process of measuring distance A, in which the basic unit is photographed at the first set position to measure distance A1, distance A2 and distance An, wherein distance A1 is the distance between the full-width end of the first electrode arranged in the photographed first basic unit, that is, the end in the full-width direction, and the full-width end of the second electrode arranged in the photographed first basic unit, that is, the end in the full-width direction; distance A2 is the distance between the full-width end of the first electrode arranged in the photographed second basic unit, that is, the end in the full-width direction, and the full-width end of the second electrode arranged in the photographed second basic unit, that is, the end in the full-width direction; distance An is the distance between the full-width end of the first electrode arranged in the photographed nth basic unit, that is, the end in the full-width direction, and the full-width end of the second electrode arranged in the photographed nth basic unit, that is, the end in the full-width direction; Step (c), comprising a process of measuring the distance B1, in which when the first basic unit whose distance A1 is measured is transferred to the second set position, the distance B1 from the reference point (O) of the second set position to the full-width end of the first electrode of the first basic unit is measured; Step (d), stacking the second basic unit transferred from the first setting position to the second setting position on the first basic unit; Step (e), comprising the step of measuring a distance B2 from the reference point (O) of the second set position to the full width end of the first electrode of the second basic unit; Step (f), comprising the process of measuring a distance C1 between the full-width end of the first electrode of the first basic unit and the full-width end of the second electrode of the second basic unit by adding the distance B2 and the distance A2 to each other and then subtracting the distance B1 from the sum of the distance B2 and the distance A2; as well as Step (g) includes a full-width inspection process, in which the distance C1 and the distance A1 are compared with each other. When the difference value between the distance C1 and the distance A1 is within the input deviation value, it is determined to be a normal stack; when the difference value is outside the input deviation value, it is determined to be a defective stack.

2. The method according to claim 1, wherein the step (b) further includes the following process: when the distance A1 measured in the process of measuring the distance A1 is within the input set value, it is judged as a normal stack; when the distance A1 is outside the input set value, it is judged as a defective stack.

3. The method according to claim 2, wherein the step (b) further comprises the process of removing the basic unit so as not to be transferred to the second setting position when it is determined that the basic unit is defective at the first setting position.

4. The method according to claim 1, in, In the step (b), a distance between the full-width end of the first electrode of the base unit and the full-width end of the second electrode of the base unit is measured at the first set position by using a vision alignment tester.

5. The method according to claim 1, wherein the step (c) further comprises the following steps: checking whether the reference point (O) of the second setting position and the reference point of the first basic unit are consistent with each other, The reference point of the first basic unit is a point where a line that divides the first basic unit equally in a full width direction and a line that divides the first basic unit equally in a full length direction intersect each other.

6. The method according to claim 5, wherein the step (c) further comprises the following process: when the reference point (O) of the second set position is inconsistent with the reference point of the first basic unit, the first basic unit is moved so that the reference point (O) of the second set position is consistent with the reference point of the first basic unit.

7. The method according to claim 1, wherein the step (g) further comprises the following process: when a defective stack is determined in the full-width inspection process, adjusting the position of the second basic unit by a difference value obtained by comparing the distance C1 with the distance A1 of the first basic unit.

8. The method according to claim 1, in, In the step (a), the first electrode has an area smaller than that of the second electrode. 9 . The method according to claim 1 , wherein the step (g) further comprises the following process: when it is determined to be a normal stack, combining the first base unit and the second base unit with each other.

10. The method according to claim 1, further comprising: include: Step (h), after step (g), stacking the nth basic unit transferred from the first setting position to the second setting position on the second basic unit; Step (i), comprising the step of measuring a distance Bn from the reference point (O) at the second set position to the full width end of the first electrode of the nth basic unit; Step (j), comprising the process of measuring a distance Cn between the full-width end of the first electrode of the second basic unit and the full-width end of the second electrode of the nth basic unit by adding the distance Bn and the distance An to each other and then subtracting the distance B2 from the sum of the distance Bn and the distance An; as well as Step (k), comparing the distance Cn with the distance A2 of the second basic unit, when the difference between the distance Cn and the distance A2 is within the input deviation value, it is determined to be a normal stack, and when the difference is outside the input deviation value, it is determined to be a defective stack.

11. According to the method of claim 10, the step (b) further comprises a process of measuring the distance D, in which the distance D1, the distance D2 and the distance Dn are measured, the distance D1 being the distance between the full-length end of the first electrode arranged in the first basic unit to be photographed, that is, the end in the full-length direction and the full-length end of the second electrode arranged in the first basic unit to be photographed, that is, the end in the full-length direction; the distance D2 being the distance between the full-length end of the first electrode arranged in the second basic unit to be photographed, that is, the end in the full-length direction and the full-length end of the second electrode arranged in the second basic unit to be photographed, that is, the end in the full-length direction; the distance Dn being the distance between the full-length end of the first electrode arranged in the nth basic unit to be photographed, that is, the end in the full-length direction and the full-length end of the second electrode arranged in the nth basic unit to be photographed, that is, the end in the full-length direction, The step (c) further comprises the following steps: when the first basic unit is transferred to the second setting position, measuring the distance E1 from the reference point (O) at the second setting position to the full-length end of the first electrode of the first basic unit, The step (e) further includes a process of measuring a distance E2 from the reference point (O) of the second set position to the full-length end of the first electrode of the second basic unit, The step (f) further includes the process of measuring a distance F1 between the full-length end of the first electrode of the first basic unit and the full-length end of the second electrode of the second basic unit by adding the distance E2 and the distance D2 of the second basic unit to each other and then subtracting the distance E1 from the sum of the distance E2 and the distance D2, and The step (g) further includes a full-length inspection process, in which the distance F1 is compared with the distance D1 of the first basic unit. When the difference value between the distance F1 and the distance D1 is within the input deviation value, it is determined to be a normal stack; when the difference value is outside the input deviation value, it is determined to be a defective stack.

12. The method according to claim 11, wherein the step (g) further comprises the following process: when a defective stack is determined in the full-length inspection process, the position of the second basic unit is adjusted by a difference value obtained by comparing the distance F1 with the distance D1 of the first basic unit.

13. The method according to claim 11, wherein the step (i) further comprises a process of measuring a distance En from the reference point (O) of the second set position to the full-length end of the first electrode of the nth basic unit, The step (j) further includes the process of measuring a distance Fn between the full-length end of the first electrode of the second basic unit and the full-length end of the second electrode of the nth basic unit by adding the distance En and the distance Dn of the nth basic unit to each other and then subtracting the distance E2 from the sum of the distance En and the distance Dn, and The step (k) further includes the following process: comparing the distance Fn with the distance D2 of the second basic unit, and when the difference between the distance Fn and the distance D2 is within the input deviation value, it is determined to be a normal stack; when the difference is outside the input deviation value, it is determined to be a defective stack.

14. A method for manufacturing a secondary battery, the method include: Step (A), manufacturing an electrode assembly according to the method for manufacturing an electrode assembly according to any one of claims 1 to 13; and Step (B) of housing the electrode assembly in a battery case and injecting an electrolyte into the battery case to manufacture the secondary battery.

15. A device for manufacturing an electrode assembly, the device include: a loading box in which a plurality of basic units in which a first electrode, a separator, a second electrode, and a separator are sequentially stacked are loaded in an up-and-down direction; a conveying member configured to convey the uppermost basic unit among the basic units loaded in the loading box to a first setting position (H1) and to convey the basic unit at the first setting position (H1) to a second setting position (H2); a first measuring member configured to measure a distance A1 from an end of a first electrode disposed in a firstly transported basic unit located at the first set position (H1) to an end of a second electrode disposed in the basic unit, and a distance A2 from an end of a first electrode disposed in a secondly transported basic unit located at the first set position (H1) to an end of the second electrode disposed in the basic unit; as well as A second measuring member, the second measuring member is configured to measure the basic unit that is first transferred to the second set position (H2), wherein a distance B1 from a reference point (O) of the second set position (H2) to an end of a first electrode of the basic unit that is first transferred is measured, and a distance B2 from the reference point (O) of the second set position (H2) to an end of a first electrode of the basic unit that is second transferred and stacked on the basic unit that is first transferred is measured, and a distance C1 between an end of the first electrode of the basic unit that is first transferred and an end of a second electrode of the basic unit that is second transferred is measured by adding the distance B2 and the distance A2 of the basic unit that is second transferred to each other, and then subtracting the distance B1 of the basic unit that is first transferred from the sum of the distance B2 and the distance A2, and the distance C1 is compared with the distance A1 of the basic unit that is first transferred, and when a difference value between the distance C1 and the distance A1 is within an input deviation value, it is determined to be a normal stack, and when the difference value is outside the input deviation value, it is determined to be a defective stack.

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