A production test fixture refresh optimization method and system

Abstract

The present invention discloses a refresh optimization method for a production test fixture, including the steps of: establishing a communication connection between the production test fixture and the driver IC of the product to be tested; if the production test fixture receives a display refresh request of the driver IC, adjusting the display frame rate of the product to be tested to a first specified threshold; if the production test fixture reads a refresh completion mark, adjusting the display frame rate to a second specified threshold; and also discloses an optimization system. By monitoring the data transmission during the refresh process of the display screen of the product to be tested and the production test fixture on the production test fixture, the display frame rate is adjusted when the display screen is refreshed, the mipi speed is reduced, and the display abnormality of the product to be tested is avoided during the refresh. After the refresh is completed, the display frame rate is adjusted to the maximum value to ensure the accuracy of the display screen detection.

Description

Technical Field

[0001] The present invention relates to the field of touch screen production and testing technology, and in particular to a production and testing fixture refresh optimization method and system. Background Art

[0002] With the development of the electronic technology industry, providing electronic products with higher display panel refresh rates has become the development direction of the display industry. In game and video application scenarios such as mobile phones and VR products, higher display panel refresh rates will also bring users a better user experience.

[0003] In the prior art, the refresh of the display panel mainly relies on a step-by-step scanning circuit. Under the control of the step-by-step scanning circuit, the scanning signal will trigger the scanning units of each row one by one starting from the first row of the display panel until the last row of scanning units is triggered. At this time, the display panel is said to have completed one refresh.

[0004] During the production test process, when the product display screen is displaying, the data is first transmitted from the production test fixture to the driver IC of the product display screen, and then the driver IC displays the data on the display screen, thus forming the image we see.

[0005] Generally speaking, the higher the resolution of the product display, the larger the amount of data that needs to be transmitted. Relatively speaking, the transmission speed of display data from the production test fixture to the product driver IC is slower than the speed of data from the product driver IC to its display. Therefore, the screen distortion problem that occurs when the screen is refreshed during the production line test is caused by the lagging transmission speed of the production test data.

[0006] The resolution of display modules of products on the market is getting higher and higher. The increase in display resolution has led to an increase in the amount of mipi data required for the normal operation of the display.

[0007] The data transmission speed of the display production and testing fixtures currently used in the module industry can no longer meet the requirements of high-resolution data transmission of product display modules. Even when the mipi transmission speed of the production and testing fixture is adjusted to the maximum, there will still be slight screen distortion during the screen refresh process. Summary of the invention

[0008] In the prior art, the data transmission speed of the production and testing fixture cannot meet the requirements of high-resolution data transmission of the product display module, resulting in a screen distortion phenomenon on the product display screen during the screen refresh process.

[0009] In view of the above problems, a production test fixture refresh optimization method and system are proposed. By monitoring the data transmission of the display screen of the product to be tested and the refresh process of the production test fixture on the production test fixture, the display frame rate is adjusted when the display screen is refreshed, and the mipi speed is reduced to avoid the display abnormality of the product to be tested during the refresh. After the refresh is completed, the display frame rate is adjusted to the maximum value to ensure the accuracy of the display screen detection.

[0010] In a first aspect, a production test fixture refresh optimization method includes:

[0011] Step 10: Establish a communication connection between the production test fixture and the driver IC of the product to be tested;

[0012] Step 20: If the production test fixture receives the driver IC display refresh request, the display frame rate of the product to be tested is adjusted to a first specified threshold;

[0013] Step 30: If the production test fixture reads the refresh completion flag, the display frame rate is adjusted to a second specified threshold;

[0014] Wherein, the first prescribed threshold is the critical display frame rate of abnormal display of the display screen of the product to be tested;

[0015] The second specified threshold is the maximum display frame rate of the product to be tested.

[0016] In conjunction with the production test fixture refresh optimization method of the present invention, in a first possible implementation manner, step 10 includes:

[0017] Step 11, the production test fixture communicates with the driver IC of the product to be tested through the IIC protocol;

[0018] Step 12: The driver IC of the product to be tested is electrically connected to the display screen.

[0019] In combination with the first possible implementation manner of the present invention, in a second possible implementation manner, step 20 includes:

[0020] Step 21, monitoring the current display status of the display screen of the product to be tested;

[0021] Step 22: If the display screen shows abnormality, monitor the current display frame rate;

[0022] Step 23, obtaining a critical display frame rate of display abnormality;

[0023] Step 24, using the critical display frame rate as a first prescribed threshold;

[0024] The critical display frame rate is the screen frame rate before the display screen displays an abnormality.

[0025] In combination with the second possible implementation manner of the present invention, in a third possible implementation manner, the step 20 further includes:

[0026] Step 25, obtaining the display screen refresh time T from the driver IC of the product to be tested;

[0027] Step 26: Obtain a third prescribed threshold value of the mipi speed of the production test fixture according to the display frame rate;

[0028] Step 27, the production test fixture transmits display data to the driver IC of the product to be tested at the third specified threshold within the refresh time T;

[0029] The third specified threshold is a mipi speed corresponding to a second fixed threshold of a display frame rate.

[0030] In combination with the third possible implementation manner of the present invention, in a fourth possible implementation manner, step 30 includes:

[0031] Step 31, monitoring the display data transmitted within the refresh time T;

[0032] Step 32: If the data transmission is completed, a refresh completion flag is transmitted to the production test fixture;

[0033] Step 33: The production test fixture stops refreshing data transmission according to the completion mark.

[0034] In combination with the fourth possible implementation manner of the present invention, in a fifth possible implementation manner, step 32 includes:

[0035] Step 321, comparing the transmitted display data with the predetermined refresh data;

[0036] Step 322: If the transmission is completed, mark the refresh data transmission;

[0037] Step 323: Transmit the mark to a control unit in the production test fixture.

[0038] In combination with the fifth possible implementation manner of the present invention, in a sixth possible implementation manner, step 30 further includes:

[0039] Step 34, the driver IC of the product to be tested reads the completion mark;

[0040] Step 35: If the display data transmission is completed, the display frame rate of the product display screen is adjusted to the maximum value.

[0041] In the second aspect, a production test fixture refresh optimization system includes:

[0042] Production test fixture;

[0043] The product to be tested;

[0044] The production test fixture is connected to the product to be tested through the IIC protocol to transmit display data;

[0045] The production test fixture includes:

[0046] Production test control unit

[0047] Adjustment unit;

[0048] The first monitoring unit;

[0049] The production test control unit is used to transmit instructions to each functional unit;

[0050] The adjustment unit is used for:

[0051] When receiving the display refresh request of the driver IC, adjusting the display frame rate of the product to be tested to a first specified threshold;

[0052] When a refresh completion flag is read, the display frame rate is adjusted to a second specified threshold;

[0053] The first monitoring unit is used to monitor the data transmission during the refreshing process;

[0054] Wherein, the first prescribed threshold is the critical display frame rate of abnormal display of the display screen of the product to be tested;

[0055] The second specified threshold is the maximum display frame rate of the product to be tested.

[0056] In conjunction with the production test fixture refresh optimization system described in the second aspect, in a first possible implementation manner, the production test fixture further includes:

[0057] Second monitoring unit;

[0058] Marking unit;

[0059] The second monitoring unit is used to monitor the display frame rate of the product to be tested and transmit it to the production test control unit in the production test fixture in real time;

[0060] The marking unit is used to generate a display data transmission completion mark during the refresh process.

[0061] In combination with the first possible implementation manner of the second aspect, in a second possible implementation manner, the production testing jig further includes:

[0062] Reading unit;

[0063] The reading unit is used to read the completion mark content and transmit it to the production test control unit in the production test fixture.

[0064] The production test fixture refresh optimization method and system of the present invention is implemented to monitor the data transmission of the display screen of the product to be tested and the production test fixture refresh process on the production test fixture, adjust the display frame rate when refreshing the display screen, reduce the mipi speed, and avoid the occurrence of abnormal display of the product to be tested during the refresh. After the refresh is completed, the display frame rate is adjusted to the maximum value to ensure the accuracy of the display screen detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0065] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0066] Figure 1 It is a schematic diagram of a first embodiment of a production test fixture refresh optimization method in the present invention;

[0067] Figure 2 It is a schematic diagram of a second embodiment of the production test fixture refresh optimization method of the present invention;

[0068] Figure 3 It is a schematic diagram of a third embodiment of the production test fixture refresh optimization method of the present invention;

[0069] Figure 4 It is a schematic diagram of a fourth embodiment of the production test fixture refresh optimization method of the present invention;

[0070] Figure 5 It is a schematic diagram of a fifth embodiment of the production test fixture refresh optimization method of the present invention;

[0071] Figure 6 It is a schematic diagram of a sixth embodiment of the production test fixture refresh optimization method of the present invention;

[0072] Figure 7 It is a schematic diagram of the seventh embodiment of the production test fixture refresh optimization method of the present invention;

[0073] Figure 8 It is a schematic diagram of a first embodiment of a production test fixture refresh optimization system in the present invention;

[0074] Fig. 9 It is a schematic diagram of a second embodiment of the production and testing fixture refresh optimization system of the present invention;

[0075] The names of the parts indicated by the numbers in the accompanying drawings are: 100 - production test fixture, 200 - driver IC of the product to be tested, 110 - production test control unit, 120 - first monitoring unit, 130 - adjustment unit, 140 - second monitoring unit, 150 - marking unit, 160 - reading unit. DETAILED DESCRIPTION

[0076] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0077] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0078] The data transmission speed of the display production test fixture 100 currently used in the module industry can no longer meet the requirements of high-resolution data transmission of product display modules. Even when the transmission speed of the production test fixture 100mipi is adjusted to the maximum, there will still be slight screen distortion during the screen refresh process.

[0079] The data transmission speed of the production test fixture 100 cannot meet the requirements of high-resolution data transmission of the product display module, resulting in a screen distortion phenomenon on the product display screen during the screen refresh process.

[0080] In view of the above problems, a method and system for refreshing and optimizing a production test fixture 100 are proposed.

[0081] First, as Figure 1 , Figure 1 It is a schematic diagram of the first embodiment of the refresh optimization method of the production test fixture 100 in the present invention, a refresh optimization method of the production test fixture 100, including: step 10, establishing a communication connection between the production test fixture 100 and the driver IC 200 of the product to be tested; step 20, if the production test fixture 100 receives a display refresh request from the driver IC 200, the display frame rate of the product to be tested is adjusted to the first specified threshold; step 30, if the production test fixture 100 reads the refresh completion mark, the display frame rate is adjusted to the second specified threshold; wherein the first specified threshold is the critical display frame rate of the abnormal display of the display screen of the product to be tested; the second specified threshold is the maximum display frame rate of the product to be tested. By monitoring the data transmission during the refresh process of the display screen of the product to be tested and the production test fixture 100 on the production test fixture 100, the display frame rate is adjusted when the display screen is refreshed, the mipi speed is reduced, and the display abnormality of the product to be tested is avoided during the refresh. After the refresh is completed, the display frame rate is adjusted to the maximum value to ensure the accuracy of the display screen detection.

[0082] The first specified threshold is the critical display frame rate before the display screen of the product to be tested becomes distorted. Lowering the display frame rate is beneficial to reducing the mipi speed of data transmission and avoiding distorted display screens. When the refresh is completed, this is an important time for employees to detect display screen products. At this time, the display frame rate is increased to the maximum value to ensure the detection effect.

[0083] Preferably, if Figure 2 , Figure 2 It is a schematic diagram of the second embodiment of the refresh optimization method of the production test fixture 100 in the present invention, and step 10 includes: step 11, the production test fixture 100 communicates with the driver IC 200 of the product to be tested through the IIC protocol; step 12, the driver IC 200 of the product to be tested is electrically connected to the display screen.

[0084] The production test fixture 100 communicates with the driver IC 200 of the product to be tested through the IIC protocol to transmit display data. The driver IC 200 is connected to the display screen, and data transmission can also be performed through other methods.

[0085] Preferably, if Figure 3 , Figure 3 It is a schematic diagram of the third embodiment of the refresh optimization method of the production test fixture 100 in the present invention, and step 20 includes: step 21, monitoring the current display state of the display screen of the product to be tested; step 22, if the display screen displays an abnormality, monitoring the current display frame rate; step 23, obtaining the critical display frame rate of the display abnormality; step 24, using the critical display frame rate as the first prescribed threshold; wherein the critical display frame rate is the screen display frame rate before the display screen displays an abnormality.

[0086] When refreshing the screen, lowering the display frame rate of the product to be tested and reducing the mipi speed from the production test fixture 100 to the driver IC 200 of the product to be tested is helpful to avoid the screen scratching problem. After the screen is refreshed, the display frame rate of the product to be tested is increased. This is the best stage for the inspector to detect the performance of the display screen. Only by increasing the display frame rate can the accuracy of the display detection be guaranteed.

[0087] Preferably, if Figure 4 , Figure 4 It is a schematic diagram of the fourth embodiment of the refresh optimization method of the production test fixture 100 in the present invention. Step 20 also includes: step 25, obtaining the display screen refresh time T from the driver IC200 of the product to be tested; step 26, obtaining the third specified threshold of the mipi speed of the production test fixture 100 according to the display frame rate; step 27, the production test fixture 100 transmits display data to the driver IC200 of the product to be tested within the refresh time T at the third specified threshold.

[0088] Preferably, if Figure 5 , Figure 5It is a schematic diagram of the fifth embodiment of the refresh optimization method of the production test fixture 100 in the present invention, and step 30 includes: step 31, monitoring the display data transmitted within the refresh time T; step 32, if the display data transmission is completed, transmitting the refresh completion mark to the production test fixture 100; step 33, the production test fixture 100 stops refreshing the data transmission according to the completion mark.

[0089] Preferably, if Figure 6 , Figure 6 It is a schematic diagram of the sixth embodiment of the refresh optimization method of the production test fixture 100 in the present invention, and step 32 includes: step 321, comparing the transmitted display data with the predetermined refresh data; step 322, if the transmission is completed, marking the refresh data transmission; step 323, transmitting the mark to the control unit in the production test fixture 100.

[0090] Preferably, if Figure 7 , Figure 7 It is a schematic diagram of the seventh embodiment of the refresh optimization method of the production test fixture 100 in the present invention, and step 30 also includes: step 34, the driver IC200 of the product to be tested reads the completion mark; step 35, if the display data transmission is completed, the display frame rate of the product display screen is adjusted to the maximum value.

[0091] Second, as Figure 8 and 9 , Figure 8 1 is a schematic diagram of a first embodiment of a refresh optimization system for a production test fixture 100 in the present invention. Fig. 9 It is a schematic diagram of the second embodiment of the refresh optimization system of the production test fixture 100 in the present invention; a refresh optimization system of the production test fixture 100, including the production test fixture 100 and a product to be tested; the production test fixture 100 communicates with the product to be tested through the IIC protocol to transmit display data; the production test fixture 100 includes a production test control unit 110, an adjustment unit 130, and a first monitoring unit 120; the production test control unit 110 is used to transmit instructions to each functional unit; the adjustment unit 130 is used to adjust the display frame rate of the product to be tested to a first specified threshold when receiving a display refresh request from the driver IC 200, and adjust the display frame rate to a second specified threshold when a refresh completion flag is read; the first monitoring unit 120 is used to monitor data transmission during the refresh process; wherein the first specified threshold is the critical display frame rate of the abnormal display of the display screen of the product to be tested; the second specified threshold is the maximum display frame rate of the product to be tested.

[0092] Preferably, the production test fixture 100 also includes a second monitoring unit 140 and a marking unit 150; the second monitoring unit 140 is used to monitor the display frame rate of the product to be tested and transmit it to the production test control unit 110 in the production test fixture 100 in real time; the marking unit 150 is used to generate a display data transmission completion mark during the refresh process.

[0093] Preferably, the production test fixture 100 further includes a reading unit 160 ; the reading unit 160 is used to read the completion mark content and transmit it to the production test control unit 110 in the production test fixture 100 .

[0094] The refresh optimization method and system of the production test fixture 100 of the present invention is implemented, by monitoring the display screen of the product to be tested and the data transmission during the refresh process of the production test fixture 100, adjusting the display frame rate when refreshing the display screen, reducing the mipi speed, and avoiding the occurrence of abnormal display of the product to be tested during the refresh. After the refresh is completed, the display frame rate is adjusted to the maximum value to ensure the accuracy of the display screen detection.

[0095] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A production test fixture refresh optimization method, characterized in that: include: Step 10: Establish a communication connection between the production test fixture and the driver IC of the product to be tested; Step 20: If the production test fixture receives the driver IC display refresh request, the display frame rate of the product to be tested is adjusted to a first specified threshold; Step 30: If the production test fixture reads the refresh completion flag, the display frame rate is adjusted to a second specified threshold; Wherein, the first prescribed threshold is the critical display frame rate of abnormal display of the display screen of the product to be tested; The second specified threshold is the maximum display frame rate of the product to be tested.

2. The production test fixture refresh optimization method according to claim 1 is characterized in that: The step 10 comprises: Step 11, the production test fixture communicates with the driver IC of the product to be tested through the IIC protocol; Step 12: The driver IC of the product to be tested is electrically connected to the display screen.

3. The production test fixture refresh optimization method according to claim 2 is characterized in that: The step 20 comprises: Step 21, monitoring the current display status of the display screen of the product to be tested; Step 22: If the product display screen displays abnormally, monitor the current display frame rate; Step 23, obtaining a critical display frame rate of display abnormality; Step 24, using the critical display frame rate as a first prescribed threshold; The critical display frame rate is the screen frame rate before the product display screen displays an abnormality.

4. The production test fixture refresh optimization method according to claim 3 is characterized in that: The step 20 further comprises: Step 25, obtaining the display screen refresh time T from the driver IC of the product to be tested; Step 26: Obtain a third prescribed threshold value of the mipi speed of the production test fixture according to the display frame rate; Step 27, the production test fixture transmits display data to the driver IC of the product to be tested at the third specified threshold within the refresh time T; The third specified threshold is a mipi speed corresponding to a second fixed threshold of a display frame rate.

5. The production test fixture refresh optimization method according to claim 4 is characterized in that: The step 30 comprises: Step 31, monitoring the display data transmitted within the refresh time T; Step 32: If the data transmission is completed, a refresh completion flag is transmitted to the production test fixture; Step 33: The production test fixture stops transmitting refresh data according to the completion mark.

6. The production test fixture refresh optimization method according to claim 5, characterized in that: The step 32 comprises: Step 321, comparing the transmitted display data with the predetermined refresh data; Step 322: If the transmission is completed, mark the refresh data transmission; Step 323: Transmit the mark to a control unit in the production test fixture.

7. The production test fixture refresh optimization method according to claim 6 is characterized in that: The step 30 further comprises: Step 34, the driver IC of the product to be tested reads the completion mark; Step 35: If the display data transmission is completed, the display frame rate of the product display screen is adjusted to the maximum value.

8. A production test fixture refresh optimization system, using the optimization method described in any one of claims 1 to 7, characterized in that: include: Production test fixture; The product to be tested; The production test fixture is connected to the product to be tested through the IIC protocol to transmit display data; The production test fixture includes: Production test control unit Adjustment unit; The first monitoring unit; The production test control unit is used to transmit instructions to each functional unit; The adjustment unit is used for: When receiving the display refresh request of the driver IC, adjusting the display frame rate of the product to be tested to a first specified threshold; When a refresh completion flag is read, the display frame rate is adjusted to a second specified threshold; The first monitoring unit is used to monitor the data transmission during the refreshing process; Wherein, the first prescribed threshold is the critical display frame rate of abnormal display of the display screen of the product to be tested; The second specified threshold is the maximum display frame rate of the product to be tested.

9. The production test fixture refresh optimization system according to claim 8, characterized in that: The production test fixture also includes: Second monitoring unit; Marking unit; The second monitoring unit is used to monitor the display frame rate of the product to be tested and transmit it to the production test control unit in the production test fixture in real time; The marking unit is used to generate a display data transmission completion mark during the refresh process.

10. The production test fixture refresh optimization system according to claim 9, characterized in that: The production test fixture also includes: Reading unit; The reading unit is used to read the completion mark content and transmit it to the production test control unit in the production test fixture.

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