Dielectric constant measuring device based on waveguide structure
A dielectric constant and measuring device technology, which is applied in the field of dielectric constant measuring devices based on waveguide structures, can solve the problems of signal transmission interference, impossibility, and high cost, and achieve simplified calculation process, high precision and high precision Effect
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2022-07-19
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Abstract
Description
technical field
[0001] The invention relates to the technical field of microwave measurement, in particular to a dielectric constant measurement device based on a waveguide structure. Background technique
[0002] The application of microwave is mainly in the application of information transmission and microwave energy. Microwave measurement technology is also one of the main applications of microwave. It is the basis and important part of microwave applications. Electromagnetic materials are widely used in civil, industrial and national defense fields. Its electromagnetic parameters have an important influence on the performance and indicators of the device. Among them, the dielectric constant is the most important parameter in the electromagnetic parameters. Therefore, it is particularly important to measure the dielectric constant of the material. There are many methods for measuring the dielectric constant, which have spread throughout the industry. , civil and national ...
Examples
Embodiment Construction
[0026] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0027] see Figure 1-6 , a dielectric constant measurement device based on a waveguide structure,
[0028] Step 1: Carry out modeling and simulation analysis in CST, adjust the model structure, and test the rationality of the data, make devices according to the simulation model and build an experimental platform,
[0029]Step 2: First calibrate the reflectometer 1, and calculate the calibration constant of the reflectometer 1. It is ...