A sample analysis system and sample scheduling method thereof

Abstract

A sample analysis system and a sample scheduling method thereof, the sample scheduling method comprising obtaining a scheduling threshold of an analysis device (30); obtaining a load condition of a front track area of the analysis device (30); if the load of the front track area of the analysis device (30) is less than or equal to the scheduling threshold of the analysis device (30), controlling the scheduling of samples that currently need to enter the front track area of the analysis device (30) to be sampled to the front track area of the analysis device (30); and if the load of the front track area of the analysis device (30) is greater than the scheduling threshold of the analysis device (30), controlling the scheduling of samples that currently need to enter the front track area of the analysis device (30) to wait in a buffer area.

Description

Technical Field

[0001] The present invention relates to a sample analysis system and a sample scheduling method thereof. Background Art

[0002] With the demand for large numbers of samples to be measured, in order to meet high throughput and reduce time, sample analysis systems consisting of multiple sample analysis devices have emerged. For such systems including multiple analysis devices, the samples to be tested are generally input uniformly at the front end of the system (such as the input module at the front end of the system), and then the system distributes the samples to be tested in sequence to one or more corresponding analysis devices for testing. Specifically, the system generally introduces a track to connect the input module and each analysis device, so that the sample can reach any analysis device through the track from the input module for testing.

[0003] To prevent some analysis devices from being too busy and others from being too idle, the system typically plans and dispatches the samples to be tested to the appropriate analysis devices based on the principle of load balancing. For example, in a batch of samples currently to be tested, both analysis devices 1 and 2 must be tested. Therefore, a portion of this batch can be scheduled to be tested on analysis device 1 first, followed by analysis device 2, while the remaining portion can be scheduled to be tested on analysis device 2 first, followed by analysis device 1. Therefore, neither analysis device 1 nor analysis device 2 is idle, and from this perspective, testing efficiency is relatively improved.

[0004] The system plans and dispatches the samples to be tested to the corresponding analysis equipment based on the principle of load balancing, which is sometimes not flexible enough. Some new planning and scheduling principles need to be invented and proposed. SUMMARY OF THE INVENTION

[0006] Technical issues

[0007] The present invention mainly provides a sample analysis system and a sample scheduling method thereof.

[0008] Solution to the problem

[0009] Technical Solutions

[0010] According to a first aspect, an embodiment provides a sample scheduling method for a sample analysis system, wherein the sample analysis system has a buffer area and includes a plurality of analysis devices, and the sample scheduling method includes:

[0011] Get the scheduling threshold of the analysis device;

[0012] Obtain the load condition of the front track area of the analysis equipment;

[0013] If the load of the front track area of the analysis device is less than or equal to the scheduling threshold of the analysis device, the control dispatches the sample that currently needs to enter the front track area of the analysis device to be sampled to the front track area of the analysis device;

[0014] If the load of the front-end track area of the analysis device is greater than the scheduling threshold of the analysis device, the control makes the samples that currently need to enter the front-end track area of the analysis device wait in the buffer area.

[0015] In one embodiment, the sample scheduling method further includes: obtaining and determining a scheduling plan for the sample to be tested based on the project information of the sample to be tested; wherein the scheduling plan at least includes a target analysis device required to perform project detection on the sample to be tested and a path for the sample to be tested to reach its target analysis device.

[0016] In one embodiment, obtaining and determining a scheduling plan for the sample to be tested based on the project information of the sample to be tested includes:

[0017] Receive and obtain project information of samples to be tested;

[0018] Controlling the dispatching of samples to be tested to the buffer area for temporary storage;

[0019] According to the project information of the samples to be tested, the scheduling plan of each sample to be tested in the buffer area is determined.

[0020] In one embodiment, determining the scheduling plan for each sample to be tested in the cache area based on the project information of the sample to be tested includes: after obtaining the project information of the sample to be tested, determining the scheduling plan for each sample to be tested based on the principle of load balancing of the analysis device.

[0021] In one embodiment, after the control makes the sample that currently needs to enter the front track area of the analysis device wait in the buffer area, it is also determined whether the load of the front track area of other target analysis devices for the sample is less than or equal to the scheduling threshold. If so, the control dispatches the sample to the front track area of the corresponding other target analysis devices for sampling.

[0022] In one embodiment, after the control makes the sample that currently needs to enter the front track area of the analysis device wait in the buffer area, it is also determined whether the front track area of other target analysis devices for the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the control dispatches the sample to the front track area of the corresponding other target analysis devices for sampling.

[0023] In one embodiment, the sample scheduling method further includes: determining whether the front track area of the analysis device is fully loaded; when it is determined to be fully loaded, directly controlling the samples that currently need to enter the front track area of the analysis device to be sucked to wait in the buffer area.

[0024] In one embodiment, after directly controlling the sample that currently needs to enter the front track area of the analysis device to be sampled to wait in the buffer area, it is also determined whether the front track area of other target analysis devices for the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the sample is controlled to be scheduled to the front track area of the corresponding other target analysis devices to be sampled.

[0025] In one embodiment, the scheduling threshold of the analysis device is determined by the analysis speed of each configured project of the analysis device.

[0026] In one embodiment, the scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each configured project, including: multiplying the analysis speed of the analysis device for each configured project by the corresponding weight and then summing the results, and then determining the scheduling threshold of the analysis device based on the sum.

[0027] In one embodiment, the weight of an item of the analysis device is negatively correlated with the analysis speed of the item by the analysis device.

[0028] According to a second aspect, an embodiment provides a sample analysis system, comprising:

[0029] An input component for receiving a sample to be tested;

[0030] A plurality of analysis devices, each of which is used to test a sample; each of the analysis devices has a front track area, and the front track area is provided with a sample suction position;

[0031] Tracks for connecting input components and various analysis devices;

[0032] a dispatching device for dispatching the sample from the input component to the front track area of the corresponding analysis device via the track;

[0033] A buffer area for caching samples; and

[0034] The processor is used to obtain a scheduling threshold of the analysis device and the load of the front-end track area of the analysis device; the processor controls the scheduling of samples that currently need to enter the front-end track area of the analysis device to be sampled based on the relationship between the scheduling threshold of the analysis device and the load of the front-end track area of the analysis device.

[0035] In one embodiment, the processor controls the scheduling of samples that currently need to enter the front track area of the analysis device for sampling based on the relationship between the scheduling threshold of the analysis device and the load of the front track area of the analysis device, including:

[0036] When the load of the front track area of the analysis device is less than or equal to the scheduling threshold of the analysis device, the processor controls the scheduling of samples that currently need to enter the front track area of the analysis device for sampling to the front track area of the analysis device;

[0037] When the load of the front track area of the analysis device is greater than the scheduling threshold of the analysis device, the processor controls the samples that currently need to enter the front track area of the analysis device to wait in the buffer area.

[0038] In one embodiment, the cache area is set in the input component; the processor obtains the project information of the sample to be tested and controls the input component to schedule the sample to be tested to the cache area for temporary storage; the processor determines the scheduling plan for each sample to be tested in the cache area based on the project information of the sample to be tested, wherein the scheduling plan at least includes the target analysis device that needs to perform its project detection on the sample to be tested and the path for the sample to be tested to reach its target analysis device.

[0039] In one embodiment, the processor controls the sample that currently needs to enter the front track area of the analysis device to wait in the cache area, and also determines whether the load of the front track area of other target analysis devices of the sample is less than or equal to the scheduling threshold. If so, the processor controls the sample to be scheduled to the front track area of the corresponding other target analysis device for sampling.

[0040] In one embodiment, the processor further determines whether the front track area of the analysis device is fully loaded. When it is determined to be fully loaded, the processor directly controls the samples that currently need to enter the front track area of the analysis device to be sucked to wait in the buffer area.

[0041] In one embodiment, the processor directly controls the sample that currently needs to enter the front track area of the analysis device to be sampled to wait in the buffer area, and also determines whether the front track area of other target analysis devices of the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the processor controls the scheduling of the sample to the front track area of the corresponding other target analysis devices to be sampled.

[0042] In one embodiment, the scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each item configured therefor; the analysis speed of the analysis device for each item configured therefor is multiplied by the corresponding weight and the sum is then used to determine the scheduling threshold of the analysis device; the weight of the item of the analysis device is negatively correlated with the analysis speed of the analysis device for the item.

[0043] According to a third aspect, an embodiment provides a computer-readable storage medium, comprising a program, wherein the program can be executed by a processor to implement the method described in any embodiment of the present invention.

[0044] Advantageous Effects of the Invention

[0045] Brief description of the accompanying drawings BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 is a schematic structural diagram of a sample analysis system according to an embodiment;

[0047] FIG2(a) is a schematic diagram of the structure of an input component and a schematic diagram of a sample scheduling path thereof according to an embodiment; FIG2(b) is a schematic diagram of the structure of an input component and a schematic diagram of a sample scheduling path thereof according to an embodiment;

[0048] Figure 3 is a schematic structural diagram of an input component in another embodiment;

[0049] Figure 4 A schematic structural diagram of an input component according to another embodiment;

[0050] Figure 5 is a schematic structural diagram of a sample analysis system according to another embodiment, which includes analysis devices M1, M2, ..., Mn;

[0051] Figure 6 is a structural diagram of a sample analysis system according to another embodiment;

[0052] Figure 7 is a flow chart of a sample scheduling method according to an embodiment;

[0053] Figure 8 A flow chart of a sample scheduling method according to another embodiment;

[0054] Figure 9 A flow chart of a sample scheduling method according to another embodiment;

[0055] Figure 10 A flow chart of a sample scheduling method according to another embodiment;

[0056] Figure 11 A flow chart of a sample scheduling method according to another embodiment;

[0057] Figure 12 A flowchart of a sample scheduling method according to yet another embodiment;

[0058] Figure 13 The flowchart of a sample scheduling method according to yet another embodiment is shown.

[0059] Invention Embodiments

[0060] Modes for Carrying Out the Invention

[0061] The present invention will be further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core portion of the present application being overwhelmed by excessive descriptions, and for those skilled in the art, it is not necessary to describe these related operations in detail. They will fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0062] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various embodiments. Furthermore, the steps or actions in the method description may be reordered or adjusted in a manner readily apparent to those skilled in the art. Therefore, the various sequences in the specification and drawings are provided solely for the purpose of clearly describing a particular embodiment and are not intended to be mandatory, unless otherwise specified.

[0063] The serial numbers assigned to components herein, such as "first," "second," etc., are used solely to distinguish the objects being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings).

[0064] There are various structures of sample analysis systems. Figure 1 A sample analysis system according to an embodiment may include an input component 10, a plurality of analysis devices 30, a track 50, a scheduling device 70, and a processor 90, which will be described in detail below.

[0065] The input component 10 is used to receive samples to be tested. The input component 10 is generally the area where users insert samples. When the sample analysis system is operating, the input component 10 automatically scans the inserted samples to obtain their identification information. This identification information can be used to obtain information such as the sample number and the test item to be tested. There are various implementation options for the input component 10. For example, the input component 10 can have a placement area and a recovery area. The placement area is used to hold sample racks to be injected, while the recovery area is used to receive sample racks to be recovered, from which operators can retrieve sample racks. To facilitate the batch insertion, transport, recovery, and removal of sample racks, the input component 10 can be configured with multiple placement areas and multiple recovery areas. To save space and simplify design, these placement areas can share a transport channel, and these recovery areas can also share a transport channel, or even all of them can share the same transport channel. The following example uses an input component 10 with two placement areas and two recovery areas as an example.

[0066] Referring to Figure 2 , the input component 10 includes several input areas and several recovery areas, as well as a dispatch mechanism (not shown). Figure 2 illustrates an example with two input areas and two recovery areas. The two input areas P1 and P2 share a transport channel, which we may designate as the first channel; the two recovery areas R1 and R2 also share a transport channel, which we may designate as the second channel. As shown in Figure 2(a), this is a schematic diagram of the sampling scheduling and transmission route of the sample rack in the input component 10. The sample rack in the placement area is pushed upward into the first channel by the scheduling mechanism. As to whether the sample rack in the placement area P1 or P2 is scheduled, it depends on the current process. Generally, the input component 10 first schedules and transmits all the sample racks in one placement area before starting to schedule and transmit the sample rack in the next placement area - the figure shows that the sample rack in the placement area P2 is being sampled; then the sample rack is pushed by the scheduling mechanism to pass to the left in the first channel. When the sample rack is scheduled and transported to position 1, it continues to be scheduled and transported downward to position 2 by the scheduling mechanism, and then is scheduled and transported to the left to the sample aspiration position corresponding to each analysis device 10. The sample tubes on the sample rack are sampled at the sample aspiration position. After all the sample tubes on the sample rack have completed the aspiration, the sample rack needs to be scheduled and transported to the recovery area. As shown in FIG2(b), a schematic diagram of the sample rack recovery and dispatching route in the input component 10 is shown. After the sample is aspirated, the sample rack is dispatched from the sample aspirating position to the right and dispatched back to position 2. Then, it is dispatched upward from position 2 to position 3, and then dispatched to the right to the second channel to enter the recovery area. Whether it is recovery area R1 or recovery area R2 depends on the current process. Generally, the input component 10 dispatches the sample rack that has completed the sample aspiration back to a recovery area first. When the recovery area is full of sample racks, the dispatching mechanism dispatches the sample rack that has completed the sample aspiration to the next recovery area. The figure shows that recovery area R2 is the recovery area currently receiving the sample rack to be recycled. Therefore, the dispatching mechanism dispatches the sample rack from position 3 to the right to position 4, and then pushes the sample rack downward into recovery area R2 to complete the recovery of the sample rack. Generally, a scanner (not shown in the figure) can be set on the first channel to scan the sample racks and / or the samples on the sample racks to obtain corresponding information, such as sample rack information, sample identification information, etc. It should be noted that the directions of up, down, left and right in the scheduling and transportation of sample racks are directions described with reference to the accompanying drawings and do not necessarily mean the real up, down, left and right.

[0067] Figure 3 FIG2 is a schematic structural diagram of the input component 10 of another embodiment. Compared with FIG2, Figure 3The input component 10 has been enhanced with a buffer area. This buffer area can be located on the same level as the input area and the recovery area, or on a different level. For example, to make the input component 10 more compact and occupy a smaller footprint, if the level where the input area and the recovery area are located is designated as the first level, then the buffer area can be located on the negative level, i.e., the level below the first level. The buffer area can have one or more of the following functions. Function 1: The buffer area can cache samples before testing. Specifically, the scheduling mechanism first dispatches the sample racks in the input area to the buffer area. During this process, the input component 10 scans and obtains the label information of each sample temporarily stored in the buffer area. It then schedules all samples to be tested, with the scheduling plan including at least the target analytical equipment to which the samples should be sent. Function 2: The buffer area can cache samples after they have been aspirated by the analytical equipment. Samples wait in the buffer area for test results to determine whether they need to be retested. If retesting is required, the samples are dispatched to the corresponding analytical equipment for retesting. Otherwise, the samples are dispatched to the recovery area for the user to retrieve.

[0068] Please refer to Figure 4 , in Figure 2 or Figure 3 In addition to the input component 10, some embodiments of the input component 10 may also include an emergency channel, allowing users to directly place samples requiring expedited testing in the emergency channel for priority testing. Of course, in some embodiments, the input component 10 may also scan and identify normal sample racks (or non-emergency sample racks) and emergency sample racks to determine scheduling and testing priorities.

[0069] Analyzer 30 is used to test samples. To improve efficiency and test throughput, a sample analysis system typically includes multiple analyzers 30, such as biochemical analyzers, immunoassay analyzers, and coagulation analyzers. These analyzers 30 can be of the same model or different models, depending on the needs of the user and department.

[0070] The rail 50 is used to connect the input component 10 and each analysis device 30 . Figure 5 This is an example of a track 50 connecting the input component 10 and each analysis device 30. Specifically, in some embodiments, each analysis device 30 has a front track area, and the front track area is provided with a sample suction position. The above track 50 is set in the front track area of each analysis device 30. Specifically, the front track area of each analysis device 30 is provided with a plurality of parallel sub-tracks, and the track 50 is mainly composed of these sub-tracks. In some embodiments, the front track area can be provided with two parallel sub-tracks, namely the injection track 31 and the return track 33. The analysis device 30 adjacent to the input component 10 - for example Figure 5The middle refers to the analysis device M1, whose front track area is used to receive the sample dispatched by the input component 10; the corresponding tracks in the front track areas of the adjacent analysis devices 30 are connected to each other, for example Figure 5 The sample introduction tracks 31 of the analysis device M1 and the analysis device M2 are interconnected, and the return tracks 33 of the analysis device M1 and the analysis device M2 are interconnected. The sample passes through the sample introduction track 31 to the sample aspiration position of the corresponding analysis device 30 for aspiration; then returns through the return track 33, for example, to the recovery area of the input component 10. In some embodiments, please refer to Figure 6 , the front track area can be provided with three parallel sub-tracks, that is, in addition to the injection track 31 and the return track 33, an emergency track 32 can be provided for injection of emergency samples, while the injection track 31 can be used for injection of routine samples. In this case, each front track area is provided with at least two sample suction positions, one for suctioning emergency samples on the emergency track 32, and one for suctioning routine samples on the injection track 31. It can be understood that at this time, the emergency tracks 32 in the front track areas of adjacent analysis devices 30 are interconnected, for example Figure 5 The emergency tracks 32 of the middle analysis device M1 and the analysis device M2 are interconnected. The emergency sample travels along the emergency track 32 to the sample aspiration position of the corresponding analysis device 30 for aspiration, and then returns via the return track 33, for example, to the recovery area of the input component 10.

[0071] The scheduling device 70 is used to schedule samples from the input component 10 to the front track area of the corresponding analysis device via the track 50. In some embodiments, the scheduling device 70 also includes a track change mechanism 71, which can change the track of the sample rack on the sample injection track 31 and / or the emergency track 32 in the front track area of the analysis device 30 to the return track 33. In some embodiments, the track change mechanism 71 can also change the track of the sample rack on the sample injection track 31 of the analysis device 30 to enter the emergency track 32 of the adjacent analysis device 30, for example, changing the track of the sample rack on the sample injection track 31 of the analysis device M1 to enter the emergency track 32 of the analysis device M2. In some embodiments, the track change mechanism 34 can also change the track of the sample rack on the emergency track 32 of the analysis device 30 to enter the sample injection track 31 of the adjacent analysis device 30.

[0072] The scheduling strategy for sample racks is described below.

[0073] In some solutions, samples are allocated to each analysis device 30 based on a load balancing principle, thereby minimizing the situation where some analysis devices 30 are too idle while others are too busy. Scheduling sample racks based on the load balancing principle has played a certain role in improving testing efficiency. The inventors have discovered that, under normal circumstances, different analysis devices have different analysis speeds or processing speeds for items. For example, immunoassay devices generally have slower analysis speeds, while biochemical analysis devices have faster analysis speeds. It is very likely that after an immunoassay device completes analysis of one item (i.e., from the start of sampling to obtaining test results), the biochemical analysis device has already completed analysis of multiple items. Therefore, it is necessary to consider this factor when formulating a scheduling strategy for sample racks. This application proposes the concept of a scheduling threshold for an analysis device. The scheduling threshold for an analysis device is used to characterize the speed at which an analysis device analyzes, tests, or processes items. The larger the scheduling threshold for an analysis device, the faster it can analyze, test, or process the test items assigned to it. In some embodiments, the scheduling threshold for an analysis device is determined by the analysis speed of the analysis device for each item to which it is assigned. In some specific embodiments, the analysis speed of the analysis device for each configured item is multiplied by the corresponding weight and the sum is then used to determine the scheduling threshold of the analysis device. In some embodiments, the weight of the item of the analysis device is negatively correlated with the analysis speed of the analysis device for the item. In some embodiments, the sum of the weights of the items configured by the analysis device is 1, that is, the weight of the items of the analysis device is a normalized weight. Generally, the analysis device has a maximum number of items that it can support, but in actual practice, it is possible that only some of the items are frequently used by the department, so the analysis device will be configured to test which items. This is the meaning of the items configured by the analysis device above. The analysis speed of the analysis device for the item can be obtained through its historical data statistics and can be updated regularly, for example, once a week, a month, or two months. The weights corresponding to the items of the analysis device can be pre-set. The following example illustrates how to determine the scheduling threshold of the analysis device. It is possible that an analysis device M1 can support a maximum of 25 tests, namely A1 to A10, B1 to B5, and C1 to C10, but the department only uses A1 to A3 among them, so the analysis device M1 can be configured to test the three projects A1 to A3; it is possible that the analysis speeds of the analysis device M1 for projects A1, A2 and A3 are V1, V2 and V3 respectively, and V1 is greater than V2, and V2 is greater than V3, then the weights of projects A1, A2 and A3 are set to a1, a2 and a3 respectively, and a1 is less than a2, and a2 is less than a3 - for example, a1, a2 and a3 are 20%, 30% and 50% respectively; the scheduling threshold of the analysis device M1 can be determined by the sum V calculated by the following formula: V = V1*a1+V2*a2+V3*a3.

[0074] The larger V is, the faster the overall analysis, testing, or digestion speed of analysis device M1 is. Accordingly, the larger the scheduling threshold for analysis device M1 is. For example, in some examples, when V is 30 items per hour, the scheduling threshold for analysis device M1 can be set to 3, allowing a maximum of three sample racks to be in the front-end track area of analysis device M1. When V is 20-25 items per hour, the scheduling threshold for analysis device M1 can be set to 2, allowing a maximum of two sample racks to be in the front-end track area of analysis device M1. When V is 5-15 items per hour, the scheduling threshold for analysis device M1 can be set to 1, allowing a maximum of one sample rack to be in the front-end track area of analysis device M1. By introducing a scheduling threshold to characterize the speed at which an analysis device analyzes, tests, or digests a project, the faster the analysis device analyzes, tests, or digests a project, the more samples can be simultaneously stored in its front-end track area.

[0075] In the specific scheduling process, when the user places the sample into the input component 10, the processor 90 generally obtains and determines the scheduling plan for the sample to be tested based on the project information of the sample to be tested, wherein the scheduling plan at least includes the target analysis device that needs to perform the project detection on the sample to be tested and the path for the sample to be tested to reach its target analysis device. For example, the processor 90 determines which projects need to be performed on the samples on the sample rack, and then determines which analysis devices can test these projects. If some projects in the sample S can only be tested on a specific analysis device, and other analysis devices do not support the testing of these projects, then this analysis device must be the target analysis device for the sample S; if some projects in the sample S can be tested on multiple analysis devices, for example, analysis devices M1 and M2 can both support the testing of these projects, then one or both analysis devices M1 and M2 can be selected as the target analysis device for the sample S. Specifically, in some embodiments, after obtaining the project information of the sample to be tested, the processor 90 can determine the scheduling plan for each sample to be tested in the buffer area based on the principle of load balancing of the analysis devices. A specific process may be as follows: the user puts the sample into the input component 10, the input component 10 schedules each sample to be tested to the cache area for temporary storage, the processor 90 receives and obtains the project information of the sample to be tested, and then determines the scheduling plan of each sample to be tested in the cache area based on the project information of the sample to be tested - for example, after obtaining the project information of the sample to be tested, the scheduling plan of each sample to be tested is determined based on the principle of load balancing of the analysis equipment.

[0076] Then the processor 90 schedules each sample according to the scheduling plan. In some embodiments, the processor 90 obtains the scheduling threshold of the analysis device 30 and the load of the front track area of the analysis device; the processor 90 controls the scheduling of samples that currently need to enter the front track area of the analysis device for sampling based on the relationship between the scheduling threshold of the analysis device 30 and the load of the front track area of the analysis device 30. In some specific embodiments, if the load of the front track area of the analysis device 30 is less than or equal to the scheduling threshold of the analysis device 30, the processor 90 controls the scheduling of samples that currently need to enter the front track area of the analysis device 30 for sampling to the front track area of the analysis device 30; conversely, if the load of the front track area of the analysis device 30 is greater than the scheduling threshold of the analysis device 30, the processor 90 controls the samples that currently need to enter the front track area of the analysis device 30 to wait in the buffer area.

[0077] As described above, if the load of the front-end track area of the analysis device 30 is greater than the scheduling threshold of the analysis device 30, the processor 90 controls the sample that currently needs to enter the front-end track area of the analysis device 30 to wait in the cache area. After that, the processor 90 also determines whether the load of the front-end track area of other target analysis devices of the sample is less than or equal to the scheduling threshold. If so, the processor 90 controls the scheduling of the sample to the front-end track area of the corresponding other target analysis devices for sample aspiration.

[0078] Generally, if the load of the front track area of the analysis device 30 is less than or equal to the scheduling threshold of the analysis device 30, then the front track area is not fully loaded. It can be understood that the front track area of the analysis device 30 has a certain range and can carry one or more sample racks, such as 3 sample racks. If the front track area of the current analysis device 30 already carries three sample racks that are being sampled or waiting to be sampled, then the front track area of the analysis device 30 is fully loaded. Otherwise, it is not fully loaded. Figure 5 or Figure 6 Taking the sample analysis system as an example, it is assumed that the sampling track 31 and the emergency track 32 of the front track area of each analysis device can carry three sample racks. Then, for sample S1 that needs to be sampled on the sampling track 31 of an analysis device, when the sampling track 31 of the analysis device carries three sample racks that are or are waiting for the analysis device to aspirate the sample, then for the sample S1, the front track area of the analysis device is fully loaded, otherwise, it is not fully loaded; similarly, for sample S2 that needs to be sampled on the emergency track 32 of an analysis device, when the emergency track 32 of the analysis device carries three sample racks that are or are waiting for the analysis device to aspirate the sample, then for the sample S2, the front track area of the analysis device is fully loaded, otherwise, it is not fully loaded.

[0079] As described above, if the load of the front track area of the analysis device 30 is less than or equal to the scheduling threshold of the analysis device 30, then generally speaking, its front track area is not fully loaded. However, in order to ensure this, a judgment of the load condition of the front track area can also be performed. For example, in some embodiments, the processor 90 also determines whether the front track area of the analysis device is fully loaded. When it is determined to be fully loaded, the samples that currently need to enter the front track area of the analysis device to be sampled are directly controlled to wait in the buffer area without comparing the relationship between the load of the front track area of the analysis device 30 and the scheduling threshold of the analysis device 30; when it is determined that the front track area of the analysis device is not fully loaded, the processor 90 controls the scheduling of the samples that currently need to enter the front track area of the analysis device to be sampled based on the relationship between the scheduling threshold of the analysis device 30 and the load of the front track area of the analysis device 30.

[0080] Similarly, the processor 90 controls the sample that currently needs to enter the front track area of the analysis device 30 to wait in the cache area. After that, the processor 90 can also determine whether the front track area of other target analysis devices for the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the processor 90 controls the scheduling of the sample to the front track area of the corresponding other target analysis devices for sampling.

[0081] The above is a brief description of the sample analysis system. Some embodiments of the present invention also disclose a sample scheduling method for the sample analysis system. The structure of the sample analysis system involved herein can be the sample analysis system disclosed in any embodiment herein, for example, a sample analysis system having a cache and including multiple analysis devices.

[0082] Please refer to Figure 7 , a sample scheduling method of some embodiments includes the following steps:

[0083] Step 100: Obtain project information of the sample to be tested.

[0084] Step 110: Determine a scheduling plan for the sample to be tested based on the project information of the sample to be tested, wherein the scheduling plan at least includes a target analysis device required to perform project detection on the sample to be tested and a path for the sample to be tested to reach its target analysis device.

[0085] For example, step 110 determines which items need to be tested on the samples on the sample rack, and then checks which analytical devices can test these items. If some items in sample S can only be tested on a specific analytical device, and other analytical devices do not support testing of these items, then this analytical device must be the target analytical device for sample S. If some items in sample S can be tested on multiple analytical devices, for example, analytical devices M1 and M2 both support testing of these items, then one or both analytical devices M1 and M2 can be selected as the target analytical device for sample S. Specifically, in some embodiments, after step 100 obtains the item information of the sample to be tested, step 110 can determine the scheduling plan for each sample to be tested in the cache area based on the principle of load balancing of analytical devices. A specific process may be as follows: the user puts the sample into the input component, the input component schedules each sample to be tested to the cache area for temporary storage, step 100 receives and obtains the project information of the sample to be tested, and then step 110 determines the scheduling plan of each sample to be tested in the cache area based on the project information of the sample to be tested - for example, after obtaining the project information of the sample to be tested, the scheduling plan of each sample to be tested is determined based on the principle of load balancing of the analysis equipment.

[0086] The following will explain how to schedule according to the specific situation. Figure 8 In some embodiments, the sample scheduling method includes the following steps:

[0087] Step 200: Obtain the scheduling threshold of the analysis device. The scheduling threshold of the analysis device is used to represent the speed at which the analysis device analyzes, tests, or processes a project. For further explanation of the scheduling threshold and how to calculate it, please refer to the previous description and will not be repeated here.

[0088] Step 210: Obtain the load condition of the front track area of the analysis device.

[0089] Step 220: According to the relationship between the scheduling threshold of the analysis device and the load of the front track area of the analysis device, the scheduling of samples that currently need to enter the front track area of the analysis device to be sampled is controlled.

[0090] Please refer to Figure 9 In some embodiments, step 220 may specifically include the following steps:

[0091] Step 222: If the load of the front track area of the analysis device is less than or equal to the scheduling threshold of the analysis device, the control will schedule the samples that currently need to enter the front track area of the analysis device to be sampled to the front track area of the analysis device.

[0092] Step 224: If the load of the front-end track area of the analysis device is greater than the scheduling threshold of the analysis device, the control makes the samples that currently need to enter the front-end track area of the analysis device wait in the buffer area.

[0093] Please refer to Figure 10 In some embodiments, the sample scheduling method may further include the following steps:

[0094] As described above, if the load of the front track area of the analysis device is greater than the scheduling threshold of the analysis device, step 224 controls the samples that currently need to enter the front track area of the analysis device to wait in the buffer area.

[0095] After step 224, step 226 further determines whether the load of the front track area of the other target analysis device for the sample is less than or equal to the scheduling threshold. If the load of the front track area of the other target analysis device for the sample is less than or equal to the scheduling threshold (referring to the scheduling threshold of the other target analysis device), step 228 controls the scheduling of the sample to the front track area of the corresponding other target analysis device for sampling.

[0096] Or, as Figure 11 As shown, in some embodiments, after step 224, step 225 also determines whether the front track area of the other target analysis device of the sample is not fully loaded and the load is less than or equal to the scheduling threshold (referring to the scheduling threshold of the other target analysis device); if so, step 227 controls the scheduling of the sample to the front track area of the corresponding other target analysis device to be sampled.

[0097] Please refer to Figure 12 In some embodiments, the sample scheduling method may further include the following steps:

[0098] Step 230: Determine whether the front track area of the analysis device is fully loaded. It is understood that step 230 may be performed before step 220, or before step 222 controls the dispatch of samples currently in need of entering the front track area of the analysis device for aspiration.

[0099] Step 231: When it is determined that the sample is fully loaded, the sample that needs to enter the front track area of the analysis device to be sucked is directly controlled to wait in the buffer area.

[0100] Please refer to Figure 13 In some embodiments, the sample scheduling method may further include the following steps:

[0101] As described above, when it is determined to be full, step 231 directly controls the samples that currently need to enter the front track area of the analysis device to be sucked to wait in the buffer area.

[0102] After step 231, step 233 further determines whether the front track area of the other target analysis device for the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, step 235 controls the scheduling of the sample to the front track area of the corresponding other target analysis device for sampling.

[0103] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope of this document. For example, the various operational steps and components used to perform the operational steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or incorporated into other steps) depending on the specific application or considering any number of cost functions associated with the operation of the system.

[0104] In the above embodiments, all or part of the embodiments may be implemented through software, hardware, firmware, or any combination thereof. Furthermore, as will be appreciated by those skilled in the art, the principles herein may be embodied in a computer program product on a computer-readable storage medium pre-installed with computer-readable program code. Any tangible, non-transitory computer-readable storage medium may be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-ROMs, DVDs, Blu-ray discs, etc.), flash memory, and / or the like. These computer program instructions may be loaded onto a general-purpose computer, a special-purpose computer, or other programmable data processing device to form a machine, such that the instructions executed on the computer or other programmable data processing device can generate a device that implements a specified function. These computer program instructions may also be stored in a computer-readable memory, which can instruct the computer or other programmable data processing device to operate in a specific manner, such that the instructions stored in the computer-readable memory can form an article of manufacture, including an implementation device that implements a specified function. The computer program instructions may also be loaded onto a computer or other programmable data processing device, thereby causing the computer or other programmable device to execute a series of operational steps to generate a computer-implemented process, such that the instructions executed on the computer or other programmable device can provide the steps for implementing the specified function.

[0105] Although the principles of this invention have been shown in various embodiments, many modifications of structure, arrangement, proportion, elements, materials and components that are particularly suitable for specific environments and operational requirements can be used without departing from the principles and scope of this invention. The above modifications and other changes or amendments are intended to be included within the scope of this invention.

[0106] The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the present disclosure will be considered in an illustrative rather than a restrictive sense, and all such modifications will be included within its scope. Similarly, the advantages, other advantages and solutions to the problems of the various embodiments have been described above. However, the benefits, advantages, solutions to the problems and any elements that can produce these, or make them more specific, should not be interpreted as critical, required or necessary. The term "comprising" and any other variants used in this article are all non-exclusive inclusions, so that a process, method, article or device that includes a list of elements includes not only these elements, but also other elements that are not explicitly listed or do not belong to the process, method, system, article or device. In addition, the term "coupled" and any other variants used in this article refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections and / or any other connections.

[0107] Those skilled in the art will recognize that many changes can be made to the details of the above embodiments without departing from the basic principles of the invention. Therefore, the scope of the present invention should be determined solely by the claims.

Claims

1. A sample scheduling method for a sample analysis system, wherein the sample analysis system has a buffer area and includes a plurality of analysis devices, characterized in that: The sample scheduling method includes: Obtaining a scheduling threshold of the analysis device; the scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each item configured therefor; Obtain and analyze the load conditions of the front track area of the equipment; If the load of the front track area of the analysis device is less than or equal to the scheduling threshold of the analysis device, the control dispatches the sample that currently needs to enter the front track area of the analysis device to be sampled to the front track area of the analysis device; If the load of the front-end track area of the analysis device is greater than the scheduling threshold of the analysis device, the control makes the samples that currently need to enter the front-end track area of the analysis device wait in the buffer area.

2. The sample scheduling method according to claim 1, wherein: Also includes: Obtain and determine the scheduling plan of the samples to be tested based on the project information of the samples to be tested; The scheduling plan at least includes the target analysis equipment required to perform project detection on the sample to be tested and the path for the sample to be tested to reach the target analysis equipment.

3. The sample scheduling method according to claim 2, wherein: The step of obtaining and determining a scheduling plan for the sample to be tested based on the project information of the sample to be tested includes: Receive and obtain project information of samples to be tested; Controlling the dispatching of samples to be tested to the buffer area for temporary storage; According to the project information of the samples to be tested, the scheduling plan of each sample to be tested in the buffer area is determined.

4. The sample scheduling method according to claim 2, wherein: Determining the scheduling plan for each sample to be tested in the cache area according to the project information of the sample to be tested includes: after obtaining the project information of the sample to be tested, determining the scheduling plan for each sample to be tested based on the principle of load balancing of the analysis device.

5. The sample scheduling method according to claim 2, wherein: After the control makes the sample that currently needs to enter the front track area of the analysis device wait in the cache area, it also determines whether the load of the front track area of other target analysis devices of the sample is less than or equal to the scheduling threshold. If so, the control dispatches the sample to the front track area of the corresponding other target analysis devices for sampling.

6. The sample scheduling method according to claim 2, wherein: After the control makes the sample that currently needs to enter the front track area of the analysis device wait in the cache area, it also determines whether the front track area of other target analysis devices of the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the control dispatches the sample to the front track area of the corresponding other target analysis devices for sampling.

7. The sample scheduling method according to claim 2, wherein: Also includes: It is also determined whether the front track area of the analysis device is fully loaded. When it is determined to be fully loaded, the samples that currently need to enter the front track area of the analysis device to be sucked are directly controlled to wait in the buffer area.

8. The sample scheduling method according to claim 7, wherein: After directly controlling the sample that currently needs to enter the front track area of the analysis device to be sampled to wait in the buffer area, it is also determined whether the front track area of other target analysis devices for the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the sample is controlled to be scheduled to the front track area of the corresponding other target analysis devices to be sampled.

9. The sample scheduling method according to claim 1, wherein: The scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each item configured therefor, including: multiplying the analysis speed of the analysis device for each item configured therefor by the corresponding weight and then summing the results, and then determining the scheduling threshold of the analysis device based on the sum obtained.

10. The sample scheduling method according to claim 9, wherein: The weight of an item of an analytical device is negatively correlated with the speed at which the analytical device analyzes the item.

11. A sample analysis system, characterized in that: include: An input component for receiving a sample to be tested; A plurality of analysis devices, each of which is used to test a sample; each of the analysis devices has a front track area, and the front track area is provided with a sample suction position; Tracks for connecting input components and various analysis devices; a dispatching device for dispatching the sample from the input component to the front track area of the corresponding analysis device via the track; Buffer area, used to cache samples; as well as The processor is used to obtain a scheduling threshold of the analysis device and the load of the front-end track area of the analysis device. The scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each item configured therefor; the processor controls the scheduling of samples that currently need to enter the front-end track area of the analysis device for sampling based on the relationship between the scheduling threshold of the analysis device and the load of the front-end track area of the analysis device.

12. The sample analysis system according to claim 11, wherein: The processor controls the scheduling of samples that currently need to enter the front track area of the analysis device to be sampled according to the relationship between the scheduling threshold of the analysis device and the load of the front track area of the analysis device, including: When the load of the front track area of the analysis device is less than or equal to the scheduling threshold of the analysis device, the processor controls the scheduling of samples that currently need to enter the front track area of the analysis device for sampling to the front track area of the analysis device; When the load of the front track area of the analysis device is greater than the scheduling threshold of the analysis device, the processor controls the samples that currently need to enter the front track area of the analysis device to wait in the buffer area.

13. The sample analysis system according to claim 11, wherein: The buffer area is set in the input component; the processor obtains the project information of the sample to be tested, and controls the input component to dispatch the sample to be tested to the buffer area for temporary storage; The processor determines a scheduling plan for each sample to be tested in the buffer area according to the project information of the sample to be tested, wherein the scheduling plan at least includes a target analysis device required to perform project detection on the sample to be tested and a path for the sample to be tested to reach its target analysis device.

14. The sample analysis system according to claim 13, wherein: The processor controls the sample that currently needs to enter the front track area of the analysis device to wait in the cache area, and also determines whether the load of the front track area of other target analysis devices of the sample is less than or equal to the scheduling threshold. If so, the processor controls the scheduling of the sample to the front track area of the corresponding other target analysis devices for sampling.

15. The sample analysis system according to claim 13, wherein: The processor also determines whether the front track area of the analysis device is fully loaded. When it is determined to be fully loaded, the processor directly controls the samples that currently need to enter the front track area of the analysis device to be sucked to wait in the buffer area.

16. The sample analysis system according to claim 15, wherein: The processor directly controls the sample that currently needs to enter the front track area of the analysis device to be sampled to wait in the buffer area, and also determines whether the front track area of other target analysis devices of the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If so, the processor controls the scheduling of the sample to the front track area of the corresponding other target analysis devices to be sampled.

17. The sample analysis system according to claim 11, wherein: The analysis speed of each configured project of the analysis device is multiplied by the corresponding weight and the sum is then used to determine the scheduling threshold of the analysis device; the weight of the project of the analysis device is negatively correlated with the analysis speed of the analysis device for the project.

18. A computer-readable storage medium, characterized in that The method comprises a program which can be executed by a processor to implement the method according to any one of claims 1 to 10.

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