Simulation test method and device of direct current transformer

Abstract

The application discloses a simulation test method and device of a direct-current transformer, and relates to the technical field of transformer simulation. The method comprises the following steps: performing differential calculation on all elements in a target direct-current transformer model to obtain a pre-decomposition matrix corresponding to the elements; calculating a simulation history current source according to circuit parameters of the target direct-current transformer model; obtaining high-voltage side and low-voltage side currents of a single direct-current transformer from the simulation history current source, triggering a Norton equivalent circuit through a switch signal, and combining the pre-decomposition matrix to obtain all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model; and based on all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model and the circuit parameters of the target direct-current transformer model, combining a system node voltage equation to solve each branch node voltage. The technical problem that a simulation method of a direct-current transformer needs to process a large amount of data when the number of direct-current transformers is large, and the cost of test equipment is greatly increased is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of transformer simulation, in particular to a simulation test method and device for an AC transformer. BACKGROUND

[0002] At present, with the acceleration of urbanization in large and medium-sized cities, the demand for power load is growing rapidly. In the city where the power transmission corridor is increasingly "congested", the trend of terminal user load direct current is obvious, the demand for "plug and play" of user-side distributed power and flexible load is increasing day by day, and the requirement for power quality and power supply reliability is increasingly stringent. Under the background that flexible DC power transmission technology has become mature, flexible DC distribution network plays an increasingly important role. As the core equipment in the power system, the transformer realizes the isolation of electric energy and the transformation of voltage through electromagnetic induction, and has been widely used in various links of generation, transmission and distribution.

[0003] In the distribution system, AC transformers are widely used in urban distribution systems. However, with the upgrading of energy structure, the load in the traditional distribution system has changed greatly. Renewable energy, energy storage and new types of load account for an increasing proportion in the distribution network system. These large-scale elements connected to the distribution network system often exhibit DC characteristics. The traditional AC power conversion-based transformer has encountered more and more problems in the context of large-scale connection of DC elements, including the stability, efficiency and reliability of AC grid-connected systems. On the other hand, with the maturity of flexible DC power transmission and DC circuit breakers, medium-voltage DC distribution systems have become possible. Therefore, from the application end, it is necessary to build a DC transformer system to meet the connection of medium-voltage DC distribution systems and low-voltage DC power grids, which can adapt to multiple voltage levels according to the needs of different elements. Therefore, multi-voltage level DC transformers have become the key core equipment of flexible DC distribution networks.

[0004] In the simulation modeling of fine DC transformers, each DAB in the DC transformer needs to be modeled separately, and actual control devices are required, i.e. actual control protection cabinets are used to test and verify the functions and performance of the equipment. For occasions with a large number of DABs, this simulation method requires a large amount of data to be calculated and processed, which in turn leads to a significant increase in the cost of test equipment. SUMMARY

[0005] The present application provides a simulation test method and device for a DC transformer, which solves the technical problem that the existing simulation method for DC transformers requires processing a large amount of data when there are a large number of DC transformers, which in turn leads to a significant increase in the cost of test equipment.

[0006] In a first aspect, the present application provides a simulation test method for a DC transformer, comprising:

[0007] obtaining a target DC transformer model from the test request;

[0008] differentially calculating all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements;

[0009] calculating a Norton equivalent circuit of a single DC transformer in the target DC transformer model through an electromagnetic transient simulation node voltage algorithm;

[0010] calculating a simulation history current source according to circuit parameters of the target DC transformer model;

[0011] obtaining high-voltage side and low-voltage side currents of the single DC transformer from the simulation history current source, triggering the Norton equivalent circuit through a switch signal, and combining the pre-decomposition matrix to obtain all simulation high-voltage side and low-voltage side currents in the target DC transformer model;

[0012] solving branch node voltages by combining system node voltage equations based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model;

[0013] determining whether the simulation is finished, and if not, performing simulation testing according to a new test instruction until the simulation is finished.

[0014] Optionally, before differentially calculating all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements, the method further comprises:

[0015] initializing control parameters corresponding to a simulation control process.

[0016] Optionally, calculating a simulation history current source according to circuit parameters of the target DC transformer model comprises:

[0017] calculating a system admittance matrix of all switch states according to the circuit parameters of the target DC transformer model;

[0018] selecting a target system admittance matrix corresponding to a current switch state from the saved system admittance matrix according to a switch change condition;

[0019] triangularly decomposing the admittance matrix based on the circuit parameters of the target DC transformer model, and solving the simulation history current source.

[0020] Optionally, solving branch node voltages by combining system node voltage equations based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model comprises:

[0021] Solving each branch node voltage based on all the simulation high and low voltage side currents in the target DC transformer model and the target system admittance matrix, in combination with a system node voltage equation, wherein the system node voltage equation is specifically:

[0022] GV = I,

[0023] Wherein G is the system admittance matrix, V is the node voltage vector, and I is all the simulation high and low voltage side currents in the target DC transformer model.

[0024] In the second aspect, the present application provides a simulation test device for a DC transformer, comprising:

[0025] A response module, configured to obtain a target DC transformer model from a test request in response to the test request.

[0026] A difference calculation module, configured to perform difference calculation on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements.

[0027] An equivalent circuit determination module, configured to calculate a Norton equivalent circuit of a single DC transformer in the target DC transformer model through an electromagnetic transient simulation node voltage algorithm.

[0028] A historical current source determination module, configured to calculate a simulation historical current source according to circuit parameters of the target DC transformer model.

[0029] An equivalent simulation module, configured to obtain high and low voltage side currents of the single DC transformer from the simulation historical current source, trigger the Norton equivalent circuit through a switching signal, and obtain all the simulation high and low voltage side currents in the target DC transformer model in combination with the pre-decomposition matrix.

[0030] A node voltage determination module, configured to solve each branch node voltage based on all the simulation high and low voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model, in combination with a system node voltage equation.

[0031] A judgment module, configured to judge whether the simulation is finished, and if not, perform simulation test according to a new test instruction until the simulation is finished.

[0032] Optionally, the device further comprises:

[0033] An initialization module, configured to initialize control parameters corresponding to a simulation control process.

[0034] Optionally, the historical current source determination module comprises:

[0035] The admittance matrix calculation submodule is configured to calculate a system admittance matrix in all switch states according to circuit parameters of the target DC transformer model.

[0036] The target system admittance matrix determination submodule is configured to determine a target system admittance matrix corresponding to the current switch state from the system admittance matrix according to the switch change condition.

[0037] The simulation historical current source determination submodule is configured to perform triangular decomposition on the admittance matrix and solve the simulation historical current source based on the circuit parameters of the target DC transformer model.

[0038] Optionally, the node voltage determination module is specifically configured to:

[0039] The node voltage determination module is specifically configured to solve each branch node voltage based on all simulation high and low voltage side currents in the target DC transformer model and the target system admittance matrix, and in combination with a system node voltage equation.

[0040] GV = I,

[0041] Wherein, G is a system admittance matrix, V is a node voltage vector, and I is all simulation high and low voltage side currents in the target DC transformer model.

[0042] In a third aspect, the present application provides an electronic device, comprising a processor and a memory, wherein the memory stores computer readable instructions, and when the computer readable instructions are executed by the processor, the steps in the method provided in the first aspect are executed.

[0043] In a fourth aspect, the present application provides a storage medium, which stores a computer program, and when the computer program is executed by a processor, the steps in the method provided in the first aspect are executed.

[0044] It can be seen from the above technical solution that the application has the following advantages: obtaining a target direct-current transformer model from a test request in response to the test request; performing differential calculation on all elements in the target direct-current transformer model to obtain a pre-decomposition matrix corresponding to the elements; calculating a Norton equivalent circuit of a single direct-current transformer in the target direct-current transformer model through an electromagnetic transient simulation node voltage algorithm; calculating a simulation history current source according to circuit parameters of the target direct-current transformer model; obtaining high-voltage side and low-voltage side currents of the single direct-current transformer from the simulation history current source, triggering the Norton equivalent circuit through a switch signal, and obtaining all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model in combination with the pre-decomposition matrix; solving branch node voltages in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model and the circuit parameters of the target direct-current transformer model; determining whether the simulation is ended, and if not, performing simulation test according to a new test instruction until the simulation is ended. The application solves the technical problem that a large amount of data needs to be processed in the existing direct-current transformer simulation method in the case of a large number of direct-current transformers, which further leads to a large increase in the cost of test equipment. BRIEF DESCRIPTION OF DRAWINGS

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description only constitute some embodiments of the application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0046] Figure 1 A flow step diagram of a simulation test method for a direct-current transformer according to an embodiment of the application;

[0047] Figure 2 A flow step diagram of a simulation test method for a direct-current transformer according to an embodiment of the application;

[0048] Figure 3 A structural schematic diagram of a direct-current transformer simulation platform according to an embodiment of the application;

[0049] Figure 4 A structural schematic diagram of a direct-current transformer according to an embodiment of the application;

[0050] Figure 5 A structural schematic diagram of a multi-voltage level direct-current transformer according to an embodiment of the application;

[0051] Figure 6 A structural block diagram of a simulation test device for a direct-current transformer according to an embodiment of the application. DETAILED DESCRIPTION

[0052] The embodiment of the present application provides a simulation test method and device of a direct-current transformer, and solves the technical problem that the simulation method of the direct-current transformer needs to process a large amount of data in the case that the number of the direct-current transformers is large, and then the cost of the test equipment is greatly increased.

[0053] In order to make the invention purposes, features and advantages of the present application more obvious and easy to understand, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the embodiments described below are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the present application.

[0054] Please refer to Figure 1 , Figure 1 The flow step diagram of the simulation test method of the direct-current transformer according to the first embodiment of the present application can specifically include the following steps.

[0055] In step S101, a target direct-current transformer model is obtained from a test request in response to the test request.

[0056] In step S102, differential calculation is performed on all elements in the target direct-current transformer model to obtain a pre-decomposition matrix corresponding to the elements.

[0057] In step S103, a Norton equivalent circuit of a single direct-current transformer in the target direct-current transformer model is calculated by an electromagnetic transient simulation node voltage algorithm.

[0058] In step S104, a simulation history current source is calculated according to the circuit parameters of the target direct-current transformer model.

[0059] In step S105, high-voltage side and low-voltage side currents of a single direct-current transformer are obtained from the simulation history current source, the Norton equivalent circuit is triggered by a switch signal, and all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model are obtained in combination with the pre-decomposition matrix.

[0060] In step S106, each branch node voltage is solved in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model and the circuit parameters of the target direct-current transformer model.

[0061] In step S107, it is determined whether the simulation is ended, and if not, the simulation test is performed according to a new test instruction until the simulation is ended.

[0062] In the simulation test method of the direct-current transformer provided in the embodiment of the application, a target direct-current transformer model is obtained from a test request in response to the test request; differential calculation is performed on all elements in the target direct-current transformer model to obtain a pre-decomposition matrix corresponding to the elements; a Norton equivalent circuit of a single direct-current transformer in the target direct-current transformer model is calculated through an electromagnetic transient simulation node voltage algorithm; a simulation history current source is calculated according to circuit parameters of the target direct-current transformer model; high-voltage side and low-voltage side currents of the single direct-current transformer are obtained from the simulation history current source, the Norton equivalent circuit is triggered through a switch signal, and all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model are obtained in combination with the pre-decomposition matrix; each branch node voltage is solved in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target direct-current transformer model and the circuit parameters of the target direct-current transformer model; and it is determined whether the simulation is ended, and if not, the simulation test is performed according to a new test instruction until the simulation is ended. The simulation method of the direct-current transformer solves the technical problem that a large amount of data needs to be processed in the simulation method of the direct-current transformer in the case that the number of direct-current transformers is large, and the cost of test equipment is greatly increased.

[0063] Embodiment two, please refer to Figure 2 , Figure 2 is a flow step diagram of the simulation test method of the direct-current transformer of the embodiment two of the application, comprising:

[0064] In step S201, a target direct-current transformer model is obtained from a test request in response to the test request.

[0065] Please refer to Figure 3 , Figure 3 is a structural schematic diagram of the simulation platform of the direct-current transformer of the application, and the embodiment of the application is specifically applied to the simulation platform of the direct-current transformer as shown in Figure 3 . Specifically, the simulation platform of the direct-current transformer comprises an upper computer 1 and an FPGA simulation machine 3 connected with a CPU simulation machine 2 respectively, the upper computer 1 and the CPU simulation machine 2 are connected through an Ethernet to realize data interaction, and the FPGA simulation machine 3 and the CPU simulation machine 2 are connected according to a peripheral component interconnect express (PCIe) standard to realize data interaction.

[0066] It should be noted that the CPU simulation machine 2 is a module for simulating a central processing unit (CPU), and the FPGA simulation machine 3 is a module for simulating a field programmable gate array (FPGA).

[0067] Wherein, the host computer 1 contains a monitoring interface 11, the CPU emulator 2 contains a power collection system and a controller 23, and the FPGA emulator 3 contains a power module model 31 and a valve control 32. Further, the host computer 1 is mainly used to realize two functions: (1) issuing control mode selection and control commands, including: switching command, pulse enable and built-in parameters of DC transformer, etc.; (2) collecting electrical signals output by the CPU emulator 2, monitoring the running condition of the simulation model on the CPU emulator 2, and displaying on the monitoring interface 11. The power collection system on the CPU emulator 2 includes: a built-in power grid model 21 and a DAB full-bridge model 22, and the controller 23 is used to generate switching signals so that the power module model 31 can be turned on or turned off according to specific requirements. For the FPGA emulator 3, the power module model 31 therein runs in the FPGA emulator 3, which can significantly improve the model calculation and test efficiency, and the valve control 32 controls the voltage sharing and sequencing of the power module model 31, so as to realize the functions of high-voltage side voltage division and low-voltage side current division of the DC transformer.

[0068] In a specific implementation, the operation and maintenance personnel can select a test request of a target DC transformer model on the monitoring interface or a mobile terminal with a corresponding control software of the simulation test platform, and the CPU emulator 2 selects the target DC transformer model from the DAB full-bridge model 22 to start simulation.

[0069] Step S202, initializing control parameters corresponding to the simulation control process;

[0070] In the embodiment of the application, the host computer 1 will clear the simulation control mode selection and control commands before simulation, so as to initialize the simulation control parameters.

[0071] Step S203, performing differential calculation on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements;

[0072] In the embodiment of the application, differential calculation is performed on all elements in the target DC transformer model in the FPGA emulator 3, so as to determine the differential information of all elements, and then obtain the pre-decomposition matrix corresponding to all elements.

[0073] Step S204, calculating a Norton equivalent circuit of a single DC transformer in the target DC transformer model by an electromagnetic transient simulation node voltage algorithm;

[0074] In the embodiment of the application, the FPGA emulator 3 obtains the Norton equivalent circuit of a single DC transformer in the target DC transformer model according to the electromagnetic transient simulation node voltage algorithm.

[0075] Step S205, according to the circuit parameters of the target DC transformer model, the system admittance matrix of all switch states is calculated;

[0076] Step S206, according to the switch change condition, the target system admittance matrix corresponding to the current switch state is selected from the saved system admittance matrix;

[0077] In the embodiment of the application, the CPU simulation machine 2 constructs all system admittance matrices, and selects the corresponding target system admittance matrix from the system admittance matrix according to the switch change condition of the switch signal.

[0078] Step S207, based on the circuit parameters of the target DC transformer model, the admittance matrix is triangularly decomposed, and the simulation history current source is solved;

[0079] In the embodiment of the application, the target system admittance matrix is triangularly decomposed to obtain the corresponding simulation history current source.

[0080] Step S208, the high and low voltage side currents of a single DC transformer are obtained from the simulation history current source, the Norton equivalent circuit is triggered by the switch signal, and all simulation high and low voltage side currents in the target DC transformer model are obtained by combining the pre-decomposition matrix;

[0081] Please refer to Figure 4 and Figure 5 , Figure 4 is a structural schematic diagram of a DC transformer, Figure 5 is a structural schematic diagram of a multi-voltage level DC transformer; the mainstream core topology structure of the current mainstream DC transformer adopts the DAB structure as shown in Figure 4 , that is, a dual-active-bridge (DAB) converter, which mainly consists of two H-bridges and a high-frequency transformer, the two H-bridges are connected through the transformer, Figure 1 , where VP and VS are the primary voltage and secondary voltage of the transformer respectively, and iL is the primary current of the transformer; the voltage ratio of the high-frequency transformer is n:1, and Lk is the leakage inductance of the transformer; S1P, S2P, S3P and S4P are four switch tubes on the primary side of the transformer, S1S, S2S, S3S and S4S are four switch tubes on the secondary side of the transformer, and each switch tube is a PWM signal with a duty cycle of 50%. Among them, the switch tubes S1P and S4P on the primary side of the transformer and the switch tubes S1S and S4S on the secondary side of the transformer are simultaneously turned on, each bridge arm is alternately turned on, and the multi-voltage level DC transformer generally adopts Figure 5The topology shown, multiple DAB converters are connected in series at high voltage side to access HV DC bus, and connected in parallel at low voltage side to access LV DC bus, so that the voltage level at high voltage side is increased by n times, and the current level at low voltage side is increased by multiple times. The high frequency transformer provides electrical isolation and voltage matching for the circuit, and the inductor serves as a transient energy storage link. By controlling the square wave voltage at the AC output side of the full-bridge converter, the size and phase of the voltage applied across the auxiliary inductor can be controlled, and in turn the size and flow of power can be controlled.

[0082] In the embodiment of the present application, the FPGA simulation machine 3 collects the high and low voltage side currents transmitted by the CPU simulation machine 2, that is, i1, i2 and i in the formula (1) are obtained. Figure 4 L , and i1, i2 and i in the formula (2) are obtained. Figure 5 Figure 2 i1, i2 and i in the formula (3) are obtained. L .

[0083] In step S209, based on all the simulated high and low voltage side currents in the target DC transformer model and the target system admittance matrix, the branch node voltages are obtained by combining the system node voltage equation, and the system node voltage equation is specifically:

[0084] GV=I,

[0085] Wherein, G is the system admittance matrix, V is the node voltage vector, and I is all the simulated high and low voltage side currents in the target DC transformer model.

[0086] In the embodiment of the present application, the FPGA simulation machine 3 obtains the branch node voltages according to all the simulated high and low voltage side currents in the target DC transformer model and the system node voltage equation.

[0087] In a specific implementation, the high and low voltage side voltages generated in the FPGA simulation machine 3 are sent to the CPU simulation machine 2 to update the voltage and current signals, and then all the node voltages are solved by combining the system node voltage equation through the network model 21, so as to obtain the node voltages of the collector system (main network) to complete a simulation closed-loop test.

[0088] In step S210, it is judged whether the simulation is ended, if not, the simulation test is performed according to the new test instruction until the simulation is ended.

[0089] In the embodiment of the present application, it is judged whether the host computer 1 changes the control instruction, such as the number of DABs, the output square wave phase shift ratio or the control delay instruction value, and the next simulation test is started until the simulation is ended.

[0090] ​​The current mainstream DC transformer real-time simulation modeling needs to model each DAB converter in the DC transformer separately, and each DAB converter needs to be controlled independently. In general, the model is segmented and modeled with a single sub-module as a unit, but this method requires a large amount of data to be calculated and processed in the case of a large number of DABs, which wastes a lot of hardware resources. Moreover, due to the characteristics of the simulation module itself, there is no electrical connection between each simulation module, only signal transmission. This method is difficult to link the control system to the main circuit, and it is difficult to ensure the stability of the connection between the simulation models.

[0091] In the simulation test method of the DC transformer provided in the embodiment of the application, in response to a test request, a target DC transformer model is obtained from the test request; differential calculation is performed on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements; a Norton equivalent circuit of a single DC transformer in the target DC transformer model is calculated by an electromagnetic transient simulation node voltage algorithm; a simulation history current source is calculated according to the circuit parameters of the target DC transformer model; high and low voltage side currents of the single DC transformer are obtained from the simulation history current source, the Norton equivalent circuit is triggered by a switching signal, and all simulation high and low voltage side currents in the target DC transformer model are obtained in combination with the pre-decomposition matrix; based on all simulation high and low voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model, in combination with a system node voltage equation, branch node voltages are solved; it is judged whether the simulation is ended, if not, the simulation test is performed according to a new test instruction until the simulation is ended. The simulation test is realized by the DC transformer simulation platform, and the technical problem that the existing DC transformer simulation method needs to process a large amount of data when the number of DC transformers is large, thereby causing a large increase in the cost of test equipment, is solved.

[0092] Please refer to Figure 6 , Figure 6 The structure block diagram of the simulation test device embodiment of the DC transformer of the application comprises:

[0093] The response module 301 is configured to obtain a target DC transformer model from a test request in response to the test request.

[0094] The differential calculation module 302 is configured to perform differential calculation on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements.

[0095] The equivalent circuit determination module 303 is configured to calculate a Norton equivalent circuit of a single DC transformer in the target DC transformer model by an electromagnetic transient simulation node voltage algorithm.

[0096] a history current source determination module 304, configured to calculate a simulation history current source according to circuit parameters of the target DC transformer model;

[0097] an equivalent simulation module 305, configured to obtain high-voltage side and low-voltage side currents of a single DC transformer from the simulation history current source, trigger the Norton equivalent circuit through a switching signal, and obtain all simulation high-voltage side and low-voltage side currents in the target DC transformer model in combination with the pre-decomposition matrix;

[0098] a node voltage determination module 306, configured to obtain branch node voltages in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model;

[0099] a judgment module 307, configured to judge whether the simulation is ended, and if not, perform simulation test according to a new test instruction until the simulation is ended.

[0100] In an optional embodiment, the device further comprises:

[0101] an initialization module, configured to initialize control parameters corresponding to the simulation control process.

[0102] In an optional embodiment, the history current source determination module 304 comprises:

[0103] an admittance matrix calculation sub-module, configured to calculate a system admittance matrix in all switching states according to the circuit parameters of the target DC transformer model;

[0104] a target system admittance matrix determination sub-module, configured to select a target system admittance matrix corresponding to a current switching state from the saved system admittance matrix according to a switching change;

[0105] a simulation history current source determination sub-module, configured to perform triangular decomposition on the admittance matrix based on the circuit parameters of the target DC transformer model, and solve the simulation history current source.

[0106] In an optional embodiment, the node voltage determination module 306 is specifically configured to:

[0107] obtain branch node voltages in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the target system admittance matrix; and the system node voltage equation is specifically:

[0108] GV = I,

[0109] wherein G is a system admittance matrix, V is a node voltage vector, and I is all simulation high-voltage side and low-voltage side currents in the target DC transformer model.

[0110] The embodiment of the present application further provides an electronic device, comprising a memory and a processor, the memory stores a computer program, and the computer program is executed by the processor to make the processor execute the steps of the simulation test method of the direct-current transformer according to any one of the above-mentioned embodiments.

[0111] The embodiment of the present application further provides a computer storage medium, which stores a computer program, and the computer program is executed by the processor to implement the steps of the simulation test method of the network configuration self-recovery direct-current transformer according to any one of the above-mentioned embodiments.

[0112] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-mentioned system, device and unit can refer to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0113] In several embodiments provided in the present application, it should be understood that the disclosed method, device, electronic device and storage medium can be implemented by other ways. For example, the above-mentioned device embodiments are only schematic, for example, the division of the units is only a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interface, device or unit, and can be electrical, mechanical or other forms.

[0114] The units described as separate components can or can not be physically separate, and the components shown as units can or can not be physical units, that is, they can be located in one place, or can be distributed on a plurality of network units. According to actual needs, part or all of the units can be selected to achieve the purpose of the embodiment scheme.

[0115] In addition, each functional unit in each embodiment of the present application can be integrated in one processing unit, or each unit can exist physically, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of software functional unit.

[0116] The integrated unit, if implemented in the form of a software function unit and sold or used as an independent product, can be stored in a computer-readable storage medium. Based on such understanding, the technical solutions of the present application or all or part of the technical solutions that essentially contribute to the prior art can be embodied in the form of a software product. The computer software product is stored in a readable storage medium, including a number of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned readable storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), a magnetic disk or an optical disk, and various media that can store program codes.

[0117] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacements for some technical features; and these modifications or replacements do not make the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A method of simulating testing of a DC transformer, characterized by, The method comprises the following steps: in response to a test request, obtaining a target DC transformer model from the test request; performing difference calculation on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements; calculating a Norton equivalent circuit of a single DC transformer in the target DC transformer model through an electromagnetic transient simulation node voltage algorithm; calculating a simulation history current source according to circuit parameters of the target DC transformer model; obtaining high-voltage side and low-voltage side currents of the single DC transformer from the simulation history current source, triggering the Norton equivalent circuit through a switch signal, and combining the pre-decomposition matrix to obtain all simulation high-voltage side and low-voltage side currents in the target DC transformer model; solving branch node voltages based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model, and combining a system node voltage equation; determining whether the simulation is finished, and if not, performing simulation test according to a new test instruction until the simulation is finished; calculating a simulation history current source according to circuit parameters of the target DC transformer model, comprising: calculating a system admittance matrix of all switch states according to the circuit parameters of the target DC transformer model; selecting a target system admittance matrix corresponding to the current switch state from the saved system admittance matrix according to the switch change condition; performing triangular decomposition on the admittance matrix based on the circuit parameters of the target DC transformer model, and solving to obtain the simulation history current source; solving branch node voltages based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the circuit parameters of the target DC transformer model, and combining a system node voltage equation, comprising: solving branch node voltages based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the target system admittance matrix, and combining a system node voltage equation; the system node voltage equation is specifically: GV = I, wherein G is a system admittance matrix, V is a node voltage vector, and I is all simulation high-voltage side and low-voltage side currents in the target DC transformer model.

2. The simulation test method of a DC voltage transformer according to claim 1, characterized in that, Before performing difference calculation on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements, the method further comprises: initializing control parameters corresponding to a simulation control process.

3. An emulation test apparatus for a DC transformer, characterized by The method comprises the following steps: a response module for obtaining a target DC transformer model from a test request in response to the test request; a difference calculation module for performing difference calculation on all elements in the target DC transformer model to obtain a pre-decomposition matrix corresponding to the elements; an equivalent circuit determination module for calculating a Norton equivalent circuit of a single DC transformer in the target DC transformer model through an electromagnetic transient simulation node voltage algorithm; a history current source determination module for calculating a simulation history current source according to circuit parameters of the target DC transformer model; An equivalent simulation module is configured to obtain high-voltage side and low-voltage side currents of a single DC transformer from the simulation history current source, trigger the Norton equivalent circuit through a switching signal, and obtain all simulation high-voltage side and low-voltage side currents in the target DC transformer model in combination with the pre-decomposition matrix; A node voltage determination module is configured to obtain branch node voltages in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and circuit parameters of the target DC transformer model; A judgment module is configured to determine whether the simulation is ended, and if not, perform simulation testing according to a new test instruction until the simulation is ended. The history current source determination module comprises: An admittance matrix calculation submodule is configured to obtain system admittance matrices in all switching states based on circuit parameters of the target DC transformer model; A target system admittance matrix determination submodule is configured to select a target system admittance matrix corresponding to a current switching state from the saved system admittance matrices based on switching changes; A simulation history current source determination submodule is configured to perform triangular decomposition on the admittance matrix based on the circuit parameters of the target DC transformer model, and obtain the simulation history current source through solving. The node voltage determination module is specifically configured to: obtain branch node voltages in combination with a system node voltage equation based on all simulation high-voltage side and low-voltage side currents in the target DC transformer model and the target system admittance matrix; the system node voltage equation is specifically: GV=I, wherein G is a system admittance matrix, V is a node voltage vector, and I is all simulation high-voltage side and low-voltage side currents in the target DC transformer model.

4. The simulation test device of a DC voltage transformer according to claim 3, characterized in that Further comprising: An initialization module is configured to initialize control parameters corresponding to the simulation control process.

5. An electronic device, comprising: The computer program comprises a processor and a memory, and the memory stores computer readable instructions, when the computer readable instructions are executed by the processor, the method of any one of claims 1-2 is run.

6. A storage medium having stored thereon a computer program, characterized in that The computer program comprises a processor and a memory, and the memory stores computer readable instructions, when the computer readable instructions are executed by the processor, the method of any one of claims 1-2 is run.

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