A probe testing device

Abstract

The present invention relates to a probe testing device, including a motherboard, a base, a rocker arm, a slider and a probe PCB board, wherein the base is arranged on the upper side of the motherboard, the rocker arm is arranged at one end of the base and is rotatably connected to the base, the slider is arranged at the other end of the base, the slider and the base are slidably matched, and the probe PCB board is arranged in the middle below the rocker arm. The beneficial effects of the probe testing device provided by the present invention are: reasonable structure, convenient operation, and very high practical value. By operating the actions of the rocker arm and the slider, the probe PCB board is driven to move to the corresponding position, completing the data connection when the CFexpressTYPEA card is inserted into the card box for testing, and disconnecting the data before the CFexpressTYPEA card is removed from the card box for testing, so that multiple tests can be performed with one card insertion, and the device can be reused.

Description

Technical Field

[0001] The invention relates to the field of probe testing, in particular to a probe testing device. Background Art

[0002] There are three types of CFexpress memory cards on the market, namely Type A, Type B and Type C. The CFexpress TYPEA card is relatively small, so it is widely used in small cameras and equipment, and the market demand is very huge. When the CFexpress TypeA card is produced and tested, the CFexpress Type A card needs to be plugged and unplugged many times, and the CFexpress Type A card and the test end are connected through a data cable. When the CFexpress Type A card is inserted, the data in the CFexpress Type A card can be detected, and when the CFexpress Type A card is pulled out, the CFexpress Type A card can be disconnected. In the prior art, the tester needs to repeatedly plug and unplug the CFexpress Type A card, which will not only damage the interface of the CFexpress Type A card, but also reduce the test efficiency of the tester. Therefore, it is urgent to provide a probe test device with a simple structure, easy operation, data connection when the card is inserted into the connector for testing, data disconnection before the card is removed from the connector, and can be used repeatedly. Summary of the invention

[0003] The embodiment of the present invention provides a probe testing device to solve the technical problem in the prior art that a CFexpress Type A card needs to be repeatedly plugged in and out, which causes damage to the interface of the CFexpress Type A card and reduces the testing efficiency of the tester.

[0004] On the one hand, an embodiment of the present invention provides a probe testing device, including a motherboard, a base, a rocker arm, a slider and a probe PCB board, wherein the base is arranged on the upper side of the motherboard, the rocker arm is arranged at one end of the base and is rotatably connected to the base, the slider is arranged at the other end of the base, the slider is slidably matched with the base, and the probe PCB board is arranged in the middle below the rocker arm.

[0005] In some embodiments, the probe PCB board is connected by screws, a probe is connected to the probe PCB board, and a probe PCB board wiring harness connector is provided on a side of the probe PCB board away from the rocker arm.

[0006] In some embodiments, a motherboard wiring harness connector is fixedly provided on one side of the motherboard away from the probe PCB board wiring harness connector, and a data harness is provided between the probe PCB board wiring harness connector and the motherboard wiring harness connector, and the data harness is used to electrically connect the probe PCB board wiring harness connector with the motherboard wiring harness connector.

[0007] In some embodiments, the motherboard is provided with a probe socket extending therethrough, and a card insertion box is connected to the lower portion of the probe socket, wherein a CFexpress Type A card is inserted into the card insertion box.

[0008] In some embodiments, a protrusion is provided at one end of the rocker arm away from the pin shaft, and a first arc-shaped surface is provided on the side below the protrusion close to the slider; the side of the slider close to the protrusion is set to a 7 shape for clamping with the protrusion, and a first inclined surface is provided on the side above the slider close to the protrusion.

[0009] In some embodiments, the base is connected to the motherboard via screws, and the base is provided with a plurality of arc surfaces for preventing collision.

[0010] In some embodiments, a pin is inserted into the end of the rocker arm away from the slider, the rocker arm is connected to the base through the pin, a rocker spring is provided between the rocker arm and the base, and the rocker spring is located on the side close to the pin; a slider spring is provided between the slider and the base, and the slider and the base are elastically connected through the slider spring.

[0011] In some embodiments, a first circular groove is provided at the connection between the rocker arm and the rocker spring, and a second circular groove is provided at the connection between the base and the rocker spring. The first circular groove and the second circular groove are used to fix the rocker spring, and guide circles are provided at the openings of the first circular groove and the second circular groove.

[0012] The beneficial effects brought by the technical solution provided by the present invention include: when it is necessary to detect the CFexpress Type A card, the rocker arm is pressed, at this time, the first arc surface of the protrusion moves downward along the first inclined surface of the slider, and at the same time, the slider slides to the right, and when the protrusion on the rocker arm moves into the 7-shaped bayonet on the slider, the slider slides to the left under the elastic force of the slider spring, and the 7-shaped bayonet of the slider clamps the protrusion on the rocker arm, and the CFexpress Type A card is inserted through the card box. After the CFexpress Type A card is inserted, the probe and the CFexpress Type A card are in contact, so that the data on the CFexpress Type A card is transmitted to the probe PCB board harness connector through the probe, and then the information on the probe PCB board harness connector is transmitted to the motherboard harness connector through the data harness, and finally the motherboard harness connector transmits the information to the motherboard to realize data connection. When data disconnection is required, press the slider to make the slider slide along the slider track to the side away from the rocker arm. The rocker arm bounces up due to the elastic force of the rocker arm spring. At this time, release the slider. Under the action of the elastic force of the slider spring, the slider slides along the slider track to the side close to the rocker arm. When the slider slides to the end of the slider track, the limit block on the slider track blocks the sliding of the slider and the slider stops sliding. At this time, the first arc surface of the protrusion contacts the first inclined surface of the slider, so that the rocker arm forms a certain angle with the base, and the probe on the probe PCB board is away from the probe socket on the motherboard. At this time, pull the CFexpress Type A card out of the card box to complete the test. Through the above operation, data connection can be achieved when the card is inserted into the connector for testing, and data disconnection can be achieved before the card is removed from the connector, and it can be reused. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0014] Figure 1 A schematic diagram of the structure of a probe testing device provided by an embodiment of the present invention;

[0015] Figure 2 A cross-sectional diagram of a probe testing device provided by an embodiment of the present invention during detection;

[0016] Figure 3 A cross-sectional view of a probe testing device after being broken provided in an embodiment of the present invention;

[0017] In the figure: 1. CFexpress Type A card; 2. motherboard; 3. probe; 4. base; 5. pin; 6. rocker spring; 7. rocker; 8. data harness; 9. motherboard harness connector; 10. probe PCB board harness connector; 11. probe PCB board; 12. slider; 13. slider spring; 14. screw; 15. probe socket; 16. card box; 17. bump; 18. first arc surface; 19. first inclined surface; 20. first circular groove; 21. second circular groove. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] An embodiment of the present invention provides a probe testing device.

[0020] Please refer to Figure 1-3 As shown, an embodiment of the present invention provides a probe testing device.

[0021] It includes a motherboard 2, a base 4, a rocker arm 7, a slider 12 and a probe PCB board 11. The base 4 is arranged on the upper side of the motherboard 2, the rocker arm 7 is arranged at one end of the base 4 and is rotatably connected to the base 4, the slider 12 is arranged at the other end of the base 4, the slider 12 is slidably matched with the base 4, and the probe PCB board 11 is arranged in the middle below the rocker arm 7.

[0022] See also Figure 3 As shown, when the CFexpress Type A card 1 needs to be detected, the rocker arm 7 is pressed. At this time, the first arc surface 18 of the protrusion 17 moves downward along the first inclined surface 19 of the slider 12. At the same time, the slider 12 slides to the right. When the protrusion 17 on the rocker arm 7 moves into the 7-shaped bayonet on the slider 12, the slider 12 slides to the left under the elastic force of the slider spring 13. The 7-shaped bayonet of the slider 12 clamps the protrusion 17 on the rocker arm 7. At this time, see Figure 2 As shown, the CFexpress Type A card 1 is inserted through the card insertion box 16. After the CFexpress Type A card 1 is inserted, the probe 3 contacts the CFexpress Type A card 1. Figure 1In this way, the data on the CFexpress Type A card 1 is transmitted to the probe PCB board harness connector 10 through the probe 3, and then the information on the probe PCB board harness connector 10 is transmitted to the motherboard harness connector 9 through the data harness 8. Finally, the motherboard harness connector 9 transmits the information to the motherboard 2 to achieve data connection. When the data needs to be disconnected, press the slider 12 to slide the slider 12 along the slider slideway to the side away from the rocker arm 7. The rocker arm 7 is bounced up by the elastic force of the rocker arm spring 6, see Figure 2 , a first circular groove 20 is provided at the connection between the rocker arm 7 and the rocker arm spring 6, and a second circular groove 21 is provided at the connection between the base 4 and the rocker arm spring 6. The first circular groove 20 and the second circular groove 21 are used to fix the rocker arm spring 6. The openings of the first circular groove 20 and the second circular groove 21 are provided with guide circles to prevent the rocker arm spring 6 from colliding with the base 4 and the rocker arm 7. At this time, the slider 12 is released. Under the elastic force of the slider spring 13, the slider 12 slides along the slider slideway to the side close to the rocker arm 7. When the slider 12 slides to the end of the slider slideway, the limit block on the slider slideway blocks the sliding of the slider 12, and the slider 12 stops. At this time, the first arc surface 18 of the protrusion 17 contacts the first inclined surface 19 of the slider 12, so that the rocker arm 7 and the base 4 form a certain angle, and the probe 3 on the probe PCB board 11 is away from the probe socket 15 on the motherboard 2. At this time, the CFexpress Type A card 1 is pulled out from the card box 16 to complete the detection.

[0023] In the description of the present invention, it should be noted that the terms "upper", "lower", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as a limitation on the present invention. Unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0024] It should be noted that, in the present invention, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0025] The above description is only a specific embodiment of the present invention, so that those skilled in the art can understand or implement the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but should conform to the widest scope consistent with the principles and novel features invented herein.

Claims

1. A probe testing device, characterized in that: include: A motherboard (2) comprising a base (4), wherein the base (4) is arranged on the upper side of the motherboard (2); A rocker arm (7), the rocker arm (7) being disposed at one end of the base (4) and rotatably connected to the base (4); A slider (12), the slider (12) being arranged at the other end of the base (4), the slider (12) being in sliding cooperation with the base (4); A probe PCB board (11), the probe PCB board (11) being arranged in the middle portion below the rocker arm (7); The probe PCB board (11) is connected by screws (14), a probe (3) is connected to the probe PCB board (11), and a probe PCB board wiring harness connector (10) is provided on the other side of the probe PCB board (11) away from the rocker arm (7); A motherboard harness connector (9) is fixedly provided on one side of the motherboard (2) away from the probe PCB board harness connector (10); a data harness (8) is provided between the probe PCB board harness connector (10) and the motherboard harness connector (9); the data harness (8) is used to electrically connect the probe PCB board harness connector (10) with the motherboard harness connector (9); a probe socket (15) is provided through the motherboard (2); a card box (16) is also connected directly below the probe socket (15); a CFexpress TYPE A card (1) is inserted into the card box (16); A protrusion (17) is provided at one end of the rocker arm (7) away from the pin shaft (5); a first arcuate surface (18) is provided below the protrusion (17) on a side close to the slider (12); a side of the slider (12) close to the protrusion (17) is configured in a 7-shape for engaging with the protrusion (17); and a first inclined surface (19) is provided above the slider (12) on a side close to the protrusion (17).

2. A probe testing device according to claim 1, characterized in that: The base (4) is connected to the motherboard (2) via screws (14); the base (4) is provided with a plurality of arc surfaces for preventing collision.

3. A probe testing device according to claim 1, characterized in that: A pin shaft (5) is inserted into the end of the rocker arm (7) away from the slider (12); the rocker arm (7) and the base (4) are connected via the pin shaft (5); a rocker arm spring (6) is provided between the rocker arm (7) and the base (4); and the rocker arm spring (6) is located on a side close to the pin shaft (5); a slider spring (13) is provided between the slider (12) and the base (4); the slider (12) and the base (4) are elastically connected via the slider spring (13).

4. A probe testing device according to claim 3, characterized in that: A first circular groove (20) is provided at the connection between the rocker arm (7) and the rocker arm spring (6), and a second circular groove (21) is provided at the connection between the base (4) and the rocker arm spring (6). The first circular groove (20) and the second circular groove (21) are used to fix the rocker arm spring (6), and guide circles are provided at the openings of the first circular groove (20) and the second circular groove (21).

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