An infrared temperature measurement method, device, electronic equipment, and storage medium
By acquiring the detector temperature and grayscale difference, using a multiple linear regression model to calculate the temperature difference between the target and the baffle, and correcting the target temperature based on the distance, the error problem of infrared thermometers when measuring target temperature is solved, achieving higher measurement accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-06-17
- Publication Date
- 2026-04-03
AI Technical Summary
Existing infrared thermometers have errors when measuring target temperature. They are affected by factors such as target distance, ambient temperature, humidity, and detector temperature, making it difficult to accurately measure target temperature.
By acquiring the detector temperature, grayscale difference, and baffle temperature, the temperature difference between the target and the baffle is calculated using a multiple linear regression model, and the calculated target temperature is corrected based on the distance to achieve accurate measurement.
It improves the accuracy of infrared thermometry, reduces measurement errors, and enables accurate measurement of target temperature.
Smart Images

Figure CN115014536B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of infrared temperature measurement technology, and in particular to an infrared temperature measurement method and an apparatus, electronic device and storage medium for implementing the infrared temperature measurement method. Background Technology
[0002] With the development of electronic technology, infrared imaging and infrared thermometry are increasingly widely used in various fields of production and daily life. Infrared thermometry plays a crucial role in product quality control and monitoring, online equipment fault diagnosis and safety protection, and energy conservation during the production process. Currently, infrared thermometers are divided into those with and without baffles. When using infrared thermometers to measure the temperature of a target, certain errors will occur. These errors are mainly affected by various factors, such as the distance to the target, the ambient temperature (as the ambient temperature increases, the radiation received by the detector also increases, which increases the measurement error), the atmospheric conditions (besides temperature, humidity also significantly affects the measurement accuracy), and the temperature of the detector itself, which also affects the detector's response. Therefore, how to accurately measure the target temperature with a baffle-equipped infrared thermometer is a problem that urgently needs to be solved.
[0003] The information disclosed in this background section is intended only to enhance the understanding of the overall background of the invention and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Summary of the Invention
[0004] The purpose of this invention is to provide a baffle-based infrared thermometry method capable of accurately measuring the temperature of a target. It also discloses an apparatus, electronic device, and storage medium for implementing this infrared thermometry method.
[0005] To achieve the above objectives, embodiments of the present invention provide an infrared temperature measurement method, the infrared temperature measurement method comprising:
[0006] Obtain the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the radiation received by the detector when the baffle is open and the radiation received by the detector when the baffle is closed.
[0007] Calculate the temperature difference ΔT between the current target and the baffle based on the current detector temperature V and the current grayscale difference G, and further calculate the current target temperature T. c ;
[0008] Based on the calculated current target temperature T cThe distance L between the target and the sensor determines the temperature ratio R between the actual target temperature and the calculated target temperature. The actual target temperature T is then calculated based on this temperature ratio R. tar .
[0009] In one or more embodiments of the present invention, the grayscale difference G is determined according to the following formula:
[0010] G = G tar -G sh =K*(I tar -I sh ),in,
[0011] I sh I represents the radiation received by the detector when the mechanical baffle is activated. tar This represents the radiation received by the detector when the mechanical baffle is closed, and K is the gain coefficient for converting the voltage signal of the object after radiation into grayscale.
[0012] In one or more embodiments of the present invention, the temperature difference ΔT between the current target and the baffle is calculated using the following first multiple linear regression model:
[0013]
[0014] Where ΔT0~ΔTn is the temperature difference corresponding to ambient temperatures T0~Tn, V0~Vn is the detector temperature corresponding to ambient temperatures T0~Tn, K0~K4 are the coefficients of the multiple linear regression model, and β~N(0, σ 2 ).
[0015] In one or more embodiments of the present invention, the first multiple linear regression model is obtained through the following steps:
[0016] The detector temperature V, baffle temperature, target temperature, grayscale difference G, and temperature difference ΔT of the infrared thermometer core were obtained after thermal stabilization at different ambient temperatures.
[0017] Based on the collected data, a first multiple linear regression model is established to calculate the temperature difference ΔT between the target and the baffle according to the detector temperature V and the gray scale difference G, as shown below:
[0018]
[0019] Substitute the collected data into the first multiple linear regression model mentioned above to calculate the multiple linear regression coefficients k0, k1, k2, k3 and k4.
[0020] In one or more embodiments of the present invention, the temperature ratio R is calculated using the following second multiple linear regression model:
[0021]
[0022] Where R0~Rn is the temperature ratio corresponding to distances from L0~Ln, Tc0~Tcn is the calculated target temperature corresponding to distances from L0~Ln, and β'~N(0, σ 2 ).
[0023] In one or more embodiments of the present invention, the second multiple linear regression model is obtained through the following steps:
[0024] Obtain the target temperature at different distances L, calculate the target temperature Tc, and calculate the ratio R between the target temperature and the target temperature.
[0025] Based on the above data, a second multiple linear regression model is established to determine the proportion R based on the distance and the calculated target temperature, as shown below:
[0026]
[0027] Substitute the collected data into the second multiple linear regression model described above to calculate the multiple linear regression coefficients k0', k1', k2', k3', and k4'.
[0028] In one or more embodiments of the present invention, the distance between the target and the measuring device is selected from 2m, 5m, and 10m.
[0029] The present invention also discloses an infrared temperature measuring device, the infrared temperature measuring device comprising:
[0030] The acquisition module is used to acquire the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the amount of radiation received by the detector when the baffle is open and the amount of radiation received by the detector when the baffle is closed.
[0031] The temperature calculation module is used to calculate the temperature difference ΔT between the current target and the baffle based on the current detector temperature V and the current grayscale difference G, and further calculate the current target temperature T. c ;
[0032] The temperature correction module is used to adjust the current target temperature T based on the calculated temperature. c The distance between the target and the sensor determines the temperature ratio R between the actual target temperature and the calculated target temperature. The actual target temperature T is then calculated based on this ratio R. tar .
[0033] The present invention also discloses an electronic device comprising:
[0034] At least one processor; and
[0035] At least one memory is coupled to the at least one processor and stores a computer program for execution by the at least one processor, which, when executed by the at least one processor, causes the electronic device to perform the method described above.
[0036] The present invention also discloses a computer-readable storage medium having a computer program stored thereon, which, when executed by a machine, implements the method described above.
[0037] Compared with the prior art, the present invention corrects the calculated target temperature by using the distance between the target and the detector to determine the temperature ratio between the target and the actual target temperature after calculating the current target temperature, thereby obtaining an accurate target temperature. Attached Figure Description
[0038] Figure 1 This is a schematic diagram of an infrared temperature measurement principle according to an embodiment of the present invention;
[0039] Figure 2 This is a flowchart of an infrared temperature measurement method according to an embodiment of the present invention;
[0040] Figure 3 This is a structural block diagram of an infrared temperature measuring device according to an embodiment of the present invention. Detailed Implementation
[0041] The specific embodiments of the present invention will now be described in detail with reference to the accompanying drawings, but it should be understood that the scope of protection of the present invention is not limited to the specific embodiments.
[0042] Unless otherwise expressly stated, throughout the specification and claims, the term "comprising" or its variations such as "including" or "comprises" shall be understood to include the stated elements or components without excluding other elements or other components.
[0043] Combination Figure 1 and Figure 2 As shown, the infrared thermometry method based on a baffle disclosed in this invention can accurately measure the temperature of a target. The following examples illustrate this. Figure 1 Using the infrared temperature measurement principle diagram shown as an example, the infrared temperature measurement method described in this invention will be explained in detail. It should be noted that, depending on the detection target and working environment, the external and internal structures of the infrared temperature measurement mechanisms may differ. However, during infrared temperature measurement, each infrared temperature measurement mechanism can use the infrared temperature measurement principle diagram shown in the figure for temperature measurement. The infrared temperature measurement mechanism here includes, but is not limited to, a detector, a housing, and a mechanical baffle.
[0044] like Figure 1As shown, the infrared temperature measurement method based on a baffle disclosed in this invention includes the following steps:
[0045] S100, acquire the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the amount of radiation received by the detector when the baffle is open and the amount of radiation received by the detector when the baffle is closed.
[0046] Specifically, the detector can be used to measure the temperature of a target. In practice, at near-ambient temperature, the relationship between the radiation received by the detector and temperature is as follows:
[0047] I r (T)=I(T)=∫ Δλ L bλ dλ≈CT n
[0048] Where C is the speed of light in a vacuum, and C is 3*10 8 m / s, T is absolute temperature.
[0049] In this embodiment, the infrared temperature measurement mechanism is a long-wave infrared temperature measurement mechanism. Therefore, n is taken as 4 in the above formula, and the above formula can be further expressed as:
[0050] I(T)≈CT 4
[0051] Of course, in other embodiments, when an infrared thermometer with a wavelength of 2 to 5 μm is used, n is 9.2554; when an infrared thermometer with a wavelength of 8 to 13 μm is used, n is 3.9889.
[0052] like Figure 2 As shown, during temperature measurement, when the mechanical baffle is activated, the radiation received by the detector mainly consists of two parts: radiation from the housing and radiation from the mechanical baffle.
[0053] I sh =I(T) k1 )+I(T sh )
[0054] Among them, I sh I(T) represents the radiation received by the detector when the mechanical baffle is activated. k1 The symbol I(T) indicates that the detector receives radiation from the housing when the mechanical baffle is open. sh The symbol T indicates the radiation received by the detector from the mechanical baffle when the mechanical baffle is open. k1 The temperature of the housing when the mechanical baffle is open, T shThis indicates the temperature of the mechanical baffle when it is open. It should be noted that inside the infrared thermometer, the temperature of the mechanical baffle is the same as the temperature of the casing.
[0055] When the mechanical baffle is closed, the radiation received by the detector mainly consists of three parts: radiation from the housing, radiation from the target (which is attenuated by the lens), and radiation from the ambient temperature (also attenuated by the lens).
[0056] I tar =I(T) k2 )+I(T tar )+I(T u )
[0057] Among them, I tar I(T) represents the radiation received by the detector when the mechanical baffle is closed. k2 The symbol I(T) indicates that the detector receives radiation from the housing when the mechanical baffle is closed. tar The value I(T) indicates that the detector receives radiation from an external target when the mechanical baffle is closed, and this radiation is attenuated by the lens. u The figure (T) indicates the radiation received by the detector from the ambient temperature when the mechanical baffle is closed, and this radiation is the radiation attenuated by the lens. k2 The temperature of the housing when the mechanical baffle is closed, T tar Indicates the target temperature when the mechanical baffle is closed, T u This indicates the ambient temperature when the mechanical baffle is closed.
[0058] In order to achieve accurate measurement of the target temperature, this invention first obtains the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh This facilitates subsequent calculations of the temperature difference ΔT between the target and the mechanical baffle, as well as the target's temperature. In practice, the infrared thermometer can be placed in a high-low temperature chamber for data acquisition. Data is collected in the high-low temperature chamber as follows: the chamber is set to a specific temperature; after the infrared thermometer cools down for a certain period, the mechanical baffle is activated, and the current detector temperature V and the current baffle temperature T are then collected. sh And the current grayscale difference G. The current grayscale difference G can be determined based on the amount of radiation received by the detector before and after the mechanical baffle is opened. That is:
[0059] G = G tar -G sh =K*(I tar -I sh )=K*(I(T k2 )+I(T tar )+I(T u )-I(Tk1 )-I(T sh ))
[0060] Among them, T k2 T K1 and T sh Similarly, K is the gain coefficient for converting the voltage signal of an object after it has been irradiated into grayscale.
[0061] After acquiring the relevant data through the high and low temperature chamber, the current detector temperature V, the current grayscale difference G, and the current baffle temperature T can be further obtained. sh For example, the data processing module (including but not limited to CPU and microcontroller) establishes a communication connection with the high and low temperature chamber to obtain the current detector temperature V, the current grayscale difference G, and the current baffle temperature T through the high and low temperature chamber. sh The data processing module can further use this data to perform subsequent calculations on the temperature difference ΔT between the target and the mechanical baffle, as well as the temperature of the target.
[0062] S200, calculate the temperature difference ΔT between the current target and the baffle based on the current detector temperature V, the current grayscale difference G, and the following first multiple linear regression model, and further calculate the current target temperature T. c ;
[0063]
[0064] Where ΔT0~ΔTn is the temperature difference corresponding to ambient temperatures T0~Tn, V0~Vn is the detector temperature corresponding to ambient temperatures T0~Tn, and β is the random error after removing the influence of the independent variable on the temperature difference, and β~N(0, σ 2 ).
[0065] Specifically, after obtaining the current detector temperature V and the current grayscale difference G, the temperature difference ΔT between the target and the baffle can be calculated using the first multiple linear regression model. This first multiple linear regression model is used to calculate the temperature difference between the detector and the baffle based on the detector temperature V and the grayscale difference G. This first multiple linear regression model is obtained through the following steps:
[0066] First, the detector temperature V, baffle temperature, target temperature, grayscale difference G, and temperature difference ΔT between the target and the baffle of the infrared thermometer core after thermal stabilization at different ambient temperatures are obtained. During implementation, a high-low temperature chamber is used to collect the detector temperature V and baffle temperature T of the infrared thermometer core after thermal stabilization at different ambient temperatures. sh Target temperature T tar The grayscale difference G and temperature difference ΔT were used to obtain the data shown in the table below:
[0067]
[0068] Secondly, based on the collected data, a first multiple linear regression model is established to calculate the temperature difference ΔT between the target and the baffle according to the detector temperature V and the gray scale difference G, as shown below:
[0069]
[0070] Finally, the collected data are substituted into the first multiple linear regression model described above to calculate the multiple linear regression coefficients k0, k1, k2, k3, and k4. In practice, the first multiple linear regression model can be written in matrix form:
[0071] T = K × V + β
[0072] We use the least squares method to find suitable values A0, A1, A2, A3, and A4 for the multiple linear regression systems k0, k1, k2, k3, and k4, such that the sum of squared residuals between the actual observed values and the estimates of the first multiple linear regression model is minimized.
[0073]
[0074] According to the least squares method, by taking the partial derivatives of A0, A1, A2, A3 and A4 in the above equation and setting the partial derivatives to 0, we can obtain the following 5 equations, as shown below.
[0075]
[0076] Solving the equations yields the least squares estimates: A0, A1, A2, A3, and A4 are the least squares estimates of K0, K1, K2, K3, and K4 to be solved. After the infrared thermometer is powered on, given the current detector temperature V and the current grayscale difference G, these values can be substituted into the first multiple linear regression model described above to calculate the temperature difference ΔT between the detector and the baffle.
[0077] Once the current temperature difference ΔT is calculated, the current target temperature can be calculated using the following formula.
[0078] T c =T sh +ΔT
[0079] S300, based on the calculated current target temperature T c The distance L between the target and the detector, and the ratio R between the actual target temperature and the calculated target temperature determined by the second multiple linear regression model, are used to further calculate the actual target temperature T based on the ratio R. tar .
[0080]
[0081] Specifically, in practical applications, the distance between the target and the detector varies, and this distance has a certain impact on the actual target temperature. Therefore, to accurately measure the target temperature, the calculated target temperature can be corrected using the current distance between the target and the detector to obtain a more accurate target temperature, i.e., the actual target temperature. In implementation, the ratio R between the actual target temperature and the calculated target temperature at the current distance is first calculated using the following second multiple linear regression model.
[0082]
[0083] Finally, the actual target temperature is calculated based on this ratio R, i.e.:
[0084] T tar =T c / R
[0085] Among them, T c The target temperature is calculated at the current distance.
[0086] In this embodiment, the distance between the target and the detector is selected from 2m, 5m, and 10m to meet the actual usage requirements.
[0087] Furthermore, the second multiple linear regression model here can be obtained through the following steps:
[0088] First, obtain the target temperature at different distances L, calculate the target temperature Tc, and calculate the ratio R between the target temperature and the target temperature.
[0089] Specifically, the target temperature at different distances was obtained, and the calculated target temperature was then compiled into the data shown in the table below:
[0090]
[0091] Secondly, based on the above data, a multiple linear regression model is established to determine the proportion R based on the distance and the calculated target temperature, as shown below:
[0092]
[0093] Finally, the collected data is substituted into the second multiple linear regression model described above to calculate the multiple linear regression coefficients k0', k1', k2', k3', and k4'. The specific calculation process can be found in the calculation process described above, and will not be repeated here. Ultimately, B0, B1, B2, B3, and B4 can be obtained as the least squares estimates of the required K0', K1', K2', K3', and K4'. After the sensor is powered on, when the distance between the target and the infrared thermometer is known and the currently calculated target temperature is known, the distance and the currently calculated target temperature can be substituted into the second multiple linear regression model described above to calculate the ratio R between the currently calculated target temperature and the actual target temperature at the current distance.
[0094] Once the temperature ratio R is calculated, the actual target temperature can be calculated based on this ratio R, thus obtaining the accurate target temperature, i.e., T. tar =T c / R.
[0095] like Figure 3 As shown, the present invention also discloses an infrared temperature measuring device that can implement the infrared temperature measuring method described above. This infrared temperature measuring device includes an acquisition module, a temperature calculation module, and a temperature correction module. Wherein,
[0096] The acquisition module is used to acquire the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the amount of radiation received by the detector when the baffle is open and the amount of radiation received by the detector when the baffle is closed.
[0097] The temperature calculation module is used to calculate the temperature difference ΔT between the current target and the baffle based on the current detector temperature V, the current grayscale difference G, and the following first multiple linear regression model, and further calculates the current target temperature T. c ;
[0098]
[0099] Where ΔT0~ΔTn is the temperature difference corresponding to ambient temperatures T0~Tn, V0~Vn is the detector temperature corresponding to ambient temperatures T0~Tn, K0~K4 are the coefficients of the multiple linear regression model, and β~N(0, σ 2 );
[0100] The temperature correction module is used to adjust the current target temperature T based on the calculated temperature. c The distance L between the target and the measuring instrument and the following second multiple linear regression model are used to determine the temperature ratio R between the actual target temperature and the calculated target temperature, and the actual target temperature is further calculated based on the temperature ratio R.
[0101]
[0102] Where R0~Rn are the temperature proportions corresponding to distances from L0~Ln, Tc0~Tcn are the calculated target temperatures corresponding to distances from L0~Ln, K0'~K4' are the coefficients of the multiple linear regression model, and β'~N(0, σ 2 ).
[0103] The specific implementation details of the acquisition module, temperature calculation module, and temperature correction module are described above and will not be repeated here.
[0104] This invention also discloses an electronic device, which may include, but is not limited to, personal computers, server computers, workstations, desktop computers, laptop computers, notebook computers, mobile electronic devices, tablet computers, etc. This electronic device can implement the infrared temperature measurement method described above and can accurately measure the target temperature. Specifically, the electronic device includes at least one memory, at least one processor, and a computer program. The at least one memory is coupled to the at least one processor, wherein the computer program is stored in the memory and can be run in the processor, such as an infrared temperature measurement program. In implementation, when the processor executes the computer program, it can implement various steps in the above method, such as acquiring the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the amount of radiation received by the detector when the baffle is open and the amount of radiation received by the detector when the baffle is closed.
[0105] The computer program here can be divided into one or more units, which are stored in the memory and executed by the memory to complete the present invention. The one or more units may be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program in the electronic device.
[0106] It should be noted that the electronic devices mentioned here include, but are not limited to, the memory, processor, and computer program described above. They may also include other devices, such as temperature acquisition devices (e.g., high and low temperature chambers). These components communicate with each other via a bus.
[0107] This invention also discloses a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the aforementioned infrared temperature measurement method. The computer program includes computer program code, which can be in the form of source code, an executable file, or some intermediate form. The computer-readable medium can include any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM), a random access memory (RAM), etc.
[0108] As described above, those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0109] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0110] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.
[0111] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.
[0112] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.
[0113] The foregoing description of specific exemplary embodiments of the invention is for illustrative and explanatory purposes. These descriptions are not intended to limit the invention to the precise forms disclosed, and it will be apparent that many changes and variations can be made in accordance with the foregoing teachings. The exemplary embodiments were chosen and described in order to explain the specific principles of the invention and its practical application, thereby enabling those skilled in the art to implement and utilize various different exemplary embodiments of the invention, as well as various different choices and variations. The scope of the invention is intended to be defined by the claims and their equivalents.
Claims
1. An infrared temperature measurement method, characterized in that, The infrared temperature measurement method includes: Obtain the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the radiation received by the detector when the baffle is open and the radiation received by the detector when the baffle is closed. Calculate the temperature difference ΔT between the current target and the baffle based on the current detector temperature V and the current grayscale difference G, and further calculate the current target temperature T. c ; Based on the calculated current target temperature T c The distance L between the target and the detector determines the temperature ratio R between the actual target temperature and the calculated target temperature. The actual target temperature T is then calculated based on this temperature ratio R. tar .
2. The infrared temperature measurement method as described in claim 1, characterized in that, The grayscale difference G is determined according to the following formula: G = G tar -G sh = K*(I tar -I sh ), among them, I sh I represents the radiation received by the detector when the mechanical baffle is activated. tar This represents the radiation received by the detector when the mechanical baffle is closed, and K is the gain coefficient for converting the voltage signal of the object after radiation into grayscale.
3. The infrared temperature measurement method as described in claim 1, characterized in that, The temperature difference ΔT between the current target and the baffle is calculated using the following first multiple linear regression model: Where ΔT0~ΔTn is the temperature difference corresponding to ambient temperatures T0~Tn, V0~Vn is the detector temperature corresponding to ambient temperatures T0~Tn, K0~K4 are the coefficients of the multiple linear regression model, and β~N(0, σ 2 ).
4. The infrared temperature measurement method as described in claim 3, characterized in that, The first multiple linear regression model was obtained through the following steps: The detector temperature V, baffle temperature, target temperature, grayscale difference G, and temperature difference ΔT between the target and the baffle are obtained after the infrared thermometer core has reached thermal stability under different ambient temperatures. Based on the collected data, a first multiple linear regression model is established to calculate the temperature difference ΔT between the target and the baffle according to the detector temperature V and the gray scale difference G, as shown below: Substitute the collected data into the first multiple linear regression model mentioned above to calculate the multiple linear regression coefficients k0, k1, k2, k3 and k4.
5. The infrared temperature measurement method as described in claim 1, characterized in that, The temperature ratio R is calculated using the following second multiple linear regression model: Where R0~Rn are the temperature proportions corresponding to distances from L0~Ln, Tc0~Tcn are the calculated target temperatures corresponding to distances from L0~Ln, K0'~K4' are the coefficients of the multiple linear regression model, and β'~N(0, σ 2 ).
6. The infrared temperature measurement method as described in claim 5, characterized in that, The second multiple linear regression model is obtained through the following steps: Obtain the target temperature at different distances L, calculate the target temperature Tc, and calculate the ratio R between the target temperature and the target temperature. Based on the above data, a second multiple linear regression model is established to determine the temperature ratio R based on distance and the calculated target temperature, as shown below: Substitute the collected data into the second multiple linear regression model described above to calculate the multiple linear regression coefficients k0', k1', k2', k3', and k4'.
7. The infrared temperature measurement method as described in claim 1, characterized in that, The distance between the target and the detector is selected from one of 2m, 5m, and 10m.
8. An infrared temperature measuring device, characterized in that, The infrared temperature measuring device includes: The acquisition module is used to acquire the current detector temperature V, the current grayscale difference G, and the current baffle temperature T. sh The current grayscale difference G is determined based on the amount of radiation received by the detector when the baffle is open and the amount of radiation received by the detector when the baffle is closed. The temperature calculation module is used to calculate the temperature difference ΔT between the current target and the baffle based on the current detector temperature V and the current grayscale difference G, and further calculate the current target temperature T. c ; The temperature correction module is used to adjust the current target temperature T based on the calculated temperature. c The distance L between the target and the sensor determines the temperature ratio R between the actual target temperature and the calculated target temperature. The actual target temperature T is then calculated based on this temperature ratio R. tar .
9. An electronic device, characterized in that, The electronic device includes: At least one processor; and At least one memory coupled to the at least one processor and storing a computer program for execution by the at least one processor, the computer program, when executed by the at least one processor, causing the electronic device to perform the method according to any one of claims 1 to 7.
10. A computer-readable storage medium, characterized in that, It stores a computer program that, when executed by a machine, implements the method according to any one of claims 1 to 7.
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