A micro-short identification method, device, computer equipment and storage medium

Abstract

The embodiment of the application discloses a micro-short identification method and device, computer equipment and a storage medium, a PCB board comprises a network, the network comprises a line, the micro-short identification method comprises: S1, gradually increasing the voltage of both ends of the line to a preset voltage value; S2, generating the time-varying curve of the electric signal of the line in step S1; S3, judging whether the time-varying curve of the electric signal exists a mutation point; S4, if the time-varying curve of the electric signal exists a mutation point, it is determined that the line exists a micro-short, so that whether the line exists a micro-short can be quickly and accurately identified.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of PCB testing, and in particular to a micro-short identification method and device, computer equipment and a storage medium. BACKGROUND

[0002] The network test for PCBs at the present stage is commonly known as two-wire testing, which can only measure traditional O / S (Open-Short Test, IC open-short circuit test). Four-wire testing for PCBs can measure the resistance of the test points, and can measure the resistance of each network when the copper thickness and the board thickness of the PCB product are stable. When the copper thickness is thin or the line width is narrow, the resistance will obviously increase, thereby achieving the effect of measuring thin copper or line gaps. However, in the actual PCB production process, there may be foreign matter or micro-copper wires, commonly known as micro-short, which can form a short circuit after a long period of use. In particular, in the case of automotive products, micro-short can form a short circuit in different environments after a long period of use, causing abnormality.

[0003] However, the existing PCB test cannot accurately test the micro-short defects in the PCB. SUMMARY

[0004] The technical problem to be solved by the embodiments of the present application is how to test the micro-short defects in the PCB.

[0005] To solve the above problems, the embodiments of the present application provide a micro-short identification method. The PCB includes a network, and the network includes a line. The micro-short identification method comprises the following steps:

[0006] S1, gradually increasing the voltage at both ends of the line to a preset voltage value;

[0007] S2, generating an electrical signal curve of the line over time during step S1;

[0008] S3, determining whether the electrical signal curve over time has a mutation point;

[0009] S4, if the electrical signal curve has a mutation point, determining that the line has a micro-short.

[0010] A further technical solution is that, in step S1, the voltage is gradually and uniformly increased.

[0011] A further technical solution is that, step S2 comprises:

[0012] S21, recording the electrical signal of the line every preset time interval during step S1;

[0013] S22, fitting and generating the electrical signal curve over time according to the electrical signal recorded in step S21.

[0014] Further, the step S3 comprises:

[0015] S31, judging whether the curve of the electrical signal changing with time has a mutation moment, wherein the mutation moment is a moment at which the change amount of the electrical signal exceeds a preset change amount threshold;

[0016] S32, if the curve of the electrical signal changing with time has the mutation moment, judging whether the curve of the electrical signal changing with time has a mutation point.

[0017] Further, the electrical signal is a voltage signal or a current signal.

[0018] Further, the preset voltage value is 200V-300V.

[0019] Further, the preset time is 10-15us.

[0020] In a second aspect, a micro-short identification device comprises units for the method of the first aspect.

[0021] In a third aspect, a computer device comprises a memory and a processor, the memory stores a computer program, and the processor implements the method of the first aspect when executing the computer program.

[0022] In a third aspect, a computer readable storage medium stores a computer program, and the computer program can implement the method of the first aspect when executed by a processor.

[0023] Compared with the prior art, the technical effects that can be achieved by the embodiments of the present application include:

[0024] A micro-short identification method comprises: S1, gradually increasing the voltage at both ends of a line to a preset voltage value; S2, generating a curve of an electrical signal of the line changing with time during the step S1; S3, judging whether the curve of the electrical signal changing with time has a mutation point; and S4, if the curve of the electrical signal changing with time has the mutation point, judging that the line has a micro-short, so that whether the line has a micro-short can be quickly and accurately identified. BRIEF DESCRIPTION OF DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0026] Figure 1 A flowchart of a micro-short identification method proposed for an embodiment of the present application;

[0027] Figure 2 A detection voltage change over time graph proposed for an embodiment of the present application;

[0028] Figure 3 A structural block diagram of a micro-short identification proposed for an embodiment of the present application;

[0029] Figure 4 A schematic block diagram of a computer device provided for an embodiment of the present application. DETAILED DESCRIPTION

[0030] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts belong to the scope of the present application.

[0031] It should be understood that the terms “comprise” and “include” as used in the specification and the appended claims indicate the presence of the described features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0032] It should also be understood that the terms used in the present application specification are only for the purpose of describing specific embodiments and are not intended to limit the present application. As used in the present application specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0033] It should be further understood that the term “and / or” as used in the present application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0034] As used in the present application specification and the appended claims, the term “if’ can be interpreted as meaning “when” or “once” or “in response to a determination” or “in response to detecting” depending on the context. Similarly, the phrases “if determined” or “if detected [described condition or event]” can be interpreted to mean “once determined” or “in response to a determination” or “once detected [described condition or event]” or “in response to detecting [described condition or event]” depending on the context.

[0035] Reference is made to Figure 1The embodiment of the present application provides a micro-short identification method, which is used for detecting whether a micro-short exists in a PCB. The PCB comprises a network, and the network comprises a line. Specifically, the PCB can comprise a plurality of networks, and the network can comprise a plurality of lines. The method comprises steps S1-S4.

[0036] S1, gradually increasing a voltage at two ends of the line to a preset voltage value.

[0037] In specific implementation, the line refers to each line of the PCB, that is, steps S1-S4 are respectively performed on each line of the PCB to determine whether a micro-short exists.

[0038] The voltage probe is connected to the contacts at the two ends of the line, and the voltage is gradually increased to the preset voltage value. Specifically, the voltage can be uniformly increased to avoid the influence of voltage mutation on the test result.

[0039] S2, generating a curve of an electrical signal of the line changing with time in the process of step S1.

[0040] In specific implementation, the data of the electrical signal of the line in the process of step S1 is recorded, and the curve of the electrical signal changing with time is generated.

[0041] For example, in an embodiment, step S2 specifically comprises steps S21-S22.

[0042] S21, recording the electrical signal of the line every preset time interval in the process of step S1.

[0043] In specific implementation, the preset time interval is 10-15 us, for example, the preset time interval is 13 us in the embodiment.

[0044] Further, the electrical signal can be a voltage signal or a current signal, for example, the electrical signal is a voltage signal in the embodiment.

[0045] S22, fitting and generating the curve of the electrical signal changing with time according to the electrical signal recorded in step S21.

[0046] In specific implementation, the data points collected are first plotted in a preset coordinate system, and the curve of the electrical signal changing with time can be obtained by connecting the data points through a smooth curve.

[0047] S3, determining whether the curve of the electrical signal changing with time has a mutation point.

[0048] In specific implementation, the mutation point refers to a point at which the curve of the electrical signal changing with time instantaneously fluctuates.

[0049] Specifically, in an embodiment, step S3 comprises steps S31-S32.

[0050] S31, determining whether the electrical signal curve with time exists a mutation time, wherein the mutation time is the time point when the change of the electrical signal exceeds the preset change threshold.

[0051] In a specific implementation, at the mutation time, the change of the electrical signal exceeds the preset change threshold, which is manifested as a sudden mutation of the curve and a breakpoint.

[0052] In this embodiment, the electrical signal is a voltage signal, and the change threshold is set to 30V. That is, if the voltage value of a point on the electrical signal curve with time changes instantaneously by more than 30V, the time point corresponding to the point is determined as the mutation time.

[0053] S32, if the electrical signal curve with time exists a mutation time, determining whether the electrical signal curve with time exists a mutation point.

[0054] In a specific implementation, if the electrical signal curve with time exists a mutation time, it is determined whether the electrical signal curve with time exists a mutation point. The point corresponding to the mutation time is the mutation point.

[0055] S4, if the electrical signal curve exists a mutation point, it is determined that the line exists a micro short.

[0056] In a specific implementation, if the electrical signal curve exists a mutation point, it is determined that the line exists a micro short.

[0057] The principle of the present application is that after applying high voltage, the original foreign matter or small copper wire may change or burn out, and sparks may be generated at this time, and the current / voltage will suddenly fluctuate.

[0058] Specifically, when there is a small foreign matter or copper wire between the lines (i.e., a micro short), the small foreign matter or copper wire will decompose a part of the current (for example, 10pA) when a constant current is continuously input. According to U=IR, in the case of continuous voltage increase, the actual foreign matter or copper residue will decompose a part of the voltage, resulting in a temporary opportunity for the actual voltage to decrease.

[0059] Referring to Figure 2 In an embodiment, when the change of the voltage with time is detected to the time t, the voltage decreases by ΔV, and if ΔV is greater than 30V, it is determined that a micro short exists.

[0060] The embodiment of the present application proposes a PCB defect detection method, which at least includes a conduction test, a short circuit test, a leakage test, a four-wire test, and a micro short recognition method proposed in the above embodiment.

[0061] Conduction test: detecting whether each line of the same network is conductive.

[0062] Short circuit test: to detect whether there is a short circuit connection between the lines of different networks.

[0063] Leakage test: to detect whether there is a poor connection between the lines of different networks, such as debris, ion contamination, electronic migration, etc.

[0064] Four-wire test: to detect the actual resistance of the same network, and to detect small quality abnormalities such as hole breakage, small holes, and thin wires by comparing with the set upper limit.

[0065] Reference Figure 3 Corresponding to the above micro-short identification method, the present application also provides a micro-short identification device 20. The micro-short identification device 20 is applied to a test equipment, and the micro-short identification device 20 comprises:

[0066] A raising unit 21 is configured to perform S1, gradually raising the voltage at both ends of the line to a preset voltage value;

[0067] A generating unit 22 is configured to perform S2, generating a curve of the electrical signal of the line changing with time during step S1;

[0068] A judging unit 23 is configured to perform S3, judging whether there is a mutation point in the curve of the electrical signal changing with time;

[0069] A determining unit 24 is configured to perform S4, if there is a mutation point in the curve of the electrical signal changing with time, determining that there is a micro-short in the line.

[0070] In an embodiment, in step S1, the voltage is gradually and uniformly raised.

[0071] In an embodiment, step S2 comprises:

[0072] S21, recording the electrical signal of the line every interval of a preset time during step S1;

[0073] S22, fitting and generating the curve of the electrical signal changing with time according to the electrical signal recorded in step S21.

[0074] In an embodiment, step S3 comprises:

[0075] S31, judging whether there is a mutation time in the curve of the electrical signal changing with time, wherein at the mutation time, the change amount of the electrical signal exceeds a preset change amount threshold;

[0076] S32, if there is a mutation time in the curve of the electrical signal changing with time, determining whether there is a mutation point in the curve of the electrical signal changing with time.

[0077] In an embodiment, the electrical signal is a voltage signal or a current signal.

[0078] In an embodiment, the preset voltage value is 200V-300V.

[0079] In an embodiment, the preset time is 10-15us.

[0080] It should be noted that the specific implementation process of the micro-short identification device 20 and each unit can be clearly understood by those skilled in the art, and can refer to the corresponding description in the foregoing method embodiments. For the convenience and brevity of description, it will not be repeated here.

[0081] As shown in FIG. 1, Figure 4 The embodiment of the present application provides a computer device, which comprises a processor 111, a communication interface 112, a memory 113 and a communication bus 114, wherein the processor 111, the communication interface 112 and the memory 113 complete mutual communication through the communication bus 114,

[0082] The memory 113 is used for storing a computer program.

[0083] In an embodiment of the present application, the processor 111 is used for executing the program stored in the memory 113, so as to realize the steps in any one of the foregoing method embodiments.

[0084] Those skilled in the art can understand that all or part of the processes in the method of the foregoing embodiment can be completed by a computer program instructing related hardware. The computer program can be stored in a storage medium, which is a computer readable storage medium. The computer program is executed by at least one processor in the computer system, so as to realize the process steps of the foregoing method embodiment.

[0085] Therefore, the present application further provides a storage medium. The storage medium can be a computer readable storage medium. The storage medium stores a computer program. The computer program is executed by a processor to realize the steps in any one of the foregoing method embodiments.

[0086] The storage medium is an entity, non-transient storage medium, for example, can be a U disk, a mobile hard disk, a read-only memory (Read-Only Memory, ROM), a magnetic disk or an optical disk and various entity storage media which can store program codes. The computer readable storage medium can be non-volatile or volatile.

[0087] Those skilled in the art can understand that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized in electronic hardware, computer software or a combination of both. In order to clearly illustrate the interchangeability of hardware and software, the components and steps of each example have been described in the above description in a general manner. Whether the functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. A person skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0088] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of each unit is only a logical function division, and actual implementation can have another division manner. For example, a plurality of units or components can be combined or integrated into another system, or some features can be omitted or not executed.

[0089] The steps in the method embodiments of the present application can be sequentially adjusted, combined and deleted according to actual needs. The units in the device embodiments of the present application can be combined, divided and deleted according to actual needs. In addition, each functional unit in each embodiment of the present application can be integrated in one processing unit, or each unit can exist physically, or two or more units can be integrated in one unit.

[0090] The integrated unit, if realized in the form of a software functional unit and sold or used as an independent product, can be stored in a storage medium. Based on such understanding, the technical solutions of the present application essentially or say the parts that make contributions to the prior art, or the whole or part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes a plurality of instructions for causing a computer device (which can be a personal computer, a terminal or a network device, etc.) to execute all or part of the steps of the methods described in each embodiment of the present application.

[0091] In the above embodiments, the description of each embodiment has its own focus, and the parts not described in detail in a certain embodiment can be referred to the related description of other embodiments.

[0092] Obviously, those skilled in the art can make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, these modifications and variations of the present application are intended to be included within the scope of the claims of the present application and their equivalent technologies. The present application is also intended to include these modifications and variations.

[0093] The above merely illustrates the specific embodiments of the present application, but the protection scope of the present application is not limited thereto, and any skilled person in the art can easily think of various equivalent modifications or replacements within the technical range disclosed by the present application, and these modifications or replacements shall be covered within the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A micro-short identification method, characterized in that, The method is used for detecting whether there is micro-short in the PCB board; The micro-short refers to small foreign matters or copper wires between lines; the PCB board comprises a network, the network comprises lines, and the micro-short identification method comprises: S1, gradually increasing the voltage at both ends of the line to 200-300V; S2, generating the time-varying curve of the electric signal of the line in the process of step S1; S3, judging whether the time-varying curve of the electric signal has a mutation point; S4, if the time-varying curve of the electric signal has a mutation point, determining that the line has micro-short; The step S2 comprises: S21, recording the electric signal of the line every 10-15us in the process of step S1; S22, fitting and generating the time-varying curve of the electric signal according to the electric signal recorded in step S21; The step S3 comprises: S31, judging whether the time-varying curve of the electric signal has a mutation time, wherein the change amount of the electric signal at the mutation time exceeds a preset change amount threshold; S32, if the time-varying curve of the electric signal has a mutation time, determining that the time-varying curve of the electric signal has a mutation point.

2. The micro-short identification method of claim 1, wherein, In step S1, the voltage is gradually and uniformly increased.

3. The micro-short identification method of claim 1, wherein, The electric signal is a voltage signal or a current signal.

4. A micro short identification device, characterized by, The computer device comprises a memory and a processor, the memory stores a computer program, and the processor executes the computer program to realize the method of any one of claims 1-3.

5. A computer device, comprising: The computer device comprises a memory and a processor, the memory stores a computer program, and the processor executes the computer program to realize the method of any one of claims 1-3.

6. A computer readable storage medium characterized by, The storage medium stores a computer program, and the computer program can realize the method of any one of claims 1-3 when executed by a processor.

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