Integral hemispherical device and use thereof

Abstract

The application discloses an integrating sphere device and application thereof, and belongs to the field of material photoluminescence property testing. The integrating sphere device comprises an integrating sphere body, an excitation light incidence module and an emission light emission module arranged along the light path direction. The integrating sphere body is composed of a shell, a hemispherical cavity and a quartz sample cover. The excitation light incidence module is composed of a light inlet hole, a first rotary motor and a first reflector. The emission light emission module comprises a light outlet hole I, a light outlet hole II, a second rotary motor, a driving gear, a driven gear, a push-pull motor, a second reflector and a polytetrafluoroethylene plate. The device can respectively carry out spectrum testing, luminescence quantum efficiency testing and luminescence imaging on a luminescence sample, and can greatly improve the material photoluminescence property testing efficiency. Meanwhile, the luminescence sample is blocked outside the integrating sphere by the quartz sample cover, and the hemispherical cavity does not need to be opened when the sample is replaced, so that the problem of integrating sphere pollution caused by repeated opening of the hemispherical cavity or careless sample loading is avoided.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of optical measurement, and particularly relates to an integral hemispherical device and application thereof. BACKGROUND

[0002] The rapid development of the lighting and display industry has provided qualitative improvement for people's daily life, which is largely due to the continuous development and research of new light-emitting materials and devices. The light-emitting spectrum, quantum efficiency, light intensity distribution and other characteristics are the key basic indicators for evaluating the performance of light-emitting materials and devices. Since the light emitted by the light-emitting materials and devices has the characteristic of uneven spatial light intensity distribution, the light-emitting quantum efficiency test of the light-emitting materials generally needs to select an integral sphere device to remove the influence of spatial anisotropy. The integral hemispherical device skillfully uses the equatorial mirror symmetry principle, and is composed of a hemispherical surface and an equatorial high-reflective plane to form a closed hemispherical space. The integral hemispherical device has the same light homogenization effect as the integral sphere with the same diameter, and the size is reduced by half. In addition, the integral hemispherical device can provide nearly twice the light intensity output, and can be applied to more light collection and light homogenization scenes with size requirements. In addition, the previous integral hemispherical device has the problems of simple structure, single function and troublesome sample replacement, and cannot meet the in-situ test and observation requirements of material researchers on the spectrum, quantum efficiency and light intensity distribution of the materials. SUMMARY

[0003] In order to improve the test efficiency of the light-induced photoluminescence characteristics of the materials and perfect the test function of the light-emitting materials, an integral hemispherical device for spectrum and yield test and a test method are provided, which integrates the spectrum test, the light-emitting quantum efficiency test and the light intensity distribution imaging function of the light-emitting materials, can simplify the operation and improve the test efficiency, and has good application prospect.

[0004] The application provides an integral hemispherical device for spectrum and yield test, which integrates the spectrum test, the quantum efficiency test and the imaging function of the light-emitting materials, and can greatly improve the test efficiency of the light-induced photoluminescence characteristics of the materials and devices.

[0005] In one aspect of the application, an integral hemispherical device is provided, which comprises an integral hemispherical body, an excitation light incidence module and an emission light emission module arranged along the light path direction.

[0006] The integral hemisphere includes an outer shell, a sample cover, a shell with a hemispherical cavity, a circular hole is arranged at the center of the bottom of the cavity of the shell, the sample cover is installed at the circular hole, and the outer shell is installed on the outside of the shell; the shell is further provided with a through hole I-1, a through hole II-1 and a through hole III-1; the outer shell is provided with a through hole I-2, a through hole II-2 and a through hole III-2 corresponding to the positions of the through hole I-1, the through hole II-1 and the through hole III-1; the through hole I-1 is in communication with the through hole I-2, the through hole II-1 is in communication with the through hole II-2, and the through hole III-1 is in communication with the through hole III-2;

[0007] The excitation light incidence module includes a light inlet hole and a rotatable first mirror; the light inlet hole is in communication with the through hole I-2 and the through hole I-1 to form a light path I, and the first mirror is installed in the hemispherical cavity and is installed at an angle of 45° with the light inlet hole;

[0008] The emission light exit module includes a light outlet hole I, a light outlet hole II and a second mirror which can be extended and rotated, the light outlet hole I is in communication with the through hole II-2 and the through hole II-1 to form a light path II, the light path II is perpendicular to the light path I, the light outlet hole II is in communication with the through hole III-2 and the through hole III-1, and the second mirror is installed in the hemispherical cavity and located at a position opposite to the light inlet hole.

[0009] Optionally, the excitation light incidence module further includes a first rotating motor; the first rotating motor is installed on the top of the outer shell and close to the side of the light inlet hole;

[0010] The rotating shaft of the first rotating motor extends into the hemispherical cavity, and the free end of the rotating shaft is installed with the first mirror.

[0011] Optionally, the emission light exit module further includes a second rotating motor, a driving gear, a driven gear and a push-pull motor;

[0012] The second rotating motor is installed on the outer shell;

[0013] The driving gear is installed on the rotating shaft of the second rotating motor, the driving gear is engaged with the driven gear, and the driven gear is fixedly connected with the push-pull motor;

[0014] The back surface of the second mirror is fixedly connected with a polytetrafluoroethylene plate;

[0015] The push-pull shaft of the push-pull motor extends into the hemispherical cavity, and the free end of the push-pull shaft is installed with the polytetrafluoroethylene plate.

[0016] Optionally, the through hole I-1 and the through hole II-1 are both arranged on the side wall of the shell.

[0017] The through hole III-1 is arranged at the top of the shell and vertically above the circular hole.

[0018] Optionally, the integral hemisphere device further comprises a closing plug for closing the light outlet hole I and / or the light outlet hole II.

[0019] As a specific embodiment, the integral hemisphere device comprises an integral hemisphere body, an excitation light incidence module and an emission light outlet module. The integral hemisphere body is composed of an outer shell, a hemispherical cavity and a quartz sample cover. The outer shell is used for protecting the hemispherical cavity and mounting components of the excitation light incidence module and the emission light outlet module. The hemispherical cavity is provided with a circular hole at the center of the bottom, and the quartz sample cover is installed at the circular hole of the hemispherical cavity. The excitation light incidence module is composed of a light inlet hole, a first rotary motor and a first reflector. The light inlet hole is arranged on the side wall of the outer shell and the hemispherical cavity, and is used for allowing excitation light to enter the hemispherical cavity. The first rotary motor is installed on the top of the outer shell near the side of the light inlet hole. The rotary shaft of the rotary motor extends into the hemispherical cavity, and the end of the rotary shaft is provided with the first reflector which is installed at an angle of 45° with the light inlet hole. The emission light outlet module is composed of a side light outlet hole, an upper light outlet hole, a closing plug, a second rotary motor, a driving gear, a driven gear, a push-pull motor, a second reflector and a polytetrafluoroethylene plate. The side light outlet hole is arranged on the side wall of the outer shell and the hemispherical cavity in a direction perpendicular to the light inlet hole. The upper light outlet hole is arranged on the top of the outer shell and the hemispherical cavity opposite to the quartz sample cover. The closing plug is used for selectively closing the side light outlet hole or the upper light outlet hole. The second rotary motor is installed on the side wall of the outer shell opposite to the side wall where the light inlet hole is arranged. The rotary shaft of the second rotary motor is provided with the driving gear. The driven gear is tightly connected with the body of the push-pull motor and is engaged with the driving gear. The push-pull motor is installed on the side wall of the outer shell opposite to the light inlet hole. The push-pull shaft of the push-pull motor extends into the hemispherical cavity, and the end of the push-pull shaft is provided with the first reflector and the polytetrafluoroethylene plate which are fixed on the back surface.

[0020] In another aspect of the present application, a luminescence characteristic measuring device is provided, which comprises the integral hemisphere device, a light source and a spectrum system.

[0021] The light source is used for emitting an excitation light beam into the hemispherical cavity through the light inlet hole.

[0022] The spectrum system is used for receiving excitation light emitted from the light outlet hole I.

[0023] The integral hemisphere device is selected from the integral hemisphere devices described above.

[0024] In another aspect of the present application, a method for testing the spectrum of a luminescent material is provided, which method employs the luminescence characteristic measuring device described above.

[0025] The method comprises:

[0026] (1) placing the luminescent material sample to be tested in the sample cover;

[0027] (2) rotating the first mirror by the first rotating motor so that the reflecting surface of the first mirror is directed to the light inlet hole;

[0028] (3) pushing the second mirror to above the sample cover by the push-pull motor; rotating the driving gear by the rotating shaft of the second rotating motor, and rotating the driven gear and the push-pull motor by the driving gear, so that the reflecting surface of the second mirror is at an angle of 45° with the center line of the light outlet hole I, and the reflecting surface faces downward;

[0029] (4) the light source emits an excitation light beam, which enters the hemispherical cavity through the light inlet hole, is reflected by the first mirror, and irradiates the luminescent material sample to be tested through the sample cover; the excitation light emitted by the luminescent material sample to be tested is reflected by the second mirror and exits through the light outlet hole I;

[0030] (5) the spectrum system receives the excitation light exiting from the light outlet hole I and performs spectrum testing of the luminescent material sample to be tested.

[0031] As a specific embodiment, the spectrum testing method comprises:

[0032] The integral hemisphere device can be placed in a conventional spectrum instrument sample chamber to perform the spectrum testing method of the luminescent sample, such as Figure 4The light emitting sample is placed in the quartz sample cover; the first mirror is rotated by the first rotating motor so that the reflecting surface of the first mirror is opposite to the light inlet hole; the second mirror and the PTFE plate are pushed to above the quartz sample cover by the push-pull motor; the driving gear is rotated by the rotating shaft of the second rotating motor, the driven gear and the push-pull motor fixedly connected with the driven gear are rotated to a position where the center line of the side light outlet hole of the mirror piece is at 45° and the mirror surface is downward, and the closed hole plug seals the upper light outlet hole. The excitation light enters the hemispherical cavity through the light inlet hole, is reflected by the first mirror, and irradiates the light emitting sample through the quartz sample cover. The light emitted by the light emitting sample is reflected by the second mirror and emitted through the side light outlet hole, and the spectral test of the light emitting sample is performed.

[0033] In another aspect of the present application, a method for testing the luminescence quantum efficiency of a luminescent material is provided, and the method uses the luminescence characteristic measuring device described above.

[0034] The method comprises:

[0035] (1) testing the internal environment of the hemispherical cavity to obtain the internal environment spectral parameters of the hemispherical cavity;

[0036] (2) testing the spectral parameters of the luminescent material sample to be tested, and obtaining the luminescence quantum efficiency of the luminescent material sample to be tested by operating the internal environment spectral parameters of the hemispherical cavity obtained in step (1).

[0037] Optionally, the step (1) comprises:

[0038] S01, rotating the first mirror by the first rotating motor so that the reflecting surface of the first mirror is not opposite to the light inlet hole;

[0039] S02, the light source emits an excitation light beam, the excitation light beam enters the hemispherical cavity through the light inlet hole, and is reflected by the first mirror to hit the inner wall of the hemispherical cavity;

[0040] S03, the second mirror is pushed to above the sample cover by the push-pull motor; the driving gear is rotated by the rotating shaft of the second rotating motor, and the driven gear and the push-pull motor are rotated by the driving gear so that the PTFE plate is positioned at the position where the light outlet hole I is perpendicular to the bottom of the hemispherical cavity;

[0041] S04, a closing hole plug closes the light outlet hole II, the excitation light beam is in the hemispherical cavity, after diffuse reflection, it is emitted through the light outlet hole I, enters the spectrum system, and obtains the internal environment spectrum parameter of the hemispherical cavity;

[0042] Wherein, the sample cover does not place the to-be-tested luminescent sample.

[0043] Optionally, the step (2) comprises:

[0044] M01, the to-be-tested luminescent material sample is placed in the sample cover, the first mirror is rotated by the first rotating motor, and the reflecting surface of the first mirror is opposite to the light inlet hole;

[0045] M02, the light source emits an excitation light beam, the excitation light beam enters the hemispherical cavity through the light inlet hole, is reflected by the first mirror, and irradiates the to-be-tested luminescent material sample through the sample cover;

[0046] M03, the second mirror is pushed above the sample cover by the push-pull motor; the driving gear is rotated by the rotating shaft of the second rotating motor, the driven gear and the push-pull motor are rotated by the driving gear, the polytetrafluoroethylene plate is positioned towards the light outlet hole I and perpendicular to the bottom of the hemispherical cavity;

[0047] M04, a closing hole plug closes the light outlet hole II, the excitation light beam is in the hemispherical cavity, after diffuse reflection, it is emitted through the light outlet hole I, enters the spectrum system, and obtains the internal environment spectrum parameter of the hemispherical cavity, and the luminescent quantum efficiency of the to-be-tested luminescent sample is obtained by operation with the internal environment spectrum parameter of the hemispherical cavity.

[0048] As a specific embodiment, the method for testing the luminescent quantum efficiency comprises:

[0049] Firstly, the internal environment of the hemispherical cavity is tested.

[0050] As Figure 5As shown, the luminescent sample is not placed in the quartz sample cover. The first reflector is rotated by the first rotary motor so that its reflective surface is not directly facing the light inlet. The excitation beam entering the hemispherical cavity through the light inlet is reflected by the first reflector and strikes the inner wall of the hemispherical cavity. The second reflector and the polytetrafluoroethylene plate, which are fixed to each other on their backs, are pushed above the quartz sample cover by the push-pull motor. The rotating shaft of the second rotary motor drives the driving gear to rotate, and the driven gear and the push-pull motor, which are fastened to it, are driven by the driving gear to rotate until the polytetrafluoroethylene plate is perpendicular to the bottom of the hemispherical cavity and faces the side light outlet. The sealing plug closes the upper light outlet. The excitation light enters the hemispherical cavity through the light inlet, is reflected by the first reflector and strikes the inner wall of the hemispherical cavity, and after multiple diffuse reflections within the hemispherical cavity, it exits through the side light outlet, obtaining the environmental spectral parameters within the hemispherical cavity.

[0051] The second step is to test the luminescence quantum efficiency of the luminescent sample:

[0052] like Figure 6 As shown, the luminescent sample is placed in the quartz sample cover; the first reflector is rotated by the first rotary motor so that the reflecting surface of the first reflector faces the light inlet hole; the second reflector and the polytetrafluoroethylene plate, which are fixed to each other on their backs, are kept above the quartz sample cover, while the position of the polytetrafluoroethylene plate perpendicular to the bottom of the hemispherical cavity and facing the side light outlet hole remains unchanged. The sealing plug closes the upper light outlet hole. Excitation light enters the hemispherical cavity through the light inlet hole, is reflected by the first reflector, passes through the quartz sample cover, and illuminates the luminescent sample. The light emitted by the luminescent sample after being excited undergoes multiple diffuse reflections in the hemispherical cavity and is uniformly emitted through the side light outlet hole, obtaining the spectral parameters of the luminescent sample with the influence of the environment inside the hemispherical cavity. The luminescence quantum efficiency of the luminescent sample is obtained by calculating with the spectral parameters of the environment inside the hemispherical cavity obtained in the first step.

[0053] Another aspect of this application provides a light-emitting imaging measurement device, which includes the integrating hemisphere device, a light source, and an imaging system;

[0054] The light source is used to emit an excitation beam that enters the hemispherical cavity through the light inlet hole;

[0055] The imaging system is located above the integrating hemisphere device and is used to receive the excitation light emitted from the light exit aperture II;

[0056] The integrating hemisphere device is selected from the aforementioned integrating hemisphere device.

[0057] In another aspect of the present application, a method for luminescence imaging of a luminescent material is provided, which employs the luminescence imaging measuring device described above.

[0058] The method comprises:

[0059] (a) placing the luminescent material sample to be tested in the sample holder; rotating the first mirror by the first rotating motor so that the reflecting surface of the first mirror is directly opposite the light inlet hole; and pulling the second mirror away from the position above the sample holder by the push-pull motor;

[0060] (b) closing the light outlet hole I with the stopper, and the light source emits an excitation light beam which enters the hemispherical cavity through the light inlet hole, is reflected by the first mirror, and irradiates the luminescent material sample to be tested through the sample holder, and the luminescence emitted by the luminescent material sample to be tested under excitation is emitted through the light outlet hole II into the imaging system to perform luminescence imaging of the luminescent material sample to be tested.

[0061] As a specific embodiment, the method for luminescence imaging comprises:

[0062] As shown in Figure 7 placing the luminescent sample in the quartz sample holder; rotating the first mirror by the first rotating motor so that the reflecting surface of the first mirror is not directly opposite the light inlet hole, and the excitation light beam entering the hemispherical cavity through the light inlet hole hits the inner wall of the hemispherical cavity after being reflected by the first mirror; and pulling the second mirror and the PTFE plate fixedly attached to the back away from the position above the quartz sample holder by the push-pull motor. The side light outlet hole is closed by the stopper. Excitation light enters the hemispherical cavity through the light inlet hole, is reflected by the first mirror, and irradiates the inner wall of the hemispherical cavity through the quartz sample holder, and after multiple diffuse reflections in the hemispherical cavity, the luminescent sample is uniformly irradiated, and the luminescence emitted by the luminescent sample under excitation is emitted through the upper light outlet hole directly above to perform luminescence imaging of the luminescent sample.

[0063] The present application can produce beneficial effects, including:

[0064] The integral hemispherical device disclosed in the present application can realize the functions of spectral testing, luminescence quantum efficiency testing, and imaging of a luminescent sample, and can improve the efficiency of testing the photoluminescence characteristics of the material; at the same time, the luminescent sample is blocked outside the integral sphere by the quartz sample holder, so that the hemispherical cavity does not need to be opened when the sample is replaced, and the problem of contamination of the integral sphere caused by repeated opening of the hemispherical cavity or careless sample loading is avoided. BRIEF DESCRIPTION OF DRAWINGS

[0065] Figure 1It is an appearance schematic diagram of the integral hemisphere device in the embodiment of the present application.

[0066] Figure 2 It is a half-section schematic diagram of the integral hemisphere device in the embodiment of the present application.

[0067] Figure 3 It is a schematic diagram of transmission of the second rotary motor and the push-pull motor of the integral hemisphere device in the embodiment of the present application.

[0068] Figure 4 It is a schematic diagram of spectral test of the integral hemisphere device in the embodiment 1 of the present application.

[0069] Figure 5 It is a first-step schematic diagram of luminescence quantum efficiency test of the integral hemisphere device in the embodiment 2 of the present application.

[0070] Figure 6 It is a second-step schematic diagram of luminescence quantum efficiency test of the integral hemisphere device in the embodiment 2 of the present application.

[0071] Figure 7 It is a schematic diagram of luminescence imaging of the integral hemisphere device in the embodiment 3 of the present application.

[0072] Wherein:

[0073] 1, shell, 2, hemisphere cavity, 3, quartz sample cover, 4, light inlet hole, 5, first rotary motor, 6, first mirror, 7, side light outlet hole, 8, upper light outlet hole, 9, closed hole plug, 10, second rotary motor, 11, driving gear, 12, driven gear, 13, push-pull motor, 14, second mirror, 15, polytetrafluoroethylene plate, 16, luminescence sample. DETAILED DESCRIPTION

[0074] The present application will be described in detail below in combination with embodiments, but the present application is not limited to these embodiments.

[0075] The present application provides an integral hemisphere device for spectral and yield test, which integrates spectral test, luminescence quantum efficiency test and imaging function of luminescent materials and devices, and can greatly improve the test efficiency of photoluminescence characteristics of materials.

[0076] The integral hemisphere device for spectral and yield test provided by the present application is as follows: Figures 1-3As shown, it mainly includes an integrating hemisphere, an excitation light incident module, and an emission light exiting module. The integrating hemisphere consists of a shell 1, a hemispherical cavity 2, and a quartz sample cover 3. The shell 1 protects the hemispherical cavity 2 and houses the components of the excitation light incident module and the emission light exiting module. A circular hole is opened at the center of the bottom of the hemispherical cavity 2, and the quartz sample cover 3 is installed at the circular hole at the center of the bottom of the hemispherical cavity 2. The excitation light incident module consists of a light inlet 4, a first rotary motor 5, and a first reflector 6. The light inlet 4 is opened on the side wall of the shell 1 and the hemispherical cavity 2, and is used to allow excitation light to enter the hemispherical cavity 2. The first rotary motor 5 is installed on the top of the shell 1 near the light inlet 4, and the rotating shaft of the rotary motor extends into the hemispherical cavity 2. The first reflector 6 is installed at a 45° angle to the light inlet 4 at its end. The light emission module comprises a side light emission hole 7, an upper light emission hole 8, a second rotary motor 10, a drive gear 11, a driven gear 12, a push-pull motor 13, a second reflector 14, and a polytetrafluoroethylene plate 15. The side light emission hole 7 is located on the side wall of the outer shell 1 and the hemispherical cavity 2 in a direction perpendicular to the light inlet hole 4. The upper light emission hole 8 is located on the top of the outer shell 1 and the hemispherical cavity 2, directly opposite the quartz sample cover 3. The second rotary motor 10 is installed on the side wall of the outer shell 1, directly opposite the side wall where the light inlet hole 4 is located. The drive gear 11 is installed on its rotating shaft. The driven gear 12 is fastened to the body of the push-pull motor 13 and meshes with the drive gear 11. The push-pull motor 13 is installed on the side wall of the outer shell 1, directly opposite the light inlet hole 4. The push-pull shaft of the push-pull motor 13 extends into the hemispherical cavity 2, and the end of the push-pull motor 13 is fitted and fixed with the back of the first reflector 6 and the polytetrafluoroethylene plate 15.

[0077] The following specific implementation examples illustrate the testing method of the integrating hemisphere device for spectral and yield testing provided by the present invention, which can perform spectral testing, luminescence quantum efficiency testing, and luminescence imaging of the luminescent sample 16, respectively.

[0078] Example 1

[0079] The aforementioned integrating hemisphere device for spectral and yield testing can be placed in the sample chamber of a conventional spectrometer to perform spectral testing of the luminescent sample 16, such as... Figure 4As shown, the luminescent sample 16 is placed in the quartz sample cover 3. First, the first rotary motor 5 is started, and the rotating shaft of the first rotary motor 5 drives the first reflector 6 on it to rotate until the reflective surface of the first reflector 6 is directly facing the light inlet hole 4. Then, the push-pull motor 13 is started to push the second reflector 14 and the polytetrafluoroethylene plate 15, which are fixed to each other on the back, to the top of the quartz sample cover 3 and then stops. Finally, the rotating shaft of the second rotary motor 10 is started to drive the driving gear 11 on it to rotate. The driving gear 11 meshes with the driven gear 12, which can drive the driven gear 12 and the push-pull motor 13, which is fastened to it, to rotate until the second reflector 14 is at a 45° angle to the center line of the side light outlet hole 7 and the reflective surface of the second reflector 14 is facing downward. The sealing plug 9 seals the upper light outlet hole 8. The excitation beam emitted by the light source enters the hemispherical cavity 2 through the light inlet 4, is reflected by the first reflector 6 and passes through the quartz sample cover 3 to illuminate the luminescent sample 16. Most of the light emitted by the luminescent sample 16 is reflected by the second reflector 14 and exits through the side light outlet 7 into the spectral system for spectral testing of the luminescent sample 16.

[0080] Example 2

[0081] The method described above describes an integrating hemisphere apparatus for measuring the luminescence quantum efficiency of luminescent samples.

[0082] Step 1: Test the internal environment of hemispherical cavity 2:

[0083] like Figure 5 As shown, no luminescent sample 16 is placed in the quartz sample cover 3. First, the first rotary motor 5 is started to rotate the first reflector 6 so that the reflecting surface of the first reflector 6 is not directly facing the light inlet 4. The excitation beam entering the hemispherical cavity 2 through the light inlet 4 is reflected by the first reflector 6 and hits the inner wall of the hemispherical cavity 2. Then, the push-pull motor 13 is started to push the second reflector 14 and the polytetrafluoroethylene plate 15, which are fixed to the back, to the top of the quartz sample cover 3. Finally, the rotating shaft of the second rotary motor 10 is started to drive the driving gear 11 on it to rotate. The driving gear 11 meshes with the driven gear 12, which can drive the driven gear 12 and the push-pull motor 13, which are fastened to it, to rotate until the polytetrafluoroethylene plate 15 is perpendicular to the bottom of the hemispherical cavity 2 and faces the side light outlet 7. The sealing plug 9 closes the upper light outlet 8. At this time, the half-integrating sphere is a high-reflection-efficiency cavity. The excitation beam emitted by the light source enters the hemispherical cavity 2 through the light inlet 4, is reflected by the first reflecting mirror 6 and hits the inner wall of the hemispherical cavity 2, and after multiple diffuse reflections in the hemispherical cavity 2, it is uniformly emitted into the spectral system through the side light outlet 7 to obtain the environmental spectral parameters inside the hemispherical cavity 2.

[0084] The second step is to test the luminescence quantum efficiency of luminescent sample 16:

[0085] like Figure 6As shown, the light-emitting sample 16 is placed in the quartz sample holder 3; the first rotary motor 5 is started again to rotate the first mirror 6, so that the reflecting surface of the first mirror 6 is opposite to the light inlet hole 4; the second mirror 14 and the PTFE plate 15 which are fixed on the back are kept in the position above the quartz sample holder 3, and the PTFE plate 15 is kept perpendicular to the bottom of the hemispherical cavity 2 and faces the side light outlet hole 7. The upper light outlet hole 8 is closed by the plug 9. The excitation light beam emitted by the light source enters the hemispherical cavity 2 through the light inlet hole 4, is reflected by the first mirror 6, and irradiates the light-emitting sample 16 through the quartz sample holder 3. The light emitted by the light-emitting sample 16 after excitation is uniformly emitted into the spectral system through the side light outlet hole 7 after multiple diffuse reflections in the integrating sphere, and the spectral parameters of the light-emitting sample 16 with the influence of the environment in the hemispherical cavity 2 are obtained. The light-emitting quantum efficiency of the light-emitting sample 16 is obtained by operation with the spectral parameters of the environment in the hemispherical cavity 2 obtained in the first step.

[0086] Example 3

[0087] The light-emitting imaging method of the light-emitting sample by the above-described spectral and yield test integrating hemispherical device is as follows: Figure 7 As shown, the whole set of integrating hemispherical device is placed directly below the imaging system; the light-emitting sample 16 is placed in the quartz sample holder 3; first, the first rotary motor 5 is started to rotate the first mirror 6, so that the reflecting surface of the first mirror 6 is not opposite to the light inlet hole 4. The excitation light beam entering the hemispherical cavity 2 through the light inlet hole 4 is reflected by the first mirror 6 and hits the inner wall of the hemispherical cavity 2. Then, the push-pull motor 13 is started to pull the second mirror 14 and the PTFE plate 15 which are fixed on the back to a position away from above the quartz sample holder 3. The side light outlet hole 7 is closed by the plug 9. The excitation light beam emitted by the light source enters the hemispherical cavity 2 through the light inlet hole 4, is reflected by the first mirror 6, and irradiates the inner wall of the hemispherical cavity 2. After multiple diffuse reflections in the hemispherical cavity 2, the light uniformly irradiates the light-emitting sample 16. The light emitted by the light-emitting sample 16 after excitation is emitted into the imaging system through the upper light outlet hole 8 directly above, and the light-emitting imaging of the light-emitting sample 16 is realized.

[0088] The above is only a few embodiments of the present application, and does not limit the present application in any form. Although the above is disclosed in the preferred embodiments, it is not intended to limit the present application. Any person skilled in the art can make some changes or modifications to the above disclosed technical content without departing from the scope of the technical solution of the present application, which are equivalent to equivalent embodiments, and all of them are within the scope of the technical solution.

Claims

1. An integrating hemispherical device, characterized in that, The integrating hemisphere device includes an integrating hemisphere arranged along the optical path direction, an excitation light incident module, and an emission light exiting module. The integrating hemisphere includes an outer shell, a sample cover, and a housing with a hemispherical cavity. A circular hole is located at the center of the bottom of the cavity of the housing. The sample cover is installed at the circular hole, and the outer shell is installed on the outside of the housing. The housing also has through holes I-1, II-1, and III-1. The outer shell has through holes I-2, II-2, and III-2 corresponding to the positions of through holes I-1, II-1, and III-1. Through holes I-1 and I-2 communicate with each other; through holes II-1 and II-2 communicate with each other; and through holes III-1 and III-2 communicate with each other. The excitation light incident module includes a light inlet and a rotatable first reflector; the light inlet is connected to the through hole I-2 and through hole I-1 to form an optical path I; the first reflector is installed in the hemispherical cavity and is installed at a 45° angle to the light inlet. The light emission module includes a light emission aperture I, a light emission aperture II, and a retractable and rotatable second reflector. The light emission aperture I communicates with through holes II-2 and II-1 to form light path II, which is perpendicular to light path I. The light emission aperture II communicates with through holes III-2 and III-1. The second reflector is installed in the hemispherical cavity and is located opposite to the light inlet aperture. The light emission module also includes a second rotary motor, a drive gear, a driven gear, and a push-pull motor. The second rotary motor is installed on the outer casing. The driving gear is mounted on the rotating shaft of the second rotary motor, the driving gear meshes with the driven gear, and the driven gear is fixedly connected to the push-pull motor; The back of the second reflector is attached and fixed to the polytetrafluoroethylene plate; the push-pull shaft of the push-pull motor extends into the hemispherical cavity, and the polytetrafluoroethylene plate is installed on the free end of the push-pull shaft; The excitation light incident module also includes a first rotary motor; the first rotary motor is installed on the top of the housing, near the light inlet hole. The rotating shaft of the first rotary motor extends into the hemispherical cavity, and the free end of the rotating shaft is equipped with the first reflector; Both through holes I-1 and II-1 are formed on the side wall of the housing; The through hole III-1 is formed at the top of the housing, vertically above the circular hole.

2. The integrating hemisphere device according to claim 1, characterized in that, The integrating hemisphere device also includes a sealing plug for sealing light outlet I and / or light outlet II.

3. A device for measuring luminescence characteristics, characterized in that, The luminescence characteristic measurement device includes the integrating hemisphere device, a light source, and a spectral system; The light source is used to emit an excitation beam that enters the hemispherical cavity through the light inlet hole; The spectral system is used to receive the excitation light emitted from the light outlet I; The integrating hemisphere device is selected from the integrating hemisphere device described in any one of claims 1 to 2.

4. A method for spectroscopic testing of luminescent materials, characterized in that, The method employs the luminescence characteristic measurement device as described in claim 3; The method includes: Step (1) Place the luminescent material sample to be tested in the sample cover; Step (2) Rotate the first reflector by the first rotary motor so that the reflective surface of the first reflector faces the light-entry hole; Step (3) Push the second reflector to the top of the sample cover using the push-pull motor; drive the drive gear to rotate using the rotating shaft of the second rotary motor, and drive the driven gear and the push-pull motor to rotate using the drive gear, so that the reflecting surface of the second reflector forms a 45° angle with the center line of the light outlet I and the reflecting surface faces downward; In step (4), the light source emits an excitation beam, which enters the hemispherical cavity through the light inlet hole, is reflected by the first reflector, and shines on the luminescent material sample under test through the sample cover. The excitation light emitted by the luminescent material sample under test is reflected by the second reflector and exits through the light outlet hole I. In step (5), the spectral system receives the excitation light emitted from the light outlet I and performs spectral testing on the luminescent material sample to be tested.

5. A method for testing the luminescence quantum efficiency of a luminescent material, characterized in that, The method employs the luminescence characteristic measurement device as described in claim 3; The method includes: Step (1) Test the internal environment of the hemispherical cavity to obtain the spectral parameters of the internal environment of the hemispherical cavity; Step (2) Test the spectral parameters of the luminescent material sample to be tested, and calculate the luminescence quantum efficiency of the luminescent material sample to be tested by combining it with the spectral parameters of the internal environment of the hemispherical cavity obtained in step (1).

6. The method according to claim 5, characterized in that, Step (1) includes: S01. Rotate the first reflector by the first rotary motor so that the reflective surface of the first reflector is not directly facing the light-entry hole; S02. The light source emits an excitation beam, which enters the hemispherical cavity through the light inlet and is reflected by the first reflector before striking the inner wall of the hemispherical cavity. S03. The second reflector is pushed above the sample cover by the push-pull motor; the drive gear is driven to rotate by the rotating shaft of the second rotary motor, and the driven gear and the push-pull motor are driven to rotate by the drive gear, so that the polytetrafluoroethylene plate faces the light outlet I and is perpendicular to the bottom position of the hemispherical cavity; S04. The light-emitting hole II is sealed with a plug. The excitation beam is diffusely reflected inside the hemispherical cavity and then emitted through the light-emitting hole I into the spectral system to obtain the internal environmental spectral parameters of the hemispherical cavity. The sample cover does not contain the luminescent material sample to be tested.

7. The method according to claim 6, characterized in that, Step (2) includes: M01. Place the luminescent material sample to be tested in the sample cover, and rotate the first reflector by the first rotary motor so that the reflecting surface of the first reflector faces the light inlet hole. M02, The light source emits an excitation beam, which enters the hemispherical cavity through the light inlet hole, is reflected by the first reflector, and shines through the sample cover to illuminate the luminescent material sample to be tested; M03. The second reflector is pushed above the sample cover by the push-pull motor; the drive gear is driven to rotate by the rotating shaft of the second rotary motor, and the driven gear and the push-pull motor are driven to rotate by the drive gear, so that the polytetrafluoroethylene plate faces the light outlet I and is perpendicular to the bottom position of the hemispherical cavity; M04. The light-emitting hole II is sealed by a plug. The excitation beam is diffusely reflected within the hemispherical cavity and then emitted through the light-emitting hole I into the spectral system to obtain the spectral parameters of the luminescent material sample to be tested. The luminescence quantum efficiency of the luminescent material sample to be tested is obtained by calculating the spectral parameters of the internal environment of the hemispherical cavity.

8. A light-emitting imaging measurement device, characterized in that, The luminescent imaging measurement device includes the integrating hemisphere device, a light source, and an imaging system; The light source is used to emit an excitation beam that enters the hemispherical cavity through the light inlet hole; The imaging system is located above the integrating hemisphere device and is used to receive the excitation light emitted from the light exit aperture II; The integrating hemisphere device is selected from the integrating hemisphere device described in any one of claims 1 to 2.

9. A method for imaging luminescent materials, characterized in that, The method employs the luminescent imaging measurement device as described in claim 8; The method includes: (a) Place the luminescent material sample to be tested in the sample cover; rotate the first reflector by the first rotary motor so that the reflective surface of the first reflector is facing the light inlet; pull the second reflector to a position away from the sample cover by the push-pull motor; (b) The light outlet I is sealed by a plug. The light source emits an excitation beam. The excitation beam enters the hemispherical cavity through the light inlet hole. It is reflected by the first reflector and passes through the sample cover to irradiate the luminescent material sample to be tested. The excitation light emitted by the luminescent material sample to be tested is emitted through the light outlet II and enters the imaging system to perform luminescence imaging of the luminescent material sample to be tested.

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