Wavelength Division Multiplexing Filter Detection Equipment

Abstract

The present invention discloses a wavelength division multiplexing filter detection device. The device is provided with a turntable, one side of the turntable is a detection surface, and detection stations are arranged at equal angles on the edge of the detection surface. A detection device is installed at each detection station. Opposite to the detection surface of the turntable, there is a workbench. The workbench is provided with a power meter facing the detection surface, and a fixture for fixing the wavelength division multiplexing filter to be tested is arranged beside the power meter. A rotating shaft is fixed at the center of the turntable, and the rotating shaft is driven to rotate by a power source. The advantages of the present invention are that the working principle is simple, but it can simulate the influence of a high-temperature environment on the device, and can quickly test the wavelength division multiplexing filter in the experimental stage to obtain test results, thereby improving the R & D efficiency.

Description

Technical Field

[0001] The present invention relates to the field of testing technologies, and particularly to a wavelength division multiplexing filter detection device. Background Art

[0002] In the field of optical communication, in order to meet the performance indicators in the DWDM100GHz system, the DWDM narrowband filter must have the following design indicators.

[0003] Center wavelength (CWL), peak insertion loss. The center wavelengths of each channel used in optical communication are specified by the International Telecommunication Union (ITU). For example, for the wavelengths in the C band: ITU-T Recommendation G.692, the frequency spacing of the DWDM system is an integer multiple of 100GHz, the reference frequency is 193.1THz, and the nominal center frequency range starts from 192.1THz (equivalent to a center wavelength of 1561.61nm) to 196.1THz (equivalent to a center wavelength of 1528.77nm). ITU-T Recommendation G.692, the frequency spacing of the DWDM system is an integer multiple of 100GHz, the reference frequency is 193.1THz, and the nominal center frequency range starts from 192.1THz (equivalent to a center wavelength of 1561.61nm) to 196.1THz (equivalent to a center wavelength of 1528.77nm). For a 100GHZ filter, the requirement for the peak insertion loss is T≤0.5dB. The transmittances of the center wavelengths of the corresponding filters are 93% and 89% respectively.

[0004] Monitoring of polarization-dependent loss, PDL (polarization-dependent loss) is an inevitable phenomenon in optical fiber communication. In a high-speed optical fiber communication system, polarization-dependent loss not only affects the amplitude of the pulse, but also acts jointly with polarization mode dispersion to affect the system. Therefore, monitoring should be carried out to ensure the stability of the signal.

[0005] In terms of thin film materials, currently, the combination of Nb2O5-SiO2 and Ta2O5-SiO2 is mainly used. Both of these material combinations can form amorphous thin films under ion beam assisted deposition (IAD). The refractive indices of Nb2O5, Ta2O5, and SiO2 thin films are 2.150, 2.060, and 1.465 respectively. Since the refractive index of the Nb2O5 film is high, compared with Ta2O5, a specific bandwidth can be obtained with fewer layers. However, in terms of absorption, Nb2O5 will be slightly higher than the Ta2O5 thin film. In addition, because the material is a thin film, if the environmental temperature changes greatly, it may cause deformation of the thin film and other situations, affecting the product performance. Therefore, a device capable of completing the test task needs to be designed. Summary of the Invention

[0006] The technical problem to be solved by the present invention is to implement an experimental device capable of detecting the influence of temperature on wavelength division multiplexing filters.

[0007] To achieve the above object, the technical solution adopted by the present invention is as follows: a wavelength division multiplexing filter detection device, the device is provided with a turntable, one side of the turntable is a detection surface, detection stations are arranged at equal angles on the edge of the detection surface, and a detection device is installed on each detection station. A workbench is arranged opposite to the detection surface of the turntable. A power meter is arranged on the workbench facing the detection surface, and a fixture for fixing the wavelength division multiplexing filter to be detected is arranged beside the power meter. A rotating shaft is fixed at the center of the turntable, and the rotating shaft is driven to rotate by a power source.

[0008] A protruding limit bump is arranged outside the turntable at each detection station. An inductor for sensing the position of the limit bump is arranged beside the workbench. The inductor is connected and outputs an induction signal to a controller, and the controller outputs a driving signal to the power source.

[0009] There are four detection stations, and each detection device is connected to a controller. The controller is connected to a display screen and a key control area.

[0010] Among them, a reflection cover is arranged in detection station A, a heating tube is fixed inside the reflection cover, and a temperature sensor is fixed on the outer edge of the reflection cover.

[0011] Among them, a laser is arranged in detection station B, which irradiates vertically towards the power meter.

[0012] Among them, a bracket is arranged in detection station C, and a laser that irradiates obliquely at 45 degrees towards the power meter is fixed on the bracket.

[0013] Among them, a lifting mechanism is arranged in detection station D, and a detection head and a contactor of a flaw detector are fixed on one side of the lifting mechanism facing the power meter.

[0014] The turntable is horizontally arranged, the detection stations are all on the lower surface of the turntable, the workbench is located below the turntable, and the fixture is located on the upper surface of the workbench.

[0015] The power source is provided with a gearbox and a motor. The output shaft of the motor is connected to the input end of the gearbox, and the output end of the gearbox is connected to the rotating shaft.

[0016] After placing the wavelength division multiplexing filter to be detected on the workbench and fixing it with the fixture, the device is started by using the controller;

[0017] The turntable rotates until detection station A reaches above the wavelength division multiplexing filter to be detected. The heating tube is turned on to maintain a set temperature for a set time, and then the heating tube is turned off;

[0018] The turntable rotates until detection station B reaches above the wavelength division multiplexing filter to be detected. The laser in detection station B is started for a set time and then turned off, and the information of the power meter is obtained;

[0019] The turntable rotates until the detection station C reaches above the wavelength division multiplexing filter to be tested. After starting the laser at the detection station C for a set time and then turning it off, the power meter information is obtained.

[0020] The turntable rotates until the detection station D reaches above the wavelength division multiplexing filter to be tested. Lower the flaw detector so that the probe contacts the wavelength division multiplexing filter to be tested. After obtaining the flaw detector signal, control the flaw detector to rise.

[0021] Process the parameters of the power meter and the flaw detector.

[0022] The advantages of the present invention are that the working principle is simple, but it can simulate the influence of a high-temperature environment on the device, and can quickly test the wavelength division multiplexing filter in the experimental stage to obtain test results, thereby improving the R & D efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The following briefly describes the content expressed in each drawing in the specification of the present invention and the marks in the drawings:

[0024] Figure 1 It is a schematic structural diagram of a wavelength division multiplexing filter detection device;

[0025] Figure 2 It is a schematic structural diagram of the turntable in the wavelength division multiplexing filter detection device;

[0026] Figures 3 - 5 It is a schematic structural diagram of the test components at each station in the wavelength division multiplexing filter detection device. The marks in the above figures are all: 1, turntable; 2, detection station; 3, limit bump; 4, rotating shaft; 5, gearbox; 6, motor; 7, laser; 8, bracket; 9, reflection cover; 10, heating tube; 11, temperature sensor; 12, workbench; 13, power meter; 14, inductor. DETAILED DESCRIPTION OF THE INVENTION

[0027] The following further describes in detail the specific implementation manners of the present invention, such as the shapes, structures, mutual positions and connection relationships of the various components involved, the functions and working principles of each part, the manufacturing process, and the operation and use methods, etc., with reference to the drawings, so as to help those skilled in the art have a more complete, accurate and in-depth understanding of the inventive concept and technical solution of the present invention.

[0028] The wavelength division multiplexing filter detection device is provided with a turntable 1. The turntable 1 is a circular plate-like structure. The turntable 1 is preferably fixed horizontally. One side of the turntable 1 is a detection surface, and the detection surface is arranged downward. A workbench 12 is fixed below the detection surface. The upper part of the workbench 12 is a plane, and a power meter 13 for sensing laser power is fixed. A fixture for clamping the wavelength division multiplexing filter to be tested is arranged around the power meter 13, so that the wavelength division multiplexing filter to be tested is placed on the lens of the power meter 13.

[0029] There are detection stations 2 set at equal angles on the edge of the detection surface of the turntable 1. For example, Figure 2 As shown, there are four stations, which are sequentially named Detection Station A, Detection Station B, Detection Station C, and Detection Station D according to the experimental sequence. Different detection devices are fixed on each detection station 2 for sequentially completing the detection. The position of the workbench 12 is directly opposite to the detection station 2. The turntable 1 rotates around the center. Then, with the position of the workbench 12 determined, by rotating the turntable 1, the detection stations 2 can sequentially pass by the workbench 12.

[0030] A rotating shaft 4 is fixed at the center of the turntable 1, and the rotating shaft 4 is driven to rotate by a power source. Since the turntable 1 needs to be selected, the connection relationship of the device wiring harness on the turntable 1 can use a brush, or it can be controlled that the turntable 1 can only reverse after rotating forward one week when rotating, then it can be connected through a wiring harness.

[0031] For example, Figure 1 As shown, the power source is provided with a gearbox 5 and a motor 6. The output shaft of the motor 6 is connected to the input end of the gearbox 5, and the output end of the gearbox 5 is connected to the rotating shaft 4. Indirect drive through the gearbox 5 can control the rotation speed of the turntable 1 to ensure that the positions of the detection station 2 and the workbench 12 are aligned. In order to accurately control the stop position when the turntable 1 rotates, protruding limit bumps 3 are provided on the side of the turntable 1. There are four limit bumps 3, corresponding to one detection station 2 respectively. When the turntable 1 rotates, the sensor 14 contacts above the detection station 2 to the workbench 12. According to the number of contacts, it can be known which detection station 2 is above the workbench 12 currently, making the operation of the equipment intelligent.

[0032] The entire equipment can be controlled by a single controller. The sensor 14 is connected and outputs an induction signal to the controller. At the same time, the controller outputs a drive signal to the power source, which can control the start and stop of the power source. Each detection device is connected to the controller, and the detected data can be transmitted to the controller, and the controller completes the intelligent control of the detection device. The controller can be provided with a display screen and a key control area. The display screen can display the detected data or directly obtain the detection result. The key control area can control the operation of the entire equipment, such as controlling start and shutdown, etc., which can be specifically set according to needs.

[0033] This invention is used for temperature testing. Therefore, the four detection stations 2 are respectively:

[0034] A reflection cover 9 is arranged inside the Detection Station A. A heating tube 10 is fixed inside the reflection cover 9, and a temperature sensor 11 is fixed on the outer edge of the reflection cover 9, which can quickly complete baking, maintain the set temperature and time, and test the temperature performance of the product to be tested;

[0035] Inside the detection station B, a laser 7 is provided which irradiates vertically towards the power meter 13;

[0036] Inside the detection station C, a bracket 8 is provided, and a laser 7 which is fixed on the bracket 8 and irradiates obliquely at 45 degrees towards the power meter 13; the two lasers 7 collect the product performance at different angles respectively;

[0037] Inside the detection station D, a lifting mechanism is provided, and a detection head and a contactor of a flaw detector are fixed on one side of the lifting mechanism facing the power meter 13, and the deformation of the product affected by high temperature is sensed by the flaw detector

[0038] The specific operation method is as follows:

[0039] After placing the wavelength division multiplexing filter to be tested on the workbench 12 and fixing it with a fixture, the device is started by using the controller. After starting the device, the turntable 1 will rotate, and the stop position of the rotation is accurately positioned by the inductor 14 and the limit projection 3;

[0040] The turntable 1 rotates to the detection station A and reaches above the wavelength division multiplexing filter to be tested. The heating tube 10 is turned on to maintain the set temperature and for the set time, and then the heating tube 10 is turned off; the temperature control can use a temperature sensor to make the heating tube 10 always maintain the set temperature, and after the timing is completed through the set time, the next step is carried out

[0041] The turntable 1 rotates to the detection station B and reaches above the wavelength division multiplexing filter to be tested. The laser 7 in the detection station 2B is started and then turned off after the set time, and the information of the power meter 13 is obtained;

[0042] The turntable 1 rotates to the detection station C and reaches above the wavelength division multiplexing filter to be tested. The laser 7 in the detection station 2C is started and then turned off after the set time, and the information of the power meter 13 is obtained;

[0043] The turntable 1 rotates to the detection station D and reaches above the wavelength division multiplexing filter to be tested. The flaw detector is lowered to make the probe contact the wavelength division multiplexing filter to be tested, and after obtaining the signal of the flaw detector, the flaw detector is controlled to rise;

[0044] When processing the parameters of the power meter 13 and the flaw detector, the obtained parameters of the power meter 13 and the flaw detector can be directly compared with the preset standard values to directly give a judgment on whether it is qualified, or the parameter information can be displayed and the parameter information can be stored for the staff to analyze by themselves.

[0045] The present invention has been described exemplarily above in conjunction with the accompanying drawings. Obviously, the specific implementation of the present invention is not limited by the above-mentioned manner. As long as various non-substantive improvements are made by adopting the method concept and technical solution of the present invention, or the concept and technical solution of the present invention are directly applied to other occasions without improvement, they are all within the protection scope of the present invention.

Claims

1. Wavelength division multiplexing filter detection device, characterized in that: The device is provided with a turntable, one side of the turntable is a detection surface, detection stations are arranged at equal angles on the edge of the detection surface, and detection devices are installed on each detection station. A workbench is arranged opposite to the detection surface of the turntable. A power meter is arranged on the workbench facing the detection surface, and a fixture for fixing the wavelength division multiplexing filter to be tested is arranged beside the power meter. A rotating shaft is fixed at the center of the turntable, and the rotating shaft is driven to rotate by a power source; A protruding limit bump is arranged on the outer side of the turntable at each detection station. An inductor for sensing the position of the limit bump is arranged beside the workbench. The inductor is connected and outputs an induction signal to a controller, and the controller outputs a drive signal to the power source; There are four detection stations, and each detection device is connected to a controller. The controller is connected with a display screen and a key control area; Among them, a reflection cover is arranged in detection station A, a heating tube is fixed in the reflection cover, and a temperature sensor is fixed on the outer edge of the reflection cover.

2. The wavelength division multiplexing filter detection device according to claim 1, characterized in that: Among them, a laser is arranged in detection station B and irradiates vertically towards the power meter.

3. The wavelength division multiplexing filter detection device according to claim 2, wherein: Among them, a bracket is arranged in detection station C, and a laser that irradiates obliquely at 45 degrees towards the power meter is fixed on the bracket.

4. The wavelength division multiplexing filter detection device according to claim 3, characterized in that: Among them, a lifting mechanism is arranged in detection station D, and a detection head and a contactor of a flaw detector are fixed on one side of the lifting mechanism facing the power meter.

5. The wavelength division multiplexing filter detection device according to claim 4, wherein: The turntable is horizontally arranged, the detection stations are all on the lower surface of the turntable, the workbench is located below the turntable, and the fixture is located on the upper surface of the workbench.

6. The wavelength division multiplexing filter detection device according to claim 5, characterized in that: The power source is provided with a gearbox and a motor. The output shaft of the motor is connected to the input end of the gearbox, and the output end of the gearbox is connected to the rotating shaft.

7. The wavelength division multiplexing filter detection device according to claim 4, 5 or 6, characterized in that: After placing the wavelength division multiplexing filter to be tested on the workbench and fixing it with the fixture, start the device by using the controller; The turntable rotates until detection station A reaches above the wavelength division multiplexing filter to be tested. Turn on the heating tube to maintain the set temperature for the set time, and then turn off the heating tube; The turntable rotates until detection station B reaches above the wavelength division multiplexing filter to be tested. Start the laser in detection station B, turn it off after the set time, and obtain the information of the power meter; The turntable rotates until detection station C reaches above the wavelength division multiplexing filter to be tested. Start the laser in detection station C, turn it off after the set time, and obtain the information of the power meter; The turntable rotates until detection station D reaches above the wavelength division multiplexing filter to be tested. Lower the flaw detector so that the probe contacts the wavelength division multiplexing filter to be tested. After obtaining the signal of the flaw detector, control the flaw detector to rise; Process the parameters of the power meter and the flaw detector.

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