Tunnel test device

Abstract

A tunnel-type testing device includes a tunnel-type furnace body, which at least includes a low-temperature testing area, a reheating area, a heating area, and a high-temperature testing area, which are arranged in sequence, wherein the low-temperature testing area is set to perform a low-temperature test on a test object in a predetermined low-temperature environment, and the high-temperature testing area is set to perform a high-temperature test on the test object in a predetermined high-temperature environment; and a conveying device, which runs through the tunnel-type furnace body, is used to convey a tray carrying the test object to the interior of the tunnel-type furnace body for testing. The reheating area and the heating area respectively include a heating lamp, which is used to heat the test object in the predetermined low-temperature environment, so that its surface temperature rises from the predetermined low temperature to a normal temperature, and so that its surface temperature rises from the normal temperature to the predetermined high temperature.

Description

Technical Field

[0001] The invention relates to a testing device, in particular to a tunnel type testing device. Background Art

[0002] It is known that in the manufacture of integrated circuits and circuit modules, a series of tests are required after the product is completed, such as: aging test, life test, temperature cycling test, thermal shock test, function test, speed test, etc., to test the function and reliability of the product. Among these tests, functional testing is a very important part of the quality testing of electronic products. Functional testing refers to simulating the extreme conditions of the product under normal working conditions at high temperature, low temperature or room temperature. Its purpose is to test the function of the product and conduct screening to ensure the quality of the product after it is sold. Therefore, functional testing items are necessary so that all products can be tested 100%.

[0003] Traditionally, a functional test device for integrated circuits, such as automotive integrated circuits, is implemented with a furnace. The furnace usually includes a heater and a refrigerator for heating air or cooling air to provide the ambient temperature required for functional testing, and a fan device for conveying hot air or cold air to the test area via convection, thereby heating the object to be tested to a desired high temperature with hot air, or cooling the object to be tested to a desired low temperature with cold air. However, the known functional test device takes 20 minutes to lower the ambient temperature of the test space inside the furnace from room temperature to a predetermined low temperature, such as -40 degrees, and then tests the object to be tested under the predetermined low temperature environment for 1 minute. Next, it takes 20 to 30 minutes to raise the ambient temperature of the test space from the predetermined low temperature, such as -40°C, to a predetermined high temperature, such as 85°C, and then tests the object to be tested at the predetermined high temperature for 1 minute. Therefore, in traditional functional testing devices, since the testing time is quite short and the heating and cooling procedures of the testing space take quite a long time, a considerable amount of time is wasted waiting for the heating and cooling of the testing space, resulting in a waste of time and low cost-effectiveness, as well as a substantial increase in the space required for the testing device.

[0004] Therefore, there is a need to develop a tunnel testing device. The present invention can meet these needs. Summary of the invention

[0005] In view of this, the main purpose of the present invention is to provide a tunnel-type testing device, which can reduce the required space of the testing device and increase the testing efficiency of the testing space.

[0006] In order to achieve this purpose, the present invention proposes a tunnel-type testing device, including a tunnel-type furnace body, which at least includes a low-temperature testing zone, a reheating zone, a heating zone, and a high-temperature testing zone, which are arranged in sequence, wherein the low-temperature testing zone is configured to perform a low-temperature test on at least one object to be tested in a predetermined low-temperature environment, and the high-temperature testing zone is configured to perform a high-temperature test on at least one object to be tested in a predetermined high-temperature environment; and a conveying device, which is configured to penetrate the tunnel-type furnace body, and is used to convey at least one tray carrying at least one object to be tested to the interior of the tunnel-type furnace body for testing. The reheating zone and the heating zone respectively include a heating lamp, which is used to heat the at least one object to be tested in the predetermined low-temperature environment, so that its surface temperature rises from the predetermined low temperature to a normal temperature, and so that its surface temperature rises from the normal temperature to the predetermined high temperature.

[0007] According to the present invention, the tunnel-type testing device further comprises a loading area, which is arranged at an entrance of the tunnel-type furnace body and is configured to place the object to be tested on the tray; and a unloading area, which is arranged at an exit of the tunnel-type furnace body and is configured to take the object to be tested out of the tray. The conveying device extends to the loading area and the unloading area.

[0008] According to the present invention, the tunnel furnace body also includes a buffer zone, located inside the tunnel furnace body and adjacent to the loading zone, which is configured to dry the object to be tested on the tray and reduce the moisture in the air entering the tunnel furnace body as much as possible; a first cooling zone, arranged after the buffer zone and before the low-temperature test zone, which is configured to cool the object to be tested so that its surface temperature drops from a room temperature to the predetermined low temperature; and a second cooling zone, arranged after the high-temperature test zone and adjacent to the unloading zone, which is configured to cool the object to be tested so that its surface temperature drops from the predetermined high temperature to the normal temperature. In addition, the first cooling zone includes a heating lamp, which is configured to heat the at least one object to be tested, thereby controlling the cooling rate of the surface temperature of the object to be tested from a room temperature to the predetermined low temperature.

[0009] According to the present invention, the heating lamp in the reheating zone, the heating lamp in the heating zone, and the heating lamp in the first cooling zone all include an upper lampshade disposed above the conveying device, and a lower lampshade disposed below the conveying device.

[0010] According to the present invention, each of the buffer zone, the first cooling zone, the low temperature test zone, the reheating zone, the heating zone, the high temperature test zone, and the second cooling zone of the tunnel furnace has an entrance gate and an exit gate. These entrance gates and these exit gates are set to avoid being opened or closed at the same time.

[0011] According to the present invention, the predetermined low temperature is -40°C, the normal temperature is 20°C, and the predetermined high temperature is 85°C.

[0012] According to the present invention, the conveying device moves the tray in a step-by-step manner and performs reciprocating positioning on the tray.

[0013] According to the present invention, the tray moves in units of 56 cm and moves one unit every 4 minutes.

[0014] According to the present invention, the tunnel-type testing device also includes a pair of electronic control units, which are respectively arranged behind the loading area and the unloading area, and are configured to control the temperature of the tunnel-type furnace body and the stepping movement of the tray; and multiple computer units, which are arranged in the buffer zone, the first cooling zone, the low-temperature test zone, the reheating zone, the heating zone, the high-temperature test zone, and the rear of the cooling zone of the tunnel-type furnace body, and are configured to record the temperature, air pressure, and moving position of the tray of the tunnel-type furnace body, send out warning signals when abnormal operation of the tunnel-type furnace body occurs, and analyze the test results of the object to be tested.

[0015] The present invention will be described in detail through the following embodiments in conjunction with the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a top perspective view of the tunnel test device of the present invention.

[0017] Figure 2 It is a rear view of the tunnel-type testing device of the present invention.

[0018] Figure 3 It is a front view of the tunnel test device of the present invention.

[0019] Figure 4 The figure is a three-dimensional appearance diagram of the heating lamp of the present invention.

[0020] Explanation of symbols:

[0021] 11 Tunnel furnace

[0022] 12 Conveying device

[0023] 11a Buffer

[0024] 111a Entrance gate to the buffer zone

[0025] 11b First cooling zone

[0026] 111b The exit gate of the buffer zone and the entrance gate of the first cooling zone

[0027] 11c Low temperature test area

[0028] 111c Exit gate of the first cooling zone and entrance gate of the low temperature test zone

[0029] 11d Temperature recovery zone

[0030] 111d Exit gate of low temperature test area and entrance gate of reheating area

[0031] 11e Warming up zone

[0032] 111e Exit gate of the reheating zone and entrance gate of the heating zone

[0033] 11f High temperature test area

[0034] 111f Exit gate of the heating zone and entrance gate of the high temperature test zone

[0035] 11g Second cooling zone

[0036] 111g Exit gate of high temperature test zone f and entrance gate of second cooling zone

[0037] 111h Exit gate of the second cooling zone

[0038] 113 Loading area

[0039] 114 Unloading area

[0040] 20 Pallets

[0041] 21. Heat lamp

[0042] 22. Heat lamp

[0043] 23. Heat lamp

[0044] 25 Electronic control unit group

[0045] 26 Computer Unit

[0046] 30 Maintenance door

[0047] 401 Upper lampshade

[0048] 402 Lower lampshade. DETAILED DESCRIPTION

[0049] In order to further understand the composition and other features of the present invention, a preferred embodiment of the present invention is now cited and described in detail with reference to the accompanying drawings.

[0050] See also Figures 1 to 3 ,in Figure 1 A top perspective view showing a tunnel test apparatus of the present invention, Figure 2 A rear view showing the tunnel test device of the present invention, Figure 3 A front view of the tunnel test device of the present invention is shown. Figure 1 and Figure 3 As shown, the tunnel testing device of the present invention comprises a tunnel furnace 11 and a conveying device 12. The conveying device 12 penetrates the tunnel furnace 11 and is used to convey at least one tray 20 into the tunnel furnace 11. The tray 20 is used to carry at least one object to be tested (not shown).

[0051] In this preferred embodiment, the tunnel furnace body 11 includes 7 areas, including a buffer zone 11a, a first cooling zone 11b, a low-temperature test zone 11c, a reheating zone 11d, a heating zone 11e, a high-temperature test zone 11f, and a second cooling zone 11g from the entrance to the exit. There is an entrance gate and an exit gate between each area, so that each area is opened and closed by a gate. For example, component number 111a represents the entrance gate of the buffer zone 11a, component number 111b represents the exit gate of the buffer zone 11a and the entrance gate of the first cooling zone 11b, component number 111c represents the exit gate of the first cooling zone 11b and the entrance gate of the low temperature test zone 11c, component number 111d represents the exit gate of the low temperature test zone 11c and the entrance gate of the reheating zone 11d, component number 111e represents the exit gate of the reheating zone 11d and the entrance gate of the heating zone 11e, component number 111f represents the exit gate of the heating zone 11e and the entrance gate of the high temperature test zone 11f, component number 111g represents the exit gate of the high temperature test zone 11f and the entrance gate of the second cooling zone 11g, and component number 111h represents the exit gate of the second cooling zone 11g. By setting the gates 111a-111h, the operations of each zone can be independent of each other without interfering with each other. It should be noted that all gates will not be opened and closed at the same time, thereby reducing gas flow. Therefore, the conveying device 12 will convey the tray 20 into the tunnel furnace body 11, so that the tray passes through all areas 11a-11g of the tunnel furnace body 11 in sequence to test the objects carried on the tray 20.

[0052] In this embodiment, the tunnel-type testing device further includes a loading area 113, which is arranged at the entrance of the tunnel-type furnace body 11, that is, in front of the entrance gate 111a of the buffer zone 11a, and the conveying device 12 will extend to the upper surface of the loading area 113, so that the objects to be tested can be placed in the tray 20, so that the tray 20 can be moved along the conveying device 12 to the various areas 11a-11g of the tunnel-type furnace body 11 for testing. The tunnel-type testing device further includes a discharging area 114, which is arranged at the exit of the tunnel-type furnace body 11, that is, behind the exit gate 111h of the second cooling zone 11g, wherein the conveying device 12 will extend to the upper surface of the discharging area 114, so that the objects to be tested can be taken out from the tray 20 after the test is completed. Both the loading area 113 and the unloading area 114 can hold two sets of trays 20, and the objects to be tested can be placed manually in the trays 20 of the loading area 113, or the objects to be tested can be taken out from the trays 20 of the unloading area 114. Alternatively, a mechanical arm (not shown) can be arranged above the loading area 113 and the unloading area 114 to place the objects to be tested in the trays 20 in the loading area 113, or to take out the tested objects to be tested from the trays 20 in the unloading area 114, thereby completing the loading and unloading operations. The loading area 113 may include a positioning mechanism (not shown) to facilitate the loading operation. A maintenance door 30 is arranged below the loading area 113 to facilitate the testing or maintenance personnel to perform maintenance operations on the tunnel-type test device.

[0053] See also Figure 1 and Figure 3After the loading operation is completed, that is, after the object to be tested is placed on the tray 20, the tray 20 will first be sent from the loading area 113 to the buffer area 11a. A condenser and a temperature control device (both not shown) will be provided in the buffer area 11a, which are set to dry the object to be tested on the tray 20 when the tray 20 enters the buffer area 11a through the entrance gate 111a of the buffer area 11a, and reduce the moisture in the air entering the tunnel furnace body 11 as much as possible. Then, the tray 20 is sent to the first cooling area 11b, and the object to be tested on the tray 20 is cooled by cold air, so that the surface temperature of the object to be tested gradually decreases from room temperature to a predetermined low temperature, such as -40°C. Then, the tray 20 is sent to the low temperature test area 11c, so that the object to be tested on the tray 20 is subjected to low temperature testing at the predetermined low temperature, such as -40°C, by cold air. Next, the tray 20 is sent to the temperature return zone 11d to heat the objects to be tested on the tray 20 so that the surface temperature of the objects to be tested gradually rises from the predetermined low temperature, such as -40°C, to a predetermined normal temperature, such as 20°C. Next, the tray 20 is sent to the temperature rise zone 11e to heat the objects to be tested on the tray 20 so that the surface temperature of the objects to be tested gradually rises from the predetermined normal temperature, such as 20°C, to a predetermined high temperature, such as 85°C, in preparation for high temperature testing. Next, the tray 20 is sent to the high temperature test zone 11f, and hot air is used to perform a high temperature test on the objects to be tested on the tray 20 at the predetermined high temperature, such as 85°C. Next, the tray 20 is sent to the second temperature drop zone 11g, and cold air is used to gradually reduce the surface temperature of the objects to be tested on the tray 20 from the predetermined high temperature, such as 85°C, to the predetermined normal temperature, such as 20°C. Finally, after the test is completed, the tray 20 is sent to the unloading area 114 for unloading to remove the objects to be tested on the tray 20 .

[0054] In particular, in the present invention, a heating lamp 21, 22, 23 is respectively provided in the first cooling zone 11b, the reheating zone 11d, and the heating zone 11e to heat the object to be tested on the tray 20. Figure 1 and Figure 3As shown. In the present invention, the tunnel furnace body 11 uses gates 111a-111h to control the opening and closing of each area 11a-11g, so the outside air and moisture will inevitably enter the interior of the tunnel furnace body 11. Therefore, when the tunnel furnace body 11 heats the object to be tested with hot air, the tunnel test device will cause condensation because the surface temperature of the object to be tested is lower than the ambient temperature. Condensation will damage the object to be tested and will also reduce the life of the tunnel test device. Therefore, the present invention will use cold air in the temperature return zone 11d and the temperature rise zone 11e to make the ambient temperature become the predetermined low temperature, such as -40°C, and will use the heating lamp to emit radiant heat to heat the object to be tested. Since most of the radiant heat energy of the heating lamps 22 and 23 will be absorbed by the object to be tested, and only a small part of the radiant heat energy will be absorbed by the air, the surface temperature of the object to be tested will be greater than the ambient temperature, thereby preventing condensation from occurring. In addition, as mentioned above, we will use cold air to cool the objects to be tested on the tray 20 in the first cooling zone 11b, so that the surface temperature of the objects to be tested gradually decreases from room temperature to a predetermined low temperature, such as -40°C. The function of the heating lamp 21 in the first cooling zone 11b is to heat the objects to be tested, thereby controlling the cooling rate of the objects to be tested.

[0055] In other embodiments, we may additionally set up a normal temperature zone (not shown) in the tunnel furnace 1111, which may be located before the buffer zone 11a, for performing normal temperature testing on the objects to be tested on the tray 20 under normal temperature conditions.

[0056] It should be noted that the conveyor 12 is driven by a motor and a ratchet (not shown) to move the tray 20 in a stepping manner and reciprocate the tray 20. The tray 20 moves in units of 56 cm and moves one unit every 4 minutes, with a temperature difference of 20° C. per minute.

[0057] See also Figure 2 The tunnel test device of the present invention further includes a pair of electronic control units 25, which are respectively arranged behind the loading area 113 and the unloading area 114, and are configured to control the temperature of the tunnel furnace body 11 and the stepping movement of the tray 20. In addition, the tunnel test device of the present invention further includes a plurality of computer units 26, which are arranged behind the areas 11a-11g of the tunnel furnace body 11, and are configured to record the temperature and air pressure of the tunnel furnace body 11, the moving position of each tray 20, send out warning signals when abnormal operation of the tunnel furnace body 11 occurs, and analyze the test results.

[0058] See also Figure 4, which shows a three-dimensional appearance diagram of the heating lamp of the present invention. In this embodiment, the heating lamp (21, 22, 23) may include an upper lampshade 401 and a lower lampshade 402, wherein the upper lampshade 401 is disposed above the conveying device 12, and the lower lampshade 402 is disposed below the conveying device 12, such as Figure 4 Therefore, the radiation emitted by the upper lampshade 401 and the lower lampshade 402 can cover all angles of the tray 20 , so that the object to be tested on the tray 20 can fully absorb the radiant heat emitted by the upper lampshade 401 and the lower lampshade 402 .

[0059] In addition, the tunnel-type test device of the present invention is mainly used in the functional test procedure of the object under test. However, the tunnel-type test device of the present invention can also be used in the aging test or reliability test procedure of the object under test.

[0060] In summary, the tunnel-type test device of the present invention is mainly characterized in that a plurality of areas are arranged in the tunnel-type furnace body 11, including at least one low-temperature test area 11c, a reheating area 11d, a heating area 11e, and a high-temperature test area 11f, wherein the low-temperature test area 11c is set to perform a low-temperature test on at least one object to be tested in a predetermined low-temperature environment, and the high-temperature test area 11f is set to perform a high-temperature test on the object to be tested in a predetermined high-temperature environment. The reheating area 11d and the heating area 11e respectively include a heating lamp, which is used to heat the object to be tested in the predetermined low-temperature environment, so that its surface temperature rises from the predetermined low temperature to a normal temperature, and so that its surface temperature rises from the normal temperature to the predetermined high temperature. Since a non-contact heating method is used in a low-temperature environment, such as using the radiant heat emitted by the heating lamp to heat the object to be tested, the surface temperature of the object to be tested can be made higher than the ambient temperature to prevent condensation. In addition, if a traditional tunnel-type test device is used to test some objects to be tested with a short use distance, it is quite difficult. For example, if the object to be tested is a PCIe Gen 4 product, the length of its cable, that is, the distance of use (the distance from the product to the computer), is usually less than 50 centimeters (cm), or if the object to be tested is a PCIe Gen 5 product, the length of its cable, that is, the distance of use (the distance from the product to the computer), is usually less than 30 centimeters (cm). If a traditional furnace test device is used to test PCIe Gen4 or PCIeGen5 products, the wire connecting the object to be tested is too short. After deducting the wire passing through the furnace insulation layer (about 10 cm) and the 5-10 cm remaining in the normal temperature PC installation operation space, the remaining length is very small, making it impossible to test multiple objects to be tested in the same furnace at the same time. In contrast, the tunnel-type test device of the present invention is quite suitable for testing multiple objects to be tested with a shorter distance of use. In addition, since the present invention uses a tunnel-type furnace to test, for example, automotive integrated circuits, rather than using a traditional furnace to test, for example, automotive integrated circuits, the present invention has the advantages of small required space, high test efficiency, fast mass production speed, and full automation.

[0061] In summary, the present invention is novel and practical in structure, far superior to the prior art in function, progressive and of industrial value, and meets the requirements of invention patents, so an invention patent application is filed in accordance with the law. The above-mentioned specific embodiments are used to explain the purpose, features and effects of the present invention in detail, which are only part of the embodiments of the present invention and should not be used to limit the scope of implementation of the present invention. The equivalent transformations or modifications made by technicians in this field based on the above description, which do not deviate from the spirit of the present invention, should be included in the scope of the claims of the present invention.

Claims

1. A tunnel test device, comprising: A tunnel furnace body, comprising at least a low-temperature test zone, a reheating zone, a heating zone, and a high-temperature test zone, which are arranged in sequence, wherein the low-temperature test zone is configured to perform a low-temperature test on at least one object to be tested in a predetermined low-temperature environment, and the high-temperature test zone is configured to perform a high-temperature test on the at least one object to be tested in a predetermined high-temperature environment; and a conveying device, arranged to penetrate the tunnel furnace body, and used to convey at least one tray carrying at least one object to be tested to the interior of the tunnel furnace body for testing; The temperature return zone and the temperature rise zone respectively include a heating lamp for heating the at least one object to be tested in the predetermined low temperature environment, so that its surface temperature rises from the predetermined low temperature to a normal temperature, and its surface temperature rises from the normal temperature to the predetermined high temperature.

2. The tunnel test device according to claim 1, further comprising: A loading area, disposed at an entrance of the tunnel furnace, configured to place the at least one object to be tested on the at least one tray; as well as A material unloading area is provided at an exit of the tunnel furnace body and is configured to take out the at least one object to be tested from the at least one tray; The conveying device extends to the loading area and the unloading area.

3. The tunnel test device according to claim 2, characterized in that: The tunnel furnace also includes: A buffer zone is located inside the tunnel furnace and adjacent to the loading zone, and is configured to dry the at least one object to be tested on the at least one tray and reduce moisture in the air entering the tunnel furnace; a first cooling zone, disposed after the buffer zone and before the low-temperature test zone, configured to cool the at least one object to be tested so that its surface temperature drops from a room temperature to the predetermined low temperature; and a second cooling zone, disposed after the high temperature test zone and adjacent to the unloading zone, configured to cool the at least one object to be tested so that its surface temperature drops from the predetermined high temperature to the normal temperature; The first cooling zone includes a heating lamp, which is configured to heat the at least one object to be tested, thereby controlling the cooling rate of the surface temperature of the object to be tested from a room temperature to the predetermined low temperature.

4. The tunnel test device according to claim 3, characterized in that: The heating lamp in the temperature return zone, the heating lamp in the temperature rise zone, and the heating lamp in the first temperature drop zone all include an upper lampshade disposed above the conveying device, and a lower lampshade disposed below the conveying device.

5. The tunnel test device according to claim 3, characterized in that: Each of the buffer zone, the first cooling zone, the low temperature test zone, the reheating zone, the heating zone, the high temperature test zone, and the second cooling zone of the tunnel furnace has an entrance gate and an exit gate.

6. The tunnel test device according to claim 5, characterized in that: The entrance gates and the exit gates are configured to avoid being opened or closed at the same time.

7. The tunnel testing device according to claim 3, further comprising: a pair of electronic control units, respectively disposed behind the loading area and the unloading area, configured to control the temperature of the tunnel furnace and the stepping movement of the at least one tray; and A plurality of computer units are arranged in the buffer zone, the first cooling zone, the low-temperature test zone, the reheating zone, the heating zone, the high-temperature test zone, and the rear of the second cooling zone of the tunnel furnace, and are configured to record the temperature, air pressure, and the moving position of the at least one tray of the tunnel furnace, to send out a warning signal when an abnormality occurs in the operation of the tunnel furnace, and to analyze the test results of the at least one object to be tested.

8. The tunnel testing device according to claim 1, characterized in that: The predetermined low temperature is -40°C, the normal temperature is 20°C, and the predetermined high temperature is 85°C.

9. The tunnel testing device according to claim 1, characterized in that: The conveying device moves the at least one tray in a stepping manner and performs reciprocating positioning on the at least one tray.

10. The tunnel test device according to claim 9, characterized in that: The at least one tray moves in a unit of 56 centimeters (cm), and moves one unit every 4 minutes.

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