A multi-channel test card and system

Abstract

The present invention relates to a multi-channel test card and system, including a signal setting unit, a signal switching unit, and a logic switching unit; the logic switching unit is connected to a post-stage processing circuit, and outputs a switching signal to the post-stage processing circuit according to a status selection signal to perform switching between automatic logic control and manual logic control; the signal setting unit outputs a corresponding set current signal according to a setting signal; the signal switching unit is respectively connected to the signal setting unit and an in-situ detection device, and performs switching between the set current signal, an external signal, and a detection signal output by the in-situ detection device. The multi-channel test card of the present invention triggers switching settings through the logic switching unit to realize trigger setting of the reactor protection channel logic according to requirements, and can also realize signal switching, thereby meeting the full-channel test function of the reactor protection channel. Moreover, the multi-channel test card of the present invention is small in volume and light in weight, and the on-site implementation operation is simple.

Description

Technical Field

[0001] The present invention relates to the technical field of instrument control systems, and more specifically, to a multi-channel test card and system. Background Art

[0002] Existing reactor protection channel verification is to perform tests regularly through a test device and judge its availability based on the test results. However, when conducting such tests, the reactor protection channel needs to be placed in a triggered state, and it is impossible to effectively distinguish the flipping situation of the downstream logic signals of the reactor protection channel, which brings difficulties to the integrity of channel verification, such as the response time test of the reactor protection channel. At the same time, existing reactor protection channels are large in size and heavy in weight, which is inconvenient for on-site implementation operations, and can only meet the requirements of single-channel verification. For multi-channel simulation verification, the existing methods do not have the conditions. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a multi-channel test card and system in view of the defects of the prior art.

[0004] The technical solution adopted by the present invention to solve its technical problems is: to construct a multi-channel test card, including: a signal providing unit, a signal switching unit, and a logic switching unit;

[0005] The logic switching unit is connected to a post-stage processing circuit and is used to output a switching signal to the post-stage processing circuit according to a status selection signal to perform switching between automatic logic control and manual logic control;

[0006] The signal providing unit is used to output a corresponding provided current signal according to a setting signal;

[0007] The signal switching unit is respectively connected to the signal providing unit and an in-situ detection device, and is used to perform switching between the provided current signal, an external signal, and a detection signal output by the in-situ detection device, so as to send the corresponding signal to the post-stage processing circuit to complete the functional test of the reactor protection channel.

[0008] In the multi-channel test card of the present invention, the signal providing unit includes: a reference module, a conversion module, and a conditioning module;

[0009] The reference module is used to provide a reference voltage;

[0010] The conversion module is connected to the reference module and is used to perform conversion processing based on the reference voltage and the setting signal and output a conversion signal;

[0011] The conditioning module is connected to the conversion module and is used to condition the conversion signal output by the conversion module and output a conditioned signal.

[0012] In the multi-channel test card of the present invention, the signal supply unit further includes: a current limiting module connected to the conditioning module;

[0013] The current limiting module is used to perform current limiting processing on the conditioned signal output by the conditioning module and then output the given current signal.

[0014] In the multi-channel test card of the present invention, it further includes: an input unit;

[0015] The input unit is connected to the signal switching unit and is used to access an external signal and transmit it to the signal switching unit when the signal supply unit is abnormal.

[0016] In the multi-channel test card of the present invention, it further includes: a test / normal selection unit;

[0017] The test / normal selection unit is connected to the signal switching unit and is used to output a test / normal trigger signal to the signal switching unit according to a test / normal selection instruction input by the user, so as to control the signal switching unit to perform switching between the detection signal and the given current signal according to the test / normal trigger signal.

[0018] In the multi-channel test card of the present invention, it further includes: a display unit;

[0019] The display unit is connected to the input unit and is used to display the external signal received by the input unit.

[0020] In the multi-channel test card of the present invention, it further includes: a setting unit respectively connected to the signal switching unit and the signal supply unit;

[0021] The setting unit is used to perform settings according to a setting instruction input by the user to output the setting signal, and to make a selection according to a selection instruction input by the user to output an internal / external selection signal to the signal switching unit.

[0022] In the multi-channel test card of the present invention, the setting unit includes: a signal setting module and an internal / external selection module;

[0023] The signal setting module is connected to the signal supply unit and is used to perform settings according to a setting instruction input by the user to output the setting signal;

[0024] The internal / external selection module is connected to the signal switching unit and is used to make a selection according to a selection instruction input by the user to output an internal / external selection signal to the signal switching unit.

[0025] In the multi-channel test card of the present invention, it further includes: an action / normal selection unit;

[0026] The action / normal selection unit is connected to the logic switching unit, and is used to output an action / normal trigger signal to the logic switching unit according to the action / normal instruction input by the user, so as to control the logic switching unit to perform switching between automatic logic control and manual logic control according to the action / normal trigger signal.

[0027] In the multi-channel test card of the present invention, it further includes: a power supply unit;

[0028] The power supply unit is used to supply electrical energy to the multi-channel test card.

[0029] In the multi-channel test card of the present invention, it further includes: an interface unit;

[0030] The interface unit is connected to the cabinet, and is used to receive the power signal provided by the cabinet and perform signal transmission between the cabinet and the multi-channel test card.

[0031] The present invention also provides a multi-channel test system, including: the above-mentioned multi-channel test card and a cabinet connected to the multi-channel test card;

[0032] The multi-channel test card is used to perform signal relay transmission;

[0033] The cabinet is used to perform functional tests on the reactor protection channels according to the signals relayed and transmitted by the multi-channel test card.

[0034] In the multi-channel test system of the present invention, the cabinet includes: a post-processing circuit; the post-processing circuit includes: a channel processing board, a threshold board, and a reactor protection logic module;

[0035] The channel processing board is connected to the multi-channel test card and is used to perform arithmetic processing on signals;

[0036] The threshold board is connected to the channel processing board and is used to perform signal threshold judgment and output an automatic logic trigger signal according to the judgment result;

[0037] The reactor protection logic module is respectively connected to the threshold board and the multi-channel test card, and is used to perform automatic protection logic tests or manual protection logic tests according to the automatic logic trigger signal or the manual logic trigger signal output by the multi-channel test card.

[0038] Implementing the multi-channel test card and system of the present invention has the following beneficial effects: It includes a signal setting unit, a signal switching unit, and a logic switching unit; the logic switching unit is connected to the subsequent processing circuit, and outputs a switching signal to the subsequent processing circuit according to the status selection signal to perform the switching between automatic logic control and manual logic control; the signal setting unit outputs a corresponding set current signal according to the setting signal; the signal switching unit is respectively connected to the signal setting unit and the in-situ detection device, and performs the switching between the set current signal, the external signal, and the detection signal output by the in-situ detection device. The multi-channel test card of the present invention triggers the switching setting through the logic switching unit to realize the trigger setting of the reactor protection channel logic according to requirements, and at the same time, it can also realize signal switching, so as to meet the full-channel test function of the reactor protection channel. Moreover, the multi-channel test card of the present invention is small in size and light in weight, and the on-site implementation operation is simple. Brief Description of the Drawings

[0039] The following will further illustrate the present invention in conjunction with the drawings. In the drawings:

[0040] Figure 1 is the principle block diagram of the first embodiment of the multi-channel test card provided by the present invention;

[0041] Figure 2 is the principle block diagram of the second embodiment of the multi-channel test card provided by the present invention;

[0042] Figure 3 is the principle block diagram of the signal setting unit provided by the present invention;

[0043] Figure 4 is the schematic diagram of the panel of the multi-channel test card provided by the embodiment of the present invention;

[0044] Figure 5 is the principle block diagram of the multi-channel test system provided by the present invention;

[0045] Figure 6 is the signal transmission schematic diagram of the multi-channel test system provided by the embodiment of the present invention. Detailed Embodiment

[0046] In order to have a clearer understanding of the technical features, objectives, and effects of the present invention, the specific embodiments of the present invention will now be described in detail with reference to the drawings.

[0047] Refer to Figure 1 , which is the principle block diagram of the first embodiment of the multi-channel test card 100 provided by the present invention.

[0048] As Figure 1 shown, the multi-channel test card 100 includes: a signal setting unit 10, a signal switching unit 20, and a logic switching unit 30.

[0049] The logic switching unit 30 is connected to the post-stage processing circuit 21 and is configured to output a switching signal to the post-stage processing circuit 21 according to a status selection signal, so as to perform switching between automatic logic control and manual logic control.

[0050] Optionally, in the embodiment of the present invention, by setting the logic switching unit 30 to control the switching between automatic logic control and manual logic control, it is realized that the logic of the reactor protection channel can be triggered and set according to requirements, and the flip of the logic downstream of the reactor protection channel can be effectively discriminated.

[0051] The signal setting unit 10 is configured to output a corresponding set current signal according to a setting signal.

[0052] Optionally, in the embodiment of the present invention, by setting the signal setting unit 10, continuous or step simulation of the reactor protection channel signal and high-precision setting are realized. Among them, the signal setting unit 10 can output a set current signal of 4 to 20 mA, and the specific output value is determined by the setting signal.

[0053] In some embodiments, as Figure 3 shown, the signal setting unit 10 includes: a reference module 11, a conversion module 12, and a conditioning module 13.

[0054] Among them, the reference module 11 is configured to give a reference voltage.

[0055] Optionally, in the embodiment of the present invention, the reference module 11 can be a high-precision reference module 11 module, and its precision can reach 0.0002.

[0056] The conversion module 12 is connected to the reference module 11 and is configured to perform conversion processing based on the reference voltage and the setting signal, and output a conversion signal.

[0057] Optionally, in the embodiment of the present invention, the conversion module 12 can be an analog-to-digital conversion chip. Further, in the embodiment of the present invention, the conversion module 12 can adopt a 24-bit high-precision analog-to-digital conversion chip.

[0058] The conditioning module 13 is connected to the conversion module 12 and is configured to condition the conversion signal output by the conversion module 12 and output a conditioned signal.

[0059] Optionally, in the embodiment of the present invention, the conditioning module 13 can be composed of a precision operational amplifier and a precision resistor.

[0060] Further, as Figure 3 shown, the signal setting unit 10 further includes: a current limiting module 14 connected to the conditioning module 13.

[0061] Among them, the current limiting module 14 is used to perform current limiting processing on the conditioned signal output by the conditioning module 13 and then output a given current signal.

[0062] By adopting a high-precision reference and a highly stable analog-to-digital conversion signal, and outputting after conditioning by the conditioning module 13 composed of a precision operational amplifier and precision resistors, and then performing current limiting protection through the current limiting module 14, the stability, reliability, and accuracy of the given current signal are greatly improved.

[0063] The signal switching unit 20 is respectively connected to the signal giving unit 10 and the in-situ detection device, and is used to perform switching between the given current signal, the external signal, and the detection signal output by the in-situ detection device, so as to send the corresponding signal to the post-stage processing circuit 21 to complete the functional test of the reactor protection channel.

[0064] Optionally, in the embodiment of the present invention, by setting the signal switching unit 20, the switching between the in-situ detection signal, the external signal, and the internal signal (i.e., the given current signal output by the signal giving unit 10) is realized, the switching between the on-site sensor and the test signal is realized, and the full-channel test function of the reactor protection channel is satisfied. At the same time, through the signal test unit, the selection of the internal signal / external signal can also be realized. When the internal signal is unavailable, the external signal can be given, thereby ensuring the normal operation of the reactor protection channel test.

[0065] Further, as Figure 2 shown, it is the principle block diagram of the second embodiment of the multi-channel test card 100 provided by the present invention.

[0066] As Figure 2 shown, on the basis of the first embodiment, the multi-channel test card 100 further includes: an input unit 50. Among them, the input unit 50 is connected to the signal switching unit 20 and is used to access an external signal and transmit it to the signal switching unit 20 when the signal giving unit 10 is abnormal.

[0067] Specifically, as Figure 4 shown, the input unit 50 is arranged on the panel 101 of the multi-channel test card 100, and it is the signal injection port of the multi-channel test card. When the internal signal is unavailable, the external signal can be injected through this signal injection using an external signal source.

[0068] Further, as Figure 2 shown, the multi-channel test card 100 further includes: a display unit 60.

[0069] The display unit 60 is connected to the input unit 50 and is used to display the external signal received by the input unit 50.

[0070] By setting the display unit 60, when an external signal is input into the multi-channel test card 100 from the signal injection port, the input external signal can be displayed in real time by the display unit 60.

[0071] Optionally, the display unit 60 can be but is not limited to an LED display screen, an LCD display screen, an OLED display screen, a flexible display screen, etc.

[0072] Furthermore, as Figure 2 shown, the multi-channel test card 100 further includes: a test / normal selection unit 90.

[0073] The test / normal selection unit 90 is connected to the signal switching unit 20 and is used to output a test / normal trigger signal to the signal switching unit 20 according to a test / normal selection instruction input by the user, so as to control the signal switching unit 20 to perform switching between the detection signal and the given current signal according to the test / normal trigger signal.

[0074] Optionally, the test / normal selection unit 90 can be implemented by a key,

[0075] Specifically, as Figure 4 shown, the test / normal selection unit 90 can be set on the panel 101. Through the test / normal selection unit 90, the switching between the detection signal of the in-situ sensor and the analog signal (i.e., the given current signal) can be realized, and the signal is transmitted to the post-stage processing circuit 21. In addition, through the test / normal selection unit 90, the setting of the normal state test and the test state test is also realized. When in the normal state, the post-stage processing circuit 21 receives the detection signal of the in-situ sensor; when in the test state, the post-stage processing circuit 21 receives the analog signal.

[0076] In some embodiments, the triggering of the test / normal selection unit 90 can include pressing a key. For example, a single press is the test logic, and multiple presses (such as two presses, with a short interval frequency between the two) are the normal logic; or, a single short press is the test logic, and a single long press is the normal logic (where the time of a single long press is greater than the time of a single short press). It can be understood that other triggering methods can also be adopted for the key, which is not limited to the embodiments of the present invention.

[0077] Furthermore, as Figure 2 shown, the multi-channel test card 100 further includes: a setting unit 70 respectively connected to the signal switching unit 20 and the signal giving unit 10.

[0078] Wherein, the setting unit 70 is used to perform settings according to a setting instruction input by the user to output a setting signal, and perform selection according to a selection instruction input by the user to output an internal / external selection signal to the signal switching unit 20.

[0079] Optionally, as Figure 4 shown, the setting unit 70 includes: a signal setting module 72 and an internal / external selection module 71.

[0080] Among them, the signal setting module 72 is connected to the signal given unit 10 and is used to perform settings according to the setting instructions input by the user to output a setting signal. The internal / external selection module 71 is connected to the signal switching unit 20 and is used to make a selection according to the selection instructions input by the user to output an internal / external selection signal to the signal switching unit 20.

[0081] Specifically, as Figure 4 shown, the signal setting module 72 can be implemented by setting keys. Among them, the setting keys can include an increase key and a decrease key. The signal can be increased by the increase key, and the signal can be decreased by the decrease key. That is, by setting the increase key and / or the decrease key, the adjustment of the setting signal can be realized, so that the required current signal value can be output.

[0082] Furthermore, as Figure 2 shown, the multi-channel test card 100 further includes: an action / normal selection unit 80.

[0083] Among them, the action / normal selection unit 80 is connected to the logic switching unit 30 and is used to output an action / normal trigger signal to the logic switching unit 30 according to the action / normal instruction input by the user, so as to control the logic switching unit 30 to perform switching between automatic logic control and manual logic control according to the action / normal trigger signal.

[0084] Optionally, the action / normal selection unit 80 can be triggered and implemented by a key.

[0085] Specifically, as Figure 4 shown, the action / normal selection unit 80 can be arranged on the panel 101. The switching between automatic logic control and manual logic control can be realized through the action / normal selection unit 80. That is, the action / normal selection unit 80 is mainly used to realize the selection of whether the reactor protection channel logic is triggered or not. Specifically, when in the action state, regardless of the upstream signal, the reactor protection channel logic in the post-stage processing circuit 21 is in the triggered state (at this time, it is manual control logic); when in the normal state, the reactor protection channel logic in the post-stage processing circuit 21 is determined by the action state of the upstream threshold card 202 (at this time, it is automatic control logic).

[0086] In some embodiments, the triggering of the action / normal selection unit 80 can be achieved by pressing a button. For example, a single press is the test logic, and multiple presses (such as two presses with a short interval frequency between them) are the normal logic; alternatively, a single short press is the test logic, and a single long press is the normal logic (where the time of a single long press is greater than the time of a single short press). It can be understood that other triggering methods can also be adopted for the button, which are not limited to the embodiments of the present invention.

[0087] Furthermore, as Figure 2 shown, the multi-channel test card 100 further includes: a power supply unit 40.

[0088] Among them, the power supply unit 40 is used to supply electrical energy to the multi-channel test card 100.

[0089] Furthermore, as Figure 2 shown, the multi-channel test card 100 further includes: an interface unit.

[0090] Among them, the interface unit is connected to the cabinet 200 and is used to receive the power signal provided by the cabinet 200 and perform signal transmission between the cabinet 200 and the multi-channel test card 100.

[0091] Optionally, in the embodiments of the present invention, the interface unit can be a pin interface, which can be set as two rows of pins based on the slots of the cabinet 200, and the two rows of pins match the slots of the cabinet 200. Through this interface unit, the connection and transmission of power and signals between the multi-channel test card 100 and the cabinet 200 can be realized, and the power is transmitted to the power supply unit 40 and converted by the power supply unit 40 into electrical energy suitable for the multi-channel test card 100, thereby reducing the setting of external power supplies and realizing the miniaturization and simplification of the card.

[0092] In addition, by setting this interface unit, when in use, only the multi-channel test card 100 needs to be directly inserted into the corresponding card slot of the cabinet 200 to realize the quick connection between the multi-channel test card 100 and the cabinet 200, making the on-site operation simpler and more convenient.

[0093] The multi-channel test card 100 in the embodiments of the present invention is a signal test card for the reactor protection channel. It can realize the full-channel test of the reactor protection channel, can set the protection logic trigger according to requirements, and meet the verification requirements of the reactor protection channel, such as the response time test of the reactor protection channel. At the same time, the test function of the reactor protection channel signal test card is complete, which can effectively reduce the risk of human error, is beneficial to improving the reliability of important equipment, and is small, convenient, and easy to operate, which can greatly improve work efficiency.

[0094] Refer to Figure 5, which is the principle block diagram of an alternative embodiment of the multi-channel test system provided by the present invention.

[0095] As Figure 5 shown, the multi-channel test system includes: the multi-channel test card 100 disclosed in the embodiments of the present invention and the cabinet 200 connected to the multi-channel test card 100.

[0096] Among them, the multi-channel test card 100 is used to perform signal relay transmission.

[0097] The cabinet 200 is used to perform a functional test on the reactor protection channel according to the signals relayed and transmitted by the multi-channel test card 100.

[0098] In some embodiments, as Figure 5 shown, the cabinet 200 includes: a post-stage processing circuit 21; the post-stage processing circuit 21 includes: a channel processing board 201, a threshold board 202, and a reactor protection logic module 203.

[0099] Among them, the channel processing board 201 is connected to the multi-channel test card 100 and is used to perform arithmetic processing on the signals.

[0100] Optionally, in the embodiments of the present invention, the arithmetic operation of the channel processing board 201 on the signal may include, but is not limited to, any one or more of addition, subtraction, multiplication, division, and square root operations.

[0101] The threshold board 202 is connected to the channel processing board 201 and is used to perform signal threshold judgment and output an automatic logic trigger signal according to the judgment result.

[0102] Optionally, in the embodiments of the present invention, the threshold board 202 mainly performs threshold judgment, such as high threshold judgment and / or low threshold judgment.

[0103] The reactor protection logic module 203 is respectively connected to the threshold board 202 and the multi-channel test card 100, and is used to perform an automatic protection logic test or a manual protection logic test according to the automatic logic trigger signal or the manual logic trigger signal output by the multi-channel test card 100.

[0104] As Figure 5 shown, if the multi-channel test card 100 receives an action selection, the output manual logic trigger signal, and the current state is the action state, at this time the reactor protection logic module 203 is in the trigger state; if the multi-channel test card 100 receives a normal selection, based on the automatic control logic, the reactor protection logic module 203 is determined by the output signal of the threshold board 202.

[0105] Specifically, as Figure 6As shown in the figure, the internal / external selection module 71 realizes the switching between the signal injection port signal and the signal of the signal supply unit 10; the test / normal selection unit 90 realizes the switching between the detection signal of the in-situ detection device (i.e., the field sensor) and the analog signal of the signal supply unit 10, and transmits the signal to the channel processing board 201 for subsequent arithmetic processing. The action / normal selection unit 80 realizes the switching and action of the downstream protection logic signal (i.e., the automatic control logic and the manual control logic). When the action / normal selection unit 80 switches to the floating state, it is the manual control logic, directly triggering the reactor protection channel logic signal; otherwise, it is the automatic control logic, and the threshold board 202 determines the reactor protection channel control logic.

[0106] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the various embodiments, reference can be made to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple. For the relevant parts, reference can be made to the description in the method part.

[0107] Those skilled in the art can further realize that the units and algorithm steps of the examples described in conjunction with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. To clearly illustrate the interchangeability of hardware and software, the components and steps of the examples have been generally described according to their functions in the above description. Whether these functions are executed in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0108] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein can be directly implemented by hardware, a software module executed by a processor, or a combination of the two. The software module can be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, register, hard disk, removable disk, CD-ROM, or any other form of storage medium well-known in the technical field.

[0109] The above embodiments are only for illustrating the technical concept and features of the present invention, and their purpose is to enable those skilled in the art to understand the content of the present invention and implement it accordingly, and cannot limit the protection scope of the present invention. All equivalent changes and modifications made to the scope of the claims of the present invention shall fall within the scope covered by the claims of the present invention.

Claims

1. A multi-channel test card, characterized in that, The multi-channel test card is a reactor protection channel signal test card, including: a signal setting unit, a signal switching unit, and a logic switching unit; The logic switching unit is connected to the subsequent processing circuit and is used to output a switching signal to the subsequent processing circuit according to the status selection signal to perform the switching between automatic logic control and manual logic control; The signal setting unit is used to output a corresponding set current signal according to the setting signal; The signal switching unit is respectively connected to the signal setting unit and the in-situ detection device, and is used to perform the switching between the set current signal, the external signal, and the detection signal output by the in-situ detection device, so as to send the corresponding signal to the subsequent processing circuit to complete the function test of the reactor protection channel; The multi-channel test card controls the switching between automatic logic control and manual logic control through the logic switching unit, realizes the triggering setting of the reactor protection channel logic according to requirements, and meets the full-channel test function of the reactor protection channel through signal switching.

2. The multi-channel test card according to claim 1, characterized in that, The signal setting unit includes: a reference module, a conversion module, and a conditioning module; The reference module is used to give a reference voltage; The conversion module is connected to the reference module and is used to perform conversion processing based on the reference voltage and the setting signal and output a conversion signal; The conditioning module is connected to the conversion module and is used to condition the conversion signal output by the conversion module and output a conditioned signal.

3. The multi-channel test card according to claim 2, characterized in that The signal setting unit further includes: a current limiting module connected to the conditioning module; The current limiting module is used to perform current limiting processing on the conditioned signal output by the conditioning module and then output the set current signal.

4. The multi-channel test card according to claim 1, wherein It further includes: An input unit; The input unit is connected to the signal switching unit and is used to access an external signal and transmit it to the signal switching unit when the signal setting unit is abnormal.

5. The multi-channel test card according to claim 4, characterized in that, It further includes: A test / normal selection unit; The test / normal selection unit is connected to the signal switching unit and is used to output a test / normal trigger signal to the signal switching unit according to the test / normal selection instruction input by the user, so as to control the signal switching unit to perform the switching between the detection signal and the set current signal according to the test / normal trigger signal.

6. The multi-channel test card according to claim 4, wherein It further includes: A display unit; The display unit is connected to the input unit and is used to display the external signal received by the input unit.

7. The multi-channel test card according to claim 1, characterized in that It further includes: A setting unit respectively connected to the signal switching unit and the signal setting unit; The setting unit is used to perform settings according to the setting instruction input by the user to output the setting signal, and perform selection according to the selection instruction input by the user to output an internal / external selection signal to the signal switching unit.

8. The multi-channel test card according to claim 7, wherein The setting unit includes: a signal setting module and an internal / external selection module; The signal setting module is connected to the signal setting unit and is used to perform settings according to the setting instruction input by the user to output the setting signal; The internal / external selection module is connected to the signal switching unit and is configured to make a selection according to a selection instruction input by a user to output an internal / external selection signal to the signal switching unit.

9. The multi-channel test card according to claim 1, wherein It further includes: An action / normal selection unit; The action / normal selection unit is connected to the logic switching unit and is configured to output an action / normal trigger signal to the logic switching unit according to an action / normal instruction input by a user, so as to control the logic switching unit to perform a switch between automatic logic control and manual logic control according to the action / normal trigger signal.

10. The multi-channel test card according to any one of claims 1-9, characterized in that It further includes: A power supply unit; The power supply unit is configured to supply electric energy to the multi-channel test card.

11. The multi-channel test card component according to claim 10, characterized in that, It further includes: An interface unit; The interface unit is connected to the cabinet and is configured to receive a power signal provided by the cabinet and perform signal transmission between the cabinet and the multi-channel test card.

12. A multi-channel test system, characterized in that, It includes: The multi-channel test card according to any one of claims 1-11 and a cabinet connected to the multi-channel test card; The multi-channel test card is configured to perform signal relay transmission; The cabinet is configured to perform a function test on a reactor protection channel according to the signal relayed and transmitted by the multi-channel test card.

13. The multi-channel test system according to claim 12, characterized in that The cabinet includes: a post-stage processing circuit; the post-stage processing circuit includes: a channel processing board, a threshold board, and a reactor protection logic module; The channel processing board is connected to the multi-channel test card and is configured to perform arithmetic processing on a signal; The threshold board is connected to the channel processing board and is configured to perform signal threshold judgment and output an automatic logic trigger signal according to a judgment result; The reactor protection logic module is respectively connected to the threshold board and the multi-channel test card and is configured to perform an automatic protection logic test or a manual protection logic test according to the automatic logic trigger signal or a manual logic trigger signal output by the multi-channel test card.

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