A gate-level netlist cross-clock domain automatic analysis method and system
By performing automated cross-clock domain analysis on gate-level netlists, the problem of difficulty in detecting cross-clock domain issues in existing technologies is solved, enabling early location and repair of design defects and improving product reliability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING XUANYU INFORMATION TECH CO LTD
- Filing Date
- 2022-06-29
- Publication Date
- 2026-07-17
AI Technical Summary
In existing technologies, cross-clock domain issues are not easily detected during the code design phase and product factory testing and experimentation, making it difficult to detect and fix metastable issues in the design in a timely manner, thus affecting product reliability.
By abstracting the simulation library files, extracting the gate-level netlist design structure, analyzing the clock tree and reset tree, identifying cross-clock domain behavior, matching fault modes, and displaying violation information, automated cross-clock domain analysis of the gate-level netlist is achieved.
It can detect and fix cross-clock domain issues during the code design phase, avoid device anomalies caused by metastability propagation, improve product reliability, and detect the effectiveness of synchronizers and the correctness of cross-clock domain paths.
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Figure CN115293084B_ABST