An infrared sensor testing device

Abstract

The present invention provides infrared sensor testing equipment, comprising a moving mechanism and a testing mechanism. The moving mechanism comprises a workbench, a clamping assembly, and a conveying device mounted on the workbench. The conveying device comprises a feed assembly and a discharge assembly. The clamping assembly is mounted on the workbench and is used to clamp and transfer the sensor on the discharge assembly. The testing mechanism comprises a driving assembly, a test box, and a test assembly for detecting the sensor. The conveying device is used to transport the test assembly. The driving assembly and the test box are both mounted on the workbench and located between the feed assembly and the discharge assembly. The driving assembly is used to transfer the test assembly into the test box. The present invention solves the problem of low manual testing efficiency and has the advantages of a compact structure, partial replacement of manual labor, and high detection efficiency.

Description

Technical Field

[0001] The present invention relates to the field of infrared sensor testing, and in particular to infrared sensor testing equipment. Background Art

[0002] Infrared sensors utilize infrared light for data processing, offering advantages such as high sensitivity. They can also control the operation of drive devices. They are commonly used for non-contact temperature measurement, gas composition analysis, and non-destructive testing. They are widely used in fields such as medicine, military affairs, space technology, and environmental engineering. For example, thermal imaging using infrared sensors to remotely measure the surface temperature of the human body can identify areas with abnormal temperatures.

[0003] In order to ensure the yield rate, manufacturers generally need to test infrared sensors before they leave the factory. However, traditional infrared sensor testing can only be performed manually by staff, which is inefficient and may lead to inaccurate test results due to misalignment between the transmitter and the receiver. Summary of the Invention

[0004] Based on this, in order to solve the problem of low efficiency of manual testing, the present invention provides an infrared sensor testing device, and its specific technical solution is as follows:

[0005] An infrared sensor testing device includes a moving mechanism and a testing mechanism; the moving mechanism includes a workbench, a clamping assembly, and a conveying device installed on the workbench, the conveying device includes a feeding assembly and a discharging assembly, the clamping assembly is installed on the workbench and is used to clamp and transfer the sensor on the discharging assembly; the testing mechanism includes a driving assembly, a test box, and a test assembly for detecting the sensor, the conveying device is used to transport the test assembly, the driving assembly and the test box are both installed on the workbench and located between the feeding assembly and the discharging assembly, and the driving assembly is used to transfer the test assembly into the test box.

[0006] The above-mentioned infrared sensor testing equipment is equipped with a conveying device to realize the feeding and discharging of the sensors to be tested, thereby speeding up the testing speed; by providing a clamping component, when the sensor test is completed and it is transported on the discharging component, the clamping component can separately clamp the sensors that have been tested correctly and transfer them for storage, completing the classification of the sensors after the test; by providing a driving component, the lifting movement of the test component is driven, so that the test component can move back and forth in and out of the test box to complete the sensor test; by providing a test box, a closed environment is provided for the sensor test that is not interfered with by external light sources; by providing a moving mechanism and a testing mechanism, the problem of low efficiency of manual sensor testing is solved.

[0007] Furthermore, the feeding assembly includes a first lifting seat and a first conveying member and a second conveying member for feeding the test assembly. The first lifting seat and the first conveying member are both installed on the workbench. The first lifting seat can be raised and lowered relative to the workbench. The first lifting seat is provided with a first guide rail, and the second conveying member is slidably connected to the first guide rail.

[0008] Furthermore, the discharging assembly includes a second lifting seat and a third conveying member and a fourth conveying member for discharging the test assembly. The second lifting seat and the fourth conveying member are both installed on the workbench. The second lifting seat can be raised and lowered relative to the workbench. A second guide rail is provided on the second lifting seat, and the third conveying member is slidably connected to the second guide rail.

[0009] Furthermore, the driving assembly includes a third guide rail, a sliding seat, a first driving member and a positioning plate for placing the test assembly. The third guide rail is mounted on the workbench, the sliding seat is slidably connected to the third guide rail, the first driving member is installed on the sliding seat, and the output end of the first driving member is connected to the positioning plate and is used to control the lifting movement of the positioning plate.

[0010] Furthermore, the test box is located above the drive assembly, a test cavity is formed in the test box, a test mainboard is installed in the test cavity, and a notch communicating with the test cavity is provided at the bottom of the test box.

[0011] Furthermore, the test assembly includes a test element and a mounting fixture for fixing the test element, the mounting fixture includes a mounting seat, a mounting plate, a second driving member and a plurality of fixing members for clamping the test element, the mounting plate is mounted on the mounting seat, the second driving member is installed at the bottom of the mounting seat, the output end of the second driving member passes through the mounting seat and is connected to the fixing member, and the fixing member is rotatably connected to the mounting plate.

[0012] Furthermore, the fixing member includes an abutment block and a rotating block rotatably connected to the mounting plate, one end of the rotating block is connected to the abutment block, and the other end of the rotating block is transmission-connected to the second driving member, and the abutment block is used to abut against the mounting plate.

[0013] Furthermore, the test element is arranged on the upper end surface of the mounting plate, and the test element is provided with a first fixing hole for fixing the sensor transmitting end, and a second fixing hole for fixing the sensor receiving end, the first fixing hole and the second fixing hole are located on the same straight line, a test sample is provided inside the test element, and the test sample is located between the first fixing hole and the second fixing hole, two PCB adapters are embedded on one side of the test element, and the PCB adapter is detachably electrically connected to the test main board, and the receiving end and the transmitting end fixed in the first fixing hole and the second fixing hole can be electrically connected to the test main board through the corresponding PCB adapters respectively.

[0014] Furthermore, the clamping assembly includes a fixed seat, a rotating member, a first control arm, a second control arm and a clamping member for clamping the sensor, the fixed seat is fixed on the workbench, the rotating member is rotatably connected to the fixed seat, the first control arm is rotatably connected between the rotating member and the second control arm, and the second control arm is rotatably connected to the clamping member.

[0015] Furthermore, the clamping member includes an adapter block, a connecting block and a clamping block for clamping the sensor, one end of the adapter block is rotatably connected to the second control arm, the other end of the rotating block is connected to the connecting block, and the clamping block is installed on the connecting block. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The present invention can be further understood from the following description in conjunction with the accompanying drawings. The components in the figures are not necessarily drawn to scale, but rather the emphasis is placed on illustrating the principles of the embodiments. In different views, the same reference numerals designate corresponding parts.

[0017] Figure 1 This is one of the structural schematic diagrams of the installation fixture of the infrared sensor testing equipment according to one embodiment of the present invention;

[0018] Figure 2 This is a second structural diagram of the installation fixture of the infrared sensor testing equipment according to one embodiment of the present invention;

[0019] Figure 3 is a structural diagram of an infrared sensor testing device according to an embodiment of the present invention;

[0020] Figure 4 This is one of the structural schematic diagrams of the clamping assembly of the infrared sensor testing device according to one embodiment of the present invention;

[0021] Figure 5 This is a second structural diagram of the clamping assembly of the infrared sensor testing device according to one embodiment of the present invention;

[0022] Figure 6 This is one of the structural schematic diagrams of the test element of the infrared sensor test equipment according to one embodiment of the present invention;

[0023] Figure 7 This is a second structural diagram of the test element of the infrared sensor test equipment according to an embodiment of the present invention.

[0024] Description of reference numerals:

[0025] 1. Workbench; 2. Clamping assembly; 21. Fixed seat; 22. Rotating member; 23. First control arm; 24. Second control arm; 25. Clamping member; 251. Adapter block; 252. Connecting block; 253. Clamping block; 3. Feeding assembly; 31. First lifting seat; 32. First conveying member; 33. Second conveying member; 4. Discharging assembly; 41. Second lifting seat; 42. Third conveying member; 43. Fourth conveying member; 5. Driving assembly; 51. Sliding seat; 52. Positioning plate; 6. Test box; 7. Test assembly; 71. Test element; 711. First fixing hole; 712. Second fixing hole; 713. Test sample; 714. PCB adapter; 72. Mounting fixture; 721. Mounting seat; 722. Mounting plate; 723. Fixing member; 7231. Abutment block; 7232. Rotating block; 724. Second driving member. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with its embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and do not limit the scope of protection of the present invention.

[0027] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly attached to the other element or there may be an intermediate element. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only implementation methods.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0029] The "first" and "second" in the present invention do not represent specific quantities and orders, but are only used to distinguish names.

[0030] like Figure 1-3 As shown, an infrared sensor testing device in one embodiment of the present invention includes a moving mechanism and a testing mechanism; the moving mechanism includes a workbench 1, a clamping assembly 2 and a conveying device installed on the workbench 1, the conveying device includes a feeding assembly 3 and a discharging assembly 4, the clamping assembly 2 is installed on the workbench 1 and is used to clamp and transfer the sensor on the discharging assembly 4; the testing mechanism includes a driving assembly 5, a test box 6 and a test assembly 7 for detecting the sensor, the conveying device is used to transport the test assembly 7, the driving assembly 5 and the test box 6 are both installed on the workbench 1 and located between the feeding assembly 3 and the discharging assembly 4, and the driving assembly 5 is used to transfer the test assembly 7 to the test box 6.

[0031] The above-mentioned infrared sensor testing equipment is equipped with a conveying device to realize the feeding and discharging of the sensors to be tested, thereby speeding up the testing speed; by providing a clamping component 2, when the sensor test is completed and it is transported on the discharging component 4, the clamping component 2 can separately clamp the sensors that have been tested correctly and transfer them for storage, completing the classification of the sensors after the test; by providing a driving component 5, the lifting movement of the test component 7 is driven, so that the test component 7 can move back and forth in and out of the test box 6 to complete the sensor test; by providing the test box 6, a closed environment is provided for the sensor test that is not interfered with by external light sources; by providing a moving mechanism and a testing mechanism, the problem of low efficiency of manual sensor testing is solved.

[0032] like Figure 3 As shown, in one embodiment, the feed assembly 3 includes a first lifting base 31 and a first conveyor member 32 and a second conveyor member 33 for feeding the test assembly 7. The first lifting base 31 and the first conveyor member 32 are both mounted on the workbench 1. The first lifting base 31 can move up and down relative to the workbench 1. The first lifting base 31 is provided with a first guide rail, and the second conveyor member 33 is slidably connected to the first guide rail. In this way, by providing the first lifting base 31, the first lifting base 31 drives the second conveyor member 33 to move up and down, so that the second conveyor member 33 and the first conveyor member 32 are at the same height. The second conveyor member 33 then slides to the discharge end of the first conveyor member 32, and the test assembly 7 on the first conveyor member 32 is then transferred to the second conveyor member 33. The sliding movement of the second conveyor member 33 then transfers the test assembly 7 to the positioning plate 52.

[0033] Specifically, the second conveying member 33 is located between the first conveying member 32 and the positioning plate 52 .

[0034] like Figure 3As shown, in one embodiment, the discharge assembly 4 includes a second lifting base 41 and a third conveyor 42 and a fourth conveyor 43 for discharging the test assembly 7. The second lifting base 41 and the fourth conveyor 43 are both mounted on the workbench 1. The second lifting base 41 can move up and down relative to the workbench 1. The second lifting base 41 is provided with a second guide rail, and the third conveyor 42 is slidably connected to the second guide rail. Thus, the second lifting base 41 drives the third conveyor 42 to move up and down, so that the third conveyor 42 and the fourth conveyor 43 are at the same height. The third conveyor 42 then slides to the feed end of the fourth conveyor 43. The test assembly 7 on the third conveyor 42 is then transferred to the fourth conveyor 43. The fourth conveyor 43 then slides and transfers the test assembly 7 to an external location for collection. During this process, the clamping assembly 2 has already transferred the sensor on the test assembly 7. Therefore, only the test assembly 7 body, without the sensor, is discharged via the fourth conveyor 43, facilitating the subsequent fixed installation of other sensors to be tested.

[0035] Specifically, the third conveying member 42 is located between the positioning plate 52 and the fourth conveying member 43 .

[0036] like Figure 3 As shown, in one embodiment, the driving assembly 5 includes a third guide rail, a sliding seat 51, a first driving member, and a positioning plate 52 for placing the test assembly 7. The third guide rail is mounted on the workbench 1, the sliding seat 51 is slidably connected to the third guide rail, and the first driving member is mounted on the sliding seat 51. The output end of the first driving member is connected to the positioning plate 52 and is used to control the lifting movement of the positioning plate 52. In this way, by providing the sliding seat 51, the sliding seat 51 along the third guide rail can transfer the test assembly 7 on the second conveyor 33 to the positioning plate 52, or transfer the test assembly 7 on the positioning plate 52 to the third conveyor 42, thereby adjusting the position of the test assembly 7 and completing feeding or unloading. By providing the first driving member, the first driving member drives the lifting movement of the positioning plate 52, so that the positioning plate 52 can drive the lifting movement of the test assembly 7, so that the sensor on the test assembly 7 can reciprocate in and out of the test box 6 to achieve testing of the sensor.

[0037] In one embodiment, a test box 6 is positioned above the drive assembly 5. A test cavity is formed within the test box 6, and a test motherboard is mounted within the cavity. A notch is provided at the bottom of the test box 6, communicating with the test cavity. This notch facilitates the reciprocating movement of the test assembly 7 into and out of the test box 6.

[0038] like Figure 1-3As shown, in one embodiment, the test assembly 7 includes a test element 71 and a mounting fixture 72 for fixing the test element 71. The mounting fixture 72 includes a mounting seat 721, a mounting plate 722, a second driving member 724, and a plurality of fixing members 723 for clamping the test element 71. The mounting plate 722 is mounted on the mounting seat 721. The second driving member 724 is installed at the bottom of the mounting seat 721. The output end of the second driving member 724 passes through the mounting seat 721 and is connected to the fixing member 723. The fixing member 723 is rotatably connected to the mounting plate 722. In this way, by providing

[0039] like Figure 1 and Figure 2 As shown, in one embodiment, the fixing member 723 includes an abutting block 7231 and a rotating block 7232 rotatably connected to the mounting plate 722, one end of the rotating block 7232 is connected to the abutting block 7231, and the other end of the rotating block 7232 is transmission-connected to the second driving member 724, and the abutting block 7231 is used to abut against the mounting plate 722. In this way, by providing.

[0040] like Figure 1 、 Figure 2 、 Figure 6 and Figure 7 As shown, in one embodiment, the test element 71 is arranged on the upper end surface of the mounting plate 722, and the test element 71 is provided with a first fixing hole 711 for fixing the sensor transmitting end, and a second fixing hole 712 for fixing the sensor receiving end. The first fixing hole 711 and the second fixing hole 712 are located on the same straight line. A test sample 713 is provided inside the test element 71, and the test sample 713 is located between the first fixing hole 711 and the second fixing hole 712. Two PCB adapters 714 are embedded on one side of the test element 71, and the PCB adapter 714 is detachably electrically connected to the test main board. The receiving end and the transmitting end fixed in the first fixing hole 711 and the second fixing hole 712 can be electrically connected to the test main board through the corresponding PCB adapters 714 respectively. In this way, the transmitter and receiver of the sensor are respectively inserted into the first fixing hole 711 and the second fixing hole 712, and then the interfaces are connected to the corresponding PCB adapter 714, and then the test mainboard is connected. The test mainboard can control the transmitter to emit infrared rays, and the emitted infrared rays pass through the test sample 713 and irradiate the receiver. The test mainboard collects the information of the receiver to determine whether the sensor is qualified, and completes the test of the sensor. Through the above technical solution, the receiver and transmitter can be quickly aligned to improve the test efficiency and test accuracy.

[0041] like Figure 3-5As shown, in one embodiment, the clamping assembly 2 includes a fixed base 21, a rotating member 22, a first control arm 23, a second control arm 24, and a clamping member 25 for clamping the sensor. The fixed base 21 is fixed to the workbench 1, the rotating member 22 is rotatably connected to the fixed base 21, the first control arm 23 is rotatably connected between the rotating member 22 and the second control arm 24, and the second control arm 24 is rotatably connected to the clamping member 25. In this way, by providing the rotating member 22, the rotation of the rotating member 22 adjusts the clamping direction of the clamping member 25, which can better transfer the sensor; by providing the first control arm 23 and the second control arm 24, the sensor is clamped with different degrees of freedom control in different directions, and the clamping angle of the clamping member 25 can be adjusted to achieve a better clamping effect.

[0042] like Figure 4 and Figure 5 As shown, in one embodiment, the clamping member 25 includes an adapter block 251, a connecting block 252, and a clamping block 253 for clamping the sensor. One end of the adapter block 251 is rotatably connected to the second control arm 24, the other end of the rotating block 7232 is connected to the connecting block 252, and the clamping block 253 is mounted on the connecting block 252. In this way, by providing the adapter block 251, the rotation of the adapter block 251 can adjust the position of the clamping block 253, thereby facilitating the clamping operation.

[0043] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0044] The above-described embodiments merely illustrate several implementations of the present invention, and while their descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent. It should be noted that a person skilled in the art would be able to make numerous variations and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the patent for this invention shall be determined by the appended claims.

Claims

1. An infrared sensor testing device, characterized in that: include A moving mechanism, the moving mechanism comprising a workbench, a clamping assembly, and a conveying device mounted on the workbench, the conveying device comprising a feeding assembly and a discharging assembly, the clamping assembly being mounted on the workbench and used to clamp and transfer a sensor on the discharging assembly; A testing mechanism, comprising a drive assembly, a test box, and a test assembly for detecting a sensor, wherein the conveying device is used to transport the test assembly, the drive assembly and the test box are both mounted on the workbench and located between the feed assembly and the discharge assembly, and the drive assembly is used to transfer the test assembly into the test box; A test cavity is formed in the test box, a test mainboard is installed in the test cavity, the test assembly includes a test element and a mounting fixture for fixing the test element, the mounting fixture includes a mounting seat, a mounting plate, a second driving member and a plurality of fixing members for clamping the test element, the mounting plate is mounted on the mounting seat, the second driving member is installed at the bottom of the mounting seat, the output end of the second driving member passes through the mounting seat and is connected to the fixing member, and the fixing member is rotatably connected to the mounting plate; the fixing member includes an abutment block and a rotating block rotatably connected to the mounting plate, one end of the rotating block is connected to the abutment block, and the other end of the rotating block is driven by the second driving member connection, the abutment block is used to abut against the mounting plate; the test element is arranged on the upper end surface of the mounting plate, and the test element is provided with a first fixing hole for fixing the sensor transmitting end, and a second fixing hole for fixing the sensor receiving end, the first fixing hole and the second fixing hole are located on the same straight line, a test sample is provided inside the test element, and the test sample is located between the first fixing hole and the second fixing hole, two PCB adapters are embedded in one side of the test element, the PCB adapter is detachably electrically connected to the test main board, and the receiving end and the transmitting end fixed in the first fixing hole and the second fixing hole are respectively electrically connected to the test main board through the corresponding PCB adapters.

2. The infrared sensor testing device according to claim 1, characterized in that: The feeding assembly includes a first lifting seat and a first conveying member and a second conveying member for feeding the test assembly. The first lifting seat and the first conveying member are both installed on the workbench. The first lifting seat can be raised and lowered relative to the workbench. The first lifting seat is provided with a first guide rail, and the second conveying member is slidably connected to the first guide rail.

3. The infrared sensor testing device according to claim 1, characterized in that: The discharging assembly includes a second lifting seat and a third conveying member and a fourth conveying member for discharging the test assembly. The second lifting seat and the fourth conveying member are both installed on the workbench. The second lifting seat can be raised and lowered relative to the workbench. The second lifting seat is provided with a second guide rail, and the third conveying member is slidably connected to the second guide rail.

4. The infrared sensor testing device according to claim 1, characterized in that: The driving assembly includes a third guide rail, a sliding seat, a first driving member and a positioning plate for placing the test assembly. The third guide rail is mounted on the workbench, the sliding seat is slidably connected to the third guide rail, the first driving member is installed on the sliding seat, and the output end of the first driving member is connected to the positioning plate and is used to control the lifting movement of the positioning plate.

5. The infrared sensor testing device according to claim 4, characterized in that: The test box is located above the driving assembly, and a notch communicating with the test cavity is provided at the bottom of the test box.

6. The infrared sensor testing device according to claim 1, characterized in that: The clamping assembly includes a fixed seat, a rotating member, a first control arm, a second control arm and a clamping member for clamping the sensor. The fixed seat is fixed on the workbench, the rotating member is rotatably connected to the fixed seat, the first control arm is rotatably connected between the rotating member and the second control arm, and the second control arm is rotatably connected to the clamping member.

7. The infrared sensor testing device according to claim 6, characterized in that: The clamping member includes an adapter block, a connecting block and a clamping block for clamping the sensor. One end of the adapter block is rotatably connected to the second control arm, and the other end of the adapter block is connected to the connecting block. The clamping block is installed on the connecting block.

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