Large aperture sky survey telescope anti-interference device and telescope

Abstract

The application discloses a large-aperture sky survey telescope anti-interference device, comprising a spatial pose detection module, a control module and a compensation correction module. The anti-interference device detects the spatial pose through the spatial pose detection module, and compensates and corrects the spatial pose error through the joint action of the control module and the compensation correction module, so that the error of the large-aperture sky survey telescope in the actual application process is eliminated, and the precision of the large-aperture sky survey telescope is ensured. The application further discloses a large-aperture sky survey telescope.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of optical technology, in particular to a large aperture sky survey telescope anti-interference device and a telescope. BACKGROUND

[0002] The increase of the aperture of the telescope can not only effectively improve the resolution of the nearby target, but also increase the light collecting ability of the telescope in a square rule, which can effectively improve the signal-to-noise ratio of the imaging of the dark and weak target, expand the limit detection capability, and finally realize the exploration of the more distant universe. Therefore, the large aperture and large field of view telescope is the key to verify the latest theory of cosmology, increase the academic discourse power in the field of time domain astronomy in the future.

[0003] The large aperture and large field of view telescope has developed rapidly in the past two decades. In order to obtain higher sky survey efficiency and light collecting ability, its aperture and field of view are continuously expanding. As a key technology of large aperture and large field of view telescope, active optics has been widely used. Foreign countries have developed and successfully operated several large aperture and large field of view telescopes. The 8-meter LSST has been put into construction, while domestic research on large field of view telescopes above two meters has not been carried out. Whether in the aspect of occupying the "space highland" to ensure national security or in the aspect of detecting small asteroids with impact threat in the field of astronomy, there is a big gap.

[0004] Compared with high-resolution imaging telescopes, the observation task of large aperture and large field of view telescopes is more intense, and longer observation time will directly affect the result. The external observation environment is more severe. SUMMARY

[0005] The present application aims at overcoming the defects in the prior art, and adopts the following technical solutions:

[0006] On the one hand, the present application provides a large aperture sky survey telescope anti-interference device for anti-interference and compensation of a large aperture sky survey telescope. The large aperture sky survey telescope comprises a primary mirror, a primary mirror support device and a correction mirror group opposite to the primary mirror, the correction mirror group is connected with the primary mirror through a metrology truss, and a support member is arranged behind the correction mirror group.

[0007] The anti-interference device comprises:

[0008] A space pose detection module is arranged for detecting the positional relationship between the space pose and the metrology truss.

[0009] A control module is arranged for comparing the detection result of the space pose detection module with a standard value set by a standard space pose, and calculating a space pose compensation value.

[0010] A compensation correction module is arranged for receiving the space pose compensation value fed back by the control module and performing compensation.

[0011] In some embodiments, the anti-interference device further comprises: an atmospheric refraction rate detection module, configured to detect the atmospheric refraction rate;

[0012] The control module is further configured to: compare the detection result of the atmospheric refraction rate detection module with a standard value of atmospheric refraction rate detection setting, and calculate an atmospheric refraction rate compensation value;

[0013] The compensation correction module is further configured to: receive the atmospheric refraction rate compensation value fed back by the control module and perform compensation.

[0014] In some embodiments, the atmospheric refraction rate detection module is a small weather station built in the large-aperture survey telescope.

[0015] In some embodiments, the anti-interference device further comprises: an optical refraction error detection module, configured to detect the optical refraction error when the temperature gradient changes;

[0016] The control module is further configured to: compare the detection result of the optical refraction error with a standard value of optical refraction error setting, and calculate an optical refraction error compensation value;

[0017] The compensation correction module is further configured to: receive the optical refraction error compensation value fed back by the control module and perform compensation.

[0018] In some embodiments, the anti-interference device further comprises: a wavefront distortion and degradation prediction module, configured to predict the wavefront distortion and degradation by using an exponential law;

[0019] The control module is further configured to: compare the wavefront distortion and degradation prediction value with a standard value of wavefront distortion and degradation setting, and calculate a wavefront distortion and degradation prediction compensation value;

[0020] The compensation correction module is further configured to: receive the wavefront distortion and degradation prediction compensation value fed back by the control module and perform compensation.

[0021] In some embodiments, the anti-interference device further comprises: a wavefront curvature detection module, configured to detect the wavefront curvature parameter;

[0022] The control module is further configured to: compare the detected wavefront curvature parameter with a standard value of wavefront curvature parameter setting, and calculate a wavefront curvature parameter compensation value;

[0023] The compensation correction module is further configured to: receive the wavefront curvature compensation value fed back by the control module and perform compensation.

[0024] In some embodiments, the standard value of wavefront curvature parameter setting adopts a method of moment estimation, and uses statistical moments to represent the wavefront distortion.

[0025] In some embodiments, the anti-interference device further comprises: a motion trajectory detection module, configured to sample different postures of the camera of the telescope in shaking and project the sampling points into a two-dimensional image.

[0026] The control module is further configured to: calculate a point spread function of motion blur for the projected two-dimensional image.

[0027] The compensation correction module is further configured to: perform deconvolution calculation on the point spread function of motion blur fed back by the control module.

[0028] In some embodiments, the anti-interference device further comprises:

[0029] A piezoelectric ceramic is arranged on the support.

[0030] In another aspect, the application also provides a large-aperture survey telescope. The large-aperture survey telescope comprises: a primary mirror, a correction lens group arranged on the optical axis of the primary mirror, the correction lens group being connected to the primary mirror through a metrology truss, and a support arranged behind the correction lens group; and an anti-interference device for a large-aperture survey telescope as described above.

[0031] The technical effects of the application: The large-aperture survey telescope anti-interference device and the telescope disclosed in the application detect the positional relationship between the spatial pose and the metrology truss through a spatial pose detection module; compare the detection result of the spatial pose detection module with a standard value set by a standard spatial pose through a control module, and calculate a spatial pose compensation value; receive the spatial pose compensation value fed back by the control module and perform compensation through a compensation correction module. Thus, the error of the large-aperture survey telescope in the actual application process is eliminated, the imaging of the telescope is affected, the precision of the large-aperture survey telescope is ensured, and the device can be applied to different application environments. BRIEF DESCRIPTION OF DRAWINGS

[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiments or prior art description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0033] Figure 1 FIG. 1 is a structural schematic diagram of a large-aperture survey telescope anti-interference device according to an embodiment of the present application;

[0034] Figure 2 FIG. 2 is a partial structural example diagram of a large-aperture survey telescope according to an embodiment of the present application;

[0035] Figure 3 a schematic diagram of ranging relative error at different temperatures according to one embodiment of the present application;

[0036] Figure 4 a schematic diagram of optical path deviation at different temperature gradients and observation distances under the condition of D=5m, dT / dZ=0.1℃ / m according to one embodiment of the present application;

[0037] Figure 5 a schematic diagram of optical path deviation at different temperature gradients and observation distances under the condition of D=5m, dT / dZ=1℃ / m according to one embodiment of the present application;

[0038] Figure 6 a contrast diagram after application of deconvolution calculation according to one embodiment of the present application. DETAILED DESCRIPTION

[0039] In order to make the objects, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, and do not constitute a limitation on the present application.

[0040] In the following description, specific details are set forth in order to provide a thorough understanding of the embodiments of the application. However, persons skilled in the art will understand that the application can be practiced without these specific details. In other instances, well-known structures, devices, circuits and methods have been abridged to not unnecessarily obscure the application.

[0041] It should be understood that when used in the specification and the appended claims, the term "comprising" indicates the presence of the described features, integers, steps, operations, elements, and / or components, but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0042] It should also be understood that the term "and / or" as used herein refers to any combination of one or more of the associated listed items, as well as all possible combinations of the items, and includes these combinations.

[0043] As used in the specification and the appended claims, the term "if' can be interpreted as meaning "when" or "once" or "in response to a determination" or "in response to detecting" depending on the context. Similarly, the phrase "if it is determined" or "if [a described condition or event] is detected" can be interpreted as meaning "once it is determined" or "in response to a determination" or "once [a described condition or event] is detected" or "in response to detecting [a described condition or event]" depending on the context.

[0044] In addition, in the description of the present application and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0045] Reference in the specification to "one embodiment" or "some embodiments" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the application. The appearances of the phrases "in one embodiment", "in some embodiments", "in other embodiments", "in additional embodiments", etc. in various places in the specification are not necessarily all referring to the same embodiment, although they can. The terms "comprising", "including", "having" and their variants mean "including but not limited to", unless otherwise expressly specified.

[0046] The present application aims to overcome the defects in the prior art, with reference to Figure 1 As shown in the drawings, the present application provides a large-aperture sky survey telescope anti-interference device 100 for anti-interference and compensation of a large-aperture sky survey telescope to meet the application of the large-aperture sky survey telescope under different spatial conditions, suitable for different environmental parameters to obtain high-precision imaging quality.

[0047] With reference to Figure 1 and Figure 2 As shown in the drawings, the large-aperture sky survey telescope comprises a primary mirror Primary Mirror, a corrector Corrector disposed on the optical axis of the primary mirror Primary Mirror, the corrector Corrector being connected with the primary mirror Primary Mirror through a metrology truss, and a support being disposed behind the corrector Corrector; the anti-interference device 100 comprises:

[0048] A spatial pose detection module 10 is configured to detect the positional relationship between the spatial pose and the metrology truss;

[0049] The control module 1 compares the detection result of the space pose detection module 10 with a standard value set by a space pose standard, and calculates a space pose compensation value.

[0050] The compensation correction module 2 receives the space pose compensation value fed back by the control module 1 and performs compensation.

[0051] The space pose detection module 10 can obtain multi-rigid-body space pose information through geometric configuration solution. The relationship between the space pose and the measurement result of the metrology truss is shown in the formula:

[0052] S j = J i L j (1)

[0053] Wherein, for the j-th time pose, the multi-dimensional pose information vector is S j = [x j y j z j α j β j γ j ] T , the six-dimensional measurement vector of the laser metrology truss is L j = [L j1 L j2 L j3 L j4 L j5 L j6 ] T , and the Jacobian matrix between the laser metrology truss and the time pose is:

[0054]

[0055] The relative rigid-body displacement between the time poses can be obtained by formula (2), that is, the alignment relationship between the mirrors can be obtained from the six detection inputs of itself:

[0056] ΔS j = S j+1 -S j = J j+1 L j+1 -J j L j (2)

[0057] The control module 1 compares the detection result of the space pose detection module 10 with a standard value set by a space pose standard, and calculates a space pose compensation value.

[0058] Due to large aperture and large field of view telescope, it is necessary to obtain high imaging quality in the whole field of view, and the off-axis aberration which has little effect on small field of view telescope can greatly reduce the image quality of large field of view telescope. And the large aperture and large field of view telescope has high requirements for system alignment (it is necessary to ensure the aberration of off-axis field of view).

[0059] In one embodiment, 650nm wavelength can be the calibration wavelength, narrowband light is used as the measurement and regulation feedback beacon. That is, after the parameter is set as the standard value of the spatial pose standard setting, the spatial pose compensation value fed back by the control module 1 is received by the compensation correction module 2 for compensation.

[0060] The reason why modern astronomical observations develop telescopes in space is that there is a common limiting condition that cannot eliminate the influence of the earth's atmosphere on the observation results. As we all know, in the atmosphere, not only will there be a large number of fine particles suspended, but also clouds will float at different altitudes. The blockage of suspended particles, water vapor and clouds will greatly interfere with the light from outer space. In addition, due to the different air densities at different altitudes of the atmosphere, the light from outer space will also be refracted and reflected during the process of penetrating the atmosphere, and will also produce diffraction phenomenon under the influence of fine particles, so the ground-based telescope is inevitably affected by weather, air pollution, atmospheric molecules, etc., which weakens the intensity of the light from outer space and sometimes makes the observation results very blurred. Seeing refers to the sharpness of the image displayed by the telescope. It depends on the degree of atmospheric turbulence. The twinkling of stars seen by the naked eye is generally believed to be caused by high-level atmospheric turbulence. Poor clarity of the telescope is often caused by low-level atmospheric turbulence. Each layer of atmospheric turbulence produces unstable regions with different densities in the atmosphere, so that the light cannot pass smoothly and maintain the same intensity. If the atmospheric turbulence makes the light from the celestial body change direction rapidly and irregularly, the image displayed by the small telescope will flicker and jump. The large telescope will enlarge the distortion, making the image more diffuse.

[0061] In some embodiments, as shown in Figure 1 The anti-interference device 100 further comprises an atmospheric refraction rate detection module 20 for detecting the atmospheric refraction rate.

[0062] The control module 1 is further configured to compare the detection result of the atmospheric refraction rate detection module 20 with the standard value of the atmospheric refraction rate detection setting, and calculate the atmospheric refraction rate compensation value.

[0063] The compensation correction module 2 is further configured to receive the atmospheric refraction rate compensation value fed back by the control module 1 and compensate.

[0064] In some embodiments, the atmospheric refraction rate detection module 20 is a small weather station built inside the large aperture survey telescope.

[0065] Atmospheric refraction compensation is mainly divided into formula method and actual measurement method. The formula method is mainly used in the ranging compensation link of coordinate measuring instruments (such as laser trackers and total stations), that is, a small weather station is built inside to obtain air pressure, temperature and other information and calculate the atmospheric refraction rate.

[0066] In some embodiments, the atmospheric refraction rate detection module 20 is a resonant cavity. In precise ranging instruments such as Zygo laser interferometers, a resonant cavity with a certain length is used to obtain the atmospheric refraction rate in real time and compensate the measurement results.

[0067] According to the Barrel-Sears formula, the atmospheric refraction rate under different pressure and temperature is as follows:

[0068]

[0069] Where T is the temperature, P is the pressure, and e is the water vapor partial pressure

[0070] The analysis of z, that is, the light propagation direction, can be obtained by derivation:

[0071]

[0072] In some embodiments, as shown in Figure 1 The light refraction error detection module 30 is further used for detecting the light refraction error when the temperature gradient changes.

[0073] The control module 1 is further used for comparing the detection result of the light refraction error with a light refraction error setting standard value and calculating a light refraction error compensation value.

[0074] The compensation correction module 2 is further used for receiving the light refraction error compensation value fed back by the control module 1 and performing compensation.

[0075] In the actual application process of the large aperture survey telescope, different temperatures may occur. As shown in Figure 3 The ranging relative error diagram under different temperatures is shown in Figure 3 It can be known that if no compensation is performed (all calculated in the standard state), the ranging accuracy caused by the temperature gradient is about 0.001%, and the measurement error is 20 microns in the two-meter level.

[0076] After that, when the light and the isotherm are no longer perpendicular, the refraction error will occur. The refraction error will affect the dynamic capture range of the receiving end, so the influence of atmospheric disturbance, i.e. the influence of refraction error, should also be considered.

[0077] According to the previous research, the sign of the refraction compensation is consistent, so it is impossible to rely on multiple measurements to average out the influence of the optical path. According to the basic equation of the optical path, taking Y analysis as an example, the optical path curvature K Y The relationship between the refractive index and the optical path is shown in the following formula:

[0078]

[0079] Among them, it is assumed that the light propagates along the z-axis, and the projections of the optical path function in the other two coordinate planes are Y and X, respectively, and both are functions of Z. Taking Y analysis as an example, the following formula can be obtained by using the basic properties of spatial curves:

[0080]

[0081] Among them,

[0082]

[0083] Reference Figure 4 Fig. 1 shows the optical path deviation under different temperature gradients and observation distances under the condition of D = 5 m and dT / dZ = 0.1℃ / m according to an embodiment of the present application; reference Figure 5 Fig. 2 shows the optical path deviation under different temperature gradients and observation distances under the condition of D = 5 m and dT / dZ = 1℃ / m according to an embodiment of the present application; through Figure 4 and Figure 5 It can be known that if the optical axis angle is about 30°, and the distance is 3 meters, and it is assumed that dT / dZ = 1℃ / m, a range of 50 microns needs to be reserved for preventing the light from deviating.

[0084] And the refraction error compensation value fed back by the control module 1 is received by the compensation correction module 2 and compensated, so that even if there is a refraction error, it can be compensated and corrected by the compensation correction module 2.

[0085] In some embodiments, the anti-interference device 100 further comprises a wavefront distortion and degradation prediction module 40, which predicts the distortion and degradation of the wavefront by using an exponential law;

[0086] The control module 1 is also used to compare the wavefront distortion and degradation prediction value with the wavefront distortion and degradation setting standard value, and calculate the refraction wavefront distortion and degradation prediction compensation value;

[0087] The compensation correction module 2 is further configured to receive the wavefront distortion and degradation prediction compensation value fed back by the control module 1 and perform compensation.

[0088] In the application scenario of thermal load, the theoretical modeling of thermal load can reduce the image quality degradation caused by the hysteresis of thermal load and the temperature difference of the environment. The theoretical modeling of the temperature rise and temperature drop process of the system can not only realize the prediction of the change of image quality, but also compensate for the main part of the temperature change, thereby reducing the dynamic range occupation of the wavefront sensor.

[0089]

[0090] Wherein:

[0091] That is, the exponential law is used to predict the distortion and degradation of the wavefront.

[0092] In this implementation scenario, the exponential prediction model is used for open-loop feedforward feedback, and the compensation correction module 2 is used for compensation, so that the large-aperture survey telescope can be applied to the thermal load scenario.

[0093] In some embodiments, the anti-interference device 100 further comprises a refraction error detection module 50 configured to detect a wavefront curvature parameter;

[0094] The control module 1 is further configured to compare the detected wavefront curvature parameter with a wavefront curvature parameter setting standard value, and calculate a wavefront curvature parameter compensation value.

[0095] The compensation correction module 2 is further configured to receive the wavefront curvature compensation value fed back by the control module 1 and perform compensation.

[0096] In some embodiments, the wavefront curvature parameter setting standard value adopts a method of moment estimation, and uses statistical moments to represent the wavefront distortion. The wavefront curvature sensor has been widely used in large-aperture and large-field active optical systems due to its large dynamic range and stable calculation. The traditional curvature sensor needs to obtain two light intensity distributions before and after the focal plane to calculate, although it can realize the perception of high spatial frequency, but whether it is time division multiplexing or light splitting to obtain the image method, it needs to sacrifice time or space. This project intends to adopt the method of moment estimation, which only needs to collect the light intensity distribution of a certain pupil surface, and then realizes the detection of low-order aberration.

[0097] M mn = <I x x m +I y y n >

[0098] That is, the wavefront distortion is characterized by statistical moments.

[0099] Meanwhile, the system jitter can also be characterized based on the defocus star image, and by taking the Maclaurin expansion of the optical transfer function as an intermediate transition, the relationship between the vibration of the excitation system and the optical transfer function (OTF) can be established, and thus the system jitter can be obtained

[0100]

[0101] wherein is the q-th moment of the system vibration x(t), and ω is the spatial frequency

[0102] For the extraction of the relevant region, multiple steps are performed, and for different extraction thresholds, wavefront reconstruction is performed, and the change trend of the wavefront solution result is judged, so as to realize the fast calculation and fast correction of the wavefront with the best effect. This is the fast correction mode scenario in which the large-aperture patrol telescope is applied to the tracking mode.

[0103] In some embodiments, the anti-interference device 100 further comprises a motion trajectory detection module 60 for sampling different poses of the jitter of the camera of the telescope and projecting the sampling points into a two-dimensional image;

[0104] The control module 1 is further configured to calculate a point spread function (PSF) of the motion blur for the projected two-dimensional image.

[0105] The compensation correction module 2 is further configured to perform deconvolution calculation on the PSF of the motion blur fed back by the control module 1.

[0106] Long-time exposure photography is usually degraded by motion blur. If an inertial sensor samples different poses of a jittering camera during exposure, an object point (X, Y, Z) in a three-dimensional (3D) object space is projected to K different positions (xk, yk), k = 1, …, K in a two-dimensional (2D) image plane,

[0107] [x k ,y k ,1] T =Π k [X,Y,Z,1] T ,

[0108] wherein Πk represents the projection matrix of the kth camera pose. If the motion trajectory is generated in a spatially invariant manner, the K points in the image plane will generate a corresponding PSF of motion blur as:

[0109]

[0110] After deconvolution calculation using the PSF, a clear image can be obtained.

[0111] Reference is made to Figure 6 As shown in the contrastive diagram after the deconvolution calculation according to one embodiment of the present application, it can be seen that the image is relatively blurred before the deconvolution calculation, but the image becomes clear after the deconvolution calculation by the compensation correction module 2.

[0112] In some embodiments, the anti-interference device 100 further comprises:

[0113] piezoelectric ceramics disposed on the support.

[0114] Traditional semi-active damping elements mostly use magneto-rheological fluid, which not only has the possibility of liquid leakage, but also has insufficient environmental adaptability. Piezoelectric ceramics are a new type of composite material and can be directly bonded with the system. Based on piezoelectric ceramics combined with subsequent circuits, this project realizes the integration design of signal collection and actuator, and through the mechanical-electronic collaborative design of electrical materials, it can realize the embedded high-energy concentration ratio semi-active damping modulation of the closely packed waveguide. The semi-active damping control system design based on system identification focuses on the estimation and adjustment of the state system state. When the signal-to-noise ratio is low, the noise of the classic controller is injected into the control signal, resulting in a decrease in its performance. Therefore, based on state space estimation, the real-time dynamic model of the system is identified, and through system dynamics testing and mode sensitivity analysis, the optimal vibration suppression strategy is determined to minimize the norm of the residual signal, and finally the optimal correction is realized. Specifically, the piezoelectric ceramics input the feedback signal into the control module 1, and the control module 1 inputs the correction information into the compensation correction module 2 for correction. Specifically, the compensation correction module 2 applies torque to the primary mirror Primary Mirror through the torque applying device on the primary mirror Primary Mirror support device to make it deform.

[0115] In some embodiments, the corrector Corrector is composed of multiple mirror surfaces, and the multiple mirror surfaces can change the surface shape through the torque applying mechanism on the support. The torque applying mechanism is electrically connected with the piezoelectric ceramics, and through the joint action of the control module 1 and the compensation correction module 2, the surface shape of the mirror surface is controlled.

[0116] In some embodiments, the shape of the mirror surface is set as a planar hexagon.

[0117] In some embodiments, the anti-interference device 100 can perform high-precision wavefront correction in a constant mode. The anti-interference device 100 corrects low-order using open-loop table building, and corrects higher-order using wavefront sensing. It can be indicated by the following formula:

[0118] w1i = w0 + εW si

[0119] wherein w0 is the wavefront at different detection spatial positions.

[0120] In some embodiments, the anti-interference device 100 can mainly correct for high-level turbulence and turbulence around the telescope in non-optimal observation conditions, respectively. It is also compensated and corrected by the way of deconvolution calculation.

[0121] On the other hand, referring to Figure 1 Figure 2 As shown, the present application also provides a large aperture survey telescope. The large aperture survey telescope comprises a primary mirror, a corrector group arranged on the optical axis of the primary mirror, the corrector group being connected with the primary mirror through a metrology truss, and a support being arranged behind the corrector group; and the large aperture survey telescope anti-interference device 100 as described above.

[0122] Referring to Figure 2 As shown, it is a partial structure example diagram of a large aperture survey telescope according to an embodiment of the present application; wherein a laser LS1 is arranged on the primary mirror, and the corrector group is arranged on the optical axis of the primary mirror. When the laser LS1 emits and is detected by the detection device, if the control module 1 analyzes that there is a surface error, the surface change of the mirror is controlled through the cooperation of the piezoelectric ceramic, the control module 1 and the compensation correction module 2, thereby playing a correcting role.

[0123] Since the large aperture survey telescope anti-interference device 100 has been described in the foregoing, it will not be described here again.

[0124] The technical effect of the embodiment of the present application: the large-aperture survey telescope anti-interference device and the telescope disclosed by the present application detect the positional relationship between the space pose and the metrology truss through the space pose detection module; the control module compares the detection result of the space pose detection module with the standard value of the space pose standard setting, and calculates the space pose compensation value; the compensation correction module receives the space pose compensation value fed back by the control module and performs compensation. Thus, the error of the large-aperture survey telescope in the actual application process is eliminated, the imaging of the telescope is affected, the precision of the large-aperture survey telescope is ensured, and the large-aperture survey telescope can be applied to different application environments. Considering the atmospheric refractive index, the refraction error, the distortion and degradation of the wavefront, the wavefront curvature and other factors, the active correction of the factors in different scenes is performed through the interaction of the control module and the compensation correction module, so that the telescope can be applied to different scenes and environments, and the precision and reliability of the system are ensured.

[0125] In order to further exert the detection capability of the large-aperture large-field-of-view telescope, the active optical anti-interference device is used to independently and real-timely correct the surface shape and control the attitude of each main component in the telescope, which can not only reduce the requirement for optical processing and system assembly precision, but also effectively relax the requirement for the rigidity of the large tracking frame and reduce the system motion inertia.

[0126] The steps of the method or algorithm described in combination with the embodiments disclosed herein can be implemented by hardware, a software module executed by a processor, or a combination of the two. The software module can be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the technical field.

[0127] In the description of the present application, it should be understood that the symbols such as parameters, variables and program names mentioned in the embodiments of the present application can be replaced by any other symbols without causing confusion.

[0128] In the description of the present application, it is to be understood that the orientations or positional relationships indicated by the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like are based on the orientations or positional relationships shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and do not indicate or imply that the devices or elements indicated thereby must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0129] In addition, the terms "first", "second", "third", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated thereby. Therefore, the features defined with "first", "second", etc. can explicitly or implicitly include at least one of the features.

[0130] In the present application, unless otherwise explicitly specified and limited, the terms "mounting", "connecting", "connecting", "fixing" and the like should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0131] In the present application, unless otherwise explicitly specified and limited, the first feature "on" or "under" the second feature can be that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature "above", "over" and "on" the second feature can be that the first feature is directly above or obliquely above the second feature, or it can only mean that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "under" and "under" the second feature can be that the first feature is directly below or obliquely below the second feature, or it can only mean that the horizontal height of the first feature is less than that of the second feature.

[0132] In the description of the specification, the description of the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In the specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples. In addition, different embodiments or examples described in the specification and the features of different embodiments or examples can be combined and combined by those skilled in the art without contradiction.

[0133] Although the embodiments of the present application have been shown and described above, it is understood that the above-described embodiments are exemplary and are not to be construed as limiting the present application, and those skilled in the art can make changes, modifications, replacements and variations to the above-described embodiments within the scope of the present application.

[0134] The specific embodiments of the application described above do not constitute a limitation on the scope of protection of the present application. Any various other corresponding changes and modifications made in accordance with the technical concept of the present application shall be included in the scope of protection of the claims of the present application.

Claims

1. A noise reduction device for a large-aperture survey telescope, the large-aperture survey telescope comprising a primary mirror, a correction lens group disposed on the optical axis of the primary mirror, the correction lens group being connected to the primary mirror by a metrology truss Next, the back of the corrective lens group is provided with a support, characterized in that, the noise reduction device comprising: a spatial pose detection module configured to detect a positional relationship between a spatial pose and the metrology truss; a control module configured to compare a detection result of the spatial pose detection module with a standard value of a spatial pose standard setting, and calculate a spatial pose compensation value; a compensation correction module configured to receive the spatial pose compensation value fed back by the control module and perform compensation, the compensation correction module being further configured to receive an atmospheric refractive index compensation value fed back by the control module and a refractive error compensation value fed back by the control module and perform compensation, wherein: the atmospheric refractive index compensation value calculation method comprises: using a resonant cavity with a fixed length to obtain the atmospheric refractive index in real time and compensate the measurement result; according to the Barrel-Sears formula, the refractive index of the atmosphere at different pressures and temperatures is as follows: where T is the temperature, P is the pressure, and e is the water vapor partial pressure analysis is performed on z, i.e., the light propagation direction, and the following equation can be obtained by derivation: The refraction error compensation value calculation method comprises the following steps: according to the basic equation of the optical path, the optical path curvature K Y The relationship between the refractive index and the curvature is shown in the following formula: where it is assumed that the light propagates along the z-axis, and the projections of the optical path function in the other two coordinate planes are Y and X, which are both functions of Z, and the following equation can be obtained using the basic properties of spatial curves: where 2. The large-aperture survey telescope noise protection device according to claim 1, characterized in that the noise reduction device further comprises: an atmospheric refractive index detection module configured to detect the atmospheric refractive index; the control module is further configured to compare a detection result of the atmospheric refractive index detection module with a standard value of an atmospheric refractive index detection standard setting, and calculate an atmospheric refractive index compensation value.

3. The large-aperture wide-field telescope anti-disturbance device according to claim 2, characterized in that, The atmospheric refractive index detection module is a small weather station built into the large-aperture survey telescope.

4. The large-aperture wide-field telescope anti-disturbance device according to claim 1, characterized in that, the noise reduction device further comprises: a refractive error detection module configured to detect the refractive error when the temperature gradient changes; the control module is further configured to compare a detection result of the refractive error with a standard value of a refractive error standard setting, and calculate a refractive error compensation value.

5. The large-aperture wide-field telescope anti-disturbance device according to claim 1, characterized in that, the noise reduction device further comprises: a wavefront distortion and degradation prediction module configured to predict the wavefront distortion and degradation using an exponential law; the control module is further configured to compare a prediction value of the wavefront distortion and degradation with a standard value of a wavefront distortion and degradation standard setting, and calculate a wavefront distortion and degradation prediction compensation value; the compensation correction module is further configured to receive the wavefront distortion and degradation prediction compensation value fed back by the control module and perform compensation.

6. The large-aperture wide-field telescope anti-disturbance device according to claim 1, characterized in that, the noise reduction device further comprises: a wavefront curvature detection module configured to detect a wavefront curvature parameter; the control module is further configured to compare the detected wavefront curvature parameter with a standard value of a wavefront curvature parameter standard setting, and calculate a wavefront curvature parameter compensation value; the compensation correction module is further configured to receive the wavefront curvature compensation value fed back by the control module and perform compensation.

7. The large-aperture wide-field telescope anti-disturbance device according to claim 6, characterized in that, The wavefront curvature parameter standard setting adopts a method of moment estimation, which uses statistical moments to represent the wavefront distortion.

8. The large-aperture survey telescope noise protection device of claim 1, wherein, the noise reduction device further comprises: a motion trajectory detection module configured to sample different poses of camera shaking of the telescope, and project the sampling points into a two-dimensional image; The control module is further configured to calculate a point spread function of motion blur for the projected two-dimensional image; The compensation correction module is further configured to perform deconvolution calculation on the point spread function of motion blur fed back by the control module.

9. The large-aperture survey telescope RFI mitigation device of claim 1, wherein, The anti-interference device further comprises: A piezoelectric ceramic disposed on the support.

10. A large aperture survey telescope telescope characterized by, Comprise: A primary mirror, a correction lens group disposed on the optical axis of the primary mirror, the correction lens group being connected to the primary mirror through a metrology truss, and a support disposed behind the correction lens group; And the large aperture sky survey telescope anti-interference device according to any one of claims 1-9.

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