Image chain simulation method, device and equipment and storage medium

Abstract

The application discloses an image chain simulation method and device, equipment and a storage medium. The method comprises the following steps: acquiring multiple frames of measured object images in response to first request information sent by an image chain control system; acquiring exposure parameters corresponding to the measured object images in response to second request information sent by the image chain control system; adjusting preset image parameters of the multiple frames of measured object images according to the exposure parameters, obtaining target image parameters, and determining target image data according to the target image parameters; and sending the target image data to the image chain control system. The method solves the problem of radiation protection requirements in the aspect of environmental safety caused by radiation emitted by the existing image chain system during testing.

Description

Technical Field

[0001] This application relates to the field of medical imaging technology, and in particular to a simulation testing method, apparatus, equipment and storage medium for an imaging chain control system. Background Technology

[0002] Equipment such as DSA angiography requires testing and debugging of the imaging chain system during the research, development, production and testing process, as well as design verification or debugging and testing.

[0003] To meet environmental safety regulations regarding radiation, a lead box or X-ray protection room is required. Inside this room, a high-voltage generator, X-ray tube, and X-ray detector are installed. First, the high-voltage generator produces tens or hundreds of kilovolts or higher, which are then emitted through the X-ray tube to expose objects between the tube and the detector. The detector receives the X-rays and converts them into digital images. This image data is continuously sent to the image chain control system, thus acquiring consecutive frames of images.

[0004] This testing method requires equipment such as radiation shielding lead boxes, protective rooms, dosimeters, radiation monitoring personnel, and management measures that comply with regulations. It is complex to operate and costly. Summary of the Invention

[0005] In view of this, this application provides an image chain simulation method, apparatus, device and storage medium, which can solve the problem of radiation protection requirements for environmental safety caused by radiation emitted during testing of existing image chain systems.

[0006] According to one aspect of this application, an image chain simulation method is provided, comprising:

[0007] In response to the first request information sent by the image chain control system, the image of the object under test is acquired;

[0008] In response to the second request information sent by the image chain control system, the exposure parameters corresponding to the image of the object under test are obtained;

[0009] The preset image parameters of the multi-frame object images are adjusted according to the exposure parameters to obtain the target image parameters, and the target image data is determined according to the target image parameters.

[0010] The target image data is sent to the image chain control system.

[0011] Optionally, determining the target image data based on the target image parameters specifically includes:

[0012] The target image data corresponding to the target image parameter is searched in the preset image data table, wherein the preset image data table includes multiple preset image parameters and preset image data corresponding to each preset image parameter.

[0013] Optionally, before searching for target image data corresponding to the target image parameters in the preset image list, the method further includes:

[0014] Based on each preset exposure parameter, preset image data corresponding to the preset exposure parameter is obtained;

[0015] Each preset image parameter is determined according to each preset exposure parameter;

[0016] Based on the preset image data and the preset image parameters, a preset image data table is established.

[0017] Optionally, after acquiring multiple frames of images of the object under test, the method further includes: sending first feedback information to the image chain control system;

[0018] After acquiring the exposure parameters corresponding to the image of the object under test, the method further includes: sending second feedback information to the image chain control system; wherein,

[0019] The first request information is a request for permission to simulate emitting radiation;

[0020] The first feedback information is information that allows the simulation to emit radiation;

[0021] The second request information is a request to simulate the emission of radiation;

[0022] The second feedback information is the information indicating that the simulated radiation emission was successful.

[0023] Optionally, acquiring multiple frames of the object under test specifically includes:

[0024] The arrangement order of the multiple images of the object under test is determined, and the multiple images of the object under test are acquired sequentially according to the arrangement order.

[0025] Optionally, determining the arrangement order of the plurality of images of the tested object specifically includes:

[0026] Establish a numbering rule for multiple images of the object under test;

[0027] Based on the numbering rules, a number is assigned to multiple images of the tested objects;

[0028] Based on the numbering, the arrangement order of the multiple images of the tested objects is determined.

[0029] Optionally, the exposure parameters include voltage and / or current;

[0030] The preset image parameters include at least one of the following: signal-to-noise ratio, contrast ratio, edge sharpness, and resolution.

[0031] According to another aspect of this application, an image chain simulation apparatus is provided, comprising:

[0032] The detector simulation module is used to acquire multiple frames of images of the object under test in response to the first request information sent by the image chain control system.

[0033] The radiation simulation module is used to obtain the exposure parameters corresponding to the image of the object under test in response to the second request information sent by the image chain control system.

[0034] The image calculation and generation module is used to adjust the preset image parameters of the multi-frame test object images according to the exposure parameters to obtain target image parameters, and determine target image data according to the target image parameters;

[0035] The output module is used to send the target image data to the image chain control system.

[0036] Optionally, the image calculation and generation module is specifically used for:

[0037] The target image data corresponding to the target image parameter is searched in the preset image data table, wherein the preset image data table includes multiple preset image parameters and preset image data corresponding to each preset image parameter.

[0038] Optionally, the device further includes a preset module, specifically used for:

[0039] Based on each preset exposure parameter, preset image data corresponding to the preset exposure parameter is obtained;

[0040] Each preset image parameter is determined according to each preset exposure parameter;

[0041] Based on the preset image data and the preset image parameters, a preset image data table is established.

[0042] Optionally, the detector simulation module is further configured to send first feedback information to the image chain control system;

[0043] The radiation simulation module is also used to send second feedback information to the image chain control system;

[0044] in,

[0045] The first request information is a request for permission to simulate emitting radiation;

[0046] The first feedback information is information that allows the simulation to emit radiation;

[0047] The second request information is a request to simulate the emission of radiation;

[0048] The second feedback information is the information indicating that the simulated radiation emission was successful.

[0049] Optionally, the detector simulation module is further configured to:

[0050] The arrangement order of the multiple images of the object under test is determined, and the multiple images of the object under test are acquired sequentially according to the arrangement order.

[0051] Optionally, the detector simulation module is further configured to:

[0052] Establish a numbering rule for multiple images of the object under test;

[0053] Based on the numbering rules, a number is assigned to multiple images of the tested objects;

[0054] Based on the numbering, the arrangement order of the multiple images of the tested objects is determined.

[0055] Optionally, the exposure parameters include voltage and / or current;

[0056] The preset image parameters include at least one of the following: signal-to-noise ratio, contrast ratio, edge sharpness, and resolution.

[0057] According to another aspect of this application, an image chain simulation device is provided, characterized in that the device comprises:

[0058] The detector interface is used to receive the first request information sent by the image chain control system.

[0059] The high-voltage generator interface is used to receive the second request information sent by the image chain control system;

[0060] Memory, used to store images of the object being measured;

[0061] The processor, connected to the detector interface, the high-voltage generator interface, and the memory respectively, is used to write the image of the object under test into the memory in response to the first request information; write the exposure parameters corresponding to the image of the object under test into the memory in response to the second request information; and adjust the preset image parameters of the multiple frames of the object under test according to the exposure parameters to obtain target image parameters, and after determining the target image data according to the target image parameters, send the target image data to the image chain control system.

[0062] According to another aspect of this application, a storage medium is provided that stores a computer program thereon, which, when executed by a processor, implements the simulation test method of the above-described image chain control system.

[0063] By employing the above technical solution, this application utilizes simulation to test the image chain system. Specifically, this application does not emit radiation to irradiate the object under test. Instead, it reads the image of the object and its exposure parameters, and simulates the actual exposure operation based on the exposure parameters to obtain the target image data. Therefore, compared to existing methods that emit radiation for testing, this application eliminates the need for radiation protection, saving costs and improving safety during the testing process. Furthermore, this embodiment eliminates the need to build an actual testing environment, reducing usage costs, simplifying the installation process, and the testing process is not limited by environmental conditions. Finally, this application tests, debugs, and verifies the image chain control system in a non-radiation environment, without requiring an object under test or repeated adjustments to the object's position; the required images and parameters can be directly downloaded, thus improving the safety of personnel.

[0064] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description

[0065] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0066] Figure 1 A flowchart illustrating an image chain simulation method provided in an embodiment of this application is shown.

[0067] Figure 2 A flowchart illustrating another image chain simulation method provided in an embodiment of this application is shown;

[0068] Figure 3 A flowchart illustrating another image chain simulation method provided in an embodiment of this application is shown;

[0069] Figure 4 A flowchart illustrating another image chain simulation method provided in an embodiment of this application is shown;

[0070] Figure 5 A flowchart illustrating another image chain simulation method provided in an embodiment of this application is shown;

[0071] Figure 6This paper shows a schematic diagram of the structure of an image chain simulation device provided in an embodiment of this application;

[0072] Figure 7 A structural block diagram of an image chain simulation device provided in an embodiment of this application is shown. Detailed Implementation

[0073] This embodiment provides an image chain simulation method, which is used in an image chain simulation device, such as... Figure 1 As shown, the method includes:

[0074] The method provided in this application is used for testing image chain control systems. Unlike existing methods that involve building a physical environment and emitting radiation, this application proposes a simulation testing method using a simulation device. The radiation can be X-rays, ultrasound, gamma rays, etc.

[0075] Based on this, the embodiments of this application first receive a first request message sent by the product under test, i.e., the image chain control system, and then perform subsequent operations according to the first request message to realize the simulation test of the image chain control system. The first request message can be a pulse signal.

[0076] Step 101: In response to the first request information sent by the image chain system, acquire multiple frames of images of the object under test;

[0077] The method provided in this application is used for testing image chain control systems. Unlike existing methods that involve building a physical environment and emitting radiation for testing, this application proposes a simulation testing method using a simulation device. The radiation can be X-rays, ultrasound, gamma rays, etc.

[0078] Based on this, the embodiments of this application first respond to the first request information sent by the product under test, i.e., the image chain control system, and then perform subsequent operations according to the first request information to realize the simulation test of the image chain control system. The first request information can be a pulse signal.

[0079] In this embodiment, unlike existing methods that place a physical object under test and emit radiation such as X-rays towards it, this embodiment uses images of the object under test instead of the traditional physical object. Each frame of the object under test image is a two-dimensional planar image obtained by rotating and capturing it from different angles; therefore, multiple frames of the object under test images can be used to obtain a three-dimensional image of the object under test.

[0080] Specifically, the image chain simulation device responds to the first request information and acquires multiple frames of images of the object under test.

[0081] Multiple frames of the object under test can be stored in the FLASH memory. Before performing calculations using the object under test images, the images in the FLASH memory are written into the memory.

[0082] Step 102: In response to the second request information sent by the image chain control system, obtain the exposure parameters corresponding to the image of the object under test;

[0083] In this embodiment, the image chain simulation device responds to the second request information sent by the image chain control system and determines that subsequent operation steps can be performed. At this time, the exposure parameters corresponding to the measured physical image are acquired and can be written into memory for subsequent simulation calculations.

[0084] Step 103: Adjust the preset image parameters of multiple frames of the object under test according to the exposure parameters to obtain the target image parameters, and determine the target image data according to the target image parameters;

[0085] In this embodiment, the image chain simulation device performs simulation calculations based on exposure parameters, adjusts preset image parameters of multiple frames of the object under test, and uses the adjusted preset image parameters as the target image parameters. For example, in the exposure parameters, the larger the current, the larger the dose, and the larger the dose, the greater the interference, that is, the greater the noise. Therefore, the signal-to-noise ratio can be appropriately increased in this case.

[0086] After determining the target image parameters, the corresponding target image data can be determined based on these parameters. This target image data is the image data obtained by simulating emitted radiation and irradiating the object under test. This application's embodiment simulates the process of a detector receiving radiation rays and converting them into a digital image, using a simulation method to obtain target image data, thus replacing the traditional method of actually emitting radiation rays.

[0087] Step 104: Send the target image data to the image chain control system.

[0088] In this embodiment, the image chain simulation device sends target image data to the image chain control system. This allows the image chain control system to continuously verify and resolve issues based on the target image data during the research and development and production processes.

[0089] By applying the technical solution of this embodiment, the testing of the image chain system is achieved through simulation. Specifically, this embodiment does not emit radiation to irradiate the object under test. Instead, it reads the image of the object under test and its exposure parameters, and simulates the actual exposure operation based on the exposure parameters to obtain the target image data. Therefore, compared with existing methods that emit radiation for testing, this application can eliminate the need for radiation protection, saving costs and improving safety during the testing process. Furthermore, this embodiment eliminates the need to build an actual testing environment, reducing usage costs, simplifying the installation process, and the testing process is not limited by environmental conditions. Finally, this embodiment tests, debugs, and verifies the image chain control system in a non-radiation environment, without requiring an object under test or repeated adjustments to the object's position; the required images and parameters can be directly downloaded, thus improving the safety of personnel.

[0090] Furthermore, as a refinement and extension of the specific implementation methods of the above embodiments, and to fully illustrate the specific implementation process of this embodiment, another image chain simulation method is provided, such as... Figure 2 As shown, the target image data is determined based on image parameters, specifically including:

[0091] Step 201: Search for the target image data corresponding to the target image parameter in the preset image data table. The preset image data table includes multiple preset image parameters and preset image data corresponding to each preset image parameter.

[0092] In this embodiment, a preset image data table is pre-set, which includes multiple preset image parameters and their corresponding preset image data. The preset image data is based on data obtained from the object under test. Instead of processing the object image according to the target image parameters to obtain the target image data, the corresponding target image data is directly searched in the preset image data package. This method is simple and highly efficient.

[0093] This embodiment eliminates the need to actually emit radiation, obtain images, and then perform tests based on those images each time. Instead, it simulates the emission of radiation, locates the corresponding image data in a pre-defined image data table, and sends the found image data to the image chain system for testing. Therefore, it eliminates the need for actual X-ray emitting and receiving equipment, as well as X-ray protection rooms, simplifying the testing process and reducing costs.

[0094] Furthermore, such as Figure 3 As shown, in another image chain simulation method, before searching for the target image data corresponding to the image parameters in a preset image list, the following steps are also included:

[0095] Step 301: Obtain the preset image data corresponding to each preset exposure parameter;

[0096] Step 302: Determine the preset image parameters corresponding to each preset exposure parameter;

[0097] Step 303: Establish a preset image data table based on preset image data and preset image parameters.

[0098] In this embodiment, before obtaining the target image data using a preset image data table, it is first necessary to establish the preset image data table. Specifically, firstly, X-rays or other radiation are emitted onto the object under test based on different preset exposure parameters, or a simulation method is used to obtain the corresponding preset image data, and the preset image parameters corresponding to each preset exposure parameter are determined. At this point, a correspondence is established between the preset image data and the preset image parameters through the preset exposure parameters; that is, each preset image parameter has corresponding preset image data. The preset image parameters and their corresponding preset image data are written into a list to obtain the preset image data table. Now, the corresponding preset image data can be found in the preset image data table according to the preset image parameters.

[0099] This embodiment only requires creating a preset image data table once, and the data information in the table can be used repeatedly. That is, only the object under test needs to be exposed when the table is created. Subsequent testing processes do not require emitting X-rays onto the object under test. Instead, the testing is carried out using simulation. Therefore, the testing process is simple and low-cost.

[0100] Furthermore, in another image chain simulation method, after acquiring multiple frames of images of the object under test, the method also includes: sending first feedback information to the image chain control system.

[0101] After acquiring the exposure parameters corresponding to the image of the object under test, the process also includes: sending a second feedback message to the image chain control system.

[0102] The first request information is a request for permission to simulate emitting radiation;

[0103] The first feedback message is that the simulation of emitting radiation is permitted.

[0104] The second request is for a simulated emission of radiation.

[0105] The second feedback message is a notification that the simulated radiation emission was successful.

[0106] In this embodiment, specifically, in the actual exposure operation, since the detection unit receives the X-rays after they are emitted, it is necessary to inform the X-ray detection unit and confirm that the X-ray detection unit has completed the preliminary preparations before emitting the X-rays.

[0107] Based on this, this embodiment simulates the steps in the actual exposure operation described above. The product under test, i.e., the image chain control system, sends a first request message to the image chain simulation device, requesting permission to emit radiation. If the image chain simulation device is ready and can simulate receiving radiation, it sends a first feedback message to the image chain control system, informing the image chain control system that permission to simulate emitting radiation is granted.

[0108] In addition, the first feedback information can be a pulse signal with a relatively large width, the width of which can be set according to the product to be tested. The duration of this pulse signal being high is the period during which simulated emission radiation is allowed.

[0109] Furthermore, in actual exposure operations, the high-voltage generator only performs the emission operation after receiving a signal from the X-ray detector that it is permitted to emit X-rays. After the X-rays are successfully emitted, a feedback signal indicating successful emission is issued to confirm that there are no abnormalities in the emission process and to enable the X-ray detector to receive the X-rays emitted by the high-voltage generator in a timely manner.

[0110] Based on this, this embodiment simulates the steps in the actual exposure operation described above. The image chain control system sends a second request message to the image chain simulation device to request the image chain simulation device to simulate radiation emission. If the image chain simulation device successfully simulates emission, it can send a second feedback message to the image chain control system to inform it that the simulated radiation emission was successful, which also means the exposure was successful. The second feedback message can be a pulse signal.

[0111] This embodiment simulates the steps of an actual exposure operation, ensuring the simulation effect while avoiding the problems of operational complexity and high cost that would result from using actual exposure.

[0112] Furthermore, such as Figure 4 As shown, in another image chain simulation method, multiple frames of images of the object under test are acquired, specifically including:

[0113] Step 401: Determine the arrangement order of multiple object images and acquire multiple object images sequentially according to the arrangement order.

[0114] In this embodiment, multiple frames of the object under test can be packaged and sent to the image chain simulation device, and the image chain simulation device can sequentially acquire multiple frames of the object under test according to the arrangement order of each frame in the package.

[0115] The system can receive multiple frames of the object under test packaged into a flash memory, then retrieve each frame of the object under test sequentially from the flash memory and read it into memory.

[0116] Furthermore, such as Figure 5As shown, in another image chain simulation method, determining the arrangement order of multiple object images specifically includes:

[0117] Step 501: Determine the numbering rules for multiple images of the tested objects;

[0118] Step 502: Assign numbers to multiple images of the tested objects based on the numbering rules;

[0119] Step 503: Determine the arrangement order of multiple test object images based on their numbers.

[0120] In this embodiment, based on the numbering rules, each frame of the object under test is assigned a corresponding number before packaging, so that the arrangement order of the object under test images can be determined according to the number.

[0121] For example, each frame can be numbered according to the shooting order, with images captured earlier having earlier numbers. Alternatively, each frame can be numbered according to the playback order, allowing you to obtain the desired playback effect simply by reading the images according to their numbers.

[0122] Furthermore, in another image chain simulation method, the exposure parameters include voltage and / or current;

[0123] The preset image parameters include at least one of the following: signal-to-noise ratio, contrast, edge sharpness, and resolution.

[0124] In this embodiment, the exposure amount mainly depends on three imaging factors: voltage, current, and exposure time. Therefore, the exposure parameters may include one or more of voltage and current. Specifically, the higher the voltage, the stronger the penetration and the higher the clarity but the lower the contrast, and vice versa. The higher the current, the greater the exposure dose, the more radiation, and the whiter the image; conversely, the image is darker. The longer the exposure time, the greater the exposure dose and the more radiation.

[0125] Preset image parameters may include signal-to-noise ratio, contrast, edge sharpness, and resolution. As the previous analysis shows, voltage, current, and exposure time can affect image parameters. Therefore, image parameters can be determined based on exposure parameters. For example, a longer exposure time can increase the signal-to-noise ratio, resulting in a clearer image and higher imaging quality.

[0126] This embodiment sets a variety of different exposure parameters and preset image parameters, and based on the relationship between the two, determines the target image parameters from the preset image parameters according to the exposure parameters so that the imaging quality meets the requirements.

[0127] Furthermore, as a specific implementation of the above-mentioned image chain simulation method, this application embodiment provides an image chain simulation device, such as... Figure 6As shown, the device includes: a receiving and storage module, and a detector simulation module (i.e., an attached module). Figure 6 (X-ray detector simulation module), radiation simulation module (i.e., attached) Figure 6 The medium- and high-voltage generator (also known as the stadium simulation module) and the image calculation and generation module.

[0128] The detector simulation module is used to acquire multiple frames of images of the object under test in response to the first request information sent by the image chain control system.

[0129] The radiation simulation module is used to obtain the exposure parameters corresponding to the image of the object under test in response to the second request information sent by the image chain control system.

[0130] The image calculation and generation module is used to adjust the preset image parameters of multiple frames of the object under test according to the exposure parameters, obtain the target image parameters, and determine the target image data based on the target image parameters.

[0131] The output module is used to send the target image data to the image chain control system.

[0132] In practical applications, optionally, the image calculation and generation module is specifically used for:

[0133] The target image data corresponding to the target image parameter is found in the preset image data table, which includes multiple preset image parameters and the preset image data corresponding to each preset image parameter.

[0134] In practical applications, the device may optionally include a pre-configured module, specifically used for:

[0135] Based on each preset exposure parameter, the preset image data corresponding to the preset exposure parameter is obtained;

[0136] Determine the preset image parameters corresponding to each preset exposure parameter;

[0137] A preset image data table is created based on preset image data and preset image parameters.

[0138] In practical applications, optionally, the detector simulation module is also used to send the first feedback information to the image chain control system;

[0139] The radiation simulation module is also used to send a second feedback message to the image chain control system; among which,

[0140] The first request is for permission to simulate emitting radiation.

[0141] The first feedback message is that the simulation of emitting radiation is permitted.

[0142] The second request is for a simulated emission of radiation.

[0143] The second feedback message is a notification that the simulated radiation emission was successful.

[0144] In practical applications, the detector simulation module may optionally also be used for:

[0145] The arrangement order of multiple test object images is determined, and the multiple test object images are acquired and written into memory in sequence according to the arrangement order.

[0146] In practical applications, the detector simulation module may optionally also be used for:

[0147] Establish a numbering rule for multiple images of objects to be tested;

[0148] Based on the numbering rules, assign numbers to multiple images of the tested objects;

[0149] Based on the numbering, the arrangement order of multiple test object images is determined.

[0150] In practical applications, exposure parameters may optionally include voltage and / or current;

[0151] The preset image parameters include at least one of the following: signal-to-noise ratio, contrast, edge sharpness, and resolution.

[0152] It should be noted that other corresponding descriptions of the functional modules involved in the image chain simulation device provided in this application embodiment can be found in the following references. Figures 1 to 5 The corresponding descriptions in [the document] will not be repeated here.

[0153] Based on the above, Figures 1 to 5 The method shown and Figure 6 The apparatus shown in the illustration, correspondingly, also provides an image chain simulation device in this application embodiment, such as... Figure 7 As shown, the device includes: a processor (i.e., a peripheral). Figure 7 The FPGA chip (Field-Programmable Gate Array) and the detector interface (i.e., the attached) Figure 7 The interface includes an X-ray detector interface, a high-voltage generator interface, and a memory (i.e., an attached X-ray detector interface). Figure 7 (In-process FLASH memory).

[0154] The detector interface is used to receive the first request information sent by the image chain control system.

[0155] The high-voltage generator interface is used to receive the second request information sent by the image chain control system;

[0156] Memory, used to store images of the object being measured;

[0157] The processor is connected to the detector interface, the high voltage generator interface, and the memory respectively. It is used to write the image of the object under test into the memory in response to the first request information; and to write the exposure parameters corresponding to the image of the object under test into the memory in response to the second request information.

[0158] And preset image parameters are used to adjust multiple frames of the object under test according to the exposure parameters to obtain the target image parameters. After determining the target image data according to the target image parameters, the target image data is sent to the image chain control system.

[0159] Based on the above, Figures 1 to 5 Accordingly, this application embodiment also provides a storage medium storing a computer program thereon, which, when executed by a processor, implements the above-described method. Figures 1 to 5 The simulation test method for the image chain control system is shown.

[0160] Based on this understanding, the technical solution of this application can be embodied in the form of a software product. The software product can be stored in a non-volatile storage medium (such as a CD-ROM, USB flash drive, or portable hard drive), and includes several instructions to cause a device (such as a personal computer, server, or network device) to execute the methods described in the various implementation scenarios of this application.

[0161] Based on the above, Figures 1 to 5 The method shown, and Figure 6 The apparatus shown and Figure 7 To achieve the above objectives, the present application also provides a device, including a housing and the device described in the above embodiments.

[0162] Optionally, the device may also include a user interface, a network interface, a camera, radio frequency (RF) circuitry, sensors, audio circuitry, a Wi-Fi module, etc. The user interface may include a display screen, input units such as a keyboard, etc., and optional user interfaces may also include USB interfaces, card reader interfaces, etc. The network interface may optionally include standard wired interfaces, wireless interfaces (such as Bluetooth interfaces, Wi-Fi interfaces), etc.

[0163] Those skilled in the art will understand that the device structure provided in this embodiment does not constitute a limitation on the device, and may include more or fewer components, or combine certain components, or have different component arrangements.

[0164] The storage medium may also include an operating motherboard and a network communication module. The operating motherboard is the program that manages and stores the hardware and software resources of the device, supporting the operation of information processing programs and other software and / or programs. The network communication module is used to enable communication between various controls within the storage medium, as well as communication with other hardware and software in the physical device.

[0165] Through the above description of the embodiments, those skilled in the art can clearly understand that this application can be implemented by means of software plus necessary general-purpose hardware platforms.

[0166] Those skilled in the art will understand that the accompanying drawings are merely schematic diagrams of a preferred embodiment, and the units or processes shown in the drawings are not necessarily essential for implementing this application. Those skilled in the art will understand that the units in the motherboard of the embodiment can be distributed within the motherboard of the embodiment as described in the embodiment description, or they can be located in one or more motherboards different from this embodiment. The units in the above-described embodiment can be combined into one unit, or further divided into multiple sub-units.

[0167] The serial numbers in this application are for descriptive purposes only and do not represent the superiority or inferiority of any particular implementation scenario. The above disclosures are merely a few specific implementation scenarios of this application; however, this application is not limited thereto, and any variations conceived by those skilled in the art should fall within the protection scope of this application.

Claims

1. An image chain simulation method, characterized in that, The method, applied to image chain simulation equipment, includes: In response to the first request information sent by the image chain control system, multiple frames of images of the object under test are acquired and written into memory; the multiple frames of images of the object under test are pre-stored. In response to a second request message sent by the image chain control system, the exposure parameters corresponding to the image of the object under test are obtained and written into the memory; the exposure parameters include voltage and / or current. The preset image parameters of the multi-frame object images are adjusted according to the exposure parameters to obtain the target image parameters, and the target image data is determined according to the target image parameters; the preset image parameters include at least one of the following: signal-to-noise ratio, contrast, edge sharpness, and resolution; The target image data is sent to the image chain control system.

2. The method according to claim 1, characterized in that, The step of determining the target image data based on the target image parameters specifically includes: The target image data corresponding to the target image parameter is searched in the preset image data table, wherein the preset image data table includes multiple preset image parameters and preset image data corresponding to each preset image parameter.

3. The method according to claim 2, characterized in that, Before searching for the target image data corresponding to the target image parameters in the preset image data table, the method further includes: Based on each preset exposure parameter, preset image data corresponding to the preset exposure parameter is obtained; Each preset image parameter is determined according to each preset exposure parameter; Based on the preset image data and the preset image parameters, a preset image data table is established.

4. The method according to claim 1, characterized in that, After acquiring multiple frames of images of the object under test, the method further includes: sending first feedback information to the image chain control system; After acquiring the exposure parameters corresponding to the image of the object under test, the method further includes: sending second feedback information to the image chain control system; wherein, The first request information is a request for permission to simulate emitting radiation; The first feedback information is information that allows the simulation to emit radiation; The second request information is a request to simulate the emission of radiation; The second feedback information is the information indicating that the simulated radiation emission was successful.

5. The method according to claim 1, characterized in that, The acquisition of multiple frames of images of the object under test specifically includes: The arrangement order of the multiple images of the object under test is determined, and the multiple images of the object under test are acquired sequentially according to the arrangement order.

6. The method according to claim 5, characterized in that, Determining the arrangement order of multiple images of the tested objects specifically includes: Establish a numbering rule for multiple images of the object under test; Based on the numbering rules, a number is assigned to multiple images of the tested objects; Based on the numbering, the arrangement order of the multiple images of the tested objects is determined.

7. An image chain simulation device, characterized in that, The device, used in image chain simulation equipment, includes: The detector simulation module is used to acquire multiple frames of images of the object under test in response to the first request information sent by the image chain control system, and write the multiple frames of images of the object under test into memory; the multiple frames of images of the object under test are pre-stored. The radiation simulation module is used to respond to the second request information sent by the image chain control system, acquire the exposure parameters corresponding to the image of the object under test, and write the exposure parameters corresponding to the image of the object under test into the memory; the exposure parameters include voltage and / or current; An image calculation and generation module is used to adjust preset image parameters of the multi-frame test object images according to the exposure parameters to obtain target image parameters, and to determine target image data according to the target image parameters; the preset image parameters include at least one of the following: signal-to-noise ratio, contrast, edge sharpness, and resolution; The output module is used to send the target image data to the image chain control system.

8. An image chain simulation device, characterized in that, The device includes: The detector interface is used to receive the first request information sent by the image chain control system. The high-voltage generator interface is used to receive the second request information sent by the image chain control system; Memory, used to store images of the object being measured; The processor, connected to the detector interface, the high-voltage generator interface, and the memory, is configured to: write multiple frames of images of the object under test into the memory in response to the first request information, wherein the multiple frames of images of the object under test are pre-stored; write exposure parameters corresponding to the images of the object under test into the memory in response to the second request information, wherein the exposure parameters include voltage and / or current; and adjust preset image parameters of the multiple frames of images of the object under test according to the exposure parameters to obtain target image parameters, wherein the preset image parameters include at least one of the following: signal-to-noise ratio, contrast, edge sharpness, and resolution; and after determining target image data according to the target image parameters, send the target image data to the image chain control system.

9. A storage medium having a program or instructions stored thereon, characterized in that, When the program or instructions are executed by the processor, they implement the steps of the method as described in any one of claims 1 to 6.

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