Screening device and screening method for patch tantalum capacitor detection

Abstract

The present application relates to patch tantalum capacitor detection screening device and screening method, the device includes base, four-axis articulated arm, material box, camera group, device turnover device and clamping assembly, device turnover device includes long and short side tooling position, clamping assembly includes respectively with a, b jaw piece connected a, b clamping arm, a jaw piece and b jaw piece structure symmetry and opposite arrangement, a, b jaw piece forms test station between. The method includes steps such as boxing, detecting front-up device, detecting back-up device, detecting long-side-up device and detecting short-side-up device, each detection step includes identification, suction, direct or after adjustment and sending to test station. The present application is simple in structure, convenient in operation, the method of classification screening simplifies the complex situation, so as to realize the rapid detection of large quantities of patch tantalum capacitor, not only greatly improve the work efficiency, also effectively reduce the labor intensity of operating personnel.

Description

Technical Field

[0001] This invention relates to the testing of electronic components, specifically to a sieving device and method for testing surface mount tantalum capacitors. Background Technology

[0002] Tantalum capacitors, also known as tantalum electrolytic capacitors, use tantalum metal as the dielectric. They are characterized by their small size and large capacitance, offering excellent performance in power supply filtering and AC bypass applications. Tantalum capacitors have unidirectional conductivity, meaning they are polarized. When using them, the current should be connected in the positive and negative directions of the power supply, connecting the anode and cathode of the capacitor. Incorrect connection will cause the core to overheat quickly, potentially damaging the oxide film and leading to failure or even explosion, resulting in adverse consequences. On surface-mount tantalum capacitors, the marked end is the anode, and the other end is the cathode.

[0003] Due to the special nature of fields such as aerospace, not only is the demand for surface-mount tantalum capacitors very high, but they also require 100% inspection and screening. Relying solely on manual screening for large quantities of components is clearly insufficient to meet the time requirements, making automated testing an inevitable trend. For tantalum capacitors, the main challenge of automated testing lies in determining the polarity of polarized components and placing them in the correct polarity at the testing station. When a batch of tantalum capacitor components (hereinafter referred to as "components") is randomly placed in a box, six possible states may occur: front side up; back side up; long side left side up; long side right side up; short side marked side up; short side marked side down. The ideal state is front side (i.e., the side with the marking strip) up, considered the standard orientation, where polarity can be determined using only a camera and the component placed in the appropriate station for testing. The other five states are difficult to identify polarity for, making it exceptionally difficult to place the components correctly in the testing station.

[0004] One method involved using a vibrating hopper to flip the components, ensuring the top component was facing forward, then determining its polarity and placing it in the appropriate station. However, this method required repeated vibration of the hopper, resulting in low efficiency and a high risk of components flying out and being lost.

[0005] To address the aforementioned shortcomings of existing technologies, this invention proposes a sieving device and method for testing surface-mount tantalum capacitors. Using this invention, devices in different placement states can be identified and their positions adjusted. Finally, through sieving, the devices are placed into the appropriate testing stations, thereby achieving rapid testing of large batches of surface-mount tantalum capacitors. Summary of the Invention

[0006] The purpose of this invention is to provide a sieving device and method for testing surface-mount tantalum capacitors, which can identify and adjust the positions of devices in different placement states, and finally place the devices into the corresponding testing stations through sieving, thereby realizing the rapid testing of large batches of surface-mount tantalum capacitors.

[0007] To achieve the above objectives, the present invention adopts the following technical solution:

[0008] A sieving device for testing surface-mount tantalum capacitors includes a base, a four-axis articulated arm, a material box, a camera assembly, a device flipping device, and a clamping assembly. The four-axis articulated arm, material box, camera assembly, device flipping device, and clamping assembly are fixed to the base. The camera assembly includes a top-view camera, a bottom-view camera, and a side-view camera. A suction nozzle is provided on the four-axis articulated arm. The device flipping device includes a flipping fixture, which includes a long-side fixture position and a short-side fixture position. Both the long-side and short-side fixture positions are groove-shaped structures. The length and width of the long-side fixture position correspond to the length and thickness of the surface-mount tantalum capacitor, respectively, and the length and width of the short-side fixture position correspond to the width and thickness of the surface-mount tantalum capacitor, respectively. The clamping assembly... The device includes a clamping arm A and a clamping arm B. The ends of clamping arms A and B are connected to claw plates A and B, respectively. Claw plates A and B are symmetrically arranged and face each other. Claw plate A has a first notch and a second notch on its upper and lower surfaces, respectively. Claw plate B has a third notch and a fourth notch on its upper and lower surfaces, respectively. Conductive springs are installed in the first, second, third, and fourth notches. The conductive springs in the first and second notches are connected to the positive terminal of the testing equipment, and the conductive springs in the third and fourth notches are connected to the negative terminal of the testing equipment. A forward testing station is formed between the first and third notches, and a reverse testing station is formed between the second and fourth notches.

[0009] Furthermore, the sieving device for detecting surface-mount tantalum capacitors also includes a computer. The signal output terminals of the top-view camera, bottom-view camera, and side-view camera are respectively connected to the signal input terminals of the computer. The control signal output terminals of the computer are respectively connected to the control signal input terminals of the four-axis articulated arm, the device flipping device, and the clamping assembly.

[0010] Furthermore, the material box is equipped with a vibrator, and the control signal input terminal of the vibrator is connected to the control signal output terminal of the computer.

[0011] Furthermore, the flipping fixture is driven by a motor, and the control signal input terminal of the motor is connected to the control signal output terminal of the computer.

[0012] A method for sieving surface-mount tantalum capacitors using one of the above-mentioned sieving devices includes the following steps:

[0013] S1. Packaging

[0014] The devices to be sorted are randomly poured into the material box;

[0015] S2. Detect the device facing upwards.

[0016] S2.1. The top-view camera takes pictures of the components in the material box;

[0017] S2.2. Analyze the photographs to identify all devices facing upwards;

[0018] S2.3. Select a device with its front facing up, determine its coordinate position, and identify its anode position by marking it;

[0019] S2.4. Based on the coordinate position, move the four-axis articulated arm directly above the selected device;

[0020] S2.5. Suction nozzle action for picking up materials;

[0021] S2.6. Move the nozzle above the bottom-view camera. The bottom-view camera takes a picture of the back of the device and calculates the angle between the length and width of the device and the length and width corresponding to the forward test station. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm so that the length and width of the device are consistent with the length and width corresponding to the forward test station.

[0022] S2.7. Move the nozzle horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test fixture;

[0023] S2.8. The clamping arms A and B move toward each other, bringing the first notch and the third notch together to clamp the workpiece, and then the workpiece is inspected.

[0024] S2.9. Repeat steps S2.3-S2.8 until all front-facing devices identified in step S2.2 have been detected;

[0025] S3. Detect devices with the back side facing up.

[0026] S3.1. The top-view camera takes pictures of the components in the material box;

[0027] S3.2. Analyze the photographs to identify all devices with their backs facing up;

[0028] S3.3. Select a device with its back facing up and determine its coordinate position;

[0029] S3.4. Based on the coordinate position, move the four-axis articulated arm to directly above the selected device;

[0030] S3.5. Suction nozzle action for picking up materials;

[0031] S3.6. Move the nozzle above the bottom-view camera. The bottom-view camera takes a picture of the front of the device and determines its anode position by marking it. At the same time, calculate the angle between the length and width of the device and the length and width corresponding to the forward test position. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm so that the anode position and length and width angle of the device are consistent with the anode position and length and width corresponding to the forward test position.

[0032] S3.7. Move the nozzle horizontally to the corresponding position above the reverse test fixture, and then move it down to place the device into the reverse test fixture;

[0033] S3.8. The clamping arms A and B move toward each other, bringing the second notch and the fourth notch together to clamp the workpiece, and then the workpiece is inspected.

[0034] S3.9. Repeat steps S3.3-S3.8 until all back-side-facing devices identified in step S3.2 have been tested;

[0035] S4. Detect devices with their long side facing upwards.

[0036] S4.1. The top-view camera takes pictures of the components in the material box;

[0037] S4.2. Analyze the photographs to identify all devices with their long sides facing upwards;

[0038] S4.3. Select a device with its long side facing upwards and determine its coordinate position;

[0039] S4.4. Based on the coordinate position, move the four-axis articulated arm directly above the selected device;

[0040] S4.5. Suction nozzle action: suction device;

[0041] S4.6. Move the nozzle to the front of the side-view camera. The side-view camera monitors the device. Adjust the rotation axis of the four-axis articulated arm so that the front of the device faces the side-view camera. Determine the anode position by the markings.

[0042] S4.7. Adjust the rotation axis of the four-axis articulated arm so that the front of the device is aligned with the cross-sectional direction of the flipping fixture;

[0043] S4.8. Move the nozzle above the bottom-view camera, take a picture of the device, calculate the angle between the length and height of the device and the length and width of the long side fixture, and adjust the rotation axis of the four-axis articulated arm to adjust the device angle so that the length and height angle of the device is consistent with the length and width of the long side fixture.

[0044] S4.9. Set the device flipping device to its initial state, move the device above the long side fixture, and release the nozzle to allow the device to fall into the long side fixture.

[0045] S4.10. Rotate the flipping fixture 90° clockwise so that the long side fixture is in the flipped material handling state;

[0046] S4.11. Move the four-axis articulated arm to above the long-side fixture position, and the nozzle picks up the device through the upper surface of the device;

[0047] S4.12. Move the nozzle horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test station;

[0048] S4.13. Arm A and Arm B move toward each other, bringing the first notch and the third notch together to clamp the workpiece, and then the workpiece is inspected.

[0049] S4.14. Repeat steps S4.3-S4.13 until all devices with their long sides facing upwards, as determined in step S4.2, have been detected;

[0050] S5. Detect devices with the short side facing upwards.

[0051] S5.1. The top-view camera takes pictures of the components in the material box;

[0052] S5.2. Analyze the photographs to identify all devices with their short sides facing upwards;

[0053] S5.3. Select a device with its short side facing upwards and determine its coordinate position;

[0054] S5.4. Based on the coordinate position, move the four-axis articulated arm directly above the selected device;

[0055] S5.5. Suction nozzle action suction device;

[0056] S5.6. Move the nozzle to the front of the side-view camera. The side-view camera monitors the device. Adjust the rotation axis of the four-axis articulated arm so that the front of the device faces the side-view camera. Determine the anode position by marking it.

[0057] S5.7. Adjust the rotation axis of the four-axis articulated arm so that the front of the device is aligned with the tangential direction of the device flipping device;

[0058] S5.8. Move the nozzle above the bottom-view camera, take a picture of the device, calculate the angle between the length and height of the device and the length and width of the short side fixture, adjust the rotation axis of the four-axis articulated arm to adjust the device angle so that the length and height angle of the device is consistent with the length and width of the short side fixture.

[0059] S5.9. Set the device flipping device to its initial state, move the device above the short side fixture position, and release the nozzle to allow the device to fall into the short side fixture position;

[0060] S5.10. Rotate the flipping fixture 90° clockwise so that the short side fixture is in the flipped material handling state;

[0061] S5.11. Move the four-axis articulated arm to above the short side fixture position, and the nozzle picks up the device through the upper surface of the device;

[0062] S5.12. Move the nozzle horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test station;

[0063] S5.13. Arm A and Arm B move toward each other, bringing the first notch and the third notch together to clamp the workpiece, and then the workpiece is inspected.

[0064] S5.14. Repeat steps S5.3-S5.13 until all devices with short sides facing up as determined in step S4.2 have been detected;

[0065] S6. Repeat steps S2-S5 until all components in the material box have been tested.

[0066] This invention has a simple structure and is easy to operate. It simplifies complex situations by classifying and screening, thereby enabling rapid testing of large batches of chip tantalum capacitors. This not only greatly improves work efficiency but also effectively reduces the labor intensity of operators. Attached Figure Description

[0067] Figure 1 This is a schematic diagram of the sieving device of the present invention;

[0068] Figure 2 This is a schematic diagram of the initial state of the device flipping device of the present invention;

[0069] Figure 3 for Figure 2 A magnified view of a portion of the image;

[0070] Figure 4 This is a schematic diagram of the material handling state of the device flipping device of the present invention;

[0071] Figure 5 for Figure 4 A magnified view of a portion of the image;

[0072] Figure 6 This is a schematic diagram of the clamping component structure of the present invention;

[0073] Figure 7 for Figure 6 A magnified view of a portion of the image;

[0074] Figure 8 for Figure 7 A schematic diagram of the bottom structure.

[0075] In the diagram: 1-Base; 2-Four-axis articulated arm; 2.1-Suction nozzle; 3-Material box; 4-Camera assembly; 4.1-Top-view camera; 4.2-Bottom-view camera; 4.3-Side-view camera; 5-Component flipping device; 5.1-Flipping fixture; 5.1.1-Long side fixture; 5.1.2-Short side fixture; 5.2-Motor; 6-Clamping assembly; 6.1-Clamping arm A; 6.2-Clamping arm B; 7-Claw A; 7.1-First notch; 7.2-Second notch; 8-Claw B; 8.1-Third notch; 8.2-Fourth notch; 9-Computer; 10-Vibrator. Detailed Implementation

[0076] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments, but these embodiments should not be construed as limiting the present invention.

[0077] The sieving device for testing surface-mount tantalum capacitors, as shown in the figure, includes a base 1, a four-axis articulated arm 2, a material box 3, a camera assembly 4, a device flipping device 5, and a clamping assembly 6. The four-axis articulated arm 2, material box 3, camera assembly 4, device flipping device 5, and clamping assembly 6 are fixed on the base 1. The camera assembly 4 includes a top-view camera 4.1, a bottom-view camera 4.2, and a side-view camera 4.3. A suction nozzle 2.1 is provided on the four-axis articulated arm 2. The device flipping device 5 includes a flipping fixture 5.1, which includes a long-side fixture position 5.1.1 and a short-side fixture position 5.1.2. Both the long-side fixture position 5.1.1 and the short-side fixture position 5.1.2 are groove-shaped structures. The length and width of the long-side fixture position 5.1.1 correspond to the length and thickness of the surface-mount tantalum capacitor, respectively, and the length and width of the short-side fixture position 5.1.2 correspond to the width and thickness of the surface-mount tantalum capacitor, respectively. The clamping assembly 6... The device includes a clamping arm 6.1 (A) and a clamping arm 6.2 (B). The ends of clamping arms 6.1 and 6.2 are connected to claw plates 7 (A) and 8 (B) respectively. Claw plates 7 and 8 are symmetrically arranged and face each other. Claw plate 7 has a first notch 7.1 and a second notch 7.2 on its upper and lower surfaces, respectively. Claw plate 8 has a third notch 8.1 and a fourth notch 8.2 on its upper and lower surfaces, respectively. Conductive springs are installed in the first notch 7.1, the second notch 7.2, the third notch 8.1, and the fourth notch 8.2. The conductive springs in the first notch 7.1 and the second notch 7.2 are connected to the positive terminal of the testing equipment, and the conductive springs in the third notch 8.1 and the fourth notch 8.2 are connected to the negative terminal of the testing equipment. A forward testing station is formed between the first notch 7.1 and the third notch 8.1, and a reverse testing station is formed between the second notch 7.2 and the fourth notch 8.2.

[0078] A preferred embodiment is as follows: In the above solution, a computer 9 is also included. The signal output terminals of the top-view camera 4.1, the bottom-view camera 4.2, and the side-view camera 4.3 are respectively connected to the signal input terminals of the computer 9. The control signal output terminals of the computer 9 are respectively connected to the control signal input terminals of the four-axis articulated arm 2, the device flipping device 5, and the clamping assembly 6.

[0079] A preferred embodiment is as follows: In the above scheme, the material box 3 is provided with a vibrator 10, and the control signal input terminal of the vibrator 10 is connected to the control signal output terminal of the computer 9.

[0080] A preferred embodiment is as follows: In the above scheme, the flipping fixture 5.1 is driven by a motor 5.2, and the control signal input terminal of the motor 5.2 is connected to the control signal output terminal of the computer 9.

[0081] A method for sieving surface-mount tantalum capacitors using one of the above-mentioned sieving devices includes the following steps:

[0082] S1. Packaging

[0083] The devices to be sorted are randomly poured into material box 3;

[0084] S2. Detect the device facing upwards.

[0085] S2.1. Top-view camera 4.1 takes pictures of the components in box 3;

[0086] S2.2. Analyze the photographs to identify all devices facing upwards;

[0087] S2.3. Select a device with its front facing up, determine its coordinate position, and identify its anode position by marking it;

[0088] S2.4. Based on the coordinate position, move the four-axis articulated arm 2 to directly above the selected device;

[0089] S2.5. Suction Nozzle 2.1 Motion Suction Device;

[0090] S2.6. Move the nozzle 2.1 above the bottom-view camera 4.2. The bottom-view camera 4.2 takes a picture of the back of the device and calculates the angle between the length and width of the device and the length and width corresponding to the forward test station. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm 2 so that the length and width of the device are consistent with the length and width corresponding to the forward test station.

[0091] S2.7. Move the nozzle 2.1 horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test fixture;

[0092] S2.8. Clamping arm 6.1 and clamping arm 6.2 move toward each other, so that the first notch 7.1 and the third notch 8.1 come together to clamp the workpiece, and then the workpiece is inspected;

[0093] S2.9. Repeat steps S2.3-S2.8 until all front-facing devices identified in step S2.2 have been detected;

[0094] S3. Detect devices with the back side facing up.

[0095] S3.1. Top-view camera 4.1 takes pictures of the components in box 3;

[0096] S3.2. Analyze the photographs to identify all devices with their backs facing up;

[0097] S3.3. Select a device with its back facing up and determine its coordinate position;

[0098] S3.4. Based on the coordinate position, move the four-axis articulated arm 2 to directly above the selected device;

[0099] S3.5. Suction Nozzle 2.1 Motion Suction Device;

[0100] S3.6. Move the nozzle 2.1 above the bottom-view camera 4.2. The bottom-view camera 4.2 takes a picture of the front of the device and determines its anode position by marking it. At the same time, calculate the angle between the length and width of the device and the length and width corresponding to the forward test position. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm 2 so that the anode position and length and width angle of the device are consistent with the anode position and length and width corresponding to the forward test position.

[0101] S3.7. Move the nozzle 2.1 to the corresponding position above the reverse test fixture, and then move it down to place the device into the reverse test fixture;

[0102] S3.8. Clamping arm 6.1 and clamping arm 6.2 move toward each other, so that the second notch 7.2 and the fourth notch 8.2 come together to clamp the workpiece, and then the workpiece is inspected;

[0103] S3.9. Repeat steps S3.3-S3.8 until all back-side-facing devices identified in step S3.2 have been tested;

[0104] S4. Detect devices with their long side facing upwards.

[0105] S4.1. Top-view camera 4.1 takes pictures of the components in the material box 3;

[0106] S4.2. Analyze the photographs to identify all devices with their long sides facing upwards;

[0107] S4.3. Select a device with its long side facing upwards and determine its coordinate position;

[0108] S4.4. Based on the coordinate position, move the four-axis articulated arm 2 to directly above the selected device;

[0109] S4.5. Suction Nozzle 2.1 Motion Suction Device;

[0110] S4.6. Move the nozzle 2.1 in front of the side-view camera 4.3. The side-view camera 4.3 monitors the device. Adjust the rotation axis of the four-axis articulated arm 2 so that the front of the device faces the side-view camera 4.3. Determine its anode position by marking.

[0111] S4.7. Adjust the rotation axis of the four-axis articulated arm 2 so that the front of the device is aligned with the cross-sectional direction of the flipping fixture 5.1;

[0112] S4.8. Move the nozzle 2.1 above the bottom-view camera 4.1. The bottom-view camera 4.1 takes a picture of the device and calculates the angle between the length and height of the device and the length and width of the long side fixture 5.1.1. Adjust the rotation axis of the four-axis articulated arm 2 to adjust the angle of the device so that the length and height angle of the device is consistent with the length and width of the long side fixture 5.1.1.

[0113] S4.9. Set the device flipping device 5 to its initial state, move the device above the long side fixture position 5.1.1, and release the nozzle 2.1 to allow the device to fall into the long side fixture position 5.1.1;

[0114] S4.10. Rotate the flipping fixture 5.1 clockwise by 90° so that the long side fixture position 5.1.1 is in the flipped material handling state;

[0115] S4.11. Move the four-axis articulated arm 2 to above the long side fixture position 5.1.1, and the nozzle 2.1 picks up the device through the upper surface of the device;

[0116] S4.12. Move the nozzle 2.1 horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test station;

[0117] S4.13. Clamping arm 6.1 and clamping arm 6.2 move toward each other, so that the first notch 7.1 and the third notch 8.1 come together to clamp the workpiece, and then the workpiece is inspected;

[0118] S4.14. Repeat steps S4.3-S4.13 until all devices with their long sides facing upwards, as determined in step S4.2, have been detected;

[0119] S5. Detect devices with the short side facing upwards.

[0120] S5.1. Top-view camera 4.1 takes pictures of the components in box 3;

[0121] S5.2. Analyze the photographs to identify all devices with their short sides facing upwards;

[0122] S5.3. Select a device with its short side facing upwards and determine its coordinate position;

[0123] S5.4. Based on the coordinate position, move the four-axis articulated arm 2 to directly above the selected device;

[0124] S5.5. Suction Nozzle 2.1 Motion Suction Device;

[0125] S5.6. Move the nozzle 2.1 in front of the side-view camera 4.3. The side-view camera 4.3 monitors the device. Adjust the rotation axis of the four-axis articulated arm 2 so that the front of the device faces the side-view camera 4.3. Determine its anode position by marking.

[0126] S5.7. Adjust the rotation axis of the four-axis articulated arm 2 so that the front of the device is aligned with the tangential direction of the device flipping device 5;

[0127] S5.8. Move the nozzle 2.1 above the bottom-view camera 4.2. The bottom-view camera 4.2 takes a picture of the device and calculates the angle between the length and height of the device and the length and width corresponding to the short side fixture position 5.1.2. Adjust the rotation axis of the four-axis articulated arm 2 to adjust the device angle so that the length and height angle of the device is consistent with the length and width corresponding to the short side fixture position 5.1.2.

[0128] S5.9. Set the device flipping device 5 to its initial state, move the device above the short side fixture position 5.1.2, and release the nozzle 2.1 to allow the device to fall into the short side fixture position 5.1.2;

[0129] S5.10. Rotate the flipping fixture 5.1 clockwise by 90° so that the short side fixture position 5.1.2 is in the flipped material handling state;

[0130] S5.11. Move the four-axis articulated arm 2 to above the short side fixture position 5.1.2, and the nozzle 2.1 picks up the device through the upper surface of the device;

[0131] S5.12. Move the nozzle 2.1 horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test station;

[0132] S5.13. Clamping arm A 6.1 and clamping arm B 6.2 move toward each other, so that the first notch 7.1 and the third notch 8.1 come together to clamp the workpiece, and then the workpiece is inspected;

[0133] S5.14. Repeat steps S5.3-S5.13 until all devices with short sides facing up as determined in step S4.2 have been detected;

[0134] S6. Repeat steps S2-S5 until all components in the material box 3 have been tested.

[0135] Example 1

[0136] (a) Sorting devices:

[0137] Model: 293D107X9010A2W;

[0138] External dimensions: (3.2±0.2)mm*(1.6±0.2)mm*1.6±0.2)mm;

[0139] Quantity: 300.

[0140] (ii) Screening device: including computer 9, vibrator 10 and motor 5.2.

[0141] (III) Screening process:

[0142] 1. Pour the device under test into the material box 3;

[0143] 2. Test the computer's startup program;

[0144] 3. The top-view camera 4.1 takes pictures of the components in the material box 3;

[0145] 4. Analyze the photos to identify all devices with clear polarity markings on the front. After analysis, 240 devices were found to be facing up, and 220 devices had clearly defined polarity. Determine their coordinate positions.

[0146] 5. Based on the coordinate position, select one of the devices with a clear polarity, and move the four-axis articulated arm 2 directly above the selected device;

[0147] 6. Suction Nozzle 2.1 Action: Suction device;

[0148] 7. Move the nozzle 2.1 above the bottom-view camera 4.2. The bottom-view camera 4.2 takes a picture of the back of the device and calculates the angle between the length and width of the device and the length and width corresponding to the forward test position. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm 2 so that the length and width of the device are consistent with the length and width corresponding to the forward test position.

[0149] 8. Move the nozzle 2.1 horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test fixture;

[0150] 9. Clamping arm A 6.1 and clamping arm B 6.2 move toward each other, bringing the first notch 7.1 and the third notch 8.1 together to clamp the workpiece, and then the workpiece is inspected;

[0151] 10. Repeat steps 5-9 until all 220 face-up devices have been tested;

[0152] 11. The top-view camera takes new photos of the components in the material box;

[0153] 12. Analyze the photographs to determine that there is only one device with the short side facing upwards;

[0154] 13. Determine its coordinates;

[0155] 14. Based on the coordinate position, move the four-axis articulated arm directly above the selected device;

[0156] 15. The suction nozzle acts as a suction device;

[0157] 16. Move the nozzle to the front of the side-view camera. The side-view camera monitors the device. Adjust the rotation axis of the four-axis articulated arm so that the front of the device faces the side-view camera. Determine the anode position by the markings.

[0158] 17. Adjust the rotation axis of the four-axis articulated arm so that the front of the device is aligned with the tangential direction of the device flipping device;

[0159] 18. Move the nozzle above the bottom-view camera. The bottom-view camera takes a picture of the device and calculates the angle between the length and height of the device and the length and width of the short side fixture. Adjust the rotation axis of the four-axis articulated arm to adjust the device angle so that the length and height angle of the device is consistent with the length and width of the short side fixture.

[0160] 19. Set the device flipping device to its initial state, move the device above the short side fixture, and release the nozzle to allow the device to fall into the short side fixture.

[0161] 20. Rotate the flipping fixture 90° clockwise so that the short side fixture is in the flipped material handling position;

[0162] 21. Move the four-axis articulated arm to above the short side fixture position, and the nozzle picks up the device through the upper surface of the device;

[0163] 22. Move the nozzle horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test station;

[0164] 23. Arm A and Arm B move toward each other, bringing the first notch and the third notch together to clamp the workpiece, and then the workpiece is inspected;

[0165] 24. Start the vibrator 10 to redistribute the components in the material box 3;

[0166] 25. Repeat steps 3-4 to confirm that there are 29 devices with their faces up, and their polarity markings are all clearly identifiable;

[0167] 26. Repeat steps 5-9 until all 29 devices facing upwards have been tested;

[0168] 27. Activate the vibrator 10 to redistribute the components in the material box 3;

[0169] 28. The top-view camera 4.1 takes pictures of the components in the material box 3;

[0170] 29. Analysis of the photograph revealed no components facing upwards.

[0171] 30. Identify all devices with their backs facing up, a total of 40 devices;

[0172] 31. Select a device with its back facing up and determine its coordinate position;

[0173] 32. Based on the coordinate position, move the four-axis articulated arm 2 to directly above the selected device;

[0174] 33. Suction Nozzle 2.1 Action Suction Device;

[0175] 34. Move the nozzle 2.1 above the bottom-view camera 4.2. The bottom-view camera 4.2 takes a picture of the front of the device and determines its anode position by marking it. At the same time, calculate the angle between the length and width of the device and the length and width corresponding to the forward test position. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm 2 so that the anode position and length and width angle of the device are consistent with the anode position and length and width corresponding to the forward test position.

[0176] 35. Move the nozzle 2.1 horizontally to the corresponding position above the reverse test fixture, and then move it down to place the device into the reverse test fixture;

[0177] 36. Clamping arm A 6.1 and clamping arm B 6.2 move toward each other, bringing the second notch 7.2 and the fourth notch 8.2 together to clamp the workpiece, and then the workpiece is inspected;

[0178] 37. Repeat steps 31-36 until all devices with their backs facing up have been detected;

[0179] 38. Start the vibrator 10 to redistribute the components in the material box 3;

[0180] 39. Top-view camera 4.1 takes pictures of the components in box 3;

[0181] 40. Analysis of the photographs revealed that all 10 items had their long sides facing upwards.

[0182] 41. Select a device with its long side facing upwards and determine its coordinate position;

[0183] 42. Based on the coordinate position, move the four-axis articulated arm 2 to directly above the selected device;

[0184] 43. Suction Nozzle 2.1 Action Suction Device;

[0185] 44. Move the nozzle 2.1 in front of the side-view camera 4.3. The side-view camera 4.3 monitors the device. Adjust the rotation axis of the four-axis articulated arm 2 so that the front of the device faces the side-view camera 4.3. Determine the anode position by marking it.

[0186] 45. Adjust the rotation axis of the four-axis articulated arm 2 so that the front of the device is aligned with the cross-sectional direction of the flipping fixture 5.1;

[0187] 46. ​​Move the suction nozzle 2.1 above the bottom-view camera 4.1. The bottom-view camera 4.1 takes a picture of the device and calculates the angle between the length and height of the device and the length and width of the long side fixture 5.1.1. Adjust the rotation axis of the four-axis articulated arm 2 to adjust the angle of the device so that the length and height angle of the device is consistent with the length and width of the long side fixture 5.1.1.

[0188] 47. Set the device flipping device 5 to its initial state, move the device above the long side fixture 5.1.1, and release the nozzle 2.1 to allow the device to fall into the long side fixture 5.1.1;

[0189] 48. Rotate the flipping fixture 5.1 clockwise by 90° so that the long side fixture position 5.1.1 is in the flipped material handling state;

[0190] 49. Move the four-axis articulated arm 2 to above the long-side fixture position 5.1.1, and the nozzle 2.1 picks up the device through the upper surface of the device;

[0191] 50. Move the nozzle 2.1 horizontally to the corresponding position above the forward test station, and then move it down to place the device into the forward test station;

[0192] 51. Clamping arm A 6.1 and clamping arm B 6.2 move toward each other, bringing the first notch 7.1 and the third notch 8.1 together to clamp the workpiece, and then the workpiece is inspected;

[0193] 52. Repeat steps 41-51 until the long-side-up device has been detected;

[0194] 53. All 300 devices have been screened.

[0195] The contents not described in detail in this specification are existing technologies known to those skilled in the art.

Claims

1. A sieving device for detecting surface-mount tantalum capacitors, comprising a base (1), a four-axis articulated arm (2), a material box (3), a camera assembly (4), a device flipping device (5), and a clamping assembly (6), characterized in that: The four-axis articulated arm (2), the material box (3), the camera group (4), the device flipping device (5), and the clamping assembly (6) are fixed on the base (1). The camera group (4) includes a top-view camera (4.1), a bottom-view camera (4.2), and a side-view camera (4.3). The four-axis articulated arm (2) is equipped with a suction nozzle (2.1). The device flipping device (5) includes a flipping fixture (5.1), which includes a long-side fixture position (5.1). .1) and the short side fixture (5.1.2), the long side fixture (5.1.1) and the short side fixture (5.1.2) are both groove structures. The length and width of the long side fixture (5.1.1) correspond to the length and thickness of the surface mount tantalum capacitor, respectively. The length and width of the short side fixture (5.1.2) correspond to the width and thickness of the surface mount tantalum capacitor, respectively. The clamping assembly (6) includes clamping arm A (6.1) and clamping arm B (6.2). The ends of (6.2) are connected to claw A (7) and claw B (8) respectively. Claw A (7) and claw B (8) are symmetrical in structure and arranged facing each other. Claw A (7) has a first notch (7.1) and a second notch (7.2) on its upper and lower surfaces respectively. Claw B (8) has a third notch (8.1) and a fourth notch (8.2) on its upper and lower surfaces respectively. The first notch (7.1), the second notch (7.2), and the third notch (8.1) are connected to claw A (7) and claw B (8) respectively. Conductive springs are respectively provided in the first and second openings (7.1 and 7.2); the conductive springs in the first and second openings (7.2) are connected to the positive terminal of the test equipment, and the conductive springs in the third and fourth openings (8.1 and 8.2) are connected to the negative terminal of the test equipment. A positive test station is formed between the first and third openings (7.1 and 8.1), and a reverse test station is formed between the second and fourth openings (7.2 and 8.2).

2. The sieving device for detecting surface mount tantalum capacitors according to claim 1, characterized in that: It also includes a computer (9), and the signal output terminals of the top-view camera (4.1), bottom-view camera (4.2) and side-view camera (4.3) are respectively connected to the signal input terminals of the computer (9). The control signal output terminals of the computer (9) are respectively connected to the control signal input terminals of the four-axis articulated arm (2), the device flipping device (5) and the clamping assembly (6).

3. The sieving device for detecting surface-mount tantalum capacitors according to claim 1 or 2, characterized in that: The material box (3) is equipped with a vibrator (10), and the control signal input terminal of the vibrator (10) is connected to the control signal output terminal of the computer (9).

4. The sieving device for detecting surface mount tantalum capacitors according to claim 1 or 2, characterized in that: The flipping fixture (5.1) is driven by a motor (5.2), and the control signal input terminal of the motor (5.2) is connected to the control signal output terminal of the computer (9).

5. The sieving device for detecting surface mount tantalum capacitors according to claim 3, characterized in that: The flipping fixture (5.1) is driven by a motor (5.2), and the control signal input terminal of the motor (5.2) is connected to the control signal output terminal of the computer (9).

6. A method for sieving surface-mount tantalum capacitors using the sieving device according to any one of claims 1-5, comprising the following steps: S1. Packaging The devices to be sorted are randomly poured into the material box (3); S2. Detect the device facing upwards. S2.

1. The top-view camera (4.1) takes pictures of the components in the material box (3); S2.

2. Analyze the photographs to identify all devices facing upwards; S2.

3. Select a device with its front facing up, determine its coordinate position, and identify its anode position by marking it; S2.

4. Based on the coordinate position, move the four-axis articulated arm (2) directly above the selected device; S2.

5. Suction nozzle (2.1) Actuating suction device; S2.

6. Move the nozzle (2.1) above the bottom-view camera (4.2). The bottom-view camera (4.2) takes a picture of the back of the device and calculates the angle between the length and width of the device and the length and width corresponding to the forward test station. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm (2) so that the length and width of the device are consistent with the length and width corresponding to the forward test station. S2.

7. Move the nozzle (2.1) to the corresponding position above the forward test station, and then move it down to place the device into the forward test fixture. S2.

8. Clamping arm A (6.1) and clamping arm B (6.2) move toward each other, so that the first notch (7.1) and the third notch (8.1) come together to clamp the workpiece, and then the workpiece is inspected; S2.

9. Repeat steps S2.3-S2.8 until all front-facing devices identified in step S2.2 have been detected; S3. Detect devices with the back side facing up. S3.

1. The top-view camera (4.1) takes pictures of the components in the material box (3); S3.

2. Analyze the photographs to identify all devices with their backs facing up; S3.

3. Select a device with its back facing up and determine its coordinate position; S3.

4. Based on the coordinate position, move the four-axis articulated arm (2) directly above the selected device; S3.

5. Suction nozzle (2.1) Actuating suction device; S3.

6. Move the nozzle (2.1) above the bottom-view camera (4.2). The bottom-view camera (4.2) takes a picture of the front of the device and determines its anode position by marking it. At the same time, calculate the angle between the length and width of the device and the length and width corresponding to the forward test station. Adjust the device angle by rotating the rotation axis of the four-axis articulated arm (2) so that the anode position and length and width angle of the device are consistent with the anode position and length and width corresponding to the forward test station. S3.

7. Move the nozzle (2.1) to the corresponding position above the reverse test fixture, and then move it down to place the device into the reverse test fixture; S3.

8. Clamping arm A (6.1) and clamping arm B (6.2) move toward each other, so that the second notch (7.2) and the fourth notch (8.2) come together to clamp the workpiece, and then the workpiece is inspected; S3.

9. Repeat steps S3.3-S3.8 until all back-side-facing devices identified in step S3.2 have been tested; S4. Detect devices with their long side facing upwards. S4.

1. The top-view camera (4.1) takes pictures of the components in the material box (3); S4.

2. Analyze the photographs to identify all devices with their long sides facing upwards; S4.

3. Select a device with its long side facing upwards and determine its coordinate position; S4.

4. Based on the coordinate position, move the four-axis articulated arm (2) directly above the selected device; S4.

5. Suction nozzle (2.1) Actuating suction device; S4.

6. Move the nozzle (2.1) in front of the side-view camera (4.3). The side-view camera (4.3) monitors the device. Adjust the rotation axis of the four-axis articulated arm (2) so that the front of the device faces the side-view camera (4.3). Determine the anode position by marking. S4.

7. Adjust the rotation axis of the four-axis articulated arm (2) so that the front of the device is aligned with the cross-sectional direction of the flipping fixture (5.1); S4.

8. Move the nozzle (2.1) above the bottom-view camera (4.1), take a picture of the device, calculate the angle between the length and height of the device and the length and width of the long side fixture (5.1.1), adjust the rotation axis of the four-axis articulated arm (2) to adjust the device angle so that the length and height angle of the device is consistent with the length and width of the long side fixture (5.1.1); S4.

9. Set the device flipping device (5) to its initial state, move the device above the long side fixture (5.1.1), and release the nozzle (2.1) to allow the device to fall into the long side fixture (5.1.1); S4.

10. Rotate the flipping fixture (5.1) 90° clockwise so that the long side fixture position (5.1.1) is in the flipped material handling state; S4.

11. Move the four-axis articulated arm (2) above the long side fixture (5.1.1) and the nozzle (2.1) picks up the device through the upper surface of the device; S4.

12. Move the nozzle (2.1) to the corresponding position above the forward test station, and then move it down to place the device into the forward test station; S4.

13. Clamping arm A (6.1) and clamping arm B (6.2) move toward each other, so that the first notch (7.1) and the third notch (8.1) come together to clamp the workpiece, and then the workpiece is inspected; S4.

14. Repeat steps S4.3-S4.13 until all devices with their long sides facing upwards, as determined in step S4.2, have been detected; S5. Detect devices with the short side facing upwards. S5.

1. The top-view camera (4.1) takes pictures of the components in the material box (3); S5.

2. Analyze the photographs to identify all devices with their short sides facing upwards; S5.

3. Select a device with its short side facing upwards and determine its coordinate position; S5.

4. Based on the coordinate position, move the four-axis articulated arm (2) directly above the selected device; S5.

5. Suction nozzle (2.1) Actuating suction device; S5.

6. Move the nozzle (2.1) in front of the side-view camera (4.3). The side-view camera (4.3) monitors the device. Adjust the rotation axis of the four-axis articulated arm (2) so that the front of the device faces the side-view camera (4.3). Determine its anode position by marking. S5.

7. Adjust the rotation axis of the four-axis articulated arm (2) so that the front of the device is aligned with the tangential direction of the device flipping device (5); S5.

8. Move the nozzle (2.1) above the bottom-view camera (4.2), take a picture of the device, calculate the angle between the length and height of the device and the length and width of the short side fixture (5.1.2), adjust the rotation axis of the four-axis articulated arm (2) to adjust the device angle so that the length and height angle of the device is consistent with the length and width of the short side fixture (5.1.2); S5.

9. Set the device flipping device (5) to its initial state, move the device above the short side fixture position (5.1.2), and release the nozzle (2.1) to allow the device to fall into the short side fixture position (5.1.2); S5.

10. Rotate the flipping fixture (5.1) 90° clockwise so that the short side fixture position (5.1.2) is in the flipped material handling state; S5.

11. Move the four-axis articulated arm (2) above the short side fixture (5.1.2) and the nozzle (2.1) picks up the device through the upper surface of the device; S5.

12. Move the nozzle (2.1) to the corresponding position above the forward test station, and then move it down to place the device into the forward test station; S5.

13. Clamping arm A (6.1) and clamping arm B (6.2) move toward each other, so that the first notch (7.1) and the third notch (8.1) come together to clamp the workpiece, and then the workpiece is inspected; S5.

14. Repeat steps S5.3-S5.13 until all devices with short sides facing up as determined in step S4.2 have been detected; S6. Repeat steps S2-S5 until all devices in the material box (3) have been tested.

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