A method, device, and storage medium for measuring an off-angle of a diamond

Abstract

The application discloses a method, device and equipment for measuring the off-angle of a diamond, and a storage medium. The method comprises the following steps: initializing an X-ray diffractometer, measuring the thickness of a diamond sample by using the initialized X-ray diffractometer, obtaining the thickness value of the diamond sample, obtaining an initial omega value and an initial 2theta value of the diamond sample, and finally measuring the off-angle of the diamond sample by using the initialized X-ray diffractometer according to the thickness value, the initial omega value and the initial 2theta value of the diamond sample, and obtaining a target omega value and a target 2theta value of the diamond sample. The method can measure the off-angle of the diamond sample, and the off-angle can be used for cutting and processing the diamond sample in the product production of the diamond sample in the later stage, so that the yield of diamond series products can be effectively improved, and the production efficiency of the production process is improved.

Description

Technical Field

[0001] This application relates to the field of X-ray diffraction testing technology, specifically to a method, apparatus, device, and storage medium for measuring the deflection angle of diamond. Background Technology

[0002] Diamond, also known as "diamond," is a mineral composed of carbon and is the hardest naturally occurring substance in nature. Diamond has a wide range of uses, including in handicrafts, industrial cutting tools, and is also a precious gemstone.

[0003] However, diamonds often have an angle during growth. Using diamonds without angle treatment directly in product manufacturing will result in a very low product yield and is not conducive to the production efficiency of the manufacturing process. Therefore, it is necessary to measure the angle of the diamond in order to perform angle treatment. Summary of the Invention

[0004] In view of this, this application provides a method, apparatus, device and storage medium for measuring the deflection angle of diamond, which solves the problem that diamonds often have deflection angles during the growth process. Using diamonds without deflection angle treatment directly for product production results in a very low product yield and is detrimental to the production efficiency of the production process.

[0005] To achieve the above objectives, the following solution is proposed:

[0006] Firstly, a method for measuring the deflection angle of diamond, comprising:

[0007] Initialize the pre-acquired X-ray diffractometer;

[0008] The thickness of a pre-acquired diamond sample is measured using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measuring stage of the X-ray diffractometer.

[0009] Obtain the initial omega value and initial 2θ value of the diamond sample;

[0010] Based on the thickness, initial omega value, and initial 2θ value of the diamond sample, the deflection angle of the diamond sample is measured using an initialized X-ray diffractometer to obtain the target omega value and target 2θ value of the diamond sample.

[0011] Preferably, the initialization of the pre-acquired X-ray diffractometer includes:

[0012] The scanning range, detector window, operating voltage, operating current, and attenuation value of the X-ray diffractometer are initialized.

[0013] Preferably, the step of measuring the deflection angle of the diamond sample using an initialized X-ray diffractometer based on the thickness value, initial omega value, and initial 2θ value of the diamond sample to obtain the target omega value and target 2θ value of the diamond sample includes:

[0014] Based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, the first rocking curve scanning range and first step of the X-ray diffractometer are set;

[0015] Using the initialized X-ray diffractometer, the diamond sample is scanned according to the first Rocking curve scanning range and the first step to obtain the first omega value and the first 2θ value;

[0016] The diamond sample is subjected to a first angle correction based on the first omega value and the first 2θ value;

[0017] Using the initialized X-ray diffractometer, the diamond sample after the first angle correction is scanned according to the first Rocking curve scanning range and the first step, to obtain the second omega value and the second 2θ value.

[0018] The diamond sample after the first angle correction is then corrected based on the second omega value and the second 2θ value.

[0019] Based on the second omega value and the second 2θ value, set the second Rocking curve scanning range and the second step;

[0020] Using the initialized X-ray diffractometer, the diamond sample after the second angle correction is scanned according to the second Rocking curve scanning range and the second step to obtain the third omega value and the third 2θ value.

[0021] Determine whether the third omega value and the third 2θ value meet the preset conditions;

[0022] If the third omega value and the third 2θ value satisfy the preset conditions, then the third omega value is taken as the target omega value, and the third 2θ value is taken as the target 2θ value.

[0023] Preferably, it further includes:

[0024] If the third omega value and the third 2θ value do not meet the preset conditions, then the X-ray diffractometer is subjected to triaxial crystal adjustment;

[0025] Based on the third omega value and the third 2θ value, the third rocking curve scanning range and the third step size are set;

[0026] Using a triaxial crystal-adjusted X-ray diffractometer, the diamond sample after the second angle correction was scanned according to the third Rocking curve scanning range and the third step to obtain the fourth omega value and the fourth 2θ value.

[0027] Based on the fourth omega value and the fourth 2θ value, set the 2θ-omega scanning range and the fourth step;

[0028] Using the triaxially adjusted X-ray diffractometer, the diamond sample was scanned according to the 2θ-omega scanning range and the fourth step to obtain the target omega value and the target 2θ value.

[0029] Preferably, the pre-obtained diamond sample has a length of 5 mm and a width of 5 mm.

[0030] Preferably, the X-ray diffractometer is a Bruker instrument, model D8Discover.

[0031] Secondly, a diamond deflection angle measuring device includes:

[0032] The initialization module is used to initialize the pre-acquired X-ray diffractometer.

[0033] A thickness measurement module is used to measure the thickness of a pre-acquired diamond sample using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measurement stage of the X-ray diffractometer.

[0034] The acquisition module is used to acquire the initial omega value and the initial 2θ value of the diamond sample;

[0035] The deflection angle measurement module is used to measure the deflection angle of the diamond sample using an initialized X-ray diffractometer based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, so as to obtain the target omega value and target 2θ value of the diamond sample.

[0036] Preferably, the deflection angle measurement module includes:

[0037] The first setting module is used to set the first rocking curve scanning range and the first step of the X-ray diffractometer based on the thickness value, initial omega value and initial 2θ value of the diamond sample.

[0038] The first scanning module is used to scan the diamond sample using an initialized X-ray diffractometer according to the first Rocking curve scanning range and the first step, to obtain the first omega value and the first 2θ value.

[0039] The first angle correction module is used to perform a first angle correction on the diamond sample based on the first omega value and the first 2θ value;

[0040] The second scanning module is used to scan the diamond sample after the first angle correction using the initialized X-ray diffractometer, according to the first Rocking curve scanning range and the first step, to obtain the second omega value and the second 2θ value.

[0041] The second angle correction module is used to perform a second angle correction on the diamond sample after the first angle correction based on the second omega value and the second 2θ value.

[0042] The second setting module is used to set the second rocking curve scanning range and the second step based on the second omega value and the second 2θ value;

[0043] The third scanning module is used to scan the diamond sample after the second angle correction using the initialized X-ray diffractometer according to the second Rocking curve scanning range and the second step, so as to obtain the third omega value and the third 2θ value.

[0044] The judgment module is used to determine whether the third omega value and the third 2θ value meet preset conditions;

[0045] The assignment module is used to assign the third omega value as the target omega value and the third 2θ value as the target 2θ value when the third omega value and the third 2θ value satisfy the preset conditions.

[0046] Thirdly, a diamond deflection angle measuring device, including a memory and a processor;

[0047] The memory is used to store programs;

[0048] The processor is configured to execute the program to implement the various steps of the diamond deflection angle measurement method as described in the first aspect.

[0049] Fourthly, a storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the diamond deflection angle measurement method as described in the first aspect.

[0050] As can be seen from the above technical solution, this application initializes a pre-acquired X-ray diffractometer and uses the initialized X-ray diffractometer to measure the thickness of a pre-acquired diamond sample, obtaining the thickness value of the diamond sample. The diamond sample is placed on the measuring stage of the X-ray diffractometer. Additionally, the initial omega value and initial 2θ value of the diamond sample are obtained. Finally, based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, the initialized X-ray diffractometer is used to measure the deflection angle of the diamond sample, obtaining the target omega value and target 2θ value. This solution uses the initialized X-ray diffractometer to measure the deflection angle of the diamond sample placed on the measuring stage, based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, thereby measuring the deflection angle of the diamond sample. This facilitates the cutting and processing of the diamond sample during subsequent product manufacturing, effectively improving the yield of diamond series products and benefiting the production efficiency of the manufacturing process. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0052] Figure 1 An optional flowchart of a diamond deflection angle measurement method provided in an embodiment of this application;

[0053] Figure 2 A schematic diagram illustrating the relationship between incident light intensity and the lifting height of the measuring stage, provided for an embodiment of this application.

[0054] Figure 3 A schematic diagram illustrating the relationship between incident light intensity and the scanning range of the Rocking curve, provided for an embodiment of this application.

[0055] Figure 4 A parameter diagram of a diamond sample provided in an embodiment of this application;

[0056] Figure 5 A schematic diagram illustrating the angle adjustment of the measuring stage of an X-ray diffractometer provided in an embodiment of this application;

[0057] Figure 6 A schematic diagram illustrating the relationship between incident light intensity and Psi-H scanning range provided in an embodiment of this application;

[0058] Figure 7A schematic diagram illustrating the relationship between incident light intensity and Phi-H scanning range provided in an embodiment of this application;

[0059] Figure 8 A schematic diagram illustrating the relationship between the intensity of incident light and the diffraction peaks of a diamond sample, provided in an embodiment of this application.

[0060] Figure 9 A schematic diagram of a diamond deflection angle measuring device provided in an embodiment of this application;

[0061] Figure 10 This is a schematic diagram of a diamond deflection angle measuring device provided in an embodiment of this application. Detailed Implementation

[0062] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0063] Diamond, also known as "diamond," is a mineral composed of carbon and is the hardest naturally occurring substance in nature. Diamond has a wide range of uses, including in handicrafts, industrial cutting tools, and is also a precious gemstone.

[0064] The substrate is a wafer made of semiconductor single-crystal material. Substrates can be directly used in wafer fabrication to produce semiconductor devices, or they can be processed into epitaxial wafers. Therefore, the surface quality of the substrate has a significant impact on the growth of diamond single-crystal epitaxy. Grinding the surface of single-crystal diamond inevitably produces fine scratches and subsurface damage, which must be removed using H2-O2 plasma pretreatment; otherwise, the quality of the single-crystal diamond epitaxial growth layer will be severely affected. Meanwhile, step growth is also a major method for diamond single-crystal epitaxial growth. Based on these factors, natural diamonds often have an off-angle. Using diamonds without off-angle treatment directly in product manufacturing results in a very low yield, which is detrimental to production efficiency. Therefore, it is necessary to measure the off-angle of the diamond to perform off-angle treatment.

[0065] To address the aforementioned shortcomings, this invention provides a method for measuring the deflection angle of diamond. This method can be applied to various computer terminals or smart terminals, and its execution entity can be the processor or server of the computer terminal or smart terminal. The flowchart of the method is shown below. Figure 1As shown, it specifically includes:

[0066] S1: Initialize the pre-acquired X-ray diffractometer.

[0067] In this application, the pre-acquired X-ray diffractometer (X-ray Powder diffractomete, XPD, or XRD) is a measuring instrument that can measure the deflection angle of a crystal.

[0068] X-rays and their diffraction: X-rays are electromagnetic waves with very short wavelengths (0.06-20 nm). They can penetrate materials of a certain thickness and can cause fluorescent materials to emit light, photographic emulsions to be exposed, and gases to ionize. X-rays are generated by bombarding a metal target with a high-energy electron beam. These X-rays have specific wavelengths corresponding to the elements in the target and are called characteristic X-rays. For crystalline materials, when the crystal under test is at different angles to the incident beam, those crystal planes that satisfy Bragg diffraction will be detected, which will be reflected in the XRD pattern as diffraction peaks with different diffraction intensities. For amorphous materials, because their structure does not have the long-range order of atomic arrangement found in crystalline structures, but only short-range order within a few atoms, the XRD pattern of amorphous materials consists of diffuse scattering peaks.

[0069] X-ray diffractometers can accurately determine the crystal structure, texture, and stress of substances using the principle of diffraction, enabling precise phase analysis, qualitative analysis, and quantitative analysis. They are widely used in metallurgy, petroleum, chemical industry, scientific research, aerospace, education, and materials production.

[0070] In the embodiments provided in this application, the X-ray diffractometer needs to be initialized before measuring the deflection angle of the crystal sample to meet different measurement requirements. For example, if this method measures the deflection angle of a single-crystal diamond sample, the measurement parameters of the X-ray diffractometer need to be adjusted according to the specific characteristics or properties of the single-crystal diamond sample.

[0071] S2: Use the initialized X-ray diffractometer to measure the thickness of the pre-acquired diamond sample to obtain the thickness value of the diamond sample; wherein, the diamond sample is placed on the measuring stage of the X-ray diffractometer.

[0072] The diamond sample obtained in advance in this application can be a single-crystal diamond material, and this embodiment does not limit it.

[0073] Understandably, to measure the deflection angle of a diamond sample, the thickness of the diamond sample must first be known. Therefore, the diamond sample is placed on the measuring stage of the initialized X-ray diffractometer, and the thickness of the diamond sample is measured using the incident light and detector of the X-ray diffractometer to obtain the thickness value of the diamond sample.

[0074] S3: Obtain the initial omega value and initial 2θ value of the diamond sample.

[0075] The deflection angle of diamond refers to the omega (ω) value and 2θ (2Theta) value of the diamond sample. However, the initial omega value and the initial 2θ value are only standard values ​​uniform to all diamond samples and do not represent the true deflection angle of each diamond sample. Therefore, the diamond deflection angle measurement method provided in this application is to use an X-ray diffractometer to measure the true (target) omega value and the true (target) 2θ value of the diamond sample.

[0076] S4: Based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, the deflection angle of the diamond sample is measured using an initialized X-ray diffractometer to obtain the target omega value and target 2θ value of the diamond sample.

[0077] Based on the thickness, initial omega value, and initial 2θ value of the diamond sample, the initialized X-ray diffractometer is configured, including setting the scanning range and secondary optical path, in order to more accurately measure the deflection angle of the diamond sample.

[0078] As can be seen from the above technical solution, this application initializes a pre-acquired X-ray diffractometer and uses the initialized X-ray diffractometer to measure the thickness of a pre-acquired diamond sample, obtaining the thickness value of the diamond sample. The diamond sample is placed on the measuring stage of the X-ray diffractometer. Additionally, the initial omega value and initial 2θ value of the diamond sample are obtained. Finally, based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, the initialized X-ray diffractometer is used to measure the deflection angle of the diamond sample, obtaining the target omega value and target 2θ value. This solution uses the initialized X-ray diffractometer to measure the deflection angle of the diamond sample placed on the measuring stage, based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, thereby measuring the deflection angle of the diamond sample. This facilitates the cutting and processing of the diamond sample during subsequent product manufacturing, effectively improving the yield of diamond series products and benefiting the production efficiency of the manufacturing process.

[0079] In the method provided by this embodiment of the invention, step S1, initializing the pre-acquired X-ray diffractometer, may include:

[0080] The scanning range, detector window, operating voltage, operating current, and attenuation value of the X-ray diffractometer are initialized. Specifically, the secondary optical path of the X-ray diffractometer can be selected as the analysis crystal mode; the 2θ scanning range can be set to "-1 to 1"; the measuring stage can be lowered by 5 mm or more, that is, the thickness parameter Z can be set to -5 mm. This ensures that the incident light of the X-ray diffractometer can be exposed and not blocked by the measuring stage, and ensures that the incident light and the detector that detects the incident light are on the same horizontal line; the detector window (LinearOpening) parameter of the X-ray diffractometer is set to "14 mm"; the operating voltage is set to 40 kV; the operating current is set to 40 mA; and the attenuation is set to 1.

[0081] The above embodiments describe in detail the process of initializing the X-ray diffractometer obtained in advance in this application. The following describes in detail the process of how to use the initialized X-ray diffractometer to measure the deflection angle of the diamond sample based on the thickness value, initial omega value and initial 2θ value of the diamond sample, and obtain the target omega value and target 2θ value of the diamond sample.

[0082] S41: Based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, set the first rocking curve scanning range and the first step of the X-ray diffractometer.

[0083] S42: Using the initialized X-ray diffractometer, scan the diamond sample according to the first Rocking curve scanning range and the first step to obtain the first omega value and the first 2θ value.

[0084] S43: Perform a first angle correction on the diamond sample based on the first omega value and the first 2θ value.

[0085] S44: Using the initialized X-ray diffractometer, scan the diamond sample after the first angle correction according to the first Rocking curve scanning range and the first step to obtain the second omega value and the second 2θ value.

[0086] S45: Perform a second angle correction on the diamond sample after the first angle correction based on the second omega value and the second 2θ value.

[0087] S46: Based on the second omega value and the second 2θ value, set the second rocking curve scanning range and the second step.

[0088] S47: Using the initialized X-ray diffractometer, scan the diamond sample after the second angle correction according to the second Rocking curve scanning range and the second step to obtain the third omega value and the third 2θ value.

[0089] S48: Determine whether the third omega value and the third 2θ value meet the preset conditions.

[0090] In this step, the preset condition can be set as follows: whether a diffraction peak of the 400 plane can be found under the third omega value and the third 2θ value measured at this time.

[0091] S49: If the third omega value and the third 2θ value satisfy the preset conditions, then the third omega value is taken as the target omega value and the third 2θ value is taken as the target 2θ value.

[0092] If a diffraction peak at plane 400 can be found at this time, it means that the third omega value and the third 2θ value are the target omega value and target 2θ value that we want to obtain.

[0093] Preferably, if a diffraction peak on plane 400 cannot be found at this point, the scanning parameters of the X-ray diffractometer need to be further adjusted. The specific process is as follows:

[0094] S50: Perform triaxial crystal adjustment on the X-ray diffractometer.

[0095] S51: Based on the third omega value and the third 2θ value, set the third rocking curve scanning range and the third step.

[0096] S52: Using a triaxial crystal-adjusted X-ray diffractometer, scan the diamond sample after the second angle correction according to the third rocking curve scanning range and the third step to obtain the fourth omega value and the fourth 2θ value.

[0097] S53: Based on the fourth omega value and the fourth 2θ value, set the 2θ-omega scanning range and the fourth step.

[0098] S54: Using the triaxial crystal-adjusted X-ray diffractometer, scan the diamond sample according to the 2θ-omega scanning range and the fourth step to obtain the target omega value and the target 2θ value.

[0099] In the embodiments provided in this application, a diamond sample with a length of 5 mm, a width of 5 mm, and a thickness of 1 mm can be obtained. Additionally, a Bruker instrument (model D8Discover) can be used as the X-ray diffractometer in the method provided in this application.

[0100] Based on the method provided in this application, a specific example is as follows:

[0101] The X-ray diffractometer was initialized and calibrated in triaxial crystal (analytical crystal) mode, which involved selecting analytical crystal mode for the secondary optical path of the X-ray diffractometer; setting the 2θ scan range to "-1 to 1"; lowering the measuring stage by 5 mm; setting the detector window (LinearOpening) parameter of the X-ray diffractometer to "14 mm"; setting the operating voltage to 40 kV; setting the operating current to 40 mA; and setting the attenuation to 1.

[0102] The pre-acquired diamond sample (which can be a single-crystal diamond) is placed on the measuring stage (sample stage) of the X-ray diffractometer. The thickness of the diamond sample is measured using the X-ray diffractometer initialized as described above. The Z-scan range is set to "-1 to 0.5", the step size to "0.01", the radiation attenuation value (Rotary Absorber) to "7.0", the secondary optical path is selected as "slit mode (slit detector)", and the slit width is set to "1 mm". The detector window, operating voltage, and operating current remain unchanged. The scanning process can proceed as follows: Figure 2 As shown, please refer to Figure 2 , Figure 2 The vertical axis represents the light intensity (Counts) of the incident light captured by the detector, and the horizontal axis represents the height (Z) of the measuring stage. This can be understood as follows: when Z is between -1.5mm and -1.2mm, the incident light is not blocked by the diamond sample placed on the measuring stage, and the detector can capture all the incident light. However, when Z starts from -1.2mm... Figure 2 The light intensity index begins to decrease, indicating that the incident light is illuminating the diamond sample, but is being blocked by the sample placed on the measuring stage. At this point, the detector cannot capture all the incident light. Z continues to change until it reaches -0.2 mm, at which point the intensity of the incident light captured by the detector no longer changes. Therefore, the thickness of the diamond sample can be calculated as: -0.2 - (-1.2) = 1 mm. It should be noted that 1 mm is only an approximate value and does not represent the precise thickness of the diamond sample.

[0103] It is important to note that the surface of diamond samples may have imperfections invisible to the naked eye. Therefore, after thickness measurement, the detector may no longer fully capture the incident light. Thus, it is necessary to readjust the incident light and the detector to ensure complete capture. This involves setting the rocking curve scanning range to "-1 to 1" and the step size to "0.01". The adjustment process can be described as follows: Figure 3 As shown, by Figure 3It can be seen that when the angle of the incident light (the value of omega) is near 0, the detector can capture the incident light with the strongest intensity. The settings for ray attenuation, secondary optical path, slit width, detector window, operating voltage, and operating current remain unchanged.

[0104] Then, the thickness of the diamond sample is measured again: by adjusting the scanning range to "-1 to 0.5", the accurate thickness of the diamond sample can be obtained.

[0105] The crystal plane coefficient hk1 of the diamond sample obtained below is 400, and the initial omega value and initial 2θ value are 59.74 and 119.47 (or 119.50), respectively. The acquisition process can be as follows: Figure 4 As shown. Based on the thickness value, initial omega value, and initial 2θ value, the first rocking curve scanning range is set to "58.74~60.74", and the first step is "0.01".

[0106] The diamond sample was scanned using a first rocking curve scan range of "58.74~60.74" and a step size of "0.01". During this process, a 2θ scan could be performed, with the 2θ scan range set to "118.47~120.47" and the step size set to "0.01", yielding the first omega value and the first 2θ value. However, the obtained first omega value and first 2θ value were obtained using a rather coarse scanning method and differed significantly from the target omega value and target 2θ value. Therefore, it was necessary to adjust various parameters of the X-ray diffractometer.

[0107] Therefore, based on the first omega value and the first 2θ value, the diamond sample undergoes a first angle correction, i.e., the measuring stage is adjusted first. The adjustment dimensions include Psi-H and Phi-H: the Psi-H scanning range is set to "-2 to 2", and the step is set to "0.01"; the Phi-H scanning range is set to "0 to 360", and the step is set to "0.13". A schematic diagram of the measuring stage angle adjustment can be seen as follows: Figure 5 As shown.

[0108] At this point, the diamond sample after the first angle correction is scanned according to the first Rocking curve scanning range and the first step, obtaining the second ohm-ga value and the second 2θ value. The second ohm-ga value and the second 2θ value obtained in this step are closer to the true deflection angle of the diamond sample than the first ohm-ga value and the first 2θ value. However, the 40° diffraction peak of the diamond sample cannot be obtained at this time. Therefore, it is necessary to continue to adjust the various parameters of the X-ray diffractometer.

[0109] Next, the same Psi-H and Phi-H scanning ranges are used to perform a second angle adjustment on the diamond sample. The relationship between this adjustment and the incident light intensity captured by the detector can be described as follows: Figure 6 and Figure 7 As shown, by Figure 6 and Figure 7 It can be seen that the detector captures the strongest incident light intensity when the Psi-H scanning range is between 0° and 0.5°; and the detector captures the strongest incident light intensity when the Phi-H scanning range is between -12° and 5°. Based on the second omega value and the second 2θ value, the second rocking curve scanning range is set to "59.54~59.94" and the second step is "0.001". During this process, a 2θ scan can also be performed, with the 2θ scan range set to "119~120" and the step set to "0.001", to obtain the third omega value and the third 2θ value.

[0110] The current determination is whether the third omega value and the third 2θ value meet the preset conditions. The preset conditions are whether the current adjustment result can produce the 400 diffraction peak of the diamond sample, or whether the intensity of the incident light captured by the detector is strong. If so, the third omega value is taken as the target omega value and the third 2θ value is taken as the target 2θ value. If not, the various parameters of the X-ray diffractometer are adjusted.

[0111] The X-ray diffractometer is then adjusted in three-axis crystal mode. The secondary optical path is switched back to the analytical crystal mode with higher measurement accuracy. All detector windows are then opened, the attenuation is set to 1, and the other parameters remain unchanged. Based on the third omega value and the third 2θ value, the third rocking curve scanning range is set to "59.54~59.94" and the third step is set to "0.001".

[0112] Using a triaxially oriented X-ray diffractometer, the diamond sample after the second angle correction was scanned according to the third rocking curve scanning range and the third step, yielding the fourth omega value and the fourth 2θ value. During this process, a second 2θ scan can be performed to make the obtained fourth omega value and fourth 2θ value closer to the true value. Finally, a 400 peak of a diamond sample can be obtained, such as... Figure 8 As shown, by Figure 8 It can be seen that the fourth omega value of 59.73 and the fourth 2θ value of 119.46 of the diamond sample are closest to the true target omega value and target 2θ value. It should be noted that the 2θ value of the diamond sample is approximately twice the omega value. The 2θ scan range can be set to "119.2~119.8" with a step of "0.005".

[0113] Finally, based on the fourth ohm-omega value and the fourth 2θ value, the 2θ-omega scanning range and the fourth step are set. Using a triaxial crystal-adjusted X-ray diffractometer, the diamond sample is scanned according to the 2θ-omega scanning range and the fourth step to obtain the target ohm-omega value and the target 2θ value. This process can obtain more diffraction peaks from the diamond sample, such as the 100 diffraction peak and the 200 diffraction peak. Obtaining multiple diffraction peaks facilitates subsequent processing of the diamond sample. It is understood that the target ohm-omega value and the target 2θ value are equal to the fourth ohm-omega value and the fourth 2θ value.

[0114] and Figure 1 Corresponding to the method described above, this embodiment of the invention also provides a diamond deflection angle measuring device for measuring... Figure 1 In the specific implementation of the method, the diamond deflection angle measuring device provided in this embodiment of the invention can be used in a computer terminal or various mobile devices, combined with... Figure 9 This section introduces the device for measuring the deflection angle of diamond, such as... Figure 9 As shown, the device may include:

[0115] Initialization module 10 is used to initialize the pre-acquired X-ray diffractometer.

[0116] The thickness measurement module 20 is used to measure the thickness of a pre-acquired diamond sample using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measuring stage of the X-ray diffractometer.

[0117] The acquisition module 30 is used to acquire the initial omega value and the initial 2θ value of the diamond sample.

[0118] The deflection angle measurement module 40 is used to measure the deflection angle of the diamond sample using an initialized X-ray diffractometer based on the thickness value, initial omega value, and initial 2θ value of the diamond sample, so as to obtain the target omega value and target 2θ value of the diamond sample.

[0119] In one example, the initialization module 10 may include:

[0120] The initialization submodule is used to initialize the scanning range, detector window, operating voltage, operating current, and attenuation value of the X-ray diffractometer.

[0121] In one example, the deflection angle measurement module 40 may include:

[0122] The first setting module is used to set the first rocking curve scanning range and the first step of the X-ray diffractometer based on the thickness value, initial omega value and initial 2θ value of the diamond sample.

[0123] The first scanning module is used to scan the diamond sample using an initialized X-ray diffractometer according to the first Rocking curve scanning range and the first step, to obtain the first omega value and the first 2θ value.

[0124] The first angle correction module is used to perform a first angle correction on the diamond sample based on the first omega value and the first 2θ value.

[0125] The second scanning module is used to scan the diamond sample after the first angle correction using the initialized X-ray diffractometer, according to the first Rocking curve scanning range and the first step, to obtain the second omega value and the second 2θ value.

[0126] The second angle correction module is used to perform a second angle correction on the diamond sample after the first angle correction based on the second omega value and the second 2θ value.

[0127] The second setting module is used to set the second rocking curve scanning range and the second step based on the second omega value and the second 2θ value.

[0128] The third scanning module is used to scan the diamond sample after the second angle correction using the initialized X-ray diffractometer according to the second Rocking curve scanning range and the second step, so as to obtain the third omega value and the third 2θ value.

[0129] The judgment module is used to determine whether the third omega value and the third 2θ value meet preset conditions.

[0130] The assignment module is used to assign the third omega value as the target omega value and the third 2θ value as the target 2θ value when the third omega value and the third 2θ value satisfy the preset conditions.

[0131] In one example, the deflection angle measurement module 40 may further include:

[0132] The adjustment module is used to perform triaxial crystal adjustment on the X-ray diffractometer when the third omega value and the third 2θ value do not meet the preset conditions.

[0133] The third setting module is used to set the third rocking curve scanning range and the third step based on the third omega value and the third 2θ value.

[0134] The fourth scanning module is used to scan the diamond sample after the second angle correction using a triaxial crystal-adjusted X-ray diffractometer, according to the third Rockingcurve scanning range and the third step, to obtain the fourth omega value and the fourth 2θ value.

[0135] The fourth setting module is used to set the 2θ-omega scanning range and the fourth step based on the fourth omega value and the fourth 2θ value.

[0136] The fifth scanning module is used to scan the diamond sample using the triaxial crystal-adjusted X-ray diffractometer according to the 2θ-omega scanning range and the fourth step, to obtain the target omega value and the target 2θ value.

[0137] Furthermore, embodiments of this application provide a device for measuring the deflection angle of diamond. Optionally, Figure 10 The hardware structure block diagram of the diamond deflection measurement device is shown, with reference to... Figure 10 The hardware structure of a diamond deflection measurement device may include: at least one processor 01, at least one communication interface 02, at least one memory 03 and at least one communication bus 04.

[0138] In this embodiment of the application, the number of processor 01, communication interface 02, memory 03 and communication bus 04 is at least one, and processor 01, communication interface 02 and memory 03 communicate with each other through communication bus 04.

[0139] Processor 01 may be a central processing unit (CPU), an application-specific integrated circuit (ASIC), or one or more integrated circuits configured to implement embodiments of the present invention.

[0140] Memory 03 may include high-speed RAM, and may also include non-volatile memory, such as at least one disk storage device.

[0141] The memory stores a program that the processor can call. The program is used to execute the following method for measuring the deflection angle of diamond, including:

[0142] Initialize the pre-acquired X-ray diffractometer;

[0143] The thickness of a pre-acquired diamond sample is measured using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measuring stage of the X-ray diffractometer.

[0144] Obtain the initial omega value and initial 2θ value of the diamond sample;

[0145] Based on the thickness, initial omega value, and initial 2θ value of the diamond sample, the deflection angle of the diamond sample is measured using an initialized X-ray diffractometer to obtain the target omega value and target 2θ value of the diamond sample. Optionally, the refinement and extension functions of the program can be found in the description of the diamond deflection angle measurement method in the method embodiments.

[0146] This application embodiment also provides a storage medium that can store a program suitable for execution by a processor. When the program runs, it controls the device containing the storage medium to perform the following diamond deflection angle measurement method, including:

[0147] Initialize the pre-acquired X-ray diffractometer;

[0148] The thickness of a pre-acquired diamond sample is measured using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measuring stage of the X-ray diffractometer.

[0149] Obtain the initial omega value and initial 2θ value of the diamond sample;

[0150] Based on the thickness, initial omega value, and initial 2θ value of the diamond sample, the deflection angle of the diamond sample is measured using an initialized X-ray diffractometer to obtain the target omega value and target 2θ value of the diamond sample.

[0151] Specifically, the storage medium can be a computer-readable storage medium, which can be an electronic storage device such as flash memory, EEPROM (Electrically Erasable Programmable Read-Only Memory), EPROM, hard disk, or ROM.

[0152] Optionally, the refinement and extension functions of the program can be found in the description of the diamond deflection angle measurement method in the method embodiments.

[0153] Furthermore, the functional modules in the various embodiments of this disclosure can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part. If the function is implemented as a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this disclosure, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, a live streaming device, or a network device, etc.) to execute all or part of the steps of the methods in the various embodiments of this disclosure.

[0154] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0155] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0156] The above description of the disclosed embodiments enables those skilled in the art to make or use this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for measuring the deflection angle of diamond, characterized in that, include: Initialize the pre-acquired X-ray diffractometer; The thickness of a pre-acquired diamond sample is measured using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measuring stage of the X-ray diffractometer. Obtain the initial omega value and initial 2θ value of the diamond sample; Based on the thickness, initial omega value, and initial 2θ value of the diamond sample, the target omega value and target 2θ value of the diamond sample are obtained by measuring the deflection angle of the diamond sample using an initialized X-ray diffractometer. This includes: setting the first rocking curve scanning range and first step of the X-ray diffractometer based on the thickness, initial omega value, and initial 2θ value of the diamond sample; scanning the diamond sample using the initialized X-ray diffractometer according to the first rocking curve scanning range and first step to obtain the first omega value and the first 2θ value; performing a first angle correction on the diamond sample based on the first omega value and the first 2θ value; scanning the diamond sample after first angle correction using the initialized X-ray diffractometer according to the first rocking curve scanning range and first step to obtain a second omega value and a second 2θ value; performing a second angle correction on the diamond sample after first angle correction based on the second omega value and the second 2θ value; and setting a second rocking curve based on the second omega value and the second 2θ value. The first and second angle corrections are performed using an initialized X-ray diffractometer, scanning the diamond sample after second angle correction according to the second rocking curve scanning range and second step to obtain a third omega value and a third 2θ value. It is then determined whether the third omega value and the third 2θ value meet preset conditions. If the third omega value and the third 2θ value meet the preset conditions, the third omega value is taken as the target omega value, and the third 2θ value is taken as the target 2θ value. The adjustment dimensions in the first and second angle correction processes include Psi-H and Phi-H.

2. The method according to claim 1, characterized in that, The initialization of the pre-acquired X-ray diffractometer includes: The scanning range, detector window, operating voltage, operating current, and attenuation value of the X-ray diffractometer are initialized.

3. The method according to claim 1, characterized in that, Also includes: If the third omega value and the third 2θ value do not meet the preset conditions, then the X-ray diffractometer is subjected to triaxial crystal adjustment; Based on the third omega value and the third 2θ value, the third rocking curve scanning range and the third step size are set; Using a triaxial crystal-adjusted X-ray diffractometer, the diamond sample after the second angle correction was scanned according to the third Rocking curve scanning range and the third step to obtain the fourth omega value and the fourth 2θ value. Based on the fourth omega value and the fourth 2θ value, set the 2θ-omega scanning range and the fourth step; Using the triaxially adjusted X-ray diffractometer, the diamond sample was scanned according to the 2θ-omega scanning range and the fourth step to obtain the target omega value and the target 2θ value.

4. The method according to claim 1, characterized in that, The pre-obtained diamond sample is 5mm long and 5mm wide.

5. The method according to claim 1, characterized in that, The X-ray diffractometer is a Bruker instrument, model D8Discover.

6. A device for measuring the deflection angle of diamond, characterized in that, include: The initialization module is used to initialize the pre-acquired X-ray diffractometer. A thickness measurement module is used to measure the thickness of a pre-acquired diamond sample using an initialized X-ray diffractometer to obtain the thickness value of the diamond sample; wherein the diamond sample is placed on the measurement stage of the X-ray diffractometer. The acquisition module is used to acquire the initial omega value and the initial 2θ value of the diamond sample; An angle measurement module is used to measure the angle of deviation of the diamond sample using an initialized X-ray diffractometer based on the thickness value, initial ohmga value, and initial 2θ value of the diamond sample, to obtain the target ohmga value and target 2θ value of the diamond sample; it includes: a first setting module, used to set the first rocking curve scanning range and first step of the X-ray diffractometer based on the thickness value, initial ohmga value, and initial 2θ value of the diamond sample; a first scanning module, used to scan the diamond sample using the initialized X-ray diffractometer according to the first rocking curve scanning range and first step to obtain the first ohmga value and the first 2θ value; a first angle correction module, used to perform a first angle correction on the diamond sample based on the first ohmga value and the first 2θ value; and a second scanning module, used to use the initialized X-ray diffractometer according to the first rocking curve scanning range and first step to obtain the target ohmga value and target 2θ value. The first rocking curve scanning range and the first step are used to scan the diamond sample after the first angle correction to obtain a second ohmga value and a second 2θ value; the second angle correction module is used to perform a second angle correction on the diamond sample after the first angle correction based on the second ohmga value and the second 2θ value; the second setting module is used to set a second rocking curve scanning range and a second step based on the second ohmga value and the second 2θ value; the third scanning module is used to scan the diamond sample after the second angle correction using an initialized X-ray diffractometer according to the second rocking curve scanning range and the second step to obtain a third ohmga value and a third 2θ value; the judgment module is used to determine whether the third ohmga value and the third 2θ value meet preset conditions; the assignment module is used to set the third ohmga value as the target ohmga value and the third 2θ value as the target 2θ value when the third ohmga value and the third 2θ value meet the preset conditions.

7. A diamond deflection angle measuring device, characterized in that, Including memory and processor; The memory is used to store programs; The processor is configured to execute the program to implement the steps of the diamond deflection angle measurement method as described in any one of claims 1-5.

8. A storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the diamond deflection angle measurement method as described in any one of claims 1-5.

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