A method for processing and analyzing the electrical thickness data of a radome

Abstract

The present invention belongs to the field of electrical performance testing of radomes, and discloses a method for processing and analyzing radar dome electrical thickness data, including the following steps: Step 1: Import the radar dome electrical thickness test data, and connect the test data of each radar dome station into a test data curve respectively; Step 2: The data processing and analysis starts from the head station a of the radar dome, and n is initialized to 1; Step 3: Determine whether the coincidence degree between the test data curve of the head station a and the test data curve of the station a + n reaches the coincidence degree threshold; if it reaches, then n = n + 1, and repeat Step 3; otherwise, enter Step 4; Step 4: Take any test data curve within the [a, a + n] stations as a representative, and uniformly analyze the data within the [a, a + n] stations; determine the out-of-tolerance curve segments in the test data curve, and determine the out-of-tolerance regions of the out-of-tolerance curve segments; Step 5: Determine the out-of-tolerance magnitude of the out-of-tolerance curve segments; Step 6: Output the radar dome electrical thickness correction data according to the out-of-tolerance magnitude.

Description

Technical Field

[0001] The present invention belongs to the technical field of radome testing, and particularly relates to a method for processing and analyzing the electrical thickness data of a radome. Background Art

[0002] The inserted phase delay (IPD), i.e., the electrical thickness, is an important parameter affecting the electrical performance index of a radome, which reflects the comprehensive influence of parameters such as the dielectric constant of the radome and the geometric thickness of the wall on the electrical performance of the radome. The detection and correction technology of the electrical thickness is an important technical means for developing and producing high-performance radomes. Therefore, an accurate and reasonable method for processing the electrical thickness data is the key to the correctness of the electrical thickness test.

[0003] Traditional processing of electrical thickness data has no standardized and effective processing and analysis process, the output form of the corrected data is not unified, and the identification efficiency is low. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a method for processing and analyzing the electrical thickness data of a radome, which solves the problems that traditional processing of electrical thickness data has no standardized and effective processing and analysis process, the output form of the corrected data is not unified, and the identification efficiency is low. By forming a systematic method for analyzing the electrical thickness test data, the test data can be analyzed and processed to form standardized and intuitive corrected data for later use in the correction and identification of the radome.

[0005] A method for processing and analyzing the electrical thickness data of a radome includes the following steps:

[0006] Step 1: Import the electrical thickness test data of the radome, and connect the test data of each radome station into a test data curve respectively;

[0007] Step 2: Start data processing and analysis from the head station a of the radome, and initialize n to 1;

[0008] Step 3: Determine whether the coincidence degree of the test data curve of the head station a and the test data curve of the station a + n reaches the coincidence degree threshold; if it reaches, then n = n + 1, and repeat Step 3; otherwise, enter Step 4;

[0009] Step 4: Take any test data curve within the [a, a + n] stations as a representative, and uniformly analyze the data within the [a, a + n] stations; determine the out-of-tolerance curve segments in the test data curve, and determine the out-of-tolerance regions of the out-of-tolerance curve segments;

[0010] Step 5: Determine the out-of-tolerance magnitude of the out-of-tolerance curve segments;

[0011] Step 6: Output the electrical thickness correction data of the radome according to the out-of-tolerance magnitude.

[0012] Further, in the third step, the coincidence degree threshold is not less than 90%.

[0013] Further, in the fourth step, the out-of-tolerance curve segment refers to the curve segment in the test data curve that is higher than the upper limit of the standard curve or lower than the lower limit of the standard curve.

[0014] Further, in the fourth step, the out-of-tolerance area is the union of the abscissa loop angle ranges of all out-of-tolerance curve segments.

[0015] Further, in the fifth step, each out-of-tolerance curve segment corresponds to an out-of-tolerance value, and the out-of-tolerance value is the mode of the test data within each out-of-tolerance curve segment.

[0016] Further, in the fifth step, if there are data spikes in the out-of-tolerance curve segment, then all the test data within the data spikes are not considered when determining the out-of-tolerance value;

[0017] The data spike refers to: there is an extreme value on the test data curve and this extreme value is at least 2° greater than the average value within this out-of-tolerance range, then the part of the test data curve from this extreme value to the connection line at both ends greater than the average value within this out-of-tolerance range is counted as a data spike.

[0018] Further, if the loop angle of the data spike is less than 15°, then all the test data within this data spike are normalized to the mode of the test data within the out-of-tolerance curve segment where the data spike is located when determining the out-of-tolerance value.

[0019] Further, if the loop angle of the data spike ≥ 15°, then this data spike is divided into a separate out-of-tolerance curve segment, and the out-of-tolerance range and out-of-tolerance value of this data spike are determined separately; the out-of-tolerance value of the data spike with a loop angle ≥ 15° is the definite integral average value of the extreme value of the test data curve at this data spike.

[0020] Beneficial effects: The present invention provides a method for processing and analyzing the electrical thickness data of a radome. By designing the processing flow of the electrical thickness test data, the data processing and analysis operations are unified and standardized, improving the accuracy of data processing. Setting the threshold for the coincidence degree of the station a curve and the station a + n curve, and setting the threshold for the data spike range in the test data can improve the efficiency and quality of data processing and analysis. Description of the Drawings

[0021] Figure 1 It is a flowchart for processing and analyzing the electrical thickness data of a radome;

[0022] Figure 2 It is a schematic diagram of the electrical thickness test data curve of a radome. Detailed Embodiments

[0023] The radome station position is defined as the axial distance from the current test position to the radome convergence point. Import the test data. The test data connects each test data point by station position to generate the corresponding test data curve. Each curve can reflect the test data of the positive circle (0° to 360°) at the station position where the curve is located. The abscissa shown in the test data curve is the circumferential angle of the radome along the course, and the ordinate is the measured electrical thickness test value. The purpose of data processing is to correct the test data curve between the upper limit and the lower limit of the standard curve. The analysis method is as follows:

[0024] First, determine whether the coincidence degree of the test curves at the front and rear station positions can reach the set threshold. If it can be satisfied, perform unified processing on the curves in this station position interval. If it cannot be satisfied, analyze the test curves of the station positions one by one. Then, by comparing the trends of the standard curve and the test data curve, analyze and obtain the out-of-tolerance area and out-of-tolerance value in the test data curve interval of this station position. Secondly, determine whether the data spikes in the out-of-tolerance area exceed the set threshold. If they exceed the threshold, further refine the out-of-tolerance area and out-of-tolerance range. If they do not exceed the threshold, merge and stack to form the corrected unit data of the station position interval or station position. Finally, determine whether the current station position curve is the last curve. If not, add 1 to the station position number and return to continue the judgment. If so, the analysis ends.

[0025] The process of data processing and analysis of the radome electrical thickness is as Figure 1 shown, taking the test curve of Figure 2 as the applicable object for analysis. The specific data processing and analysis steps are as follows:

[0026] Step 101, start processing the test data.

[0027] Step 102, import the test data. The test data connects each test data point by station position to generate the corresponding test data curve.

[0028] Step 103, start data analysis from the head station position a of the radome, and set n to 1.

[0029] Step 104, determine whether the coincidence degree of the curve at station position a and the curve at station position a + n can reach 95%.

[0030] Step 105, if it can be reached, then n = n + 1, return to Step 104 to make another curve judgment, and so on until the appearance of non-coincident station position curves.

[0031] Step 106, perform unified analysis and processing on the data in the [a, a + n] station position range. Analyze the circumferential angle (abscissa) of the out-of-tolerance area within the [a, a + n] station position interval. As Figure 2As shown, take the curve in the figure as an analysis case. The electrical thickness difference between the upper limit value and the lower limit value of the standard curve is 2°. Two parts of the test data curve are higher than the upper limit value of the standard curve. Therefore, it can be analyzed that the out-of-tolerance areas of the data curve at this station are (0° - 180°) and (312° - 335°). Considering the error influence of the later marking and the convenience of angle marking, the range of the out-of-tolerance area is rounded to a multiple of 5. Then it is analyzed that the out-of-tolerance areas of the data curve at this station are (0° - 180°) and (315° - 330°).

[0032] Step 107: Analyze the out-of-tolerance values (ordinate) of the out-of-tolerance amounts within the [a, a + n] station interval. The out-of-tolerance areas have been determined in the previous step. This step is to determine the out-of-tolerance amounts of each out-of-tolerance area. To correct the test data curve between the upper and lower limit values of the standard curve, the out-of-tolerance area (0° - 180°) needs to be reduced by 1.5°, and the out-of-tolerance area (315° - 330°) needs to be reduced by 1°. Therefore, the out-of-tolerance amounts of each out-of-tolerance area can be obtained.

[0033] Step 108: The electrical thickness peak of the data spike is high but the angle is small. If not handled well, it will affect the performance of the entire station. If there is a data spike in the out-of-tolerance area, it will be judged again.

[0034] Step 109: If the loop angle of the data spike ≥ 15°, refine the out-of-tolerance area and the out-of-tolerance amount, conduct a secondary analysis of the data spike area, and return to Step 106. Process the data spike according to Steps 106 and 107.

[0035] Step 110: If the data peak does not exceed the threshold range of 15°, merge and classify to form the corrected unit data of the [a, a + n] station, and output the corresponding report. Figure 2 The corrected unit in Figure 2 is shown in Table 1. For example, for the data spike of the test data curve in

[0036] it does not exceed the threshold, so the corrected unit data can be merged.

[0037] Step 111: Judge whether the curve of the current station a + n is the last curve.

[0038] Step 112: If it is not the last curve, increment the current station by 1, that is, a = n + 1, and return to Step 104 to judge the new station again.

[0039] Table 1 Corrected unit data

[0040] 。

Claims

1. A method for processing and analyzing the electrical thickness data of a radome, characterized in that: The method includes the following steps: Step 1: Import the test data of the radome electrical thickness, and connect the test data of each radome station into a test data curve respectively; Step 2: Data processing and analysis start from the radome head position a, and n is initialized to 1; Step 3: Judge whether the coincidence degree between the test data curve of the head position a and the test data curve of the position a + n reaches the coincidence degree threshold; if it reaches, then n = n + 1, and repeat Step 3; otherwise, enter Step 4; Step 4: Take any test data curve within the [a, a + n] position as a representative, and uniformly analyze the data within the [a, a + n] position; determine the out-of-tolerance curve segments in the test data curve, and determine the out-of-tolerance areas of the out-of-tolerance curve segments; Step 5: Determine the out-of-tolerance value of the out-of-tolerance curve segment; each out-of-tolerance curve segment corresponds to an out-of-tolerance value, and the out-of-tolerance value is the mode of the test data within each out-of-tolerance curve segment. If there are data spikes in the out-of-tolerance curve segment and the loop angle of the data spike is less than 15°, then all the test data within this data spike are normalized to the mode of the test data within the out-of-tolerance curve segment where the data spike is located when determining the out-of-tolerance value; if there are data spikes in the out-of-tolerance curve segment and the loop angle of the data spike ≥ 15°, then this data spike is divided into a separate out-of-tolerance curve segment, and the out-of-tolerance range and out-of-tolerance value of this data spike are determined separately; the out-of-tolerance value of the data spike with a loop angle ≥ 15° is the definite integral average value of the extreme value of the data spike on the test data curve; Step 6: Output the radome electrical thickness correction data according to the out-of-tolerance value.

2. The method for processing and analyzing the electrical thickness data of a radome according to claim 1, wherein: In the said Step 3, the coincidence degree threshold is not less than 90%.

3. The method for processing and analyzing the electrical thickness data of a radome according to claim 1, characterized in that: In the said Step 4, the out-of-tolerance curve segment refers to the curve segment in the test data curve that is higher than the upper limit of the standard curve or lower than the lower limit of the standard curve.

4. The method for processing and analyzing the electrical thickness data of a radome according to claim 3, wherein: In the said Step 4, the out-of-tolerance area is the union of the abscissa loop angle ranges of all out-of-tolerance curve segments.

5. The method for processing and analyzing the radome electrical thickness data according to claim 4, characterized in that: The data spike refers to: there is an extreme value on the test data curve, and this extreme value is at least 2° larger than the mean value within this out-of-tolerance range, then the extreme value on the test data curve and the part of the line connecting its two ends that is greater than the mean value within this out-of-tolerance range are all counted as data spikes.

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