Testing Method, System and Electronic Device for LED Lamp

Abstract

The present application discloses a testing method, system and electronic device for an LED lamp. The method includes: determining a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from an LED lamp group, wherein the range of the first luminous intensity is less than that of the second luminous intensity; when both the first LED lamp and the second LED lamp meet the target luminous intensity range, determining a first test resistance range corresponding to the first LED lamp and a second test resistance range corresponding to the second LED lamp by using a test device in a constructed test environment; and determining a target resistance range corresponding to the LED lamp group in a working state based on the first test resistance range and the second test resistance range. This testing method can determine relevant devices such as current-limiting resistors adapted to the used LED lamps, so that the electronic device has strong adaptability.

Description

Technical Field

[0001] This application relates to the field of testing electronic devices, and particularly to a testing method, system and electronic device for an LED lamp. Background Art

[0002] During the production process of electronic devices such as laptop computers, due to the limitations of the manufacturing process of the LED lamp body, the parameters of the LED lamps in the same batch may not be exactly the same. For example, the luminous intensity of the LED lamps may be different or even have a large difference range. However, the finished electronic device requires that the brightness range of the LED lamp has corresponding limitations, such as within a relatively small range of 5-10 lx. Therefore, during the design process of the electronic device, it brings no small trouble to the selection of related components such as current-limiting resistors (used to limit the current of the LED lamp). For example, during the debugging process of the LED lamp brightness, it is still difficult to determine the parameters of the current-limiting resistor after repeated debugging, which is time-consuming, laborious and inefficient. Summary of the Invention

[0003] The embodiments of this application provide a testing method, system and electronic device for an LED lamp. This testing method can determine related devices such as current-limiting resistors that are compatible with multiple used LED lamps, so that the electronic device has high adaptability during the design and production processes.

[0004] To achieve the above object, this embodiment provides a testing method for an LED lamp, including:

[0005] Determine a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from an LED lamp group, where the range of the first luminous intensity is less than that of the second luminous intensity;

[0006] When both the first LED lamp and the second LED lamp meet the target luminous intensity range, use the testing equipment in the constructed testing environment to determine a first testing resistor range corresponding to the first LED lamp and a second testing resistor range corresponding to the second LED lamp;

[0007] Based on the first testing resistor range and the second testing resistor range, determine a target resistor range corresponding to the LED lamp group in the working state.

[0008] Optionally, after determining the target resistor range, the method further includes:

[0009] When both the first LED lamp and the second LED lamp meet the target luminous intensity range, respectively determine a first light guiding test parameter corresponding to the first LED lamp in the testing environment and a second light guiding test parameter corresponding to the second LED lamp in the testing environment;

[0010] Based on the first light guiding test parameter and the second light guiding test parameter, determine the target light guiding parameter corresponding to the LED lamp group in the working state.

[0011] Optionally, the method further includes:

[0012] Place the first LED lamp and the second LED lamp at the test positions in the test environment respectively for testing, where the test environment is different from the usage environment of the first LED lamp and / or the second LED lamp.

[0013] Optionally, the test device includes a variable resistor. When the first LED lamp and the second LED lamp both meet the target luminous intensity range, use the test device in the constructed test environment to determine the first test resistance range corresponding to the first LED lamp and the second test resistance range corresponding to the second LED lamp, including:

[0014] Apply a corresponding test voltage to the first LED lamp installed at the test position;

[0015] Adjust the variable resistor, and determine the first test resistance range when the target luminous intensity range is met;

[0016] Apply a corresponding test voltage to the second LED lamp installed at the test position;

[0017] Adjust the variable resistor, and determine the second test resistance range when the target luminous intensity range is met.

[0018] Optionally, based on the first test resistance range and the second test resistance range, determine the target resistance range corresponding to the LED lamp group in the working state, including:

[0019] Compare the first test resistance range with the second test resistance range;

[0020] Determine the overlapping part of the first test resistance range and the second test resistance range as the target resistance range.

[0021] Optionally, based on the first test resistance range and the second test resistance range, determine the target resistance range corresponding to the LED lamp group in the working state, including:

[0022] Determine the light guiding test parameter corresponding to the LED lamp group;

[0023] When the light guiding test parameter remains unchanged, determine the overlapping part of the first test resistance range and the second test resistance range as the target resistance range.

[0024] An embodiment of the present application also provides a test system for an LED lamp, including:

[0025] A selection module configured to determine a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from an LED lamp group, wherein the first luminous intensity is less than the second luminous intensity;

[0026] A test device includes a variable resistor, an illuminance meter, and a controller. The illuminance meter is used to determine a target luminous intensity range of the first LED lamp and the second LED lamp. The controller is configured to control the variable resistor to slide and change when both the first LED lamp and the second LED lamp meet the target luminous intensity range, so as to determine a first test resistor range corresponding to the first LED lamp and a second test resistor range corresponding to the second LED lamp. The controller is further configured to determine a target resistor range corresponding to the LED lamp group in the working state based on the first test resistor range and the second test resistor range.

[0027] Optionally, the system further includes a light guide column module for conducting the luminous light of the LED lamp group,

[0028] The light guide column module is configured to respectively determine a first light guide test parameter corresponding to the first LED lamp in the test environment and a second light guide test parameter corresponding to the second LED lamp in the test environment when both the first LED lamp and the second LED lamp meet the target luminous intensity range.

[0029] An embodiment of the present application also provides an electronic device, including: a memory and a processor. An executable program is stored in the memory, and the processor executes the executable program to implement the steps of the method as described above.

[0030] An embodiment of the present application also provides a storage medium carrying one or more computer programs, and when the one or more computer programs are executed by a processor, the steps of the method as described above are implemented.

[0031] This test method can, for multiple LED lamps, determine relevant devices such as current-limiting resistors adapted to them according to the actual parameters of the LED lamps, so that after using the current-limiting resistors in the production process of the electronic device, it can be adapted to multiple LED lamps with similar parameters to be installed, thereby making the electronic device more adaptable and reducing the production cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 is a flowchart of the test method for the LED lamp according to the embodiment of the present application;

[0033] Figure 2 Flow chart of an embodiment of the test method according to an embodiment of the present application;

[0034] Figure 3 For the embodiment of the present application Figure 1 Flow chart of an embodiment of step S200 in;

[0035] Figure 4 For the embodiment of the present application Figure 1 Flow chart of an embodiment of step S300 in;

[0036] Figure 5 For the embodiment of the present application Figure 1 Flow chart of another embodiment of step S300 in;

[0037] Figure 6 Schematic diagram of the connection relationship of the test equipment for the LED lamp according to the embodiment of the present application;

[0038] Figure 7 Schematic diagram of the connection line between the controller and other test equipment according to the embodiment of the present application;

[0039] Figure 8 Schematic diagram for determining the target resistance range according to the embodiment of the present application;

[0040] Figure 9 Block diagram of the structure of the test system according to the embodiment of the present application;

[0041] Figure 10 Block diagram of the structure of the electronic device according to the embodiment of the present application. Detailed implementation manners

[0042] Various solutions and features of the present application are described herein with reference to the accompanying drawings.

[0043] It should be understood that various modifications can be made to the embodiments applied herein. Therefore, the above description should not be regarded as a limitation, but only as an example of the embodiments. Those skilled in the art will think of other modifications within the scope and spirit of the present application.

[0044] The accompanying drawings included in and constituting a part of the specification illustrate the embodiments of the present application, and together with the general description of the present application given above and the detailed description of the embodiments given below are used to explain the principles of the present application.

[0045] These and other features of the present application will become apparent from the following description of the preferred forms of the embodiments given by way of non - limiting example with reference to the accompanying drawings.

[0046] It should also be understood that although the present application has been described with reference to some specific examples, those skilled in the art can surely implement many other equivalent forms of the present application.

[0047] When combined with the accompanying drawings, the above and other aspects, features, and advantages of the present application will become more apparent in view of the following detailed description.

[0048] Specific embodiments of the present application will be described hereinafter with reference to the accompanying drawings; however, it should be understood that the claimed embodiments are merely examples of the present application, which can be implemented in various ways. Well-known and / or repetitive functions and structures are not described in detail to avoid obscuring the present application with unnecessary or redundant details. Therefore, the specific structural and functional details claimed herein are not intended to be limiting, but are merely used as a basis and representative basis for the claims to teach those skilled in the art to use the present application in substantially any suitable detailed structure in a variety of ways.

[0049] This specification may use the phrase "in one embodiment", "in another embodiment", "in yet another embodiment", or "in other embodiments", each of which may refer to one or more of the same or different embodiments according to the present application.

[0050] A testing method for an LED lamp according to an embodiment of the present application, which can be applied to test the LED lamp used in an electronic device to facilitate the electronic device to determine the installation environment of the LED lamp, especially to facilitate the determination of the auxiliary device of the LED lamp in the electronic device, thereby improving the production efficiency of the electronic device. For example, in the design stage of an electronic device, an LED lamp group needs to be used, and the electronic device itself needs to install corresponding auxiliary components to cooperate with the LED lamp group to work. This includes resistors associated with the LED lamp group, but it is necessary to first determine what parameters of the resistors to install. In this embodiment, an independent testing environment can be used to test the LED lamp group. According to the situation where the LED lamp group works normally, such as the light intensity, etc., to determine the parameters of other components that cooperate with the LED lamp group during operation, such as the parameters of the above-mentioned resistors, so as to facilitate the installation of suitable resistors in the electronic device. Since this testing environment can test multiple LED lamps separately, the testing efficiency can be effectively improved.

[0051] The following will describe this method in detail with reference to the accompanying drawings, as Figure 1 shown, the method includes the following steps:

[0052] S100, determine a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from the LED lamp group, where the first luminous intensity is less than the second luminous intensity.

[0053] Exemplarily, the LED lamp group includes a plurality of LED lamps, but the parameters of all the LED lamps are not completely the same, for example, the luminous intensities of the plurality of LED lamps are different. A first LED lamp and a second LED lamp having different parameters are selected from the LED lamp group.

[0054] In one embodiment, the first LED lamp may be an LED lamp selected from the LED lamp group and having the smallest luminous intensity, and the second LED lamp may be an LED lamp selected from the LED lamp group and having the largest luminous intensity. That is, the first LED lamp has a first luminous intensity that is the smallest value among the luminous intensities of all LED lamps, and the second LED lamp has a second luminous intensity that is the largest value among the luminous intensities of all LED lamps.

[0055] After the first LED lamp and the second LED lamp are determined, they can be placed in a test environment and tested using a test system.

[0056] S200, when both the first LED lamp and the second LED lamp meet the target luminous intensity range, determine a first test resistance range corresponding to the first LED lamp and a second test resistance range corresponding to the second LED lamp using a test device in a constructed test environment.

[0057] For example, the test environment may be an environment for testing various parameters of an LED lamp and various parameters of ancillary equipment of the LED lamp, and the test environment corresponds to a test system. Figure 6 The test system includes at least one test device, such as a test device including a variable resistor, an illuminance meter, a light shield, a controller, and a placement structure for placing an LED lamp.

[0058] In this embodiment, in a test environment, a plurality of test devices with different functions are used to continue testing the first LED lamp and the second LED lamp. Under the condition that both the first LED lamp and the second LED lamp meet the target luminous intensity range, a first test resistance range corresponding to the first LED lamp can be determined, that is, when the first LED lamp is adjusted within the first test resistance range, the luminous intensity of the first LED lamp meets the target luminous intensity range. The first test resistance range can be a numerical range. Similarly, a second test resistance range corresponding to the second LED lamp can be determined, that is, when the second LED lamp is adjusted within the second test resistance range, the luminous intensity of the second LED lamp meets the target luminous intensity range, and the second test resistance range can be another numerical range.

[0059] In one embodiment, under the same conditions, when the brightness value of the first LED lamp is the smallest in the LED lamp group and the brightness value of the second LED lamp is the largest in the LED lamp group, the average value in the first test resistance range is less than the average value in the second test resistance range.

[0060] S300. Based on the first test resistance range and the second test resistance range, determine the target resistance range corresponding to the LED lamp group in the working state.

[0061] Exemplarily, the average value of the first test resistance range can be the smallest among the average values of the test resistance ranges corresponding to all the LED lamps in the LED lamp group; the average value of the second test resistance range can be the largest among the average values of the test resistance ranges corresponding to all the LED lamps in the LED lamp group.

[0062] Based on the first test resistance range and the second test resistance range, the target resistance range applicable to all the LED lamps in the LED lamp group can be determined. This target resistance range can be applied in an electronic device. The current-limiting resistor set based on this target resistance range can enable all the LED lamps in the LED lamp group to emit light normally, so that multiple LED lamps can meet the production requirements of the electronic device.

[0063] This test method can, for multiple LED lamps, determine the current-limiting resistor adapted to them according to the actual parameters of the LED lamps, so that after using this current-limiting resistor in the production process of the electronic device, it can be adapted to multiple LED lamps with similar parameters to be installed, thereby making the electronic device more adaptable and reducing the production cost.

[0064] In one embodiment of the present application, after determining the target resistance range, as Figure 2 shown, the method further includes the following steps:

[0065] S400. When both the first LED lamp and the second LED lamp meet the target luminous intensity range, respectively determine the first light guide test parameter corresponding to the first LED lamp in the test environment and the second light guide test parameter corresponding to the second LED lamp in the test environment.

[0066] Exemplarily, when testing the first LED lamp and the second LED lamp, an illuminometer module is needed to detect their luminous intensity. For example, the light emitted by the LED and guided out by the light guide column in the light guide column module is tested through the photosensitive probe of the illuminometer, so that the first light guide test parameter corresponding to the first LED lamp in the test environment and the second light guide test parameter corresponding to the second LED lamp in the test environment can be obtained.

[0067] In one embodiment, with the current-limiting resistor unchanged, a corresponding voltage can be applied to the first LED lamp, and then the first light guide test parameter corresponding to the first LED lamp can be determined. When the first LED lamp operates under the first light guide test parameter, it can emit light normally, and the light-emitting intensity meets the preset requirements. The first light guide test parameter can be the light guide parameter of the light guide column corresponding to the first LED lamp.

[0068] Similarly, with the current-limiting resistor unchanged, a corresponding voltage can be applied to the second LED lamp, and then the second light guide test parameter corresponding to the second LED lamp can be determined. When the second LED lamp operates under the second light guide test parameter, it can emit light normally, and the light-emitting intensity meets the preset requirements.

[0069] S500, based on the first light guide test parameter and the second light guide test parameter, determine the target light guide parameter corresponding to the LED lamp group in the working state.

[0070] Exemplarily, the luminous performances corresponding to the first LED lamp and the second LED lamp are the strongest and the weakest in the LED lamp group respectively. Thus, the light guide effects corresponding to the first light guide parameter and the second light guide parameter can be the weakest and the strongest respectively. Furthermore, based on the first light guide test parameter and the second light guide test parameter, the determined target light guide parameter can enable all the LED lamps in the LED lamp group to emit light normally, ensuring that the light-emitting intensity meets the requirements. The electronic device can determine light guide elements such as light guide columns according to the target light guide parameter, so that the installed light guide elements can be adapted to more LED lamps. The high adaptability can enable the electronic device to reduce production costs.

[0071] In one embodiment of the present application, the method further includes the following steps: place the first LED lamp and the second LED lamp at the test positions in the test environment for testing respectively, where the test environment is different from the usage environment of the first LED lamp and / or the second LED lamp.

[0072] Exemplarily, the test environment in this embodiment is different from the installation environment of the electronic device. Thus, a large number of LED lamp groups can be tested separately. The test environment corresponds to a test system, and the test system includes at least one test device, such as Figure 6 and Figure 7 as shown. For example, the test device includes a variable resistor, an illuminometer, a light-shielding cover, a controller, and an installation structure for placing the LED lamp, etc.

[0073] In a specific embodiment, the controller can select the power supply for the test system, such as selecting the USB interface as the power supply. The controller can appear in the form of a power supply and a resistance control box, which has a display screen capable of displaying the resistance value of the sliding rheostat during the test. The controller can include a single-chip microcomputer, a digital-to-analog conversion module, and a crystal oscillator for providing the clock frequency. The controller is respectively connected to the power supply and the placement structure, delivering power to the placement structure, and the analog-to-digital conversion module can adjust the variable resistor (current-limiting resistor). The placement structure has test positions (which can be jigs) for placing the LED lights, capable of holding the first LED light or the second LED light; a light guide column container for accommodating the light guide column is also provided on the placement structure, which can guide the light emitted by the LED light to the illuminance meter module, and a light-shielding cover is also provided outside the placement structure, which can cover the placement structure to prevent light leakage. During the test, the first LED light and the second LED light can be respectively placed in the jigs, the light guide column can be placed in the container and filled with black rubber clay, the probe of the illuminance meter can be placed at the corresponding position of the jig, after adjusting the relative positions of the three, the LED is lit, and the light-shielding cover is placed outside the placement structure.

[0074] In an embodiment of the present application, the test device includes a variable resistor. When both the first LED light and the second LED light meet the target luminous intensity range, the first test resistance range corresponding to the first LED light and the second test resistance range corresponding to the second LED light are determined by using the test device in the constructed test environment, as Figure 3 shown, including:

[0075] S210, applying a corresponding test voltage to the first LED light installed at the test position;

[0076] S220, adjusting the variable resistor, and determining the first test resistance range when the target luminous intensity range is met;

[0077] S230, applying a corresponding test voltage to the second LED light installed at the test position;

[0078] S240, adjusting the variable resistor, and determining the second test resistance range when the target luminous intensity range is met.

[0079] Exemplarily, the controller can select a power source to supply power to the first LED lamp installed at the test position. For example, USB is selected as the power supply to apply a test voltage to the first LED lamp. The controller can be equipped with a display screen that can display the test voltage of the first LED lamp. The controller has a digital-to-analog conversion module, which can adjust a variable resistor (current-limiting resistor) to adjust the test voltage. The illuminometer module collects the light intensity of the first LED lamp during the adjustment process. When the target luminous intensity range is satisfied, the first test resistor range corresponding to the variable resistor is determined, that is, the light intensity emitted by the first LED lamp within the first test resistor range can meet the target luminous intensity. The target luminous intensity can be set according to the physical parameters of the first LED lamp or according to the actual requirements of the usage scenario.

[0080] Similarly, the digital-to-analog conversion module can adjust a variable resistor (current-limiting resistor) to adjust the test voltage. The illuminometer module collects the light intensity of the second LED lamp during the adjustment process. When the target luminous intensity range is satisfied, the second test resistor range corresponding to the variable resistor is determined, that is, the light intensity emitted by the second LED lamp within the second test resistor range can meet the target luminous intensity.

[0081] In an embodiment of the present application, based on the first test resistor range and the second test resistor range, the target resistor range corresponding to the LED lamp group in the working state is determined, such as Figure 4 and Figure 8 shown, including:

[0082] S310, compare the first test resistor range with the second test resistor range.

[0083] Exemplarily, the values in the first test resistor range can be compared with the values in the second test resistor range, so as to determine which values in the first test resistor range overlap with the values in the second test resistor range and which are different from the values in the second test resistor range.

[0084] S320, determine the overlapping part of the first test resistor range and the second test resistor range as the target resistor range.

[0085] Exemplarily, for the values in the target resistor range corresponding to the overlapping part, the current-limiting resistor can be adjusted within this range so that the luminous intensities of the first LED lamp and the second LED lamp both meet the target luminous intensity requirements. As Figure 8 shown, R1 to R2 is the first test resistor range, R3 to R4 is the second test resistor range, and the overlapping part is Figure 8The shaded part in. After determining the target resistance range, the resistor corresponding to the target resistance range can be installed in the electronic device, and the electronic device can meet the requirements of the LED lamp whose luminous performance is between the first LED lamp and the second LED lamp. The adaptability of the electronic device is enhanced, and the production cost is reduced.

[0086] In an embodiment of the present application, based on the first test resistance range and the second test resistance range, determine the target resistance range corresponding to the LED lamp group in the working state, as Figure 5 shown, including:

[0087] S330, determine the light guide test parameters corresponding to the LED lamp group;

[0088] S340, with the light guide test parameters unchanged, determine the overlapping part of the first test resistance range and the second test resistance range as the target resistance range.

[0089] Exemplarily, when determining the target resistance range, it is necessary to first determine the light guide test parameters corresponding to the LED lamp group. For example, the light guide column corresponding to the LED lamp group can export the light emitted by the LED lamp, and determine the light guide test parameters of the light guide column. With the light guide test parameters unchanged, the above overlapping part is determined as the target resistance range, thus ensuring the accuracy of the target resistance range.

[0090] The embodiment of the present application also provides a test system for an LED lamp, as Figure 6 and Figure 9 shown, including:

[0091] A selection module configured to determine a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from the LED lamp group, wherein the first luminous intensity is less than the second luminous intensity.

[0092] Exemplarily, the LED lamp group includes multiple LED lamps, but the parameters of all the LED lamps are not exactly the same. For example, the luminous intensities of the multiple LED lamps are different. The selection module selects the first LED lamp and the second LED lamp with different parameters from the LED lamp group. For example, the selection module selects the first LED lamp and the second LED lamp through the identification information of each LED lamp.

[0093] In one embodiment, the first LED lamp can be the LED lamp with the minimum luminous intensity selected from the LED lamp group, and the second LED lamp can be the LED lamp with the maximum luminous intensity selected from the LED lamp group. That is, the first LED lamp has the first luminous intensity which is the minimum value among the luminous intensities of all the LED lamps, and the second LED lamp has the second luminous intensity which is the maximum value among the luminous intensities of all the LED lamps.

[0094] After determining the first LED lamp and the second LED lamp, they can be respectively placed in a test environment and tested using a test device.

[0095] A test device, including a variable resistor, an illuminometer, and a controller. Wherein, the illuminometer is used to determine the target luminous intensity range of the first LED lamp and the second LED lamp, and the controller is used to control the variable resistor to slide and change when both the first LED lamp and the second LED lamp meet the target luminous intensity range, so as to determine the first test resistor range corresponding to the first LED lamp and the second test resistor range corresponding to the second LED lamp; the controller is further used to determine the target resistor range corresponding to the LED lamp group in the working state based on the first test resistor range and the second test resistor range.

[0096] Exemplarily, at least one test device is included in this test system. For example, the test device includes a variable resistor, an illuminometer, a light-shielding cover, a controller, and an installation structure for installing the LED lamp, etc.

[0097] In this embodiment, in the test environment, the first LED lamp and the second LED lamp are continuously tested using multiple test devices with different functions. The variable resistor is used to respectively adjust the test voltages of the first LED lamp and the second LED lamp to change their light intensities.

[0098] The illuminometer is used to monitor the light intensities of the first LED lamp and the second LED lamp. When ensuring that both the first LED lamp and the second LED lamp meet the target luminous intensity range, the controller can determine the first test resistor range corresponding to the first LED lamp, that is, when the first LED lamp is adjusted within the first test resistor range, the luminous intensity of the first LED lamp meets the target luminous intensity range. The first test resistor range can be a numerical range. Similarly, the controller can determine the second test resistor range corresponding to the second LED lamp, that is, when the second LED lamp is adjusted within the second test resistor range, the luminous intensity of the second LED lamp meets the target luminous intensity range, and the second test resistor range can be another numerical range.

[0099] In one embodiment, under the same conditions, when the brightness value of the first LED lamp is the smallest in the LED lamp group and the brightness value of the second LED lamp is the largest in the LED lamp group, the average value in the first test resistor range is less than the average value in the second test resistor range.

[0100] Exemplarily, the average value of the first test resistance range can be the smallest among the average values of the test resistance ranges corresponding to all the LED lights in the LED light group; the average value of the second test resistance range can be the largest among the average values of the test resistance ranges corresponding to all the LED lights in the LED light group.

[0101] Based on the first test resistance range and the second test resistance range, the controller can determine a target resistance range suitable for all the LED lights in the LED light group. This target resistance range can be applied to an electronic device, and the current-limiting resistor set based on this target resistance range can enable all the LED lights in the LED light group to emit light normally, so that multiple LED lights can meet the production requirements of the electronic device.

[0102] In an embodiment of the present application, the system further includes a light guide column module for conducting the emitted light of the LED light group.

[0103] The light guide column module is used to respectively determine a first light guide test parameter corresponding to the first LED light in the test environment and a second light guide test parameter corresponding to the second LED light in the test environment when both the first LED light and the second LED light meet the target light emission intensity range.

[0104] Exemplarily, when testing the first LED light and the second LED light, an illuminometer module is required to detect their light emission intensities. For example, the light emitted by the LED and guided out by the light guide column in the light guide column module is tested through the photosensitive probe of the illuminometer, so that a first light guide test parameter corresponding to the first LED light in the test environment and a second light guide test parameter corresponding to the second LED light in the test environment can be obtained.

[0105] In an embodiment, when the current-limiting resistor (which can be a variable resistor) remains unchanged, the controller can apply a corresponding voltage to the first LED light, and then determine the first light guide test parameter corresponding to the first LED light. The first LED light operates under the first light guide test parameter, can emit light normally, and the light emission intensity meets the preset requirements. This first light guide test parameter can be the light guide parameter of the light guide column corresponding to the first LED light.

[0106] Similarly, when the current-limiting resistor remains unchanged, the controller can apply a corresponding voltage to the second LED light, and then determine the second light guide test parameter corresponding to the second LED light. The second LED light operates under the second light guide test parameter, can emit light normally, and the light emission intensity meets the preset requirements.

[0107] Exemplarily, the luminous performance corresponding to the first LED lamp and the second LED lamp is the strongest and the weakest in the LED lamp group respectively. Thus, the light guiding effects corresponding to the first light guiding parameter and the second light guiding parameter can be the weakest and the strongest respectively. Furthermore, based on the first light guiding test parameter and the second light guiding test parameter, the determined target light guiding parameter can enable all the LED lamps in the LED lamp group to emit light normally and ensure that the luminous intensity meets the requirements. The electronic device can determine light guiding elements such as a light guiding column according to the target light guiding parameter, so that the installed light guiding elements can be adapted to more LED lamps. The high adaptability enables the electronic device to reduce production costs.

[0108] In an embodiment of the present application, the test device further includes an installation structure, which has a test position. The test position carries the first LED lamp and the second LED lamp, so that the first LED lamp and the second LED lamp are tested in a test environment, where the test environment is different from the usage environment of the first LED lamp and / or the second LED lamp.

[0109] Exemplarily, the test environment in this embodiment is different from the installation environment of the electronic device. Thus, a large number of LED lamp groups can be tested separately. The test environment corresponds to a test system, and the test system includes at least one test device. For example, the test device includes a variable resistor, an illuminometer, a light-shielding cover, a controller, and an installation structure for installing the LED lamp, etc.

[0110] In a specific embodiment, in combination with Figure 6 and Figure 7 , the controller can select the power supply of the test system, such as selecting a USB interface as the power supply. The controller can appear in the form of a power supply and a resistance value control box, which has a display screen and can display the resistance value of the sliding rheostat during the test. The controller can include a single-chip microcomputer, a digital-to-analog conversion module, and a crystal oscillator for providing a clock frequency. The controller is respectively connected to the power supply and the installation structure, delivers power to the installation structure, and the analog-to-digital conversion module can adjust the variable resistor (current-limiting resistor). The installation structure has a test position (which can be a fixture) for installing the LED lamp and can hold the first LED lamp or the second LED lamp; a light guiding column container for accommodating the light guiding column is also arranged on the installation structure, which can guide the light emitted by the LED lamp to the illuminometer module. A light-shielding cover is also arranged outside the installation structure, and the light-shielding cover can cover the installation structure to prevent light from leaking. During the test, the first LED lamp and the second LED lamp can be respectively placed in the fixture, the light guiding column can be placed in the container and filled with black rubber clay, the probe of the illuminometer can be placed at the corresponding position of the fixture. After adjusting the relative positions of the three, the LED is lit, and the light-shielding cover is placed outside the installation structure.

[0111] In one embodiment of the present application, the test device further includes a power supply module, and the controller is connected to the power supply module;

[0112] The power supply module is used to apply a corresponding test voltage to the first LED lamp installed at the test position, so that the controller adjusts the variable resistor, and when the target luminous intensity range is satisfied, the first test resistance range is determined;

[0113] The power supply module is also used to apply a corresponding test voltage to the second LED lamp installed at the test position, so that the controller adjusts the variable resistor, and when the target luminous intensity range is satisfied, the second test resistance range is determined.

[0114] Exemplarily, the controller can select the power supply module to supply power to the first LED lamp installed at the test position. For example, USB is selected as the power supply to apply a test voltage to the first LED lamp. The controller can have a display screen that can display the test voltage of the first LED lamp. The controller has an analog-to-digital conversion module, and the analog-to-digital conversion module can adjust the variable resistor (current-limiting resistor), thereby adjusting the test voltage. The illuminometer module collects the light intensity of the first LED lamp during the adjustment process. When the target luminous intensity range is satisfied, the first test resistance range corresponding to the variable resistor is determined, that is, the light intensity emitted by the first LED lamp within the first test resistance range can meet the target luminous intensity. The target luminous intensity can be set according to the physical parameters of the first LED lamp or according to the actual requirements of the usage scenario.

[0115] Similarly, the analog-to-digital conversion module can adjust the variable resistor (current-limiting resistor), thereby adjusting the test voltage. The illuminometer module collects the light intensity of the second LED lamp during the adjustment process. When the target luminous intensity range is satisfied, the second test resistance range corresponding to the variable resistor is determined, that is, the light intensity emitted by the second LED lamp within the second test resistance range can meet the target luminous intensity.

[0116] In one embodiment of the present application, the test device is further used for:

[0117] Compare the first test resistance range with the second test resistance range;

[0118] Determine the overlapping part of the first test resistance range and the second test resistance range as the target resistance range.

[0119] In one embodiment of the present application, the test device is further used for:

[0120] Determine the light guide test parameters corresponding to the LED lamp group;

[0121] With the light guide test parameters unchanged, the overlapping part of the first test resistance range and the second test resistance range is determined as the target resistance range.

[0122] Based on the same inventive concept, an embodiment of the present application also provides an electronic device, as Figure 10 shown, including: a memory and a processor, where an executable program is stored in the memory, and the processor executes the executable program to implement the steps of the method as described above.

[0123] The above-mentioned processor may be a general-purpose processor, a digital signal processor, an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The above-mentioned PLD may be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL), or any combination thereof. The general-purpose processor may be a microprocessor or any conventional processor, etc.

[0124] The above-mentioned memory may include non-permanent memory in a computer-readable medium, random access memory (RAM), and / or non-volatile memory in the form of, for example, read-only memory (ROM) or flash memory (flash RAM). The memory is an example of a computer-readable medium.

[0125] An embodiment of the present application also provides a storage medium, which carries one or more computer programs, and when the one or more computer programs are executed by a processor, the steps of the method as described above are implemented.

[0126] The storage medium in this embodiment may be included in an electronic device / system; it may also exist independently and not be assembled into the electronic device / system. The above-mentioned storage medium carries one or more programs, and when the one or more programs are executed, the method according to the embodiment of the present application is implemented.

[0127] According to an embodiment of the present application, the computer-readable storage medium may be a non-volatile computer-readable storage medium, for example, it may include but is not limited to: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the above. In the present application, the computer-readable storage medium may be any tangible medium that contains or stores a program, and this program can be used by or in combination with an instruction execution system, apparatus, or device.

[0128] The above embodiments are only exemplary embodiments of the present application and are not used to limit the present application. The protection scope of the present application is defined by the claims. Those skilled in the art can make various modifications or equivalent replacements within the essence and protection scope of the present application, and such modifications or equivalent replacements should also be regarded as falling within the protection scope of the present application.

Claims

1. A testing method for an LED lamp, characterized in that, Including: Determining a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from an LED lamp group, where the range of the first luminous intensity is less than that of the second luminous intensity, the first LED lamp has the smallest value among the luminous intensities of all the LED lamps, and the second LED lamp has the largest value among the luminous intensities of all the LED lamps; When both the first LED lamp and the second LED lamp meet the target luminous intensity range, determining a first test resistance range corresponding to the first LED lamp and a second test resistance range corresponding to the second LED lamp by using a test device in a constructed test environment; Based on the first test resistance range and the second test resistance range, determining a target resistance range corresponding to the LED lamp group in the working state; where, The determining a target resistance range corresponding to the LED lamp group in the working state based on the first test resistance range and the second test resistance range includes: Comparing the first test resistance range with the second test resistance range; Determining the overlapping part of the first test resistance range and the second test resistance range as the target resistance range.

2. The test method according to claim 1, characterized in that, After determining the target resistance range, the method further includes: When both the first LED lamp and the second LED lamp meet the target luminous intensity range, respectively determining a first light guiding test parameter corresponding to the first LED lamp in the test environment and a second light guiding test parameter corresponding to the second LED lamp in the test environment; Based on the first light guiding test parameter and the second light guiding test parameter, determining a target light guiding parameter corresponding to the LED lamp group in the working state.

3. The test method according to claim 1, wherein The method further includes: Respectively placing the first LED lamp and the second LED lamp at test positions in the test environment for testing, where the test environment is different from the usage environment of the first LED lamp and / or the second LED lamp.

4. The test method according to claim 1, wherein The test device includes a variable resistor. When both the first LED lamp and the second LED lamp meet the target luminous intensity range, determining a first test resistance range corresponding to the first LED lamp and a second test resistance range corresponding to the second LED lamp by using a test device in a constructed test environment includes: Applying a corresponding test voltage to the first LED lamp installed at the test position; Adjusting the variable resistor and determining the first test resistance range when the target luminous intensity range is met; Applying a corresponding test voltage to the second LED lamp installed at the test position; Adjusting the variable resistor and determining the second test resistance range when the target luminous intensity range is met.

5. The test method according to claim 2, wherein The determining a target resistance range corresponding to the LED lamp group in the working state based on the first test resistance range and the second test resistance range includes: Determining the light guiding test parameter corresponding to the LED lamp group; With the light guide test parameters remaining unchanged, the overlapping portion of the first test resistance range and the second test resistance range is determined as the target resistance range.

6. A test system for an LED lamp, characterized in that, Including: A selection module configured to determine a first LED lamp with a first luminous intensity and a second LED lamp with a second luminous intensity from an LED lamp group, where the first luminous intensity is less than the second luminous intensity, the first LED lamp has the minimum value among the luminous intensities of all the LED lamps, and the second LED lamp has the maximum value among the luminous intensities of all the LED lamps; A test device including a variable resistor, an illuminometer, and a controller, where the illuminometer is used to determine the target luminous intensity range of the first LED lamp and the second LED lamp, and the controller is configured to control the variable resistor to slide and change when both the first LED lamp and the second LED lamp meet the target luminous intensity range, so as to determine the first test resistance range corresponding to the first LED lamp and the second test resistance range corresponding to the second LED lamp; the controller is further configured to determine the target resistance range corresponding to the LED lamp group in the working state based on the first test resistance range and the second test resistance range; where The test device is further configured to: compare the first test resistance range with the second test resistance range; and determine the overlapping portion of the first test resistance range and the second test resistance range as the target resistance range.

7. The test system according to claim 6, characterized in that It further includes a light guide column module for conducting the luminous rays of the LED lamp group, The light guide column module is configured to respectively determine the first light guide test parameter corresponding to the first LED lamp in the test environment and the second light guide test parameter corresponding to the second LED lamp in the test environment when both the first LED lamp and the second LED lamp meet the target luminous intensity range.

8. An electronic device, characterized in that, Including: A memory and a processor, where an executable program is stored in the memory, and the processor executes the executable program to implement the steps of the method according to any one of claims 1 to 5.

9. A storage medium, characterized in that, The storage medium carries one or more computer programs, and when the one or more computer programs are executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

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