Test method, device, test equipment and computer medium for earphone noise

Abstract

The application discloses a kind of earphone noise test method, device, test equipment and computer readable storage medium, comprising: control the earphone equipment to be tested to play target audio file according to preset volume value;Wherein, the volume value is the maximum volume value of the earphone equipment to be tested;When the earphone equipment to be tested plays the target audio file, control preset signal acquisition device to detect the working circuit of the earphone equipment to be tested to obtain each induction voltage signal in the working circuit;Determine abnormal induction voltage signal in each induction voltage signal, and determine the noise source and noise characteristic of target noise signal according to the abnormal voltage signal.Using the present application can achieve the technical effect that the test equipment can accurately find the noise source and noise signal characteristics in earphone equipment.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of earphones, and particularly relates to an earphone noise testing method and device, testing equipment and a computer readable storage medium. BACKGROUND

[0002] With the development of the Bluetooth earphone industry, earphone devices are gradually favored by consumers due to their convenient use and easy storage, but earphone devices mainly adopt miniaturized design, so the circuit structure inside the earphone is very compact, thus the magnetic field formed between the circuits in the earphone device during operation can seriously interfere with the speaker of the earphone device, and even cause audible noise.

[0003] Therefore, technicians have to spend more time and effort to solve the earphone noise problem, and in particular, the technicians mainly find the working position of the earphone noise by testing and verifying the earphone device in an anechoic chamber when solving the earphone noise problem, which leads to repeated assembly and whole machine testing of the earphone device by the technicians, resulting in low efficiency of the testing process, and frequent assembly also introduces more uncontrollable variables, further reducing the success rate of the test. SUMMARY

[0004] The embodiments of the present application provide an earphone noise testing method, device, testing equipment and computer readable storage medium, which aims to enable the testing equipment to accurately find the noise source in the earphone device and the signal characteristics of the noise signal.

[0005] To achieve the above-mentioned purpose, the present application provides an earphone noise testing method, which comprises the following steps:

[0006] controlling a to-be-tested earphone device to play a target audio file according to a preset volume value; wherein the volume value is the maximum volume value of the to-be-tested earphone device;

[0007] controlling a preset signal acquisition device to detect the working circuit of the to-be-tested earphone device to obtain each induced voltage signal in the working circuit when the to-be-tested earphone device plays the target audio file;

[0008] determining an abnormal induced voltage signal in each induced voltage signal, and determining the noise source and noise characteristics of the target noise signal according to the abnormal voltage signal.

[0009] Further, the step of controlling the signal acquisition device to detect the working circuit of the to-be-tested earphone device to obtain each induced voltage signal in the working circuit comprises:

[0010] detecting, by the signal acquisition device, a starting position point of the earphone device to be tested to obtain each induced voltage signal of the starting position point, wherein the starting position point is a position of a horn coil in the earphone device to be tested;

[0011] and,

[0012] controlling the signal acquisition device to traverse the working circuit from the starting position point in a preset detection direction to obtain each induced voltage signal in the working circuit.

[0013] Further, the step of controlling the signal acquisition device to detect the starting position point of the earphone device to be tested to obtain each induced voltage signal of the starting position point comprises:

[0014] removing the horn coil in the earphone device to be tested from the working circuit of the earphone device to be tested, and connecting the horn coil to the signal acquisition device;

[0015] controlling the signal acquisition device to detect the starting position point of the earphone device to be tested through the horn coil to obtain each induced voltage signal of the starting position point.

[0016] Further, the step of determining an abnormal induced voltage signal in each induced voltage signal comprises:

[0017] determining a voltage signal frequency spectrum and a voltage signal amplitude corresponding to each of the induced voltage signals;

[0018] determining an abnormal signal frequency spectrum in the working circuit based on each voltage signal frequency spectrum, and determining an abnormal signal amplitude in the working circuit based on each voltage signal amplitude;

[0019] determining the abnormal induced voltage signal according to the abnormal signal frequency spectrum and the abnormal signal amplitude.

[0020] Further, after the step of determining an abnormal induced voltage signal in each induced voltage signal, the method further comprises:

[0021] reproducing a target noise signal based on the abnormal induced voltage signal, and playing out the target noise signal to obtain a noise characteristic of the target noise signal;

[0022] determining a noise solution corresponding to the target noise signal based on the noise characteristic.

[0023] Further, after the step of controlling the earphone device to be tested to play a target audio file at a preset volume value, the method further comprises:

[0024] The sound output device in the headphone device under test is linked to the signal acquisition device, and when the headphone device under test plays the target audio file, the signal acquisition device is controlled to acquire each induced voltage signal in the sound output line of the headphone device under test through the sound output device.

[0025] Based on each of the induced voltage signals, the abnormal induced voltage signal contained in the sound output line is determined, and the noise source and noise characteristics of the target noise signal are determined according to the abnormal induced voltage signal.

[0026] The noise solution corresponding to the target noise signal is determined based on the noise source and the noise characteristics.

[0027] Further, the step of controlling the headphone device under test to play the target audio file according to a preset volume value includes:

[0028] The test headphone device is controlled to play the target audio file according to the volume value in a preset first working mode, wherein the first working mode is an active noise cancellation enabled mode;

[0029] or,

[0030] The test headphone device is controlled to play the target audio file according to the volume value in a preset second working mode, wherein the second working mode is an active noise cancellation off mode;

[0031] or,

[0032] The test headphone device is controlled to play the target audio file at the volume value in a preset third working mode, wherein the third working mode is a transparency mode;

[0033] The method further includes:

[0034] The device under test is controlled to enter a preset broadcast mode or back-connect mode, so as to detect the device under test and obtain each induced voltage signal in the broadcast mode or the back-connect mode.

[0035] Furthermore, to achieve the above objectives, the present invention also provides a testing device for headphone noise, the device comprising:

[0036] A mute playback module is used to control the headphone device under test to play a target audio file at a preset volume value; wherein, the volume value is the maximum volume value of the headphone device under test;

[0037] The signal collection module is configured to control a preset signal collection device to detect a working circuit of the earphone device to be tested to obtain each induced voltage signal in the working circuit when the earphone device to be tested plays the target audio file.

[0038] The voltage analysis module is configured to determine an abnormal induced voltage signal from the induced voltage signals and determine a noise source and noise characteristics of a target noise signal according to the abnormal voltage signal.

[0039] In addition, the present application also provides a test device, which comprises a memory, a processor and an earphone noise test program stored in the memory and executable on the processor, and the earphone noise test program implements the steps of the earphone noise test method when executed by the processor.

[0040] In addition, the present application also provides a computer readable storage medium, which stores an earphone noise test program, and the earphone noise test program implements the steps of the earphone noise test method when executed by a processor.

[0041] The earphone noise test method, device, test device and computer readable storage medium provided by the present application control the earphone device to be tested to play a target audio file at a preset volume value, wherein the volume value is the maximum volume value of the earphone device to be tested; the working circuit of the earphone device to be tested is detected by a preset signal collection device to obtain each induced voltage signal in the working circuit when the earphone device to be tested plays the target audio file; an abnormal induced voltage signal is determined from the induced voltage signals, and a noise source and noise characteristics of a target noise signal are determined according to the abnormal voltage signal.

[0042] In the embodiment, the test device first reads the storage device to obtain the target audio file pre-stored by the technician, and sends the target audio file to the earphone device to be tested to control the earphone device to be tested to play the target audio file in each preset working mode, then the test device controls the signal acquisition device arranged in the test device to facilitate the working circuit of the earphone device to be tested to obtain each induced voltage signal generated on the working circuit when the earphone device to be tested plays the target audio file, finally, the test device inputs each induced voltage signal obtained to the signal processing and amplifying device arranged in the test device, determines the abnormal induced voltage signal contained in the working circuit based on each induced voltage signal, and inputs the abnormal induced voltage signal to the frequency spectrum analysis and display device arranged in the test device, so as to determine the noise source and noise characteristics of the target noise signal corresponding to the abnormal induced voltage signal.

[0043] Therefore, the test device can accurately find the noise source in the earphone device and the signal characteristics of the noise signal by determining the noise source and noise characteristics of the target noise signal based on the abnormal induced voltage signal, so that the test process efficiency is greatly improved, and the time and effort required by the technician are reduced. BRIEF DESCRIPTION OF DRAWINGS

[0044] Figure 1 is a structural schematic diagram of the test device of the hardware running environment involved in the embodiment of the present application;

[0045] Figure 2 is a flowchart of the first embodiment of the earphone noise test method of the present application;

[0046] Figure 3 is a flowchart of the second embodiment of the earphone noise test method of the present application;

[0047] Figure 4 is a flowchart of the third embodiment of the earphone noise test method of the present application;

[0048] Figure 5 is a structural schematic diagram of the test device involved in an embodiment of the earphone noise test method of the present application;

[0049] Figure 6 is a detailed flowchart of an embodiment of the earphone noise test method of the present application;

[0050] Figure 7 The functional module schematic diagram related to the earphone noise testing method embodiment of the present application.

[0051] The implementation, functional features and advantages of the present application will be further explained with reference to the embodiments and the accompanying drawings. DETAILED DESCRIPTION

[0052] It should be understood that the specific embodiments described herein merely exemplify the present application and do not limit the present application.

[0053] Please refer to Figure 1 , Figure 1 The hardware running environment testing device structure schematic diagram related to the embodiment of the present application.

[0054] It should be noted that Figure 1 The hardware running environment testing device structure schematic diagram related to the embodiment of the present application. The testing device of the present application can be a testing device configured with a signal acquisition unit, a signal processing and amplification unit, a spectrum analysis and display unit and a real-time recording and playing unit. The testing device can be a mobile terminal, a data storage control terminal, a PC or a portable computer terminal.

[0055] As Figure 1 shown, the testing device can include a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004 and a memory 1005. The communication bus 1002 is used to realize the connection and communication between the components. The user interface 1003 can include a display, an input unit such as a keyboard. The optional user interface 1003 can further include a standard wired interface, a wireless interface. The network interface 1004 can optionally include a standard wired interface, a wireless interface (such as a wireless fidelity (WIreless-FIdelity, WI-FI) interface). The memory 1005 can be a high-speed random access memory (RAM) memory, or a stable non-volatile memory (Non-Volatile Memory, NVM), such as a magnetic disk memory. The memory 1005 can optionally be a storage device independent of the aforementioned processor 1001.

[0056] Those skilled in the art can understand that Figure 1 The structure shown in the foregoing does not constitute a limitation on the testing device, and can include more or fewer components than the diagram, or combine certain components, or different component arrangements.

[0057] As shown in Figure 1 , the memory 1005 as a storage medium can include an operating system, a data storage module, a network communication module, a user interface module, and a test program of earphone noise.

[0058] In Figure 1 the test device, the network interface 1004 is mainly used for data communication with other devices; the user interface 1003 is mainly used for data interaction with the user; the processor 1001 and the memory 1005 in the test device of the application can be arranged in the test device, and the test device calls the test program of earphone noise stored in the memory 1005 through the processor 1001, and executes the test method of earphone noise provided by the embodiment of the application.

[0059] Based on the above test device, each embodiment of the test method of earphone noise of the application is provided.

[0060] Please refer to Figure 2 , Figure 2 the flowchart of the first embodiment of the test method of earphone noise of the application.

[0061] It should be understood that although the logical order is shown in the flowchart, in some cases, the test method of earphone noise of the application can of course execute the steps shown or described in a different order from here.

[0062] In this embodiment, the test method of earphone noise of the application can include the following steps:

[0063] Step S10: controlling the earphone device to be tested to play a target audio file according to a preset volume value; wherein the volume value is the maximum volume value of the earphone device to be tested;

[0064] The target audio file is an audio file containing silent audio recorded by the technician in advance in a silent environment. The target audio file is stored in the storage device of the test device before the test device is shipped, so that the test device can directly read the storage device to obtain it locally when needed. It can be understood that there are many recording methods and obtaining methods of the target audio file, which are not limited by the application.

[0065] In this embodiment, the test device reads the above storage device to obtain the above target audio file when running, and transmits the target audio file to the above earphone device to be tested. The test device further controls the earphone device to be tested to play the target audio file at the maximum volume value in the preset working mode.

[0066] Exemplarily, for example, as shown in Figure 6 , Figure 6For the detailed flowchart of the embodiment of the test method of the earphone noise of the present application, before the test equipment is running, the test system is first built by the technician, and the test equipment is controlled to solidify the Bluetooth transmission power through the pre-installed software, then the test equipment reads the above-mentioned storage device to obtain the above-mentioned target audio file pre-stored by the technician, and transmits the target audio file to the above-mentioned earphone device to be tested, and then the test device controls the earphone device to be tested to enter each of the above-mentioned working modes pre-set by the technician, and controls the earphone device to be tested to play the target audio file at the maximum volume value of the earphone device to be tested in each of the working modes.

[0067] It should be noted that in the present embodiment, the test equipment can make the Bluetooth transmission power of the above-mentioned earphone device to be tested fixed at the maximum state through the adjustment software pre-configured by the technician, so as to better extract the target noise signal generated by the earphone device to be tested when playing the above-mentioned target audio file in the earphone device to be tested under the condition of ensuring the maximum radiation energy.

[0068] Further, in a feasible embodiment, the step of "controlling the earphone device to be tested to play the target audio file according to the preset volume value" in the above-mentioned step S10 can specifically include:

[0069] Step S101: controlling the earphone device to be tested to play the target audio file according to the volume value in a preset first working mode, wherein the first working mode is an active noise reduction open mode;

[0070] Step S102: controlling the earphone device to be tested to play the target audio file according to the volume value in a preset second working mode, wherein the second working mode is an active noise reduction closed mode;

[0071] Step S103: controlling the earphone device to be tested to play the target audio file according to the volume value in a preset third working mode, wherein the third working mode is a transparent mode;

[0072] The working mode is a running mode preset by the technician for each working element in the earphone device to be in different states, which can include a broadcast mode, a back connection mode, an active noise reduction function open mode, an active noise reduction function close mode, a transparent mode, etc. It can be understood that in different working modes, each working element in the earphone device to be tested should be in the corresponding running state in the working mode. Of course, the setting method of the working mode and the corresponding running parameters of each working mode can refer to the setting method of other earphone devices of the same type, and the present application does not limit this. Similarly, the test device can make the earphone device to be tested enter only one working mode. Of course, the test device can also control the earphone device to be tested to enter multiple working modes, and the present application also does not limit this.

[0073] For example, the test device can control the earphone device to be tested to first enter the active noise reduction open mode preset by the technician. At this time, each working element in the earphone device to be tested enters the working state corresponding to the active noise reduction open mode. The earphone device to be tested plays the target audio file at the maximum volume value, and outputs the audio signal generated by the target audio file through the SPK output device configured in the earphone device to be tested.

[0074] Alternatively,

[0075] The test device can control the earphone device to be tested to enter the active noise reduction close mode preset by the technician. At this time, each working element in the earphone device to be tested enters the working state corresponding to the active noise reduction close mode. The earphone device to be tested plays the target audio file at the maximum volume value, and outputs the audio signal generated by the target audio file through the SPK output device configured in the earphone device to be tested.

[0076] Alternatively,

[0077] The test device can control the earphone device to be tested to enter the transparent mode preset by the technician. At this time, each working element in the earphone device to be tested enters the working state corresponding to the transparent mode. The earphone device to be tested plays the target audio file at the maximum volume value, and outputs the audio signal generated by the target audio file through the SPK output device configured in the earphone device to be tested.

[0078] Further, in a possible embodiment, the earphone noise test method of the present application can further include:

[0079] Step S104: Control the earphone device to be tested to enter the preset broadcast mode or back connection mode to detect the earphone device to be tested in the broadcast mode or the back connection mode to obtain each inductive voltage signal.

[0080] For example, the test equipment can control the headphone device under test to enter a broadcast mode or back-connect mode preset by the technician, and detect the headphone device under test to obtain each induced voltage signal when each working element in the headphone device under test enters the working state corresponding to the broadcast mode or back-connect mode.

[0081] Step S20: When the headphone device under test plays the target audio file, control the preset signal acquisition device to detect the working circuit of the headphone device under test to obtain the induced voltage signals in the working circuit;

[0082] In this embodiment, the induced voltage signal is the voltage signal generated when the spatial electromagnetic field generated by each working element in the headphone device under test changes during operation. That is, when the spatial electromagnetic field changes, the change generated by the spatial electromagnetic field will generate an induced voltage signal on the speaker coil or SPK output device in the headphone device under test. It should be noted that the spatial electromagnetic field mainly includes Bluetooth antenna radiation, battery body radiation, PCB circuit radiation, etc.

[0083] For example, please refer to Figure 5 , Figure 5 This is a schematic diagram of the testing equipment according to an embodiment of the headphone noise testing method of the present invention. When the headphone device under test plays the target audio file, the testing equipment controls the following components configured within the testing equipment: Figure 5 The signal acquisition device shown traverses the operating circuit of the headphone device under test and controls the acquisition device to acquire the induced voltage signals generated on the operating circuit. The test equipment then inputs the acquired induced voltage signals to a device configured within the test equipment, such as... Figure 5 The signal processing and amplification device shown.

[0084] It is understood that, in this embodiment, the aforementioned signal acquisition device is... Figure 5 The signal acquisition unit in the middle, similarly, the aforementioned signal processing and amplification device is the signal acquisition unit. Figure 5 The signal amplification and processing unit in the signal acquisition device is mainly connected to the speaker coil or the SPK output device of the headphone device under test, and the speaker coil or the SPK output device is used as the input of the signal acquisition device. That is, the test device connects the speaker coil to the signal acquisition device through a twisted pair cable so that the speaker coil becomes the input of the signal acquisition device.

[0085] In addition, because the speaker coil in different earphone devices will have different induction to the above-mentioned radiated magnetic field, in the present embodiment, the test device can select the speaker coil or the SPK output device in the above-mentioned earphone device to be tested as the probe of the signal acquisition device, of course, the test device can also set other coils or devices in the above-mentioned earphone device to be tested as the input end of the signal acquisition device, and the present application does not limit this.

[0086] Similarly, the signal processing and amplifying device is used to improve the strength of the signal, increase the communication ability of the system, prolong the transmission distance, reduce the size of the device, and make the device meet a wider range of use, in the present embodiment, the signal processing and amplifying unit is a low-noise amplifying input device, and the deployment position of the audio signal amplifying unit can refer to the deployment position of the remaining signal processing and amplifying devices of the same type.

[0087] Further, in a possible embodiment, the above-mentioned step S20 can specifically include:

[0088] Step S201: controlling the signal acquisition device to detect a starting position point of the earphone device to be tested to obtain each induced voltage signal of the starting position point; wherein the starting position point is the position of the speaker coil in the earphone device to be tested;

[0089] In the present embodiment, when the test device detects that the above-mentioned earphone device to be tested is playing the above-mentioned target audio file, the test device links the speaker coil and the above-mentioned signal acquisition device, so that the speaker coil becomes the input end of the signal acquisition, at the same time, the test device controls the signal acquisition device to detect a starting position point of the speaker coil to obtain each induced voltage signal generated by the starting position point, and then the test device inputs each of the above-mentioned induced voltage signals to the above-mentioned signal processing and amplifying device.

[0090] Step S202: controlling the signal acquisition device to traverse the working circuit from the starting position point according to a preset detection direction to obtain each of the above-mentioned induced voltage signals in the working circuit;

[0091] In the present embodiment, the test device obtains the detection direction preset by the technician, and controls the above-mentioned signal acquisition device to traverse the above-mentioned working circuit according to the detection direction from the above-mentioned starting detection point, and obtains each induced voltage signal generated by each working element on the working circuit through the signal acquisition device, and then the test device inputs each of the above-mentioned induced voltage signals to the above-mentioned signal processing and amplifying device.

[0092] For example, as shown in FIG. 6, the test device can control the signal acquisition device to traverse the working circuit according to the detection direction from the starting position point, and obtain each induced voltage signal generated by each working element on the working circuit through the signal acquisition device. Figure 6As shown, when determining that the earphone device to be tested is playing the target audio file, the test device links the loudspeaker coil in the earphone device to be tested to the signal acquisition device through the twisted pair, so that the loudspeaker coil becomes the signal input end of the signal acquisition device. Then, the test device determines the position of the loudspeaker coil in the working circuit as the starting position point. The test device further controls the signal acquisition device to collect the induced voltage signals generated at the starting test point through the loudspeaker coil. Then, the test device obtains the detection direction preset by the technician, controls the signal acquisition device to traverse the working circuit according to the detection direction, and collects the induced voltage signals generated by each working element on the working circuit through the loudspeaker coil. Finally, the test device inputs the obtained induced voltage signals to the signal processing and amplifying device.

[0093] Further, in a possible implementation, the step of “controlling the signal acquisition device to detect the starting position point of the earphone device to be tested to obtain the induced voltage signals of the starting position point” in the step S201 can specifically include:

[0094] Step S2011: removing the loudspeaker coil in the earphone device to be tested from the working circuit of the earphone device to be tested, and connecting the loudspeaker coil to the signal acquisition device;

[0095] Step S2012: controlling the signal acquisition device to detect the starting position point of the earphone device to be tested through the loudspeaker coil to obtain the induced voltage signals of the starting position point;

[0096] For example, when detecting that the earphone device to be tested is playing the target audio file, the test device separates the loudspeaker coil in the earphone device to be tested from the working circuit, links the loudspeaker coil to the signal acquisition device through the twisted pair, so that the loudspeaker coil becomes the input end of the signal acquisition device. At the same time, the test device determines the position of the loudspeaker coil in the working circuit as the starting position point. Then, the test device controls the signal acquisition device to be close to the starting position point and collect the induced voltage signals generated at the starting position point through the loudspeaker coil. The test device further inputs the induced voltage signals to the signal processing and amplifying device.

[0097] Step S30: determining an abnormal induced voltage signal from the induced voltage signals, and determining the noise source and noise characteristics of the target noise signal according to the abnormal voltage signal;

[0098] In the embodiment, the signal processing and amplifying device amplifies each of the acquired induction voltage signals, and inputs each of the amplified induction voltage signals to a spectrum analysis and display device arranged in the test equipment. The spectrum analysis and display device converts each of the induction voltage signals into a frequency domain waveform, and determines a voltage signal feature and a voltage signal amplitude of each of the induction voltage signals according to the frequency domain waveform. The spectrum analysis and display device uploads the voltage signal feature and the voltage signal amplitude to the test equipment. The test equipment determines an abnormal induction voltage signal included in each of the induction voltage signals, and determines a noise source and a noise feature of the target noise signal according to the abnormal induction voltage signal.

[0099] For example, as shown in FIG. 6, the signal processing and amplifying device amplifies each of the acquired induction voltage signals, and inputs each of the amplified induction voltage signals to the spectrum analysis and display device. Then, the spectrum analysis and display device converts each of the acquired induction voltage signals into a frequency domain waveform, and displays the frequency domain waveform through a display unit connected to the spectrum analysis and display device. The voltage signal feature and the voltage signal amplitude of each of the frequency domain waveforms are acquired through the display unit. The spectrum analysis and display device uploads the voltage signal feature and the voltage signal amplitude to the test equipment. The test equipment determines an abnormal induction voltage signal in each of the induction voltage signals based on the voltage signal feature and the voltage signal amplitude, and determines a voltage source and a voltage feature of the abnormal induction voltage signal through the corresponding induction voltage signal. Finally, the test equipment determines the voltage source of the abnormal induction voltage signal as the noise source of the target noise signal, and determines the noise feature of the target noise signal according to the voltage feature of the abnormal induction voltage signal. Figure 6 For example, as shown in FIG. 6, the signal processing and amplifying device amplifies each of the acquired induction voltage signals, and inputs each of the amplified induction voltage signals to the spectrum analysis and display device. Then, the spectrum analysis and display device converts each of the acquired induction voltage signals into a frequency domain waveform, and displays the frequency domain waveform through a display unit connected to the spectrum analysis and display device. The voltage signal feature and the voltage signal amplitude of each of the frequency domain waveforms are acquired through the display unit. The spectrum analysis and display device uploads the voltage signal feature and the voltage signal amplitude to the test equipment. The test equipment determines an abnormal induction voltage signal in each of the induction voltage signals based on the voltage signal feature and the voltage signal amplitude, and determines a voltage source and a voltage feature of the abnormal induction voltage signal through the corresponding induction voltage signal. Finally, the test equipment determines the voltage source of the abnormal induction voltage signal as the noise source of the target noise signal, and determines the noise feature of the target noise signal according to the voltage feature of the abnormal induction voltage signal.

[0100] Figure 6 For example, as shown in FIG. 6, the signal processing and amplifying device amplifies each of the acquired induction voltage signals, and inputs each of the amplified induction voltage signals to the spectrum analysis and display device. Then, the spectrum analysis and display device converts each of the acquired induction voltage signals into a frequency domain waveform, and displays the frequency domain waveform through a display unit connected to the spectrum analysis and display device. The voltage signal feature and the voltage signal amplitude of each of the frequency domain waveforms are acquired through the display unit. The spectrum analysis and display device uploads the voltage signal feature and the voltage signal amplitude to the test equipment. The test equipment determines an abnormal induction voltage signal in each of the induction voltage signals based on the voltage signal feature and the voltage signal amplitude, and determines a voltage source and a voltage feature of the abnormal induction voltage signal through the corresponding induction voltage signal. Finally, the test equipment determines the voltage source of the abnormal induction voltage signal as the noise source of the target noise signal, and determines the noise feature of the target noise signal according to the voltage feature of the abnormal induction voltage signal.

[0101] ​Further, in a possible implementation, the step of "determining abnormal induced voltage signals from the induced voltage signals" in step S30 can specifically include:

[0102] Step S301: determining the voltage signal spectrum and the voltage signal amplitude of each of the induced voltage signals;

[0103] In this embodiment, the signal amplification device first amplifies each of the induced voltage signals, and inputs each of the amplified induced voltage signals to the spectrum analysis and display device, so as to determine the voltage signal spectrum and the voltage signal amplitude of each of the induced voltage signals by the spectrum analysis and display device.

[0104] Step S302: determining the abnormal signal spectrum in the working circuit based on the voltage signal spectrum, and determining the abnormal signal amplitude in the working circuit based on the voltage signal amplitude;

[0105] In this embodiment, after determining the voltage signal spectrum and the voltage signal amplitude of each of the induced voltage signals, the spectrum analysis and display device uploads each of the voltage signal spectrum and each of the voltage signal amplitude to the test device, so as to determine the abnormal signal spectrum in each of the voltage signal spectrum by the test device, and to screen each of the voltage signal amplitude by the test device, so as to determine the abnormal signal amplitude in each of the voltage signal amplitude.

[0106] Step S303: determining the abnormal induced voltage signals according to the abnormal signal spectrum and the abnormal signal amplitude;

[0107] In this embodiment, after determining the abnormal signal spectrum and the abnormal signal amplitude, the test device determines the induced voltage signal corresponding to the abnormal signal spectrum and the abnormal signal amplitude as the abnormal induced voltage signal.

[0108] Exemplarily, for example, the signal amplification device first amplifies each of the acquired above-mentioned induced voltage signals, and inputs each of the amplified induced voltage signals to the above-mentioned spectrum analysis and display device. The spectrum analysis and display device further converts each of the induced voltage signals into a frequency domain waveform, and further determines a voltage signal spectrum and a voltage signal amplitude corresponding to each of the induced voltage signals through the frequency domain waveform. Then, the spectrum analysis and display device uploads each of the voltage signal spectrum and the voltage signal amplitude to the test equipment. Meanwhile, the test equipment acquires a standard induced voltage characteristic preset by a technician, and compares each of the voltage signal spectrum with the standard induced voltage characteristic to determine an abnormal signal spectrum in the voltage signal spectrum. Meanwhile, the test equipment compares each of the voltage signal amplitudes with the standard induced voltage characteristic to determine an abnormal signal amplitude in the voltage signal amplitude. The test equipment further determines an induced voltage signal corresponding to the abnormal signal spectrum and the abnormal signal amplitude as the above-mentioned abnormal induced voltage signal.

[0109] In the embodiment, the test equipment first reads the above-mentioned storage device to acquire the above-mentioned target audio file when in operation, and transmits the target audio file to the earphone device to be tested. The test equipment further controls the earphone device to be tested to play the target audio file at a maximum volume value in each of the preset working modes. Then, the test equipment controls a signal acquisition device arranged in the test equipment to traverse a working circuit of the earphone device to be tested, and controls the signal acquisition device to acquire each of the induced voltage signals generated on the working circuit when the earphone device to be tested plays the target audio file. The test equipment further inputs each of the acquired induced voltage signals to a signal processing and amplification device arranged in the test equipment. Finally, the signal processing and amplification device amplifies each of the acquired above-mentioned induced voltage signals, and inputs each of the amplified induced voltage signals to a spectrum analysis and display device arranged in the test equipment. The spectrum analysis and display device converts each of the induced voltage signals into a frequency domain waveform, and further determines a voltage signal characteristic and a voltage signal amplitude corresponding to each of the induced voltage signals according to the frequency domain waveform. The test equipment further determines an abnormal induced voltage signal contained in each of the induced voltage signals, and further determines a noise source and a noise characteristic of a target noise signal according to the abnormal induced voltage signal.

[0110] Therefore, the application adopts the control signal collection device to traverse the working circuit of the earphone device to be tested to obtain each induced voltage signal in the working circuit, and judges the abnormal induced voltage signal existing in the working circuit based on each induced voltage signal, solves the problem that the technical personnel need to repeatedly assemble and test the earphone to determine the abnormal induced voltage signal, and determines the noise source and noise characteristics of the target noise signal according to the abnormal induced voltage signal, so as to accurately find the noise source in the earphone device and the signal characteristics of the noise signal, and the efficiency of the test process is greatly improved, and the time and effort of the technical personnel need to be invested are reduced.

[0111] Further, based on the first embodiment of the earphone noise test method of the application, the second embodiment of the earphone noise test method of the application is proposed.

[0112] Please refer to Figure 3 , Figure 3 The flowchart of the second embodiment of the earphone noise test method of the application is shown in the above step S30, and the earphone noise test method of the application can further include the following steps:

[0113] Step A10: reproducing a target noise signal based on the abnormal induced voltage signal, and playing out the target noise signal to obtain the noise characteristics of the target noise signal;

[0114] In this embodiment, the test device inputs the acquired abnormal induced voltage signal into the real-time recording and playing unit arranged in the test device, the real-time recording and playing unit reproduces the target noise signal corresponding to the abnormal induced voltage signal according to the abnormal signal spectrum and abnormal signal amplitude corresponding to the abnormal induced voltage signal, and plays out the target noise signal through the sound output device to obtain the noise characteristics of the target noise signal.

[0115] For example, the test device inputs the acquired abnormal induced voltage signal into the real-time recording and playing unit, the real-time recording and playing unit determines the abnormal signal spectrum and abnormal signal amplitude corresponding to the abnormal induced voltage signal, and reproduces the target noise signal corresponding to the abnormal induced voltage signal based on the abnormal signal spectrum and the abnormal signal amplitude, then the real-time recording and playing unit plays out the target noise signal through the SPK output device arranged in the test device, determines the noise characteristics corresponding to the target noise signal, and uploads the noise characteristics to the test device.

[0116] Step A20: determining the noise solution corresponding to the target noise signal based on the noise characteristics;

[0117] In this embodiment, the testing device filters preset solutions based on the acquired noise characteristics to determine the target solution corresponding to the noise characteristics among the solutions, and identifies the target solution as the noise solution.

[0118] For example, after acquiring the noise characteristics, the testing device reads the storage device to obtain solutions pre-stored by the technician. Then, the testing device inputs the noise characteristics and each solution into a data processing device configured within the testing device. The data processing device filters each solution based on the noise characteristics to determine the target solution corresponding to the noise characteristics among the solutions, and uses the target solution as the noise solution.

[0119] In this embodiment, the test device inputs the acquired abnormal induced voltage signal to the real-time recording and playback unit configured within the test device. The real-time recording and playback unit reproduces the target noise signal corresponding to the abnormal induced voltage signal based on the abnormal signal spectrum and abnormal signal amplitude corresponding to the abnormal induced voltage signal. The target noise signal is then amplified through the aforementioned sound output device to obtain the noise characteristics of the target noise signal. Subsequently, the test device filters each preset solution based on the acquired noise characteristics to determine the target solution corresponding to the noise characteristics among each solution, and identifies the target solution as the noise solution.

[0120] Thus, the present invention employs a method in which the implementation recording and playback unit within the testing equipment reproduces the target noise signal according to the abnormal induced voltage signal, and then amplifies the target noise signal to obtain noise characteristics. Based on these noise characteristics, a noise solution is determined. This achieves the goal of enabling testing equipment or technicians to more intuitively understand the noise characteristics, thereby allowing the testing equipment to determine an accurate noise solution based on the noise characteristics and improving the efficiency of the testing process.

[0121] Furthermore, based on the second embodiment of the headphone noise testing method of the present invention described above, a third embodiment of the headphone noise testing method of the present invention is proposed here.

[0122] Please refer to Figure 4 , Figure 4 This is a flowchart illustrating a third embodiment of the headphone noise testing method of the present invention. After step S10 above, the headphone noise testing method of the present invention may further include:

[0123] Step B10: link the sound output device in the earphone device to be tested with the signal acquisition device, and control the signal acquisition device to acquire each induced voltage signal in the sound output circuit of the earphone device to be tested through the sound output device when the earphone device to be tested plays the target audio file;

[0124] In this embodiment, the test device first connects the sound output device in the earphone device to be tested with the signal acquisition device, so that the sound output device becomes the input end of the signal acquisition device. Meanwhile, the test device controls the signal acquisition device to acquire each induced voltage signal generated in the sound output circuit of the earphone device to be tested through the sound output device when the test device detects that the earphone device to be tested plays the target audio file, and inputs each induced voltage signal to the signal processing and amplifying device.

[0125] For example, the test device first connects the SPK output device in the earphone device to be tested with the signal acquisition device through the twisted pair, so that the SPK output device becomes the input end of the signal acquisition device. Then, the test device controls the signal acquisition device to detect the SPK output circuit of the SPK output device in the earphone device to be tested when the test device detects that the earphone device to be tested plays the target audio file, and acquires each induced voltage signal generated in the SPK output circuit through the SPK output device. Finally, the test device inputs each acquired induced voltage signal to the signal processing and amplifying device.

[0126] Step B20: determine the abnormal induced voltage signal contained in the sound output circuit based on each induced voltage signal, and determine the noise source and noise characteristics of the target noise signal according to the abnormal induced voltage signal;

[0127] In this embodiment, the signal processing and amplifying device amplifies each induced voltage signal after receiving each induced voltage signal, and inputs each amplified induced voltage signal to the frequency spectrum analysis and display device. The frequency spectrum analysis and display device converts each amplified induced voltage signal into a frequency domain waveform, and then determines the abnormal induced voltage signal contained in each amplified induced voltage signal according to each frequency domain waveform. Then, the frequency spectrum analysis and display device determines the noise source and noise characteristics of the target noise signal according to the abnormal induced voltage signal.

[0128] Exemplarily, for example, after receiving each of the above-mentioned induced voltage signals generated by the above-mentioned SPK output line, the signal processing amplification device performs amplification processing on each of the induced voltage signals, and inputs each of the amplified induced voltage signals to the above-mentioned spectrum analysis and display device. Then, the spectrum analysis and display device converts each of the acquired induced voltage signals into a frequency domain waveform, and determines the voltage signal spectrum and the voltage signal amplitude corresponding to each of the induced voltage signals through each of the frequency domain waveforms. After that, the spectrum analysis and display device determines the above-mentioned abnormal induced voltage signal in each of the induced voltage signals based on each of the voltage signal spectrum and each of the voltage signal amplitude, and determines the noise characteristic of the target noise signal according to the abnormal signal spectrum and the abnormal signal amplitude corresponding to the abnormal induced voltage signal. At the same time, the spectrum analysis and display device determines the above-mentioned noise source as the position where the abnormal induced voltage signal is generated. Finally, the signal processing amplification device uploads the acquired noise characteristic and the noise source to the test equipment.

[0129] Step B30: determining the noise solution corresponding to the target noise signal according to the noise source and the noise characteristic;

[0130] In this embodiment, after receiving the above-mentioned noise characteristic and the above-mentioned noise source, the test equipment screens each of the preset solutions based on the noise characteristic and the noise source, to determine the target solution corresponding to the noise characteristic in each of the solutions, and determines the target solution as the noise solution.

[0131] Exemplarily, for example, after acquiring the above-mentioned noise characteristic and the above-mentioned noise source, the test equipment reads the above-mentioned storage device to acquire each of the solutions pre-stored by the technician. Then, the test equipment inputs the noise characteristic and the noise source to the data processing device configured in the test equipment respectively, and screens each of the solutions based on the noise characteristic and the noise source by the data processing device, to determine the target solution corresponding to the noise characteristic in each of the solutions, and takes the target solution as the above-mentioned noise solution.

[0132] In the embodiment, the test device first connects the sound output device in the earphone device to be tested to the signal collection device, so that the sound output device becomes the input end of the signal collection device. Meanwhile, the test device controls the signal collection device to collect each of the induced voltage signals generated on the sound output circuit in the earphone device to be tested through the sound output device when the earphone device to be tested is playing the target audio file, and inputs each of the induced voltage signals to the signal processing and amplifying device. After receiving each of the induced voltage signals, the signal processing and amplifying device amplifies each of the induced voltage signals, and inputs each of the amplified induced voltage signals to the frequency spectrum analysis and display device. The frequency spectrum analysis and display device converts each of the induced voltage signals into a frequency domain waveform, determines an abnormal induced voltage signal contained in each of the induced voltage signals according to the frequency domain waveform, determines the noise source and noise characteristics of the target noise signal according to the abnormal induced voltage signal, and finally, the test device receives the noise characteristics and the noise source, and screens each of the preset solutions based on the noise characteristics and the noise source to determine a target solution corresponding to the noise characteristics in each of the solutions, and determines the target solution as a noise solution.

[0133] Thus, the application adopts the method of taking the sound output device of the earphone device as the input end of the signal collection device, collecting each of the induced voltage signals on the sound output circuit through the sound output device, and determining the noise characteristics and noise solution according to the abnormal voltage signal in each of the induced voltage signals, so as to accurately find the noise source in the earphone device and the signal characteristics of the noise signal.

[0134] In addition, the application also provides an earphone noise test device, which is applied to a test device configured with a signal collection device to detect the noise of an earphone device to be tested. Please refer to Figure 7 , Figure 7 The functional module diagram of the earphone noise test method according to an embodiment of the application is shown in Figure 7 The earphone noise test device according to the application includes:

[0135] The mute playing module 10 is configured to control the earphone device to be tested to play the target audio file at a preset volume value. The volume value is the maximum volume value of the earphone device to be tested.

[0136] The signal collection module 20 is configured to control the preset signal collection device to detect the working circuit of the earphone device to be tested to obtain each of the induced voltage signals in the working circuit when the earphone device to be tested is playing the target audio file.

[0137] a voltage analysis module 30, configured to determine an abnormal induced voltage signal from each of the induced voltage signals, and determine a noise source and a noise characteristic of a target noise signal according to the abnormal induced voltage signal.

[0138] Further, the signal collection module 20 comprises:

[0139] a first acquisition unit, configured to control the signal acquisition device to detect a starting position point of the earphone device to be tested to obtain each induced voltage signal of the starting position point; wherein the starting position point is a position of a horn coil in the earphone device to be tested.

[0140] a second acquisition unit, configured to control the signal acquisition device to traverse the working circuit from the starting position point according to a preset detection direction to obtain each induced voltage signal in the working circuit.

[0141] Further, the first acquisition unit comprises:

[0142] a circuit separation sub-unit, configured to remove the horn coil in the earphone device to be tested from a working circuit of the earphone device to be tested, and connect the horn coil to the signal acquisition device.

[0143] a first detection sub-unit, configured to control the signal acquisition device to detect the starting position point of the earphone device to be tested through the horn coil to obtain each induced voltage signal of the starting position point.

[0144] Further, the voltage analysis module 30 comprises:

[0145] a signal decomposition unit, configured to determine a voltage signal frequency spectrum and a voltage signal amplitude corresponding to each of the induced voltage signals.

[0146] a signal screening unit, configured to determine an abnormal signal frequency spectrum in the working circuit based on each of the voltage signal frequency spectrums, and determine an abnormal signal amplitude in the working circuit based on each of the voltage signal amplitudes.

[0147] an abnormality confirmation unit, configured to determine the abnormal induced voltage signal according to the abnormal signal frequency spectrum and the abnormal signal amplitude.

[0148] Further, the voltage analysis module 30 further comprises:

[0149] a noise reproduction unit, configured to reproduce a target noise signal based on the abnormal induced voltage signal, and play out the target noise signal to obtain a noise characteristic of the target noise signal.

[0150] The first determination unit is configured to determine a noise solution corresponding to the target noise signal based on the noise feature.

[0151] Further, the signal collection module 20 comprises:

[0152] The device linking unit is configured to link the sound output device in the earphone device to be tested with the signal acquisition device, and control the signal acquisition device to acquire each induced voltage signal in the sound output line of the earphone device to be tested through the sound output device when the earphone device to be tested plays the target audio file.

[0153] The third acquisition unit is configured to determine an abnormal induced voltage signal contained in the sound output line based on each induced voltage signal, and determine a noise source and a noise feature of a target noise signal according to the abnormal induced voltage signal.

[0154] The second determination unit is configured to determine a noise solution corresponding to the target noise signal according to the noise source and the noise feature.

[0155] Further, the mute playing module 10 comprises:

[0156] The first playing unit is configured to control the earphone device to be tested to play the target audio file according to the volume value in a preset first working mode, wherein the first working mode is an active noise reduction open mode.

[0157] The second playing unit is configured to control the earphone device to be tested to play the target audio file according to the volume value in a preset second working mode, wherein the second working mode is an active noise reduction closed mode.

[0158] The third playing unit is configured to control the earphone device to be tested to play the target audio file according to the volume value in a preset third working mode, wherein the third working mode is a transparent mode.

[0159] The third acquisition unit is configured to control the earphone device to be tested to enter a preset broadcast mode or a loopback mode, so as to acquire each induced voltage signal by detecting the earphone device to be tested in the broadcast mode or the loopback mode.

[0160] In addition, the present application also provides a test device, which has an earphone noise test program capable of running on a processor, and when the test device executes the earphone noise test program, the steps of the earphone noise test method according to any one of the above embodiments are realized.

[0161] The specific embodiments of the test device of the present application are basically the same as those of the above-mentioned earphone noise test method, and will not be repeated here.

[0162] Further, the application also provides a computer readable storage medium, wherein a test program of earphone noise is stored on the computer readable storage medium, and the test program of earphone noise realizes the steps of the test method of earphone noise according to any one of the above embodiments when executed by a processor.

[0163] The specific embodiments of the computer readable storage medium of the application are basically the same as the above-mentioned embodiments of the test method of earphone noise, and will not be repeated here.

[0164] It should be noted that in this paper, the term "comprise", "include" or any other variant thereof is intended to cover non-exclusive inclusion, so that the process, method, article or system including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or system. Without more limitations, the element defined by the statement "comprises a" does not exclude the presence of another identical element in the process, method, article or system including the element.

[0165] The above-mentioned serial numbers of the embodiments of the application are only for description, and do not represent the advantages and disadvantages of the embodiments.

[0166] Through the description of the above embodiments, those skilled in the art can clearly understand that the above-mentioned embodiment method can be realized by software and necessary general hardware platform, of course, it can also be realized by hardware, but in many cases, the former is a better embodiment. Based on such understanding, the technical solutions of the application can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a plurality of instructions for making a terminal device (which can be a test device configured with a signal acquisition unit, a signal processing and amplification unit, a frequency spectrum analysis and display unit, and a real-time recording and playing unit, and the test device can be a mobile terminal, a data storage control terminal, a PC or a portable computer terminal, etc.) execute the method described in each embodiment of the application.

[0167] The above is only the preferred embodiment of the application, and does not limit the patent scope of the application, and any equivalent structure or equivalent flow transformation made by using the content of the specification and drawings of the application, or directly or indirectly applied to other related technical fields, are also included in the patent protection scope of the application.

Claims

1. A method for testing headphone noise, characterized in that, The headphone noise testing method includes the following steps: The test headphone device is controlled to play a target audio file at a preset volume value; wherein the volume value is the maximum volume value of the test headphone device. When the headphone device under test plays the target audio file, a preset signal acquisition device is controlled to detect the working circuit of the headphone device under test to obtain the induced voltage signals in the working circuit. The induced voltage signals are the voltage signals generated by each working element in the working circuit during operation. Determine the voltage signal spectrum and voltage signal amplitude corresponding to each of the induced voltage signals; The abnormal signal spectrum within the working circuit is determined based on the spectrum of each voltage signal, and the abnormal signal amplitude within the working circuit is determined based on the amplitude of each voltage signal. An abnormal induced voltage signal is determined based on the abnormal signal spectrum and the abnormal signal amplitude, and the noise source and noise characteristics of the target noise signal are determined based on the abnormal induced voltage signal, wherein the noise source is the location where the abnormal induced voltage signal is generated.

2. The headphone noise testing method as described in claim 1, characterized in that, The step of controlling the signal acquisition device to detect the working circuit of the headphone device under test to obtain various induced voltage signals in the working circuit includes: The signal acquisition device is controlled to detect the starting position point of the headphone device under test to obtain the induced voltage signals at the starting position point; wherein, the starting position point is the location of the speaker coil inside the headphone device under test; and, The signal acquisition device is controlled to traverse the working circuit from the starting position point in a preset detection direction to obtain each of the induced voltage signals in the working circuit.

3. The headphone noise testing method as described in claim 2, characterized in that, The step of controlling the signal acquisition device to detect the starting position point of the headphone device under test and obtain the induced voltage signals at the starting position point includes: Remove the speaker coil from the working circuit of the headphone device under test, and connect the speaker coil to the signal acquisition device; The signal acquisition device is controlled to detect the starting position point of the headphone device under test through the speaker coil to obtain the induced voltage signals at the starting position point.

4. The headphone noise testing method as described in claim 1, characterized in that, After determining the abnormal induced voltage signal among the induced voltage signals, the method further includes: The target noise signal is reproduced based on the abnormal induced voltage signal, and the target noise signal is amplified to obtain the noise characteristics of the target noise signal; Based on the noise characteristics, a noise solution corresponding to the target noise signal is determined.

5. The headphone noise testing method as described in claim 1, characterized in that, After the step of controlling the headphone device under test to play the target audio file at a preset volume value, the method further includes: The sound output device in the headphone device under test is linked to the signal acquisition device, and when the headphone device under test plays the target audio file, the signal acquisition device is controlled to acquire each induced voltage signal in the sound output line of the headphone device under test through the sound output device. Based on each of the induced voltage signals, the abnormal induced voltage signal contained in the sound output line is determined, and the noise source and noise characteristics of the target noise signal are determined according to the abnormal induced voltage signal. The noise solution corresponding to the target noise signal is determined based on the noise source and the noise characteristics.

6. The headphone noise testing method as described in claim 1, characterized in that, The step of controlling the headphone device under test to play the target audio file according to a preset volume value includes: The test headphone device is controlled to play the target audio file according to the volume value in a preset first working mode, wherein the first working mode is an active noise cancellation enabled mode; or, The test headphone device is controlled to play the target audio file according to the volume value in a preset second working mode, wherein the second working mode is an active noise cancellation off mode; or, The test headphone device is controlled to play the target audio file at the volume value in a preset third working mode, wherein the third working mode is a transparency mode; The method further includes: The device under test is controlled to enter a preset broadcast mode or back-connect mode, so as to detect the device under test and obtain each induced voltage signal in the broadcast mode or the back-connect mode.

7. A testing device for headphone noise, characterized in that, The device includes: A mute playback module is used to control the headphone device under test to play a target audio file at a preset volume value; wherein, the volume value is the maximum volume value of the headphone device under test; The signal acquisition module is used to control a preset signal acquisition device to detect the working circuit of the headphone device under test when the headphone device under test plays the target audio file, so as to obtain the induced voltage signals in the working circuit. The induced voltage signals are the voltage signals generated by each working element in the working circuit during operation. The voltage analysis module is used to determine the voltage signal spectrum and voltage signal amplitude corresponding to each of the induced voltage signals, determine the abnormal signal spectrum in the working circuit based on the voltage signal spectrum, and determine the abnormal signal amplitude in the working circuit based on the voltage signal amplitude. An abnormal induced voltage signal is determined based on the abnormal signal spectrum and the abnormal signal amplitude, and the noise source and noise characteristics of the target noise signal are determined based on the abnormal induced voltage signal, wherein the noise source is the location where the abnormal induced voltage signal is generated.

8. A testing device, characterized in that, The testing device includes: a memory, a processor, and a headphone noise testing program stored in the memory and executable on the processor. When the headphone noise testing program is executed by the processor, it implements the steps of the headphone noise testing method as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a test program for headphone noise, which, when executed by a processor, implements the steps of the headphone noise test method as described in any one of claims 1 to 6.

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