BMS testing methods, BMS testing equipment, electronic equipment and storage media

Abstract

This application provides a BMS testing method, BMS testing device, electronic device, and storage medium. By acquiring test data output from an external testing device, a test value is obtained by detecting the test data. If the test value meets preset test input conditions, the test channel between the external testing device and the test fixture is closed, allowing test data to be input to the test fixture through the test channel. The BMS placed on the test fixture is then tested to obtain the BMS test result. This application, by detecting the test data output from the external testing device, avoids abnormal test data caused by malfunctions in the external testing device, thereby preventing the test fixture from using abnormal test data to test the BMS and causing damage to the BMS circuit components.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of BMS battery management system testing, and particularly relates to a BMS testing method, a BMS testing device, an electronic device and a storage medium. BACKGROUND

[0002] In order to improve the quality of the BMS, the BMS will be tested for effectiveness, safety, aging and other quality when it is shipped. However, when the test tool is connected to the BMS for power-on testing, the overload of the voltage, current and power output from the test tool to the BMS will cause damage to the BMS circuit device. SUMMARY

[0003] The main purpose of the embodiments of the present application is to provide a BMS testing method, a BMS testing device, an electronic device and a storage medium, which can avoid damage to the BMS circuit device caused by abnormal test data output from the tool.

[0004] To achieve the above purpose, a first aspect of the embodiments of the present application provides a BMS testing method, which comprises:

[0005] obtaining test data output from an external testing device;

[0006] obtaining a detection value obtained by detecting the test data;

[0007] If the detection value meets a preset test input condition, a test channel between the external testing device and a test tool is closed, so that the test data can be input to the test tool through the test channel, a BMS placed on the test tool is tested, and a test result of the BMS is obtained.

[0008] In some embodiments, the detection value includes a voltage value, a current value, a temperature value and a power value, and if the detection value meets the preset test input condition, the test channel between the external testing device and the test tool is closed, which includes:

[0009] If the voltage value is within a preset voltage range, the current value is within a preset current range, the temperature value is within a preset temperature range, and the power value is within a preset power range, the test channel is closed.

[0010] In some embodiments, the BMS placed on the test tool is tested, and the test result of the BMS is obtained, which includes:

[0011] obtaining a product parameter value obtained by testing the BMS;

[0012] If the product parameter value meets the preset product test condition, it is determined that the test result of the BMS is non-defective.

[0013] If the product parameter value does not meet the preset product test condition, it is determined that the test result of the BMS is defective.

[0014] In some embodiments, after the detection value of the test data is obtained, the BMS test method further includes:

[0015] If the detection value does not meet the preset test input condition, first prompt information and second prompt information are generated, the first prompt information is used to prompt the inspection of the external test equipment, and the second prompt information is used to prompt the inspection of the test channel between the external test equipment and the test work.

[0016] In some embodiments, after the detection value of the test data is obtained, the BMS test method further includes:

[0017] If the detection value does not meet the preset test input condition, the test channel between the external test equipment and the test tool is controlled to be disconnected, and the external test equipment is controlled to be closed.

[0018] In some embodiments, if the detection value meets the preset test input condition, the test channel between the external test equipment and the test tool is controlled to be closed, including:

[0019] If the detection value meets the test input condition of all test channels, all test channels between the external test equipment and the test tool are controlled to be closed.

[0020] In some embodiments, the test channel is provided with an electronic switch, and the control of the test channel between the external test equipment and the test tool includes:

[0021] A closing signal is sent to the electronic switch, the electronic switch receives the closing signal, and the test channel is closed.

[0022] To achieve the above-mentioned purpose, a second aspect of the embodiment of the present application proposes a BMS test device, the device includes:

[0023] A first acquisition module is configured to acquire test data output by an external test equipment;

[0024] A second acquisition module is configured to acquire a detection value obtained by detecting the test data;

[0025] The BMS testing module is used to control the closure of the test channel between the external testing equipment and the test fixture if the detected value meets the preset test input conditions, so that the test data can be input to the test fixture through the test channel to test the BMS placed on the test fixture and obtain the test result of the BMS.

[0026] To achieve the above objectives, a third aspect of this application provides an electronic device, which includes a memory, a processor, a program stored in the memory and executable on the processor, and a data bus for enabling communication between the processor and the memory. When the program is executed by the processor, it implements the method described in the first aspect above.

[0027] To achieve the above objectives, a fourth aspect of the present application provides a storage medium, which is a computer-readable storage medium for computer-readable storage, wherein the storage medium stores one or more programs that can be executed by one or more processors to implement the method described in the first aspect.

[0028] The BMS testing method, BMS testing device, electronic device, and storage medium proposed in this application acquire test data output from an external testing device, obtain test values ​​obtained by detecting the test data, and if the test values ​​meet preset test input conditions, control the closure of the test channel between the external testing device and the test fixture, so that the test data can be input to the test fixture through the test channel to test the BMS placed on the test fixture and obtain the test results of the BMS. By detecting the test data output by the external testing device, this embodiment of the application can avoid abnormal test data caused by abnormal external testing device, thereby preventing the test fixture from testing the BMS with abnormal test data, which could lead to damage to the BMS circuit components. Attached Figure Description

[0029] Figure 1 This is a first flowchart of the BMS testing method provided in the embodiments of this application;

[0030] Figure 2 yes Figure 1 The flowchart of step S130 in the process;

[0031] Figure 3 This is a second flowchart of the BMS testing method provided in the embodiments of this application;

[0032] Figure 4 This is a first structural schematic diagram of the BMS testing device provided in the embodiments of this application;

[0033] Figure 5This is a second structural schematic diagram of the BMS testing device provided in the embodiments of this application;

[0034] Figure 6 This is a schematic diagram of the hardware structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0035] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0036] It should be noted that although functional modules are divided in the device schematic diagram and a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flowchart. The terms "first," "second," etc., in the specification, claims, and the aforementioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0038] First, let's analyze some of the terms used in this application:

[0039] Test fixtures are devices used to verify whether a product meets expected specifications. When a product fails to meet specifications, the test fixture will output a corresponding response.

[0040] A Battery Management System (BMS) is an electronic system or circuit used to monitor and maintain the health and capacity of a battery or battery pack. It can monitor charging, discharging, temperature, and other factors that affect the state of the battery or battery pack.

[0041] The power battery system is a crucial component of new energy electric vehicles. The Battery Management System (BMS) is the management system for the power battery, used for intelligent management and maintenance of each battery cell to prevent overcharging and over-discharging, thus extending battery life and ensuring battery safety. By monitoring the status of each battery cell, the BMS issues alarms when battery faults are detected, ensuring the safety of the entire vehicle system. The quality of the BMS is critical to the safety of both the battery system and the entire vehicle system. To improve BMS quality, effectiveness, safety, and aging tests are conducted before the BMS leaves the factory.

[0042] In related technologies, when a BMS board is off-lined, it is connected to a testing fixture for data acquisition and power-on testing. The test results are used to determine whether the product functions normally, thus ensuring the quality of the BMS. However, when the BMS is connected to the testing fixture for data acquisition and power-on testing, if the power and other parameters of the testing fixture were not retrieved during a previous high-power test, the voltage, current, and power output from the testing fixture to the BMS may be overloaded, which could damage the BMS circuit components.

[0043] Based on this, embodiments of this application provide a BMS testing method, a BMS testing device, an electronic device, and a storage medium, aiming to avoid damage to BMS circuit devices caused by abnormal test data output from the tooling.

[0044] The BMS testing method, BMS testing device, electronic device and storage medium provided in the embodiments of this application are specifically described through the following embodiments. First, the BMS testing method in the embodiments of this application is described.

[0045] The BMS testing method provided in this application relates to the field of BMS battery management system testing technology. The BMS testing method provided in this application can be applied to a terminal, a server, or software running on either a terminal or a server. In some embodiments, the terminal can be a smartphone, tablet, laptop, desktop computer, etc.; the server can be configured as an independent physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, CDN, and big data and artificial intelligence platforms; the software can be an application implementing the BMS testing method, but is not limited to the above forms.

[0046] This application can be used in a wide variety of general-purpose or special-purpose computer system environments or configurations. Examples include: personal computers, server computers, handheld or portable devices, tablet devices, multiprocessor systems, microprocessor-based systems, set-top boxes, programmable consumer electronics, network PCs, minicomputers, mainframe computers, and distributed computing environments including any of the above systems or devices. This application can be described in the general context of computer-executable instructions executed by a computer, such as program modules. Generally, program modules include routines, programs, objects, components, data structures, etc., that perform specific tasks or implement specific abstract data types. This application can also be practiced in distributed computing environments where tasks are performed by remote processing devices connected via a communication network. In distributed computing environments, program modules can reside in local and remote computer storage media, including storage devices.

[0047] Figure 1 This is an optional flowchart of the BMS testing method provided in the embodiments of this application. Figure 1 The method may include, but is not limited to, steps S110 to S130.

[0048] Step S110: Obtain test data output by external test equipment;

[0049] Step S120: Obtain the detection value obtained by detecting the test data;

[0050] Step S130: If the detected value meets the preset test input conditions, control the test channel between the external test equipment and the test fixture to close, so that the test data can be input to the test fixture through the test channel, and the BMS placed on the test fixture is tested to obtain the test result of the BMS.

[0051] In step S110 of some embodiments, the BMS is placed on the test fixture, and the test input conditions are set in advance in the host computer to complete the pre-test preparation. After the pre-test preparation is completed, the host computer sends a test command to the external test equipment. After receiving the test command, the external test equipment outputs test data, and the host computer obtains the test data output by the external test equipment. The test data can be parameters such as voltage, current, power, and temperature.

[0052] In step S120 of some embodiments, the specific value of the test data output by the external test device is measured by a digital multimeter to obtain the corresponding detection value. The host computer obtains the detection value, which can be a voltage value, current value, temperature value, or power value.

[0053] In step S130 of some embodiments, an electronic switch is provided on the test channel. If the detected value meets the preset test input conditions, the host computer sends a closing signal to the electronic switch to control the closure of the test channel between the external test equipment and the test fixture, allowing test data to be input to the test fixture through the test channel. The electronic switch can be a relay, a switching diode, a switching transistor, etc. If the detected value does not meet the preset test input conditions, the test is not performed. The host computer generates a first prompt message and a second prompt message, and sends a disconnect signal to the electronic switch to control the disconnection of the test channel between the external test equipment and the test fixture. Then, a stop test command is sent to the external test equipment so that the external test equipment stops outputting test data after receiving the stop test command. The first prompt message is used to prompt the inspection of the external test equipment, and the second prompt message is used to prompt the inspection of the test channel between the external test equipment and the test fixture. By controlling the test fixture and the external test equipment through the host computer, when the external test equipment is high-voltage equipment, the test personnel do not need to touch the equipment to make the equipment output test data, which can protect the test personnel and avoid the risks caused by contact with high-voltage equipment.

[0054] It should be noted that if the detected value meets the test input conditions of all test channels, then all test channels between the external test equipment and the test fixture will be closed. If the detected value does not meet the test input conditions of a certain test channel, then that test channel between the external test equipment and the test fixture will be disconnected.

[0055] Specifically, if the voltage value is within a preset voltage range, the current value is within a preset current range, the temperature value is within a preset temperature range, and the power value is within a preset power range, a closing signal is sent to the electronic switch to close the test channel. If any detected value does not meet the test input conditions corresponding to that detected value, the test channel is disconnected.

[0056] During testing, the measured values ​​of the test data are acquired. If the measured values ​​do not meet the preset test input conditions, the test is not performed. Monitoring the BMS input (i.e., the test data output from the external test equipment) during the test ensures that BMS circuitry is not damaged due to abnormal BMS input.

[0057] Steps S110 to S130 of this embodiment involve acquiring test data output from an external testing device, obtaining test values ​​by detecting the test data, and controlling the closure of the test channel between the external testing device and the test fixture if the test values ​​meet preset test input conditions. This allows the test data to be input to the test fixture through the test channel, testing the BMS placed on the test fixture, and obtaining the BMS test results. This embodiment obtains test values ​​by detecting the test data output from the external testing device and determining whether the test values ​​meet the test input conditions. Only when the test values ​​meet the test input conditions is the test data output from the external testing device used for BMS testing. This avoids abnormal test data caused by external testing device malfunctions, thus preventing the test fixture from using abnormal test data to test the BMS, which could damage the BMS circuit components. This improves the BMS yield during production and reduces production costs caused by BMS damage due to external testing equipment. Detecting the external inputs required by the BMS before testing ensures that the external inputs do not affect the safety of the BMS circuit components.

[0058] Please see Figure 2 In some embodiments, step S130 may include, but is not limited to, steps S210 to S230:

[0059] Step S210: Obtain the product parameter values ​​obtained from testing the BMS;

[0060] Step S220: If the product parameter values ​​meet the preset product test conditions, then the test result of the BMS is determined to be defect-free.

[0061] Step S230: If the product parameter values ​​do not meet the preset product test conditions, the test result of the BMS is determined to be defective.

[0062] In steps S210 to S230 of some embodiments, the BMS is tested by contacting the circuit points on the test fixture with the probes to obtain the product parameter values ​​of the BMS, and the product parameter values ​​of the BMS are output to the host computer. The host computer determines whether the product parameter values ​​meet the product test conditions. If the product parameter values ​​meet the product test conditions preset in the host computer, the test result of the BMS is determined to be defect-free. If the product parameter values ​​do not meet the product test conditions preset in the host computer, the test result of the BMS is determined to be defective. The product test conditions are test conditions that conform to the product quality standards and can be defined by the user according to the product quality standards.

[0063] Please see Figure 3 , Figure 3 This is an optional flowchart of the BMS testing method provided in the embodiments of this application. Figure 3The method may include, but is not limited to, steps S310 to S380.

[0064] In step S310, the host computer sends a test command, and the external test device receives the test command and outputs test data.

[0065] Step S320: Use a multimeter to test the test data and obtain the corresponding test values.

[0066] In step S330, the host computer determines whether the test value meets the test input conditions. If the determination result is yes, then step S340 is executed; if the determination result is no, then step S380 is executed.

[0067] Step S340: The host computer sends a closing signal to the electronic switch set on the test channel to control the test channel to close, so that the test data can be input to the test fixture through the test channel to test the BMS placed on the test fixture. The test channel is set between the external test equipment and the test fixture.

[0068] Step S350: During the test, the host computer obtains the current detection value corresponding to the test data;

[0069] Step S360: Determine whether the current detection value meets the test input conditions. If the determination result is yes, then proceed to step S370; if the determination result is no, then proceed to step S380.

[0070] Step S370: Continue testing the BMS until the test results of the BMS are obtained.

[0071] In step S380, the host computer generates a first prompt message and a second prompt message, sends a disconnect signal to the electronic switch set on the test channel to disconnect the test channel and shut down the external test equipment. The first prompt message is used to prompt the external test equipment to be checked, and the second prompt message is used to prompt the external test equipment to be checked and the test channel between the test equipment and the test work.

[0072] By executing steps S310 to S380, the external inputs required by the BMS are checked before the BMS test to ensure that the external inputs do not affect the safety of the BMS circuit components. During the test, the BMS inputs are checked to ensure that the BMS circuit components are not damaged during the test.

[0073] Please see Figure 4 This application also provides a BMS testing apparatus that can implement the above-described BMS testing method. The apparatus includes:

[0074] The first acquisition module 410 is used to acquire test data output by an external test device;

[0075] The second acquisition module 420 is used to acquire the detection values ​​obtained by detecting the test data;

[0076] The BMS test module 430 is used to control the closure of the test channel between the external test equipment and the test fixture if the detected value meets the preset test input conditions, so that the test data can be input to the test fixture through the test channel, and the BMS placed on the test fixture can be tested to obtain the test results of the BMS.

[0077] Please see Figure 5 This application also provides a BMS testing device that can implement the above-described BMS testing method. The device includes: an external test input module 510, a tooling access module 520, a tooling input detection module 530, a control module 540, and a test tooling module 550. The tooling access module 520 connects the external test input module 510 and the test tooling module 550. The tooling access module 520 is equipped with relays, which control the data output from the external test input module 510 to reach the test tooling module 550. The tooling input detection module 530 measures the input data at the front end of each relay in the tooling access module 520 by placing a digital multimeter at the front end of each relay. This input data is the data output from the external test input module 510. The control module 540 controls the on / off state of each relay in the tooling access module 520 by reading the multimeter measurement values ​​from the tooling input detection module 530. The test tooling module 550 tests the BMS to obtain test results, which the control module 540 can read.

[0078] The specific implementation of this BMS testing device is basically the same as the specific implementation of the BMS testing method described above, and will not be repeated here.

[0079] This application also provides an electronic device, which includes: a memory, a processor, a program stored in the memory and executable on the processor, and a data bus for communication between the processor and the memory. When the program is executed by the processor, it implements the aforementioned BMS testing method. This electronic device can be any smart terminal, including tablet computers, in-vehicle computers, etc.

[0080] Please see Figure 6 , Figure 6 The hardware structure of an electronic device according to another embodiment is illustrated. The electronic device includes:

[0081] The processor 610 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this application.

[0082] The memory 620 can be implemented as a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 620 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented through software or firmware, the relevant program code is stored in the memory 620 and is called and executed by the processor 610 using the BMS testing method of the embodiments of this application.

[0083] The input / output interface 630 is used to realize information input and output;

[0084] The communication interface 640 is used to enable communication and interaction between this device and other devices. Communication can be achieved through wired means (such as USB, network cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).

[0085] Bus 650 transmits information between various components of the device (e.g., processor 610, memory 620, input / output interface 630, and communication interface 640);

[0086] The processor 610, memory 620, input / output interface 630 and communication interface 640 are connected to each other within the device via bus 650.

[0087] This application also provides a storage medium, which is a computer-readable storage medium for computer-readable storage. The storage medium stores one or more programs, which can be executed by one or more processors to implement the BMS testing method described above.

[0088] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs and non-transitory computer-executable programs. Furthermore, memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, memory may optionally include memory remotely located relative to the processor, and these remote memories can be connected to the processor via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0089] The BMS testing method, BMS testing device, electronic device, and storage medium provided in this application embodiment acquire test data output by an external testing device, obtain test values ​​obtained by detecting the test data, and if the test values ​​meet preset test input conditions, control the closure of the test channel between the external testing device and the test fixture, so that the test data can be input to the test fixture through the test channel to test the BMS placed on the test fixture, and obtain the test results of the BMS. By detecting the test data output by the external testing device, this application embodiment can avoid abnormal test data caused by abnormal external testing device, thereby preventing the test fixture from using abnormal test data to test the BMS and causing damage to the BMS circuit components.

[0090] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0091] It will be understood by those skilled in the art that Figures 1-3 The technical solutions shown do not constitute a limitation on the embodiments of this application, and may include more or fewer steps than shown, or combine certain steps, or different steps.

[0092] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0093] Those skilled in the art will understand that all or some of the steps in the methods disclosed above, as well as the functional modules / units in the systems and devices, can be implemented as software, firmware, hardware, or suitable combinations thereof.

[0094] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0095] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0096] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of the units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0097] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0098] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0099] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing programs, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0100] The preferred embodiments of the present application have been described above with reference to the accompanying drawings, but this does not limit the scope of the claims of the present application. Any modifications, equivalent substitutions, and improvements made by those skilled in the art without departing from the scope and substance of the embodiments of the present application shall be within the scope of the claims of the present application.

Claims

1. A BMS test method, characterized in that, The method comprises: acquiring test data output by an external test device; acquiring detection values obtained by detecting the test data; wherein the detection values comprise voltage values, current values, temperature values and power values; if the detection values meet preset test input conditions, controlling a test channel between the external test device and a test tool to be closed, so that the test data can be input to the test tool through the test channel, testing a BMS placed on the test tool to obtain a test result of the BMS; wherein the test input conditions comprise that the voltage values are within a preset voltage range, the current values are within a preset current range, the temperature values are within a preset temperature range, and the power values are within a preset power range; if the detection values do not meet the preset test input conditions, controlling the test channel between the external test device and the test tool to be disconnected, and controlling the external test device to be turned off.

2. The BMS testing method of claim 1, wherein, The testing of the BMS placed on the test tool to obtain the test result of the BMS comprises: acquiring product parameter values obtained by testing the BMS; if the product parameter values meet preset product test conditions, determining that the test result of the BMS is defect-free; if the product parameter values do not meet the preset product test conditions, determining that the test result of the BMS is defective.

3. The BMS testing method of claim 1, wherein, After the acquiring of the detection values obtained by detecting the test data, the BMS testing method further comprises: if the detection values do not meet the preset test input conditions, generating first prompt information and second prompt information, wherein the first prompt information is used to prompt to check the external test device, and the second prompt information is used to prompt to check a test channel between the external test device and the test tool.

4. The BMS testing method of any one of claims 1 to 3, wherein, If the detection values meet the preset test input conditions, the controlling of the test channel between the external test device and the test tool to be closed comprises: if the detection values meet test input conditions of all test channels, controlling all test channels between the external test device and the test tool to be closed.

5. The BMS test method of any one of claims 1 to 3, wherein, The test channel is provided with an electronic switch, and the controlling of the test channel between the external test device and the test tool to be closed comprises: sending a closing signal to the electronic switch, so that the electronic switch receives the closing signal and closes the test channel.

6. A BMS test device characterized by The device comprises: a first acquiring module configured to acquire test data output by an external test device; a second acquiring module configured to acquire detection values obtained by detecting the test data; wherein the detection values comprise voltage values, current values, temperature values and power values; The BMS test module is configured to, if the detection value meets preset test input conditions, control a test channel between the external test device and a test tool to be closed, so that the test data can be input to the test tool through the test channel, and test a BMS placed on the test tool to obtain a test result of the BMS; wherein the test input conditions include that the voltage value is within a preset voltage range, the current value is within a preset current range, the temperature value is within a preset temperature range, and the power value is within a preset power range. If the detection value does not meet the preset test input conditions, the BMS test module is configured to control the test channel between the external test device and the test tool to be disconnected, and control the external test device to be turned off.

7. An electronic device, characterized by The electronic device includes a memory, a processor, a program stored on the memory and executable on the processor, and a data bus for realizing connection communication between the processor and the memory, and the program is executed by the processor to realize the steps of the method according to any one of claims 1 to 5.

8. A storage medium, which is a computer-readable storage medium, for computer-readable storage, characterized by, The storage medium stores one or more programs, and the one or more programs are executable by one or more processors to realize the steps of the method according to any one of claims 1 to 5.

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